JP2019105590A - Measuring apparatus, measuring method, measuring system and program - Google Patents

Abstract

To provide a mechanism capable of highly accurately performing thickness measurement of a plurality of parts of an inspected material even under environment with various kinds of disturbance.SOLUTION: A measuring apparatus is provided with: a B scope image generation unit 152 which converts a value of amplitude into a value of luminance to generate a B scope image using a thickness direction of a steel pipe 400 which is an inspected material and a moving direction of an ultrasonic probe 110 as axes for ultrasonic waveform data showing amplitude of ultrasonic waves 112 received by a receiving unit 122 in time series at each measurement point of the steel pipe 400; a binary image generation unit 153 which performs binary processing of the B scope image to generate a binary image; a binary image processing unit 154 which removes image particles satisfying at least one of less than a predetermined area or less than predetermined width among image particles in which a region of one value of two values in the binary image becomes a lump; and a thickness calculation unit 158 which calculates thickness of the steel pipe 400 for every measurement point of the steel pipe 400 on the basis of the binary image obtained as a result of processing of the binary image processing unit 154.SELECTED DRAWING: Figure 1

Description

  The present invention relates to a measurement apparatus and a measurement method for measuring a thickness of a material to be inspected, a measurement system including the measurement apparatus, and a program for causing a computer to execute the measurement method.

  Conventionally, a method of measuring the thickness of a steel pipe, which is a material to be inspected, using ultrasonic waves has been proposed (see, for example, Patent Document 1). Specifically, in Patent Document 1, in order to detect a defect in the inner surface of a steel pipe, ultrasonic waves are propagated from the outer surface (front surface) to the inner surface (rear surface) of the steel pipe via an ultrasonic probe. Then, the path of the ultrasonic waves (ie, the thickness of the steel pipe) is calculated. Under the present circumstances, in patent document 1, in order to measure the thickness of several places of steel pipe, it measures, moving an ultrasonic probe and the steel pipe which is a to-be-tested material relatively.

JP, 2012-177685, A

  In patent document 1, when calculating the path length of ultrasonic waves propagated inside the steel pipe which is the material to be inspected (that is, the thickness of the steel pipe), a predetermined threshold is set and echo from the inner surface (back surface) of the steel pipe is set. I try to detect the signal.

  Generally, in on-line ultrasonic measurement at the time of steel pipe production, various disturbances such as a change in surface state due to a scale attached to the surface of the steel pipe, bending or defective shape of the steel pipe, and flapping during steel pipe transportation occur. Then, when such various disturbances occur, it is conceivable that the amplitude value of the echo signal fluctuates significantly. In this case, in the technique of Patent Document 1 described above, thickness measurement of a plurality of portions of a steel pipe can be performed with high accuracy. It is difficult to do.

  The present invention has been made in view of such problems, and it is an object of the present invention to provide a mechanism capable of measuring the thickness of a plurality of portions of a test material with high accuracy even under an environment having various disturbances. I assume.

  The measuring device according to the present invention is a measuring device for measuring the thickness of the test material, and it comprises transmitting means for transmitting ultrasonic waves toward the surface of the test material, and the ultrasonic waves from the test material. Receiving means for receiving, ultrasonic waveform data generating means for generating ultrasonic waveform data indicating the amplitude of ultrasonic waves from the test material in time series, and ultrasonic waves generated by the ultrasonic waveform data generating means Two-dimensional array luminance data generation means for converting the value of the amplitude of waveform data into a value of luminance to generate two-dimensional array luminance data, and binary processing the two-dimensional array luminance data using a predetermined binarization threshold value A two-dimensional array binary data generation unit that generates two-dimensional array binary data by performing a quantization process, and a one-mass area in which one of the two values in the two-dimensional array binary data is grouped Among them, remove one mass region that satisfies a predetermined condition Calculating the thickness of the test material based on two-dimensional array binary data processing means for performing the processing and two-dimensional array binary data obtained as a result of processing by the two-dimensional array binary data processing means And thickness calculation means.

  Another aspect of the measuring apparatus according to the present invention is a measuring apparatus for measuring the thickness of the test material, which transmits ultrasonic waves toward the surface of the test material via an ultrasonic probe. Means, receiving means for receiving the ultrasonic waves from the test material via the ultrasonic probe, and first ultrasonic waves indicating the amplitudes of the ultrasonic waves from the test material in time series A first detection gate indicating a range for detecting surface reflected ultrasonic waves, which are the ultrasonic waves reflected by the surface of the test material, with respect to waveform data, and propagates inside the test material and A gate setting means for setting a second detection gate indicating a range for detecting the back surface reflected ultrasonic wave which is the ultrasonic wave reflected by the back surface of the test material; and the second in the first ultrasonic wave waveform data At least one of the first detection gate and the second detection gate Ultrasonic waveform data processing means for performing processing for changing the amplitude and data obtained by performing processing for changing the amplitude with the ultrasonic waveform data processing means for data within the range of one detection gate Regarding ultrasonic waveform data, the first reception time, which is the time when the surface reflection ultrasonic wave is received by the receiving means from within the range of the first detection gate, and the back side from within the range of the second detection gate Reception time calculation means for calculating a second reception time which is a time when the reflected ultrasonic wave is received by the reception means, the first reception time and the second reception time, and the inside of the test material And thickness calculation means for calculating the thickness of the test material based on the velocity of the propagated ultrasonic wave.

  Moreover, the other aspect in the measuring apparatus of this invention is a measuring apparatus which measures the thickness of a to-be-tested material, Comprising: Each ultrasonic probe in the some ultrasonic probe arrange | positioned with respect to the said to-be-tested material Transmission means for transmitting an ultrasonic wave toward the surface of the test object through a feeler, and receiving means for receiving the ultrasonic wave from the test object through each ultrasonic probe Ultrasonic waveform data generating means for generating ultrasonic waveform data representing, in time series, the amplitude of ultrasonic waves from the test material for each of the ultrasonic probes; and the plurality of ultrasonic probes The ultrasonic wave data of the second ultrasonic probe except for the first ultrasonic probe which is one ultrasonic probe included in the Reception time detection for detecting the time when the surface reflection ultrasonic wave which is a sound wave is received by the receiving means Means and the position of the time detected by the reception time detection means received via the second ultrasonic probe superimposed on the ultrasonic waveform data relating to the first ultrasonic probe Reference waveform data generating means for generating reference waveform data in which a reference waveform assuming noise based on the surface reflection ultrasonic wave is generated, and the reference waveform from the ultrasonic waveform data relating to the first ultrasonic probe The thickness of the test material is calculated based on the waveform data subtraction means for performing data subtraction processing and the ultrasonic waveform data obtained by performing the subtraction processing using the waveform data subtraction means. And calculating means.

  The present invention also includes a measurement method by the above-described measurement device, a measurement system including the above-described measurement device, and a program for causing a computer to execute the measurement method.

  According to the present invention, it is possible to measure the thickness of a plurality of portions of the material to be inspected with high accuracy even under an environment having various disturbances.

It is a figure showing an example of the schematic structure of the measuring device concerning a 1st embodiment of the present invention. It is a schematic diagram for demonstrating the ultrasound waveform data produced | generated by the ultrasound waveform data production | generation part shown in FIG. 1, and the B scope image produced | generated by the B scope image production | generation part shown in FIG. 1 illustrates an example of ultrasonic waveform data generated by an ultrasonic waveform data generation unit illustrated in FIG. 1 and noise B generated by a B scope image generation unit illustrated in FIG. FIG. 1. B scope image generated by the B scope image generation unit shown in FIG. 1 when noise due to disturbance occurs, binary image generated by the binary image generation unit shown in FIG. 1, binary image shown in FIG. It is a figure which shows an example of the binary image obtained as a result of the process by a process part, and the linearization image produced | generated by the linearization image generation part shown in FIG. First detection gate and second detection gate set by the gate setting unit shown in FIG. 1, position detection processing performed by the position detection unit shown in FIG. 1, thickness calculated by the thickness calculation unit shown in FIG. It is a figure which shows an example of calculation processing and the thickness chart displayed by the display control part shown in FIG. It is a figure for demonstrating the binarization threshold value used when performing a binarization process by the binary image generation part shown in FIG. It is a flowchart which shows an example of the process sequence of the thickness measurement method of the steel pipe by the measuring apparatus which concerns on the 1st Embodiment of this invention. The measuring device which concerns on the 1st Embodiment of this invention WHEREIN: It is a figure which shows an example of the 1st thickness measurement result in a steel pipe. The measuring device which concerns on the 1st Embodiment of this invention WHEREIN: It is a figure which shows an example of the 2nd thickness measurement result in a steel pipe. It is a figure which shows an example of schematic structure of the measuring apparatus which concerns on aspect 1 of the 2nd Embodiment of this invention. It is a schematic diagram for demonstrating the ultrasonic waveform data produced | generated by the ultrasonic waveform data generation part shown in FIG. 10 shows an example of first ultrasonic waveform data generated by an ultrasonic waveform data generation unit shown in FIG. 10, and first and second detection gates set by a gate setting unit shown in FIG. FIG. FIG. 12 is a view showing an example in the case where the first histogram related to the amplitude of the ultrasonic wave is generated within the range of the second detection gate for the first ultrasonic waveform data shown in FIG. 12 in the histogram generation unit shown in FIG. is there. FIG. 11 is a diagram showing an example in which a second histogram relating to the amplitude of ultrasonic waves is generated within the range of a second detection gate for the third ultrasonic waveform data in the histogram generation unit shown in FIG. 10; It is a figure which shows an example of the calibration curve data used when calculating an amplification degree in the amplification degree calculation part shown in FIG. FIG. 12 shows an example of second ultrasonic waveform data acquired by the ultrasonic waveform data processing unit shown in FIG. 10, and an example of a first detection gate and a second detection gate set by the gate setting unit shown in FIG. FIG. It is a flowchart which shows an example of a process procedure of the thickness measurement method of the reference material by the measuring apparatus which concerns on aspect 1 of the 2nd Embodiment of this invention. It is a flowchart which shows an example of a process procedure of the thickness measurement method of the steel pipe by the measuring apparatus which concerns on aspect 1 of the 2nd Embodiment of this invention. It is a figure which shows an example of schematic structure of the measuring apparatus which concerns on aspect 2 of the 2nd Embodiment of this invention. It is a figure which shows an example of the window function used by the window function process part shown in FIG. It is a flowchart which shows an example of a process procedure of the thickness measurement method of the steel pipe by the measuring apparatus which concerns on aspect 2 of the 2nd Embodiment of this invention. It is a figure which shows an example of schematic structure of the measuring apparatus which concerns on aspect 3 of the 2nd Embodiment of this invention. It is a flowchart which shows an example of a process procedure of the thickness measurement method of the steel pipe by the measuring apparatus which concerns on aspect 3 of the 2nd Embodiment of this invention. It is a figure which shows an example of schematic structure of the measuring apparatus which concerns on the 3rd Embodiment of this invention. FIG. 25 is a view showing an example of ultrasonic waveform data generated by an ultrasonic waveform data generation unit shown in FIG. 24 and an example of a first detection gate and a second detection gate set by a gate setting unit shown in FIG. 24. . Ultrasonic waveform data generated by the ultrasonic waveform data generation unit shown in FIG. 24, first detection gate and second detection gate set by the gate setting unit shown in FIG. 24, reception time detection unit shown in FIG. FIG. 25 is a diagram showing an example of time detection processing performed in FIG. 24, reference waveform data generated by the reference waveform data generation unit shown in FIG. 24, and waveform data subtraction processing performed by the reception time detection unit shown in FIG. 24. It is a flowchart which shows an example of a process procedure of the thickness measurement method of the steel pipe by the measuring device which concerns on the 3rd Embodiment of this invention. It is a figure which shows an example of schematic structure of the measurement system which concerns on aspect 1 of the 4th Embodiment of this invention. It is a schematic diagram which shows an example of the process sequence of the thickness measurement method of the steel pipe by the measurement system which concerns on aspect 1 of the 4th Embodiment of this invention. It is a figure which shows an example of schematic structure of the measurement system which concerns on aspect 2 of the 4th Embodiment of this invention. It is a schematic diagram which shows an example of the process sequence of the thickness measurement method of the steel pipe by the measurement system which concerns on aspect 2 of the 4th Embodiment of this invention. It is a figure which shows an example of schematic structure of the measurement system which concerns on aspect 3 of the 4th Embodiment of this invention.

  Hereinafter, embodiments (embodiments) for carrying out the present invention will be described with reference to the drawings. In each embodiment of the present invention described below, an example in which a steel pipe is applied as a material to be inspected in the present invention will be described. However, the present invention is not limited to this steel pipe, and ultrasonic waves are used. It is applicable if it is a thing (for example, steel plate etc.) which can measure wall thickness.

First Embodiment
First, a first embodiment of the present invention will be described.

  FIG. 1 is a view showing an example of a schematic configuration of a measurement apparatus 100 according to a first embodiment of the present invention. The measuring apparatus 100 is an apparatus for measuring the thickness of the steel pipe 400 at each measurement point of the steel pipe 400 while relatively moving the steel pipe 400 which is a material to be inspected and the ultrasonic probe 110. Here, the thickness of the steel pipe 400 is determined by the length between the surface 400S of the steel pipe which is the outer surface of the steel pipe 400 and the back surface 400B of the steel pipe which is the inner surface of the steel pipe 400.

  As shown in FIG. 1, the measuring apparatus 100 includes an ultrasonic probe 110, a transmitting / receiving unit 120, an amplifying unit 130, an A / D converting unit 140, a control / processing unit 150, an information input unit 160, a communication unit 170, and a storage. It is configured to have a unit 180 and a display unit 190.

  The ultrasonic probe 110 controls transmission and reception of ultrasonic waves at a plurality of measurement points of the steel pipe 400 by moving relative to the steel pipe 400.

  As an example of relatively moving the ultrasonic probe 110 and the steel pipe 400, in FIG. 1, the ultrasonic probe 110 moves in the circumferential direction of the steel pipe 400 based on the control of the control and processing unit 150. Although the form is illustrated, the present invention is not limited to this form. For example, a mode in which the steel pipe 400 moves while the ultrasonic probe 110 is at rest is also applicable to the present invention, and a plurality of ultrasonic probes 110 are provided, and those ultrasonic probes 110 are also provided. A mode in which the thickness measurement position in the steel pipe 400 is moved by electrically changing the transmission direction of the ultrasonic wave by appropriately controlling the ultrasonic wave transmission timing is also applicable to the present invention. Further, FIG. 1 shows an example in which the ultrasonic probe 110 moves in the circumferential direction of the steel pipe 400, but for example, the ultrasonic probe 110 is in the axial direction of the steel pipe 400 (z direction in FIG. 1). It is applicable also to the form which moves. Further, FIG. 1 shows an example in which one ultrasonic probe 110 is provided in the circumferential direction of the steel pipe 400 in order to simplify the description, but as described above, for example, to improve the measurement efficiency It is applicable also to the form which provides a plurality of ultrasonic probes 110 in the circumferential direction of steel pipe 400.

  The transmitting and receiving unit 120 transmits and receives ultrasonic waves to and from the steel pipe 400 via the ultrasonic probe 110 based on the control of the control and processing unit 150. The transmission / reception unit 120 includes a transmission unit 121 and a reception unit 122.

  The transmitting unit 121 is directed to the surface 400S of the steel pipe via the ultrasonic probe 110 that moves relative to the steel pipe 400 at each measurement point of the steel pipe 400 based on the control of the control and processing unit 150. Then, a process of transmitting the ultrasonic wave 111 is performed. Also, the receiving unit 122 performs processing for receiving the ultrasonic waves 112 from the steel pipe 400 via the ultrasonic probe 110 for each measurement point of the steel pipe 400 based on the control of the control and processing unit 150. .

  The amplification unit 130 amplifies the ultrasonic waves 112 from the steel pipe 400 received by the reception unit 122 based on the control of the control and processing unit 150.

  The A / D conversion unit 140 performs processing of converting the ultrasonic wave 112 from the steel pipe 400 amplified by the amplification unit 130 from an analog signal to a digital signal based on the control of the control / processing unit 150.

  Note that, in the present embodiment, the signals that have passed through the amplification unit 130 are in the order of passing through the A / D conversion unit 140, but in reverse order, the signals that have passed through the A / D conversion unit 140 are It can also be in the order of amplification by the amplification unit 130. By so doing, since digital signals are to be amplified, signal handling can be facilitated.

  The control and processing unit 150 controls each component of the measuring apparatus 100 based on, for example, the input information input from the information input unit 160 and the input information input from the communication unit 170, and controls the operation of the measuring apparatus 100. Control. Further, the control / processing unit 150 performs various processes based on, for example, input information input from the information input unit 160 and input information input from the communication unit 170. As shown in FIG. 1, the control / processing unit 150 includes an ultrasonic waveform data generation unit 151, a B scope image generation unit 152, a binary image generation unit 153, a binary image processing unit 154, and a linearized image generation unit 155. A gate setting unit 156, a position detection unit 157, a thickness calculation unit 158, and a display control unit 159 are provided. The description of each of the configuration units 151 to 159 in the control and processing unit 150 will be described later.

  The information input unit 160 inputs, for example, input information operation input by the user to the control / processing unit 150.

  The communication unit 170 manages communication with the external device G via the computer network N. In the case of the first embodiment, examples of the external device G include a measuring device 200 according to a second embodiment described later and a measuring device 300 according to a third embodiment.

  The storage unit 180 stores various types of information and various types of data used by the control and processing unit 150, and various types of information and various types of data obtained by the processing of the control and processing unit 150.

  The display unit 190 displays various types of information, various types of data, and the like based on the control of the control / processing unit 150.

  Next, the components 151 to 159 in the control / processing unit 150 of FIG. 1 will be described.

  The ultrasonic waveform data generation unit 151 shown in FIG. 1 is configured so that the amplitude of the ultrasonic wave 112 from the steel pipe 400 after being amplified by the amplification unit 130 (after being A / D converted by the A / D conversion unit 140) is Generate ultrasonic waveform data shown in series.

  FIG. 2 is a schematic diagram for explaining the ultrasonic waveform data generated by the ultrasonic waveform data generation unit 151 shown in FIG. 1 and the B scope image generated by the B scope image generation unit 152 shown in FIG. It is. In FIG. 2, the same components as those shown in FIG. 1 are denoted by the same reference numerals.

  First, in the area 1011 of FIG. 2A, the surface 400S of the steel pipe and the back surface 400B of the steel pipe shown in FIG. 1 are horizontally drawn, and the ultrasonic wave 111 from the ultrasonic probe 110 toward the steel pipe 400 Three patterns of ultrasonic waves 112 directed to the ultrasonic probe 110 are shown. In the first pattern shown on the left side of the area 1011 in FIG. 2A, the ultrasonic wave 111 traveling from the ultrasonic probe 110 toward the steel pipe 400 is reflected by the surface 400S of the steel pipe, and It shows a state of going to the acoustic wave probe 110. Further, in the second pattern shown at the center of the area 1011 in FIG. 2A, the ultrasonic wave 111 traveling from the ultrasonic probe 110 toward the steel pipe 400 is reflected by the back surface 400B of the steel pipe, and the first back surface reflection ultrasonic wave A state of going to the ultrasound probe 110 is shown as 112-B1. Further, in the third pattern shown on the right side of the area 1011 in FIG. 2A, the ultrasonic wave 111 directed from the ultrasonic probe 110 to the steel pipe 400 is reflected by the back surface 400B of the steel pipe, and thereafter the steel surface 400S is used. After reflected, it is reflected again on the back surface 400B of the steel pipe, and shows a state of traveling toward the ultrasound probe 110 as the second back surface reflection ultrasonic wave 112-B2. Specifically, in the present embodiment, regarding the back surface reflection ultrasonic wave 112-B, assuming that n is a positive integer, the nth back surface reflection ultrasonic wave 112-Bn is between the surface 400S of the steel pipe and the back surface 400B of the steel pipe. It is defined as n back-to-back back reflection ultrasonic waves 112-B.

  Further, in the area 1012 of FIG. 2A, the surface reflected ultrasonic wave 112-S, the first back surface reflected ultrasonic wave 112-B1, and the second back surface reflected ultrasonic wave 112 shown in the area 1011 of FIG. An example of the ultrasonic waveform data which showed the amplitude of -B2 in the time series is shown typically. In the area 1012 of FIG. 2A, the surface reflection ultrasonic wave 112-S shown in the area 1011 of FIG. 2A is S echo, the first back surface reflection ultrasonic wave 112 B1 is B1 echo, and the second back surface The reflected ultrasonic wave 112-B2 shows the waveform as B2 echo. Further, in the present embodiment, the amplitude shown on the horizontal axis of the ultrasonic waveform data shown in the area 1012 of FIG. 2A is, for example, an A / D conversion unit 140 with an input range of ± 1.0 V and 8-bit. If the amplitude of the ultrasonic wave input to the A / D conversion unit 140 is −1.0 V, “0”, and if the amplitude of the ultrasonic wave input to the A / D conversion unit 140 is 0.0 V If the amplitude of the ultrasonic wave input to the A / D conversion unit 140 is +1.0 V, the value is “255”. Further, in the present embodiment, when the amplitude of the ultrasonic wave exceeding the input range of the A / D converter 140 is input, for example, the amplitude of the ultrasonic wave input to the A / D converter 140 is −1. For example, when the amplitude of the ultrasonic wave input to the A / D conversion unit 140 is larger than +1.0 V, it is forced to “255” when the amplitude is smaller than 0 V. Further, in the present embodiment, the time shown on the vertical axis of the ultrasonic waveform data shown in the area 1012 of FIG. 2A indicates the elapsed time since the reception unit 122 starts the reception process.

  In an area 1013 of FIG. 2B, an example of a measurement point 401 at which the thickness of the steel pipe 400 is measured while the steel pipe 400 and the ultrasonic probe 110 are relatively moved is schematically shown. Then, in the area 1014 of FIG. 2B, the ultrasonic waveform data generated by the ultrasonic waveform data generation unit 151 for each measurement point 401 shown in the area 1013 of FIG. 1 schematically shows an example of ultrasonic waveform data).

  The B scope image generation unit 152 shown in FIG. 1 converts the value of the amplitude of the ultrasonic waveform data generated for each measurement point by the ultrasonic waveform data generation unit 151 into a value of luminance, and the thickness direction of the steel pipe 400 And generates a B-scope image with the direction of movement of the ultrasonic probe 110 relative to the steel pipe 400 as an axis.

