JP6977529B2 - Measuring equipment, measuring methods, measuring systems and programs - Google Patents

Description

The present invention relates to a measuring device and a measuring method for measuring the wall thickness of a material to be inspected, a measuring system including the measuring device, and a program for causing a computer to execute the measuring method.

Conventionally, a method of measuring the wall thickness of a steel pipe as an inspected material by using ultrasonic waves has been proposed (see, for example, Patent Document 1). Specifically, in Patent Document 1, in order to detect a defect on the inner surface of a steel pipe, ultrasonic waves are propagated from the outer surface (front surface) to the inner surface (back surface) of the steel pipe via an ultrasonic probe. Therefore, the ultrasonic path (that is, the wall thickness of the steel pipe) is calculated. At this time, in Patent Document 1, in order to measure the wall thickness of a plurality of steel pipes, the measurement is performed while the ultrasonic probe and the steel pipe as the inspected material are relatively moved.

Japanese Unexamined Patent Publication No. 2012-177685

In Patent Document 1, when calculating the path of ultrasonic waves propagating inside a steel pipe as an inspected material (that is, the wall thickness of the steel pipe), a predetermined threshold value is set and an echo from the inner surface (back surface) of the steel pipe is set. I try to detect the signal.

In general, in online ultrasonic measurement during steel pipe manufacturing, various disturbances such as changes in the surface state due to scales attached to the surface of the steel pipe, bending and shape defects of the steel pipe, and fluttering during transportation of the steel pipe occur. When such various disturbances occur, it is considered that the amplitude value of the echo signal fluctuates remarkably. In this case, the technique of Patent Document 1 described above makes it possible to measure the wall thickness of a plurality of steel pipes with high accuracy. It's difficult to do.

The present invention has been made in view of such problems, and an object of the present invention is to provide a mechanism capable of measuring the wall thickness of a plurality of places to be inspected with high accuracy even in an environment with various disturbances. And.

The measuring device of the present invention is a measuring device for measuring the wall thickness of the material to be inspected, and is a transmission means for transmitting ultrasonic waves toward the surface of the material to be inspected at each measurement point of the material to be inspected. For each measurement point, the receiving means for receiving the ultrasonic waves from the material to be inspected and the ultrasonic waveform data for generating ultrasonic waveform data showing the amplitude of the ultrasonic waves from the material to be inspected in chronological order. The generation means, the two-dimensional array brightness data generation means for converting the amplitude value of the ultrasonic waveform data generated by the ultrasonic waveform data generation means into the brightness value, and generating the two-dimensional array brightness data, and the above-mentioned. A two-dimensional array binary data generation means for generating two-dimensional array binary data by binarizing the two-dimensional array brightness data using a predetermined binarization threshold, and two in the two-dimensional array binary data. The two-dimensional array binary data processing means, the linearized image generation means, and the above-mentioned one based on the two-dimensional array binary data obtained as a result of the processing by the two-dimensional array binary data processing means, wherein possess a wall thickness calculating means for calculating the thickness of the test material, the two-dimensional array intensity data The generation means generates a B-scope image in which the wall thickness direction of the material to be inspected is from top to bottom as the two-dimensional array brightness data, and the two-dimensional array binary data generation means is the two-dimensional array. As the binary data, the B-scope image is binarized using the predetermined binarization threshold to generate a binary image, and the two-dimensional array binary data processing means is the 2 as a single block region. The process of removing the image particles of the value image is performed, and the linearized image generation means detects the position of the upper end of the image particles in the binary image obtained as a result of the process by the two-dimensional array binary data processing means. Then, a linearized image is generated in which the data of the B scope image is shifted up and down so that the position of the upper end becomes a straight line at a predetermined position, and the wall thickness calculating means uses the linearized image. The wall thickness of the material to be inspected is calculated for each measurement point.

Another aspect of the measuring device of the present invention is a measuring device for measuring the wall thickness of the material to be inspected, which transmits an ultrasonic wave toward the surface of the material to be inspected via an ultrasonic probe. The means, the receiving means for receiving the sound wave from the material to be inspected via the ultrasonic probe, and the first sound wave showing the amplitude of the sound wave from the material to be inspected in chronological order. With respect to the waveform data, a first detection gate indicating a range for detecting the surface reflected sound wave, which is the sound wave reflected on the surface of the material to be inspected, and the inside of the material to be inspected are propagated and said. A gate setting means for setting a second detection gate indicating a range for detecting the back surface reflected sound wave which is the ultrasonic wave reflected on the back surface of the material to be inspected, and the first ultrasonic wave waveform data. An ultrasonic wave waveform data processing means that performs a process of changing the amplitude of data within the range of at least one of the detection gate 1 and the second detection gate, and the ultrasonic wave waveform data processing. With respect to the ultrasonic wave waveform data obtained by performing the process of changing the amplitude by the means, the first reception, which is the time when the surface reflected sound wave is received by the receiving means from within the range of the first detection gate. A reception time calculation means for calculating the time and a second reception time which is the time when the back surface reflected sound wave is received by the reception means from within the range of the second detection gate, the first reception time, and the first reception time. said second reception time, said propagated through inside the test material on the basis of the ultrasonic velocity, said possess a wall thickness calculating means for calculating the thickness of the test material, the ultrasonic wave The data processing means is a process of multiplying the data within the range of at least one of the first detection gate and the second detection gate in the first ultrasonic waveform data by a window function. A first histogram relating to the amplitude of the sound wave is created for the data obtained by multiplying the window function by the window function processing means for changing the amplitude and the window function processing means. It has an amplification degree calculating means for calculating an amplification degree at which the count value of a specific bin in the first histogram becomes a predetermined value, and is based on the amplification degree calculated by the amplification degree calculation means. The processing for changing the amplitude of the first ultrasonic wave waveform data is performed to acquire the second ultrasonic wave waveform data, and the reception time calculation means obtains the second ultrasonic wave waveform data with respect to the second ultrasonic wave waveform data. Calculate the reception time of 1 and the second reception time. Put out.

Further, another aspect of the measuring device of the present invention is a measuring device for measuring the wall thickness of the material to be inspected, and each ultrasonic probe in a plurality of ultrasonic probes arranged with respect to the material to be inspected. A transmitting means for transmitting ultrasonic waves toward the surface of the material to be inspected via a tentacle, and a receiving means for receiving the ultrasonic waves from the material to be inspected via each ultrasonic probe. For each ultrasonic probe, an ultrasonic waveform data generation means for generating ultrasonic waveform data showing the amplitude of ultrasonic waves from the material to be inspected in chronological order, and a plurality of ultrasonic probes. The ultrasonic waveform data of the second ultrasonic probe excluding the first ultrasonic probe, which is one ultrasonic probe included in the above, is reflected on the surface of the material to be inspected. The ultrasonic probe according to the first ultrasonic probe is located at the position of the reception time detecting means for detecting the time when the surface reflected ultrasonic wave, which is a sound wave, is received by the receiving means, and the time detected by the receiving time detecting means. A reference waveform data generation means for generating reference waveform data in which a reference waveform is arranged assuming noise based on the surface reflected ultrasonic wave received via the second ultrasonic probe, which is superimposed on the ultrasonic waveform data. Obtained by performing the processing of subtracting the reference waveform data from the ultrasonic waveform data related to the first ultrasonic probe and the processing of subtracting the reference waveform data by the waveform data subtracting means. It has a wall thickness calculating means for calculating the wall thickness of the material to be inspected based on the ultrasonic waveform data.

The present invention also includes a measuring method using the above-mentioned measuring device, a measuring system including the above-mentioned measuring device, and a program for causing a computer to execute the measuring method.

According to the present invention, it is possible to measure the wall thickness of a plurality of places to be inspected with high accuracy even in an environment with various disturbances.

It is a figure which shows an example of the schematic structure of the measuring apparatus which concerns on 1st Embodiment of this invention. It is a schematic diagram for demonstrating the ultrasonic waveform data generated by the ultrasonic waveform data generation unit shown in FIG. 1 and the B scope image generated by the B scope image generation unit shown in FIG. 1. An example of the ultrasonic waveform data generated by the ultrasonic waveform data generation unit shown in FIG. 1 and the B-scope image generated by the B-scope image generation unit shown in FIG. 1 when noise is generated due to disturbance is shown. It is a figure. A B-scope image generated by the B-scope image generation unit shown in FIG. 1, a binary image generated by the binary image generation unit shown in FIG. 1, and a binary image shown in FIG. 1 when noise is generated due to disturbance. It is a figure which shows an example of the binary image obtained as a result of processing by a processing unit, and the linearized image generated by the linearized image generation unit shown in FIG. The first detection gate and the second detection gate set by the gate setting unit shown in FIG. 1, the position detection process performed by the position detection unit shown in FIG. 1, and the wall thickness performed by the wall thickness calculation unit shown in FIG. It is a figure which shows an example of the calculation process and the wall thickness chart displayed by the display control unit shown in FIG. It is a figure for demonstrating the binarization threshold value used at the time of performing the binarization processing in the binary image generation part shown in FIG. It is a flowchart which shows an example of the processing procedure of the wall thickness measuring method of a steel pipe by the measuring apparatus which concerns on 1st Embodiment of this invention. It is a figure which shows an example of the 1st wall thickness measurement result in the steel pipe in the measuring apparatus which concerns on 1st Embodiment of this invention. It is a figure which shows an example of the 2nd wall thickness measurement result in the steel pipe in the measuring apparatus which concerns on 1st Embodiment of this invention. It is a figure which shows an example of the schematic structure of the measuring apparatus which concerns on aspect 1 of the 2nd Embodiment of this invention. It is a schematic diagram for demonstrating the ultrasonic waveform data generated by the ultrasonic waveform data generation part shown in FIG. An example of the first ultrasonic waveform data generated by the ultrasonic waveform data generation unit shown in FIG. 10 and the first detection gate and the second detection gate set by the gate setting unit shown in FIG. 10 is shown. It is a figure. FIG. 5 is a diagram showing an example of a case where the histogram creating unit shown in FIG. 10 creates a first histogram relating to the amplitude of ultrasonic waves within the range of the second detection gate for the first ultrasonic waveform data shown in FIG. be. FIG. 10 is a diagram showing an example of a case where the histogram creating unit shown in FIG. 10 creates a second histogram relating to the amplitude of the ultrasonic wave within the range of the second detection gate for the third ultrasonic waveform data. It is a figure which shows an example of the calibration curve data used when calculating the amplification degree in the amplification degree calculation part shown in FIG. An example of the second ultrasonic waveform data acquired by the ultrasonic waveform data processing unit shown in FIG. 10 and the first detection gate and the second detection gate set by the gate setting unit shown in FIG. 10 is shown. It is a figure. It is a flowchart which shows an example of the processing procedure of the wall thickness measuring method of a reference material by the measuring apparatus which concerns on aspect 1 of 2nd Embodiment of this invention. It is a flowchart which shows an example of the processing procedure of the wall thickness measuring method of a steel pipe by the measuring apparatus which concerns on aspect 1 of 2nd Embodiment of this invention. It is a figure which shows an example of the schematic structure of the measuring apparatus which concerns on aspect 2 of the 2nd Embodiment of this invention. It is a figure which shows an example of the window function used in the window function processing part shown in FIG. It is a flowchart which shows an example of the processing procedure of the wall thickness measuring method of a steel pipe by the measuring apparatus which concerns on aspect 2 of 2nd Embodiment of this invention. It is a figure which shows an example of the schematic structure of the measuring apparatus which concerns on aspect 3 of the 2nd Embodiment of this invention. It is a flowchart which shows an example of the processing procedure of the wall thickness measuring method of a steel pipe by the measuring apparatus which concerns on aspect 3 of 2nd Embodiment of this invention. It is a figure which shows an example of the schematic structure of the measuring apparatus which concerns on 3rd Embodiment of this invention. It is a figure which shows an example of the ultrasonic waveform data generated by the ultrasonic waveform data generation unit shown in FIG. 24, and the first detection gate and the second detection gate set by the gate setting unit shown in FIG. 24. .. The ultrasonic waveform data generated by the ultrasonic waveform data generation unit shown in FIG. 24, the first detection gate and the second detection gate set by the gate setting unit shown in FIG. 24, and the reception time detection unit shown in FIG. 24. It is a figure which shows an example of the time detection processing performed in FIG. 24, the reference waveform data generated by the reference waveform data generation unit shown in FIG. 24, and the waveform data subtraction processing performed by the reception time detection unit shown in FIG. 24. It is a flowchart which shows an example of the processing procedure of the wall thickness measuring method of a steel pipe by the measuring apparatus which concerns on 3rd Embodiment of this invention. It is a figure which shows an example of the schematic structure of the measurement system which concerns on aspect 1 of the 4th Embodiment of this invention. It is a schematic diagram which shows an example of the processing procedure of the wall thickness measuring method of a steel pipe by the measuring system which concerns on aspect 1 of 4th Embodiment of this invention. It is a figure which shows an example of the schematic structure of the measurement system which concerns on aspect 2 of the 4th Embodiment of this invention. It is a schematic diagram which shows an example of the processing procedure of the wall thickness measuring method of a steel pipe by the measuring system which concerns on aspect 2 of 4th Embodiment of this invention. It is a figure which shows an example of the schematic structure of the measurement system which concerns on aspect 3 of the 4th Embodiment of this invention.

Hereinafter, embodiments (embodiments) for carrying out the present invention will be described with reference to the drawings. In each embodiment of the present invention shown below, an example in which a steel pipe is applied as the material to be inspected in the present invention will be described, but the present invention is not limited to this steel pipe, and ultrasonic waves are used. It is applicable as long as it can measure the wall thickness (for example, steel plate).

(First Embodiment)
First, the first embodiment of the present invention will be described.

FIG. 1 is a diagram showing an example of a schematic configuration of a measuring device 100 according to a first embodiment of the present invention. The measuring device 100 is a device that measures the wall thickness of the steel pipe 400 at each measurement point of the steel pipe 400 while relatively moving the steel pipe 400, which is the material to be inspected, and the ultrasonic probe 110. Here, the wall thickness of the steel pipe 400 is determined by the length between the surface 400S of the steel pipe, which is the outer surface of the steel pipe 400, and the back surface 400B of the steel pipe, which is the inner surface of the steel pipe 400.

As shown in FIG. 1, the measuring device 100 includes an ultrasonic probe 110, a transmission / reception unit 120, an amplification unit 130, an A / D conversion unit 140, a control / processing unit 150, an information input unit 160, a communication unit 170, and a storage unit. It is configured to have a unit 180 and a display unit 190.

The ultrasonic probe 110 controls the transmission and reception of ultrasonic waves at a plurality of measurement points of the steel pipe 400 by moving relative to the steel pipe 400.

As an example of relatively moving the ultrasonic probe 110 and the steel pipe 400, in FIG. 1, the ultrasonic probe 110 moves in the circumferential direction of the steel pipe 400 based on the control of the control / processing unit 150. Although the form is exemplified, the present invention is not limited to this form. For example, a form in which the steel tube 400 side moves while the ultrasonic probe 110 is stationary is also applicable to the present invention, and a plurality of ultrasonic probes 110 are provided and the ultrasonic probes 110 are provided. A form in which the wall thickness measurement position on the steel pipe 400 is moved by electrically changing the ultrasonic wave transmission direction by appropriately controlling the ultrasonic wave transmission timing is also applicable to the present invention. Further, FIG. 1 shows an example in which the ultrasonic probe 110 moves in the circumferential direction of the steel pipe 400. For example, the ultrasonic probe 110 determines the pipe axial direction (z direction in FIG. 1) of the steel pipe 400. It can also be applied to moving forms. Further, FIG. 1 shows an example in which one ultrasonic probe 110 is provided in the circumferential direction of the steel pipe 400 for the sake of simplicity, but as described above, for example, in order to improve the measurement efficiency. It is also applicable to a form in which a plurality of ultrasonic probes 110 are provided in the circumferential direction of the steel pipe 400.

The transmission / reception unit 120 transmits / receives ultrasonic waves to / from the steel pipe 400 via the ultrasonic probe 110 based on the control of the control / processing unit 150. The transmission / reception unit 120 includes a transmission unit 121 and a reception unit 122.

The transmission unit 121 is directed toward the surface 400S of the steel pipe via the ultrasonic probe 110 that moves relative to the steel pipe 400 at each measurement point of the steel pipe 400 under the control of the control / processing unit 150. The process of transmitting the ultrasonic wave 111 is performed. Further, the receiving unit 122 performs a process of receiving the ultrasonic wave 112 from the steel pipe 400 via the ultrasonic probe 110 at each measurement point of the steel pipe 400 based on the control of the control / processing unit 150. ..

The amplification unit 130 performs a process of amplifying the ultrasonic wave 112 from the steel pipe 400 received by the reception unit 122 based on the control of the control / processing unit 150.

Based on the control of the control / processing unit 150, the A / D conversion unit 140 performs a process of converting the ultrasonic wave 112 from the steel pipe 400 after being amplified by the amplification unit 130 from an analog signal to a digital signal.

In the present embodiment, the signal that has passed through the amplification unit 130 is in the order of passing through the A / D conversion unit 140, but the order is reversed and the signal that has passed through the A / D conversion unit 140 is used. The order of amplification by the amplification unit 130 can also be set. By doing so, the digital signal is amplified, so that the handling of the signal can be facilitated.

The control / processing unit 150 controls each component of the measuring device 100 based on, for example, the input information input from the information input unit 160 and the input information input from the communication unit 170, and controls the operation of the measuring device 100. Control. Further, the control / processing unit 150 performs various processes based on, for example, the input information input from the information input unit 160 and the input information input from the communication unit 170. As shown in FIG. 1, the control / processing unit 150 includes an ultrasonic waveform data generation unit 151, a B-scope image generation unit 152, a binary image generation unit 153, a binary image processing unit 154, and a linearized image generation unit 155. , A gate setting unit 156, a position detection unit 157, a wall thickness calculation unit 158, and a display control unit 159. A description of each of the constituent units 151 to 159 in the control / processing unit 150 will be described later.

The information input unit 160 inputs, for example, the input information operation-input by the user to the control / processing unit 150.

The communication unit 170 controls communication with the external device G via the computer network N. In the case of the first embodiment, examples of the external device G include the measuring device 200 according to the second embodiment and the measuring device 300 according to the third embodiment, which will be described later.

The storage unit 180 stores various information and various data used by the control / processing unit 150, and various information and various data obtained by the processing of the control / processing unit 150.

The display unit 190 displays various information, various data, and the like based on the control of the control / processing unit 150.

Next, each component 151 to 159 in the control / processing unit 150 of FIG. 1 will be described.

The ultrasonic waveform data generation unit 151 shown in FIG. 1 measures the amplitude of the ultrasonic wave 112 from the steel tube 400 after being amplified by the amplification unit 130 (and further A / D converted by the A / D conversion unit 140). Generates ultrasonic waveform data shown in series.

FIG. 2 is a schematic diagram for explaining the ultrasonic waveform data generated by the ultrasonic waveform data generation unit 151 shown in FIG. 1 and the B-scope image generated by the B-scope image generation unit 152 shown in FIG. Is. In FIG. 2, the same reference numerals are given to the configurations similar to those shown in FIG.

First, in the region 1011 of FIG. 2A, the front surface 400S of the steel pipe and the back surface 400B of the steel pipe shown in FIG. 1 are drawn horizontally, and the ultrasonic waves 111 and the steel pipe 400 heading from the ultrasonic probe 110 to the steel pipe 400 are used. Three patterns with the ultrasonic wave 112 toward the ultrasonic probe 110 are shown. In the first pattern shown on the left side of the region 1011 in FIG. 2 (a), the ultrasonic wave 111 directed from the ultrasonic probe 110 toward the steel tube 400 is reflected by the surface 400S of the steel tube, and is superposed as the surface reflected ultrasonic wave 112-S. It shows a state toward the sound wave probe 110. Further, in the second pattern shown in the center of the region 1011 in FIG. 2A, the ultrasonic wave 111 directed from the ultrasonic probe 110 toward the steel tube 400 is reflected by the back surface 400B of the steel tube, and the first back surface reflected ultrasonic wave is obtained. It shows a state of going toward the ultrasonic probe 110 as 112-B1. Further, in the third pattern shown on the right side of the region 1011 in FIG. 2A, the ultrasonic wave 111 from the ultrasonic probe 110 toward the steel tube 400 is reflected by the back surface 400B of the steel tube, and then on the surface 400S of the steel tube. After the reflection, it is reflected again by the back surface 400B of the steel tube, and is shown to be directed toward the ultrasonic probe 110 as the second back surface reflected ultrasonic wave 112-B2. Specifically, in the present embodiment, regarding the back surface reflected ultrasonic wave 112-B, if n is a positive integer, the nth back surface reflected ultrasonic wave 112-Bn is placed between the front surface 400S of the steel pipe and the back surface 400B of the steel pipe. It is defined as the backside reflected ultrasonic wave 112-B that reciprocates n times.

Further, in the region 1012 of FIG. 2 (a), the front surface reflected ultrasonic wave 112-S, the first back surface reflected ultrasonic wave 112-B1 and the second back surface reflected ultrasonic wave 112 shown in the region 1011 of FIG. 2 (a) are shown. An example of ultrasonic waveform data showing the amplitude of −B2 in time series is schematically shown. In the region 1012 of FIG. 2 (a), the surface reflected ultrasonic wave 112-S shown in the region 1011 of FIG. 2 (a) is S echo, the first back surface reflected ultrasonic wave 112-B1 is B1 echo, and the second back surface is second. The waveform is shown by using the reflected ultrasonic wave 112-B2 as a B2 echo. Further, in the present embodiment, the amplitude shown on the horizontal axis of the ultrasonic waveform data shown in the region 1012 of FIG. 2A uses, for example, an 8-bit A / D converter 140 with an input range of ± 1.0 V. If the amplitude of the ultrasonic wave input to the A / D conversion unit 140 is −1.0V, it is “0”, and when the amplitude of the ultrasonic wave input to the A / D conversion unit 140 is 0.0V, it is “0”. 127 ”, when the amplitude of the ultrasonic wave input to the A / D conversion unit 140 is + 1.0 V, the value is assumed to be“ 255 ”. Further, in the present embodiment, when the amplitude of the ultrasonic wave exceeding the input range of the A / D conversion unit 140 is input, for example, the amplitude of the ultrasonic wave input to the A / D conversion unit 140 is -1. When it is smaller than 0V, it is forced to "0", and when the amplitude of the ultrasonic wave input to the A / D conversion unit 140 is larger than + 1.0V, it is forced to "255". Further, in the present embodiment, the time shown on the vertical axis of the ultrasonic waveform data shown in the region 1012 of FIG. 2A indicates the elapsed time from the start of the reception process by the receiving unit 122.

The region 1013 of FIG. 2B schematically shows an example of a measurement point 401 for measuring the wall thickness of the steel pipe 400 while relatively moving the steel pipe 400 and the ultrasonic probe 110. Then, in the region 1014 of FIG. 2 (b), the ultrasonic waveform data generated by the ultrasonic waveform data generation unit 151 (related to the so-called A scope) for each measurement point 401 shown in the region 1013 of FIG. 2 (b). An example of ultrasonic waveform data) is schematically shown.

The B-scope image generation unit 152 shown in FIG. 1 converts the amplitude value of the ultrasonic waveform data generated for each measurement point by the ultrasonic waveform data generation unit 151 into a brightness value, and converts the amplitude value of the ultrasonic waveform data into a brightness value in the wall thickness direction of the steel pipe 400. And generate a B-scope image about the direction of movement of the ultrasonic probe 110 relative to the steel tube 400.

