JP2019114528A5 - - Google Patents

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JP2019114528A5
JP2019114528A5 JP2018189685A JP2018189685A JP2019114528A5 JP 2019114528 A5 JP2019114528 A5 JP 2019114528A5 JP 2018189685 A JP2018189685 A JP 2018189685A JP 2018189685 A JP2018189685 A JP 2018189685A JP 2019114528 A5 JP2019114528 A5 JP 2019114528A5
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Japan
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ion
time
flight
mass
turn
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JP2018189685A
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JP2019114528A (ja
JP7035946B2 (ja
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Priority to US16/226,003 priority Critical patent/US10541125B2/en
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JP2018189685A 2017-12-20 2018-10-05 イオン分析装置 Active JP7035946B2 (ja)

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Application Number Priority Date Filing Date Title
US16/226,003 US10541125B2 (en) 2017-12-20 2018-12-19 Ion analyzer

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2017244343 2017-12-20
JP2017244343 2017-12-20

Publications (3)

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JP2019114528A JP2019114528A (ja) 2019-07-11
JP2019114528A5 true JP2019114528A5 (https=) 2021-04-01
JP7035946B2 JP7035946B2 (ja) 2022-03-15

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JP2018189685A Active JP7035946B2 (ja) 2017-12-20 2018-10-05 イオン分析装置

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JP (1) JP7035946B2 (https=)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2617318B (en) * 2022-03-30 2025-01-15 Thermo Fisher Scient Bremen Gmbh Analysis of time-of-flight mass spectra
JP7799569B2 (ja) * 2022-06-28 2026-01-15 株式会社日立ハイテク 測定装置および質量分析装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04154038A (ja) * 1990-10-17 1992-05-27 Yamaha Corp 質量分析計
US7791018B2 (en) 2005-07-19 2010-09-07 University Of New Hampshire Electronic read-out circuits for pixilated/resistive charge detectors
JP6683015B2 (ja) 2016-05-26 2020-04-15 株式会社島津製作所 分析データ処理装置

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