Here, an example of a method of generating a B-scope image by the B-scope image generation unit 152 will be described using FIG. 2.
In the area 1015 of FIG. 2B, the value of the amplitude of the ultrasonic waveform data shown in the area 1014 of FIG. 2B generated for each measurement point 401 shown in the area 1013 of FIG. An example of a conversion table for converting into a value is shown. Specifically, in the conversion table shown in area 1015 of FIG. 2B, when the value of the amplitude of the ultrasonic waveform data shown in area 1012 of FIG. 2A, and when the value of the amplitude of the ultrasonic waveform data shown in the area 1012 of FIG. 2A is “127”, it is converted into the value of the “intermediate color (gray)” luminance, and the area of FIG. A table is shown for converting the value of the amplitude of the ultrasonic waveform data indicated by 1012 into the value of the luminance of "white" when the value of the amplitude is "255". The B-scope image generation unit 152 in the present embodiment uses the conversion table shown in the area 1015 of FIG. 2B to generate each of the measurement points 401 shown in the area 1013 of FIG. The value of the amplitude of the ultrasonic waveform data shown in the area 1014 of b) is converted into the value of the brightness to generate the B scope image 1016 shown in FIG. The B scope image 1016 shown in FIG. 2C shows one ultrasonic waveform data generated at one measurement point 401 where one upper and lower line is shown in FIG. 2B. The direction from the top to the bottom is the thickness direction of the steel pipe 400 as shown in FIG. 2 (a). For this reason, also in the B scope image 1016 shown in FIG. 2C, the direction from the top to the bottom is the thickness direction of the steel pipe 400, and the direction from the left to the right is the ultrasound probe 110. Of the steel pipe 400 (that is, the moving direction of the measurement point 401 shown in the area 1013 of FIG. 2B). Further, in FIG. 2C, in the B scope image 1016, a portion corresponding to the S echo of the surface reflected ultrasonic wave 112-S and a portion corresponding to the B1 echo of the first back surface reflected ultrasonic wave 112-B1; A portion corresponding to a B2 echo of the second back surface reflection ultrasonic wave 112-B2 is illustrated.

  3 shows ultrasonic waveform data generated by the ultrasonic waveform data generation unit 151 shown in FIG. 1 when noise due to disturbance occurs, and B generated by the B scope image generation unit 152 shown in FIG. It is a figure which shows an example of a scope image. Specifically, for example, when the thickness of the steel pipe 400 is measured by filling the space between the steel pipe 400 and the ultrasonic probe 110 with water, for example, air bubbles may be present in the water, or FIG. When a scale adheres to the surface, etc., these air bubbles and the scale become a reflective source of the ultrasonic wave 111 which goes to the steel pipe 400 from the ultrasonic probe 110, and the case where this is observed as a reflection echo is shown.

  Specifically, FIG. 3A shows an example of ultrasonic waveform data 1021 generated by the ultrasonic waveform data generation unit 151 shown in FIG. 1 when noise is generated due to disturbance. Contrary to the ultrasonic waveform data shown in the area 1012 of FIG. 2A, the ultrasonic waveform data 1021 indicates the elapsed time from the start of the reception processing by the receiving unit 122 on the horizontal axis, and the vertical axis on the vertical axis. It is data that shows the amplitude. At this time, in the ultrasonic waveform data 1021, there is a portion corresponding to noise due to disturbance at a time prior to the portion corresponding to the S echo of the surface reflected ultrasonic wave 112 -S. Depending on the setting of the detection gate for detecting the S echo of -S, there is a concern that the portion corresponding to the noise may be erroneously determined as the surface reflected ultrasonic wave 112-S being detected. There is a problem that the thickness measurement of the can not be performed with high accuracy.

  FIG. 3B shows an example of the B scope image 1022 generated by the B scope image generating unit 152 shown in FIG. 1 when noise due to disturbance occurs. In the B scope image 1022, a portion 10221 corresponding to noise due to disturbance and a line 10222 corresponding to the ultrasonic waveform data 1021 shown in FIG. 3A are shown. Then, on the B scope image 1022, a portion 10221 corresponding to noise due to disturbance is a portion 10223 corresponding to the S echo of the surface reflected ultrasonic wave 112-S and a portion corresponding to the B echo of the back surface reflected ultrasonic wave 112-B. Unlike a band-shaped multiplex signal of 10224, it is observed as a massive pattern. Therefore, in the present embodiment, the thickness measurement of the steel pipe 400 can be performed with high accuracy by removing the portion 10221 corresponding to the noise due to the disturbance by using the difference in the feature of the portion 10221 corresponding to the noise due to the disturbance. It shows the form that it did.

  The binary image generation unit 153 illustrated in FIG. 1 generates a binary image by binarizing the B scope image generated by the B scope image generation unit 152 using a predetermined binarization threshold value.

  FIG. 4 shows a B scope image generated by the B scope image generation unit 152 shown in FIG. 1, a binary image generated by the binary image generation unit 153 shown in FIG. 1, and FIG. FIG. 6 is a view showing an example of a binary image obtained as a result of processing by the binary image processing unit 154 shown in FIG. 1 and a linearized image generated by the linearized image generation unit 155 shown in FIG.

  Specifically, FIG. 4A shows an example of the B scope image 1031 generated by the B scope image generation unit 152 shown in FIG. 1 when noise due to disturbance occurs. In the B scope image 1031, a portion 10311 corresponding to noise due to disturbance is shown. Then, in this case, the binary image generation unit 153 shown in FIG. 1 performs binarization processing on the B scope image 1031 shown in FIG. 4A using a predetermined binarization threshold, and the processing shown in FIG. A binary image 1032 is generated. At this time, the binary image generation unit 153 shown in FIG. 1 can also generate a binary image 1032 using, for example, a binarization threshold described later with reference to FIG. It is also possible to generate a binary image 1032 using this. Further, in the binary image 1032 shown in FIG. 4B, the black part corresponds to the value of “0”, and the part of a color other than black corresponds to the value of “1”.

  The binary image processing unit 154 shown in FIG. 1 first performs expansion / contraction processing, which is general particle removal and particle combination processing, on the binary image generated by the binary image generation unit 153. Thereafter, the binary image processing unit 154 shown in FIG. 1 performs so-called particle analysis, and among the image particles in which the area of one of the binary values in the binary image after the expansion / contraction processing has become one mass A process of removing image particles that satisfy at least one of the area less than the predetermined area and the area less than the predetermined width is performed.

  Specifically, after the binary image processing unit 154 shown in FIG. 1 performs expansion / contraction processing on the binary image 1032 shown in FIG. 4B, one of the binary values in the binary image is processed. Among the image particles in which the area of the value (in the example shown in FIG. 4B, the value of “1” related to the part of color other than black) is in a lump, it is less than the predetermined area and less than the predetermined width The image particle which satisfy | fills at least any one of is removed, and the binary image 1033 after the process shown in FIG.4 (c) is acquired. Here, the width of the image particle represents the length in the lateral direction of the binary image 1032 shown in FIG. 4B (that is, the moving direction of the measurement point 401 shown in the area 1013 of FIG. 2B). . Therefore, if, for example, a half of the total length in the horizontal direction of the binary image 1032 shown in FIG. 4B is set as a predetermined width that is a threshold for removing image particles, In the binary image 1033 after the process shown in c), the image particles of the portion 10311 corresponding to the noise shown in FIG. 4A are removed. Note that the above-described predetermined width set as the threshold value for removing image particles is merely an example until it gets tired, and is not limited to this in the present embodiment. Further, in the present embodiment, information relating to a predetermined feature amount and parameter conditions for removing image particles (that is, information relating to a predetermined area and a predetermined width here) is stored in advance in the storage unit 180. It shall be.

  In the image processing by the binary image processing unit 154, as shown in FIG. 3B, a band portion 10223 corresponding to the S echo of the surface reflection ultrasonic wave 112-S or B of the back surface reflection ultrasonic wave 112-B Focusing on the fact that the area and width of the portion 10221 corresponding to noise due to disturbance is smaller than that of the belt-like portion 10224 corresponding to echo, processing for removing the portion 10221 corresponding to noise due to the disturbance is performed. is there. Thereby, in the example shown in FIG. 4, as described above, in the binary image 1033 processed by the binary image processing unit 154, the image particles of the portion 10311 corresponding to the noise shown in FIG. It is done.

  The linearized image generation unit 155 shown in FIG. 1 detects the position of the upper end of the image particle in the binary image obtained as a result of the processing by the binary image processing unit 154, and the position of the upper end is straight at a predetermined position. A linearized image is generated by shifting the data of the B scope image generated by the B scope image generation unit 152 up and down so that

  Specifically, the linearized image generation unit 155 shown in FIG. 1 first makes an image particle of the binary image 1033 shown in FIG. 4C (in the example shown in FIG. 4C, a portion of a color other than black) The upper end position (upper end line) 10331 according to is detected. The upper end position (upper end line) 10331 is a portion corresponding to the S echo of the surface reflection ultrasonic wave 112-S. Next, in the linearized image generation unit 155 shown in FIG. 1, the position (line of the upper end) 10331 at the upper end shown in FIG. 4C is a straight line at a predetermined position (specifically, the upper position in this embodiment). A linearized image 1034 is generated by shifting the data of the B scope image 1031 shown in FIG. The straightened image 1034 shows a straight line 10341 obtained by linearizing the upper end position (upper end line) 10331 shown in FIG. 4C. Further, in this linearized image 1034, an area filled with data having a predetermined value (for example, 127) is shown in an area where there is no data located below.

  The gate setting unit 156 illustrated in FIG. 1 includes a first detection gate indicating a range for detecting the surface reflection ultrasonic wave 112-S with respect to the linearized image generated by the linearized image generation unit 155; A second detection gate indicating a range for detecting the reflected ultrasonic wave 112-B is set.

  5 shows the first detection gate and the second detection gate set by the gate setting unit 156 shown in FIG. 1, the position detection process performed by the position detection unit 157 shown in FIG. 1, the thickness calculation shown in FIG. It is a figure which shows an example of the thickness calculation process performed by the part 158, and a thickness chart displayed by the display control part 159 shown in FIG.

  Specifically, as shown in FIG. 5A, the gate setting unit 156 shown in FIG. 1 detects surface reflected ultrasonic waves 112-S from the linearized image generated by the linearized image generation unit 155. A first detection gate 1041 indicating a range to be used and a second detection gate 1042 indicating a range for detecting the back surface reflection ultrasonic wave 112-B are set. Here, the gate setting unit 156 sets a detection gate indicating a range for detecting the second back surface reflection ultrasonic wave 112-B2 as the second detection gate 1042. The setting of the first detection gate 1041 and the second detection gate 1042 here corresponds to setting of the detection gate in the ultrasonic waveform data related to the A scope generated for each of the measurement points 401. Further, in the linearized image, the portion corresponding to the S echo of the surface reflected ultrasonic wave 112-S is linearized, so the settings of the first detection gate 1041 and the second detection gate 1042 are measured at each measurement point 401. It is not necessary to set to follow each time, and a rectangular area can be set.

  After that, for example, the binary image generation unit 153 shown in FIG. 1 binarizes the linearized image shown in FIG. 5A using a predetermined binarization threshold, and then the binary image generation unit 153 shown in FIG. Generate a binary image. Here, the binarization threshold used when the binarization process is performed by the binary image generation unit 153 will be described.

FIG. 6 is a diagram for explaining the binarization threshold used when the binarization processing is performed by the binary image generation unit 153 shown in FIG.
In FIG. 6, in order to make the explanation easy to understand, ultrasonic waveform data related to the A scope generated at one measurement point 401 is shown. Further, FIG. 6 also illustrates the range of the first detection gate 1041 and the second detection gate 1042 set by the gate setting unit 156. Then, in the example shown in FIG. 6, for the range of the first detection gate 1041, a value equal to or greater than the lower limit threshold 1045 and equal to or less than the lower limit threshold 1046 is “1”, and the other is “0”. Further, for the range of the second detection gate 1042, a value that is equal to or greater than the lower limit threshold 1047 and equal to or less than the lower limit threshold 1048 is “1”, and the other is “0”. Note that the first detection gate 1041 for detecting the surface reflected ultrasonic wave 112-S and the second for detecting the back surface reflected ultrasonic wave 112-B (here, the second back surface reflected ultrasonic wave 112-B2) In the detection gate 1042, the lower threshold 1045, the lower threshold 1046, the lower threshold 1047, and the lower threshold 1048 are inverted because the phase is different between the surface reflection ultrasonic wave 112-S and the back surface reflection ultrasonic wave 112-B. It is by reversing.

  Thereafter, for example, the binary image processing unit 154 illustrated in FIG. 1 performs expansion / contraction processing, which is the above-described general particle removal and particle combination processing, and acquires the binary image illustrated in FIG. Do.

  The position detection unit 157 shown in FIG. 1 corresponds to the time when the surface reflection ultrasonic wave 112-S is received by the reception unit 122 from within the range of the first detection gate set by the gate setting unit 156 for each measurement point. Back surface reflected ultrasonic wave 112-B (in this case, the second back surface reflected ultrasonic wave 112-B2) from within the range of the first position and the range of the second detection gate set by the gate setting unit 156. The second position corresponding to the received time is detected.

  Specifically, the position detection unit 157 shown in FIG. 1 uses the same method as the position detection of the upper end of the image particle by the above-described linearized image generation unit 155 for the binary image shown in FIG. 5B. The first position corresponding to the time when the surface reflection ultrasonic wave 112-S is received by the reception unit 122 from the range of the first detection gate 1041 set by the gate setting unit 156, and the gate setting unit 156 The second position corresponding to the time at which the back surface reflected ultrasonic wave 112-B (here, the second back surface reflected ultrasonic wave 112-B2) is received by the receiving unit 122 is detected from the range of the second detection gate 1042 Do. Then, the position detection unit 157 shown in FIG. 1 detects the first position 1043 and the second position 1044 from the linearized image shown in FIG. 5C based on the detection result.

  The thickness calculator 158 shown in FIG. 1 is configured to detect the first position and the second position detected by the position detector 157 and the velocity of the ultrasonic wave propagating through the inside of the steel pipe 400 for each measurement point 401. Based on the thickness of the steel pipe 400 is calculated.

  Specifically, in the linearized image shown in FIG. 5C, the thickness calculation unit 158 sets the first position 1043 and the second position for each of the measurement points 401 (that is, for each of the upper and lower lines). The pixel interval with 1044 (an amount corresponding to time, for example, the time per pixel is determined by the sampling pitch of A / D converter 140) is converted to time, and this time and the inside of steel pipe 400 are propagated The thickness of the steel pipe 400 is calculated from the velocity of the ultrasonic wave. An example of a thickness chart according to the thickness of the steel pipe 400 calculated for each measurement point 401 by the thickness calculation unit 158 is shown in FIG.

Here, when the second detection gate 1042 is set to detect, for example, the n-th (n is a positive integer) back surface reflected ultrasonic wave 112-Bn, the time based on the first position 1043 is TS. Assuming that the time based on the second position 1044 is TBn (corresponding to the “time” in which “TBn-TS” is obtained based on the pixel interval between the first position 1043 and the second position 1044 described above), The part 158 calculates the thickness of the steel pipe 400 using the following formula (1).
Thickness = (TBn-TS) x (speed of ultrasonic wave propagated inside the steel pipe 400) / (2 x n)
... (1)

For example, the display control unit 159 illustrated in FIG. 1 controls the display unit 190 to display a linearized image in which a color (for example, red) is added to the first position 1043 and the second position 1044 illustrated in FIG. I do. By performing this display, it is clearly observed whether the thickness change of the steel pipe 400, the S echo of the surface reflection ultrasonic wave 112-S and the B echo of the back surface reflection ultrasonic wave 112-1 are detected at the correct position. be able to.
In addition, the display control unit 159 illustrated in FIG. 1 performs control to display the thickness chart illustrated in FIG. 5C on the display unit 190, for example.

Next, the processing procedure of the thickness measurement method of the steel pipe 400 which is a material to be inspected will be described.
FIG. 7 is a flowchart showing an example of the processing procedure of the method for measuring the thickness of the steel pipe 400 by the measuring device 100 according to the first embodiment of the present invention.

  First, in step S1101 in FIG. 7, the control / processing unit 150 (for example, the ultrasonic waveform data generating unit 151) performs measurement of measuring the thickness of the steel pipe 400 based on input information input from the information input unit 160, for example. Set the number of points T.

  Subsequently, in step S1102 of FIG. 7, the control and processing unit 150 (for example, the ultrasonic waveform data generation unit 151) sets 1 to a variable t indicating a measurement point.

  Subsequently, in step S1103 of FIG. 7, the transmission unit 121 sets the surface 400S of the measurement point t of the steel pipe 400, which is the material to be inspected, via the ultrasonic probe 110 based on the control of the control / processing unit 150. The ultrasonic wave 111 is transmitted.

  Subsequently, in step S1104 of FIG. 7, the receiving unit 122 receives the ultrasonic waves 112 from the steel pipe 400 via the ultrasonic probe 110 based on the control of the control and processing unit 150.

  Subsequently, in step S1105 of FIG. 7, the ultrasonic waveform data generation unit 151 performs the superimposition from the steel pipe 400 after being amplified by the amplification unit 130 (after being further A / D converted by the A / D conversion unit 140). Ultrasonic waveform data indicating the amplitude of the sound wave 112 in time series is generated. Here, for example, ultrasonic waveform data shown in a region 1012 of FIG. 2A is generated.

  Subsequently, in step S1106 in FIG. 7, the control and processing unit 150 (for example, the ultrasonic waveform data generation unit 151) determines whether or not the variable t indicating the measurement point is smaller than the number T of measurement points.

As a result of the determination in step S1106 in FIG. 7, when the variable t indicating the measurement point is smaller than the number T of measurement points (S1106 / YES), it is determined that there is a measurement point which has not been measured yet. The process proceeds to step S1107.
At step S1107 in FIG. 7, the control / processing unit 150 (for example, the ultrasonic waveform data generating unit 151) adds 1 to the variable t indicating the measurement point. After that, the process returns to step S1103 in FIG.

On the other hand, if it is determined in step S1106 in FIG. 7 that the variable t indicating the measurement point is not smaller than the number T of measurement points (S1106 / NO), it is determined that measurement has been performed for all measurement points. The process proceeds to step S1108 of FIG.
In step S1108 of FIG. 7, the B scope image generation unit 152 converts the value of the amplitude of the ultrasonic waveform data generated for each measurement point in step S1105 into a value of luminance, and the thickness direction of the steel pipe 400 And generates a B-scope image with the direction of movement of the ultrasonic probe 110 relative to the steel pipe 400 as an axis. Here, for example, the process shown in FIG. 2B is performed to generate the B scope image 1016 shown in FIG. In the following description, it is assumed that the B scope image 1031 shown in FIG. 4A is generated by the process of this step.

  Subsequently, in step S1109 in FIG. 7, the binary image generation unit 153 generates a binary image by binarizing the B scope image generated in step S1108 using a predetermined binarization threshold value. . Here, for example, a binary image 1032 shown in FIG. 4B is generated.

  Subsequently, in step S1110 of FIG. 7, the binary image processing unit 154 first performs expansion / contraction processing, which is general particle removal and particle combination processing, on the binary image generated in step S1109. Do. Thereafter, the binary image processing unit 154 performs so-called particle analysis, and a predetermined area of the image particles in which the area of one of the binary values in the binary image after the expansion / contraction processing is grouped A process is performed to remove image particles that satisfy at least one of less than and less than a predetermined width. Here, for example, the binary image 1033 after the process shown in FIG. 4C is acquired.

  Subsequently, in step S1111 in FIG. 7, the linearized image generation unit 155 detects the position of the upper end of the image particle in the binary image obtained as a result of the process of step S1110. Here, for example, the position of the upper end (upper end line) 10331 shown in FIG. 4C is detected.

  Subsequently, in step S1112 of FIG. 7, the linearized image generation unit 155 causes the position of the upper end detected in step S1111 to be a straight line at a predetermined position (specifically, the upper position in the present embodiment). A linearized image is generated by shifting the data of the B-scope image generated in step S1108 up and down. Here, for example, a linearized image 1034 shown in FIG. 4D is generated.

Subsequently, in step S1113 of FIG. 7, the gate setting unit 156 generates a first detection gate indicating a range for detecting the surface reflection ultrasonic wave 112-S with respect to the linearized image generated in step S1112. , And a second detection gate indicating a range for detecting the back surface reflection ultrasonic wave 112-B (here, the second back surface reflection ultrasonic wave 112-B2). For example, the first detection gate 1041 and the second detection gate 1042 shown in FIG. 5A are set.
Thereafter, for example, the binary image generation unit 153 binarizes the linearized image shown in FIG. 5A using a predetermined binarization threshold to generate a binary image, and the binary image processing unit In 154, the binary image shown in FIG. 5B is obtained by performing expansion / contraction processing, which is the above-described general particle removal and particle binding processing, on the binary image.

  Subsequently, in step S1114 in FIG. 7, the position detection unit 157 receives the surface reflection ultrasonic waves 112-S from the range of the first detection gate set in step S1113 by the reception unit 122 for each measurement point. Back surface reflected ultrasonic wave 112-B (here, the second back surface reflected ultrasonic wave 112-B2) from the first position corresponding to the time of day and the range of the second detection gate set in step S1113 A second position corresponding to the received time is detected by the unit 122.

Specifically, for the binary image shown in FIG. 5B, the position detection unit 157 sets the first image set in step S1113 using the same method as the position detection of the upper end of the image particle according to step S1111. The first position out of the range of the detection gate 1041 and the second position out of the range of the second detection gate 1042 set in step S1113 are detected. Then, the position detection unit 157 detects the first position 1043 and the second position 1044 from the linearized image shown in FIG. 5C based on the detection result.
After that, the display control unit 159 performs control to display, for example, a linearized image in which a color (for example, red) is added to the first position 1043 and the second position 1044 shown in FIG. .

  Subsequently, in step S1115 of FIG. 7, the thickness calculator 158 calculates, for each measurement point, the first position and the second position detected in step S1114, and the ultrasonic waves propagated inside the steel pipe 400. Based on the speed, the thickness of the steel pipe 400 is calculated.

  Subsequently, in step S1116 in FIG. 7, the display control unit 159 performs control to display the thickness of the steel pipe 400 calculated in step S1115 on the display unit 190. Here, for example, a thickness chart shown in FIG. 5D is displayed. After that, the control / processing unit 150 stores the data of the thickness of the steel pipe 400 calculated in step S1115 in the storage unit 180 as necessary.

  Subsequently, in step S1117 of FIG. 7, the control / processing unit 150 determines whether to end the thickness measurement of the steel pipe 400, which is the material to be inspected, based on input information input from the information input unit 160, for example. to decide.

  If the thickness measurement of the steel pipe 400 is not completed as a result of the determination in step S1117 in FIG. 7 (S1117 / NO), the process returns to step S1101 in FIG. 7 and the processes in step S1101 and subsequent steps are performed again.

  On the other hand, when the thickness measurement of the steel pipe 400 is completed as a result of the determination in step S1117 of FIG. 7 (S1117 / YES), the processing of the flowchart of FIG. 7 is ended.