Here, an example of a method of generating a B-scope image by the B-scope image generation unit 152 will be described with reference to FIG.
In the region 1015 of FIG. 2 (b), the amplitude value of the ultrasonic waveform data shown in the region 1014 of FIG. 2 (b) generated for each measurement point 401 shown in the region 1013 of FIG. An example of a conversion table for converting to a value is shown. Specifically, the conversion table shown in the region 1015 of FIG. 2 (b) has a “black” brightness value when the amplitude value of the ultrasonic waveform data shown in the region 1012 of FIG. 2 (a) is “0”. When the amplitude value of the ultrasonic waveform data shown in the region 1012 of FIG. 2 (a) is "127", the data is converted to the brightness value of "intermediate color (gray)" and the region of FIG. 2 (a). A table is shown which converts the amplitude value of the ultrasonic waveform data shown in 1012 into a “white” brightness value when the amplitude value is “255”. The B-scope image generation unit 152 in the present embodiment is generated for each measurement point 401 shown in the region 1013 of FIG. 2B by using the conversion table shown in the region 1015 of FIG. 2B. The amplitude value of the ultrasonic waveform data shown in the region 1014 of b) is converted into a brightness value to generate the B-scope image 1016 shown in FIG. 2 (c). In the B-scope image 1016 shown in FIG. 2 (c), one upper and lower line shows one ultrasonic waveform data generated at one measurement point 401 shown in FIG. 2 (b). As shown in FIG. 2A, the direction from top to bottom is the wall thickness direction of the steel pipe 400. Therefore, also in the B scope image 1016 shown in FIG. 2C, the direction from top to bottom is the wall thickness direction of the steel pipe 400, and the direction from left to right is the ultrasonic probe 110. Is the relative movement direction with respect to the steel pipe 400 (that is, the movement direction of the measurement point 401 shown in the region 1013 of FIG. 2B). Further, in FIG. 2C, in the B scope image 1016, a portion corresponding to the S echo of the front surface reflected ultrasonic wave 112-S and a portion corresponding to the B1 echo of the first back surface reflected ultrasonic wave 112-B1. The portion corresponding to the B2 echo of the second back surface reflected ultrasonic wave 112-B2 is illustrated.

3 shows the ultrasonic waveform data generated by the ultrasonic waveform data generation unit 151 shown in FIG. 1 and the B generated by the B scope image generation unit 152 shown in FIG. 1 when noise is generated due to disturbance. It is a figure which shows an example of the scope image. Specifically, FIG. 3 shows, for example, the case where air bubbles are present in the water when the thickness of the steel pipe 400 is measured by filling the space between the steel pipe 400 and the ultrasonic probe 110 with water, or in the case of the steel pipe 400. When scale adheres to the surface, these bubbles and scale become the reflection source of the ultrasonic wave 111 from the ultrasonic probe 110 toward the steel pipe 400, and this is observed as a reflected echo.

Specifically, FIG. 3A shows an example of ultrasonic waveform data 1021 generated by the ultrasonic waveform data generation unit 151 shown in FIG. 1 when noise is generated due to disturbance. In the ultrasonic waveform data 1021, contrary to the ultrasonic waveform data shown in the region 1012 of FIG. 2A, the horizontal axis shows the elapsed time since the reception unit 122 started the reception process, and the vertical axis shows the elapsed time. The data shows the amplitude. At this time, the ultrasonic waveform data 1021 has a portion corresponding to noise due to disturbance before the portion corresponding to the S echo of the surface reflected ultrasonic wave 112-S, but the surface reflected ultrasonic wave 112 Depending on the setting of the detection gate for detecting the S echo of −S, there is a concern that the surface reflected ultrasonic wave 112-S may be erroneously determined to be detected in the portion corresponding to the noise. In this case, the steel pipe 400 There is a problem that the wall thickness cannot be measured with high accuracy.

FIG. 3B shows an example of the B-scope image 1022 generated by the B-scope image generation unit 152 shown in FIG. 1 when noise is generated due to disturbance. The B-scope image 1022 shows a portion 10221 corresponding to noise due to disturbance and a line 10222 corresponding to the ultrasonic waveform data 1021 shown in FIG. 3 (a). Then, on the B scope image 1022, the portion 10221 corresponding to the noise due to the disturbance corresponds to the portion 10223 corresponding to the S echo of the front surface reflected ultrasonic wave 112-S and the portion corresponding to the B echo of the back surface reflected ultrasonic wave 112-B. Unlike the band-shaped multiplex signal of 10224, it is observed as a massive pattern. Therefore, in the present embodiment, the portion 10221 corresponding to the noise due to the disturbance can be removed by using the difference in the image features of the portion 10221 corresponding to the noise due to the disturbance, and the wall thickness of the steel pipe 400 can be measured with high accuracy. The form is shown.

The binary image generation unit 153 shown in FIG. 1 generates a binary image by binarizing the B-scope image generated by the B-scope image generation unit 152 using a predetermined binarization threshold value.

FIG. 4 shows a B-scope image generated by the B-scope image generation unit 152 shown in FIG. 1 and a binary image generated by the binary image generation unit 153 shown in FIG. 1 when noise is generated due to disturbance. It is a figure which shows an example of the binary image obtained as a result of processing by the binary image processing unit 154 shown in 1, and the linearized image generated by the linearized image generation unit 155 shown in FIG.

Specifically, FIG. 4A shows an example of the B-scope image 1031 generated by the B-scope image generation unit 152 shown in FIG. 1 when noise is generated due to disturbance. The B-scope image 1031 shows a portion 10311 corresponding to noise due to disturbance. Then, in this case, the binary image generation unit 153 shown in FIG. 1 performs binarization processing of the B scope image 1031 shown in FIG. 4A using a predetermined binarization threshold value, and is shown in FIG. 4B. The indicated binary image 1032 is generated. At this time, the binary image generation unit 153 shown in FIG. 1 can generate the binary image 1032 by using, for example, FIG. 6 and using the binarization threshold value described later, and can also generate another binarization threshold value. It is also possible to generate a binary image 1032 by using it. Further, in the binary image 1032 shown in FIG. 4B, the black portion corresponds to the value of "0", and the portion of the color other than black corresponds to the value of "1".

The binary image processing unit 154 shown in FIG. 1 first performs expansion / contraction processing, which is general particle removal and particle bonding processing, on the binary image generated by the binary image generation unit 153. After that, the binary image processing unit 154 shown in FIG. 1 performs so-called particle analysis, and among the image particles in which the area of one of the binary values in the binary image after the expansion / contraction processing is a mass. , Performs a process of removing image particles that satisfy at least one of less than a predetermined area and less than a predetermined width.

Specifically, the binary image processing unit 154 shown in FIG. 1 performs expansion / contraction processing on the binary image 1032 shown in FIG. 4B, and then one of the binary values in the binary image. Of the image particles in which the region of the value (in the example shown in FIG. 4B, the value of "1" relating to the portion of the color other than black) is a mass, the area is smaller than the predetermined area and the width is smaller than the predetermined width. Image particles satisfying at least one of the above are removed, and the processed binary image 1033 shown in FIG. 4 (c) is acquired. Here, the width of the image particles represents the length in the lateral direction of the binary image 1032 shown in FIG. 4 (b) (that is, the moving direction of the measurement point 401 shown in the region 1013 of FIG. 2 (b)). .. Therefore, for example, if a predetermined width, which is a threshold value for removing image particles, is set to 1/2 the total length in the lateral direction of the binary image 1032 shown in FIG. 4 (b), FIG. 4 ( In the binary image 1033 after the processing shown in c), the image particles of the portion 10311 corresponding to the noise shown in FIG. 4A are removed. The above-mentioned predetermined width set as the threshold value for removing image particles is an example, and is not limited to this in the present embodiment. Further, in the present embodiment, information relating to a predetermined feature amount and parameter conditions for removing image particles (that is, information relating to a predetermined area and a predetermined width here) is stored in advance in the storage unit 180. It is assumed that it is.

In the image processing by the binary image processing unit 154, as shown in FIG. 3B, the band-shaped portion 10223 corresponding to the S echo of the front surface reflection ultrasonic wave 112-S and the back surface reflection ultrasonic wave 112-B B. Focusing on the fact that the area and width of the part 10221 corresponding to the noise due to the disturbance is smaller than that of the band-shaped part 10224 corresponding to the echo, the process for removing the part 10221 corresponding to the noise due to the disturbance is performed. be. As a result, in the example shown in FIG. 4, as described above, in the binary image 1033 processed by the binary image processing unit 154, the image particles of the portion 10311 corresponding to the noise shown in FIG. 4A are removed. Has been done.

The linearized image generation unit 155 shown in FIG. 1 detects the position of the upper end of the image particles in the binary image obtained as a result of the processing by the binary image processing unit 154, and the position of the upper end is a straight line at a predetermined position. A linearized image is generated by shifting the data of the B-scope image generated by the B-scope image generation unit 152 up and down so as to be.

Specifically, the linearized image generation unit 155 shown in FIG. 1 first obtains image particles for the binary image 1033 shown in FIG. 4 (c) (in the example shown in FIG. 4 (c), a portion having a color other than black). 10331 is detected at the upper end position (upper end line) 10331. The upper end position (upper end line) 10331 is a portion corresponding to the S echo of the surface reflected ultrasonic wave 112-S. Next, in the linearized image generation unit 155 shown in FIG. 1, the upper end position (upper end line) 10331 shown in FIG. 4 (c) is a straight line at a predetermined position (specifically, the upper position in the present embodiment). A linearized image 1034 is generated in which the data of the B scope image 1031 shown in FIG. 4A is shifted up and down so as to be. In this linearized image 1034, a straight line 10341 is shown in which the upper end position (upper end line) 10331 shown in FIG. 4C is linearized. Further, in this linearized image 1034, the area where there is no data located below is filled with a predetermined numerical value (for example, 127).

The gate setting unit 156 shown in FIG. 1 has a first detection gate indicating a range for detecting the surface reflected ultrasonic wave 112-S with respect to the linearized image generated by the linearized image generation unit 155, and a back surface. A second detection gate indicating a range for detecting the reflected ultrasonic wave 112-B is set.

5A and 5B show a first detection gate and a second detection gate set by the gate setting unit 156 shown in FIG. 1, a position detection process performed by the position detection unit 157 shown in FIG. 1, and a wall thickness calculation shown in FIG. It is a figure which shows an example of the wall thickness calculation process performed by the part 158, and the wall thickness chart displayed by the display control part 159 shown in FIG.

Specifically, as shown in FIG. 5A, the gate setting unit 156 shown in FIG. 1 detects the surface reflected ultrasonic wave 112-S for the linearized image generated by the linearized image generation unit 155. A first detection gate 1041 indicating a range for detecting the back surface reflected ultrasonic wave 112-B and a second detection gate 1042 indicating a range for detecting the back surface reflected ultrasonic wave 112-B are set. Here, the gate setting unit 156 shall set as the second detection gate 1042 a detection gate indicating a range for detecting the second back surface reflected ultrasonic wave 112-B2. The setting of the first detection gate 1041 and the second detection gate 1042 here corresponds to setting the detection gate in the ultrasonic waveform data related to the A scope generated for each measurement point 401. Further, in the linearized image, since the portion corresponding to the S echo of the surface reflected ultrasonic wave 112-S is linearized, the setting of the first detection gate 1041 and the second detection gate 1042 is set at each measurement point 401. It is not necessary to follow each setting, and a rectangular area can be set.

After that, for example, the binary image generation unit 153 shown in FIG. 1 performs binarization processing on the linearized image shown in FIG. 5A using a predetermined binarization threshold value, and is shown in FIG. 5B. Generate a binary image. Here, the binarization threshold value used when the binarization process is performed by the binary image generation unit 153 will be described.

FIG. 6 is a diagram for explaining the binarization threshold value used when the binarization process is performed by the binary image generation unit 153 shown in FIG. 1.
FIG. 6 shows ultrasonic waveform data related to the A scope generated at a certain measurement point 401 for the sake of clarity. Further, FIG. 6 also illustrates the range of the first detection gate 1041 and the second detection gate 1042 set by the gate setting unit 156. In the example shown in FIG. 6, for the range of the first detection gate 1041, the value of the lower limit threshold value 1045 or more and the lower limit threshold value 1046 or less is set to “1”, and the other values are set to “0”. Further, regarding the range of the second detection gate 1042, a value having a lower limit threshold value of 1047 or more and a lower limit threshold value of 1048 or less is set to "1", and the other values are set to "0". The first detection gate 1041 for detecting the front surface reflected ultrasonic wave 112-S and the back surface reflected ultrasonic wave 112-B (here, the second back surface reflected ultrasonic wave 112-B2) are detected. In the detection gate 1042, the lower limit threshold 1045 and the lower limit threshold 1046 and the lower limit threshold 1047 and the lower limit threshold 1048 are inverted because the front surface reflected ultrasonic wave 112-S and the back surface reflected ultrasonic wave 112-B have different phases. This is due to inversion.

After that, for example, the binary image processing unit 154 shown in FIG. 1 performs the expansion / contraction processing which is the above-mentioned general particle removal and particle bonding processing to acquire the binary image shown in FIG. 5 (b). do.

The position detection unit 157 shown in FIG. 1 corresponds to the time when the surface reflection ultrasonic wave 112-S is received by the reception unit 122 from within the range of the first detection gate set by the gate setting unit 156 for each measurement point. The back surface reflected ultrasonic wave 112-B (here, the second back surface reflected ultrasonic wave 112-B2) is received from the range of the first position and the second detection gate set by the gate setting unit 156. The second position corresponding to the time received in is detected.

Specifically, the position detection unit 157 shown in FIG. 1 uses the same method as the position detection of the upper end of the image particles by the linearized image generation unit 155 described above for the binary image shown in FIG. 5 (b). , The first position corresponding to the time when the surface reflected ultrasonic wave 112-S is received by the receiving unit 122 from within the range of the first detection gate 1041 set by the gate setting unit 156, and set by the gate setting unit 156. The second position corresponding to the time when the back surface reflected ultrasonic wave 112-B (here, the second back surface reflected ultrasonic wave 112-B2) is received by the receiving unit 122 is detected from within the range of the second detection gate 1042. do. Then, the position detection unit 157 shown in FIG. 1 detects the first position 1043 and the second position 1044 from the linearized image shown in FIG. 5C based on the detection result.

The wall thickness calculation unit 158 shown in FIG. 1 determines the first position and the second position detected by the position detection unit 157 and the velocity of the ultrasonic wave propagating inside the steel pipe 400 for each measurement point 401. Based on this, the wall thickness of the steel pipe 400 is calculated.

Specifically, in the linearized image shown in FIG. 5 (c), the wall thickness calculation unit 158 has a first position 1043 and a second position for each measurement point 401 (that is, for each of the upper and lower lines). The pixel interval with 1044 (a quantity corresponding to time, for example, the time per pixel is determined by the sampling pitch of the A / D conversion unit 140) is converted into time, and this time and the inside of the steel pipe 400 are propagated. The wall thickness of the steel pipe 400 is calculated from the velocity of the ultrasonic waves. FIG. 5D shows an example of a wall thickness chart related to the wall thickness of the steel pipe 400 calculated for each measurement point 401 by the wall thickness calculation unit 158.

Here, when the second detection gate 1042 is set to detect, for example, the nth (n is a positive integer) backside reflected ultrasonic wave 112-Bn, the time based on the first position 1043 is set as TS. , When the time based on the second position 1044 is TBn (“TBn-TS” corresponds to the “time” obtained based on the pixel spacing between the first position 1043 and the second position 1044 described above), the wall thickness is calculated. Part 158 calculates the wall thickness of the steel pipe 400 using the following formula (1).
Wall thickness = (TBn-TS) × (velocity of ultrasonic waves propagating inside the steel pipe 400) ÷ (2 × n)
... (1)

The display control unit 159 shown in FIG. 1 controls to display, for example, a linearized image in which colors (for example, red) are added to the first position 1043 and the second position 1044 shown in FIG. 5 (c) on the display unit 190. I do. By making this display, it is clearly observed whether or not the change in the wall thickness of the steel pipe 400, the S echo of the front surface reflected ultrasonic wave 112-S, and the B echo of the back surface reflected ultrasonic wave 112-1 are detected at the correct positions. be able to.
Further, the display control unit 159 shown in FIG. 1 controls, for example, to display the wall thickness chart shown in FIG. 5C on the display unit 190.

Next, a processing procedure of a method for measuring the wall thickness of the steel pipe 400, which is the material to be inspected, will be described.
FIG. 7 is a flowchart showing an example of a processing procedure of a method for measuring the wall thickness of a steel pipe 400 by the measuring device 100 according to the first embodiment of the present invention.

First, in step S1101 of FIG. 7, the control / processing unit 150 (for example, the ultrasonic waveform data generation unit 151) measures the wall thickness of the steel pipe 400 based on the input information input from the information input unit 160, for example. Set the number T of points.

Subsequently, in step S1102 of FIG. 7, the control / processing unit 150 (for example, the ultrasonic waveform data generation unit 151) sets 1 to the variable t indicating the measurement point.

Subsequently, in step S1103 of FIG. 7, the transmission unit 121 reaches the surface 400S of the measurement point t of the steel pipe 400 to be inspected via the ultrasonic probe 110 based on the control of the control / processing unit 150. The ultrasonic wave 111 is transmitted toward.

Subsequently, in step S1104 of FIG. 7, the receiving unit 122 receives the ultrasonic wave 112 from the steel pipe 400 via the ultrasonic probe 110 under the control of the control / processing unit 150.

Subsequently, in step S1105 of FIG. 7, the ultrasonic waveform data generation unit 151 is superposed from the steel pipe 400 after being amplified by the amplification unit 130 (and further A / D converted by the A / D conversion unit 140). Ultrasonic waveform data showing the amplitude of the sound wave 112 in time series is generated. Here, for example, the ultrasonic waveform data shown in the region 1012 of FIG. 2A is generated.

Subsequently, in step S1106 of FIG. 7, the control / processing unit 150 (for example, the ultrasonic waveform data generation unit 151) determines whether or not the variable t indicating the measurement point is smaller than the number T of the measurement points.

As a result of the determination in step S1106 of FIG. 7, when the variable t indicating the measurement point is smaller than the number T of the measurement points (S1106 / YES), it is determined that there is a measurement point that has not been measured yet, and FIG. Step S1107 of.
Proceeding to step S1107 of FIG. 7, the control / processing unit 150 (for example, the ultrasonic waveform data generation unit 151) adds 1 to the variable t indicating the measurement point. After that, the process returns to step S1103 of FIG. 7, and the changed measurement point t is processed after step S1103.

On the other hand, as a result of the determination in step S1106 of FIG. 7, if the variable t indicating the measurement point is not smaller than the number T of the measurement points (S1106 / NO), it is determined that the measurement has been performed for all the measurement points, and FIG. Step S1108 of step 7 proceeds.
Proceeding to step S1108 of FIG. 7, the B-scope image generation unit 152 converts the amplitude value of the ultrasonic waveform data generated for each measurement point in step S1105 into a brightness value, and converts the amplitude value of the ultrasonic waveform data into a brightness value in the wall thickness direction of the steel pipe 400. And generate a B-scope image about the direction of movement of the ultrasonic probe 110 relative to the steel tube 400. Here, for example, the process shown in FIG. 2 (b) is performed to generate the B-scope image 1016 shown in FIG. 2 (c). In the following description, it is assumed that the B scope image 1031 shown in FIG. 4A is generated by the process of this step.

Subsequently, in step S1109 of FIG. 7, the binary image generation unit 153 binarizes the B-scope image generated in step S1108 using a predetermined binarization threshold value to generate a binary image. .. Here, for example, the binary image 1032 shown in FIG. 4B is generated.

Subsequently, in step S1110 of FIG. 7, the binary image processing unit 154 first performs expansion / contraction processing, which is general particle removal and particle bonding processing, on the binary image generated in step S1109. conduct. After that, the binary image processing unit 154 performs so-called particle analysis to determine a predetermined area of the image particles in which the region of one of the binary values in the binary image after the expansion / contraction processing is a mass. A process for removing image particles satisfying at least one of less than or less than a predetermined width is performed. Here, for example, the processed binary image 1033 shown in FIG. 4C is acquired.

Subsequently, in step S1111 of FIG. 7, the linearized image generation unit 155 detects the position of the upper end of the image particles in the binary image obtained as a result of the process of step S1110. Here, for example, the position of the upper end (line of the upper end) 10331 shown in FIG. 4 (c) is detected.

Subsequently, in step S1112 of FIG. 7, the linearized image generation unit 155 so that the position of the upper end detected in step S1111 becomes a straight line at a predetermined position (specifically, the upper position in the present embodiment). A linearized image is generated by shifting the data of the B scope image generated in step S1108 up and down. Here, for example, the linearized image 1034 shown in FIG. 4D is generated.

Subsequently, in step S1113 of FIG. 7, the gate setting unit 156 serves as a first detection gate indicating a range for detecting the surface reflected ultrasonic wave 112-S with respect to the linearized image generated in step S1112. , A second detection gate indicating a range for detecting the back surface reflected ultrasonic wave 112-B (here, the second back surface reflected ultrasonic wave 112-B2) is set. For example, the first detection gate 1041 and the second detection gate 1042 shown in FIG. 5A are set.
After that, for example, the binary image generation unit 153 generates a binary image by binarizing the linearized image shown in FIG. 5A using a predetermined binarization threshold value, and the binary image processing unit. The 154 performs the expansion / contraction processing, which is the general particle removal and particle bonding processing described above, on the binary image to acquire the binary image shown in FIG. 5 (b).

Subsequently, in step S1114 of FIG. 7, the position detection unit 157 receives the surface reflected ultrasonic wave 112-S from the range of the first detection gate set in step S1113 at the reception unit 122 for each measurement point. The backside reflected ultrasonic wave 112-B (here, the second backside reflected ultrasonic wave 112-B2) is received from the first position corresponding to the time and within the range of the second detection gate set in step S1113. The second position corresponding to the time received by the unit 122 is detected.

Specifically, the position detection unit 157 is the first set in step S1113 for the binary image shown in FIG. 5 (b) by using the same method as the position detection of the upper end of the image particles in step S1111. The first position from the range of the detection gate 1041 and the second position from the range of the second detection gate 1042 set in step S1113 are detected. Then, the position detection unit 157 detects the first position 1043 and the second position 1044 from the linearized image shown in FIG. 5C based on the detection result.
After that, the display control unit 159 controls the display unit 190 to display, for example, a linearized image in which colors (for example, red) are added to the first position 1043 and the second position 1044 shown in FIG. 5 (c). ..

Subsequently, in step S1115 of FIG. 7, the wall thickness calculation unit 158 determines the first position and the second position detected in step S1114 and the ultrasonic wave propagating inside the steel pipe 400 at each measurement point. The wall thickness of the steel pipe 400 is calculated based on the speed.

Subsequently, in step S1116 of FIG. 7, the display control unit 159 controls to display the wall thickness of the steel pipe 400 calculated in step S1115 on the display unit 190. Here, for example, the wall thickness chart shown in FIG. 5D is displayed. After that, the control / processing unit 150 performs a process of storing the wall thickness data of the steel pipe 400 calculated in step S1115 in the storage unit 180, if necessary.

Subsequently, in step S1117 of FIG. 7, the control / processing unit 150 determines whether or not to finish the wall thickness measurement of the steel pipe 400 to be inspected, for example, based on the input information input from the information input unit 160. to decide.

