JP2019500748A5 - - Google Patents
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- Publication number
- JP2019500748A5 JP2019500748A5 JP2018528345A JP2018528345A JP2019500748A5 JP 2019500748 A5 JP2019500748 A5 JP 2019500748A5 JP 2018528345 A JP2018528345 A JP 2018528345A JP 2018528345 A JP2018528345 A JP 2018528345A JP 2019500748 A5 JP2019500748 A5 JP 2019500748A5
- Authority
- JP
- Japan
- Prior art keywords
- component
- substrate
- voltage
- contact
- electrostatic charge
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000758 substrate Substances 0.000 claims 19
- 238000000034 method Methods 0.000 claims 5
- 230000003472 neutralizing effect Effects 0.000 claims 1
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201562262638P | 2015-12-03 | 2015-12-03 | |
| US62/262,638 | 2015-12-03 | ||
| PCT/US2016/064100 WO2017095857A1 (en) | 2015-12-03 | 2016-11-30 | Method and apparatus for measuring electrostatic charge of a substrate |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2019500748A JP2019500748A (ja) | 2019-01-10 |
| JP2019500748A5 true JP2019500748A5 (https=) | 2019-11-28 |
| JP6811777B2 JP6811777B2 (ja) | 2021-01-13 |
Family
ID=58798105
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2018528345A Expired - Fee Related JP6811777B2 (ja) | 2015-12-03 | 2016-11-30 | 基板の静電荷を測定する方法および装置 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US10739394B2 (https=) |
| JP (1) | JP6811777B2 (https=) |
| KR (1) | KR20180081630A (https=) |
| CN (1) | CN108291931B (https=) |
| TW (1) | TWI712803B (https=) |
| WO (1) | WO2017095857A1 (https=) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2021034820A1 (en) * | 2019-08-20 | 2021-02-25 | Ascend Performance Materials Operations Llc | Method for measuring static attraction propensity |
| US11881424B2 (en) * | 2022-03-10 | 2024-01-23 | Intel Corporation | Electrostatic charge measurement tool |
Family Cites Families (35)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4827144B1 (https=) * | 1965-12-27 | 1973-08-20 | ||
| JPS4910076A (https=) * | 1972-05-24 | 1974-01-29 | ||
| US3876917A (en) | 1973-03-26 | 1975-04-08 | Bell & Howell Co | Electrostatic charging apparatus |
| US3935517A (en) * | 1975-01-02 | 1976-01-27 | Xerox Corporation | Constant current charging device |
| JPH05273835A (ja) | 1992-03-26 | 1993-10-22 | Ricoh Co Ltd | 接触帯電装置 |
| JPH05333076A (ja) * | 1992-06-02 | 1993-12-17 | Kanegafuchi Chem Ind Co Ltd | 摩擦帯電量測定装置 |
| JP2961472B2 (ja) * | 1992-10-22 | 1999-10-12 | 三田工業株式会社 | トナー像転写手段を備えた画像生成機 |
| US5461324A (en) | 1994-08-08 | 1995-10-24 | International Business Machines Corporation | Split-fixture configuration and method for testing circuit traces on a flexible substrate |
| US6391506B1 (en) * | 1996-07-04 | 2002-05-21 | Fuji Xerox Co., Ltd. | Carrier, developer, and image-forming method |
| US5983043A (en) * | 1997-12-24 | 1999-11-09 | Canon Kabushiki Kaisha | Potential measuring apparatus and potential measuring method |
| KR100265285B1 (ko) * | 1997-12-30 | 2000-09-15 | 윤종용 | 정전기 센서를 이용한 표면 정전기 분포상태 측정방법과 장치 및 표면 정전기 분포상태 측정 시스템 |
| JP2001013185A (ja) * | 1999-06-29 | 2001-01-19 | Hugle Electronics Inc | 帯電分布測定装置 |