In the above-described example, the gate setting unit 156 sets a detection gate indicating a range for detecting the second back surface reflection ultrasonic wave 112-B2 as the second detection gate 1042. The embodiment is not limited to this. In the present embodiment, the following modes are also applicable.
First, in the gate setting unit 156, as the second detection gate 1042, at least two back surface reflection ultrasonic waves 112-B having different numbers of reflections on the back surface 400B of the steel pipe (for example, the first back surface reflection ultrasonic waves 112-B1 and It is possible to set a range for detecting each of the second back surface reflection ultrasonic waves 112-B 2). Then, the thickness calculation unit 158 causes one of the back surface reflection ultrasonic waves of the two back surface reflection ultrasonic waves 112-B described above as the second detection gate 1042 in the gate setting unit 156 (for example, the second back surface reflection ultrasonic wave). When the thickness value of the steel pipe 400 calculated based on the second detection gate 1042 exceeds the reference thickness value when the detection gate indicating the range for detecting the sound wave 112-B 2) is set. Indicates the range for detecting the other back surface reflected ultrasonic wave (for example, the first back surface reflected ultrasonic wave 112-B1) of the two back surface reflected ultrasonic waves described above as the second detection gate 1042 in the setting unit 156 When the detection gate is set, the final thickness of the steel pipe 400 is calculated in consideration of the thickness value of the steel pipe 400 calculated based on the second detection gate 1042. That. Here, the reference thickness value corresponds to, for example, a threshold that can be arbitrarily set by the user. This form will be described below with reference to FIGS. 8 and 9.

  FIG. 8 is a view showing an example of a first thickness measurement result of the steel pipe 400 in the measuring device 100 according to the first embodiment of the present invention. Specifically, the first thickness measurement result shown in FIG. 8 is a thickness measurement result using a steel pipe without defects (defects) as the steel pipe 400.

  FIG. 8A shows a first thickness measurement result in the case where a detection gate indicating a range for detecting the first back surface reflection ultrasonic wave 112-B1 is set as the second detection gate 1042. There is. Specifically, in the area 1052 of FIG. 8A, together with the linearized image generated by the linearized image generation unit 155, the first related to the surface reflection ultrasonic wave 112-S detected by the position detection unit 157. A position 10521 and a second position 10522 pertaining to the first back surface reflected ultrasound wave 112-B1 are shown. In the area 1051 of FIG. 8A, the thickness chart calculated by the thickness calculation unit 158 based on the first position 10521 and the second position 10522 shown in the area 1052 of FIG. It shows.

  Also, FIG. 8B shows the first thickness measurement result when the detection gate indicating the range for detecting the second back surface reflection ultrasonic wave 112-B2 is set as the second detection gate 1042. It shows. Specifically, in the area 1054 of FIG. 8B, the first reflected surface ultrasonic wave 112-S detected by the position detection unit 157 together with the linearized image generated by the linearized image generation unit 155. The position 10541 and the second position 10542 relating to the second back surface reflection ultrasonic wave 112-B2 are shown. In the area 1053 of FIG. 8B, the thickness chart calculated by the thickness calculation unit 158 based on the first position 10541 and the second position 10542 shown in the area 1054 of FIG. It shows.

  In FIG. 8A, local thinness is observed at the position of the arrow 10511 in the region 1051 and the position of the star 10523 in the region 1052 corresponding to the position of the arrow 10511. On the other hand, in FIG. 8B, the position of the arrow 10531 in the area 1053 which is the same position as the position of the arrow 10511 in the area 1051 and the position of the star 10543 in the area 1054 corresponding to the position of the arrow 10531 Local thinness has not been observed. This means that noise was observed at the position of the arrow 10511 in the region 1051 and the position of the star 10523 in the region 1052 corresponding to the position of the arrow 10511. That is, on the same ultrasonic waveform data, noise largely affects either one of the first back surface reflected ultrasonic wave 112-B1 and the second back surface reflected ultrasonic wave 112-B2, and the other affects the other. It means that it is hard to receive.

  FIG. 9 is a view showing an example of a second thickness measurement result of the steel pipe 400 in the measuring device 100 according to the first embodiment of the present invention. Specifically, the second thickness measurement result shown in FIG. 9 is a thickness measurement result using a steel pipe in which four artificial defects (defects) are formed as the steel pipe 400.

  FIG. 9A shows a second thickness measurement result in the case where a detection gate indicating a range for detecting the first back surface reflection ultrasonic wave 112-B1 is set as the second detection gate 1042. There is. Specifically, in the area 1062 of FIG. 9A, together with the linearized image generated by the linearized image generation unit 155, the first related to the surface reflection ultrasonic wave 112-S detected by the position detection unit 157. A position 10621 and a second position 10622 according to the first back surface reflected ultrasound wave 112-B1 are shown. In the area 1061 of FIG. 9A, the thickness chart calculated by the thickness calculator 158 based on the first position 10621 and the second position 10622 shown in the area 1062 of FIG. It shows.

  Also, FIG. 9B shows the second thickness measurement result when the detection gate indicating the range for detecting the second back surface reflection ultrasonic wave 112-B2 is set as the second detection gate 1042. It shows. Specifically, in the area 1064 of FIG. 9B, the first reflected surface ultrasonic wave 112-S detected by the position detection unit 157 together with the linearized image generated by the linearized image generation unit 155. A position 10641 and a second position 10642 pertaining to the second back surface reflected ultrasound wave 112-B2 are shown. Also, in the area 1063 of FIG. 9B, the thickness chart calculated by the thickness calculation unit 158 based on the first position 10641 and the second position 10642 shown in the area 1064 of FIG. It shows.

  In the thickness chart shown in the area 1061 of FIG. 9A and the thickness chart shown in the area 1063 of FIG. 9B, thinness is observed at four local positions based on four artificial defects. There is. 9A is the same position as the position of the arrow 10611 of the area 1061 shown in FIG. 9A and the position of the star 10623 of the area 1062 corresponding to the position of the arrow 10611, and the position of the arrow 10611 of the area 1061. Local thinness is observed at the position of the arrow 10631 of the area 1063 shown in b) and the position of the star 10643 of the area 1064 corresponding to the position of the arrow 10631. Specifically, at the same position, a convexity indicating local thinness at the position of the star 10623 shown in the area 1062 of FIG. 9A and the position of the star 10643 shown in the area 1064 of FIG. The pattern of the shape is observed. As described above, when there is a defect (scratch) in the steel pipe 400, there is a similar change in any of the back surface reflection ultrasonic waves among the plurality of back surface reflection ultrasonic waves 112-B, and substantially the same thickness measurement results. .

  From the above, as the second detection gate 1042, a detection gate for detecting each of at least two back surface reflected ultrasonic waves 112-B can be set, and a detection gate for detecting one of the back surface reflected ultrasonic waves When the first thickness value of the steel pipe 400 calculated based on the above exceeds the reference thickness value, the second thickness value of the steel pipe 400 calculated based on the detection gate for detecting the other back surface reflection ultrasonic wave is used. Re-evaluate in consideration and calculate the final thickness of the steel pipe 400 (for example, when the difference between the first thickness value and the second thickness value is less than a predetermined value, any thickness value) The second thickness value may be adopted if the difference between the first thickness value and the second thickness value is equal to or greater than a predetermined value). Thereby, thickness measurement can be performed with high precision.

As described above, the measurement apparatus 100 according to the first embodiment generates ultrasonic waveform data indicating the amplitude of the ultrasonic wave 112 from the steel pipe 400 in time series at each measurement point of the steel pipe 400, The value of the amplitude of the ultrasonic waveform data generated for each measurement point is converted to the value of luminance, and the thickness direction of the steel pipe 400 and the relative movement direction of the ultrasonic probe 110 with respect to the steel pipe 400 are taken as axes. A B-scope image is generated, and the B-scope image is binarized to generate a binary image, and among the image particles in which the area of one of the binary values in the binary image is grouped, A process is performed to remove image particles that satisfy at least one of the area less than the predetermined area and the area less than the predetermined width, and the thickness of the steel pipe 400 for each measurement point based on the binary image obtained as a result of the process To calculate
According to this configuration, for example, when measuring the thickness of a plurality of portions of the steel pipe 400 while moving the ultrasonic probe 110 and the steel pipe 400 relative to each other, for example, the steel pipe 400 and the ultrasonic probe 110 Even when noise is generated due to disturbances such as when air bubbles exist in the intervening water or when a scale is attached to the surface of the steel pipe 400, processing is performed to remove the noise. Thickness measurement can be performed with high accuracy.

In the first embodiment described above, the value of the amplitude of the ultrasonic waveform data generated for each measurement point by the ultrasonic waveform data generation unit 151 is converted into the value of the luminance, and the thickness direction of the steel pipe 400 and The embodiment has been described in which the B scope image generation unit 152 for generating the B scope image having the axis of the relative movement direction of the ultrasonic probe 110 with respect to the steel pipe 400 is provided. However, the present invention is not limited to the mode of generating the B-scope image, and the thickness direction of the steel pipe 400 and the relative movement direction of the ultrasonic probe 110 with respect to the steel pipe 400 are the axes. A mode of generating two-dimensional array luminance data which is luminance data arrayed in a dimensional form is also included in the present invention. In this case, the B-scope image generation unit 152 configures “two-dimensional array luminance data generation means” that generates a B-scope image as two-dimensional array luminance data.
In the first embodiment described above, a binary image is generated by binarizing the B scope image generated by the B scope image generation unit 152 using a predetermined binarization threshold to generate a binary image. The embodiment in which the generation unit 153 is provided has been described. However, the present invention is not limited to the mode of generating this binary image, and the above-mentioned two-dimensional array luminance data is binarized using a predetermined binarization threshold to obtain a two-dimensional array. The form of generating binary data is also included in the present invention. In this case, the binary image generation unit 153 constitutes “two-dimensional array binary data generation means” that generates a binary image as two-dimensional array binary data.
In the first embodiment described above, of the image particles in which the area of one of the binary values in the binary image described above is grouped, at least one of the area less than the predetermined area and the area less than the predetermined width. The embodiment has been described in which the binary image processing unit 154 is provided to perform processing for removing image particles that satisfy either one. However, the present invention is not limited to the mode of processing this binary image, and one region of one of the binary values in the two-dimensional array binary data described above is a lump region. Among the embodiments, the present invention also includes a mode of performing processing for removing one mass region that satisfies at least one of the area less than the predetermined area and the area less than the predetermined width. In this case, the binary image processing unit 154 configures “two-dimensional array binary data processing means” that performs processing of removing image particles of the binary image as one mass region of two-dimensional array binary data. And in this case, the thickness calculation unit 158 calculates the thickness of the steel pipe 400 for each measurement point based on the two-dimensional array binary data obtained as a result of the processing by the two-dimensional array binary data processing means. Take the form of calculation.

Second Embodiment
Next, a second embodiment of the present invention will be described.

<Aspect 1 of the Second Embodiment>
First, aspect 1 of the second embodiment of the present invention will be described.

  FIG. 10 is a view showing an example of a schematic configuration of a measuring apparatus 200-1 according to aspect 1 of the second embodiment of the present invention. In FIG. 10, the same components as those in the schematic configuration of the measuring apparatus 100 according to the first embodiment shown in FIG. 1 are denoted by the same reference numerals, and the detailed description thereof will be omitted as necessary. This measuring apparatus 200-1 is an apparatus for measuring the thickness of a steel pipe 400 which is a material to be inspected, like the measuring apparatus 100 according to the first embodiment shown in FIG.

  In the first embodiment of the present embodiment, when measuring the thickness of the steel pipe 400, the thickness of a reference material (hereinafter simply referred to as "reference material") 410 serving as a reference of the steel pipe 400 is measured in advance. The thickness of the reference member 410 is also between the surface 410S of the reference member which is the outer surface of the reference member 410 and the back surface 410B of the reference member which is the inner surface of the reference member 410. It is determined by In addition, the value of the thickness of the reference material is assumed to be accurately known by another measurement or the like separately performed in advance.

  As shown in FIG. 10, the measuring apparatus 200-1 includes the ultrasonic probe 110, the transmitting / receiving unit 120, the amplifying unit 130, the A / D converting unit 140, the control / processing unit 250-1, the information input unit 160, and communication It is configured to have a unit 170, a storage unit 180, and a display unit 190.

  The ultrasonic probe 110 controls transmission and reception of ultrasonic waves at a plurality of locations of the steel pipe 400 by moving relative to the steel pipe 400 as in the first embodiment.

  As an example of relatively moving the ultrasonic probe 110 and the steel pipe 400, in FIG. 10, the ultrasonic probe 110 moves in the circumferential direction of the steel pipe 400 based on the control of the control and processing unit 250-1. Although the form which moves is illustrated, in the present invention, it is not limited to this form. For example, a mode in which the steel pipe 400 moves while the ultrasonic probe 110 is at rest is also applicable to the present invention, and a plurality of ultrasonic probes 110 are provided, and those ultrasonic probes 110 are also provided. A mode in which the thickness measurement position in the steel pipe 400 is moved by electrically changing the transmission direction of the ultrasonic wave by appropriately controlling the ultrasonic wave transmission timing is also applicable to the present invention. 10 shows an example in which the ultrasonic probe 110 moves in the circumferential direction of the steel pipe 400, for example, the ultrasonic probe 110 is in the axial direction of the steel pipe 400 (z direction in FIG. 10). It is applicable also to the form which moves. Further, FIG. 10 shows an example in which one ultrasonic probe 110 is provided in the circumferential direction of the steel pipe 400 in order to simplify the description, but as described above, for example, to improve the measurement efficiency It is applicable also to the form which provides a plurality of ultrasonic probes 110 in the circumferential direction of steel pipe 400.

  In the first embodiment of the present embodiment, as described above, an example of measuring the thickness of the reference material 410 in advance when measuring the thickness of the steel pipe 400 will be described. In the case of measuring the thickness, the ultrasonic probe 110 is opposed to the reference material 410 in a state where the ultrasonic probe 110 and the reference material 410 are both kept stationary in order to reduce noise and other disturbances. Thus, it is possible to adopt a form in which ultrasonic waves are transmitted and received.

  The transmitting and receiving unit 120 transmits and receives ultrasonic waves to and from the steel pipe 400 via the ultrasonic probe 110 based on the control of the control and processing unit 250-1. The transmission / reception unit 120 includes a transmission unit 121 and a reception unit 122.

  The transmitting unit 121 transmits the ultrasonic wave 111 toward the surface 400S of the steel pipe via the ultrasonic probe 110 moving relative to the steel pipe 400 based on the control of the control and processing unit 250-1. Do the process. Moreover, the receiving part 122 performs the process which receives the ultrasonic wave 112 from the steel pipe 400 via the ultrasonic probe 110 based on control of control / process part 250-1.

  In the first embodiment of the present embodiment, as described above, an example of measuring the thickness of the reference material 410 in advance when measuring the thickness of the steel pipe 400 will be described. When the thickness is to be measured, the transmitting unit 121 transmits the ultrasonic wave 111 toward the surface 410 S of the reference material via the ultrasonic probe 110, and the receiving unit 122 also detects the ultrasonic probe 110. The form of receiving the ultrasonic wave 112 from the reference material 410 is taken.

  The amplification unit 130 amplifies the ultrasonic waves 112 from the steel pipe 400 received by the reception unit 122 based on the control of the control and processing unit 250-1. In particular, based on the amplification degree calculated by the amplification degree calculation unit 2532 described later, the amplification unit 130 enlarges and shrinks the size of the ultrasonic waveform data in the amplitude direction with respect to the entire ultrasonic waveform data. Alternatively, it is possible to carry out a process of fractioning. In the first embodiment of the present embodiment, as described above, an example of measuring the thickness of the reference material 410 when measuring the thickness of the steel pipe 400 will be described, but the thickness of the reference material 410 is measured In this case, the amplification unit 130 amplifies the ultrasonic wave 112 from the reference material 410 received by the reception unit 122.

  The A / D conversion unit 140 performs processing of converting the ultrasonic wave 112 from the steel pipe 400 amplified by the amplification unit 130 from an analog signal to a digital signal based on the control of the control / processing unit 250-1. In the first embodiment of the present embodiment, as described above, an example of measuring the thickness of the reference material 410 when measuring the thickness of the steel pipe 400 will be described, but the thickness of the reference material 410 is measured In this case, the A / D conversion unit 140 converts the ultrasonic waves 112 from the reference material 410 after being amplified by the amplification unit 130 from analog signals into digital signals.

  In mode 1 of the present embodiment, the signals having passed through the amplification unit 130 are in the order of passing through the A / D conversion unit 140, but the order is reversed and the signals pass through the A / D conversion unit 140. These signals can also be amplified in order by the amplification unit 130. By so doing, since digital signals are to be amplified, signal handling can be facilitated.

  The control / processing unit 250-1 controls each component of the measuring apparatus 200-1 based on, for example, input information input from the information input unit 160 and input information input from the communication unit 170, and the measuring apparatus 200. Control the operation of -1. Also, the control / processing unit 250-1 performs various processes based on, for example, input information input from the information input unit 160 and input information input from the communication unit 170. As shown in FIG. 10, the control / processing unit 250-1 includes an ultrasonic waveform data processing unit 253- that includes an ultrasonic waveform data generation unit 251, a gate setting unit 252, a histogram generation unit 2531 and an amplification degree calculation unit 2532. 1, a reception time calculation unit 254, a thickness calculation unit 255, and a display control unit 256. The description of each configuration unit 251 to 256 in the control / processing unit 250-1 will be described later.

  For example, the information input unit 160 inputs, to the control / processing unit 250-1, input information input by the user.

  The communication unit 170 manages communication with the external device G via the computer network N. In the case of the second embodiment, examples of the external device G include the measuring device 100 according to the first embodiment described above and the measuring device 300 according to the third embodiment to be described later.

  The storage unit 180 stores various types of information and various types of data used by the control and processing unit 250-1, and various types of information and various types of data obtained by the processing of the control and processing unit 250-1.

  The display unit 190 displays various types of information, various types of data, and the like based on the control of the control and processing unit 250-1.

  Next, the components 251 to 256 in the control / processing unit 250-1 of FIG. 10 will be described.

  The ultrasonic waveform data generation unit 251 shown in FIG. 10 generates the amplitude of the ultrasonic wave 112 from the steel pipe 400 after being amplified by the amplification unit 130 (and after being A / D converted by the A / D conversion unit 140). Generate ultrasonic waveform data shown in series. The ultrasonic waveform data corresponds to the “first ultrasonic waveform data” in the present embodiment.

  FIG. 11 is a schematic diagram for explaining ultrasonic waveform data generated by the ultrasonic waveform data generation unit 251 shown in FIG. In FIG. 11, the same components as those shown in FIG. 10 are denoted by the same reference numerals.

  First, in FIG. 11A, the surface 400S of the steel pipe and the back surface 400B of the steel pipe shown in FIG. 10 are drawn in the horizontal direction, and ultrasonic waves 111 directed from the ultrasonic probe 110 to the steel pipe 400 Three patterns of ultrasonic waves 112 directed to the feeler 110 are shown. In the first pattern shown on the left side of FIG. 11A, the ultrasonic wave 111 traveling from the ultrasonic probe 110 to the steel pipe 400 is reflected by the surface 400S of the steel pipe, and ultrasonic probe is performed as surface reflected ultrasonic wave 112-S. It shows a situation going to the child 110. In the second pattern shown in the center of FIG. 11A, the ultrasonic wave 111 traveling from the ultrasonic probe 110 to the steel pipe 400 is reflected by the back surface 400B of the steel pipe, and the first back surface reflection ultrasonic wave 112-B1 As shown in the figure, a state of going to the ultrasound probe 110 is shown. In the third pattern shown on the right side of FIG. 11A, the ultrasonic wave 111 traveling from the ultrasonic probe 110 to the steel pipe 400 is reflected by the back surface 400B of the steel pipe and then reflected by the surface 400S of the steel pipe It is reflected again at the back surface 400B of the steel pipe, and shows a state of traveling toward the ultrasound probe 110 as the second back surface reflection ultrasonic wave 112-B2. Specifically, in the present embodiment, regarding the back surface reflection ultrasonic wave 112-B, if n is a positive integer, the nth back surface reflection ultrasonic wave 112-Bn is between the surface 400S of the steel pipe and the back surface 400B of the steel pipe ( Alternatively, between the surface 410S of the reference material and the back surface 410B of the reference material) is defined as n-reciprocated back reflection ultrasonic waves 112-B.

  FIG. 11B shows the amplitudes of the surface reflected ultrasonic wave 112-S, the first back surface reflected ultrasonic wave 112-B1 and the second back surface reflected ultrasonic wave 112-B2 shown in FIG. 11A in time series. It is a figure which shows typically an example of the ultrasonic wave waveform data. In FIG. 11B, the surface reflection ultrasonic wave 112-S shown in FIG. 11A is S echo, the first back surface reflection ultrasonic wave 112-B1 is B1 echo, and the second back surface reflection ultrasonic wave 112-B2 The waveform is shown as B2 echo.

  Further, an ultrasonic waveform data processing unit 253-1 to be described later indicates an ultrasonic waveform indicating the amplitude of the ultrasonic wave 112 from the steel pipe 400 in time series based on the amplification degree calculated by the amplification degree calculation unit 2532 to be described later. A process of changing the amplitude of data (first ultrasonic waveform data) is performed to acquire new ultrasonic waveform data. The new ultrasonic waveform data corresponds to the “second ultrasonic waveform data” in the present embodiment.

  Furthermore, in the first embodiment of the present embodiment, as described above, an example of measuring the thickness of the reference material 410 in advance when measuring the thickness of the steel pipe 400 will be described. When the thickness is to be measured, the ultrasonic waveform data generation unit 251 shown in FIG. 10 is a reference material 410 after being amplified by the amplification unit 130 (after being further A / D converted by the A / D conversion unit 140). To generate ultrasonic waveform data representing the amplitudes of the ultrasonic waves 112 from time-series in time series. This ultrasound waveform data corresponds to the "third ultrasound waveform data" in the present embodiment. The example shown in FIG. 11 can be applied to the ultrasonic waveform data in the case of using the reference material 410 as in the case of the ultrasonic waveform data in the case of using the steel pipe 400 described above.

  The gate setting unit 252 shown in FIG. 10 is a first example showing a range for detecting surface reflection ultrasonic waves 112-S with respect to each of the ultrasonic waveform data in the first to third ultrasonic waveform data described above. A process of setting a detection gate and a second detection gate indicating a range for detecting the back surface reflection ultrasonic wave 112-B is performed. FIG. 11B illustrates an example of the first detection gate 2011 and the second detection gate 2012 set by the gate setting unit 252.

  Here, in the present embodiment, as shown in FIG. 11B, the second back surface reflection ultrasonic wave 112-B2 is detected as the second detection gate 2012 for detecting the back surface reflection ultrasonic wave 112-B. In the present invention, the present invention is not limited to this embodiment. For example, an embodiment in which an apparatus for detecting the first back surface reflection ultrasonic wave 112-B1 is set, or a third back surface reflection The form which sets what detects an ultrasonic wave and subsequent back surface reflected ultrasonic waves is also applicable to this invention.