If the wall thickness measurement of the steel pipe 400 is not completed as a result of the determination in step S1117 of FIG. 7 (S1117 / NO), the process returns to step S1101 of FIG. 7 and the processes after step S1101 are performed again.

On the other hand, as a result of the determination in step S1117 of FIG. 7, when the wall thickness measurement of the steel pipe 400 is finished (S1117 / YES), the processing of the flowchart of FIG. 7 is finished.

In the above-mentioned example, the gate setting unit 156 sets a detection gate indicating a range for detecting the second back surface reflected ultrasonic wave 112-B2 as the second detection gate 1042. The embodiments are not limited to this. In this embodiment, the following embodiments are also applicable.
First, in the gate setting unit 156, as the second detection gate 1042, at least two back surface reflected ultrasonic waves 112-B (for example, the first back surface reflected ultrasonic waves 112-B1 and the first back surface reflected ultrasonic waves 112-B1) having different reflection times on the back surface 400B of the steel pipe It is possible to set a range for detecting each of the second back surface reflected ultrasonic waves 112-B2). Then, the wall thickness calculation unit 158 determines the back surface reflected ultrasonic wave (for example, the second back surface reflected ultrasonic wave) of one of the two back surface reflected ultrasonic waves 112-B described above as the second detection gate 1042 in the gate setting unit 156. When a detection gate indicating a range for detecting sound waves 112-B2) is set and the wall thickness value of the steel pipe 400 calculated based on the second detection gate 1042 exceeds the reference wall thickness value, the gate The range for detecting the back surface reflected ultrasonic wave (for example, the first back surface reflected ultrasonic wave 112-B1) of the other of the above-mentioned two back surface reflected ultrasonic waves as the second detection gate 1042 in the setting unit 156 is shown. This is a form in which the final wall thickness of the steel pipe 400 is calculated in consideration of the wall thickness value of the steel pipe 400 calculated based on the second detection gate 1042 when the detection gate is set. Here, the reference wall thickness value corresponds to, for example, a threshold value that can be arbitrarily set by the user. This form will be described below with reference to FIGS. 8 and 9.

FIG. 8 is a diagram showing an example of a first wall thickness measurement result in a steel pipe 400 in the measuring device 100 according to the first embodiment of the present invention. Specifically, the first wall thickness measurement result shown in FIG. 8 is a wall thickness measurement result using a steel pipe without defects (scratches) as the steel pipe 400.

FIG. 8A shows the first wall thickness measurement result when the detection gate indicating the range for detecting the first back surface reflected ultrasonic wave 112-B1 is set as the second detection gate 1042. There is. Specifically, in the region 1052 of FIG. 8A, the linearized image generated by the linearized image generation unit 155 and the first surface reflected ultrasonic wave 112-S detected by the position detection unit 157 are included in the region 1052. The second position 10522 according to the position 10521 and the first back surface reflected ultrasonic wave 112-B1 is shown. Further, in the area 1051 of FIG. 8A, a wall thickness chart calculated by the wall thickness calculation unit 158 based on the first position 10521 and the second position 10522 shown in the area 1052 of FIG. 8A is displayed. Shows.

Further, FIG. 8B shows the first wall thickness measurement result when a detection gate indicating a range for detecting the second back surface reflected ultrasonic wave 112-B2 is set as the second detection gate 1042. Shows. Specifically, in the region 1054 of FIG. 8B, the linearized image generated by the linearized image generation unit 155 and the first surface reflection ultrasonic wave 112-S detected by the position detection unit 157 are included. The second position 10542 relating to the position 10541 and the second backside reflected ultrasound 112-B2 is shown. Further, in the area 1053 of FIG. 8 (b), a wall thickness chart calculated by the wall thickness calculation unit 158 based on the first position 10541 and the second position 10542 shown in the area 1054 of FIG. 8 (b) is displayed. Shows.

In FIG. 8A, local thinning is observed at the position of the arrow 10511 in the region 1051 and the position of the star mark 10523 in the region 1052 corresponding to the position of the arrow 10511. On the other hand, in FIG. 8B, the position of the arrow 10531 of the region 1053, which is the same position as the position of the arrow 10511 of the region 1051, and the position of the star mark 10543 of the region 1054 corresponding to the position of the arrow 10531 are both. No local thinning has been observed. This means that noise was observed at the position of the arrow 10511 in the region 1051 and the position of the star 10523 in the region 1052 corresponding to the position of the arrow 10511. That is, on the same ultrasonic waveform data, the noise has a large effect on one of the first back surface reflected ultrasonic wave 112-B1 and the second back surface reflected ultrasonic wave 112-B2, and the other has an effect. It means that it is difficult to receive.

FIG. 9 is a diagram showing an example of a second wall thickness measurement result of the steel pipe 400 in the measuring device 100 according to the first embodiment of the present invention. Specifically, the second wall thickness measurement result shown in FIG. 9 is a wall thickness measurement result using a steel pipe in which four artificial defects (scratches) are formed as the steel pipe 400.

FIG. 9A shows a second wall thickness measurement result when a detection gate indicating a range for detecting the first back surface reflected ultrasonic wave 112-B1 is set as the second detection gate 1042. There is. Specifically, in the region 1062 of FIG. 9A, the linearized image generated by the linearized image generation unit 155 and the first surface reflection ultrasonic wave 112-S detected by the position detection unit 157 are included. The second position 10622 according to the position 10621 and the first back surface reflected ultrasonic wave 112-B1 is shown. Further, in the area 1061 of FIG. 9A, a wall thickness chart calculated by the wall thickness calculation unit 158 based on the first position 10621 and the second position 10622 shown in the area 1062 of FIG. 9A is displayed. Shows.

Further, FIG. 9B shows a second wall thickness measurement result when a detection gate indicating a range for detecting the second back surface reflected ultrasonic wave 112-B2 is set as the second detection gate 1042. Shows. Specifically, in the region 1064 of FIG. 9B, the linearized image generated by the linearized image generation unit 155 and the first surface reflection ultrasonic wave 112-S detected by the position detection unit 157 are included. The second position 10642 pertaining to the position 10641 and the second backside reflected ultrasound 112-B2 is shown. Further, in the area 1063 of FIG. 9B, a wall thickness chart calculated by the wall thickness calculation unit 158 based on the first position 10641 and the second position 10642 shown in the area 1064 of FIG. 9B is displayed. Shows.

In both the wall thickness chart shown in region 1061 of FIG. 9 (a) and the wall thickness chart shown in region 1063 of FIG. 9 (b), thin wall thickness is observed at four local positions based on four artificial defects. There is. Further, the position of the arrow 10611 in the region 1061 shown in FIG. 9A, the position of the star mark 10623 in the region 1062 corresponding to the position of the arrow 10611, and the position of the arrow 10611 in the region 1061 are the same as those in FIG. Local thinning is observed at both the position of the arrow 10631 in the region 1063 shown in b) and the position of the star mark 10643 in the region 1064 corresponding to the position of the arrow 10631. Specifically, at the same position, the position of the star mark 10623 shown in the region 1062 of FIG. 9 (a) and the position of the star mark 10643 shown in the region 1064 of FIG. 9 (b) are convex indicating a local thin wall. A pattern is observed. As described above, when the steel pipe 400 has a defect (scratch), there is a similar change in any of the backside reflected ultrasonic waves 112-B among the plurality of backside reflected ultrasonic waves 112-B, and almost the same wall thickness measurement result is obtained. ..

From the above, as the second detection gate 1042, it is possible to set a detection gate for detecting each of at least two back surface reflected ultrasonic waves 112-B, and a detection gate for detecting one back surface reflected ultrasonic wave. When the first wall thickness value of the steel pipe 400 calculated based on the above exceeds the standard wall thickness value, the second wall thickness value of the steel pipe 400 calculated based on the detection gate for detecting the other back surface reflected ultrasonic wave is used. Re-evaluate in consideration and calculate the final wall thickness of the steel pipe 400 (for example, if the difference between the first wall thickness value and the second wall thickness value is less than a predetermined value, which wall thickness value is used. May be adopted, and when the difference between the first wall thickness value and the second wall thickness value is a predetermined value or more, the second wall thickness value is adopted). This makes it possible to measure the wall thickness with higher accuracy.

As described above, in the measuring device 100 according to the first embodiment, ultrasonic waveform data showing the amplitude of the ultrasonic wave 112 from the steel tube 400 in time series is generated for each measurement point of the steel tube 400. The amplitude value of the ultrasonic waveform data generated for each measurement point is converted into the brightness value, and the thickness direction of the steel tube 400 and the movement direction of the ultrasonic probe 110 with respect to the steel tube 400 are used as axes. A B-scope image is generated, the B-scope image is binarized to generate a binary image, and among the image particles in which the region of one of the two values in the binary image is a mass. A process of removing image particles satisfying at least one of less than a predetermined area and a predetermined width is performed, and the wall thickness of the steel pipe 400 is obtained at each measurement point based on the binary image obtained as a result of the process. Is calculated.
According to this configuration, when measuring the wall thickness of a plurality of locations of the steel pipe 400 while relatively moving the ultrasonic probe 110 and the steel pipe 400, for example, the steel pipe 400 and the ultrasonic probe 110 are used. Even when noise is generated due to disturbance such as when air bubbles are present in the intervening water or when scale adheres to the surface of the steel pipe 400, processing is performed to remove the noise at multiple locations of the steel pipe 400. The wall thickness can be measured with high accuracy.

In the first embodiment described above, the amplitude value of the ultrasonic waveform data generated for each measurement point by the ultrasonic waveform data generation unit 151 is converted into a brightness value, and the thickness direction of the steel pipe 400 and the thickness direction of the steel pipe 400 are obtained. The embodiment in which the B-scope image generation unit 152 for generating the B-scope image about the relative movement direction of the ultrasonic probe 110 with respect to the steel pipe 400 is provided has been described. However, the present invention is not limited to the form of generating this B-scope image, and is centered on the wall thickness direction of the steel tube 400 and the relative movement direction of the ultrasonic probe 110 with respect to the steel tube 400. The present invention also includes a form for generating two-dimensional array brightness data, which is dimensionally arranged brightness data. In this case, the B-scope image generation unit 152 constitutes a "two-dimensional array brightness data generation means" that generates a B-scope image as two-dimensional array brightness data.
Further, in the first embodiment described above, the B-scope image generated by the B-scope image generation unit 152 is binarized using a predetermined binarization threshold value to generate a binary image. The mode in which the generation unit 153 is provided has been described. However, the present invention is not limited to the form of generating this binary image, and the above-mentioned two-dimensional array luminance data is binarized using a predetermined binarization threshold to perform a two-dimensional array. A form for generating binary data is also included in the present invention. In this case, the binary image generation unit 153 constitutes a "two-dimensional array binary data generation means" that generates a binary image as the two-dimensional array binary data.
Further, in the first embodiment described above, at least of the image particles in which the region of one of the binary values in the above-mentioned binary image is a mass, which is smaller than a predetermined area and less than a predetermined width. A mode of providing a binary image processing unit 154 that performs a process of removing image particles satisfying either one has been described. However, the present invention is not limited to the form of processing this binary image, and the area of one of the two values in the above-mentioned two-dimensional array binary data is a single block region. Among them, the present invention also includes a mode in which a single block region satisfying at least one of a predetermined area and a predetermined width is removed. In this case, the binary image processing unit 154 constitutes a "two-dimensional array binary data processing means" that performs a process of removing image particles of the binary image as a block area of the two-dimensional array binary data. Then, in this case, the wall thickness calculation unit 158 determines the wall thickness of the steel pipe 400 for each measurement point based on the two-dimensional array binary data obtained as a result of the processing by the two-dimensional array binary data processing means. Take the form of calculation.

(Second embodiment)
Next, a second embodiment of the present invention will be described.

<Aspect 1 of the second embodiment>
First, the first aspect of the second embodiment of the present invention will be described.

FIG. 10 is a diagram showing an example of a schematic configuration of the measuring device 200-1 according to the first embodiment of the second embodiment of the present invention. In FIG. 10, the same reference numerals are given to the configurations similar to the schematic configuration of the measuring device 100 according to the first embodiment shown in FIG. 1, and detailed description thereof will be omitted as necessary. The measuring device 200-1 is a device for measuring the wall thickness of the steel pipe 400 to be inspected, similarly to the measuring device 100 according to the first embodiment shown in FIG.

Further, in the first aspect of the present embodiment, when measuring the wall thickness of the steel pipe 400, the wall thickness of the reference material (hereinafter, simply referred to as “reference material”) 410, which is the reference material of the steel pipe 400, is measured in advance. The thickness of the reference material 410 is also the length between the surface 410S of the reference material, which is the outer surface of the reference material 410, and the back surface 410B of the reference material, which is the inner surface of the reference material 410. It is determined by. In addition, it is assumed that the value of the wall thickness of the reference material is accurately known by other measurements or the like separately performed in advance.

As shown in FIG. 10, the measuring device 200-1 includes an ultrasonic probe 110, a transmission / reception unit 120, an amplification unit 130, an A / D conversion unit 140, a control / processing unit 250-1, an information input unit 160, and a communication unit. It includes a unit 170, a storage unit 180, and a display unit 190.

Similar to the first embodiment, the ultrasonic probe 110 controls the transmission and reception of ultrasonic waves at a plurality of locations of the steel pipe 400 by moving relative to the steel pipe 400.

As an example of relatively moving the ultrasonic probe 110 and the steel pipe 400, in FIG. 10, the ultrasonic probe 110 rotates in the circumferential direction of the steel pipe 400 based on the control of the control / processing unit 250-1. Although the moving form is exemplified, the present invention is not limited to this form. For example, a form in which the steel tube 400 side moves while the ultrasonic probe 110 is stationary is also applicable to the present invention, and a plurality of ultrasonic probes 110 are provided and the ultrasonic probes 110 are provided. A form in which the wall thickness measurement position on the steel pipe 400 is moved by electrically changing the ultrasonic wave transmission direction by appropriately controlling the ultrasonic wave transmission timing is also applicable to the present invention. Further, FIG. 10 shows an example in which the ultrasonic probe 110 moves in the circumferential direction of the steel pipe 400. For example, the ultrasonic probe 110 rotates in the pipe axial direction of the steel pipe 400 (z direction in FIG. 10). It can also be applied to moving forms. Further, in FIG. 10, for the sake of simplicity, an example in which one ultrasonic probe 110 is provided in the circumferential direction of the steel pipe 400 is shown, but as described above, for example, in order to improve the measurement efficiency. It is also applicable to a form in which a plurality of ultrasonic probes 110 are provided in the circumferential direction of the steel pipe 400.

Further, in the first aspect of the present embodiment, as described above, an example of measuring the wall thickness of the reference material 410 in advance when measuring the wall thickness of the steel pipe 400 will be described. When measuring the wall thickness, in order to reduce disturbances such as noise, the ultrasonic probe 110 and the reference material 410 are both stationary, and the ultrasonic probe 110 refers to the reference material 410. It is possible to take the form of sending and receiving ultrasonic waves.

The transmission / reception unit 120 transmits / receives ultrasonic waves to / from the steel pipe 400 via the ultrasonic probe 110 under the control of the control / processing unit 250-1. The transmission / reception unit 120 includes a transmission unit 121 and a reception unit 122.

The transmission unit 121 transmits ultrasonic waves 111 toward the surface 400S of the steel pipe via the ultrasonic probe 110 that moves relative to the steel pipe 400 under the control of the control / processing unit 250-1. Perform the processing. Further, the receiving unit 122 performs a process of receiving the ultrasonic wave 112 from the steel pipe 400 via the ultrasonic probe 110 based on the control of the control / processing unit 250-1.

Further, in the first aspect of the present embodiment, as described above, an example of measuring the wall thickness of the reference material 410 in advance when measuring the wall thickness of the steel pipe 400 will be described. When measuring the wall thickness, the transmitting unit 121 transmits the ultrasonic wave 111 toward the surface 410S of the reference material via the ultrasonic probe 110, and the receiving unit 122 transmits the ultrasonic probe 110. The ultrasonic wave 112 from the reference material 410 is received via the reference material 410.

The amplification unit 130 performs a process of amplifying the ultrasonic wave 112 from the steel pipe 400 received by the reception unit 122 based on the control of the control / processing unit 250-1. In particular, the amplification unit 130 expands and contracts (multiplies) the magnitude of the ultrasonic waveform data in the amplitude direction for the entire ultrasonic waveform data based on the amplification degree calculated by the amplification degree calculation unit 2532, which will be described later. Alternatively, it is possible to perform a process of (a fraction). Further, in the first aspect of the present embodiment, as described above, an example of measuring the wall thickness of the reference material 410 when measuring the wall thickness of the steel pipe 400 will be described, but the wall thickness of the reference material 410 is measured. In this case, the amplification unit 130 takes a form of amplifying the ultrasonic wave 112 from the reference material 410 received by the reception unit 122.

The A / D conversion unit 140 performs a process of converting the ultrasonic wave 112 from the steel pipe 400 after being amplified by the amplification unit 130 from an analog signal to a digital signal based on the control of the control / processing unit 250-1. Further, in the first aspect of the present embodiment, as described above, an example of measuring the wall thickness of the reference material 410 when measuring the wall thickness of the steel pipe 400 will be described, but the wall thickness of the reference material 410 is measured. In this case, the A / D conversion unit 140 takes a form of converting the ultrasonic signal 112 from the reference material 410 after being amplified by the amplification unit 130 from an analog signal to a digital signal.

In the first aspect of the present embodiment, the signal that has passed through the amplification unit 130 passes through the A / D conversion unit 140, but the order is reversed and the signal passes through the A / D conversion unit 140. It is also possible to set the order in which the generated signals are amplified by the amplification unit 130. By doing so, the digital signal is amplified, so that the handling of the signal can be facilitated.

The control / processing unit 250-1 controls each component of the measuring device 200-1 based on, for example, the input information input from the information input unit 160 and the input information input from the communication unit 170, and the measuring device 200 Controls the operation of -1 in an integrated manner. Further, the control / processing unit 250-1 performs various processes based on, for example, the input information input from the information input unit 160 and the input information input from the communication unit 170. As shown in FIG. 10, the control / processing unit 250-1 includes an ultrasonic waveform data generation unit 251, a gate setting unit 252, a histogram creation unit 2531, and an amplification degree calculation unit 2532. 1. It includes a reception time calculation unit 254, a wall thickness calculation unit 255, and a display control unit 256. The description of each component 251 to 256 in the control / processing unit 250-1 will be described later.

The information input unit 160 inputs, for example, the input information operation-input by the user to the control / processing unit 250-1.

The communication unit 170 controls communication with the external device G via the computer network N. In the case of the second embodiment, examples of the external device G include the measuring device 100 according to the first embodiment described above and the measuring device 300 according to the third embodiment described later.

The storage unit 180 stores various information and various data used by the control / processing unit 250-1, and various information and various data obtained by the processing of the control / processing unit 250-1.

The display unit 190 displays various information, various data, and the like based on the control of the control / processing unit 250-1.

Next, each component 251 to 256 in the control / processing unit 250-1 of FIG. 10 will be described.

The ultrasonic waveform data generation unit 251 shown in FIG. 10 measures the amplitude of the ultrasonic wave 112 from the steel tube 400 after being amplified by the amplification unit 130 (and further A / D converted by the A / D conversion unit 140). Generates ultrasonic waveform data shown in series. This ultrasonic waveform data corresponds to the "first ultrasonic waveform data" in the present embodiment.

FIG. 11 is a schematic diagram for explaining the ultrasonic waveform data generated by the ultrasonic waveform data generation unit 251 shown in FIG. In FIG. 11, the same reference numerals are given to the configurations similar to those shown in FIG.

First, in FIG. 11A, the front surface 400S of the steel pipe and the back surface 400B of the steel pipe shown in FIG. 10 are drawn in the horizontal direction, and the ultrasonic wave 111 from the ultrasonic probe 110 toward the steel pipe 400 and the ultrasonic wave probe from the steel pipe 400 are drawn. Three patterns with the ultrasonic wave 112 toward the tentacle 110 are shown. In the first pattern shown on the left side of FIG. 11A, the ultrasonic wave 111 from the ultrasonic probe 110 toward the steel tube 400 is reflected by the surface 400S of the steel tube, and the surface reflected ultrasonic wave 112-S is ultrasonically detected. It shows the state of going to the child 110. Further, in the second pattern shown in the center of FIG. 11A, the ultrasonic wave 111 directed from the ultrasonic probe 110 toward the steel tube 400 is reflected by the back surface 400B of the steel tube, and the first back surface reflected ultrasonic wave 112-B1 It is shown that the ultrasonic probe 110 is heading toward the ultrasonic probe 110. Further, in the third pattern shown on the right side of FIG. 11A, after the ultrasonic wave 111 from the ultrasonic probe 110 toward the steel tube 400 is reflected by the back surface 400B of the steel tube and then reflected by the surface 400S of the steel tube. It shows how the back surface 400B of the steel tube reflects again and heads toward the ultrasonic probe 110 as the second back surface reflected ultrasonic wave 112-B2. Specifically, in the present embodiment, regarding the back surface reflected ultrasonic wave 112-B, if n is a positive integer, the nth back surface reflected ultrasonic wave 112-Bn is placed between the front surface 400S of the steel tube and the back surface 400B of the steel tube ( Alternatively, it is defined as the back surface reflected ultrasonic wave 112-B that reciprocates n times between the front surface 410S of the reference material and the back surface 410B of the reference material.

11 (b) shows the amplitudes of the front surface reflected ultrasonic wave 112-S, the first back surface reflected ultrasonic wave 112-B1 and the second back surface reflected ultrasonic wave 112-B2 shown in FIG. 11 (a) in chronological order. It is a figure which shows an example of the ultrasonic wave waveform data schematically. In FIG. 11B, the front surface reflected ultrasonic wave 112-S shown in FIG. 11 (a) is an S echo, the first back surface reflected ultrasonic wave 112-B1 is a B1 echo, and the second back surface reflected ultrasonic wave 112-B2. Is shown as a B2 echo.

Further, the ultrasonic waveform data processing unit 253-1 described later shows an ultrasonic waveform showing the amplitude of the sound wave 112 from the steel pipe 400 in time series based on the amplification degree calculated by the amplification degree calculation unit 2532 described later. A process of changing the amplitude of the data (first ultrasonic waveform data) is performed to acquire new ultrasonic waveform data. This new ultrasonic waveform data corresponds to the "second ultrasonic waveform data" in the present embodiment.

Further, in the first aspect of the present embodiment, as described above, an example of measuring the wall thickness of the reference material 410 in advance when measuring the wall thickness of the steel pipe 400 will be described. When measuring the wall thickness, the ultrasonic waveform data generation unit 251 shown in FIG. 10 is a reference material 410 after being amplified by the amplification unit 130 (and further A / D converted by the A / D conversion unit 140). Generates ultrasonic waveform data showing the amplitude of the ultrasonic 112 from the above in chronological order. This ultrasonic waveform data corresponds to the "third ultrasonic waveform data" in the present embodiment. As for the ultrasonic waveform data when the reference material 410 is used, the example shown in FIG. 11 can be applied in the same manner as the ultrasonic waveform data when the steel pipe 400 described above is used.

