JP6907226B2 - 飛行時間質量分析法のためのマルチモードイオンミラープリズム及びエネルギーフィルタリング装置及びシステム - Google Patents

飛行時間質量分析法のためのマルチモードイオンミラープリズム及びエネルギーフィルタリング装置及びシステム Download PDF

Info

Publication number
JP6907226B2
JP6907226B2 JP2018547862A JP2018547862A JP6907226B2 JP 6907226 B2 JP6907226 B2 JP 6907226B2 JP 2018547862 A JP2018547862 A JP 2018547862A JP 2018547862 A JP2018547862 A JP 2018547862A JP 6907226 B2 JP6907226 B2 JP 6907226B2
Authority
JP
Japan
Prior art keywords
electrostatic mirror
mirror prism
ion beam
tof
ion
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2018547862A
Other languages
English (en)
Japanese (ja)
Other versions
JP2019505082A (ja
JP2019505082A5 (enExample
Inventor
ハンレー,ルーク
ヴラディミロヴィチ ヴェリーオフキン,イゴア,
ヴラディミロヴィチ ヴェリーオフキン,イゴア,
Original Assignee
ザ ボード オブ トラスティーズ オブ ザ ユニヴァーシティー オブ イリノイ
ザ ボード オブ トラスティーズ オブ ザ ユニヴァーシティー オブ イリノイ
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ザ ボード オブ トラスティーズ オブ ザ ユニヴァーシティー オブ イリノイ, ザ ボード オブ トラスティーズ オブ ザ ユニヴァーシティー オブ イリノイ filed Critical ザ ボード オブ トラスティーズ オブ ザ ユニヴァーシティー オブ イリノイ
Publication of JP2019505082A publication Critical patent/JP2019505082A/ja
Publication of JP2019505082A5 publication Critical patent/JP2019505082A5/ja
Application granted granted Critical
Publication of JP6907226B2 publication Critical patent/JP6907226B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/44Energy spectrometers, e.g. alpha-, beta-spectrometers
    • H01J49/46Static spectrometers
    • H01J49/48Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter
    • H01J49/486Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter with plane mirrors, i.e. uniform field
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/004Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • H01J49/34Dynamic spectrometers
    • H01J49/40Time-of-flight spectrometers
    • H01J49/405Time-of-flight spectrometers characterised by the reflectron, e.g. curved field, electrode shapes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • H01J49/34Dynamic spectrometers
    • H01J49/40Time-of-flight spectrometers
    • H01J49/401Time-of-flight spectrometers characterised by orthogonal acceleration, e.g. focusing or selecting the ions, pusher electrode

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2018547862A 2015-11-30 2016-11-30 飛行時間質量分析法のためのマルチモードイオンミラープリズム及びエネルギーフィルタリング装置及びシステム Expired - Fee Related JP6907226B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201562260987P 2015-11-30 2015-11-30
US62/260,987 2015-11-30
PCT/US2016/064113 WO2017095863A1 (en) 2015-11-30 2016-11-30 Multimode ion mirror prism and energy filtering apparatus and system for time-of-flight mass spectrometry

Publications (3)

Publication Number Publication Date
JP2019505082A JP2019505082A (ja) 2019-02-21
JP2019505082A5 JP2019505082A5 (enExample) 2019-11-28
JP6907226B2 true JP6907226B2 (ja) 2021-07-21

Family

ID=58798074

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2018547862A Expired - Fee Related JP6907226B2 (ja) 2015-11-30 2016-11-30 飛行時間質量分析法のためのマルチモードイオンミラープリズム及びエネルギーフィルタリング装置及びシステム

Country Status (5)

Country Link
US (1) US10622203B2 (enExample)
EP (1) EP3384520B1 (enExample)
JP (1) JP6907226B2 (enExample)
CA (1) CA3003060A1 (enExample)
WO (1) WO2017095863A1 (enExample)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB201613988D0 (en) 2016-08-16 2016-09-28 Micromass Uk Ltd And Leco Corp Mass analyser having extended flight path
GB2567794B (en) 2017-05-05 2023-03-08 Micromass Ltd Multi-reflecting time-of-flight mass spectrometers
GB2563571B (en) 2017-05-26 2023-05-24 Micromass Ltd Time of flight mass analyser with spatial focussing
EP3662503A1 (en) 2017-08-06 2020-06-10 Micromass UK Limited Ion injection into multi-pass mass spectrometers
WO2019030477A1 (en) 2017-08-06 2019-02-14 Anatoly Verenchikov ACCELERATOR FOR MASS SPECTROMETERS WITH MULTIPASSES
US11211238B2 (en) 2017-08-06 2021-12-28 Micromass Uk Limited Multi-pass mass spectrometer
US11239067B2 (en) 2017-08-06 2022-02-01 Micromass Uk Limited Ion mirror for multi-reflecting mass spectrometers
WO2019030471A1 (en) 2017-08-06 2019-02-14 Anatoly Verenchikov ION GUIDE INSIDE PULSED CONVERTERS
EP3662502A1 (en) 2017-08-06 2020-06-10 Micromass UK Limited Printed circuit ion mirror with compensation
WO2019030473A1 (en) 2017-08-06 2019-02-14 Anatoly Verenchikov FIELDS FOR SMART REFLECTIVE TOF SM
GB201802917D0 (en) 2018-02-22 2018-04-11 Micromass Ltd Charge detection mass spectrometry
GB201806507D0 (en) 2018-04-20 2018-06-06 Verenchikov Anatoly Gridless ion mirrors with smooth fields
GB201807626D0 (en) 2018-05-10 2018-06-27 Micromass Ltd Multi-reflecting time of flight mass analyser
GB201807605D0 (en) 2018-05-10 2018-06-27 Micromass Ltd Multi-reflecting time of flight mass analyser
GB201808530D0 (en) 2018-05-24 2018-07-11 Verenchikov Anatoly TOF MS detection system with improved dynamic range
GB201810573D0 (en) 2018-06-28 2018-08-15 Verenchikov Anatoly Multi-pass mass spectrometer with improved duty cycle
GB201901411D0 (en) 2019-02-01 2019-03-20 Micromass Ltd Electrode assembly for mass spectrometer
GB201903779D0 (en) 2019-03-20 2019-05-01 Micromass Ltd Multiplexed time of flight mass spectrometer
WO2021207494A1 (en) 2020-04-09 2021-10-14 Waters Technologies Corporation Ion detector
CN113921373B (zh) * 2021-09-23 2024-10-25 中国科学院国家空间科学中心 一种多镜面反射飞行时间探测装置
CN118402037A (zh) 2021-12-15 2024-07-26 水技术公司 具有集成放大器的感应式检测器