  Further, in the present embodiment, as shown in FIG. 11B, the first detection gate 2011 and the second detection gate 2012 are set to the lower limit side of the amplitude, but in the present invention, this form is used. The present invention is not limited to this, and a mode in which the first detection gate 2011 and the second detection gate 2012 are set on the upper limit side of the amplitude is also applicable to the present invention. Further, the first detection gate 2011 is the upper limit side of the amplitude and the second detection gate 2012 is the lower limit side of the amplitude, or the first detection gate 2011 is the lower limit side of the amplitude and the second detection gate 2012 is the upper limit of the amplitude The mode set to the side is also applicable to the present invention. By doing so, it becomes possible to cope with the phase change of the signal.

Here, setting examples of the first detection gate 2011 and the second detection gate 2012 by the gate setting unit 252 will be described below.
In aspect 1 of the present embodiment, as the first detection gate 2011, the gate setting unit 252 sets the time of the start point at the time after the reception unit 122 starts the reception process, and the length of that time And the level of its amplitude value. Further, in aspect 1 of the present embodiment, the gate setting unit 252 sets the time of the start point as the second detection gate 2012 from the time (TS) of the intersection of the ultrasonic waveform and the first detection gate 2011. The time is set, and the length of the time and the level of the amplitude value are set. The setting of the first detection gate 2011 and the second detection gate 2012 described here is an example, and the present invention is not limited to this embodiment. The surface reflected ultrasonic wave 112-S receives, for example, the time when the amplitude peak of the surface reflected ultrasonic wave 112-S and the first detection gate 2011 intersect at the beginning (appropriately, adjustment such as “the second time” is also possible). It is assumed that it is time returned to the section 122, and even if there are other amplitude peaks in the first detection gate 2011, they are considered as noise. In addition, for example, the time at which the amplitude peak of the second back surface reflection ultrasonic wave 112-B2 and the second detection gate 2012 intersect at the beginning (where appropriate, such as adjustment of the “second time” is also possible) is the back surface reflection ultrasonic wave It is assumed that it is the time when 112-B has returned to the receiving unit 122, and that there are other amplitudes in the second detection gate 2012 as they are considered as noise. In this way, by taking into consideration the velocity of ultrasonic waves, it is possible to mechanically know the distance of the steel pipe 400 (or the reference material 410) to the front and back surfaces, and as a result, the thickness can be known. It will be. Therefore, it is necessary to determine optimum values by performing various tests in advance in the amplitude direction (levels of amplitude values) of the first detection gate 2011 and the second detection gate 2012. .

  The ultrasonic waveform data processing unit 253-1 illustrated in FIG. 10 is a first ultrasonic waveform data generated by the ultrasonic waveform data generation unit 251 and indicating the amplitude of the ultrasonic waves 112 from the steel pipe 400 in time series. The processing of changing the amplitude is performed on the data in the range of at least one of the first detection gate 2011 and the second detection gate 2012 in the ultrasonic waveform data of (1). As shown in FIG. 10, the ultrasonic waveform data processing unit 253-1 includes a histogram creating unit 2531 and an amplification degree calculating unit 2532.

  The histogram creation unit 2531 shown in FIG. 10 is a histogram related to the amplitude of the ultrasonic wave within the range of one of the first detection gate 2011 and the second detection gate 2012 for the first ultrasonic waveform data. Process to create The histogram created for the first ultrasonic waveform data corresponds to the “first histogram” in the present embodiment. Further, in the present embodiment, the histogram creating unit 2531 creates a histogram relating to the amplitude of the ultrasonic wave within the range of the second detection gate 2012, but the present invention is limited to this form. Alternatively, a form of creating a histogram relating to the amplitude of ultrasonic waves within the range of the first detection gate 2011 is also applicable to the present invention. The process of the histogram creation unit 2531 will be described using FIGS. 12 and 13.

  12 shows the first ultrasonic waveform data generated by the ultrasonic waveform data generation unit 251 shown in FIG. 10, and the first detection gate and the second detection gate set by the gate setting unit 252 shown in FIG. It is a figure which shows an example of a detection gate. In FIG. 12, the same components as those shown in FIG. 11 are denoted by the same reference numerals. The amplitude shown on the vertical axis of FIG. 12 is, for example, the amplitude of the ultrasonic wave input to the A / D converter 140 when the A / D converter 140 with an input range of ± 1.0 V and 8-bit is used. Is “0” when the voltage is −1.0 V, “127” when the amplitude of the ultrasonic wave input to the A / D converter 140 is 0.0 V, the amplitude of the ultrasonic wave input to the A / D converter 140 is When +1.0 V, the value is "255". Further, when the amplitude of the ultrasonic wave exceeding the input range of the A / D conversion unit 140 is input, for example, when the amplitude of the ultrasonic wave input to the A / D conversion unit 140 is smaller than -1.0 V For example, when the amplitude of the ultrasonic wave input to the A / D conversion unit 140 is larger than +1.0 V, it is forced to "255". Further, in the aspect 1 of the present embodiment, the time shown on the horizontal axis of FIG. 12 indicates the elapsed time since the reception unit 122 starts the reception process.

  FIG. 13 shows the case where the first histogram relating to the ultrasonic wave amplitude is generated within the range of the second detection gate 2012 for the first ultrasonic waveform data shown in FIG. 12 in the histogram generation unit 2531 shown in FIG. Is a diagram illustrating an example of In the first histogram shown in FIG. 13, the horizontal axis represents the amplitude of the ultrasonic wave shown in FIG. 12, and the vertical axis represents the count value of each bin.

  Further, in aspect 1 of the present embodiment, the histogram creating unit 2531 shown in FIG. 10 is a super that shows the amplitude of the ultrasound 112 from the reference material 410 generated by the ultrasound waveform data generating unit 251 in time series. Also for the third ultrasonic waveform data, which is the ultrasonic waveform data, similarly to the first ultrasonic waveform data described above, processing for creating a histogram related to the amplitude of the ultrasonic wave within the range of the second detection gate 2012 Do. The histogram created for the third ultrasonic waveform data corresponds to the “second histogram” in the present application.

  FIG. 14 shows an example in the case where the second histogram related to the amplitude of the ultrasonic wave is generated within the range of the second detection gate 2012 for the third ultrasonic waveform data in the histogram generation unit 2531 shown in FIG. FIG. Specifically, FIG. 14 shows a second histogram represented by bins similar to the first histogram shown in FIG. When the second histogram shown in FIG. 14 is compared with the first histogram shown in FIG. 13, the second histogram shown in FIG. 14 has the smallest bin and the largest bin than the first histogram shown in FIG. The count value of is increasing. From this, in the third ultrasonic waveform data (not shown), the amplitude of the ultrasonic wave in the range of the second detection gate 2012 is lower than that of the first ultrasonic waveform data shown in FIG. It can be inferred that the ratio forced to “0” and the upper limit “255” is high.

  The amplification degree calculation unit 2532 shown in FIG. 10 performs a process of calculating the amplification degree at which the count value of a specific bin in the first histogram created by the histogram creation unit 2531 becomes a predetermined value.

  Specifically, the amplification degree calculation unit 2532 according to aspect 1 of the present embodiment is the smallest bin 2031 including 0 among the bins of the first histogram shown in FIG. 13 (ie, the A / D conversion unit 140 Among the bins of the second histogram shown in FIG. 14, the count value of the bin including the lower limit value is the smallest bin 2041 (that is, the lower limit value of the A / D conversion unit 140) including 0 corresponding to the bin 2031. Amplifying is performed so as to be the same as the count value of the contained bin, and the amplification factor is calculated as “amplification degree”.

  Here, in the present embodiment, an example in which the minimum bin including 0 is applied as a specific bin is described, but the present invention is not limited to this embodiment, and, for example, as a specific bin A mode in which the largest bin including 255 (that is, the bin including the upper limit of the A / D conversion unit 140) is applied is also applicable to the present invention. Further, in the present embodiment, an example has been described in which amplification is performed so as to be the same as the count value of the smallest bin 2041, but it is not necessary to be exactly the same. It is also applicable to the present invention that the ultrasonic wave 112 -B can be detected to be approximately the same as the count value of the smallest bin 2041 as long as the ultrasonic wave 112 -B can be detected.

  In addition, as a method of calculating the amplification degree by the amplification degree calculation unit 2532, for example, a method of amplifying ultrasonic waveform data in fine steps and repeating it until the count value of the smallest bin is compared each time A method of preparing in advance calibration curve data showing the relationship between the minimum bin count value and the corresponding amplification degree, and referring to this calibration curve data to calculate the amplification degree from the minimum bin count value, etc. Is considered. A method of calculating the amplification degree using this calibration curve data will be described with reference to FIG.

  FIG. 15 is a view showing an example of calibration curve data used when the amplification degree is calculated by the amplification degree calculation unit 2532 shown in FIG. Specifically, FIG. 15 shows the count value (horizontal axis) of a specific bin in the first histogram, the count value of the specific bin in the first histogram, and the count value of the specific bin in the second histogram. An example of calibration curve data showing the relationship with the amplification degree (vertical axis) determined by The calibration curve data shown in FIG. 15 is stored in advance in the storage unit 180.

  In this case, in aspect 1 of the present embodiment, the amplification degree calculation unit 2532 shown in FIG. 10 reads the calibration curve data shown in FIG. 15 from the storage unit 180, and generates the first histogram created by the histogram creation unit 2531. The amplification degree is calculated from the count value of the smallest bin 2031 at.

  Then, when the amplification degree is calculated by the amplification degree calculation unit 2532, the ultrasonic waveform data processing unit 253-1 shown in FIG. 10 then performs the first calculation based on the amplification degree calculated by the amplification degree calculation unit 2532. The processing of changing the amplitude of the ultrasonic waveform data of (1) is performed to acquire second ultrasonic waveform data which is new ultrasonic waveform data. Thereafter, the gate setting unit 252 shown in FIG. 10 sets a first detection gate 2011 and a second detection gate 2012 for the second ultrasonic waveform data.

  16 shows the second ultrasonic waveform data acquired by the ultrasonic waveform data processing unit 253-1 shown in FIG. 10, and the first detection gate and the first detection gate set by the gate setting unit 252 shown in FIG. It is a figure which shows an example of a 2 detection gate. Here, in aspect 1 of the present embodiment, the gate setting unit 252 shown in FIG. 10 compares the second ultrasonic waveform data shown in FIG. 16 with the first ultrasonic waveform data shown in FIG. It is assumed that the first detection gate 2011 and the second detection gate 2012 at the same level as the first detection gate 2011 and the second detection gate 2012 which have been set are set.

  The reception time calculation unit 254 shown in FIG. 10 receives the surface reflection ultrasonic waves 112-S from the range of the first detection gate 2011 at the reception unit 122 for the second ultrasonic waveform data shown in FIG. Processing for calculating the first reception time which is the second reception time which is the time when the second back surface reflection ultrasonic wave 112-B2 is received by the reception unit 122 from within the range of the second detection gate 2012 Do. Specifically, in the aspect 1 of the present embodiment, as shown in FIG. 11B, in the reception time calculation unit 254 shown in FIG. 10, the ultrasonic waveform and the first detection gate 2011 first intersect. The time TS of the intersection is calculated as the first reception time, and the time TB2 of the intersection where the ultrasonic waveform and the second detection gate 2012 first intersect is calculated as the second reception time. Note that the time at which the amplitude 0 crosses first is calculated as time TS, going back from the intersection of the ultrasonic waveform and the first detection gate 2011, and the ultrasonic waveform and the second detection gate 2012 It is also possible to calculate, as the second reception time, a time TB2 that first crosses the amplitude 0, going back from the intersection point to the front. Since the time of the intersection with the amplitude 0 is not affected by the increase or decrease of the amplitude, this makes it possible to calculate the time with high accuracy.

  Furthermore, although the aspect 1 of this embodiment demonstrates the example which measures the thickness of the reference material 410 when measuring the thickness of the steel pipe 400 as mentioned above, it measures the thickness of this reference material 410 In this case, the reception time calculation unit 254 shown in FIG. 10 also applies the first ultrasonic waveform data to the third ultrasonic waveform data, which indicates the amplitude of the ultrasonic waves 112 from the reference material 410 in time series. The reception time and the second reception time are calculated. Note that details of an example in which the thickness of the reference material 410 is used when measuring the thickness of the steel pipe 400 will be described later in the description of the flowcharts of FIGS. 17 and 18.

  The thickness calculation unit 255 shown in FIG. 10 is a superstructure that propagates the inside of the steel pipe 400, the first reception time and the second reception time in the second ultrasonic waveform data, calculated by the reception time calculation unit 254. The thickness of the steel pipe 400 is calculated based on the speed of the sound wave. In this case, in the first embodiment of the present embodiment, as described above, an example of measuring the thickness of the reference material 410 when measuring the thickness of the steel pipe 400 will be described. When measuring, the thickness calculator 255 shown in FIG. 10 calculates the first reception time and the second reception time in the third ultrasonic waveform data calculated by the reception time calculator 254, and the reference material 410. The process of calculating the thickness of the reference material 410 is performed based on the velocity of the ultrasonic wave that has propagated through the inside of Here, in aspect 1 of the present embodiment, the data of the velocity of the ultrasonic wave propagated inside the steel pipe 400 and the data of the velocity of the ultrasonic wave propagated inside the reference material 410 are stored in advance in the storage unit 180 It is assumed that

  In the above, the example has been described in which the detection gate level is fixed and the waveform amplitude (amplification degree) is variable, but essentially, there is a problem with the relative relationship between the detection gate level and the waveform amplification degree. Therefore, it is also possible to make the gate level (attenuation degree) variable by fixing the amplitude of the waveform. That is, since increasing the amplification of the waveform and lowering the level of the detection gate are synonymous in the technical idea of the present invention, the relationship of "count value-amplification (magnification)" in FIG. The same processing can be performed by substituting “count value−gate level attenuation”.

  The display control unit 256 illustrated in FIG. 10 performs control to display the thickness of the steel pipe 400 calculated by the thickness calculation unit 255 on the display unit 190, for example.

  Next, the process procedure of the measuring method by the measuring apparatus 200-1 which concerns on the aspect 1 of 2nd Embodiment is demonstrated.

First, the processing procedure of the thickness measurement method of the reference material 410 will be described.
FIG. 17 is a flow chart showing an example of the processing procedure of the method for measuring the thickness of the reference material 410 by the measurement apparatus 200-1 according to aspect 1 of the second embodiment of the present invention.

  First, in step S2101 of FIG. 17, the control / processing unit 250-1 sets the amplification degree (gain) of the amplification unit 130 based on, for example, input information input from the information input unit 160.

  Subsequently, in step S2102 in FIG. 17, the transmission unit 121 transmits the ultrasound 111 toward the surface 410S of the reference material via the ultrasound probe 110 based on the control of the control and processing unit 250-1. Do.

  Subsequently, in step S2103 of FIG. 17, the receiving unit 122 receives the ultrasonic waves 112 from the reference material 410 via the ultrasonic probe 110 based on the control of the control and processing unit 250-1.

  Under the present circumstances, in this embodiment, the process of step S2102 and S2103 is performed in the state which made the ultrasound probe 110 and the reference material 410 stand still.

  Subsequently, in step S2104 of FIG. 17, the ultrasonic waveform data generation unit 251 receives the signal from the reference material 410 after being amplified by the amplification unit 130 (after being A / D converted by the A / D conversion unit 140). Third ultrasonic waveform data, which is ultrasonic waveform data representing the amplitude of the ultrasonic waves 112 in time series, is generated. Here, for example, it is assumed that ultrasonic waveform data shown in FIG. 11 (b) is generated.

  Subsequently, in step S2105 of FIG. 17, the gate setting unit 252 indicates a first range for detecting surface reflected ultrasound waves 112-S with respect to the third ultrasound waveform data generated in step S2104. And a second detection gate 2012 indicating a range for detecting the back surface reflection ultrasonic wave 112-B. Here, for example, it is assumed that the first detection gate 2011 and the second detection gate 2012 shown in FIG. 11B are set.

  Subsequently, in step S2106 in FIG. 17, the histogram generation unit 2531 performs the second generation of the third ultrasonic waveform data representing in time series the amplitude of the ultrasonic wave 112 from the reference material 410 generated in step S2104. A second histogram relating to the amplitude of the ultrasound within the range of the detection gate 2012 is created. Here, for example, it is assumed that the second histogram shown in FIG. 14 is created.

  Subsequently, in step S2107 in FIG. 17, the control / processing unit 250-1 causes a specific bin in the second histogram created in step S2106 (in the present embodiment, for example, the minimum bin 2041 shown in FIG. 14). It is determined whether the count value of is within a predetermined range which is determined in advance.

  If it is determined in step S2107 in FIG. 17 that the count value of a specific bin in the second histogram created in step S2106 is not within the predetermined range (S2107 / NO), the step in FIG. It returns to S2101 and performs the process after step S2101 again.

On the other hand, if it is determined in step S2107 in FIG. 17 that the count value of a specific bin in the second histogram created in step S2106 is within a predetermined range (S2107 / YES), The process proceeds to step S2108 of 17.
When the process proceeds to step S2108 in FIG. 17, the reception time calculation unit 254 receives surface reflected ultrasonic waves 112-S from within the range of the first detection gate 2011 for the third ultrasonic waveform data generated in step S2104. The second reception time, which is the time when the receiving unit 122 receives the second back surface reflection ultrasonic wave 112-B2 from within the range of the second detection gate 2012, the first reception time, which is the time received by the unit 122 And calculate. Specifically, in aspect 1 of the present embodiment, as shown in FIG. 11B, the reception time calculation unit 254 sets the time TS of the intersection of the ultrasonic waveform and the first detection gate 2011 to the first time. It is calculated as the reception time, and time TB2 at the intersection of the ultrasonic waveform and the second detection gate 2012 is calculated as the second reception time.

  Subsequently, in step S2109 of FIG. 17, the thickness calculator 255 calculates the inside of the reference material 410 stored in the storage unit 180 and the first reception time and the second reception time calculated in step S2108. The thickness of the reference material 410 is calculated from the velocity of the propagated ultrasonic wave.

  Subsequently, in step S2110 of FIG. 17, the control / processing unit 250-1 causes the thickness of the reference material 410 calculated in step S2109 to be, for example, the actual thickness of the reference material 410 stored in advance in the storage unit 180. It is determined whether or not the thickness is within a predetermined range determined in advance as compared with the thickness.

  If the thickness of the reference material 410 calculated in step S2109 is not within the predetermined range as compared with the actual thickness of the reference material 410 as a result of the determination in step S2110 of FIG. 17 (S2110 / NO), ultrasonic waves Since it is conceivable that a problem such as picking up noise has occurred at the time of detection of, the process returns to step S2101 in FIG. 17, and the processes after step S2101 are performed again.

On the other hand, as a result of the determination in step S2110 of FIG. 17, if the thickness of the reference material 410 calculated in step S2109 is within the predetermined range compared to the actual thickness of the reference material 410 (S2110 / YES) The process proceeds to step S2111 in FIG.
When the process proceeds to step S2111 in FIG. 17, the thickness calculator 255 calculates a thickness correction value to be described later based on the difference between the thickness of the reference material 410 calculated in step S2109 and the actual thickness of the reference material 410. decide.

  Thereafter, for example, the control / processing unit 250-1 stores data of the thickness correction value determined in step S2111 in the storage unit 180. Furthermore, for example, the control / processing unit 250-1 stores the data of the second histogram created in step S2106 for the third ultrasonic waveform data used in calculating the thickness of the reference material 410 in the storage unit 180. Remember.

  When the process in step S2111 in FIG. 17 ends, the process in the flowchart in FIG. 17 showing an example of the process procedure of the thickness measurement method of the reference material 410 ends.

Next, the processing procedure of the method for measuring the thickness of the steel pipe 400, which is a material to be inspected, will be described.
FIG. 18 is a flow chart showing an example of the processing procedure of the method for measuring the thickness of the steel pipe 400 by the measuring apparatus 200-1 according to aspect 1 of the second embodiment of the present invention. When the process of the flowchart of FIG. 18 is started, it is assumed that the data of the thickness correction value obtained by the process of the flowchart of FIG. 17 and the data of the second histogram are already stored in the storage unit 180. . In addition, when the process of the flowchart in FIG. 18 is started, for example, it is assumed that the amplification degree is set to the same amplification degree as the amplification degree set in step S2101 in FIG.

  First, in step S2201 in FIG. 18, the transmitter 121 transmits ultrasonic waves toward the surface 400S of the steel pipe, which is the material to be inspected, via the ultrasonic probe 110 based on the control of the control and processing unit 250-1. Send 111

  Subsequently, in step S2202 of FIG. 18, the receiving unit 122 receives the ultrasonic waves 112 from the steel pipe 400 via the ultrasonic probe 110 based on the control of the control and processing unit 250-1.

  Subsequently, in step S 2203 of FIG. 18, the ultrasonic waveform data generation unit 251 transmits the superstructure from the steel pipe 400 after being amplified by the amplification unit 130 (after being A / D converted by the A / D conversion unit 140). First ultrasonic waveform data, which is ultrasonic waveform data representing the amplitude of the sound wave 112 in time series, is generated. Here, for example, it is assumed that ultrasonic waveform data shown in FIG. 12 is generated.

  Subsequently, in step S2204 in FIG. 18, the gate setting unit 252 indicates a first range for detecting surface reflected ultrasound waves 112-S with respect to the first ultrasound waveform data generated in step S2203. And a second detection gate 2012 indicating a range for detecting the back surface reflection ultrasonic wave 112-B. Here, for example, it is assumed that the first detection gate 2011 and the second detection gate 2012 shown in FIG. 12 are set. Further, in aspect 1 of the present embodiment, the gate setting unit 252 sets the first detection gate 2011 and the second detection gate 2011 set in step S2105 of FIG. 17 with respect to the first ultrasonic waveform data shown in FIG. It is assumed that the first detection gate 2011 and the second detection gate 2012 at the same level as the detection gate 2012 are set.

  Subsequently, in step S2205 of FIG. 18, the histogram generation unit 2531 performs the second generation of the first ultrasonic waveform data representing in time series the amplitude of the ultrasonic wave 112 from the steel pipe 400 generated in step S2203. In the range of the detection gate 2012, a first histogram relating to the amplitude of the ultrasonic wave is created. Here, for example, it is assumed that the first histogram shown in FIG. 13 is created.

  Subsequently, in step S2206 of FIG. 18, the amplification degree calculation unit 2532 performs a process of calculating an amplification degree in which the count value of a specific bin in the first histogram created in step S2205 is a predetermined value. Specifically, in the aspect 1 of the present embodiment, the amplification degree calculation unit 2532 is configured such that the count value of the minimum bin 2031 in the first histogram illustrated in FIG. A process of calculating the amplification degree which is the count value of the smallest bin 2041 in the histogram of 2 is performed. At this time, as a method of calculating the amplification degree, as described above, for example, a method of amplifying ultrasonic waveform data in fine steps and repeating it until the count value of the smallest bin is compared each time or until it becomes a predetermined value Calibration curve data (Figure 15) showing the relationship between the smallest bin count value and the corresponding amplification degree is prepared beforehand, and the amplification degree is calculated from the smallest bin count value with reference to this calibration curve data. A method of calculating etc. can be considered.