The gate setting unit 252 shown in FIG. 10 is a first unit showing a range for detecting the surface reflected ultrasonic wave 112-S for each ultrasonic wave waveform data in the above-mentioned first to third ultrasonic wave waveform data. A process of setting a detection gate and a second detection gate indicating a range for detecting the back surface reflected ultrasonic wave 112-B is performed. FIG. 11B shows an example of the first detection gate 2011 and the second detection gate 2012 set by the gate setting unit 252.

Here, in the present embodiment, as shown in FIG. 11B, the second back surface reflected ultrasonic wave 112-B2 is detected as the second detection gate 2012 for detecting the back surface reflected ultrasonic wave 112-B. However, the present invention is not limited to this form, and for example, a form for detecting the first backside reflection ultrasonic wave 112-B1 or a third backside reflection is set. A form in which an ultrasonic wave or a device for detecting backside reflected ultrasonic waves after that is set is also applicable to the present invention.

Further, in the present embodiment, as shown in FIG. 11B, the first detection gate 2011 and the second detection gate 2012 are set on the lower limit side of the amplitude, but in the present invention, this embodiment is used. Not limited to this, a mode in which the first detection gate 2011 and the second detection gate 2012 are set on the upper limit side of the amplitude is also applicable to the present invention. Further, the first detection gate 2011 is on the upper limit side of the amplitude and the second detection gate 2012 is on the lower limit side of the amplitude, or the first detection gate 2011 is on the lower limit side of the amplitude and the second detection gate 2012 is on the upper limit side of the amplitude. The form set on the side is also applicable to the present invention. By doing so, it becomes possible to cope with the phase change of the signal.

Here, a setting example of the first detection gate 2011 and the second detection gate 2012 by the gate setting unit 252 will be described below.
In the first aspect of the present embodiment, the gate setting unit 252 sets the time of the start point of the first detection gate 2011 as the time after the reception process is started by the reception unit 122, and the length of the time is long. And set the level of its amplitude value. Further, in the first aspect of the present embodiment, the gate setting unit 252 sets the time of the start point as the second detection gate 2012 from the time (TS) of the intersection of the ultrasonic waveform and the first detection gate 2011. It is set by the time, and the length of the time and the level of the amplitude value are set. The settings of the first detection gate 2011 and the second detection gate 2012 described here are examples, and the present invention is not limited to this embodiment. The surface-reflected ultrasonic wave 112-S receives, for example, the time when the amplitude peak of the surface-reflected ultrasonic wave 112-S and the first detection gate 2011 intersect at the first time (adjustment such as "second time" is possible as appropriate). It is considered that it is the time to return to the part 122, and even if there are peaks of other amplitudes in the first detection gate 2011, they are regarded as noise. Further, the time during which the amplitude peak of the second backside reflected ultrasonic wave 112-B2 and the second detection gate 2012 intersect at the first time (appropriately, adjustment such as “second time” is possible) is set as the backside reflected ultrasonic wave. It is considered that it is the time when 112-B has returned to the receiver 122, and even if there are other amplitudes in the second detection gate 2012, they are regarded as noise. By doing so, by taking into account the speed of ultrasonic waves, it is possible to mechanically know the distances of the steel pipe 400 (or the reference material 410) to the front surface and the back surface, and as a result, the wall thickness can be known. It will be like. Therefore, it is necessary to determine the optimum values for the values in the amplitude direction (amplitude value level) of the first detection gate 2011 and the second detection gate 2012 by conducting various tests in advance. ..

The ultrasonic waveform data processing unit 253-1 shown in FIG. 10 is the first ultrasonic waveform data showing the amplitude of the sound wave 112 from the steel pipe 400 generated by the ultrasonic waveform data generation unit 251 in chronological order. In the ultrasonic waveform data of the above, the processing for changing the amplitude is performed on the data within the range of at least one of the first detection gate 2011 and the second detection gate 2012. As shown in FIG. 10, the ultrasonic waveform data processing unit 253-1 includes a histogram creation unit 2531 and an amplification degree calculation unit 2532.

The histogram creating unit 2531 shown in FIG. 10 has a histogram relating to the amplitude of the ultrasonic wave within the range of one of the detection gates of the first detection gate 2011 and the second detection gate 2012 for the first ultrasonic waveform data. Perform the process of creating. The histogram created for this first ultrasonic waveform data corresponds to the "first histogram" in the present embodiment. Further, in the present embodiment, the histogram creating unit 2531 shall create a histogram relating to the amplitude of the ultrasonic wave within the range of the second detection gate 2012, but the present invention is limited to this embodiment. Instead, a form of creating a histogram relating to the amplitude of ultrasonic waves within the range of the first detection gate 2011 is also applicable to the present invention. The processing of the histogram creating unit 2531 will be described with reference to FIGS. 12 and 13.

FIG. 12 shows the first ultrasonic waveform data generated by the ultrasonic waveform data generation unit 251 shown in FIG. 10, and the first detection gate and the second detection gate set by the gate setting unit 252 shown in FIG. It is a figure which shows an example of the detection gate. In FIG. 12, the same reference numerals are given to the configurations similar to those shown in FIG. The amplitude shown on the vertical axis in FIG. 12 is, for example, the amplitude of the ultrasonic wave input to the A / D conversion unit 140 when the input range is ± 1.0V and the 8-bit A / D conversion unit 140 is used. Is "0" when is -1.0V, "127" when the amplitude of the ultrasonic wave input to the A / D conversion unit 140 is 0.0V, and the amplitude of the ultrasonic wave input to the A / D conversion unit 140 is. When it is + 1.0V, it becomes a value of "255". Further, when the amplitude of the ultrasonic wave exceeding the input range of the A / D conversion unit 140 is input, for example, when the amplitude of the ultrasonic wave input to the A / D conversion unit 140 is smaller than −1.0V. It is forced to "0", and is forced to "255" when the amplitude of the ultrasonic wave input to the A / D conversion unit 140 is larger than + 1.0V, for example. Further, in the first aspect of the present embodiment, the time shown on the horizontal axis of FIG. 12 indicates the elapsed time from the start of the reception process by the reception unit 122.

FIG. 13 shows a case where the histogram creating unit 2531 shown in FIG. 10 creates a first histogram relating to the amplitude of the ultrasonic wave within the range of the second detection gate 2012 for the first ultrasonic waveform data shown in FIG. It is a figure which shows an example. In the first histogram shown in FIG. 13, the horizontal axis represents the amplitude of the ultrasonic wave shown in FIG. 12, and the vertical axis represents the count value of each bin.

Further, in the first aspect of the present embodiment, the histogram creating unit 2531 shown in FIG. 10 shows the amplitude of the ultrasonic wave 112 from the reference material 410 generated by the ultrasonic wave waveform data generation unit 251 in chronological order. For the third ultrasonic wave waveform data, which is the sound wave waveform data, a process of creating a histogram related to the ultrasonic wave amplitude within the range of the second detection gate 2012 is performed in the same manner as the first ultrasonic wave waveform data described above. conduct. The histogram created for this third ultrasonic waveform data corresponds to the "second histogram" in the present application.

FIG. 14 shows an example of a case where the histogram creating unit 2531 shown in FIG. 10 creates a second histogram relating to the amplitude of the ultrasonic wave within the range of the second detection gate 2012 for the third ultrasonic waveform data. It is a figure. Specifically, FIG. 14 shows a second histogram represented by a bin similar to the first histogram shown in FIG. Comparing the second histogram shown in FIG. 14 with the first histogram shown in FIG. 13, the second histogram shown in FIG. 14 has the smallest bin and the largest bin than the first histogram shown in FIG. The count value of is increasing. From this, in the third ultrasonic waveform data (not shown), the amplitude of the ultrasonic wave within the range of the second detection gate 2012 is lower than the lower limit value of the first ultrasonic waveform data shown in FIG. It can be inferred that the ratio of being forced to "0" and the upper limit "255" is increasing.

The amplification degree calculation unit 2532 shown in FIG. 10 performs a process of calculating the amplification degree at which the count value of a specific bin in the first histogram created by the histogram creation unit 2531 becomes a predetermined value.

Specifically, the amplification degree calculation unit 2532 of the first embodiment of the present embodiment is the smallest bin 2031 containing 0 among the bins of the first histogram shown in FIG. 13 (that is, the A / D conversion unit 140). The count value of the lower limit value) is the smallest bin 2041 (that is, the lower limit value of the A / D conversion unit 140) including 0 corresponding to the bin 2031 among the bins of the second histogram shown in FIG. Amplification is performed so that the count value is the same as the count value of the including bin), and the amplification factor is calculated as the “amplification degree”.

Here, in the present embodiment, an example in which the smallest bottle containing 0 is applied as a specific bin has been described, but the present invention is not limited to this embodiment, and for example, as a specific bottle. A form to which the maximum bin including 255 (that is, the bin including the upper limit value of the A / D conversion unit 140) is applied is also applicable to the present invention. Further, in the present embodiment, an example of amplifying so as to be the same as the count value of the smallest bin 2041 has been described, but it is not necessary to be exactly the same, and the front surface reflection ultrasonic wave 112-S and the back surface reflection are described. As long as the ultrasonic wave 112-B can be detected, it can be applied to the present invention by amplifying it so as to have a value substantially the same as the count value of the smallest bin 2041.

Further, as a method of calculating the amplification degree by the amplification degree calculation unit 2532, for example, a method of amplifying ultrasonic waveform data in small steps, comparing the count values of the smallest bins each time, and repeating until a predetermined value is reached. , A method of creating calibration curve data showing the relationship between the count value of the smallest bin and the corresponding amplification degree in advance, and calculating the amplification degree from the count value of the smallest bin by referring to this calibration curve data, etc. Can be considered. A method of calculating the amplification degree using this calibration curve data will be described with reference to FIG.

FIG. 15 is a diagram showing an example of calibration curve data used when calculating the amplification degree in the amplification degree calculation unit 2532 shown in FIG. Specifically, FIG. 15 shows the count value of a specific bin in the first histogram (horizontal axis), the count value of the specific bin in the first histogram, and the count value of the specific bin in the second histogram. An example of the calibration curve data showing the relationship with the amplification degree (vertical axis) determined by is shown. The calibration curve data shown in FIG. 15 is stored in advance in the storage unit 180.

In this case, in the first aspect of the present embodiment, the amplification degree calculation unit 2532 shown in FIG. 10 reads the calibration curve data shown in FIG. 15 from the storage unit 180, and the first histogram created by the histogram creation unit 2531. The amplification degree is calculated from the count value of the smallest bin 2031 in.

Then, when the amplification degree is calculated by the amplification degree calculation unit 2532, the ultrasonic waveform data processing unit 253-1 shown in FIG. 10 is first based on the amplification degree calculated by the amplification degree calculation unit 2532. The second ultrasonic waveform data, which is new ultrasonic waveform data, is acquired by performing the process of changing the amplitude of the ultrasonic waveform data of. After that, the gate setting unit 252 shown in FIG. 10 sets the first detection gate 2011 and the second detection gate 2012 for the second ultrasonic waveform data.

FIG. 16 shows the second ultrasonic waveform data acquired by the ultrasonic waveform data processing unit 253-1 shown in FIG. 10, and the first detection gate and the first detection gate set by the gate setting unit 252 shown in FIG. It is a figure which shows an example of the detection gate of 2. Here, in the first aspect of the present embodiment, the gate setting unit 252 shown in FIG. 10 has a reference to the second ultrasonic waveform data shown in FIG. 16 with respect to the first ultrasonic waveform data shown in FIG. It is assumed that the first detection gate 2011 and the second detection gate 2012 at the same level as the first detection gate 2011 and the second detection gate 2012 set in the above are set.

The reception time calculation unit 254 shown in FIG. 10 receives the surface reflected ultrasonic wave 112-S from the range of the first detection gate 2011 by the reception unit 122 with respect to the second ultrasonic wave waveform data shown in FIG. The process of calculating the first reception time, which is the time when the second back surface reflected ultrasonic wave 112-B2 is received by the reception unit 122 from within the range of the second detection gate 2012, and the second reception time. conduct. Specifically, in the first aspect of the present embodiment, in the reception time calculation unit 254 shown in FIG. 10, the ultrasonic waveform and the first detection gate 2011 intersect first, as shown in FIG. 11 (b). It is assumed that the time TS of the intersection is calculated as the first reception time, and the time TB2 of the intersection where the ultrasonic waveform and the second detection gate 2012 first intersect is calculated as the second reception time. It should be noted that the time at which the amplitude 0 first intersects with the amplitude 0 is calculated as the time TS by going back forward from the intersection of the ultrasonic waveform and the first detection gate 2011, and the ultrasonic waveform and the second detection gate 2012 are calculated. It is also possible to calculate the time TB2 that first intersects with the amplitude 0 as the second reception time, going back from the intersection. Since the time of the intersection with the amplitude 0 is not affected by the increase or decrease of the amplitude, it is possible to calculate the time with high accuracy.

Further, in the first aspect of the present embodiment, as described above, an example of measuring the wall thickness of the reference material 410 when measuring the wall thickness of the steel pipe 400 will be described, but the wall thickness of the reference material 410 is measured. In this case, the reception time calculation unit 254 shown in FIG. 10 also has the first ultrasonic waveform data, which is the ultrasonic waveform data showing the amplitude of the ultrasonic 112 from the reference material 410 in time series. The process of calculating the reception time and the second reception time is performed. The details of the example in which the wall thickness of the reference material 410 is used when measuring the wall thickness of the steel pipe 400 will be described later in the description of the flowcharts of FIGS. 17 and 18.

The wall thickness calculation unit 255 shown in FIG. 10 has the first reception time and the second reception time in the second ultrasonic waveform data calculated by the reception time calculation unit 254, and the super-propagated inside the steel pipe 400. A process of calculating the wall thickness of the steel pipe 400 is performed based on the velocity of the sound wave. At this time, in the first aspect of the present embodiment, as described above, an example of measuring the wall thickness of the reference material 410 when measuring the wall thickness of the steel pipe 400 will be described. When measuring, the wall thickness calculation unit 255 shown in FIG. 10 has the first reception time and the second reception time in the third ultrasonic waveform data calculated by the reception time calculation unit 254, and the reference material 410. A process of calculating the wall thickness of the reference material 410 is performed based on the velocity of the ultrasonic waves propagating inside the reference material 410. Here, in the first aspect of the present embodiment, the ultrasonic wave velocity data propagating inside the steel pipe 400 and the ultrasonic wave velocity data propagating inside the reference material 410 are stored in advance in the storage unit 180. It is assumed that there is.

In the above, the example of fixing the level of the detection gate and making the amplitude (attenuation degree) of the waveform variable has been described, but in essence, the relative relationship between the level of the detection gate and the amplification degree of the waveform is a problem. Therefore, it is also possible to fix the amplitude of the waveform and make the gate level (attenuation degree) variable. That is, since increasing the amplification degree of the waveform and lowering the level of the detection gate are synonymous in terms of the technical idea of the present invention, the relationship of "count value-amplification degree (magnification)" in FIG. 15 is used. , By substituting "count value-gate level attenuation", the same processing can be performed.

The display control unit 256 shown in FIG. 10 controls, for example, to display the wall thickness of the steel pipe 400 calculated by the wall thickness calculation unit 255 on the display unit 190.

Next, the processing procedure of the measuring method by the measuring device 200-1 according to the first embodiment of the second embodiment will be described.

First, the processing procedure of the wall thickness measuring method of the reference material 410 will be described.
FIG. 17 is a flowchart showing an example of a processing procedure of a method for measuring the wall thickness of the reference material 410 by the measuring device 200-1 according to the first embodiment of the second embodiment of the present invention.

First, in step S2101 of FIG. 17, the control / processing unit 250-1 sets the amplification degree (gain) of the amplification unit 130 based on the input information input from the information input unit 160, for example.

Subsequently, in step S2102 of FIG. 17, the transmission unit 121 transmits the ultrasonic wave 111 toward the surface 410S of the reference material via the ultrasonic probe 110 based on the control of the control / processing unit 250-1. do.

Subsequently, in step S2103 of FIG. 17, the receiving unit 122 receives the ultrasonic wave 112 from the reference material 410 via the ultrasonic probe 110 under the control of the control / processing unit 250-1.

At this time, in the present embodiment, the processes of steps S2102 and S2103 are performed with the ultrasonic probe 110 and the reference material 410 both stationary.

Subsequently, in step S2104 of FIG. 17, the ultrasonic waveform data generation unit 251 is from the reference material 410 after being amplified by the amplification unit 130 (and further A / D converted by the A / D conversion unit 140). A third ultrasonic waveform data, which is ultrasonic waveform data showing the amplitude of the ultrasonic 112 in time series, is generated. Here, it is assumed that the ultrasonic waveform data shown in FIG. 11B is generated, for example.

Subsequently, in step S2105 of FIG. 17, the gate setting unit 252 shows a range for detecting the surface reflected ultrasonic wave 112-S with respect to the third ultrasonic waveform data generated in step S2104. The detection gate 2011 of the above and the second detection gate 2012 indicating the range for detecting the back surface reflected ultrasonic wave 112-B are set. Here, for example, it is assumed that the first detection gate 2011 and the second detection gate 2012 shown in FIG. 11B are set.

Subsequently, in step S2106 of FIG. 17, the histogram creating unit 2531 describes the third ultrasonic waveform data in which the amplitude of the ultrasonic wave 112 from the reference material 410 generated in step S2104 is shown in time series. A second histogram relating to the amplitude of the ultrasonic wave is created within the range of the detection gate 2012 of. Here, for example, it is assumed that the second histogram shown in FIG. 14 is created.

Subsequently, in step S2107 of FIG. 17, the control / processing unit 250-1 has a specific bin in the second histogram created in step S2106 (in this embodiment, for example, the smallest bin 2041 shown in FIG. 14). It is determined whether or not the count value of is within a predetermined range.

As a result of the determination in step S2107 of FIG. 17, if the count value of a specific bin in the second histogram created in step S2106 is not within a predetermined range (S2107 / NO), the step of FIG. 17 Returning to S2101, the processing after step S2101 is performed again.

On the other hand, as a result of the determination in step S2107 of FIG. 17, when the count value of the specific bin in the second histogram created in step S2106 is within a predetermined range (S2107 / YES), FIG. The process proceeds to step S2108 of 17.
Proceeding to step S2108 of FIG. 17, the reception time calculation unit 254 receives the surface reflected ultrasonic wave 112-S from within the range of the first detection gate 2011 for the third ultrasonic wave waveform data generated in step S2104. The first reception time, which is the time received by the unit 122, and the second reception time, which is the time when the second back surface reflected ultrasonic wave 112-B2 is received by the reception unit 122 from within the range of the second detection gate 2012. And calculate. Specifically, in the first aspect of the present embodiment, the reception time calculation unit 254 sets the time TS at the intersection of the ultrasonic waveform and the first detection gate 2011 as the first time TS, as shown in FIG. 11 (b). It is calculated as the reception time, and the time TB2 at the intersection of the ultrasonic waveform and the second detection gate 2012 is calculated as the second reception time.

Subsequently, in step S2109 of FIG. 17, the wall thickness calculation unit 255 sets the first reception time and the second reception time calculated in step S2108, and the inside of the reference material 410 stored in the storage unit 180. The wall thickness of the reference material 410 is calculated from the velocity of the propagating ultrasonic waves.

Subsequently, in step S2110 of FIG. 17, the control / processing unit 250-1 has the actual meat of the reference material 410 in which the wall thickness of the reference material 410 calculated in step S2109 is stored in advance in, for example, the storage unit 180. It is judged whether or not it is within a predetermined range by comparing with the thickness.

As a result of the determination in step S2110 of FIG. 17, when the wall thickness of the reference material 410 calculated in step S2109 is not within a predetermined range as compared with the actual wall thickness of the reference material 410 (S2110 / NO), ultrasonic waves are used. Since it is considered that a problem such as picking up noise has occurred at the time of detection of the above, the process returns to step S2101 in FIG. 17 and the processing after step S2101 is performed again.

On the other hand, as a result of the determination in step S2110 of FIG. 17, when the wall thickness of the reference material 410 calculated in step S2109 is within a predetermined range as compared with the actual wall thickness of the reference material 410 (S2110 / YES). , Proceed to step S2111 in FIG.
Proceeding to step S2111 of FIG. 17, the wall thickness calculation unit 255 determines the wall thickness correction value described later based on the difference between the wall thickness of the reference material 410 calculated in step S2109 and the actual wall thickness of the reference material 410. decide.

After that, for example, the control / processing unit 250-1 stores the data of the wall thickness correction value determined in step S2111 in the storage unit 180. Further, for example, the control / processing unit 250-1 stores the data of the second histogram created in step S2106 for the third ultrasonic waveform data used when calculating the wall thickness of the reference material 410 in the storage unit 180. Remember.

When the processing in step S2111 of FIG. 17 is completed, the processing of the flowchart of FIG. 17 showing an example of the processing procedure of the wall thickness measuring method of the reference material 410 is completed.

Next, a processing procedure of a method for measuring the wall thickness of the steel pipe 400, which is the material to be inspected, will be described.
FIG. 18 is a flowchart showing an example of a processing procedure of a method for measuring the wall thickness of a steel pipe 400 by the measuring device 200-1 according to the first embodiment of the second embodiment of the present invention. When the processing of the flowchart of FIG. 18 is started, it is assumed that the wall thickness correction value data and the data of the second histogram obtained by the processing of the flowchart of FIG. 17 are already stored in the storage unit 180. .. Further, when starting the processing of the flowchart of FIG. 18, it is assumed that the amplification degree 130 is set to the same amplification degree as that set in step S2101 of FIG. 17, for example.

First, in step S2201 of FIG. 18, the transmission unit 121 ultrasonic waves toward the surface 400S of the steel pipe to be inspected via the ultrasonic probe 110 under the control of the control / processing unit 250-1. Send 111.

Subsequently, in step S2202 of FIG. 18, the receiving unit 122 receives the ultrasonic wave 112 from the steel pipe 400 via the ultrasonic probe 110 under the control of the control / processing unit 250-1.

Subsequently, in step S2203 of FIG. 18, the ultrasonic waveform data generation unit 251 is superposed from the steel pipe 400 after being amplified by the amplification unit 130 (and further A / D converted by the A / D conversion unit 140). A first ultrasonic waveform data, which is ultrasonic waveform data showing the amplitude of the ultrasonic 112 in time series, is generated. Here, for example, it is assumed that the ultrasonic waveform data shown in FIG. 12 is generated.

Subsequently, in step S2204 of FIG. 18, the gate setting unit 252 shows a range for detecting the surface reflected ultrasonic wave 112-S with respect to the first ultrasonic wave waveform data generated in step S2203. The detection gate 2011 of the above and the second detection gate 2012 indicating the range for detecting the back surface reflected ultrasonic wave 112-B are set. Here, for example, it is assumed that the first detection gate 2011 and the second detection gate 2012 shown in FIG. 12 are set. Further, in the first aspect of the present embodiment, the gate setting unit 252 sets the first detection gate 2011 and the second detection gate 2011 and the second detection gate 2011 set in step S2105 of FIG. 17 with respect to the first ultrasonic waveform data shown in FIG. It is assumed that the first detection gate 2011 and the second detection gate 2012 at the same level as the detection gate 2012 are set.

Subsequently, in step S2205 of FIG. 18, the histogram creating unit 2531 has a second ultrasonic waveform data showing the amplitude of the ultrasonic wave 112 from the steel pipe 400 generated in step S2203 in chronological order. A first histogram relating to the amplitude of the ultrasonic waves is created within the range of the detection gate 2012. Here, for example, it is assumed that the first histogram shown in FIG. 13 is created.

