JP2019528435A5 - - Google Patents

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Publication number
JP2019528435A5
JP2019528435A5 JP2019503570A JP2019503570A JP2019528435A5 JP 2019528435 A5 JP2019528435 A5 JP 2019528435A5 JP 2019503570 A JP2019503570 A JP 2019503570A JP 2019503570 A JP2019503570 A JP 2019503570A JP 2019528435 A5 JP2019528435 A5 JP 2019528435A5
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JP
Japan
Prior art keywords
sample
fluid sample
support
sample support
gas
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JP2019503570A
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English (en)
Japanese (ja)
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JP2019528435A (ja
JP6997757B2 (ja
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Priority claimed from GBGB1613173.2A external-priority patent/GB201613173D0/en
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Publication of JP2019528435A publication Critical patent/JP2019528435A/ja
Publication of JP2019528435A5 publication Critical patent/JP2019528435A5/ja
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Publication of JP6997757B2 publication Critical patent/JP6997757B2/ja
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JP2019503570A 2016-07-29 2017-07-28 電子顕微鏡法 Active JP6997757B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB1613173.2 2016-07-29
GBGB1613173.2A GB201613173D0 (en) 2016-07-29 2016-07-29 Electron microscopy
PCT/EP2017/069240 WO2018020036A1 (en) 2016-07-29 2017-07-28 Electron microscopy

Publications (3)

Publication Number Publication Date
JP2019528435A JP2019528435A (ja) 2019-10-10
JP2019528435A5 true JP2019528435A5 (cg-RX-API-DMAC7.html) 2020-09-03
JP6997757B2 JP6997757B2 (ja) 2022-02-04

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ID=56936668

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2019503570A Active JP6997757B2 (ja) 2016-07-29 2017-07-28 電子顕微鏡法

Country Status (10)

Country Link
US (1) US11067486B2 (cg-RX-API-DMAC7.html)
EP (1) EP3491360B1 (cg-RX-API-DMAC7.html)
JP (1) JP6997757B2 (cg-RX-API-DMAC7.html)
CN (1) CN109891208A (cg-RX-API-DMAC7.html)
AU (1) AU2017302126B2 (cg-RX-API-DMAC7.html)
CA (1) CA3032234C (cg-RX-API-DMAC7.html)
DK (1) DK3491360T3 (cg-RX-API-DMAC7.html)
ES (1) ES3026360T3 (cg-RX-API-DMAC7.html)
GB (1) GB201613173D0 (cg-RX-API-DMAC7.html)
WO (1) WO2018020036A1 (cg-RX-API-DMAC7.html)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3647763B1 (en) 2018-10-29 2021-07-14 FEI Company A method of preparing a biological sample for study in an analysis device
CN111389478B (zh) * 2020-03-23 2023-07-25 西安医学院 一种组织切片的实验处理装置及其使用方法
GB2593491A (en) * 2020-03-24 2021-09-29 Res & Innovation Uk Electron microscopy support
EP4109069A1 (en) 2021-06-25 2022-12-28 FEI Company Blotting material with profiled region, method of manufacturing same, and uses thereof
NL2033291B1 (en) 2022-10-12 2024-04-26 Academisch Ziekenhuis Leiden Device and Method for Cryogenic Electron Microscopy Sample Preparation

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59109840A (ja) 1982-12-16 1984-06-25 Hitachi Koki Co Ltd 走査形電子顕微鏡用生物試料の前処理方法
US7112790B1 (en) * 2003-08-13 2006-09-26 Cypress Semiconductor Corp. Method to prepare TEM samples
JP2007163447A (ja) * 2005-12-09 2007-06-28 Lee Bing Huan 電子顕微鏡用の超薄液体制御板
JP4891830B2 (ja) 2007-04-18 2012-03-07 日本電子株式会社 電子顕微鏡用試料ホルダおよび観察方法
US8256232B2 (en) * 2007-11-20 2012-09-04 Max-Planck-Gesellschaft Zur Foerderung Der Wissenschaften, E.V. Ultra-rapid freezing device and method
GB0724736D0 (en) * 2007-12-19 2008-01-30 Oxford Nanolabs Ltd Formation of layers of amphiphilic molecules
GB2461708A (en) 2008-07-08 2010-01-13 Silson Ltd Sample holder
JP2010054272A (ja) 2008-08-27 2010-03-11 National Institute Of Advanced Industrial Science & Technology スピン偏極走査電子顕微鏡
AT507079B1 (de) * 2009-01-22 2010-02-15 Leica Mikrosysteme Gmbh Vorrichtung und verfahren zum präparieren von proben
JP5550262B2 (ja) * 2009-05-29 2014-07-16 キヤノン株式会社 試料観察システム及び試料観察方法
US9312095B2 (en) * 2010-03-24 2016-04-12 Brown University Method and system for automating sample preparation for microfluidic cryo TEM
GB201118282D0 (en) 2011-10-21 2011-12-07 Cancer Rec Tech Ltd Sample slide preparation method and device
JP5930922B2 (ja) 2012-09-14 2016-06-08 株式会社日立ハイテクノロジーズ 荷電粒子線装置及び試料観察方法
JP6239246B2 (ja) * 2013-03-13 2017-11-29 株式会社日立ハイテクノロジーズ 荷電粒子線装置、試料観察方法、試料台、観察システム、および発光部材
AU2014307715B2 (en) * 2013-08-13 2019-02-14 United Kingdom Research And Innovation Electron microscopy sample support comprising porous metal foil
GB201318463D0 (en) * 2013-08-13 2013-12-04 Medical Res Council Graphene Modification
EP2853847B1 (en) 2013-09-30 2016-02-03 Fei Company Preparation of cryogenic sample for charged-particle microscopy
AU2014363718B2 (en) 2013-12-13 2017-02-23 Ventana Medical Systems, Inc. Thermal management in the context of automated histological processing of biological specimens and associated technology
GB2537579A (en) 2014-11-07 2016-10-26 Linkam Scient Instr Ltd Microscopic sample preparation
AU2016251232A1 (en) * 2015-04-20 2017-10-12 Ventana Medical Systems, Inc. Inkjet deposition of reagents for histological samples
EP3260839B1 (en) * 2016-06-22 2021-01-27 Universiteit Maastricht Method for preparing samples for imaging or diffraction experiments under cryogenic conditions
EP3647763B1 (en) * 2018-10-29 2021-07-14 FEI Company A method of preparing a biological sample for study in an analysis device

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