  Subsequently, in step S2207 of FIG. 18, the ultrasonic waveform data processing unit 253-1 changes the amplitude of the first ultrasonic waveform data generated in step S2203 based on the amplification degree calculated in step S2206. Processing is performed to obtain second ultrasonic waveform data, which is new ultrasonic waveform data. Here, for example, it is assumed that ultrasonic waveform data shown in FIG. 16 is generated. Thereafter, the gate setting unit 252 sets the first detection gate 2011 and the second detection gate 2012 for the second ultrasonic waveform data. Here, in the first aspect of the present embodiment, the gate setting unit 252 sets the first detection gate 2011 and the second detection gate 2011 set in step S2204 of FIG. 18 with respect to the second ultrasonic waveform data shown in FIG. The first detection gate 2011 and the second detection gate 2012 at the same level as the detection gate 2012 of FIG.

  Subsequently, in step S2208 of FIG. 18, the reception time calculation unit 254 performs surface reflection ultrasonic waves 112-S from the range of the first detection gate 2011 for the second ultrasonic waveform data acquired in step S2207. The first reception time, which is the time received by the reception unit 122, and the second reception, which is the time when the second back surface reflection ultrasonic wave 112-B2 is received by the reception unit 122 from within the range of the second detection gate 2012 A process of calculating time and date is performed. Specifically, in the aspect 1 of the present embodiment, as shown in FIG. 11B, the reception time calculation unit 254 calculates the time TS of the intersection point at which the ultrasonic waveform and the first detection gate 2011 first intersect. Is calculated as the first reception time, and the time TB2 of the intersection where the ultrasonic waveform and the second detection gate 2012 first intersect is calculated as the second reception time.

  Subsequently, in step S2209 of FIG. 18, the thickness calculation unit 255 propagates the inside of the steel pipe 400 stored in the storage unit 180 and the first reception time and the second reception time calculated in step S2208. The thickness of the steel pipe 400 is calculated from the velocity of the ultrasonic wave.

  Subsequently, in step S2210 of FIG. 18, the thickness calculation unit 255 adds the thickness correction value stored in the storage unit 180 to the thickness value calculated in step S2209, to obtain the final thickness of the steel pipe 400. Calculate the thickness.

Specifically, in step S2210, the final thickness of the steel pipe 400 is calculated using the following equation (2).
Thickness = (TB2-TS) x (velocity of ultrasonic waves propagated inside the steel pipe 400) / 4
+ Thickness correction value ... (2)

In the first aspect of the present embodiment, as the second detection gate 2012 for detecting the back surface reflected ultrasonic wave 112-B, the one for detecting the second back surface reflected ultrasonic wave 112-B2 is set, so (2) The final thickness of the steel pipe 400 is calculated by the equation (2), and this is generalized to, for example, the n-th (n is a positive integer) back surface reflection ultrasonic wave 112-B n as the second detection gate 2012 In the case of setting the one to be detected, the final thickness of the steel pipe 400 is calculated using the following equation (3).
Thickness = (TBn-TS) x (speed of ultrasonic wave propagated inside the steel pipe 400) / (2 x n)
+ Thickness correction value (3)

  Subsequently, in step S2211 in FIG. 18, the display control unit 256 performs control to display the final thickness of the steel pipe 400 calculated in step S2210 on the display unit 190. Furthermore, the control / processing unit 250-1 stores the data of the final thickness of the steel pipe 400 calculated in step S2210 in the storage unit 180 as necessary.

  Subsequently, in step S2212 in FIG. 18, the control / processing unit 250-1 determines whether to end the thickness measurement of the steel pipe 400, which is a material to be inspected, based on the input information input from the information input unit 160, for example. To judge.

  When the thickness measurement of the steel pipe 400 is not finished as a result of the judgment of step S2212 in FIG. 18 (S2212 / NO), for example, the control and processing unit 250-1 sets the installation position of the ultrasonic probe 110 by a predetermined distance. After moving and changing the installation position, the process returns to step S2201 of FIG. 18 and the processes after step S2201 are performed again. By repeatedly performing the process of steps S2201 to S2212 in FIG. 18, the thickness measurement can be performed on a plurality of portions (for example, the entire circumference of the steel pipe 400 shown in FIG. 1) of the steel pipe 400 which is the test material.

  On the other hand, when the thickness measurement of the steel pipe 400 is completed as a result of the determination in step S2212 of FIG. 18 (S2212 / YES), the process of the flowchart of FIG. 18 showing an example of the processing procedure of the thickness measurement method of the steel pipe 400. Finish.

As described above, in the measurement apparatus 200-1 according to aspect 1 of the second embodiment, the second ultrasonic waveform data representing the amplitude of the ultrasonic wave 112 from the steel pipe 400 in time series is A histogram (first histogram) relating to the amplitude of the ultrasonic wave is created within the range of the detection gate 2012, the amplification degree at which the count value of a specific bin in the histogram becomes a predetermined value is calculated, and the amplification degree is calculated. The amplitude of the first ultrasonic waveform data is changed to acquire the second ultrasonic waveform data, and the surface reflected ultrasonic waves 112-S from the range of the first detection gate 2011 are acquired for the second ultrasonic waveform data. The second reception time is the time when the back reflection ultrasonic wave 112-B is received by the reception unit 122 from within the range of the first reception time, which is the time when the reception unit 122 receives the second detection gate 2012 It is calculated, and to calculate the thickness of the steel pipe 400 based on the first reception time and the second reception time and the ultrasonic velocity propagating inside the steel pipe 400.
According to this configuration, when measuring the thickness of a plurality of portions of the steel pipe 400 while moving the ultrasonic probe 110 and the steel pipe 400 relative to each other, the surface state due to the scale or the like attached to the surface of the steel pipe 400 Even when the amplitude of the ultrasonic wave 112 changes significantly due to various disturbances such as change, bending or defective shape of the steel pipe 400, or flapping during transportation of the steel pipe 400, the first ultrasonic waves obtained at each portion of the steel pipe 400 In order to adjust the amplification degree which concerns on the amplitude of waveform data, thickness measurement of several places of the steel pipe 400 can be performed with high precision.
Also, conventionally, there has been a problem that when the ultrasonic waveform data exceeds the input range and overflows, the entire image of the waveform data is not known and adjustment of the amplification degree is difficult. The problem is that the amplification factor is adjusted by focusing on the count value of the smallest bin 2031 including 0 or the bin count including the upper limit of the A / D converter 140 where the count value is considered to be large due to the overflow. It will not occur, and thickness measurement will be able to be performed with the optimal amplification degree.

<Aspect 2 of the Second Embodiment>
Next, aspect 2 of the second embodiment of the present invention will be described. In the description of aspect 2 of the second embodiment, the same configuration and processing as in aspect 1 of the second embodiment described above will be omitted.

  FIG. 19 is a diagram showing an example of a schematic configuration of a measuring apparatus 200-2 according to aspect 2 of the second embodiment of the present invention. In FIG. 19, the same components as those shown in FIG. 10 are denoted by the same reference numerals, and the detailed description thereof will be omitted.

  Here, in the schematic configuration of the measurement apparatus 200-2 according to aspect 2 of the second embodiment shown in FIG. 19, the schematic configuration of the measurement apparatus 200-1 according to aspect 1 of the second embodiment shown in FIG. The difference is that the amplification degree calculation unit 2532 shown in FIG. 10 is not configured inside the control / processing unit 250-2 shown in FIG. 19 and the window function processing unit 2533 shown in FIG. 19 is newly configured. It is a point that

  As shown in FIG. 19, the control / processing unit 250-2 includes an ultrasonic waveform data processing unit 253-2 including an ultrasonic waveform data generation unit 251, a gate setting unit 252, a histogram creation unit 2531 and a window function processing unit 2533. A reception time calculation unit 254, a thickness calculation unit 255, and a display control unit 256 are provided. Here, the components in the control / processing unit 250-2 in the control / processing unit 250-1 in the aspect 1 of the second embodiment shown in FIG. Since it is the same as 251-252, 254-256, the explanation is omitted. Hereinafter, the ultrasonic waveform data processing unit 253-2 of FIG. 19 will be described.

  The ultrasonic waveform data processing unit 253-2 illustrated in FIG. 19 is a first ultrasonic waveform data generated by the ultrasonic waveform data generation unit 251 and indicating the amplitude of the ultrasonic waves 112 from the steel pipe 400 in time series. The processing of changing the amplitude is performed on the data in the range of at least one of the first detection gate 2011 and the second detection gate 2012 in the ultrasonic waveform data of (1). As shown in FIG. 19, the ultrasonic waveform data processing unit 253-2 includes a histogram creating unit 2531 and a window function processing unit 2533. Here, since the histogram creation unit 2531 in FIG. 19 has the same configuration as the histogram creation unit 2531 in FIG. 10, the description thereof will be omitted.

  The window function processing unit 2533 is a range of the second detection gate 2012 in the first ultrasonic waveform data indicating in time series the amplitude of the ultrasonic wave 112 from the steel pipe 400 generated by the ultrasonic wave waveform data generation unit 251. Performs processing to multiply the data in the window function.

  FIG. 20 is a diagram showing an example of the window function used by the window function processing unit 2533 shown in FIG. Further, it is assumed that the data of the window function shown in FIG. 20 is stored in advance in storage unit 180. The window function shown in FIG. 20 corresponds to the data within the range of the second detection gate 2012 in the first ultrasonic waveform data shown in FIG.

  Then, the window function processing unit 2533 performs processing of multiplying the data in the range of the second detection gate 2012 in the first ultrasonic waveform data shown in FIG. 12 by the window function shown in FIG. Change Here, the window function processing unit 2533 sets the predetermined position within the range of the second detection gate 2012 in the first ultrasonic waveform data shown in FIG. 12 and the peak position 2051 of the window function shown in FIG. After alignment, the window function shown in FIG. 20 is applied to the data in the range of the second detection gate 2012 in the first ultrasonic waveform data shown in FIG.

  At this time, in aspect 2 of the present embodiment, the second detection gate 2012 in the first ultrasonic waveform data shown in FIG. 12 is aligned with the peak position 2051 of the window function shown in FIG. When, for example, the position 2021 of the maximum amplitude within the range of the second detection gate 2012 shown in FIG. 12 or the absolute value of the amplitude within the range of the second detection gate 2012 is taken as a predetermined position within the range It is conceivable to set the position of the maximum value of the envelope to Here, although the example of performing position alignment based on the peak position 2051 about the window function of a Gaussian distribution shape as shown in FIG. 20 is demonstrated, according to the generation | occurrence | production situations, such as a noise, a window function, It is not necessary to have a Gaussian distribution, and for example, it may be a rectangular wave having a flat upper surface, a triangular wave, or the like. Therefore, a specific position of such a window function (for example, the center position of the upper surface of the rectangular wave, the apex of the triangular wave) may be determined as the reference position, and the alignment may be performed based on the reference position.

  Next, the process procedure of the measuring method by the measuring apparatus 200-2 which concerns on the aspect 2 of 2nd Embodiment is demonstrated.

  First, with regard to the processing procedure of the method of measuring the thickness of the reference material 410 in aspect 2 of the second embodiment, the processing procedure of the method of measuring the thickness of reference material 410 in aspect 1 of the second embodiment shown in FIG. The description is omitted because it is similar.

  Next, the processing procedure of the method for measuring the thickness of the steel pipe 400, which is the material to be inspected, in the second embodiment will be described.

  FIG. 21 is a flow chart showing an example of the processing procedure of the method for measuring the thickness of the steel pipe 400 by the measuring apparatus 200-2 according to aspect 2 of the second embodiment of the present invention. When the process of the flowchart of FIG. 21 is started, it is assumed that the data of the thickness correction value obtained by the process of the flowchart of FIG. 17 is already stored in the storage unit 180. In addition, when the process of the flowchart in FIG. 21 is started, for example, it is assumed that the same amplification degree as the amplification degree set in step S2101 in FIG. 17 is set in the amplification unit 130.

  First, in the processing of the method of measuring the thickness of the steel pipe 400 in aspect 2 of the second embodiment, the processing of steps S2201 to S2204 in aspect 1 of the second embodiment shown in FIG. 18 is performed. Thereby, for example, first ultrasonic waveform data shown in FIG. 12 is generated, and, for example, the first detection gate 2011 and the second detection gate 2012 shown in FIG. 12 are set.

  Subsequently, in step S2301 of FIG. 21, the window function processing unit 2533 performs the window function shown in FIG. 20 on the data within the range of the second detection gate 2012 in the first ultrasonic waveform data shown in FIG. Process to combine Here, the window function processing unit 2533 is a predetermined position within the range of the second detection gate 2012 in the first ultrasonic waveform data shown in FIG. 12 (for example, as described above, the second detection shown in FIG. 12). The position 2021 of the maximum amplitude in the range of the gate 2012 or the position of the maximum value of its envelope when the absolute value of the amplitude in the range of the second detection gate 2012 is taken) With the peak position 2051 of the window function aligned on the time axis, the window function shown in FIG. 20 is obtained for the data within the range of the second detection gate 2012 in the first ultrasonic waveform data shown in FIG. Perform the multiplication process to change the amplitude.

  Thereafter, the gate setting unit 252 sets the first detection gate 2011 and the second detection gate 2012 to the ultrasonic waveform data obtained by performing the process of multiplying the window function. Here, in the second aspect of the present embodiment, the gate setting unit 252 sets the first ultrasonic wave data set in step S2204 of FIG. 21 to the ultrasonic waveform data obtained by performing the process of multiplying the window function. It is assumed that the first detection gate 2011 and the second detection gate 2012 at the same level as the detection gate 2011 and the second detection gate 2012 are set.

  Subsequently, in step S 2302 of FIG. 21, the reception time calculation unit 254 processes the ultrasonic waveform data obtained by performing the process of multiplying the window function in step S 2301 from within the range of the first detection gate 2011. The first reception time, which is the time at which the reflected ultrasonic waves 112-S were received by the receiving unit 122, and the second back surface reflected ultrasonic waves 112-B 2 from within the range of the second detection gate 2012 are received by the receiving unit 122 A process of calculating a second reception time that is a time is performed. Specifically, in the present embodiment, as shown in FIG. 11B, the reception time calculation unit 254 sets the time TS of the intersection point where the ultrasonic waveform and the first detection gate 2011 first intersect at the first time. It is assumed that the time TB2 of the intersection point where the ultrasonic waveform and the second detection gate 2012 first intersect is calculated as the second reception time.

  Subsequently, in step S 2303 of FIG. 21, the thickness calculation unit 255 propagates the inside of the steel pipe 400 stored in the storage unit 180 and the first reception time and the second reception time calculated in step S 2302. The thickness of the steel pipe 400 is calculated from the velocity of the ultrasonic wave.

  Subsequently, in step S2304 of FIG. 21, the thickness calculation unit 255 adds the thickness correction value stored in the storage unit 180 to the thickness value calculated in step S2303 to obtain the final thickness of the steel pipe 400. Calculate the thickness. Under the present circumstances, also in aspect 2 of the present embodiment, as in aspect 1 of the present embodiment, the thickness calculation unit 255 uses the above-mentioned equation (2) (or equation (3) obtained by generalizing this). The final thickness of the steel pipe 400 is calculated.

  Subsequently, in step S2305 in FIG. 21, the display control unit 256 controls the display unit 190 to display the final thickness of the steel pipe 400 calculated in step S2304. Further, the control / processing unit 250-2 stores the data of the final thickness of the steel pipe 400 calculated in step S2304 in the storage unit 180, as necessary.

  Subsequently, in step S2212 in FIG. 21, the control / processing unit 250-2 determines whether to end the thickness measurement of the steel pipe 400, which is the material to be inspected, based on the input information input from the information input unit 160, for example. To judge.

  If the thickness measurement of the steel pipe 400 is not completed as a result of the determination in step S2212 in FIG. 21 (S2212 / NO), for example, the control and processing unit 250-2 sets the installation position of the ultrasonic probe 110 by a predetermined distance. After moving and changing the installation position, the process returns to step S2201 of FIG. 21 and the processes after step S2201 are performed again. By repeatedly performing the process of steps S2201 to S2212 of FIG. 21, thickness measurement of a plurality of places (for example, the entire circumference of the steel pipe 400 shown in FIG. 19) can be performed.

  On the other hand, when the thickness measurement of the steel pipe 400 is completed as a result of the determination in step S2212 of FIG. 21 (S2212 / YES), the process of the flowchart of FIG. 21 showing an example of the processing procedure of the thickness measurement method of the steel pipe 400. Finish.

As described above, in the measuring apparatus 200-2 according to aspect 2 of the second embodiment, the second detection in the first ultrasonic waveform data indicating the amplitude of the ultrasonic wave 112 from the steel pipe 400 in time series The data in the range of the gate 2012 is multiplied by a window function, and the ultrasonic waveform data obtained by performing the process of multiplying the window function is the surface within the range of the first detection gate 2011 The time at which the back surface reflection ultrasonic wave 112-B is received by the reception unit 122 from within the range of the first detection time, which is the time when the reflection ultrasonic wave 112-S is received by the reception unit 122, and the second detection gate 2012 The reception time of 2 is calculated, and the thickness of the steel pipe 400 is calculated based on the first reception time, the second reception time, and the velocity of the ultrasonic wave propagated through the inside of the steel pipe 400.
According to this configuration, when measuring the thickness of a plurality of portions of the steel pipe 400 while moving the ultrasonic probe 110 and the steel pipe 400 relative to each other, the surface state due to the scale or the like attached to the surface of the steel pipe 400 The waveform of the previous reflected ultrasonic wave within the range of the second detection gate 2012 in the first ultrasonic waveform data due to various disturbances such as bending, poor shape of the steel pipe 400, flapping during transportation of the steel pipe 400, etc. Even when various irregular reflection noises are superimposed within the range of the second detection gate 2012, the window for the data within the range of the second detection gate 2012 is Since the process of multiplying the function is performed, the influence of the above-described tailing and irregular reflection noise can be suppressed. Thereby, thickness measurement of the several places of the steel pipe 400 can be performed with high precision also under the environment which has various disturbances.
In the above description, the window function is multiplied by the second detection gate. However, when the window function is multiplied by the first detection gate, the window function may be divided by the first function. Even in the case of performing processing for both the detection gate and the second detection gate, it is possible to apply to aspect 2 of the present embodiment.

<Aspect 3 of the Second Embodiment>
Next, aspect 3 of the second embodiment of the present invention will be described. In the description of aspect 3 of the second embodiment, the configuration and processing similar to those of aspects 1 and 2 of the second embodiment described above will be omitted.

  FIG. 22 is a diagram showing an example of a schematic configuration of a measuring apparatus 200-3 according to aspect 3 of the second embodiment of the present invention. In FIG. 22, the same components as those shown in FIG. 10 and the components shown in FIG. 19 are denoted by the same reference numerals, and the detailed description thereof will be omitted.

  Here, in the schematic configuration of a measuring apparatus 200-3 according to aspect 3 of the second embodiment shown in FIG. 22, the schematic configuration of a measuring apparatus 200-1 according to aspect 1 of the second embodiment shown in FIG. The difference is that a window function processing unit 2533 shown in FIG. 22 is newly configured inside the control / processing unit 250-3 shown in FIG. The window function processor 2533 shown in FIG. 22 is the same as the window function processor 2533 in the second embodiment of the second embodiment shown in FIG.

  Next, the processing procedure of the measuring method by the measuring apparatus 200-3 according to aspect 3 of the second embodiment will be described.

  First, regarding the processing procedure of the method of measuring the thickness of the reference material 410 in the third embodiment of the second embodiment, the processing procedure of the method of measuring the thickness of the reference material 410 in the first embodiment of the second embodiment shown in FIG. The description is omitted because it is similar.

  Next, the processing procedure of the method for measuring the thickness of the steel pipe 400, which is the material to be inspected in the third embodiment of the second embodiment, will be described.

  FIG. 23: is a flowchart which shows an example of a process sequence of the thickness measurement method of the steel pipe 400 by the measuring apparatus 200-3 which concerns on aspect 3 of the 2nd Embodiment of this invention. When starting the processing of the flowchart of FIG. 23, it is assumed that the data of the thickness correction value obtained by the processing of the flowchart of FIG. 17 and the data of the second histogram are already stored in the storage unit 180. . In addition, when the processing of the flowchart in FIG. 23 is started, for example, it is assumed that the amplification degree is set to the same amplification degree as the amplification degree set in step S2101 in FIG.

  First, in the processing of the method of measuring the thickness of the steel pipe 400 according to aspect 3 of the second embodiment, the processing of steps S2201 to S2204 according to aspect 1 of the second embodiment shown in FIG. 18 is performed. Thereby, for example, first ultrasonic waveform data shown in FIG. 12 is generated, and, for example, the first detection gate 2011 and the second detection gate 2012 shown in FIG. 12 are set.

  Subsequently, in step S2301 of FIG. 23, the window function processing unit 2533 performs the window function shown in FIG. 20 on the data within the range of the second detection gate 2012 in the first ultrasonic waveform data shown in FIG. Process to combine The process of step S2301 of FIG. 23 is the same as the process of step S2301 of FIG. 21 in the second aspect of the second embodiment described above, and thus the detailed description thereof is omitted.

  Thereafter, the gate setting unit 252 sets the first detection gate 2011 and the second detection gate 2012 to the ultrasonic waveform data obtained by performing the process of multiplying the window function. Here, in the present embodiment, the gate setting unit 252 sets the first detection gate 2011 set in step S2204 of FIG. 23 to the ultrasonic waveform data obtained by performing the process of multiplying the window function. The first detection gate 2011 and the second detection gate 2012 at the same level as that of the second detection gate 2012 are set.

  Subsequently, in step S2401 of FIG. 23, the histogram generation unit 2531 performs ultrasonic wave data within the range of the second detection gate 2012 for the ultrasonic waveform data obtained by performing the process of multiplying the window function in step S2301. Create a first histogram relating to the amplitude of Here, for example, it is assumed that the first histogram shown in FIG. 13 is created.

  Subsequently, in step S2402 of FIG. 23, the amplification degree calculation unit 2532 performs a process of calculating an amplification degree in which the count value of a specific bin in the first histogram created in step S2401 is a predetermined value. The process of step S2402 of FIG. 23 is the same as the process of step S2206 of FIG. 18 in the aspect 1 of the second embodiment described above, and thus the detailed description thereof is omitted.

  Subsequently, in step S 2403 of FIG. 23, the ultrasonic waveform data processing unit 253-3 obtains the superimposition obtained by performing the process of multiplying the window function in step S 2301 based on the amplification degree calculated in step S 2402. A process of changing the amplitude of the sound waveform data is performed to acquire second ultrasonic waveform data, which is new ultrasonic waveform data. Here, for example, it is assumed that ultrasonic waveform data shown in FIG. 16 is generated. Thereafter, the gate setting unit 252 sets the first detection gate 2011 and the second detection gate 2012 for the second ultrasonic waveform data. Here, in aspect 3 of the present embodiment, the gate setting unit 252 performs the process of multiplying the second ultrasonic waveform data shown in FIG. 16 by the window function in step S2301. The first detection gate 2011 and the second detection gate 2012 at the same level as the first detection gate 2011 and the second detection gate 2012 set for the sound wave waveform data are set.