Subsequently, in step S2206 of FIG. 18, the amplification degree calculation unit 2532 performs a process of calculating the amplification degree at which the count value of the specific bin in the first histogram created in step S2205 becomes a predetermined value. Specifically, in the first aspect of the present embodiment, the amplification degree calculation unit 2532 has the count value of the smallest bin 2031 in the first histogram shown in FIG. 13 stored in the storage unit 180, which is shown in FIG. The process of calculating the amplification degree which becomes the count value of the smallest bin 2041 in the histogram of 2 is performed. At this time, as a method of calculating the amplification degree, as described above, for example, a method of amplifying ultrasonic waveform data in small steps, comparing the count values of the smallest bins each time, and repeating until a predetermined value is reached. , Prepare calibration curve data (FIG. 15) showing the relationship between the count value of the minimum bin and the corresponding amplification degree in advance, and refer to this calibration curve data to calculate the amplification degree from the count value of the minimum bin. A calculation method or the like can be considered.

Subsequently, in step S2207 of FIG. 18, the ultrasonic waveform data processing unit 253-1 changes the amplitude of the first ultrasonic waveform data generated in step S2203 based on the amplification degree calculated in step S2206. The second ultrasonic waveform data, which is new ultrasonic waveform data, is acquired. Here, for example, it is assumed that the ultrasonic waveform data shown in FIG. 16 is generated. After that, the gate setting unit 252 sets the first detection gate 2011 and the second detection gate 2012 for the second ultrasonic waveform data. Here, in the first aspect of the present embodiment, the gate setting unit 252 sets the first detection gate 2011 and the second detection gate 2011 and the second detection gate 2011 set in step S2204 of FIG. 18 with respect to the second ultrasonic waveform data shown in FIG. It is assumed that the first detection gate 2011 and the second detection gate 2012 at the same level as the detection gate 2012 of the above are set.

Subsequently, in step S2208 of FIG. 18, the reception time calculation unit 254 uses the surface reflected ultrasonic wave 112-S from within the range of the first detection gate 2011 for the second ultrasonic wave waveform data acquired in step S2207. The first reception time, which is the time received by the reception unit 122, and the second reception time, which is the time when the second back surface reflected ultrasonic wave 112-B2 from within the range of the second detection gate 2012 is received by the reception unit 122. Performs the process of calculating the time. Specifically, in the first aspect of the present embodiment, the reception time calculation unit 254 sets the time TS at the intersection where the ultrasonic waveform and the first detection gate 2011 first intersect, as shown in FIG. 11 (b). Is calculated as the first reception time, and the time TB2 at the intersection where the ultrasonic waveform and the second detection gate 2012 first intersect is calculated as the second reception time.

Subsequently, in step S2209 of FIG. 18, the wall thickness calculation unit 255 propagates the first reception time and the second reception time calculated in step S2208 and the inside of the steel pipe 400 stored in the storage unit 180. The wall thickness of the steel pipe 400 is calculated from the velocity of the ultrasonic waves.

Subsequently, in step S2210 of FIG. 18, the wall thickness calculation unit 255 adds the wall thickness correction value stored in the storage unit 180 to the wall thickness value calculated in step S2209 to add the wall thickness correction value stored in the storage unit 180 to the final wall thickness of the steel pipe 400. Calculate the thickness.

Specifically, in step S2210, the final wall thickness of the steel pipe 400 is calculated using the following formula (2).
Wall thickness = (TB2-TS) × (velocity of ultrasonic waves propagating inside the steel pipe 400) ÷ 4
+ Wall thickness correction value ・ ・ ・ (2)

In the first aspect of the present embodiment, the second detection gate 2012 for detecting the back surface reflected ultrasonic wave 112-B is set to detect the second back surface reflected ultrasonic wave 112-B2, and is described above. The final wall thickness of the steel pipe 400 is calculated by the equation (2), but by generalizing this, as the second detection gate 2012, for example, the back surface reflected ultrasonic wave 112-Bn of the nth (n is a positive integer) When setting what is detected, the final wall thickness of the steel pipe 400 is calculated using the following formula (3).
Wall thickness = (TBn-TS) × (velocity of ultrasonic waves propagating inside the steel pipe 400) ÷ (2 × n)
+ Wall thickness correction value ・ ・ ・ (3)

Subsequently, in step S2211 of FIG. 18, the display control unit 256 controls to display the final wall thickness of the steel pipe 400 calculated in step S2210 on the display unit 190. Further, the control / processing unit 250-1 performs a process of storing the final wall thickness data of the steel pipe 400 calculated in step S2210 in the storage unit 180, if necessary.

Subsequently, in step S2212 of FIG. 18, whether or not the control / processing unit 250-1 ends the wall thickness measurement of the steel pipe 400 to be inspected, for example, based on the input information input from the information input unit 160. To judge.

As a result of the determination in step S2212 of FIG. 18, if the wall thickness measurement of the steel pipe 400 is not completed (S2212 / NO), for example, the control / processing unit 250-1 positions the ultrasonic probe 110 by a predetermined distance. After moving and changing the installation position, the process returns to step S2201 in FIG. 18 and the processes after step S2201 are performed again. By repeating the processes of steps S2201 to S2212 of FIG. 18, the wall thickness of the steel pipe 400 to be inspected can be measured at a plurality of locations (for example, the entire circumference of the steel pipe 400 shown in FIG. 1).

On the other hand, when the wall thickness measurement of the steel pipe 400 is completed as a result of the determination in step S2212 of FIG. 18 (S2212 / YES), the processing of the flowchart of FIG. 18 showing an example of the processing procedure of the wall thickness measuring method of the steel pipe 400. To finish.

As described above, in the measuring device 200-1 according to the first embodiment of the second embodiment, the second ultrasonic waveform data showing the amplitude of the ultrasonic 112 from the steel pipe 400 in time series is the second. A histogram (first histogram) relating to the amplitude of ultrasonic waves is created within the range of the detection gate 2012, the amplification degree at which the count value of a specific bin in the histogram becomes a predetermined value is calculated, and based on the amplification degree. The amplitude of the first ultrasonic waveform data is changed to acquire the second ultrasonic waveform data, and the surface reflected ultrasonic 112-S is obtained from the range of the first detection gate 2011 for the second ultrasonic waveform data. The first reception time, which is the time when the reception unit 122 received the ultrasonic wave 112-B, and the second reception time, which is the time when the backside reflected ultrasonic wave 112-B was received by the reception unit 122 from within the range of the second detection gate 2012. The wall thickness of the steel pipe 400 is calculated based on the first reception time and the second reception time and the velocity of the ultrasonic wave propagating inside the steel pipe 400.
According to this configuration, when measuring the wall thickness of a plurality of locations of the steel pipe 400 while relatively moving the ultrasonic probe 110 and the steel pipe 400, the surface condition due to the scale or the like attached to the surface of the steel pipe 400 is maintained. Even when the amplitude of the ultrasonic wave 112 changes significantly due to various disturbances such as changes, bending and shape defects of the steel pipe 400, and fluttering during transportation of the steel pipe 400, the first ultrasonic wave obtained at each part of the steel pipe 400. In order to adjust the amplification degree related to the amplitude of the waveform data, it is possible to measure the wall thickness of the steel pipe 400 at a plurality of places with high accuracy.
Further, conventionally, when the ultrasonic waveform data exceeds the input range and overflows, there is a problem that the entire image of the waveform data cannot be known and it is difficult to adjust the amplification degree. However, according to such a configuration, Since the amplification degree is adjusted by focusing on the count value of the smallest bin 2031 including 0 or the bin including the upper limit value of the A / D conversion unit 140, which is considered to increase the count value due to the overflow, such a problem occurs. It does not occur, and the wall thickness can be measured with the optimum amplification degree.

<Aspect 2 of the second embodiment>
Next, aspect 2 of the second embodiment of the present invention will be described. In the description of the second embodiment, the same configuration and the same processing as the first aspect of the second embodiment described above will be omitted.

FIG. 19 is a diagram showing an example of a schematic configuration of the measuring device 200-2 according to the second embodiment of the present invention. In FIG. 19, the same components as those shown in FIG. 10 are designated by the same reference numerals, and therefore detailed description thereof will be omitted.

Here, in the schematic configuration of the measuring device 200-2 according to the second embodiment shown in FIG. 19, the schematic configuration of the measuring device 200-1 according to the second embodiment shown in FIG. 10 and The difference is that the amplification degree calculation unit 2532 shown in FIG. 10 is not configured inside the control / processing unit 250-2 shown in FIG. 19, and the window function processing unit 2533 shown in FIG. 19 is newly configured. It is a point.

As shown in FIG. 19, the control / processing unit 250-2 includes an ultrasonic waveform data generation unit 251, a gate setting unit 252, a histogram creation unit 2531, and a window function processing unit 2533. , The reception time calculation unit 254, the wall thickness calculation unit 255, and the display control unit 256. Here, with respect to the constituent units 251 to 252 and 254 to 256 in the control / processing unit 250-2, the constituent units in the control / processing unit 250-1 in the second embodiment shown in FIG. 10, respectively. Since it is the same as 251 to 252 and 254 to 256, the description thereof will be omitted. Hereinafter, the ultrasonic waveform data processing unit 253-2 of FIG. 19 will be described.

The ultrasonic waveform data processing unit 253-2 shown in FIG. 19 is the first ultrasonic waveform data showing the amplitude of the sound wave 112 from the steel pipe 400 generated by the ultrasonic waveform data generation unit 251 in chronological order. In the ultrasonic waveform data of the above, the processing for changing the amplitude is performed on the data within the range of at least one of the first detection gate 2011 and the second detection gate 2012. As shown in FIG. 19, the ultrasonic waveform data processing unit 253-2 includes a histogram creation unit 2531 and a window function processing unit 2533. Here, since the histogram creation unit 2531 in FIG. 19 has the same configuration as the histogram creation unit 2531 in FIG. 10, the description thereof will be omitted.

The window function processing unit 2533 has a range of the second detection gate 2012 in the first ultrasonic wave waveform data showing the amplitude of the sound wave 112 from the steel pipe 400 generated by the ultrasonic wave waveform data generation unit 251 in time series. Performs the process of multiplying the data in the window function by the window function.

FIG. 20 is a diagram showing an example of a window function used in the window function processing unit 2533 shown in FIG. Further, it is assumed that the data of the window function shown in FIG. 20 is stored in advance in the storage unit 180. The window function shown in FIG. 20 corresponds to the data within the range of the second detection gate 2012 in the first ultrasonic waveform data shown in FIG.

Then, the window function processing unit 2533 performs a process of multiplying the data within the range of the second detection gate 2012 in the first ultrasonic waveform data shown in FIG. 12 by the window function shown in FIG. 20 to obtain an amplitude. To change. Here, the window function processing unit 2533 sets a predetermined position within the range of the second detection gate 2012 in the first ultrasonic waveform data shown in FIG. 12 and the peak position 2051 of the window function shown in FIG. 20 on the time axis. After aligning the data, the data within the range of the second detection gate 2012 in the first ultrasonic waveform data shown in FIG. 12 is multiplied by the window function shown in FIG. 20.

At this time, in the second embodiment of the present embodiment, the second detection gate 2012 in the first ultrasonic waveform data shown in FIG. 12, which aligns the peak position 2051 of the window function shown in FIG. 20 with respect to the time axis. As a predetermined position within the range, for example, when the position 2021 of the maximum amplitude within the range of the second detection gate 2012 shown in FIG. 12 or the absolute value of the amplitude within the range of the second detection gate 2012 is taken. It is conceivable to set the position of the maximum value of the envelope. Here, the Gaussian-distributed window function as shown in FIG. 20 is described by an example of performing alignment based on the peak position 2051, but the window function may be used depending on the occurrence of noise or the like. It does not have to have a Gaussian distribution, and may be, for example, a rectangular wave shape having a flat upper surface, a triangular wave shape, or the like. Therefore, it is also possible to determine a specific position of such a window function (for example, the center position of the upper surface of the rectangular wave, the apex of the triangular wave) as a reference position, and perform alignment based on the reference position.

Next, the processing procedure of the measuring method by the measuring device 200-2 according to the second embodiment will be described.

First, the processing procedure of the wall thickness measuring method of the reference material 410 in the second embodiment is the same as the processing procedure of the wall thickness measuring method of the reference material 410 in the first aspect of the second embodiment shown in FIG. Since they are the same, the description thereof will be omitted.

Next, the processing procedure of the wall thickness measuring method of the steel pipe 400 which is the material to be inspected in the second embodiment will be described.

FIG. 21 is a flowchart showing an example of a processing procedure of a method for measuring the wall thickness of a steel pipe 400 by the measuring device 200-2 according to the second embodiment of the present invention. When the processing of the flowchart of FIG. 21 is started, it is assumed that the data of the wall thickness correction value obtained by the processing of the flowchart of FIG. 17 is already stored in the storage unit 180. Further, when starting the processing of the flowchart of FIG. 21, it is assumed that the amplification degree 130 is set to the same amplification degree as that set in step S2101 of FIG. 17, for example.

First, in the process of the method for measuring the wall thickness of the steel pipe 400 in the second embodiment, the process of steps S2201 to S2204 in the first aspect of the second embodiment shown in FIG. 18 is performed. As a result, for example, the first ultrasonic waveform data shown in FIG. 12 is generated, and for example, the first detection gate 2011 and the second detection gate 2012 shown in FIG. 12 are set.

Subsequently, in step S2301 of FIG. 21, the window function processing unit 2533 refers to the data within the range of the second detection gate 2012 in the first ultrasonic waveform data shown in FIG. 12, and the window function shown in FIG. 20. Perform the process of multiplying. Here, the window function processing unit 2533 is at a predetermined position within the range of the second detection gate 2012 in the first ultrasonic waveform data shown in FIG. 12 (for example, as described above, the second detection shown in FIG. 12). The position of the maximum amplitude within the range of the gate 2012 2021, or the position of the maximum value of the envelope when the absolute value of the amplitude within the range of the second detection gate 2012 is taken) and FIG. By aligning the peak position 2051 of the window function with respect to the time axis, the window function shown in FIG. 20 is used for the data within the range of the second detection gate 2012 in the first ultrasonic waveform data shown in FIG. The amplitude is changed by performing the multiplication process.

After that, the gate setting unit 252 sets the first detection gate 2011 and the second detection gate 2012 for the ultrasonic waveform data obtained by multiplying the window functions. Here, in the second aspect of the present embodiment, the gate setting unit 252 is the first set in step S2204 of FIG. 21 with respect to the ultrasonic waveform data obtained by performing the process of multiplying the window functions. It is assumed that the first detection gate 2011 and the second detection gate 2012 at the same level as the detection gate 2011 and the second detection gate 2012 are set.

Subsequently, in step S2302 of FIG. 21, the reception time calculation unit 254 applies the ultrasonic waveform data obtained by performing the process of multiplying the window function in step S2301 from within the range of the first detection gate 2011 to the surface. The first reception time, which is the time when the reflected ultrasonic wave 112-S was received by the receiving unit 122, and the second back surface reflected ultrasonic wave 112-B2 from within the range of the second detection gate 2012 were received by the receiving unit 122. A process of calculating the second reception time, which is the time, is performed. Specifically, in the present embodiment, as shown in FIG. 11B, the reception time calculation unit 254 first sets the time TS at the intersection where the ultrasonic waveform and the first detection gate 2011 first intersect. It is assumed that the time TB2 at the intersection where the ultrasonic waveform and the second detection gate 2012 first intersect is calculated as the second reception time.

Subsequently, in step S2303 of FIG. 21, the wall thickness calculation unit 255 propagates the first reception time and the second reception time calculated in step S2302 and the inside of the steel pipe 400 stored in the storage unit 180. The wall thickness of the steel pipe 400 is calculated from the velocity of the ultrasonic waves.

Subsequently, in step S2304 of FIG. 21, the wall thickness calculation unit 255 adds the wall thickness correction value stored in the storage unit 180 to the wall thickness value calculated in step S2303 to add the wall thickness correction value stored in the storage unit 180 to the final wall thickness of the steel pipe 400. Calculate the thickness. At this time, also in the second aspect of the present embodiment, as in the first aspect of the present embodiment, the wall thickness calculation unit 255 uses the above-mentioned equation (2) (or a generalized equation (3)). The final wall thickness of the steel pipe 400 is calculated.

Subsequently, in step S2305 of FIG. 21, the display control unit 256 controls to display the final wall thickness of the steel pipe 400 calculated in step S2304 on the display unit 190. Further, the control / processing unit 250-2 performs a process of storing the final wall thickness data of the steel pipe 400 calculated in step S2304 in the storage unit 180, if necessary.

Subsequently, in step S2212 of FIG. 21, whether or not the control / processing unit 250-2 ends the wall thickness measurement of the steel pipe 400 to be inspected, for example, based on the input information input from the information input unit 160. To judge.

As a result of the determination in step S2212 in FIG. 21, if the wall thickness measurement of the steel pipe 400 is not completed (S2212 / NO), for example, the control / processing unit 250-2 sets the installation position of the ultrasonic probe 110 by a predetermined distance. After moving and changing the installation position, the process returns to step S2201 in FIG. 21 and the processes after step S2201 are performed again. By repeating the processes of steps S2201 to S2212 of FIG. 21, the wall thickness of the steel pipe 400 to be inspected can be measured at a plurality of locations (for example, the entire circumference of the steel pipe 400 shown in FIG. 19).

On the other hand, when the wall thickness measurement of the steel pipe 400 is completed as a result of the determination in step S2212 of FIG. 21 (S2212 / YES), the processing of the flowchart of FIG. 21 showing an example of the processing procedure of the wall thickness measuring method of the steel pipe 400. To finish.

As described above, in the measuring device 200-2 according to the second embodiment, the second detection in the first ultrasonic wave waveform data showing the amplitude of the ultrasonic wave 112 from the steel pipe 400 in chronological order. The ultrasonic waveform data obtained by multiplying the data in the range of the gate 2012 by the window function and multiplying the window function is obtained from the range of the first detection gate 2011 to the surface. The first reception time, which is the time when the reflected ultrasonic wave 112-S is received by the receiving unit 122, and the time when the back surface reflected ultrasonic wave 112-B is received by the receiving unit 122 from within the range of the second detection gate 2012. The reception time of No. 2 is calculated, and the wall thickness of the steel pipe 400 is calculated based on the first reception time and the second reception time and the velocity of the ultrasonic wave propagating inside the steel pipe 400.
According to this configuration, when measuring the wall thickness of a plurality of locations of the steel pipe 400 while relatively moving the ultrasonic probe 110 and the steel pipe 400, the surface condition due to the scale or the like attached to the surface of the steel pipe 400 is maintained. Due to various disturbances such as changes, bending and shape defects of the steel pipe 400, and fluttering during transportation of the steel pipe 400, the waveform of the previous reflected ultrasonic wave within the range of the second detection gate 2012 in the first ultrasonic wave waveform data. Even when various diffused reflection noises are superimposed in the range of the second detection gate 2012, the data in the range of the second detection gate 2012 is windowed. Since the process of multiplying the functions is performed, the influence of the above-mentioned tailing and diffused reflection noise can be suppressed. As a result, it is possible to measure the wall thickness of the steel pipe 400 at a plurality of locations with high accuracy even in an environment with various disturbances.
In the above description, the description is based on the process of multiplying the window function by the second detection gate. However, in the case of performing the process of multiplying the window function by the first detection gate or by multiplying the window function by the first detection gate, the first description is performed. Even when the process of applying to both the detection gate and the second detection gate is performed, it can be applied to the second aspect of the present embodiment.

<Aspect 3 of the second embodiment>
Next, the third aspect of the second embodiment of the present invention will be described. In the description of the third aspect of the second embodiment, the same configuration and the same processing as those of the first and second aspects of the second embodiment described above will be omitted.

FIG. 22 is a diagram showing an example of a schematic configuration of the measuring device 200-3 according to the third embodiment of the second embodiment of the present invention. In FIG. 22, the configurations shown in FIG. 10 and the same configurations as those shown in FIG. 19 are designated by the same reference numerals, and therefore detailed description thereof will be omitted.

Here, in the schematic configuration of the measuring device 200-3 according to the third embodiment shown in FIG. 22, the schematic configuration of the measuring device 200-1 according to the first embodiment shown in FIG. 10 and The difference is that the window function processing unit 2533 shown in FIG. 22 is newly configured inside the control / processing unit 250-3 shown in FIG. 22. The window function processing unit 2533 shown in FIG. 22 is the same as the window function processing unit 2533 in the second embodiment shown in FIG.

Next, the processing procedure of the measurement method by the measuring device 200-3 according to the third embodiment of the second embodiment will be described.

First, regarding the processing procedure of the wall thickness measuring method of the reference material 410 in the third embodiment of the second embodiment, the processing procedure of the wall thickness measuring method of the reference material 410 in the first aspect of the second embodiment shown in FIG. Since they are the same, the description thereof will be omitted.

Next, the processing procedure of the wall thickness measuring method of the steel pipe 400 which is the material to be inspected in the third embodiment of the second embodiment will be described.

FIG. 23 is a flowchart showing an example of a processing procedure of a method for measuring the wall thickness of a steel pipe 400 by the measuring device 200-3 according to the third embodiment of the second embodiment of the present invention. When the processing of the flowchart of FIG. 23 is started, it is assumed that the wall thickness correction value data and the data of the second histogram obtained by the processing of the flowchart of FIG. 17 are already stored in the storage unit 180. .. Further, when starting the processing of the flowchart of FIG. 23, it is assumed that the amplification degree 130 is set to the same amplification degree as that set in step S2101 of FIG. 17, for example.

First, in the process of the method for measuring the wall thickness of the steel pipe 400 in the third embodiment of the second embodiment, the process of steps S2201 to S2204 in the first embodiment of the second embodiment shown in FIG. 18 is performed. As a result, for example, the first ultrasonic waveform data shown in FIG. 12 is generated, and for example, the first detection gate 2011 and the second detection gate 2012 shown in FIG. 12 are set.

Subsequently, in step S2301 of FIG. 23, the window function processing unit 2533 refers to the data within the range of the second detection gate 2012 in the first ultrasonic waveform data shown in FIG. 12 with respect to the window function shown in FIG. Perform the process of multiplying. Since the process of step S2301 of FIG. 23 is the same as the process of step S2301 of FIG. 21 in the second embodiment described above, the detailed description thereof will be omitted.

After that, the gate setting unit 252 sets the first detection gate 2011 and the second detection gate 2012 for the ultrasonic waveform data obtained by multiplying the window functions. Here, in the present embodiment, the gate setting unit 252 sets the first detection gate 2011 in step S2204 of FIG. 23 with respect to the ultrasonic waveform data obtained by performing the process of multiplying the window functions. And the first detection gate 2011 and the second detection gate 2012 at the same level as the second detection gate 2012 shall be set.

Subsequently, in step S2401 of FIG. 23, the histogram creation unit 2531 obtains ultrasonic wave waveform data obtained by performing the processing of multiplying the window function in step S2301 within the range of the second detection gate 2012. A first histogram relating to the amplitude of is created. Here, for example, it is assumed that the first histogram shown in FIG. 13 is created.

Subsequently, in step S2402 of FIG. 23, the amplification degree calculation unit 2532 performs a process of calculating the amplification degree at which the count value of the specific bin in the first histogram created in step S2401 becomes a predetermined value. Since the process of step S2402 of FIG. 23 is the same as the process of step S2206 of FIG. 18 in the first aspect of the second embodiment described above, detailed description thereof will be omitted.

