JP2019507871A - 動く対象のパラメータをモニタする方法およびシステム - Google Patents

動く対象のパラメータをモニタする方法およびシステム Download PDF

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Publication number
JP2019507871A
JP2019507871A JP2018543184A JP2018543184A JP2019507871A JP 2019507871 A JP2019507871 A JP 2019507871A JP 2018543184 A JP2018543184 A JP 2018543184A JP 2018543184 A JP2018543184 A JP 2018543184A JP 2019507871 A JP2019507871 A JP 2019507871A
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plane
imaging
motion
frequency
imaging system
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JP2018543184A
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Japanese (ja)
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JP2019507871A5 (enExample
Inventor
ザルフスキー，ズィーフ
ガルシア，ハビエル
アリー アリエル シュワルツ，モシェ
アリー アリエル シュワルツ，モシェ
ベイダーマン，エフゲニー
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ContinUse Biometrics Ltd
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ContinUse Biometrics Ltd
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Publication of JP2019507871A5 publication Critical patent/JP2019507871A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P3/00—Measuring linear or angular speed; Measuring differences of linear or angular speeds
    • G01P3/36—Devices characterised by the use of optical means, e.g. using infrared, visible, or ultraviolet light
    • G01P3/38—Devices characterised by the use of optical means, e.g. using infrared, visible, or ultraviolet light using photographic means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
    • G01B9/0201—Interferometers characterised by controlling or generating intrinsic radiation properties using temporal phase variation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
    • G01B9/02012—Interferometers characterised by controlling or generating intrinsic radiation properties using temporal intensity variation
    • G01B9/02014—Interferometers characterised by controlling or generating intrinsic radiation properties using temporal intensity variation by using pulsed light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02015—Interferometers characterised by the beam path configuration
    • G01B9/02029—Combination with non-interferometric systems, i.e. for measuring the object
    • G01B9/0203—With imaging systems
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02041—Interferometers characterised by particular imaging or detection techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02041—Interferometers characterised by particular imaging or detection techniques
    • G01B9/02045—Interferometers characterised by particular imaging or detection techniques using the Doppler effect
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02094—Speckle interferometers, i.e. for detecting changes in speckle pattern
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01H—MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES
    • G01H9/00—Measuring mechanical vibrations or ultrasonic, sonic or infrasonic waves by using radiation-sensitive means, e.g. optical means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P3/00—Measuring linear or angular speed; Measuring differences of linear or angular speeds
    • G01P3/36—Devices characterised by the use of optical means, e.g. using infrared, visible, or ultraviolet light
    • G01P3/366—Devices characterised by the use of optical means, e.g. using infrared, visible, or ultraviolet light by using diffraction of light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/45—Multiple detectors for detecting interferometer signals

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Electromagnetism (AREA)
  • Power Engineering (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Geophysics And Detection Of Objects (AREA)
JP2018543184A 2016-02-25 2017-02-07 動く対象のパラメータをモニタする方法およびシステム Pending JP2019507871A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201662299598P 2016-02-25 2016-02-25
US62/299,598 2016-02-25
PCT/IL2017/050146 WO2017145145A1 (en) 2016-02-25 2017-02-07 A method and system for monitoring parameters of a moving object

Publications (2)

Publication Number Publication Date
JP2019507871A true JP2019507871A (ja) 2019-03-22
JP2019507871A5 JP2019507871A5 (enExample) 2020-03-26

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JP2018543184A Pending JP2019507871A (ja) 2016-02-25 2017-02-07 動く対象のパラメータをモニタする方法およびシステム

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US (1) US10883818B2 (enExample)
EP (1) EP3420324B1 (enExample)
JP (1) JP2019507871A (enExample)
CN (1) CN108780004A (enExample)
WO (1) WO2017145145A1 (enExample)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
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NL2018853B1 (en) 2017-05-05 2018-11-14 Illumina Inc Systems and methods for improved focus tracking using a hybrid mode light source
NL2018854B1 (en) 2017-05-05 2018-11-14 Illumina Inc Systems and methodes for improved focus tracking using blocking structures
NL2018857B1 (en) 2017-05-05 2018-11-09 Illumina Inc Systems and methods for improved focus tracking using a light source configuration
DE102018113979B4 (de) * 2018-06-12 2024-07-25 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Vorrichtung und Verfahren zur interferometrischen Vermessung einer Oberfläche eines bewegten Prüflings
EP3886686A4 (en) * 2018-11-27 2022-07-20 Continuse Biometrics Ltd. SYSTEM AND METHOD FOR REMOTE MONITORING OF BIOMEDICAL PARAMETERS
JP7095751B2 (ja) * 2018-11-27 2022-07-05 株式会社島津製作所 欠陥検査装置および欠陥検査方法
IL273248B2 (en) * 2019-03-19 2023-05-01 Continuse Biometrics Ltd System and method for optical monitoring based on symmetry conditions of the optical field
US20220252633A1 (en) * 2019-07-22 2022-08-11 The University Of Tokyo Processing system, marking method, marker detected in said method, and marking program
IL278987A (en) * 2019-12-05 2021-06-30 Continuse Biometrics Ltd System and method for passively monitoring a sample
CN111238419B (zh) * 2020-01-20 2021-10-01 中车齐齐哈尔车辆有限公司 制动阀滑阀副平面度的检测装置及检测方法
IT202000006703A1 (it) * 2020-03-31 2021-10-01 Emanuele Giacomozzi Accelerometro ottico-inerziale, telesensore a tracciamento di speckle utilizzante tale accelerometro e metodo di correzione del rumore vibrazionale di tale telesensore
CN113465639B (zh) * 2021-06-28 2022-03-25 浙江大学 一种基于光学结构的时空微分器进行物体运动检测的方法及系统
WO2025027399A1 (en) * 2023-08-01 2025-02-06 Spacearth Technology Srl Speckle-tracking vibration telesensor with dual optical receiver and method of correcting the vibrational noise of such a telesensor
CN119344701B (zh) * 2024-12-23 2025-03-25 南方科技大学 基于多波段激光的生理功能监测方法、系统、终端及介质
CN120467187B (zh) * 2025-07-14 2025-10-17 成都工业学院 基于多波长干涉与莫尔条纹耦合的运动精度检测系统及方法

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JP2005308497A (ja) * 2004-04-20 2005-11-04 Joji Matsuda 振動計測装置
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JPH0642916A (ja) * 1991-08-12 1994-02-18 Hamamatsu Photonics Kk 光学的変位量測定装置
JPH10503592A (ja) * 1994-08-04 1998-03-31 バイエリッシェ モートーレン ウエルケ アクチエンゲゼルシャフト 物体の振動状態を測定する方法
JP2005308497A (ja) * 2004-04-20 2005-11-04 Joji Matsuda 振動計測装置
US20100226543A1 (en) * 2007-07-26 2010-09-09 Zeev Zalevsky Motion Detection System and Method
JP2015527132A (ja) * 2012-08-01 2015-09-17 バー‐イラン、ユニバーシティーＢａｒ−Ｉｌａｎ Ｕｎｉｖｅｒｓｉｔｙ 個体の生物学的又は生化学的パラメータを非侵襲的にモニタする方法及びシステム

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EP3420324A1 (en) 2019-01-02
US20190063898A1 (en) 2019-02-28
EP3420324A4 (en) 2019-10-30
WO2017145145A1 (en) 2017-08-31
US10883818B2 (en) 2021-01-05
EP3420324B1 (en) 2021-03-24
CN108780004A (zh) 2018-11-09

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