  Subsequently, in step S2404 in FIG. 23, the reception time calculation unit 254 performs surface reflection ultrasonic waves 112-S from the range of the first detection gate 2011 for the second ultrasonic waveform data acquired in step S2403. The first reception time, which is the time received by the reception unit 122, and the second reception, which is the time when the second back surface reflection ultrasonic wave 112-B2 is received by the reception unit 122 from within the range of the second detection gate 2012 A process of calculating time and date is performed. Specifically, in aspect 3 of the present embodiment, as shown in FIG. 11B, the reception time calculation unit 254 calculates the time TS of the intersection point at which the ultrasound waveform and the first detection gate 2011 first intersect. Is calculated as the first reception time, and the time TB2 of the intersection where the ultrasonic waveform and the second detection gate 2012 first intersect is calculated as the second reception time.

  Subsequently, in step S2405 in FIG. 23, the thickness calculation unit 255 propagates the inside of the steel pipe 400 stored in the storage unit 180 and the first reception time and the second reception time calculated in step S2404. The thickness of the steel pipe 400 is calculated from the velocity of the ultrasonic wave.

  Subsequently, in step S2406 of FIG. 23, the thickness calculation unit 255 adds the thickness correction value stored in the storage unit 180 to the thickness value calculated in step S2405, to obtain the final thickness of the steel pipe 400. Calculate the thickness. Under the present circumstances, also in aspect 3 of the present embodiment, as in aspect 1 of the present embodiment, the thickness calculation unit 255 uses the above-described equation (2) (or equation (3) obtained by generalizing this). The final thickness of the steel pipe 400 is calculated.

  Subsequently, in step S2407 in FIG. 23, the display control unit 256 performs control to display the final thickness of the steel pipe 400 calculated in step S2406 on the display unit 190. Further, the control / processing unit 250-3 stores the data of the final thickness of the steel pipe 400 calculated in step S2406 in the storage unit 180, as necessary.

  Subsequently, in step S2212 in FIG. 23, the control / processing unit 250-3 determines whether to end the thickness measurement of the steel pipe 400, which is the material to be inspected, based on the input information input from the information input unit 160, for example. To judge.

  If the thickness measurement of the steel pipe 400 is not completed as a result of the determination in step S2212 in FIG. 23 (S2212 / NO), for example, the control and processing unit 250-3 sets the installation position of the ultrasonic probe 110 by a predetermined distance. After moving and changing the installation position, the process returns to step S2201 in FIG. 23, and the processes after step S2201 are performed again. By repeatedly performing the process of steps S2201 to S2212 in FIG. 23, the thickness measurement can be performed on a plurality of portions (for example, the entire circumference of the steel pipe 400 shown in FIG. 13) of the steel pipe 400 which is the test material.

  On the other hand, when the thickness measurement of the steel pipe 400 is completed as a result of the determination in step S2212 of FIG. 23 (S2212 / YES), the process of the flowchart of FIG. 23 showing an example of the processing procedure of the thickness measurement method of the steel pipe 400. Finish.

As described above, in the measurement apparatus 200-3 according to the third embodiment of the second embodiment, the second detection in the first ultrasonic waveform data indicating the amplitude of the ultrasonic wave 112 from the steel pipe 400 in time series The data in the range of the gate 2012 is multiplied by a window function, and the ultrasonic waveform data obtained by performing the process of multiplying the window function is exceeded in the range of the second detection gate 2012. A histogram (first histogram) relating to the amplitude of the sound wave is created, an amplification degree at which the count value of a specific bin in the histogram becomes a predetermined value is calculated, and a window function is multiplied based on the amplification degree The second ultrasonic waveform data is acquired by changing the amplitude of the ultrasonic waveform data obtained by the first detection gate 20 for the second ultrasonic waveform data. The back reflection ultrasonic wave 112-B is received by the reception unit 122 from the first reception time which is the time when the surface reflection ultrasonic wave 112-S is received by the reception unit 122 from the range of 1 and the second detection gate 2012 The second reception time, which is the reception time, is calculated, and the thickness of the steel pipe 400 is calculated based on the first reception time, the second reception time, and the velocity of the ultrasonic wave propagated inside the steel pipe 400. It is like that.
According to this configuration, when measuring the thickness of a plurality of portions of the steel pipe 400 while moving the ultrasonic probe 110 and the steel pipe 400 relative to each other, the surface state due to the scale or the like attached to the surface of the steel pipe 400 The waveform of the previous reflected ultrasonic wave within the range of the second detection gate 2012 in the first ultrasonic waveform data due to various disturbances such as bending, poor shape of the steel pipe 400, flapping during transportation of the steel pipe 400, etc. Even when various irregular reflection noises are superimposed within the range of the second detection gate 2012, the window for the data within the range of the second detection gate 2012 is Since the process of multiplying the function is performed, the influence of the above-described tailing and irregular reflection noise can be suppressed. Thereby, thickness measurement of the several places of the steel pipe 400 can be performed with high precision also under the environment which has various disturbances. Furthermore, even when the amplitude of the ultrasonic wave 112 changes significantly due to the various disturbances described above, in order to adjust the amplification factor related to the amplitude of the first ultrasonic waveform data obtained at each portion of the steel pipe 400 Also, thickness measurement of a plurality of portions of the steel pipe 400 can be performed with high accuracy.
Also, conventionally, there has been a problem that when the ultrasonic waveform data exceeds the input range and overflows, the entire image of the waveform data is not known and adjustment of the amplification degree is difficult. The problem is that the amplification factor is adjusted by focusing on the count value of the smallest bin 2031 including 0 or the bin count including the upper limit of the A / D converter 140 where the count value is considered to be large due to the overflow. It will not occur, and thickness measurement will be able to be performed with the optimal amplification degree.
In the above description, the window function is multiplied by the second detection gate. However, when the window function is multiplied by the first detection gate, the window function may be divided by the first function. Even in the case where processing is performed on both the detection gate and the second detection gate, the present invention can be applied to aspect 3 of the present embodiment.
Also, in the above description, the histogram is created for the second detection gate multiplied by the window function, but not limited to this, the detection gate multiplied by the window function and the detection that creates the histogram Even when the gate is different, the third embodiment of the present embodiment can be applied.

Third Embodiment
Next, a third embodiment of the present invention will be described.

  FIG. 24 is a view showing an example of a schematic configuration of a measuring apparatus 300 according to the third embodiment of the present invention. In FIG. 24, the same components as those in the schematic configuration of the measuring apparatus 100 according to the first embodiment shown in FIG. 1 are denoted by the same reference numerals, and the detailed description thereof will be omitted as necessary. The measuring device 300 is a device for measuring the thickness of the steel pipe 400 via the respective ultrasonic probes in the plurality of ultrasonic probes 110 arranged for the steel pipe 400 which is a material to be inspected. Here, the thickness of the steel pipe 400 is determined by the length between the surface 400S of the steel pipe which is the outer surface of the steel pipe 400 and the back surface 400B of the steel pipe which is the inner surface of the steel pipe 400.

  As shown in FIG. 24, the measuring apparatus 300 includes an ultrasound probe 110, a transmitting / receiving unit 120, an amplifying unit 130, an A / D converting unit 140, a control / processing unit 350, an information input unit 160, a communication unit 170, and a storage. It is configured to have a unit 180 and a display unit 190.

  The ultrasonic probe 110 controls transmission and reception of ultrasonic waves at a plurality of measurement points of the steel pipe 400 by moving relative to the steel pipe 400. Here, in the present embodiment, a mode in which a plurality of ultrasonic probes 110-1 to 110-4 are provided as the ultrasonic probe 110 is shown.

  As an example in which the ultrasonic probes 110-1 to 110-4 and the steel pipe 400 are moved relative to each other, in FIG. 24, the respective ultrasonic probes 110-are controlled based on the control of the control and processing unit 350. Although a configuration in which 1 to 110-4 moves in the circumferential direction of the steel pipe 400 is illustrated, the present invention is not limited to this configuration. For example, a mode in which the steel pipe 400 moves while the ultrasonic probes 110-1 to 110-4 are at rest is also applicable to the present invention, and the respective ultrasonic probes 110-1 to 110 are also applicable. A mode in which the thickness measurement position in the steel pipe 400 is moved by electrically changing the transmission direction of the ultrasonic wave by appropriately controlling the ultrasonic wave transmission timing of -4 is also applicable to the present invention. Further, FIG. 24 shows an example in which the ultrasound probes 110-1 to 110-4 move in the circumferential direction of the steel pipe 400, but for example, the ultrasound probes 110-1 to 110-4 are steel pipes 400. It is applicable also to the form which moves in the direction of the tube axis (z direction in FIG. 24).

  The transmitting and receiving unit 120 transmits and receives ultrasonic waves to and from the steel pipe 400 via the respective ultrasonic probes 110-1 to 110-4 based on the control of the control and processing unit 350. The transmission / reception unit 120 includes a transmission unit 121 and a reception unit 122.

  The transmitting unit 121 performs a process of transmitting the ultrasonic waves 111 toward the surface 400S of the steel pipe via the respective ultrasonic probes 110-1 to 110-4 based on the control of the control / processing unit 350. Here, in FIG. 24, the transmission unit 121 sets the ultrasonic wave 111 transmitted toward the surface 400 S of the steel pipe via the ultrasonic wave probe 110-1 as the ultrasonic wave 111-1, and the ultrasonic wave probe 110. The ultrasonic wave 111 transmitted toward the surface 400S of the steel pipe via -2 is the ultrasonic wave 111-2, and the ultrasonic wave 111 transmitted toward the surface 400S of the steel pipe through the ultrasonic probe 110-3 is super The ultrasonic wave 111-3 is shown as an ultrasonic wave 111-4 as the acoustic wave 111-3 and transmitted toward the surface 400 S of the steel pipe via the ultrasonic probe 110-4. Moreover, the receiving part 122 performs the process which receives the ultrasonic wave 112 from the steel pipe 400 via each ultrasonic probe 110-1 to 110-4 based on control of the control * process part 350. FIG. Here, in FIG. 24, the receiving unit 122 sets the ultrasonic wave 112 received from the steel pipe 400 via the ultrasonic wave probe 110-1 as the ultrasonic wave 112-1 and transmits the ultrasonic wave 110-1 to the ultrasonic wave probe 110-2. The ultrasonic wave 112 received from the steel pipe 400 is the ultrasonic wave 112-2, and the ultrasonic wave 112 received from the steel pipe 400 via the ultrasonic probe 110-3 is the ultrasonic wave 112-3. The ultrasonic probe 110 The ultrasonic wave 112 received from the steel pipe 400 via -4 is illustrated as an ultrasonic wave 112-4.

  The amplification unit 130 amplifies the ultrasonic waves 112 from the steel pipe 400 received by the reception unit 122 based on the control of the control and processing unit 350.

  The A / D conversion unit 140 performs processing of converting the ultrasonic wave 112 from the steel pipe 400 amplified by the amplification unit 130 from an analog signal to a digital signal based on the control of the control / processing unit 350.

  Note that, in the present embodiment, the signals that have passed through the amplification unit 130 are in the order of passing through the A / D conversion unit 140, but in reverse order, the signals that have passed through the A / D conversion unit 140 are It can also be in the order of amplification by the amplification unit 130. By so doing, since digital signals are to be amplified, signal handling can be facilitated.

  The control / processing unit 350 controls each component of the measuring apparatus 300 based on, for example, the input information input from the information input unit 160 and the input information input from the communication unit 170, and controls the operation of the measuring apparatus 300. Control. Also, the control / processing unit 350 performs various processes based on, for example, input information input from the information input unit 160 and input information input from the communication unit 170. As shown in FIG. 24, the control / processing unit 350 generates an ultrasonic waveform data generation unit 351, a gate setting unit 352, a reception time detection unit 353, a reference waveform data generation unit 354, a waveform data subtraction unit 355, and reception time calculation. It comprises the part 356, the thickness calculation part 357, and the display control part 358. The description of each of the component units 351 to 358 in the control and processing unit 350 will be described later.

  For example, the information input unit 160 inputs, to the control and processing unit 350, input information input by the user.

  The communication unit 170 manages communication with the external device G via the computer network N. In the case of the third embodiment, examples of the external device G include the measuring device 100 according to the first embodiment described above and the measuring device 200 according to the second embodiment.

  The storage unit 180 stores various types of information and various types of data used by the control and processing unit 350, and various types of information and various types of data obtained by the processing of the control and processing unit 350.

  The display unit 190 displays various information, various data, and the like based on the control of the control / processing unit 350.

  Next, the components 351 to 358 in the control / processing unit 350 of FIG. 24 will be described.

  The ultrasonic waveform data generation unit 351 shown in FIG. 24 is amplified by the amplification unit 130 for each of the ultrasonic probes 110-1 to 110-4 (A / D conversion is further performed by the A / D conversion unit 140. Waveform data that indicates in time series the amplitude of the ultrasonic wave 112 from the steel pipe 400).

  FIG. 25 shows ultrasonic waveform data generated by the ultrasonic waveform data generation unit 351 shown in FIG. 24, and the first detection gate and the second detection gate set by the gate setting unit 352 shown in FIG. It is a figure which shows an example.

FIG. 25A shows, for example, a processing example according to the ultrasound probe 110-1.
Specifically, FIG. 25A shows, on the left side thereof, a B-scope image 3011 generated by the control / processing unit 350, for example. This B scope image 3011 is similar to the B scope image described above in the first embodiment. Further, in FIG. 25A, ultrasonic waveform data 3012 corresponding to data of upper and lower lines 30111 in the B scope image 3011 shown in FIG. 25A is shown on the right side. The ultrasonic waveform data 3012 is generated by the ultrasonic waveform data generation unit 351.

FIG. 25B shows, for example, an example of processing related to the ultrasound probe 110-3 disposed at a position facing the ultrasound probe 110-1 shown in FIG. 25A described above. .
Specifically, in FIG. 25B, a B-scope image 3013 generated by, for example, the control and processing unit 350 is shown on the left side. The B scope image 3013 is also similar to the B scope image described above in the first embodiment. Further, in FIG. 25B, ultrasonic waveform data 3014 corresponding to the data of upper and lower lines 30131 in the B scope image 3013 shown in FIG. 25B is shown on the right side thereof. The ultrasonic waveform data 3014 is also generated by the ultrasonic waveform data generation unit 351.

  Both the ultrasonic waveform data 3012 shown in FIG. 25 (a) and the ultrasonic waveform data 3014 shown in FIG. 25 (b) are echoes of the surface reflection ultrasonic waves 112-S described in the first and second embodiments. The waveform is shown with the first back surface reflection ultrasonic wave 112-B1 as the B1 echo and the second back surface reflection ultrasonic wave 112-B2 as the B2 echo. Further, in the present embodiment, the amplitude shown on the horizontal axis of the ultrasonic waveform data 3012 shown in FIG. 25A and the ultrasonic waveform data 3014 shown in FIG. 25B is, for example, ± 1.0 V in the input range. When the amplitude of the ultrasonic wave input to the A / D conversion unit 140 is −1.0 V when the 8-bit A / D conversion unit 140 is used, “0” is input to the A / D conversion unit 140 It is assumed that the value of “127” is obtained when the amplitude of the ultrasonic wave is 0.0V, and the value of “255” is obtained when the amplitude of the ultrasonic wave input to the A / D conversion unit 140 is + 1.0V. Further, in the present embodiment, when the amplitude of the ultrasonic wave exceeding the input range of the A / D converter 140 is input, for example, the amplitude of the ultrasonic wave input to the A / D converter 140 is −1. For example, when the amplitude of the ultrasonic wave input to the A / D conversion unit 140 is larger than +1.0 V, it is forced to “255” when the amplitude is smaller than 0 V. Furthermore, in the present embodiment, during the time indicated by the vertical axis of the ultrasonic waveform data 3012 shown in FIG. 25A and the ultrasonic waveform data 3014 shown in FIG. Indicates the elapsed time since then.

  Here, looking at the B scope image 3011 related to the ultrasound probe 110-1 shown in FIG. 25 (a), in addition to the original multiple signal of S and B echoes with strong contrast, the same contrast with weak contrast is similar. It can be seen that the patterns appear in different phases. Then, referring to the B scope image 3031 of the ultrasound probe 110-3 shown in FIG. 25B, the B scope image 3011 of the ultrasound probe 110-1 shown in FIG. The portions of the patterns 30112 and 30113 other than the multiple signals of the above are superimposed on the S-echo with particularly large amplitude of the B-scope image 3031 according to the ultrasound probe 110-3 shown in FIG. I understand that. This can not be known simply by observing only the ultrasonic waveform data 3012 related to the ultrasonic probe 110-1. In the B scope image 3011 related to the ultrasound probe 110-1 shown in FIG. 25 (a), patterns other than the patterns 30112 and 30113 also appear in the patterns other than the original multiplex signal. Is considered to be the influence of the S echoes of the ultrasound probes 110-2 and 110-4.

  Furthermore, regarding the influence of the S echo of the other ultrasonic probe 110 described above, comparing the ultrasonic waveform data 3012 shown in FIG. 25A with the ultrasonic waveform data 3014 shown in FIG. The echo observed between the B1 echo and the B2 echo of the ultrasonic waveform data 3012 related to the ultrasonic probe 110-1 shown in FIG. 25 (a) is the other ultrasonic probe shown in FIG. 25 (b). It can be seen that the position is on the same time axis as the S echo of the ultrasonic waveform data 3014 relating to the child 110-3. So, in the 3rd embodiment, in ultrasonic wave waveform data concerning a certain ultrasonic probe 110, the art for reducing the influence of S echo in other ultrasonic probes 110 is provided.

  The gate setting unit 352 shown in FIG. 24 is configured to generate surface reflection ultrasonic waves for ultrasonic waveform data generated by the ultrasonic waveform data generation unit 351 for each of the ultrasonic probes 110-1 to 110-4. 1st detection gate which shows the range for detecting S echo of surface reflected ultrasonic waves 112-S in 1 and 2nd embodiments, and back surface reflected ultrasonic waves (back side reflection in the 1st and 2nd embodiments) A process of setting a second detection gate indicating a range for detecting the B echo of the ultrasonic wave 112-B) is performed.

  In the example illustrated in FIG. 25, the gate setting unit 352 generates the first detection gate 30121 and the ultrasonic waveform data 3012 generated for the ultrasonic probe 110-1 by the ultrasonic waveform data generation unit 351. The second detection gate 30122 is set. Similarly, in the example illustrated in FIG. 25, the gate setting unit 352 performs the first detection on the ultrasonic waveform data 3014 generated for the ultrasonic probe 110-3 by the ultrasonic waveform data generation unit 351. The gate 30141 and the second detection gate 30142 are set. Here, in the present embodiment, as shown in FIG. 25, the second back surface reflection ultrasonic wave 112-B2 (B2 echo) is detected as a second detection gate for detecting the back surface reflection ultrasonic wave 112-B. In the present invention, the present invention is not limited to this form. For example, the form in which the thing that detects the first back surface reflection ultrasonic wave 112-B1 (B1 echo) is set, or An embodiment in which a back surface reflection ultrasonic wave of No. 3 or a back surface reflection ultrasonic wave after that is detected is also applicable to the present invention.

  FIG. 26 shows ultrasonic waveform data generated by the ultrasonic waveform data generation unit 351 shown in FIG. 24, the first detection gate and the second detection gate set by the gate setting unit 352 shown in FIG. The time detection process performed by the reception time detection unit 353 shown in FIG. 24, the reference waveform data generated by the reference waveform data generation unit 354 shown in FIG. 24, and the waveform data subtraction process performed by the reception time detection unit 353 shown in FIG. Is a diagram illustrating an example of

  26 (a) shows, in the same way as the ultrasonic waveform data 3012, shown in FIG. 25 (a), the ultrasonic waveform data 3021 generated for the ultrasonic probe 110-1 in the ultrasonic waveform data generator 351, for example. It shows. Further, in the ultrasonic waveform data 3021, the first detection gate 30211 and the second detection gate 30212 set in the gate setting unit 352 are shown. The first detection gate 30211 and the second detection gate 30212 are similar to the first detection gate 30121 and the second detection gate 30122 shown in FIG. 25 (a).

  In FIG. 26B, as in the ultrasonic waveform data 3014 shown in FIG. 25B, in the ultrasonic waveform data generation unit 351, for example, ultrasonic waveform data 3022 generated for the ultrasonic probe 110-3 is used. It shows. Further, in the ultrasonic waveform data 3022, a first detection gate 30221 and a second detection gate 30222 set in the gate setting unit 352 are shown. The first detection gate 30221 and the second detection gate 30222 are similar to the first detection gate 30141 and the second detection gate 30142 shown in FIG.

  Also, in the ultrasound waveform data 3021 related to the ultrasound probe 110-1 shown in FIG. 26 (a), the other ultrasound waves shown in FIG. 26 (b) are the same as in the case described using FIG. It is assumed that the signal of the noise level 30213 is included under the influence of the S echo related to the probe 110-3.

  The reception time detection unit 353 illustrated in FIG. 24 is a first ultrasonic probe (here, a single ultrasonic probe included in the plurality of ultrasonic probes 110-1 to 110-4). Of the ultrasonic waveform data related to the second ultrasonic probe (here, ultrasonic probes 110-2 to 110-4) except for the ultrasonic probe 110-1). The time when the S echo of the surface reflection ultrasonic waves (surface reflection ultrasonic waves 112-S in the first and second embodiments) is received by the receiving unit 122 is detected from within the range of the detection gate.

  Specifically, the reception time detection unit 353 illustrated in FIG. 24 is the same as the ultrasonic waveform data 3022 related to the ultrasonic probe 110-3 (second ultrasonic probe) illustrated in FIG. The time at which the S echo of the surface reflected ultrasonic wave (surface reflected ultrasonic wave 112-S in the first and second embodiments) is received by the receiving unit 122 from the range of the detection gate 30221 of 1 is detected. Here, as in the case described with reference to FIG. 11B in the second embodiment, the time TS of the intersection point at which the ultrasonic waveform and the first detection gate 30221 first intersect is detected as the reception time. .

  The reference waveform data generation unit 354 shown in FIG. 24 sets the first ultrasonic probe (here, the ultrasonic probe 110-1) at the position of the reception time detected by the reception time detection unit 353. Surface-reflected ultrasonic waves (first and second ultrasonic waves) received via the second ultrasonic probe (here, ultrasonic probes 110-2 to 110-4) superimposed in the ultrasonic waveform data. Reference waveform data in which a reference waveform assuming noise based on the S echo of the surface reflection ultrasonic wave 112-S) in the second embodiment is generated.