Subsequently, in step S2403 of FIG. 23, the ultrasonic waveform data processing unit 253-3 performs a process of multiplying the window function in step S2301 based on the amplification degree calculated in step S2402. A process of changing the amplitude of the sound wave waveform data is performed, and a second ultrasonic wave waveform data, which is new ultrasonic wave waveform data, is acquired. Here, for example, it is assumed that the ultrasonic waveform data shown in FIG. 16 is generated. After that, the gate setting unit 252 sets the first detection gate 2011 and the second detection gate 2012 for the second ultrasonic waveform data. Here, in the third aspect of the present embodiment, the gate setting unit 252 is obtained by performing a process of multiplying the second ultrasonic waveform data shown in FIG. 16 by a window function in step S2301. It is assumed that the first detection gate 2011 and the second detection gate 2012 at the same level as the first detection gate 2011 and the second detection gate 2012 set for the sound wave waveform data are set.

Subsequently, in step S2404 of FIG. 23, the reception time calculation unit 254 uses the surface reflected ultrasonic wave 112-S from within the range of the first detection gate 2011 for the second ultrasonic wave waveform data acquired in step S2403. The first reception time, which is the time received by the reception unit 122, and the second reception time, which is the time when the second back surface reflected ultrasonic wave 112-B2 from within the range of the second detection gate 2012 is received by the reception unit 122. Performs the process of calculating the time. Specifically, in the third aspect of the present embodiment, as shown in FIG. 11B, the reception time calculation unit 254 sets the time TS at the intersection where the ultrasonic waveform and the first detection gate 2011 first intersect. Is calculated as the first reception time, and the time TB2 at the intersection where the ultrasonic waveform and the second detection gate 2012 first intersect is calculated as the second reception time.

Subsequently, in step S2405 of FIG. 23, the wall thickness calculation unit 255 propagates the first reception time and the second reception time calculated in step S2404 and the inside of the steel pipe 400 stored in the storage unit 180. The wall thickness of the steel pipe 400 is calculated from the velocity of the ultrasonic waves.

Subsequently, in step S2406 of FIG. 23, the wall thickness calculation unit 255 adds the wall thickness correction value stored in the storage unit 180 to the wall thickness value calculated in step S2405 to add the wall thickness correction value stored in the storage unit 180 to the final wall thickness of the steel pipe 400. Calculate the thickness. At this time, also in the third aspect of the present embodiment, as in the first aspect of the present embodiment, the wall thickness calculation unit 255 uses the above-mentioned equation (2) (or the generalized equation (3)). The final wall thickness of the steel pipe 400 is calculated.

Subsequently, in step S2407 of FIG. 23, the display control unit 256 controls to display the final wall thickness of the steel pipe 400 calculated in step S2406 on the display unit 190. Further, the control / processing unit 250-3 performs a process of storing the final wall thickness data of the steel pipe 400 calculated in step S2406 in the storage unit 180, if necessary.

Subsequently, in step S2212 of FIG. 23, whether or not the control / processing unit 250-3 ends the wall thickness measurement of the steel pipe 400 to be inspected, for example, based on the input information input from the information input unit 160. To judge.

As a result of the determination in step S2212 in FIG. 23, if the wall thickness measurement of the steel pipe 400 is not completed (S2212 / NO), for example, the control / processing unit 250-3 sets the installation position of the ultrasonic probe 110 by a predetermined distance. After moving and changing the installation position, the process returns to step S2201 in FIG. 23, and the processes after step S2201 are performed again. By repeating the processes of steps S2201 to S2212 of FIG. 23, it is possible to measure the wall thickness of a plurality of locations (for example, the entire circumference of the steel pipe 400 shown in FIG. 13) of the steel pipe 400 to be inspected.

On the other hand, when the wall thickness measurement of the steel pipe 400 is completed as a result of the determination in step S2212 of FIG. 23 (S2212 / YES), the processing of the flowchart of FIG. 23 showing an example of the processing procedure of the wall thickness measuring method of the steel pipe 400. To finish.

As described above, in the measuring device 200-3 according to the third embodiment of the second embodiment, the second detection in the first ultrasonic wave waveform data showing the amplitude of the sound wave 112 from the steel pipe 400 in chronological order. The processing of multiplying the data in the range of the gate 2012 by the window function is performed, and the ultrasonic waveform data obtained by performing the processing of multiplying the window function is superposed within the range of the second detection gate 2012. A histogram related to the amplitude of the sound wave (first histogram) is created, the amplification degree at which the count value of a specific bin in the histogram becomes a predetermined value is calculated, and the processing of multiplying by the window function based on the amplification degree is performed. The amplitude of the obtained ultrasonic wave waveform data is changed to acquire the second ultrasonic wave waveform data, and the surface reflected sound wave 112 is obtained from the range of the first detection gate 2011 for the second ultrasonic wave waveform data. The first reception time, which is the time when −S is received by the reception unit 122, and the second reception time, which is the time when the backside reflected sound wave 112-B is received by the reception unit 122 from within the range of the second detection gate 2012. Is calculated, and the wall thickness of the steel pipe 400 is calculated based on the first reception time and the second reception time and the velocity of the sound wave propagating inside the steel pipe 400.
According to this configuration, when measuring the wall thickness of a plurality of locations of the steel pipe 400 while relatively moving the ultrasonic probe 110 and the steel pipe 400, the surface condition due to the scale or the like attached to the surface of the steel pipe 400 is maintained. Due to various disturbances such as changes, bending and shape defects of the steel pipe 400, and fluttering during transportation of the steel pipe 400, the waveform of the previous reflected ultrasonic wave within the range of the second detection gate 2012 in the first ultrasonic wave waveform data. Even when various diffused reflection noises are superimposed in the range of the second detection gate 2012, the data in the range of the second detection gate 2012 is windowed. Since the process of multiplying the functions is performed, the influence of the above-mentioned tailing and diffused reflection noise can be suppressed. As a result, it is possible to measure the wall thickness of the steel pipe 400 at a plurality of locations with high accuracy even in an environment with various disturbances. Further, even when the amplitude of the ultrasonic wave 112 changes significantly due to the various disturbances described above, in order to adjust the amplification degree related to the amplitude of the first ultrasonic waveform data obtained at each part of the steel pipe 400, from this point. Also, it is possible to measure the wall thickness of a plurality of steel pipes 400 with high accuracy.
Further, conventionally, when the ultrasonic waveform data exceeds the input range and overflows, there is a problem that the entire image of the waveform data cannot be known and it is difficult to adjust the amplification degree. However, according to such a configuration, Since the amplification degree is adjusted by focusing on the count value of the smallest bin 2031 including 0 or the bin including the upper limit value of the A / D conversion unit 140, which is considered to increase the count value due to the overflow, such a problem occurs. It does not occur, and the wall thickness can be measured with the optimum amplification degree.
In the above description, the description is based on the process of multiplying the window function by the second detection gate. However, in the case of performing the process of multiplying the window function by the first detection gate or by multiplying the window function by the first detection gate, the first description is performed. Even when the process of applying to both the detection gate and the second detection gate is performed, it can be applied to the third aspect of the present embodiment.
Further, in the above description, the histogram is created for the second detection gate multiplied by the window function, but the present invention is not limited to this, and the detection gate multiplied by the window function and the detection for creating the histogram are created. Even if the gates are different, it can be applied to the third aspect of the present embodiment.

(Third embodiment)
Next, a third embodiment of the present invention will be described.

FIG. 24 is a diagram showing an example of a schematic configuration of the measuring device 300 according to the third embodiment of the present invention. In FIG. 24, the same reference numerals are given to the configurations similar to the schematic configuration of the measuring device 100 according to the first embodiment shown in FIG. 1, and detailed description thereof will be omitted as necessary. This measuring device 300 is a device that measures the wall thickness of the steel pipe 400 via each ultrasonic probe in a plurality of ultrasonic probes 110 arranged with respect to the steel pipe 400 as the material to be inspected. Here, the wall thickness of the steel pipe 400 is determined by the length between the surface 400S of the steel pipe, which is the outer surface of the steel pipe 400, and the back surface 400B of the steel pipe, which is the inner surface of the steel pipe 400.

As shown in FIG. 24, the measuring device 300 includes an ultrasonic probe 110, a transmission / reception unit 120, an amplification unit 130, an A / D conversion unit 140, a control / processing unit 350, an information input unit 160, a communication unit 170, and a storage unit. It is configured to have a unit 180 and a display unit 190.

The ultrasonic probe 110 controls the transmission and reception of ultrasonic waves at a plurality of measurement points of the steel pipe 400 by moving relative to the steel pipe 400. Here, in the present embodiment, a mode in which a plurality of ultrasonic probes 110-1 to 110-4 are provided as the ultrasonic probe 110 is shown.

As an example of relatively moving the ultrasonic probes 110-1 to 110-4 and the steel pipe 400, in FIG. 24, each ultrasonic probe 110- is based on the control of the control / processing unit 350. The form in which 1-110-4 moves in the circumferential direction of the steel pipe 400 is exemplified, but the present invention is not limited to this form. For example, a form in which the steel tube 400 side moves while the ultrasonic probes 110-1 to 110-4 are stationary is also applicable to the present invention, and the respective ultrasonic probes 110-1 to 110 are also applicable. A form in which the wall thickness measurement position on the steel pipe 400 is moved by electrically changing the ultrasonic wave transmission direction by appropriately controlling the ultrasonic wave transmission timing of -4 is also applicable to the present invention. Further, FIG. 24 shows an example in which the ultrasonic probes 110-1 to 110-4 move in the circumferential direction of the steel pipe 400. For example, the ultrasonic probes 110-1 to 110-4 are the steel pipe 400. It is also applicable to the form of moving in the pipe axis direction (z direction in FIG. 24).

The transmission / reception unit 120 transmits / receives ultrasonic waves to / from the steel pipe 400 via the ultrasonic probes 110-1 to 110-4 based on the control of the control / processing unit 350. The transmission / reception unit 120 includes a transmission unit 121 and a reception unit 122.

The transmission unit 121 performs a process of transmitting an ultrasonic wave 111 toward the surface 400S of the steel pipe via the ultrasonic probes 110-1 to 110-4 under the control of the control / processing unit 350. Here, in FIG. 24, the ultrasonic 111 transmitted by the transmission unit 121 toward the surface 400S of the steel tube via the ultrasonic probe 110-1 is referred to as an ultrasonic 111-1, and the ultrasonic probe 110 is used. The ultrasonic 111 transmitted toward the surface 400S of the steel pipe via -2 is referred to as ultrasonic 111-2, and the ultrasonic 111 transmitted toward the surface 400S of the steel pipe via the ultrasonic probe 110-3 is super-ultrasonic. The ultrasonic wave 111-3 and the ultrasonic wave 111 transmitted toward the surface 400S of the steel pipe via the ultrasonic probe 110-4 are shown as the ultrasonic wave 111-4. Further, the receiving unit 122 performs a process of receiving the ultrasonic wave 112 from the steel pipe 400 via the ultrasonic probes 110-1 to 110-4 based on the control of the control / processing unit 350. Here, in FIG. 24, the receiving unit 122 sets the ultrasonic wave 112 received from the steel tube 400 via the ultrasonic probe 110-1 as the ultrasonic wave 112-1, and via the ultrasonic probe 110-2. The ultrasonic wave 112 received from the steel tube 400 is referred to as ultrasonic wave 112-2, and the ultrasonic wave 112 received from the steel tube 400 via the ultrasonic probe 110-3 is referred to as ultrasonic wave 112-3, and the ultrasonic probe 110 is used. The ultrasonic wave 112 received from the steel pipe 400 via -4 is shown as the ultrasonic wave 112-4.

The amplification unit 130 performs a process of amplifying the ultrasonic wave 112 from the steel pipe 400 received by the reception unit 122 based on the control of the control / processing unit 350.

The A / D conversion unit 140 performs a process of converting the ultrasonic wave 112 from the steel pipe 400 after being amplified by the amplification unit 130 from an analog signal to a digital signal based on the control of the control / processing unit 350.

In the present embodiment, the signal that has passed through the amplification unit 130 is in the order of passing through the A / D conversion unit 140, but the order is reversed and the signal that has passed through the A / D conversion unit 140 is used. The order of amplification by the amplification unit 130 can also be set. By doing so, the digital signal is amplified, so that the handling of the signal can be facilitated.

The control / processing unit 350 controls each component of the measuring device 300 based on, for example, the input information input from the information input unit 160 and the input information input from the communication unit 170, and controls the operation of the measuring device 300. Control. Further, the control / processing unit 350 performs various processes based on, for example, the input information input from the information input unit 160 and the input information input from the communication unit 170. As shown in FIG. 24, the control / processing unit 350 includes an ultrasonic waveform data generation unit 351, a gate setting unit 352, a reception time detection unit 353, a reference waveform data generation unit 354, a waveform data subtraction unit 355, and a reception time calculation. It includes a unit 356, a wall thickness calculation unit 357, and a display control unit 358. The description of each component 351 to 358 in the control / processing unit 350 will be described later.

The information input unit 160 inputs, for example, the input information operation-input by the user to the control / processing unit 350.

The communication unit 170 controls communication with the external device G via the computer network N. In the case of the third embodiment, examples of the external device G include the measuring device 100 according to the first embodiment and the measuring device 200 according to the second embodiment described above.

The storage unit 180 stores various information and various data used by the control / processing unit 350, and various information and various data obtained by the processing of the control / processing unit 350.

The display unit 190 displays various information, various data, and the like based on the control of the control / processing unit 350.

Next, each component 351 to 358 in the control / processing unit 350 of FIG. 24 will be described.

The ultrasonic waveform data generation unit 351 shown in FIG. 24 is amplified by the amplification unit 130 for each ultrasonic probe 110-1 to 110-4 (further, A / D conversion by the A / D conversion unit 140). The ultrasonic waveform data showing the amplitude of the ultrasonic wave 112 from the steel pipe 400 in time series is generated.

FIG. 25 shows the ultrasonic waveform data generated by the ultrasonic waveform data generation unit 351 shown in FIG. 24, and the first detection gate and the second detection gate set by the gate setting unit 352 shown in FIG. 24. It is a figure which shows an example.

FIG. 25A shows, for example, a processing example relating to the ultrasonic probe 110-1.
Specifically, FIG. 25A shows, for example, a B-scope image 3011 generated by the control / processing unit 350 on the left side thereof. This B-scope image 3011 is the same as the B-scope image described above in the first embodiment. Further, in FIG. 25 (a), ultrasonic waveform data 3012 corresponding to the data of the upper and lower lines 30111 in the B scope image 3011 shown in FIG. 25 (a) is shown on the right side thereof. The ultrasonic waveform data 3012 is generated by the ultrasonic waveform data generation unit 351.

FIG. 25 (b) shows, for example, a processing example relating to the ultrasonic probe 110-3 arranged at a position facing the ultrasonic probe 110-1 shown in FIG. 25 (a) described above. ..
Specifically, FIG. 25B shows, for example, a B-scope image 3013 generated by the control / processing unit 350 on the left side thereof. This B-scope image 3013 is also the same as the B-scope image described above in the first embodiment. Further, in FIG. 25 (b), ultrasonic waveform data 3014 corresponding to the data of the upper and lower lines 30131 in the B scope image 3013 shown in FIG. 25 (b) is shown on the right side thereof. This ultrasonic waveform data 3014 is also generated by the ultrasonic waveform data generation unit 351.

Both the ultrasonic waveform data 3012 shown in FIG. 25 (a) and the ultrasonic waveform data 3014 shown in FIG. 25 (b) S-echo the surface reflected ultrasonic wave 112-S described above in the first and second embodiments. The waveform is shown by using the first back surface reflected ultrasonic wave 112-B1 as a B1 echo and the second back surface reflected ultrasonic wave 112-B2 as a B2 echo. Further, in the present embodiment, the amplitude shown on the horizontal axis of the ultrasonic waveform data 3012 shown in FIG. 25 (a) and the ultrasonic waveform data 3014 shown in FIG. 25 (b) has, for example, an input range of ± 1.0 V. When the 8-bit A / D conversion unit 140 is used and the amplitude of the ultrasonic wave input to the A / D conversion unit 140 is −1.0V, it is “0” and is input to the A / D conversion unit 140. When the amplitude of the ultrasonic wave is 0.0V, the value is "127", and when the amplitude of the ultrasonic wave input to the A / D conversion unit 140 is + 1.0V, the value is "255". Further, in the present embodiment, when the amplitude of the ultrasonic wave exceeding the input range of the A / D conversion unit 140 is input, for example, the amplitude of the ultrasonic wave input to the A / D conversion unit 140 is -1. When it is smaller than 0V, it is forced to "0", and when the amplitude of the ultrasonic wave input to the A / D conversion unit 140 is larger than + 1.0V, it is forced to "255". Further, in the present embodiment, the reception unit 122 starts the reception process during the time shown on the vertical axis of the ultrasonic waveform data 3012 shown in FIG. 25 (a) and the ultrasonic waveform data 3014 shown in FIG. 25 (b). It shall indicate the elapsed time since then.

Here, looking at the B-scope image 3011 related to the ultrasonic probe 110-1 shown in FIG. 25 (a), in addition to the original S-echo and B-echo multiplex signals with strong shading, the same with weak shading It can be seen that the patterns appear in different phases. Then, referring to the B-scope image 3031 according to the ultrasonic probe 110-3 shown in FIG. 25 (b), the B-scope image 3011 according to the ultrasonic probe 110-1 shown in FIG. 25 (a) is originally In the portions of the patterns 30112 and 30113 other than the multiplex signal of, the S echo having a particularly large amplitude of the B scope image 3031 according to the ultrasonic probe 110-3 shown in FIG. 25 (b) is superimposed from the locus. You can see that. This cannot be understood simply by observing only the ultrasonic waveform data 3012 related to the ultrasonic probe 110-1. In the B scope image 3011 according to the ultrasonic probe 110-1 shown in FIG. 25 (a), patterns other than the original multiplex signals also appear in patterns other than the patterns 30112 and 30113. It is considered to be the influence of the S echo of the ultrasonic probes 110-2 and 110-4.

Further, regarding the influence of the S echo of the other ultrasonic probe 110 described above, comparing the ultrasonic waveform data 3012 shown in FIG. 25 (a) with the ultrasonic waveform data 3014 shown in FIG. 25 (b), FIG. The echo observed between the B1 echo and the B2 echo of the ultrasonic waveform data 3012 according to the ultrasonic probe 110-1 shown in 25 (a) is another ultrasonic probe shown in FIG. 25 (b). It can be seen that the ultrasonic wave waveform data 3014 relating to the child 110-3 is located at a position on the same time axis as the S echo. Therefore, in the third embodiment, there is provided a technique for reducing the influence of the S echo on the other ultrasonic probe 110 in the ultrasonic waveform data of one ultrasonic probe 110.

The gate setting unit 352 shown in FIG. 24 is a surface reflection ultrasonic wave (first) with respect to the ultrasonic wave waveform data generated for each ultrasonic probe 110-1 to 110-4 by the ultrasonic waveform data generation unit 351. A first detection gate indicating a range for detecting the S echo of the front surface reflected ultrasonic wave 112-S in the first and second embodiments, and a back surface reflected ultrasonic wave (back surface reflection in the first and second embodiments). A process of setting a second detection gate indicating a range for detecting the B echo of the ultrasonic wave 112-B) is performed.

In the example shown in FIG. 25, the gate setting unit 352 has the first detection gate 30121 and the ultrasonic waveform data 3012 generated for the ultrasonic probe 110-1 by the ultrasonic waveform data generation unit 351. The second detection gate 30122 is set. Similarly, in the example shown in FIG. 25, the gate setting unit 352 first detects the ultrasonic waveform data 3014 generated for the ultrasonic probe 110-3 by the ultrasonic waveform data generation unit 351. The gate 30141 and the second detection gate 30142 are set. Here, in the present embodiment, as shown in FIG. 25, the second back surface reflected ultrasonic wave 112-B2 (B2 echo) is detected as the second detection gate for detecting the back surface reflected ultrasonic wave 112-B. However, the present invention is not limited to this form, and for example, a form for detecting the first back surface reflected ultrasonic wave 112-B1 (B1 echo) or a first form is set. Also applicable to the present invention is a mode in which the back surface reflected ultrasonic wave of 3 and the subsequent back surface reflected ultrasonic wave are set.

26 shows the ultrasonic waveform data generated by the ultrasonic waveform data generation unit 351 shown in FIG. 24, the first detection gate and the second detection gate set by the gate setting unit 352 shown in FIG. 24, and FIG. 24. Time detection processing performed by the reception time detection unit 353 shown in FIG. 24, reference waveform data generated by the reference waveform data generation unit 354 shown in FIG. 24, and waveform data subtraction processing performed by the reception time detection unit 353 shown in FIG. 24. It is a figure which shows an example.

FIG. 26A shows the ultrasonic wave waveform data 3021 generated for, for example, the ultrasonic probe 110-1 by the ultrasonic wave waveform data generation unit 351 in the same manner as the ultrasonic wave waveform data 3012 shown in FIG. 25 (a). Shows. Further, the ultrasonic waveform data 3021 shows the first detection gate 30211 and the second detection gate 30212 set in the gate setting unit 352. The first detection gate 30211 and the second detection gate 30212 are similar to the first detection gate 30121 and the second detection gate 30122 shown in FIG. 25 (a).

26 (b) shows the ultrasonic waveform data 3022 generated by the ultrasonic waveform data generation unit 351 for example, for example, for the ultrasonic probe 110-3, in the same manner as the ultrasonic waveform data 3014 shown in FIG. 25 (b). Shows. Further, the ultrasonic waveform data 3022 shows the first detection gate 30221 and the second detection gate 30222 set in the gate setting unit 352. The first detection gate 30221 and the second detection gate 30222 are similar to the first detection gate 30141 and the second detection gate 30142 shown in FIG. 25 (b).

Further, the ultrasonic waveform data 3021 according to the ultrasonic probe 110-1 shown in FIG. 26 (a) has other ultrasonic waves shown in FIG. 26 (b) as in the case described with reference to FIG. 25. It is assumed that the signal of the noise level 30213 is included under the influence of the S echo related to the probe 110-3.

The reception time detection unit 353 shown in FIG. 24 is a first ultrasonic probe (here, super ultrasonic probe) which is one ultrasonic probe included in the plurality of ultrasonic probes 110-1 to 110-4. Regarding the ultrasonic waveform data related to the second ultrasonic probe (here, ultrasonic probes 110-2 to 110-4) excluding the ultrasonic probe 110-1), the first The time when the S echo of the surface reflected ultrasonic wave (surface reflected ultrasonic wave 112-S in the first and second embodiments) is received by the receiving unit 122 is detected from within the range of the detection gate.

Specifically, the reception time detection unit 353 shown in FIG. 24 has the ultrasonic waveform data 3022 related to the ultrasonic probe 110-3 (second ultrasonic probe) shown in FIG. 26 (b). The time when the S echo of the surface reflected ultrasonic wave (surface reflected ultrasonic wave 112-S in the first and second embodiments) is received by the receiving unit 122 is detected from within the range of the detection gate 30221 of 1. Here, the time TS at the intersection where the ultrasonic waveform and the first detection gate 30221 first intersect is detected as the reception time, as in the case described with reference to FIG. 11B in the second embodiment. ..

