JP2019505082A5 - - Google Patents

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Publication number
JP2019505082A5
JP2019505082A5 JP2018547862A JP2018547862A JP2019505082A5 JP 2019505082 A5 JP2019505082 A5 JP 2019505082A5 JP 2018547862 A JP2018547862 A JP 2018547862A JP 2018547862 A JP2018547862 A JP 2018547862A JP 2019505082 A5 JP2019505082 A5 JP 2019505082A5
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JP
Japan
Prior art keywords
electrostatic mirror
mirror prism
ion beam
ion
mass spectrometry
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JP2018547862A
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English (en)
Japanese (ja)
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JP6907226B2 (ja
JP2019505082A (ja
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Priority claimed from PCT/US2016/064113 external-priority patent/WO2017095863A1/en
Publication of JP2019505082A publication Critical patent/JP2019505082A/ja
Publication of JP2019505082A5 publication Critical patent/JP2019505082A5/ja
Application granted granted Critical
Publication of JP6907226B2 publication Critical patent/JP6907226B2/ja
Expired - Fee Related legal-status Critical Current
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JP2018547862A 2015-11-30 2016-11-30 飛行時間質量分析法のためのマルチモードイオンミラープリズム及びエネルギーフィルタリング装置及びシステム Expired - Fee Related JP6907226B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201562260987P 2015-11-30 2015-11-30
US62/260,987 2015-11-30
PCT/US2016/064113 WO2017095863A1 (en) 2015-11-30 2016-11-30 Multimode ion mirror prism and energy filtering apparatus and system for time-of-flight mass spectrometry

Publications (3)

Publication Number Publication Date
JP2019505082A JP2019505082A (ja) 2019-02-21
JP2019505082A5 true JP2019505082A5 (enExample) 2019-11-28
JP6907226B2 JP6907226B2 (ja) 2021-07-21

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Family Applications (1)

Application Number Title Priority Date Filing Date
JP2018547862A Expired - Fee Related JP6907226B2 (ja) 2015-11-30 2016-11-30 飛行時間質量分析法のためのマルチモードイオンミラープリズム及びエネルギーフィルタリング装置及びシステム

Country Status (5)

Country Link
US (1) US10622203B2 (enExample)
EP (1) EP3384520B1 (enExample)
JP (1) JP6907226B2 (enExample)
CA (1) CA3003060A1 (enExample)
WO (1) WO2017095863A1 (enExample)

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GB201613988D0 (en) 2016-08-16 2016-09-28 Micromass Uk Ltd And Leco Corp Mass analyser having extended flight path
GB2567794B (en) 2017-05-05 2023-03-08 Micromass Ltd Multi-reflecting time-of-flight mass spectrometers
GB2563571B (en) 2017-05-26 2023-05-24 Micromass Ltd Time of flight mass analyser with spatial focussing
EP3662503A1 (en) 2017-08-06 2020-06-10 Micromass UK Limited Ion injection into multi-pass mass spectrometers
WO2019030477A1 (en) 2017-08-06 2019-02-14 Anatoly Verenchikov ACCELERATOR FOR MASS SPECTROMETERS WITH MULTIPASSES
US11211238B2 (en) 2017-08-06 2021-12-28 Micromass Uk Limited Multi-pass mass spectrometer
US11239067B2 (en) 2017-08-06 2022-02-01 Micromass Uk Limited Ion mirror for multi-reflecting mass spectrometers
WO2019030471A1 (en) 2017-08-06 2019-02-14 Anatoly Verenchikov ION GUIDE INSIDE PULSED CONVERTERS
EP3662502A1 (en) 2017-08-06 2020-06-10 Micromass UK Limited Printed circuit ion mirror with compensation
WO2019030473A1 (en) 2017-08-06 2019-02-14 Anatoly Verenchikov FIELDS FOR SMART REFLECTIVE TOF SM
GB201802917D0 (en) 2018-02-22 2018-04-11 Micromass Ltd Charge detection mass spectrometry
GB201806507D0 (en) 2018-04-20 2018-06-06 Verenchikov Anatoly Gridless ion mirrors with smooth fields
GB201807626D0 (en) 2018-05-10 2018-06-27 Micromass Ltd Multi-reflecting time of flight mass analyser
GB201807605D0 (en) 2018-05-10 2018-06-27 Micromass Ltd Multi-reflecting time of flight mass analyser
GB201808530D0 (en) 2018-05-24 2018-07-11 Verenchikov Anatoly TOF MS detection system with improved dynamic range
GB201810573D0 (en) 2018-06-28 2018-08-15 Verenchikov Anatoly Multi-pass mass spectrometer with improved duty cycle
GB201901411D0 (en) 2019-02-01 2019-03-20 Micromass Ltd Electrode assembly for mass spectrometer
GB201903779D0 (en) 2019-03-20 2019-05-01 Micromass Ltd Multiplexed time of flight mass spectrometer
WO2021207494A1 (en) 2020-04-09 2021-10-14 Waters Technologies Corporation Ion detector
CN113921373B (zh) * 2021-09-23 2024-10-25 中国科学院国家空间科学中心 一种多镜面反射飞行时间探测装置
CN118402037A (zh) 2021-12-15 2024-07-26 水技术公司 具有集成放大器的感应式检测器

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EP1405055A4 (en) * 2001-05-25 2007-05-23 Analytica Of Branford Inc MULTIPLE DETECTTON SYSTEM
US7385187B2 (en) * 2003-06-21 2008-06-10 Leco Corporation Multi-reflecting time-of-flight mass spectrometer and method of use
US7351958B2 (en) * 2005-01-24 2008-04-01 Applera Corporation Ion optics systems
GB2455977A (en) * 2007-12-21 2009-07-01 Thermo Fisher Scient Multi-reflectron time-of-flight mass spectrometer
GB2462065B (en) * 2008-07-17 2013-03-27 Kratos Analytical Ltd TOF mass spectrometer for stigmatic imaging and associated method
US7919748B2 (en) * 2009-03-31 2011-04-05 Agilent Technologies, Inc. Cylindrical geometry time-of-flight mass spectrometer
US20110049383A1 (en) * 2009-09-03 2011-03-03 Advanced Ion Beam Technology, Inc. Ion implanter and ion implant method thereof
GB2476964A (en) * 2010-01-15 2011-07-20 Anatoly Verenchikov Electrostatic trap mass spectrometer
US8389929B2 (en) * 2010-03-02 2013-03-05 Thermo Finnigan Llc Quadrupole mass spectrometer with enhanced sensitivity and mass resolving power
US8642951B2 (en) * 2011-05-04 2014-02-04 Agilent Technologies, Inc. Device, system, and method for reflecting ions
GB201111560D0 (en) * 2011-07-06 2011-08-24 Micromass Ltd Photo-dissociation of proteins and peptides in a mass spectrometer
GB201118279D0 (en) * 2011-10-21 2011-12-07 Shimadzu Corp Mass analyser, mass spectrometer and associated methods

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