Specifically, as shown in FIG. 26 (c), the reference waveform data generation unit 354 shown in FIG. 24 is different from the ultrasound probe 110-3 shown in FIG. 26 (b) in the reception time detection unit 353. 26A is superimposed on the position of the reception time detected from the ultrasonic wave waveform data 3022 in the ultrasonic wave waveform data 3021 according to the ultrasonic wave probe 110-1 shown in FIG. 26A, via the ultrasonic wave probe 110-3 Reference waveform data 3023 in which a reference waveform assuming noise based on the S echo of the received surface reflection ultrasonic wave (surface reflection ultrasonic wave 112-S in the first and second embodiments) is generated.
At this time, the reference waveform data generation unit 354 shown in FIG. 24 uses, for example, the magnitude of the amplitude of the reference waveform and the shape of the reference waveform set in advance and stored in the storage unit 180 to generate the reference waveform data 3023. Take a form to generate. In the present invention, the present invention is not limited to this form. For example, the reference waveform data generation unit 354 shown in FIG. 24 is an ultrasonic probe 110-3 (second Of the amplitude of the reference waveform based on the waveform of the S echo of the surface reflected ultrasonic waves (surface reflected ultrasonic waves 112-S in the first and second embodiments) of the ultrasonic waveform data 3022 according to the acoustic wave probe) And the form of determining the shape of the reference waveform (for example, determining the waveform obtained by attenuating the waveform of the S echo at a predetermined attenuation rate as the reference waveform) to generate the reference waveform data 3023 is also applied to the present invention It is possible.

  In the example shown in FIG. 26, an example in which the ultrasonic probe 110-3 is used as a representative of the second ultrasonic probe is used. However, in the measurement apparatus 300 according to the present embodiment, FIG. As shown in FIG. 2, since the other ultrasonic probes 110-2 and 110-4 are also applicable as the second ultrasonic probe, in this case, the ultrasonic probes 110-2 and 110-4 For each of the above, similarly to the above-described ultrasound probe 110-3, the reception time detection unit 353 shown in FIG. 24 detects the reception time, and the reference waveform data generation unit 354 shown in FIG. Take a form to generate.

  The waveform data subtraction unit 355 shown in FIG. 24 is generated by the reference waveform data generation unit 354 from the ultrasound waveform data related to the first ultrasound probe (here, referred to as the ultrasound probe 110-1). A process of subtracting the obtained reference waveform data is performed.

  Specifically, the waveform data subtractor 355 shown in FIG. 24 generates reference waveform data 3023 shown in FIG. 26C from ultrasonic waveform data 3021 related to the ultrasound probe 110-1 shown in FIG. Perform the process of subtracting Ultrasonic waveform data 3024 shown in FIG. 26D is acquired by the subtraction processing by the waveform data subtraction unit 355. FIG. 26 (d) shows that the signal of the noise level 30213 shown in FIG. 26 (a) is reduced to the signal of the noise level 30241 by the subtraction processing by the waveform data subtraction unit 355. In the example shown in FIG. 26, a noise level 30213 based on the influence of S echoes on the other ultrasonic probes shown in FIG. 26 (b) superimposed on the ultrasonic waveform data 3021 shown in FIG. 26 (a). However, although the level detected by the second detection gate 30212 has not been reached, for example, when the level of the second detection gate 30212 is set lower or the noise level 30213 becomes larger, the noise level The signal of 30213 is erroneously detected by the second detection gate 30212. As a result, the thickness of the steel pipe 400 is calculated as an erroneous value. On the other hand, in the measuring apparatus 300 according to the third embodiment, the waveform data subtracting unit 355 performs processing to reduce the noise level signal so that the thickness measurement of the steel pipe 400 can be performed with high accuracy. There is.

  In the example shown in FIG. 26, an example in which the ultrasonic probe 110-3 is used as a representative of the second ultrasonic probe is used. However, in the measurement apparatus 300 according to the present embodiment, FIG. As shown in FIG. 24, since the other ultrasonic probes 110-2 and 110-4 are also applicable as the second ultrasonic probe, in this case, the waveform data subtraction unit 355 shown in FIG. A process of subtracting the reference waveform data of each of the ultrasonic probes 110-2 and 110-4 from the ultrasonic waveform data 3021 of the ultrasonic probe 110-1 shown in 26 (a) is performed. Take the form.

  The reception time calculation unit 356 shown in FIG. 24 performs surface reflection ultrasonic waves (first and second reflected waves) from within the range of the first detection gate for ultrasonic waveform data obtained by performing subtraction processing by the waveform data subtraction unit 355. In the second embodiment, the first reception time, which is the time when the S echo of the surface reflection ultrasonic wave 112-S in the second embodiment is received by the reception unit 122, and the back surface reflection ultrasonic wave (first and second detection gates) The second reception time, which is the time when the B echo of the back surface reflection ultrasonic wave 112-B) in the second embodiment is received by the reception unit 122, is calculated.

  Specifically, the reception time calculation unit 356 shown in FIG. 24 is, for example, the first reception time within the range of the first detection gate 30211 and the second reception time for the ultrasonic waveform data 3024 shown in FIG. The second reception time is calculated from the range of the detection gate 30212 of Here, as in the case described with reference to FIG. 11B in the second embodiment, the time TS of the intersection point where the ultrasonic waveform and the first detection gate 30211 first intersect is the first reception time. It is assumed that the time TB2 of the intersection where the ultrasonic waveform and the second detection gate 30212 first intersect is calculated as the second reception time.

  The thickness calculation unit 357 shown in FIG. 24 performs a process of calculating the thickness of the steel pipe 400 based on the ultrasonic waveform data obtained by performing the process of subtraction by the waveform data subtraction unit 355. More specifically, the thickness calculation unit 357 is based on the first reception time and the second reception time calculated by the reception time calculation unit 356, and the velocity of the ultrasonic wave propagated inside the steel pipe 400. , The process of calculating the thickness of the steel pipe 400 is performed. Here, in the present embodiment, it is assumed that the data of the velocity of the ultrasonic wave propagated through the inside of the steel pipe 400 is stored in advance in the storage unit 180. Here, since a specific thickness calculation method by the thickness calculation unit 357 is the same as the thickness calculation method by the thickness calculation unit 255 in the second embodiment, the description thereof will be omitted.

  The display control unit 358 shown in FIG. 24 performs control to display the thickness of the steel pipe 400 calculated by the thickness calculation unit 357 on the display unit 190, for example.

Next, the processing procedure of the thickness measurement method of the steel pipe 400 which is a material to be inspected will be described.
FIG. 27 is a flowchart showing an example of the processing procedure of the method of measuring the thickness of the steel pipe 400 by the measuring device 300 according to the third embodiment of the present invention.

  First, in step S3101 in FIG. 27, the transmission unit 121 transmits the surface of the steel pipe, which is the material to be inspected, through each of the ultrasonic probes 110-1 to 110-4 under the control of the control and processing unit 350. The ultrasonic wave 111 is transmitted toward 400S.

  Subsequently, in step S3102 in FIG. 27, the receiving unit 122 receives the ultrasonic waves 112 from the steel pipe 400 via the respective ultrasonic probes 110-1 to 110-4 based on the control of the control and processing unit 350. Receive

  Subsequently, in step S3103 in FIG. 27, after the ultrasonic waveform data generation unit 351 amplifies each of the ultrasonic probes 110-1 to 110-4 by the amplification unit 130 (further, the A / D conversion unit Ultrasonic waveform data is generated which indicates in time series the amplitude of the ultrasonic wave 112 from the steel pipe 400 after A / D conversion at 140.

  Subsequently, in step S3104 of FIG. 27, the gate setting unit 352 performs surface reflection ultrasound (for the ultrasound waveform data generated for each of the ultrasound probes 110-1 to 110-4 in step S3103). A first detection gate showing a range for detecting an S echo of surface reflection ultrasonic waves 112-S in the first and second embodiments, and a back surface reflection ultrasonic wave (a back surface in the first and second embodiments) A process of setting a second detection gate indicating a range for detecting the B echo of the reflected ultrasonic wave 112-B) is performed.

  Subsequently, in step S3105 of FIG. 27, the control / processing unit 350 sets the number M of ultrasonic probes 110 based on, for example, input information input from the information input unit 160. Here, in the example shown in FIG. 24, 4 is set as the number M of the ultrasound probes 110.

  Subsequently, at step S3106 in FIG. 27, the control and processing unit 350 sets 1 to a variable m indicating the first ultrasonic probe 110 to be processed.

  Subsequently, in step S3107 in FIG. 27, the reception time detection unit 353 sets the ultrasonic waveform data related to the second ultrasonic probe except the first ultrasonic probe m in step S3104. The time at which the S echo of the surface reflection ultrasonic waves (surface reflection ultrasonic waves 112-S in the first and second embodiments) is received by the receiving unit 122 is detected from within the range of the first detection gate.

  Here, in order to make the description easy to understand, for example, the ultrasonic waveform data 3021 shown in FIG. 26A is used as the ultrasonic waveform data for the first ultrasonic probe m, and the ultrasonic waveform data shown in FIG. The sound wave waveform data 3022 is set as ultrasonic wave waveform data relating to the second ultrasonic probe. The same applies to the following description. In this case, specifically, in step S3107 of FIG. 27, the reception time detection unit 353 detects surface waveform ultrasonic waves from within the range of the first detection gate 30221 for the ultrasonic waveform data 3022 shown in FIG. The time when the S echo is received by the receiving unit 122 is detected.

  Subsequently, in step S3108 in FIG. 27, the reference waveform data generation unit 354 superimposes the ultrasonic waveform data relating to the first ultrasonic probe m on the position of the reception time detected in step S3107. Reference waveform data in which a reference waveform assuming noise based on the S echo of surface reflection ultrasonic waves received through the two ultrasonic probes is generated.

  Specifically, for example, in step S3108 in FIG. 27, the reference waveform data generation unit 354 superimposes the position of the reception time detected in step S3107 in the ultrasonic waveform data 3021 shown in FIG. Reference waveform data 3023 shown in FIG. 26C is generated in which a reference waveform assuming noise based on the S echo of the surface reflection ultrasonic wave received via the ultrasonic probe is arranged.

  Subsequently, in step S3109 of FIG. 27, the waveform data subtracting unit 355 performs a process of subtracting the reference waveform data generated in step S3108 from the ultrasonic waveform data related to the first ultrasonic probe m.

  Specifically, for example, in step S3109 of FIG. 27, the waveform data subtracting unit 355 subtracts the process of subtracting the reference waveform data 3023 shown in FIG. 26C from the ultrasonic waveform data 3021 shown in FIG. Do. Ultrasonic waveform data 3024 shown in FIG. 26D is obtained by this subtraction process.

  Subsequently, in step S3110 in FIG. 27, the reception time calculation unit 356 executes S subtraction of step S3109 for the ultrasound waveform data obtained by performing the subtraction process on the surface reflected ultrasound S within the range of the first detection gate. The first reception time, which is the time when the echo is received by the receiver 122, and the second reception time, which is the time when the B echo of the back surface reflection ultrasound is received by the receiver 122 from within the range of the second detection gate Calculate

  Specifically, for example, in step S3110 of FIG. 27, the reception time calculation unit 356 generates S of surface reflection ultrasonic waves from within the range of the first detection gate 30211 for the ultrasonic waveform data 3024 shown in FIG. The first reception time, which is the time when the echo is received by the receiver 122, and the second reception time, which is the time when the B echo of the back surface reflected ultrasound is received by the receiver 122 from within the range of the second detection gate 30212 And calculate.

  Subsequently, in step S3111 of FIG. 27, the thickness calculation unit 357 is based on the first reception time and the second reception time calculated in step S3110, and the velocity of the ultrasonic wave propagated inside the steel pipe 400. And the process of calculating the thickness of the steel pipe 400 is performed. Here, since a specific thickness calculation method by the thickness calculation unit 357 is the same as the thickness calculation method by the thickness calculation unit 255 in the second embodiment, the description thereof will be omitted.

  Subsequently, at step S3112 in FIG. 27, the control / processing unit 350 determines whether or not the variable m indicating the first ultrasonic probe 110 is smaller than the number M of ultrasonic probes 110.

If, as a result of the determination in step S3112 in FIG. 27, the variable m indicating the first ultrasound probe 110 is smaller than the number M of ultrasound probes 110 (S3112 / YES), processing is still being performed. It is determined that there is no ultrasonic probe 110, and the process proceeds to step S3113 in FIG.
In step S3113 in FIG. 27, the control and processing unit 350 adds 1 to the variable m indicating the first ultrasonic probe 110. Thereafter, the process returns to step S3107 in FIG. 27, and the processes after step S3107 are performed on the changed first ultrasonic probe m. In the present embodiment, as shown in FIG. 24, since four ultrasound probes 110-1 to 110-4 are provided, the series of processes in steps S3107 to S3113 in FIG. 27 is performed four times. It will be repeated.

On the other hand, when the variable m indicating the first ultrasonic probe 110 is not smaller than the number M of the ultrasonic probes 110 as a result of the determination in step S3112 of FIG. 27 (S311 / NO), all It is determined that the process has been performed on the ultrasound probe 110, and the process proceeds to step S3114 in FIG.
In step S3114 in FIG. 27, the display control unit 358 controls the display unit 190 to display the thickness of the steel pipe 400 calculated in step S3111. After that, the control / processing unit 350 performs a process of storing the data of the thickness of the steel pipe 400 calculated in step S3111 in the storage unit 180, as necessary.

  Subsequently, in step S3115 of FIG. 27, the control / processing unit 350 determines whether or not to finish the thickness measurement of the steel pipe 400, which is the material to be inspected, based on the input information input from the information input unit 160, for example. to decide.

  If the thickness measurement of the steel pipe 400 is not completed as a result of the determination in step S3115 in FIG. 27 (S3115 / NO), the process returns to step S3101 in FIG. 27 and the process from step S3101 is performed again.

  On the other hand, when the thickness measurement of the steel pipe 400 is completed as a result of the determination in step S3115 of FIG. 27 (S3115 / YES), the processing of the flowchart of FIG. 27 is ended.

As described above, in the measuring apparatus 300 according to the third embodiment, ultrasonic waveform data indicating the amplitudes of the ultrasonic waves 112 from the steel pipe 400 in time series is generated for each of the ultrasonic probes 110. A first ultrasonic wave waveform data related to a second ultrasonic wave probe except the first ultrasonic wave probe which is one ultrasonic wave probe included in the plurality of ultrasonic wave probes 110; The time at which the surface reflected ultrasonic wave is received by the receiving unit 122 is detected from within the range of the detection gate, and the position of the detected time is superimposed on the ultrasonic waveform data relating to the first ultrasonic probe. Reference waveform data is generated by arranging a reference waveform assuming noise based on surface reflection ultrasonic waves received via an ultrasonic probe, and reference waveform data from ultrasonic waveform data relating to the first ultrasonic probe Process to subtract and Within the range of the first detection gate, and within the range of the first reception time and the second detection gate, which are times when the surface reflection ultrasonic waves are received by the receiving unit 122 from the range of the first detection gate. The second reception time, which is the time at which the back surface reflection ultrasonic wave is received by the reception unit 122, is calculated from the first reception time and the second reception time, and the velocity of the ultrasonic wave propagated inside the steel pipe 400. Based on the thickness of the steel pipe 400 is calculated.
According to this configuration, when measuring the thickness of a plurality of portions of the steel pipe 400, the surface reflection received via the second ultrasonic probe in the ultrasonic waveform data relating to the first ultrasonic probe Even when noise signals based on ultrasonic waves are superimposed, processing is performed to reduce the noises, and therefore, thickness measurement of a plurality of portions of the steel pipe 400 can be performed with high accuracy.

Fourth Embodiment
Next, a fourth embodiment of the present invention will be described.
In the fourth embodiment of the present invention, at least two of the measuring apparatus 100 according to the first embodiment, the measuring apparatus 200 according to the second embodiment, and the measuring apparatus 300 according to the third embodiment. And in the form of a measurement system configured. In the present invention, as described above, any measuring system including at least two measuring devices among the measuring device 100, the measuring device 200 and the measuring device 300 can be applied to any combination of measuring devices. Representative ones of the measurement systems according to the combination of the measurement devices will be described below as aspect 1 to aspect 3.

<Aspect 1 of the Fourth Embodiment>
First, aspect 1 of the fourth embodiment of the present invention will be described.

  FIG. 28 is a diagram showing an example of a schematic configuration of a measurement system 10-1 according to aspect 1 of the fourth embodiment of the present invention.

  In this measurement system 10-1, as shown in FIG. 28, the measurement apparatus 100 according to the first embodiment and the measurement apparatus 200 according to the second embodiment are communicably connected via the computer network N. There is. At this time, any one of the measuring devices 200-1 to 200-3 may be applied as the measuring device 200 according to the second embodiment. In addition, the configuration common to the components of the measuring apparatus 100 according to the first embodiment shown in FIG. 1 and the components of the measuring apparatus 200 according to the second embodiment shown in FIG. 10, FIG. 19 or FIG. For parts, it is possible to integrate all or part as needed. In addition, a measurement system 10-1 configured including the measurement apparatus 100 according to the first embodiment and the measurement apparatus 200 according to the second embodiment illustrated in FIG. 28 is formed as, for example, one measurement apparatus. It may be

  FIG. 29 is a schematic view showing an example of the processing procedure of the method for measuring the thickness of the steel pipe 400 by the measurement system 10-1 according to aspect 1 of the fourth embodiment of the present invention.

  First, in the measurement system 10-1, as shown in FIG. 29, the process of the measurement apparatus 100 according to the first embodiment is performed. Specifically, the processing of steps S1101 to S1112 in FIG. 7 is performed, and the B scope image 1031 shown in FIG. 29A, the binary image 1032 shown in FIG. 29B, and FIG. A binary image obtained as a result of processing by the binary image processing unit 154 and a linearized image 1034 shown in FIG. 29D are generated. Since FIGS. 29 (a) to 29 (d) are similar to those shown in FIG. 4, the description thereof is omitted. Thereafter, when the first detection gate 1041 and the second detection gate 1042 are set in the gate setting unit 156 shown in FIG. 1, the result is as shown in FIG.

  Next, in the measurement system 10-1, as shown in FIG. 29, the process of the measurement apparatus 200 according to the second embodiment is performed. Here, in the example shown in FIG. 29, the case where the process of the measuring apparatus 200-3 according to the second embodiment is performed is shown. When, for example, one line is selected from the information input unit 160 or the like for the image in FIG. 29 (e), the gate setting unit 252 of the measurement apparatus 200-3 according to the second embodiment performs FIG. 29 (f). The first detection gate and the second detection gate are set based on the first detection gate 1041 and the second detection gate 1042 described above for the ultrasonic waveform data of Next, the measuring apparatus 200-3 according to the second embodiment performs the processing of steps S 2301 to S 2403 of FIG. 23 to obtain FIGS. 29 (g), 29 (h), 29 (i) and 29. The process shown in 29 (j) is performed. Thereafter, the measuring apparatus 200-3 according to the second embodiment performs thickness measurement of the steel pipe 400 by performing the processing of steps S 2404 to S 2212 in FIG. 23.

  The measurement system 10-1 according to aspect 1 of the fourth embodiment includes the measurement device 100 according to the first embodiment and the measurement device 200 according to the second embodiment, so that Even in an environment with various disturbances, thickness measurement of a plurality of points of the test material can be performed with higher accuracy.

<Aspect 2 of the Fourth Embodiment>
Next, aspect 2 of the fourth embodiment of the present invention will be described.

  FIG. 30 is a diagram showing an example of a schematic configuration of a measurement system 10-2 according to aspect 2 of the fourth embodiment of the present invention.

  In this measurement system 10-2, as shown in FIG. 30, the measurement apparatus 100 according to the first embodiment and the measurement apparatus 300 according to the third embodiment are communicatively connected via the computer network N. There is. Under the present circumstances, about the structure part common in the structure part of the measuring apparatus 100 which concerns on 1st Embodiment shown in FIG. 1, and the structure part of the measurement apparatus 300 which concerns on 3rd Embodiment shown in FIG. It is possible to integrate all or part depending on In addition, a measurement system 10-2 configured including the measurement device 100 according to the first embodiment and the measurement device 300 according to the third embodiment shown in FIG. 30 is formed as, for example, one measurement device. It may be

  FIG. 31: is a schematic diagram which shows an example of the process sequence of the thickness measurement method of the steel pipe 400 by the measurement system 10-2 which concerns on aspect 2 of the 4th Embodiment of this invention.

  First, in the measurement system 10-2, as shown in FIG. 31, the process of the ultrasound probe 110-1 (Ch1) shown in FIG. 24 is performed by the measurement apparatus 100 according to the first embodiment. Specifically, the binary image 4022 obtained as a result of the processing by the B scope image 4021 and the binary image processing unit 154 shown in FIG. 31 by performing the processing of steps S1101 to S1111 in FIG. S echo) detection processing 4023 is performed.

  At this time, in the measurement system 10-2, as shown in FIG. 31, the process of the ultrasound probe 110-1 (Ch1) shown in FIG. 24 is performed by the measurement apparatus 300 according to the third embodiment. Specifically, the processing in steps S3101 to S3108 in FIG. 27 is performed to generate a reference image 4024 related to Ch2 based on the reference waveform data. Next, the measuring apparatus 300 according to the third embodiment performs a process of subtracting the reference image 4024 from the B scope image 4021 in the process of step S3109 of FIG.

  Next, in the measurement system 10-2, as shown in FIG. 31, the measurement apparatus 100 according to the first embodiment detects the position of the upper end (S echo) detected in the detection process 4023 in the process of step S1112 in FIG. A linearized image 4027 according to Ch1 is generated by shifting the data of the B-scope image 4021 subjected to the subtraction processing up and down so that the position of .beta. Thereafter, for example, the measuring apparatus 100 according to the first embodiment performs the thickness measurement of the steel pipe 400 by performing the processes of steps S1113 to S1117 of FIG. 7.

  Similarly, in the measurement system 10-2, as shown in FIG. 31, the process of the ultrasound probe 110-2 (Ch 2) shown in FIG. 24 is performed by the measurement apparatus 100 according to the first embodiment. Specifically, the binary image 4032, which is obtained as a result of the processing by the B scope image 4031, the binary image processing unit 154 shown in FIG. S echo) detection processing 4033 is performed.

  Under the present circumstances, in the measurement system 10-2, as shown in FIG. 31, the process of the ultrasound probe 110-2 (Ch2) shown by FIG. 24 by the measuring apparatus 300 which concerns on 3rd Embodiment is performed. Specifically, the processing in steps S3101 to S3108 in FIG. 27 is performed to generate a reference image 4034 related to Ch1 based on the reference waveform data. Next, the measuring apparatus 300 according to the third embodiment performs a process of subtracting the reference image 4034 from the B scope image 4031 in the process of step S3109 of FIG.