The reference waveform data generation unit 354 shown in FIG. 24 uses the first ultrasonic probe (here, ultrasonic probe 110-1) at the position of the reception time detected by the reception time detection unit 353. Surface reflected ultrasonic waves (first and first) received via a second ultrasonic probe (here, ultrasonic probes 110-2 to 110-4) superimposed on the ultrasonic waveform data. The reference waveform data in which the reference waveform assuming the noise based on the S echo of the surface reflected ultrasonic wave 112-S) in the second embodiment is arranged is generated.

Specifically, as shown in FIG. 26 (c), the reference waveform data generation unit 354 shown in FIG. 24 is the ultrasonic probe 110-3 shown in FIG. 26 (b) in the reception time detection unit 353. The ultrasonic wave probe 110-3 superimposed on the ultrasonic wave waveform data 3021 according to the ultrasonic probe 110-1 shown in FIG. 26A is superimposed on the position of the reception time detected from the sound wave waveform data 3022 via the ultrasonic probe 110-3. The reference waveform data 3023 is generated by arranging the reference waveform assuming the noise based on the S echo of the surface reflected ultrasonic wave (surface reflected ultrasonic wave 112-S in the first and second embodiments) received.
At this time, the reference waveform data generation unit 354 shown in FIG. 24 uses, for example, the magnitude of the amplitude of the reference waveform and the shape of the reference waveform stored in the storage unit 180 in advance to generate the reference waveform data 3023. Take the form to generate. The present invention is not limited to this embodiment, and for example, the reference waveform data generation unit 354 shown in FIG. 24 is the ultrasonic probe 110-3 (second super) shown in FIG. 26 (b). The magnitude of the amplitude of the reference waveform based on the S-echo waveform of the surface-reflected ultrasonic waves (surface-reflected ultrasonic waves 112-S in the first and second embodiments) of the ultrasonic waveform data 3022 relating to the sound probe). Also applicable to the present invention is to determine the shape of the reference waveform (for example, determine the waveform obtained by attenuating the waveform of the S echo with a predetermined attenuation rate as the reference waveform) and generate the reference waveform data 3023. It is possible.

Further, in the example shown in FIG. 26, an example in which the ultrasonic probe 110-3 was used as a representative of the second ultrasonic probe was shown, but in the measuring device 300 according to the present embodiment, FIG. 24 is shown. As shown in, other ultrasonic probes 110-2 and 110-4 are also applicable as the second ultrasonic probe, and in this case, the ultrasonic probes 110-2 and 110-4. Similarly to the ultrasonic probe 110-3 described above, the reception time is detected by the reception time detection unit 353 shown in FIG. 24, and the reference waveform data is generated by the reference waveform data generation unit 354 shown in FIG. 24. Take the form to generate.

The waveform data subtraction unit 355 shown in FIG. 24 is generated by the reference waveform data generation unit 354 from the ultrasonic waveform data related to the first ultrasonic probe (here, the ultrasonic probe 110-1). Performs the process of subtracting the referenced waveform data.

Specifically, the waveform data subtraction unit 355 shown in FIG. 24 has reference waveform data 3023 shown in FIG. 26 (c) from the ultrasonic waveform data 3021 according to the ultrasonic probe 110-1 shown in FIG. 26 (a). Is processed to be subtracted. The ultrasonic waveform data 3024 shown in FIG. 26D is acquired by the subtraction process by the waveform data subtraction unit 355. FIG. 26 (d) shows that the signal of the noise level 30213 shown in FIG. 26 (a) is reduced to the signal of the noise level 30241 by the subtraction process by the waveform data subtraction unit 355. In the example shown in FIG. 26, the noise level 30213 based on the influence of the S echo related to the other ultrasonic probe shown in FIG. 26 (b) superimposed on the ultrasonic waveform data 3021 shown in FIG. 26 (a). However, the noise level has not reached the level detected by the second detection gate 30212, but for example, when the level of the second detection gate 30212 is set lower or the noise level 30213 becomes higher, the noise level is concerned. The signal of 30213 will be erroneously detected by the second detection gate 30212, and as a result, the wall thickness of the steel pipe 400 will be calculated as an erroneous value. On the other hand, in the measuring device 300 according to the third embodiment, the waveform data subtracting unit 355 performs a process of reducing the noise level signal so that the wall thickness of the steel pipe 400 can be measured with high accuracy. There is.

Further, in the example shown in FIG. 26, an example in which the ultrasonic probe 110-3 was used as a representative of the second ultrasonic probe was shown, but in the measuring device 300 according to the present embodiment, FIG. 24 is shown. As shown in, since other ultrasonic probes 110-2 and 110-4 can also be applied as the second ultrasonic probe, in this case, the waveform data subtraction unit 355 shown in FIG. 24 is shown in FIG. A process of subtracting the reference waveform data related to the respective ultrasonic probes 110-2 and 110-4 from the ultrasonic waveform data 3021 related to the ultrasonic probe 110-1 shown in 26 (a) is performed. Take the form.

The reception time calculation unit 356 shown in FIG. 24 has surface-reflected ultrasonic waves (first and first) from within the range of the first detection gate for the ultrasonic waveform data obtained by performing the subtraction process by the waveform data subtraction unit 355. The first reception time, which is the time when the S echo of the front surface reflected ultrasonic wave 112-S) in the second embodiment is received by the receiving unit 122, and the back surface reflected ultrasonic wave (first and) from within the range of the second detection gate. The second reception time, which is the time when the B echo of the back surface reflected ultrasonic wave 112-B) in the second embodiment is received by the reception unit 122, is calculated.

Specifically, the reception time calculation unit 356 shown in FIG. 24 has, for example, the first reception time and the second reception time from within the range of the first detection gate 30211 for the ultrasonic waveform data 3024 shown in FIG. 26 (d). The second reception time is calculated from the range of the detection gate 30212 of. Here, as in the case described with reference to FIG. 11B in the second embodiment, the time TS of the intersection where the ultrasonic waveform and the first detection gate 30211 first intersect is the first reception time. Also, the time TB2 at the intersection where the ultrasonic waveform and the second detection gate 30212 first intersect is calculated as the second reception time.

The wall thickness calculation unit 357 shown in FIG. 24 performs a process of calculating the wall thickness of the steel pipe 400 based on the ultrasonic waveform data obtained by performing the process of subtracting by the waveform data subtraction unit 355. More specifically, the wall thickness calculation unit 357 is based on the first reception time and the second reception time calculated by the reception time calculation unit 356 and the velocity of the ultrasonic wave propagating inside the steel pipe 400. , Perform a process of calculating the wall thickness of the steel pipe 400. Here, in the present embodiment, it is assumed that the data of the velocity of the ultrasonic wave propagating inside the steel pipe 400 is stored in the storage unit 180 in advance. Here, since the specific wall thickness calculation method by the wall thickness calculation unit 357 is the same as the wall thickness calculation method by the wall thickness calculation unit 255 in the second embodiment, the description thereof will be omitted.

The display control unit 358 shown in FIG. 24 controls, for example, to display the wall thickness of the steel pipe 400 calculated by the wall thickness calculation unit 357 on the display unit 190.

Next, a processing procedure of a method for measuring the wall thickness of the steel pipe 400, which is the material to be inspected, will be described.
FIG. 27 is a flowchart showing an example of a processing procedure of a method for measuring the wall thickness of a steel pipe 400 by the measuring device 300 according to the third embodiment of the present invention.

First, in step S3101 of FIG. 27, the transmission unit 121 controls the surface of the steel pipe to be inspected via the ultrasonic probes 110-1 to 110-4 under the control of the control / processing unit 350. Ultrasonic wave 111 is transmitted toward 400S.

Subsequently, in step S3102 of FIG. 27, the receiving unit 122 controls the ultrasonic wave 112 from the steel pipe 400 via the ultrasonic probes 110-1 to 110-4 under the control of the control / processing unit 350. To receive.

Subsequently, in step S3103 of FIG. 27, the ultrasonic waveform data generation unit 351 is amplified by the amplification unit 130 for each ultrasonic probe 110-1 to 110-4 (furthermore, the A / D conversion unit). Generates ultrasonic waveform data showing the amplitude of the ultrasonic wave 112 from the steel pipe 400 (after A / D conversion in 140) in chronological order.

Subsequently, in step S3104 of FIG. 27, the gate setting unit 352 refers to the surface reflected ultrasonic wave (surface reflected ultrasonic wave) with respect to the ultrasonic wave waveform data generated for each ultrasonic probe 110-1 to 110-4 in step S3103. A first detection gate indicating a range for detecting the S echo of the front surface reflected ultrasonic wave 112-S in the first and second embodiments, and a back surface reflected ultrasonic wave (back surface in the first and second embodiments). A process of setting a second detection gate indicating a range for detecting the B echo of the reflected ultrasonic wave 112-B) is performed.

Subsequently, in step S3105 of FIG. 27, the control / processing unit 350 sets the number M of the ultrasonic probe 110 based on the input information input from the information input unit 160, for example. Here, in the example shown in FIG. 24, 4 is set as the number M of the ultrasonic probe 110.

Subsequently, in step S3106 of FIG. 27, the control / processing unit 350 sets 1 to the variable m indicating the first ultrasonic probe 110 to be processed.

Subsequently, in step S3107 of FIG. 27, the reception time detection unit 353 was set in step S3104 for the ultrasonic waveform data related to the second ultrasonic probe excluding the first ultrasonic probe m. The time when the S echo of the surface reflected ultrasonic wave (surface reflected ultrasonic wave 112-S in the first and second embodiments) is received by the receiving unit 122 is detected from within the range of the first detection gate.

Here, in order to make the explanation easy to understand, for example, the ultrasonic waveform data 3021 shown in FIG. 26 (a) is used as the ultrasonic waveform data related to the first ultrasonic probe m, and the ultrasonic waveform data shown in FIG. 26 (b) is used. The sound wave waveform data 3022 is used as the ultrasonic wave waveform data related to the second ultrasonic probe. The same applies to the following description. In this case, specifically, in step S3107 of FIG. 27, the reception time detection unit 353 transfers the surface reflected ultrasonic waves from within the range of the first detection gate 30221 with respect to the ultrasonic waveform data 3022 shown in FIG. 26 (b). The time when the S echo is received by the receiving unit 122 is detected.

Subsequently, in step S3108 of FIG. 27, the reference waveform data generation unit 354 superimposes the ultrasonic waveform data related to the first ultrasonic probe m on the position of the reception time detected in step S3107. The reference waveform data in which the reference waveform assuming the noise based on the S echo of the surface reflected ultrasonic wave received through the ultrasonic probe of 2 is generated is generated.

Specifically, for example, in step S3108 of FIG. 27, the reference waveform data generation unit 354 superimposes on the position of the reception time detected in step S3107 in the ultrasonic waveform data 3021 shown in FIG. 26 (a). The reference waveform data 3023 shown in FIG. 26C is generated by arranging the reference waveform assuming noise based on the S echo of the surface reflected ultrasonic wave received through the ultrasonic probe of FIG. 26 (c).

Subsequently, in step S3109 of FIG. 27, the waveform data subtraction unit 355 performs a process of subtracting the reference waveform data generated in step S3108 from the ultrasonic waveform data related to the first ultrasonic probe m.

Specifically, for example, in step S3109 of FIG. 27, the waveform data subtraction unit 355 performs a process of subtracting the reference waveform data 3023 shown in FIG. 26 (c) from the ultrasonic waveform data 3021 shown in FIG. 26 (a). conduct. By this subtraction process, the ultrasonic waveform data 3024 shown in FIG. 26 (d) is acquired.

Subsequently, in step S3110 of FIG. 27, the reception time calculation unit 356 applies the ultrasonic waveform data obtained by performing the subtraction process of step S3109 from within the range of the first detection gate to the surface reflected ultrasonic wave S. The first reception time, which is the time when the echo is received by the reception unit 122, and the second reception time, which is the time when the B echo of the backside reflected ultrasonic wave is received by the reception unit 122 from within the range of the second detection gate. Is calculated.

Specifically, for example, in step S3110 of FIG. 27, the reception time calculation unit 356 regarding the ultrasonic waveform data 3024 shown in FIG. 26 (d), S of the surface reflected ultrasonic wave from within the range of the first detection gate 30211. The first reception time, which is the time when the echo is received by the reception unit 122, and the second reception time, which is the time when the B echo of the backside reflected ultrasonic wave is received by the reception unit 122 from within the range of the second detection gate 30212. And calculate.

Subsequently, in step S3111 of FIG. 27, the wall thickness calculation unit 357 is based on the first reception time and the second reception time calculated in step S3110 and the velocity of the ultrasonic wave propagating inside the steel pipe 400. Then, a process of calculating the wall thickness of the steel pipe 400 is performed. Here, since the specific wall thickness calculation method by the wall thickness calculation unit 357 is the same as the wall thickness calculation method by the wall thickness calculation unit 255 in the second embodiment, the description thereof will be omitted.

Subsequently, in step S3112 of FIG. 27, the control / processing unit 350 determines whether or not the variable m indicating the first ultrasonic probe 110 is smaller than the number M of the ultrasonic probes 110.

As a result of the determination in step S3112 in FIG. 27, if the variable m indicating the first ultrasonic probe 110 is smaller than the number M of the ultrasonic probes 110 (S3112 / YES), the processing is still performed. It is determined that there is no ultrasonic probe 110, and the process proceeds to step S3113 in FIG. 27.
Proceeding to step S3113 of FIG. 27, the control / processing unit 350 adds 1 to the variable m indicating the first ultrasonic probe 110. After that, the process returns to step S3107 of FIG. 27, and the changed first ultrasonic probe m is processed after step S3107. In this embodiment, as shown in FIG. 24, since the four ultrasonic probes 110-1 to 110-4 are provided, the series of processes in steps S3107 to S3113 in FIG. 27 is performed four times. It will be repeated.

On the other hand, as a result of the determination in step S3112 of FIG. 27, when the variable m indicating the first ultrasonic probe 110 is not smaller than the number M of the ultrasonic probes 110 (S3112 / NO), all. It is determined that the ultrasonic probe 110 has been processed, and the process proceeds to step S3114 in FIG. 27.
Proceeding to step S3114 of FIG. 27, the display control unit 358 controls the display unit 190 to display the wall thickness of the steel pipe 400 calculated in step S3111. After that, the control / processing unit 350 performs a process of storing the wall thickness data of the steel pipe 400 calculated in step S3111 in the storage unit 180, if necessary.

Subsequently, in step S3115 of FIG. 27, the control / processing unit 350 determines whether or not to end the wall thickness measurement of the steel pipe 400 to be inspected, for example, based on the input information input from the information input unit 160. to decide.

If the wall thickness measurement of the steel pipe 400 is not completed as a result of the determination in step S3115 of FIG. 27 (S3115 / NO), the process returns to step S3101 of FIG. 27, and the processing after step S3101 is performed again.

On the other hand, as a result of the determination in step S3115 of FIG. 27, when the wall thickness measurement of the steel pipe 400 is finished (S3115 / YES), the processing of the flowchart of FIG. 27 is finished.

As described above, the measuring device 300 according to the third embodiment generates ultrasonic waveform data showing the amplitude of the ultrasonic 112 from the steel tube 400 in chronological order for each ultrasonic probe 110. , The first ultrasonic waveform data relating to the second ultrasonic probe excluding the first ultrasonic probe which is one ultrasonic probe included in the plurality of ultrasonic probes 110. A second second, which detects the time when the surface reflected ultrasonic wave is received by the receiving unit 122 from within the range of the detection gate and superimposes it on the position of the detected time in the ultrasonic waveform data related to the first ultrasonic probe. Reference waveform data is generated by arranging reference waveforms assuming noise based on surface reflected ultrasonic waves received via the ultrasonic probe, and reference waveform data is obtained from the ultrasonic waveform data related to the first ultrasonic probe. Is performed, and the ultrasonic waveform data obtained by performing the subtraction process is the first time when the surface reflected ultrasonic waves are received by the receiving unit 122 from within the range of the first detection gate. The reception time and the second reception time, which is the time when the backside reflected ultrasonic wave is received by the reception unit 122 from within the range of the second detection gate, are calculated, and the first reception time, the second reception time, and the steel pipe 400 are calculated. The wall thickness of the steel pipe 400 is calculated based on the velocity of the ultrasonic waves propagating inside the pipe 400.
According to such a configuration, when the wall thickness of the steel pipe 400 is measured at a plurality of places, the surface reflection received by the ultrasonic waveform data of the first ultrasonic probe via the second ultrasonic probe is obtained. Even when a noise signal based on ultrasonic waves is superimposed, processing is performed to reduce the noise, so that it is possible to measure the wall thickness of a plurality of locations of the steel pipe 400 with high accuracy.

(Fourth Embodiment)
Next, a fourth embodiment of the present invention will be described.
A fourth embodiment of the present invention includes at least two measuring devices among the measuring device 100 according to the first embodiment, the measuring device 200 according to the second embodiment, and the measuring device 300 according to the third embodiment. It is a form of a measurement system including. In the present invention, as long as it is a measuring system including at least two measuring devices among the measuring device 100, the measuring device 200, and the measuring device 300, it can be applied to any combination of measuring devices. Among the measurement systems related to the combination of measuring devices, typical ones will be described below as aspects 1 to 3.

<Aspect 1 of the fourth embodiment>
First, the first aspect of the fourth embodiment of the present invention will be described.

FIG. 28 is a diagram showing an example of a schematic configuration of the measurement system 10-1 according to the first embodiment of the fourth embodiment of the present invention.

In this measurement system 10-1, as shown in FIG. 28, the measuring device 100 according to the first embodiment and the measuring device 200 according to the second embodiment are communicated and connected via the computer network N. There is. At this time, as the measuring device 200 according to the second embodiment, any of the measuring devices 200-1 to 200-3 may be applied. Further, a configuration common to the component of the measuring device 100 according to the first embodiment shown in FIG. 1 and the component of the measuring device 200 according to the second embodiment shown in FIGS. 10, 19 or 22. All or part of the parts can be integrated as needed. Further, the measuring system 10-1 including the measuring device 100 according to the first embodiment and the measuring device 200 according to the second embodiment shown in FIG. 28 is formed as, for example, one measuring device. It may be one.

FIG. 29 is a schematic diagram showing an example of a processing procedure of a method for measuring the wall thickness of a steel pipe 400 by the measurement system 10-1 according to the first embodiment of the fourth embodiment of the present invention.

First, in the measurement system 10-1, as shown in FIG. 29, the processing of the measuring device 100 according to the first embodiment is performed. Specifically, the processes from steps S110 to S1112 in FIG. 7 are performed, and the B scope image 1031 shown in FIG. 29 (a), the binary image 1032 shown in FIG. 29 (b), and FIG. 29 (c) are shown. A binary image obtained as a result of processing by the binary image processing unit 154 and a linearized image 1034 shown in FIG. 29 (d) are generated. Since FIGS. 29 (a) to 29 (d) are the same as those shown in FIG. 4, the description thereof will be omitted. After that, when the first detection gate 1041 and the second detection gate 1042 are set in the gate setting unit 156 shown in FIG. 1, the result is as shown in FIG. 29 (e).

Next, in the measurement system 10-1, as shown in FIG. 29, the processing of the measuring device 200 according to the second embodiment is performed. Here, in the example shown in FIG. 29, a case where the processing of the measuring device 200-3 according to the second embodiment is performed is shown. When one line is selected from, for example, the information input unit 160 or the like with respect to the image of FIG. 29 (e), the gate setting unit 252 of the measuring device 200-3 according to the second embodiment has the gate setting unit 252 of FIG. 29 (f). The first detection gate and the second detection gate are set based on the first detection gate 1041 and the second detection gate 1042 described above for the ultrasonic waveform data of the above. Next, the measuring device 200-3 according to the second embodiment performs the processes of steps S2301 to S2403 of FIG. 23, thereby FIG. 29 (g), FIG. 29 (h), FIG. 29 (i) and FIG. The process shown in 29 (j) is performed. After that, the measuring device 200-3 according to the second embodiment measures the wall thickness of the steel pipe 400 by performing the processes of steps S2404 to S2212 in FIG. 23.

According to the measurement system 10-1 according to the first embodiment of the fourth embodiment, the measuring device 100 according to the first embodiment and the measuring device 200 according to the second embodiment are included in the configuration. Even in an environment with various disturbances, it is possible to measure the wall thickness of a plurality of places to be inspected with higher accuracy.

<Aspect 2 of the fourth embodiment>
Next, the second aspect of the fourth embodiment of the present invention will be described.

FIG. 30 is a diagram showing an example of a schematic configuration of the measurement system 10-2 according to the second embodiment of the fourth embodiment of the present invention.

In this measurement system 10-2, as shown in FIG. 30, the measuring device 100 according to the first embodiment and the measuring device 300 according to the third embodiment are communicated and connected via the computer network N. There is. At this time, a common component is required between the component of the measuring device 100 according to the first embodiment shown in FIG. 1 and the component of the measuring device 300 according to the third embodiment shown in FIG. 24. All or part of it can be integrated according to the situation. Further, the measuring system 10-2 including the measuring device 100 according to the first embodiment and the measuring device 300 according to the third embodiment shown in FIG. 30 is formed as, for example, one measuring device. It may be one.

FIG. 31 is a schematic view showing an example of a processing procedure of a method for measuring the wall thickness of a steel pipe 400 by the measurement system 10-2 according to the second embodiment of the fourth embodiment of the present invention.

First, in the measurement system 10-2, as shown in FIG. 31, the ultrasonic probe 110-1 (Ch1) shown in FIG. 24 is processed by the measuring device 100 according to the first embodiment. Specifically, the process from steps S1101 to S1111 in FIG. 7 is performed, and the binary image 4022 obtained as a result of the processing by the B scope image 4021 and the binary image processing unit 154 shown in FIG. 31, the upper end position ( The detection process 4023 of S echo) is performed.

At this time, in the measurement system 10-2, as shown in FIG. 31, the ultrasonic probe 110-1 (Ch1) shown in FIG. 24 is processed by the measuring device 300 according to the third embodiment. Specifically, the processes from steps S310 to S3108 in FIG. 27 are performed to generate a reference image 4024 related to Ch2 based on the reference waveform data. Next, the measuring device 300 according to the third embodiment performs a process of subtracting the reference image 4024 from the B scope image 4021 in the process of step S3109 of FIG. 27.

Next, in the measurement system 10-2, as shown in FIG. 31, the measuring device 100 according to the first embodiment has an upper end position (S echo) detected by the detection process 4023 in the process of step S1112 in FIG. Generates a linearized image 4027 related to Ch1 by shifting the data of the B-scope image 4021 subjected to the subtraction process up and down so that the position is a predetermined position. After that, for example, the measuring device 100 according to the first embodiment measures the wall thickness of the steel pipe 400 by performing the processes from steps S1113 to S1117 in FIG. 7.

Similarly, in the measurement system 10-2, as shown in FIG. 31, the ultrasonic probe 110-2 (Ch2) shown in FIG. 24 is processed by the measuring device 100 according to the first embodiment. Specifically, the process from steps S1101 to S1111 in FIG. 7 is performed, and the binary image 4032 obtained as a result of the processing by the B scope image 4031 and the binary image processing unit 154 shown in FIG. 31, the upper end position ( The detection process 4033 of S echo) is performed.

At this time, in the measurement system 10-2, as shown in FIG. 31, the ultrasonic probe 110-2 (Ch2) shown in FIG. 24 is processed by the measuring device 300 according to the third embodiment. Specifically, the processes from steps S310 to S3108 in FIG. 27 are performed to generate a reference image 4034 related to Ch1 based on the reference waveform data. Next, the measuring device 300 according to the third embodiment performs a process of subtracting the reference image 4034 from the B scope image 4031 in the process of step S3109 of FIG. 27.

