JP2019522213A5 - - Google Patents

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Publication number
JP2019522213A5
JP2019522213A5 JP2019504757A JP2019504757A JP2019522213A5 JP 2019522213 A5 JP2019522213 A5 JP 2019522213A5 JP 2019504757 A JP2019504757 A JP 2019504757A JP 2019504757 A JP2019504757 A JP 2019504757A JP 2019522213 A5 JP2019522213 A5 JP 2019522213A5
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JP
Japan
Prior art keywords
contact probe
interest
point
inspection system
relative configuration
Prior art date
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Application number
JP2019504757A
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English (en)
Japanese (ja)
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JP2019522213A (ja
JP7090068B2 (ja
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Priority claimed from PCT/GB2017/052182 external-priority patent/WO2018020244A1/en
Publication of JP2019522213A publication Critical patent/JP2019522213A/ja
Publication of JP2019522213A5 publication Critical patent/JP2019522213A5/ja
Application granted granted Critical
Publication of JP7090068B2 publication Critical patent/JP7090068B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2019504757A 2016-07-28 2017-07-26 非接触式プローブおよび動作の方法 Active JP7090068B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP16275107 2016-07-28
EP16275107.7 2016-07-28
PCT/GB2017/052182 WO2018020244A1 (en) 2016-07-28 2017-07-26 Non-contact probe and method of operation

Publications (3)

Publication Number Publication Date
JP2019522213A JP2019522213A (ja) 2019-08-08
JP2019522213A5 true JP2019522213A5 (enExample) 2020-09-10
JP7090068B2 JP7090068B2 (ja) 2022-06-23

Family

ID=56555347

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2019504757A Active JP7090068B2 (ja) 2016-07-28 2017-07-26 非接触式プローブおよび動作の方法

Country Status (5)

Country Link
US (1) US11105607B2 (enExample)
EP (1) EP3491333B1 (enExample)
JP (1) JP7090068B2 (enExample)
CN (1) CN109477714B (enExample)
WO (1) WO2018020244A1 (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA3155008A1 (en) * 2019-09-18 2021-03-25 DWFritz Automation, Inc. Non-contact optical measurement devices and exchangeable optical probes
EP3839418A1 (en) 2019-12-18 2021-06-23 Hexagon Technology Center GmbH Optical sensor with overview camera
US11763491B2 (en) 2020-10-21 2023-09-19 Faro Technologies, Inc. Compensation of three-dimensional measuring instrument having an autofocus camera
US11481917B2 (en) * 2020-10-21 2022-10-25 Faro Technologies, Inc. Compensation of three-dimensional measuring instrument having an autofocus camera
CN114018816B (zh) * 2021-12-03 2025-08-19 北京中车重工机械有限公司 车顶检测系统的检测相机连接装置

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US5025665A (en) * 1989-06-01 1991-06-25 Elsag International B.V. Non-contacting on-line paper strength measuring system
GB9705105D0 (en) 1997-03-12 1997-04-30 Brown & Sharpe Limited Optical surface measurement apparatus and methods
IT1303239B1 (it) * 1998-08-07 2000-11-02 Brown & Sharpe Dea Spa Dispositivo e metodo per il posizionamento di una testa di misura inuna macchina per la misura tridimensionale senza contatto.
JP2001033306A (ja) 1999-07-16 2001-02-09 Seiko Precision Inc 反射型光センサ
JP3792679B2 (ja) 2003-06-23 2006-07-05 Ｎｅｃビューテクノロジー株式会社 投射面距離測定装置を有するプロジェクタ
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DE102006049695A1 (de) * 2006-10-16 2008-04-24 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Vorrichtung und Verfahren zum berührungslosen Erfassen einer dreidimensionalen Kontur
GB0707720D0 (en) 2007-04-23 2007-05-30 Renishaw Plc Apparatus and method for controlling or programming a measurement routine
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CN104165599B (zh) * 2014-08-20 2017-01-25 南京理工大学 偏摆工件非球面的非接触式测量系统与方法
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DE202016006669U1 (de) * 2016-10-26 2017-08-29 Tesa Sa Optischer Sensor mit variierbaren Messkanälen

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