| US20020192360A1 (en) * | 2001-04-24 | 2002-12-19 | 3M Innovative Properties Company | Electrostatic spray coating apparatus and method |
| US6806014B2 (en) * | 2001-08-21 | 2004-10-19 | Aetas Technology, Inc. | Monocomponent developing arrangement for electrophotography |
| US7103301B2 (en) * | 2003-02-18 | 2006-09-05 | Ricoh Company, Ltd. | Image forming apparatus using a contact or a proximity type of charging system including a protection substance on a moveable body to be charged |
| JP4439994B2 (ja) * | 2003-05-14 | 2010-03-24 | キヤノン株式会社 | 画像形成装置及びカートリッジ、カートリッジに搭載される記憶装置 |
| JP2005173305A (ja) * | 2003-12-12 | 2005-06-30 | Konica Minolta Business Technologies Inc | 画像形成装置及び画像形成方法 |
| JP4434799B2 (ja) * | 2004-03-23 | 2010-03-17 | キヤノン株式会社 | 画像形成装置 |
| JP2007003879A (ja) * | 2005-06-24 | 2007-01-11 | Dainippon Screen Mfg Co Ltd | 画像形成装置および画像形成方法 |
| JP2007180074A (ja) * | 2005-12-27 | 2007-07-12 | Olympus Corp | 静電気検出装置および基板検査装置 |
| US8339637B2 (en) * | 2007-08-03 | 2012-12-25 | Ricoh Company, Ltd. | Management apparatus, management system, operation status determination method, and image forming apparatus |
| WO2009099175A1 (ja) * | 2008-02-08 | 2009-08-13 | Brother Kogyo Kabushiki Kaisha | 現像剤供給装置及び画像形成装置 |
| US20090226224A1 (en) * | 2008-03-10 | 2009-09-10 | Kabushiki Kaisha Toshiba | Image forming apparatus and transfer belt turning method for image forming apparatus |
| JP5535670B2 (ja) * | 2010-01-28 | 2014-07-02 | 富士フイルム株式会社 | 放射線画像検出器の製造方法 |
| US8676071B2 (en) * | 2011-01-18 | 2014-03-18 | Xerox Corporation | Interdocument photoreceptor signal sensing and feedback control of paper edge ghosting |
| CN103609203A (zh) * | 2011-04-27 | 2014-02-26 | 道康宁法国公司 | 基材的等离子体处理 |
| WO2013056735A1 (en) | 2011-10-19 | 2013-04-25 | Applied Materials, Inc. | Roll to roll tester and method of testing flexible substrates roll to roll |
| JP6106974B2 (ja) * | 2011-11-14 | 2017-04-05 | 株式会社リコー | 転写装置及び画像形成装置 |
| EP2801835B1 (en) | 2011-12-26 | 2019-07-24 | The University of Tokyo | Measurement method and measurement device |
| CN102608440B (zh) | 2012-03-12 | 2014-05-07 | 南京航空航天大学 | 一种静电传感实验系统及颗粒摩擦带电量的测量方法 |
| US9902130B2 (en) * | 2012-07-02 | 2018-02-27 | Corning Incorporated | Methods of processing a glass substrate and glass apparatus |
| JP2014016178A (ja) | 2012-07-06 | 2014-01-30 | Canon Inc | 帯電量測定方法及び測定装置 |
| CN102879658B (zh) | 2012-09-20 | 2015-04-22 | 兰州大学 | 一种球盘式摩擦电测量装置 |
| US8897675B2 (en) | 2013-03-26 | 2014-11-25 | Xerox Corporation | Semi-contact bias charge roller |
| CN103513119B (zh) * | 2013-10-18 | 2016-08-17 | 河北大学 | 静电分选机转辊表面电荷密度分布的测量方法及测量装置 |
-
2016
- 2016-11-30 JP JP2018528345A patent/JP6811777B2/ja not_active Expired - Fee Related
- 2016-11-30 WO PCT/US2016/064100 patent/WO2017095857A1/en not_active Ceased
- 2016-11-30 TW TW105139391A patent/TWI712803B/zh not_active IP Right Cessation
- 2016-11-30 KR KR1020187019055A patent/KR20180081630A/ko not_active Ceased
- 2016-11-30 US US15/781,226 patent/US10739394B2/en not_active Expired - Fee Related
- 2016-11-30 CN CN201680070941.XA patent/CN108291931B/zh not_active Expired - Fee Related
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