Next, in the measurement system 10-2, as shown in FIG. 31, the measuring device 100 according to the first embodiment has an upper end position (S echo) detected by the detection process 4033 in the process of step S1112 in FIG. Generates a linearized image 4037 related to Ch2 in which the data of the B-scope image 4031 subjected to the subtraction process is shifted up and down so that is in a predetermined position. After that, for example, the measuring device 100 according to the first embodiment measures the wall thickness of the steel pipe 400 by performing the processes from steps S1113 to S1117 in FIG. 7.

According to the measurement system 10-2 according to the second embodiment of the fourth embodiment, the measuring device 100 according to the first embodiment and the measuring device 300 according to the third embodiment are included in the configuration. Even in an environment with various disturbances, it is possible to measure the wall thickness of a plurality of places to be inspected with higher accuracy.

<Aspect 3 of the fourth embodiment>
Next, the third aspect of the fourth embodiment of the present invention will be described.

FIG. 32 is a diagram showing an example of a schematic configuration of the measurement system 10-3 according to the third embodiment of the fourth embodiment of the present invention.

As shown in FIG. 32, the measuring system 10-3 includes a measuring device 100 according to a first embodiment, a measuring device 200 according to a second embodiment, and a measuring device 300 according to a third embodiment. However, they are communicated with each other via the computer network N. At this time, as the measuring device 200 according to the second embodiment, any of the measuring devices 200-1 to 200-3 may be applied. Further, the component of the measuring device 100 according to the first embodiment shown in FIG. 1, the component of the measuring device 200 according to the second embodiment shown in FIGS. 10, 19 or 22, and the component of the measuring device 200 are shown in FIG. 24. With respect to the constituent parts common to the constituent parts of the measuring device 300 according to the third embodiment, all or a part thereof can be integrated as necessary. Further, a measuring system 10-3 including the measuring device 100 according to the first embodiment, the measuring device 200 according to the second embodiment, and the measuring device 300 according to the third embodiment shown in FIG. 32. May be formed as, for example, one measuring device.

As a processing procedure of the wall thickness measuring method of the steel pipe 400 by the measuring system 10-3, first, the measuring system 10-1 shown in FIG. 29 is processed. Next, the processing of the measurement system 10-2 shown in FIG. 31 is performed.

According to the measurement system 10-3 according to the third embodiment of the fourth embodiment, the measuring device 100 according to the first embodiment, the measuring device 200 according to the second embodiment, and the measuring device according to the third embodiment. Since it is configured to include 300, it is possible to measure the wall thickness of a plurality of places to be inspected with higher accuracy even in an environment with various disturbances.

(Other embodiments)
In the measuring device 100 according to the first embodiment and the measuring device 300 according to the third embodiment described above, the wall thickness of the reference material 410 is taken into consideration as in the measuring device 200 according to the second embodiment described above. Then, the final wall thickness of the steel pipe 400 may be calculated.

Further, as another embodiment, software (program) for executing the processing of the flowchart shown in FIGS. 7, 17, 18, 21, 23, and 27 is installed in a system or various storage media via a network or various storage media. The present invention also includes a form in which a program is supplied to a device and the system or a computer (or CPU, MPU, etc.) of the device reads and executes a program. The present invention also includes this program and a computer-readable storage medium that stores the program.

It should be noted that the above-described embodiments of the present invention are merely examples of embodiment of the present invention, and the technical scope of the present invention should not be construed in a limited manner by these. Is. That is, the present invention can be implemented in various forms without departing from the technical idea or its main features.

100, 200, 300: Measuring device, 110: Ultrasonic probe, 111, 112: Ultrasonic, 120: Transmitter / receiver, 121: Transmitter, 122: Receiver, 130: Amplifier, 140: A / D conversion Unit, 150, 250, 350: Control / processing unit, 151,251,351: Ultrasonic waveform data generation unit, 152: B scope image generation unit, 153: Binary image generation unit, 154: Binary image processing unit, 155: Linearized image generation unit, 156,252,352: Gate setting unit, 157: Position detection unit, 158,255,357: Wall thickness calculation unit, 159,256,358: Display control unit, 160: Information input unit , 170: Communication unit, 180: Storage unit, 190: Display unit, 253: Ultrasonic waveform data processing unit, 2531: Histogram creation unit, 2532: Amplification degree calculation unit, 2533: Window function processing unit, 254,356: Reception Time calculation unit, 353: Reception time detection unit, 354: Reference waveform data generation unit, 355: Waveform data subtraction unit, 400: Steel pipe, 400S: Steel pipe front surface, 400B: Steel pipe back surface

Claims (22)

A measuring device that measures the wall thickness of the material to be inspected.
A transmission means for transmitting ultrasonic waves toward the surface of the material to be inspected at each measurement point of the material to be inspected.
For each measurement point, a receiving means for receiving the ultrasonic wave from the material to be inspected, and a receiving means.
An ultrasonic waveform data generation means for generating ultrasonic waveform data showing the amplitude of ultrasonic waves from the material to be inspected in chronological order.
A two-dimensional array brightness data generation means that converts the amplitude value of the ultrasonic waveform data generated by the ultrasonic waveform data generation means into a brightness value and generates two-dimensional array brightness data.
A two-dimensional array binary data generation means that generates two-dimensional array binary data by binarizing the two-dimensional array brightness data using a predetermined binarization threshold.
A two-dimensional array binary data processing means for performing a process of removing a single block region satisfying a predetermined condition from a single block region in which the region of one of the two values in the two-dimensional array binary data is a single block. ,
Linear image generation means and
A wall thickness calculating means for calculating the wall thickness of the material to be inspected based on the two-dimensional array binary data obtained as a result of processing by the two-dimensional array binary data processing means.
Have,
The two-dimensional array brightness data generation means generates a B-scope image in which the wall thickness direction of the material to be inspected is from top to bottom as the two-dimensional array brightness data.
The two-dimensional array binary data generation means generates a binary image by binarizing the B-scope image as the two-dimensional array binary data using the predetermined binarization threshold value.
The two-dimensional array binary data processing means performs a process of removing image particles of the binary image as the one-lump region.
The linearized image generation means detects the position of the upper end of the image particle in the binary image obtained as a result of processing by the two-dimensional array binary data processing means, and the position of the upper end is a straight line at a predetermined position. A linearized image in which the data of the B scope image is shifted up and down is generated so as to be
The wall thickness calculating means is a measuring device that calculates the wall thickness of the material to be inspected at each measurement point using the linearized image. It propagates inside the inspected material and a first detection gate indicating a range for detecting the surface reflected ultrasonic wave which is the ultrasonic wave reflected on the surface of the inspected material with respect to the linearized image. A gate setting means for setting a second detection gate indicating a range for detecting the back surface reflected ultrasonic wave, which is the ultrasonic wave reflected on the back surface of the material to be inspected, and a gate setting means.
For each measurement point, the first position corresponding to the time when the surface reflected ultrasonic wave is received by the receiving means from within the range of the first detection gate, and the range of the second detection gate. It further has a position detecting means for detecting a second position corresponding to the time when the back surface reflected ultrasonic wave is received by the receiving means.
The wall thickness calculating means is the material to be inspected based on the first position and the second position and the velocity of the ultrasonic wave propagating inside the material to be inspected at each measurement point. The measuring device according to claim 1, which calculates the wall thickness of the above. The measuring device according to claim 2 , further comprising a display control means for controlling the display of the linearized image in which the first position and the second position are colored are displayed on the display unit. The first position is the predetermined position in the linearized image.
2. The second position is a position within the range of the second detection gate in the linearized image, and is a position of the upper end which becomes the one value when the binarization process is performed . Or the measuring device according to 3. As the second detection gate, the gate setting means is configured to be capable of setting a range for detecting each of at least two backside reflected ultrasonic waves having different reflection times on the back surface of the material to be inspected. ,
When the gate setting means sets a detection gate indicating a range for detecting the back surface reflected ultrasonic wave of one of the two back surface reflected ultrasonic waves as the second detection gate in the gate setting means. In addition, when the wall thickness value of the material to be inspected exceeds the reference wall thickness value calculated based on the second detection gate, the two back surface reflected ultrasonic waves are used as the second detection gate in the gate setting means. When a detection gate indicating a range for detecting the back surface reflected ultrasonic wave of the other of them is set, the wall thickness value of the material to be inspected calculated based on the second detection gate is taken into consideration, and the inspected material is inspected. The measuring device according to any one of claims 2 to 4, which calculates the final wall thickness of the material. At each measurement point of the material to be inspected, a transmission means for transmitting ultrasonic waves toward the surface of the material to be inspected and a receiving means for receiving the ultrasonic waves from the material to be inspected at each measurement point. This is a measuring method using a measuring device for measuring the wall thickness of the material to be inspected.
An ultrasonic waveform data generation step for generating ultrasonic waveform data showing the amplitude of ultrasonic waves from the material to be inspected in chronological order, and
A two-dimensional array brightness data generation step that converts the amplitude value of the ultrasonic waveform data generated in the ultrasonic waveform data generation step into a brightness value and generates two-dimensional array brightness data.
A two-dimensional array binary data generation step that generates two-dimensional array binary data by binarizing the two-dimensional array luminance data using a predetermined binarization threshold.
A two-dimensional array binary data processing step for performing a process of removing a single block region satisfying a predetermined condition from a single block region in which the region of one of the two values in the two-dimensional array binary data is a single block. ,
The linearized image generation step and
Based on the two-dimensional array binary data obtained as a result of processing by the two-dimensional array binary data processing step, said possess a thickness calculating step of calculating the thickness of the test material,
In the two-dimensional array brightness data generation step, a B-scope image in which the wall thickness direction of the material to be inspected is from top to bottom is generated as the two-dimensional array brightness data.
In the two-dimensional array binary data generation step, the B-scope image is binarized using the predetermined binarization threshold as the two-dimensional array binary data to generate a binary image.
In the two-dimensional array binary data processing step, a process of removing image particles of the binary image as the one-lump region is performed.
In the linearized image generation step, the position of the upper end of the image particles is detected in the binary image obtained as a result of the processing by the two-dimensional array binary data processing step, and the position of the upper end is a predetermined position. A linearized image is generated by shifting the data of the B scope image up and down so as to be a straight line.
In the wall thickness calculation step, a measurement method for calculating the wall thickness of the material to be inspected for each measurement point using the linearized image. A measuring device that measures the wall thickness of the material to be inspected.
A transmission means for transmitting ultrasonic waves toward the surface of the material to be inspected via an ultrasonic probe, and a transmission means.
A receiving means for receiving the ultrasonic wave from the material to be inspected via the ultrasonic probe, and a receiving means.
For detecting surface reflected ultrasonic waves, which are the ultrasonic waves reflected on the surface of the material to be inspected, with respect to the first ultrasonic wave waveform data showing the amplitude of the ultrasonic waves from the material to be inspected in chronological order. A first detection gate indicating a range and a second detection indicating a range for detecting the backside reflected ultrasonic wave which is the ultrasonic wave propagating inside the material to be inspected and reflected on the back surface of the material to be inspected. Gate setting means to set the gate and
An ultrasonic waveform that performs a process of changing the amplitude of data within the range of at least one of the first detection gate and the second detection gate in the first ultrasonic waveform data. Data processing means and
With respect to the ultrasonic waveform data obtained by performing the processing of changing the amplitude by the ultrasonic waveform data processing means, the time when the surface reflected ultrasonic wave is received by the receiving means from within the range of the first detection gate. The reception time calculation means for calculating the first reception time, which is the time when the back surface reflected ultrasonic wave is received by the reception means from within the range of the second detection gate, and the second reception time.
A wall thickness calculating means for calculating the wall thickness of the material to be inspected based on the first reception time, the second reception time, and the speed of the ultrasonic wave propagating inside the material to be inspected.
Have,
The ultrasonic waveform data processing means is
The amplitude of the first ultrasonic waveform data is subjected to a process of multiplying the data within the range of at least one of the first detection gate and the second detection gate by a window function. Window function processing means to change,
In the window function processing means, a histogram creating means for creating a first histogram related to the amplitude of the ultrasonic wave with respect to the data obtained by performing the processing of multiplying the window function, and
It has an amplification degree calculation means for calculating an amplification degree at which the count value of a specific bin in the first histogram becomes a predetermined value, and the first supersonic wave is based on the amplification degree calculated by the amplification degree calculation means. The second ultrasonic waveform data is acquired by performing the process of changing the amplitude of the ultrasonic waveform data.
The reception time calculation means is a measuring device that calculates the first reception time and the second reception time of the second ultrasonic waveform data. The predetermined value is
An ultrasonic wave is transmitted from the transmitting means toward the surface of the reference material as a reference of the material to be inspected via the ultrasonic probe, and the receiving means transmits the ultrasonic wave via the ultrasonic probe. With respect to the third ultrasonic wave waveform data in which the ultrasonic wave from the reference material is received and the amplitude of the ultrasonic wave from the reference material is shown in time series in the gate setting means, the first detection gate is used. The second detection gate is set, and the second detection gate is set.
When the second histogram relating to the amplitude of the ultrasonic wave is created within the range of the detection gate for which the first histogram was created for the third ultrasonic waveform data in the histogram creating means, the second histogram is created. The measuring device according to claim 7 , which is a count value of a specific bin in a histogram. Further having a conversion means for converting an ultrasonic wave from the material to be inspected received by the receiving means from an analog signal to a digital signal.
The measuring device according to claim 7 or 8 , wherein the specific bin is a bin including an upper limit value or a lower limit value of the conversion means. The window function processing means aligns a predetermined position within the range of the detection gate obtained by multiplying the window function in the first ultrasonic waveform data with a reference position of the window function, and multiplies the window function. The measuring device according to claim 7, wherein the matching process is performed. The predetermined position is the position of the maximum amplitude within the range of the detection gate multiplied by the window function in the first ultrasonic waveform data, or the window function in the first ultrasonic waveform data is multiplied. The measuring device according to claim 10 , which is the position of the maximum value of the envelope when the absolute value of the amplitude within the range of the detection gate is taken. A transmitting means for transmitting ultrasonic waves toward the surface of the material to be inspected via an ultrasonic probe and a receiving means for receiving the ultrasonic waves from the material to be inspected via the ultrasonic probe. It is a measuring method by a measuring device for measuring the wall thickness of the material to be inspected.
For detecting surface reflected ultrasonic waves, which are the ultrasonic waves reflected on the surface of the material to be inspected, with respect to the first ultrasonic wave waveform data showing the amplitude of the ultrasonic waves from the material to be inspected in chronological order. A first detection gate indicating a range and a second detection indicating a range for detecting the backside reflected ultrasonic wave which is the ultrasonic wave propagating inside the material to be inspected and reflected on the back surface of the material to be inspected. The gate setting step to set the gate and
An ultrasonic waveform that performs a process of changing the amplitude of data within the range of at least one of the first detection gate and the second detection gate in the first ultrasonic waveform data. Data processing steps and
With respect to the ultrasonic waveform data obtained by performing the processing of changing the amplitude in the ultrasonic waveform data processing step, the time when the surface reflected ultrasonic wave is received by the receiving means from within the range of the first detection gate. The reception time calculation step for calculating the first reception time, which is the time when the back surface reflected ultrasonic wave is received by the reception means from within the range of the second detection gate, and the second reception time, which is the time when the back surface reflected ultrasonic wave is received by the reception means.
A wall thickness calculation step for calculating the wall thickness of the material to be inspected based on the first reception time, the second reception time, and the speed of the ultrasonic wave propagating inside the material to be inspected. Yes, and
In the ultrasonic waveform data processing step,
The amplitude of the first ultrasonic waveform data is subjected to a process of multiplying the data within the range of at least one of the first detection gate and the second detection gate by a window function. To change the window function processing step and
In the window function processing step, a histogram creation step for creating a first histogram related to the amplitude of the ultrasonic wave for the data obtained by performing the processing of multiplying the window function, and a histogram creation step.
Amplification degree calculation step for calculating the amplification degree at which the count value of a specific bin in the first histogram becomes a predetermined value.
The second ultrasonic waveform data is acquired by performing a process of changing the amplitude of the first ultrasonic waveform data based on the amplification degree calculated in the amplification degree calculation step.
In the reception time calculation step, a measurement method for calculating the first reception time and the second reception time of the second ultrasonic waveform data. A measuring device that measures the wall thickness of the material to be inspected.
A transmission means for transmitting ultrasonic waves toward the surface of the material to be inspected via each ultrasonic probe in a plurality of ultrasonic probes arranged for the material to be inspected.
A receiving means for receiving the ultrasonic wave from the material to be inspected via each ultrasonic probe, and a receiving means.
An ultrasonic waveform data generation means for generating ultrasonic waveform data showing the amplitude of ultrasonic waves from the material to be inspected in chronological order for each ultrasonic probe.
The ultrasonic waveform data related to the second ultrasonic probe excluding the first ultrasonic probe, which is one ultrasonic probe included in the plurality of ultrasonic probes, is to be inspected. A reception time detecting means for detecting the time when the surface reflected ultrasonic wave, which is the ultrasonic wave reflected on the surface of the material, is received by the receiving means, and a receiving time detecting means.
The surface reflection received via the second ultrasonic probe, which is superimposed on the ultrasonic waveform data of the first ultrasonic probe at the position of the time detected by the reception time detecting means. A reference waveform data generation means for generating reference waveform data in which reference waveforms assuming noise based on ultrasonic waves are arranged, and
A waveform data subtracting means that performs a process of subtracting the reference waveform data from the ultrasonic waveform data related to the first ultrasonic probe.
On the basis of the ultrasonic waveform data obtained by performing the processing of the subtraction by the waveform data subtraction means, said having a thickness calculation means for calculating the thickness of the test material, the measuring device. A first detection gate indicating a range for detecting the surface reflected ultrasonic wave with respect to the ultrasonic wave waveform data generated for each ultrasonic probe by the ultrasonic waveform data generation means, and the subject. A gate setting means for setting a second detection gate indicating a range for detecting the backside reflected ultrasonic wave which is the ultrasonic wave propagating inside the inspection material and reflected on the back surface of the inspection material, and a gate setting means.
The first time is the time when the surface reflected ultrasonic wave is received by the receiving means from within the range of the first detection gate with respect to the ultrasonic waveform data obtained by performing the subtraction process by the waveform data subtracting means. Further has a reception time calculation means for calculating the reception time of the above and the second reception time which is the time when the back surface reflected ultrasonic wave is received by the reception means from within the range of the second detection gate.
The wall thickness calculating means calculates the wall thickness of the material to be inspected based on the first reception time and the second reception time and the velocity of the ultrasonic wave propagating inside the material to be inspected. The measuring device according to claim 13. The measuring device according to claim 13 or 14 , wherein the reference waveform data generating means generates the reference waveform data by using a preset amplitude magnitude of the reference waveform and the shape of the reference waveform. The reference waveform data generation means obtains the magnitude of the amplitude of the reference waveform and the shape of the reference waveform based on the waveform of the surface reflected ultrasonic wave of the ultrasonic waveform data related to the second ultrasonic probe. The measuring device according to claim 13 or 14 , which determines and generates the reference waveform data. When there are a plurality of the second ultrasonic probes,
The reception time detecting means detects the time when the surface reflected ultrasonic wave is received by the receiving means for each of the ultrasonic waveform data related to the second ultrasonic probe.
The reference waveform data generation means generates the reference waveform data related to each of the second ultrasonic probes, and generates the reference waveform data.
The waveform data subtracting means performs a process of subtracting the reference waveform data related to the second ultrasonic probe from the ultrasonic waveform data related to the first ultrasonic probe. , The measuring device according to any one of claims 13 to 16. A transmission means for transmitting ultrasonic waves toward the surface of the material to be inspected via each ultrasonic probe in a plurality of ultrasonic probes arranged with respect to the material to be inspected, and each ultrasonic probe. It is a measuring method using a measuring device that includes a receiving means for receiving the ultrasonic wave from the material to be inspected via a tentacle and measures the wall thickness of the material to be inspected.
For each ultrasonic probe, an ultrasonic waveform data generation step for generating ultrasonic waveform data showing the amplitude of ultrasonic waves from the material to be inspected in chronological order, and
The ultrasonic waveform data related to the second ultrasonic probe excluding the first ultrasonic probe, which is one ultrasonic probe included in the plurality of ultrasonic probes, is to be inspected. A reception time detection step for detecting the time when the surface reflected ultrasonic wave, which is the ultrasonic wave reflected on the surface of the material, is received by the receiving means, and
The surface reflection received via the second ultrasonic probe, which is superimposed on the ultrasonic waveform data of the first ultrasonic probe at the position of the time detected in the reception time detection step. A reference waveform data generation step that generates reference waveform data in which reference waveforms that assume noise based on ultrasonic waves are arranged, and
A waveform data subtraction step for performing a process of subtracting the reference waveform data from the ultrasonic waveform data related to the first ultrasonic probe, and a waveform data subtraction step.
The waveform data subtraction based on ultrasound waveform data obtained by performing the processing of the subtraction in step, said having a thickness calculating step of calculating the thickness of the test material, the measuring method. The measuring device according to any one of claims 1 to 5.
It is configured to include the measuring device according to any one of claims 7 to 11.
The measuring device according to any one of claims 7 to 11
The gate setting means is processed based on the two-dimensional array binary data obtained as a result of the processing by the two-dimensional array binary data processing means in the measuring device according to any one of claims 1 to 5. The ultrasonic waveform data related to each measurement point in the two-dimensional array brightness data is defined as the first ultrasonic waveform data, and the first detection gate and the second detection with respect to the first ultrasonic waveform data. Set up the gate and
Wherein the wall thickness calculation means calculates a thickness of the inspection member, the measurement system. The measuring device according to any one of claims 1 to 5.
It is configured to include the measuring device according to any one of claims 13 to 17.
The measuring device according to any one of claims 13 to 17
In the waveform data subtraction means, the two-dimensional array brightness data obtained by the measuring device according to any one of claims 1 to 5 is used as the ultrasonic waveform data related to the first ultrasonic probe. Apply and perform the process of subtracting the reference waveform data from the two-dimensional array brightness data.
The measuring device according to any one of claims 1 to 5
In the wall thickness calculating means, the wall thickness of the material to be inspected is used by using the two-dimensional array brightness data processed based on the two-dimensional array binary data obtained as a result of the processing by the two-dimensional array binary data processing means. to calculate the measurement system. The measuring device according to any one of claims 1 to 5.
The measuring device according to any one of claims 7 to 11.
It is configured to include the measuring device according to any one of claims 13 to 17.
The measuring device according to any one of claims 13 to 17
In the waveform data subtraction means, the two-dimensional array brightness data obtained by the measuring device according to any one of claims 1 to 5 is used as the ultrasonic waveform data related to the first ultrasonic probe. Apply and perform the process of subtracting the reference waveform data from the two-dimensional array brightness data.
The measuring device according to any one of claims 7 to 11
The gate setting means is processed based on the two-dimensional array binary data obtained as a result of the processing by the two-dimensional array binary data processing means in the measuring device according to any one of claims 1 to 5. The ultrasonic waveform data related to each measurement point in the two-dimensional array brightness data is defined as the first ultrasonic waveform data, and the first detection gate and the second detection with respect to the first ultrasonic waveform data. Set up the gate and
Wherein the wall thickness calculation means calculates a thickness of the inspection member, the measurement system. A program for causing a computer to perform each step in the measurement method according to any one of claims 6 , 12 and 18.

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