  Next, in the measurement system 10-2, as shown in FIG. 31, the measurement apparatus 100 according to the first embodiment detects the position of the upper end (S echo) detected in the detection process 4033 in the process of step S1112 in FIG. A linearized image 4037 according to Ch2 is generated by shifting the data of the B-scope image 4031 subjected to the subtraction process up and down so that the position of ス コ ー プ is a predetermined position. Thereafter, for example, the measuring apparatus 100 according to the first embodiment performs the thickness measurement of the steel pipe 400 by performing the processes of steps S1113 to S1117 of FIG. 7.

  The measurement system 10-2 according to aspect 2 of the fourth embodiment includes the measurement device 100 according to the first embodiment and the measurement device 300 according to the third embodiment, so that Even in an environment with various disturbances, thickness measurement of a plurality of points of the test material can be performed with higher accuracy.

<Aspect 3 of the Fourth Embodiment>
Next, aspect 3 of the fourth embodiment of the present invention will be described.

  FIG. 32 is a diagram showing an example of a schematic configuration of a measurement system 10-3 according to aspect 3 of the fourth embodiment of the present invention.

  As shown in FIG. 32, this measurement system 10-3 includes the measurement apparatus 100 according to the first embodiment, the measurement apparatus 200 according to the second embodiment, and the measurement apparatus 300 according to the third embodiment. Are mutually communicably connected via a computer network N. At this time, any one of the measuring devices 200-1 to 200-3 may be applied as the measuring device 200 according to the second embodiment. In addition, constituent parts of the measuring apparatus 100 according to the first embodiment shown in FIG. 1 and constituent parts of the measuring apparatus 200 according to the second embodiment shown in FIG. 10, FIG. 19 or FIG. In the components of the measurement apparatus 300 according to the third embodiment, all or part of the common components can be integrated as needed. Further, a measurement system 10-3 configured including the measurement apparatus 100 according to the first embodiment, the measurement apparatus 200 according to the second embodiment, and the measurement apparatus 300 according to the third embodiment shown in FIG. May be formed, for example, as a single measuring device.

  As a process procedure of the thickness measurement method of the steel pipe 400 by this measurement system 10-3, first, the process of the measurement system 10-1 shown in FIG. 29 is performed. Next, the process of the measurement system 10-2 shown in FIG. 31 is performed.

  According to the measurement system 10-3 according to aspect 3 of the fourth embodiment, the measurement apparatus 100 according to the first embodiment, the measurement apparatus 200 according to the second embodiment, and the measurement apparatus according to the third embodiment Since the configuration 300 is included, it is possible to measure the thickness of a plurality of portions of the test material with high accuracy even under an environment with various disturbances.

(Other embodiments)
Also in the measuring apparatus 100 according to the first embodiment described above and the measuring apparatus 300 according to the third embodiment, the thickness of the reference material 410 is considered in the same manner as the measuring apparatus 200 according to the second embodiment described above. Then, the final thickness of the steel pipe 400 may be calculated.

  Further, as another embodiment, software (program) for executing the processing of the flowcharts shown in FIG. 7, FIG. 17, FIG. 18, FIG. 21, FIG. The present invention is also included in the present invention as being supplied to an apparatus, and a system (or CPU, MPU or the like) of the system or apparatus reading and executing a program. Further, the program and a computer readable storage medium storing the program are also included in the present invention.

  The embodiments of the present invention described above are merely examples of implementation for carrying out the present invention, and the technical scope of the present invention should not be interpreted limitedly by these. It is. That is, the present invention can be implemented in various forms without departing from the technical concept or the main features thereof.

100, 200, 300: measuring device, 110: ultrasonic probe, 111, 112: ultrasonic wave, 120: transmission / reception unit, 121: transmission unit, 122: reception unit, 130: amplification unit, 140: A / D conversion Unit, 150, 250, 350: Control and processing unit, 151, 251, 351: Ultrasonic waveform data generation unit, 152: B scope image generation unit, 153: Binary image generation unit, 154: Binary image processing unit, 155: linearized image generation unit, 156, 252, 352: gate setting unit, 157: position detection unit, 158, 255, 357: thickness calculation unit, 159, 256, 358: display control unit, 160: information input unit , 170: communication unit, 180: storage unit, 190: display unit, 253: ultrasonic waveform data processing unit, 2531: histogram creation unit, 2532: amplification degree calculation unit, 2533: window function processing unit, 54,356: reception time calculator, 353: reception time detecting unit, 354: reference waveform data generation unit, 355: waveform data subtraction unit, 400: steel pipe, 400S: the surface of the steel pipe, 400B: back surface of the steel tube

Claims (28)

A measuring device for measuring the thickness of a test material,
Transmission means for transmitting ultrasonic waves toward the surface of the test material;
Receiving means for receiving the ultrasonic waves from the test material;
Ultrasonic waveform data generation means for generating ultrasonic waveform data representing the amplitudes of ultrasonic waves from the test material in time series;
Two-dimensional array luminance data generation means for converting the value of the amplitude of the ultrasonic waveform data generated by the ultrasonic waveform data generation means into a value of luminance to generate two-dimensional array luminance data;
Two-dimensional array binary data generation means for generating two-dimensional array binary data by binarizing the two-dimensional array luminance data using a predetermined binarization threshold value;
Two-dimensional array binary data processing means for removing one mass region satisfying a predetermined condition from among one mass region in which one of the binary values in the two-dimensional array binary data is grouped ,
A thickness calculating means for calculating a thickness of the inspection material based on two-dimensional array binary data obtained as a result of processing by the two-dimensional array binary data processing means; . The transmitting means moves the test subject and the ultrasonic probe relative to each other, and at each measurement point of the test subject, the surface of the test subject via the ultrasonic probe. Send ultrasound to the
The receiving means receives the ultrasonic waves from the test material via the ultrasonic probe at each of the measurement points,
The ultrasonic waveform data generation unit generates the ultrasonic waveform data for each of the measurement points,
The two-dimensional array luminance data generation unit converts the value of the amplitude of the ultrasonic waveform data generated for each of the measurement points by the ultrasonic waveform data generation unit into a value of luminance, and the flesh of the test material Generating the two-dimensional array luminance data with the thickness direction and the movement direction of the ultrasonic probe relative to the test material as axes;
The two-dimensional array binary data processing means performs processing of removing, from the one mass area, one mass area that satisfies at least one of an area less than a predetermined area and a width less than a predetermined width as the predetermined condition;
The thickness calculating means calculates the thickness of the test material for each of the measurement points based on two-dimensional array binary data obtained as a result of processing by the two-dimensional array binary data processing means. The measuring device according to claim 1, The two-dimensional array luminance data generation unit generates a B-scope image as the two-dimensional array luminance data.
The two-dimensional array binary data generation unit binarizes the B-scope image using the predetermined binarization threshold as the two-dimensional array binary data to generate a binary image.
The two-dimensional array binary data processing means performs processing of removing image particles of the binary image as the one-mass region,
The thickness calculating means calculates the thickness of the test material for each of the measurement points based on the binary image obtained as a result of the processing by the two-dimensional array binary data processing means. The measuring device according to claim 1 or 2. The B scope image is an image in which the thickness direction of the test material is a direction from top to bottom,
The position of the upper end of the image particle is detected from the binary image obtained as a result of the processing by the two-dimensional array binary data processing means, and the B scope image is detected so that the position of the upper end becomes a straight line at a predetermined position. And linearized image generation means for generating a linearized image in which the data of
The measuring apparatus according to claim 3, wherein the thickness calculation means calculates the thickness of the test material for each of the measurement points using the linearized image. A first detection gate indicating a range for detecting surface reflected ultrasonic waves, which are the ultrasonic waves reflected by the surface of the test material, with respect to the linearized image, and propagates inside the test material And a gate setting unit configured to set a second detection gate indicating a range for detecting the back surface reflected ultrasonic wave which is the ultrasonic wave reflected by the back surface of the test material.
The first position corresponding to the time when the surface reflection ultrasonic wave is received by the receiving means from within the range of the first detection gate and the range from within the range of the second detection gate for each of the measurement points Position detection means for detecting a second position corresponding to the time when the back surface reflection ultrasonic wave is received by the reception means;
The thickness calculation means is configured to determine the inspection material based on the first position, the second position, and the velocity of the ultrasonic wave that has propagated inside the inspection material for each of the measurement points. The measuring device according to claim 4, wherein the thickness of the wall is calculated.   6. The measuring apparatus according to claim 5, further comprising display control means for performing control of displaying on the display unit the linearized image in which the first position and the second position are colored. The first position is the predetermined position in the linearized image,
The second position is a position within the range of the second detection gate in the linearized image, and is a position of an upper end which becomes the one value when the binarization processing is performed. The measuring device according to claim 5 or 6. The gate setting means is configured to be able to set a range for detecting each of at least two of the back surface reflection ultrasonic waves having different numbers of reflections on the back surface of the test material as the second detection gate. ,
In the case where the thickness calculation means sets a detection gate indicating a range for detecting one of the two back surface reflection ultrasonic waves as the second detection gate in the gate setting means. When the thickness value of the material to be inspected calculated based on the second detection gate exceeds a reference thickness value, the gate setting unit sets the second back surface reflection ultrasonic wave as the second detection gate. In the case where a detection gate indicating a range for detecting the other back surface reflection ultrasonic wave is set, the inspection is performed in consideration of the thickness value of the inspection material calculated based on the second detection gate. The measurement apparatus according to any one of claims 5 to 7, wherein a final thickness of the material is calculated. A measuring method by a measuring device, comprising: transmitting means for transmitting ultrasonic waves toward the surface of the test material; and receiving means for receiving the ultrasonic waves from the test material, and measuring the thickness of the test material And
An ultrasonic waveform data generation step of generating ultrasonic waveform data in which the amplitudes of the ultrasonic waves from the test material are indicated in time series;
A two-dimensional array luminance data generation step of converting the value of the amplitude of the ultrasonic waveform data generated at the ultrasonic waveform data generation step into a luminance value to generate two-dimensional array luminance data;
A two-dimensional array binary data generation step of generating two-dimensional array binary data by binarizing the two-dimensional array luminance data using a predetermined binarization threshold value;
A two-dimensional array binary data processing step of removing one mass region satisfying a predetermined condition from among one mass region in which one of the binary values in the two-dimensional array binary data is grouped; ,
A thickness calculating step of calculating a thickness of the material to be inspected on the basis of two-dimensional array binary data obtained as a result of processing by the two-dimensional array binary data processing step; . A measuring device for measuring the thickness of a test material,
Transmitting means for transmitting ultrasonic waves toward the surface of the test object via an ultrasonic probe;
Receiving means for receiving the ultrasonic wave from the test material through the ultrasonic probe;
For detecting surface reflection ultrasonic waves, which are the ultrasonic waves reflected by the surface of the test material, with respect to first ultrasonic waveform data indicating the amplitudes of the ultrasonic waves from the test material in time series A first detection gate indicating a range, and a second detection indicating a range for detecting a back surface reflection ultrasonic wave which is the ultrasonic wave propagated inside the test material and reflected by the back surface of the test material Gate setting means for setting the gate and
An ultrasonic waveform for performing processing of changing the amplitude of data in a range of at least one of the first detection gate and the second detection gate in the first ultrasonic waveform data Data processing means,
With regard to the ultrasonic waveform data obtained by performing the process of changing the amplitude by the ultrasonic waveform data processing means, the time when the surface reflection ultrasonic wave is received by the receiving means from within the range of the first detection gate Reception time calculation means for calculating a first reception time which is the second reception time which is a time when the back surface reflection ultrasonic wave is received by the reception means from within the range of the second detection gate;
Thickness calculation means for calculating the thickness of the test material based on the first reception time and the second reception time, and the velocity of the ultrasonic wave propagating through the inside of the test material; The measuring apparatus characterized by having. The ultrasonic waveform data processing means
Histogram creation for creating a first histogram related to the amplitude of the ultrasonic wave within the range of one of the first detection gate and the second detection gate for the first ultrasonic waveform data Means,
And amplification factor calculating means for calculating an amplification factor at which the count value of a specific bin in the first histogram becomes a predetermined value, the first overtaking based on the amplification factor calculated by the amplification factor calculating means. Processing for changing the amplitude of the sound wave waveform data to obtain second ultrasonic wave data;
11. The measurement apparatus according to claim 10, wherein the reception time calculation unit calculates the first reception time and the second reception time for the second ultrasonic waveform data. The ultrasonic waveform data processing means
A window function is applied to the data in the range of at least one of the first detection gate and the second detection gate in the first ultrasonic waveform data to perform the processing of multiplying the amplitude by the window function. Window function processing means for changing
The said reception time calculation means is characterized by calculating said 1st reception time and said 2nd reception time about the ultrasound waveform data obtained by performing the process which multiplies the said window function. The measuring device as described in 10. The ultrasonic waveform data processing means
A window function is applied to the data in the range of at least one of the first detection gate and the second detection gate in the first ultrasonic waveform data to perform the processing of multiplying the amplitude by the window function. Window function processing means for changing
Histogram creation for creating a first histogram related to the amplitude of the ultrasonic wave within the range of one of the first detection gate and the second detection gate for the first ultrasonic waveform data Means,
And amplification factor calculating means for calculating an amplification factor at which the count value of a specific bin in the first histogram becomes a predetermined value, the first overtaking based on the amplification factor calculated by the amplification factor calculating means. Processing for changing the amplitude of the sound wave waveform data to obtain second ultrasonic wave data;
11. The measurement apparatus according to claim 10, wherein the reception time calculation unit calculates the first reception time and the second reception time for the second ultrasonic waveform data. The predetermined value is
Ultrasonic waves are transmitted from the transmitting means toward the surface of the reference material serving as the reference of the test material through the ultrasonic probe, and the receiving means receives the ultrasonic wave through the ultrasonic probe. The first detection gate for the third ultrasonic waveform data which receives the ultrasonic wave from the reference material and the amplitude of the ultrasonic wave from the reference material is indicated in time series in the gate setting means; Setting the second detection gate,
When the second histogram relating to the amplitude of the ultrasonic wave is generated within the range of the detection gate in which the first histogram is generated for the third ultrasonic waveform data in the histogram generation means, the second The measurement apparatus according to claim 11 or 13, which is a count value of a specific bin in a histogram. It further comprises conversion means for converting the ultrasonic wave from the test material received by the reception means from an analog signal to a digital signal,
The measuring apparatus according to any one of claims 11, 13 and 14, wherein the specific bin is a bin including an upper limit value or a lower limit value of the conversion means.   The window function processing means multiplies the window function by aligning a predetermined position within the range of a detection gate multiplied by the window function in the first ultrasonic waveform data with a reference position of the window function. The measuring device according to claim 12 or 13, characterized by performing combining processing.   The predetermined position is the position of the maximum amplitude within the range of the detection gate multiplied by the window function in the first ultrasonic waveform data, or the window function in the first ultrasonic waveform data multiplied The measuring device according to claim 16, characterized in that it is the position of the maximum value of the envelope when the absolute value of the amplitude within the range of the detection gate is taken. Transmitting means for transmitting ultrasonic waves toward the surface of the test material through the ultrasonic probe, and receiving means for receiving the ultrasonic waves from the test material through the ultrasonic probe And measuring the thickness of the test material.
For detecting surface reflection ultrasonic waves, which are the ultrasonic waves reflected by the surface of the test material, with respect to first ultrasonic waveform data indicating the amplitudes of the ultrasonic waves from the test material in time series A first detection gate indicating a range, and a second detection indicating a range for detecting a back surface reflection ultrasonic wave which is the ultrasonic wave propagated inside the test material and reflected by the back surface of the test material A gate setting step of setting a gate and
An ultrasonic waveform for performing processing of changing the amplitude of data in a range of at least one of the first detection gate and the second detection gate in the first ultrasonic waveform data Data processing steps,
Regarding ultrasonic waveform data obtained by performing the process of changing the amplitude in the ultrasonic waveform data processing step, the time when the surface reflection ultrasonic wave is received by the receiving means from within the range of the first detection gate A reception time calculation step of calculating a first reception time which is the second reception time which is a time when the back surface reflection ultrasonic wave is received by the reception means from within the range of the second detection gate;
Calculating a thickness of the test material based on the first reception time and the second reception time, and the velocity of the ultrasonic wave propagating through the inside of the test material; The measuring method characterized by having. A measuring device for measuring the thickness of a test material,
A transmitting unit that transmits ultrasonic waves toward the surface of the test material via the ultrasonic probes of the plurality of ultrasonic probes disposed on the test material;
Receiving means for receiving the ultrasonic waves from the test material via the ultrasonic probes;
Ultrasonic waveform data generation means for generating ultrasonic waveform data representing, in time series, the amplitude of ultrasonic waves from the test material for each of the ultrasonic probes;
About the said ultrasonic wave waveform data which concerns on the 2nd ultrasonic probe except the 1st ultrasonic probe which is one ultrasonic probe contained in the plurality of ultrasonic probes. Reception time detection means for detecting the time when the surface reflection ultrasonic wave which is the ultrasonic wave reflected by the surface of the material is received by the reception means;
The surface reflection received via the second ultrasonic probe, superimposed on the ultrasonic waveform data relating to the first ultrasonic probe at the position of the time detected by the reception time detection means Reference waveform data generation means for generating reference waveform data in which a reference waveform assuming noise based on ultrasound is arranged;
Waveform data subtracting means for performing a process of subtracting the reference waveform data from the ultrasonic waveform data related to the first ultrasonic probe;
And a thickness calculating means for calculating the thickness of the test material based on the ultrasonic waveform data obtained by performing the process of subtracting the waveform data subtracting means. A first detection gate indicating a range for detecting the surface reflection ultrasonic wave with respect to the ultrasonic wave waveform data generated for each of the ultrasonic probes by the ultrasonic wave waveform data generating means; Gate setting means for setting a second detection gate indicating a range for detecting the back surface reflected ultrasonic wave which is the ultrasonic wave propagated inside the inspection material and reflected by the back surface of the inspection material;
The ultrasonic wave waveform data obtained by performing the process of subtraction by the waveform data subtraction means, the time when the surface reflection ultrasonic wave is received by the reception means from within the range of the first detection gate Reception time calculation means for calculating the second reception time which is the time at which the back surface reflection ultrasonic wave is received by the reception means from within the range of the second detection gate;
The thickness calculation means calculates the thickness of the test material based on the first reception time and the second reception time, and the velocity of the ultrasonic wave propagated through the inside of the test material. 20. The measuring device according to claim 19, wherein:   21. The reference waveform data generation method according to claim 19, wherein the reference waveform data generation unit generates the reference waveform data using the amplitude magnitude of the reference waveform and the shape of the reference waveform which are set in advance. Measuring device.   The reference waveform data generation unit is configured to generate the amplitude of the reference waveform and the shape of the reference waveform based on the waveform of the surface reflection ultrasonic wave of the ultrasonic waveform data related to the second ultrasonic probe. 21. The measurement apparatus according to claim 19 or 20, which determines and generates the reference waveform data. When there are a plurality of the second ultrasonic probes,
The reception time detection means detects the time when the surface reflection ultrasonic wave is received by the reception means for each of the ultrasonic waveform data relating to each of the second ultrasonic probes.
The reference waveform data generation unit generates each of the reference waveform data relating to each of the second ultrasonic probes.
The waveform data subtracting means performs a process of subtracting the reference waveform data of each of the second ultrasonic probes from the ultrasonic waveform data of the first ultrasonic probe. The measuring device according to any one of claims 19 to 22, characterized in that. Transmission means for transmitting ultrasonic waves toward the surface of the test material through the ultrasonic probes of the plurality of ultrasonic probes arranged for the test material, and the ultrasonic probes And a receiving unit configured to receive the ultrasonic wave from the test material via a feeler, wherein the measurement method is performed by a measuring device that measures the thickness of the test material,
An ultrasonic waveform data generation step of generating ultrasonic waveform data in which the amplitudes of the ultrasonic waves from the test material are indicated in time series for each of the ultrasonic probes;
About the said ultrasonic wave waveform data which concerns on the 2nd ultrasonic probe except the 1st ultrasonic probe which is one ultrasonic probe contained in the plurality of ultrasonic probes. A reception time detection step of detecting a time at which the surface reflection ultrasonic wave which is the ultrasonic wave reflected by the surface of the material is received by the reception means;
The surface reflection received via the second ultrasonic probe, which is superimposed in the ultrasonic waveform data relating to the first ultrasonic probe at the position of the time detected in the reception time detection step A reference waveform data generation step of generating reference waveform data in which a reference waveform assuming noise based on ultrasonic waves is arranged;
A waveform data subtraction step of performing a process of subtracting the reference waveform data from the ultrasonic waveform data related to the first ultrasonic probe;
A thickness calculating step of calculating a thickness of the test material based on the ultrasonic waveform data obtained by performing the process of subtracting by the waveform data subtracting means. A measuring device according to any one of claims 1 to 8;
And the measuring device according to any one of claims 10 to 17.
In the measuring apparatus according to any one of claims 10 to 17,
9. The measuring apparatus according to any one of claims 1 to 8, wherein the gate setting means processes the two-dimensional array binary data obtained as a result of processing by the two-dimensional array binary data processing means. The ultrasonic waveform data relating to each measurement point in the two-dimensional array luminance data is used as the first ultrasonic waveform data, and the first detection gate and the second detection with respect to the first ultrasonic waveform data. Set the gate and
The measurement system, wherein the thickness calculation means calculates the thickness of the test material. A measuring device according to any one of claims 1 to 8;
24. A measuring apparatus according to any one of claims 19 to 23, comprising:
The measurement device according to any one of claims 19 to 23,
The two-dimensional array luminance data obtained by the measurement device according to any one of claims 1 to 8 as the ultrasonic waveform data relating to the first ultrasonic probe in the waveform data subtraction means. Applying and subtracting the reference waveform data from the two-dimensional array luminance data;
In the measuring device according to any one of claims 1 to 8,
The thickness calculation means, using the two-dimensional array brightness data processed based on the two-dimensional array binary data obtained as a result of processing by the two-dimensional array binary data processing means, the thickness of the test material Calculating a measurement system. A measuring device according to any one of claims 1 to 8;
A measuring device according to any one of claims 10 to 17,
24. A measuring apparatus according to any one of claims 19 to 23, comprising:
The measurement device according to any one of claims 19 to 23,
The two-dimensional array luminance data obtained by the measurement device according to any one of claims 1 to 8 as the ultrasonic waveform data relating to the first ultrasonic probe in the waveform data subtraction means. Applying and subtracting the reference waveform data from the two-dimensional array luminance data;
In the measuring apparatus according to any one of claims 10 to 17,
9. The measuring apparatus according to any one of claims 1 to 8, wherein the gate setting means processes the two-dimensional array binary data obtained as a result of processing by the two-dimensional array binary data processing means. The ultrasonic waveform data relating to each measurement point in the two-dimensional array luminance data is used as the first ultrasonic waveform data, and the first detection gate and the second detection with respect to the first ultrasonic waveform data. Set the gate and
The measurement system, wherein the thickness calculation means calculates the thickness of the test material.   A program for causing a computer to execute each step in the measurement method according to any one of claims 9, 18 and 24.