JP2019192903A5 - - Google Patents

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Publication number
JP2019192903A5
JP2019192903A5 JP2019022355A JP2019022355A JP2019192903A5 JP 2019192903 A5 JP2019192903 A5 JP 2019192903A5 JP 2019022355 A JP2019022355 A JP 2019022355A JP 2019022355 A JP2019022355 A JP 2019022355A JP 2019192903 A5 JP2019192903 A5 JP 2019192903A5
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JP
Japan
Prior art keywords
avalanche
avalanche diodes
photodetector
diodes
substrate
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JP2019022355A
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English (en)
Japanese (ja)
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JP2019192903A (ja
JP7353765B2 (ja
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Priority to US16/385,466 priority Critical patent/US10833207B2/en
Publication of JP2019192903A publication Critical patent/JP2019192903A/ja
Publication of JP2019192903A5 publication Critical patent/JP2019192903A5/ja
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Publication of JP7353765B2 publication Critical patent/JP7353765B2/ja
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JP2019022355A 2018-04-24 2019-02-12 光検出装置、光検出システム及び移動体 Active JP7353765B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US16/385,466 US10833207B2 (en) 2018-04-24 2019-04-16 Photo-detection device, photo-detection system, and mobile apparatus

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2018082796 2018-04-24
JP2018082796 2018-04-24

Publications (3)

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JP2019192903A JP2019192903A (ja) 2019-10-31
JP2019192903A5 true JP2019192903A5 (enExample) 2022-02-10
JP7353765B2 JP7353765B2 (ja) 2023-10-02

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Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7492338B2 (ja) 2020-01-30 2024-05-29 キヤノン株式会社 光電変換装置、光電変換システム及び移動体
JP7592538B2 (ja) * 2020-07-21 2024-12-02 キヤノン株式会社 光検出システム
JP2022054553A (ja) * 2020-09-28 2022-04-07 ソニーセミコンダクタソリューションズ株式会社 固体撮像素子、および、撮像装置
CN112945379B (zh) * 2021-02-03 2024-03-12 中国科学院长春光学精密机械与物理研究所 一种单光子探测器死时间设置与噪声滤除的系统
WO2023067755A1 (ja) 2021-10-21 2023-04-27 ソニーセミコンダクタソリューションズ株式会社 光検出装置、撮像装置および測距装置
CN116131833B (zh) * 2022-04-15 2024-06-14 浙桂(杭州)半导体科技有限责任公司 雪崩二极管控制电路
CN116960133B (zh) * 2022-04-15 2024-06-21 浙桂(杭州)半导体科技有限责任公司 一种高填充系数雪崩二极管传感器
TWI836678B (zh) * 2022-10-22 2024-03-21 國立陽明交通大學 具深度資訊之影像感測晶片
WO2025234314A1 (ja) * 2024-05-08 2025-11-13 ソニーセミコンダクタソリューションズ株式会社 光検出装置および測距装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102007037020B3 (de) 2007-08-06 2008-08-21 MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. Avalanche-Photodiode
EP3081963B1 (en) 2015-04-15 2020-11-11 ams AG Avalanche diode arrangement and method for providing a detection signal
CA2990466C (en) 2015-07-08 2023-07-11 The Commonwealth Of Australia Spad array structures and methods of operation
JP6701135B2 (ja) 2016-10-13 2020-05-27 キヤノン株式会社 光検出装置および光検出システム

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