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1405055A4 (en) * 2001-05-25 2007-05-23 Analytica Of Branford Inc MULTIPLE DETECTTON SYSTEM
US7385187B2 (en) * 2003-06-21 2008-06-10 Leco Corporation Multi-reflecting time-of-flight mass spectrometer and method of use
US7351958B2 (en) * 2005-01-24 2008-04-01 Applera Corporation Ion optics systems
GB2455977A (en) * 2007-12-21 2009-07-01 Thermo Fisher Scient Multi-reflectron time-of-flight mass spectrometer
GB2462065B (en) * 2008-07-17 2013-03-27 Kratos Analytical Ltd TOF mass spectrometer for stigmatic imaging and associated method
US7919748B2 (en) * 2009-03-31 2011-04-05 Agilent Technologies, Inc. Cylindrical geometry time-of-flight mass spectrometer
US20110049383A1 (en) * 2009-09-03 2011-03-03 Advanced Ion Beam Technology, Inc. Ion implanter and ion implant method thereof
GB2476964A (en) * 2010-01-15 2011-07-20 Anatoly Verenchikov Electrostatic trap mass spectrometer
US8389929B2 (en) * 2010-03-02 2013-03-05 Thermo Finnigan Llc Quadrupole mass spectrometer with enhanced sensitivity and mass resolving power
US8642951B2 (en) * 2011-05-04 2014-02-04 Agilent Technologies, Inc. Device, system, and method for reflecting ions
GB201111560D0 (en) * 2011-07-06 2011-08-24 Micromass Ltd Photo-dissociation of proteins and peptides in a mass spectrometer
GB201118279D0 (en) * 2011-10-21 2011-12-07 Shimadzu Corp Mass analyser, mass spectrometer and associated methods

Also Published As

Publication number Publication date
WO2017095863A1 (en) 2017-06-08
EP3384520A4 (en) 2019-06-26
EP3384520A1 (en) 2018-10-10
JP2019505082A (ja) 2019-02-21
US20180323053A1 (en) 2018-11-08
US10622203B2 (en) 2020-04-14
CA3003060A1 (en) 2017-06-08
EP3384520B1 (en) 2022-08-03

Similar Documents

Publication Publication Date Title
JP6907226B2 (ja) 飛行時間質量分析法のためのマルチモードイオンミラープリズム及びエネルギーフィルタリング装置及びシステム
JP4763601B2 (ja) 多重反射飛行時間型質量分析計及びその使用方法
Radionova et al. In pursuit of resolution in time‐of‐flight mass spectrometry: A historical perspective
EP2002461B1 (en) Mass spectrometer
US8604423B2 (en) Method for enhancement of mass resolution over a limited mass range for time-of-flight spectrometry
RU2481668C2 (ru) Ионно-оптическое устройство с многократным отражением
JP5900770B2 (ja) 直交加速同軸円筒飛行時間型質量分析器
Brais et al. Recent advances in instrumental approaches to time‐of‐flight mass spectrometry
JP2013529367A (ja) ビームエキスパンダを備える質量分析計
WO2014110697A1 (zh) 一种多次反射的高分辨飞行时间质谱仪
JP6292319B2 (ja) 飛行時間型質量分析装置
JP2006228435A (ja) 飛行時間型質量分析装置
US8263932B2 (en) Mass-analyzing method
US9997345B2 (en) Orthogonal acceleration coaxial cylinder mass analyser
Toyoda Development of multi-turn time-of-flight mass spectrometers and their applications
GB2505275A (en) Orthogonal acceleration coaxial cylinder time of flight mass analyser
JP2016514350A (ja) 改良型イオン移動度分光計または分離デジタル化のための時間シフト
WO2004021386A2 (en) Mass spectrometer
Santacruz et al. A constant-momentum/energy-selector time-of-flight mass spectrometer
Papanastasiou Space velocity correlation in orthogonal time-of-flight mass spectrometry
AU2011237721A1 (en) Method for enhancement of mass resolution over a limited mass range for time-of-flight spectrometry

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20191018

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20191018

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20200826

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20200901

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20201215

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20210315

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20210601

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20210630

R150 Certificate of patent or registration of utility model

Ref document number: 6907226

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

LAPS Cancellation because of no payment of annual fees