JP2019021761A5 - - Google Patents

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Publication number
JP2019021761A5
JP2019021761A5 JP2017138766A JP2017138766A JP2019021761A5 JP 2019021761 A5 JP2019021761 A5 JP 2019021761A5 JP 2017138766 A JP2017138766 A JP 2017138766A JP 2017138766 A JP2017138766 A JP 2017138766A JP 2019021761 A5 JP2019021761 A5 JP 2019021761A5
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JP
Japan
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semiconductor region
insulating film
semiconductor
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conductivity type
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JP2017138766A
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English (en)
Japanese (ja)
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JP6858091B2 (ja
JP2019021761A (ja
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Priority to JP2017138766A priority Critical patent/JP6858091B2/ja
Priority claimed from JP2017138766A external-priority patent/JP6858091B2/ja
Priority to CN201880023964.4A priority patent/CN110521002B/zh
Priority to PCT/JP2018/020457 priority patent/WO2019017076A1/ja
Publication of JP2019021761A publication Critical patent/JP2019021761A/ja
Publication of JP2019021761A5 publication Critical patent/JP2019021761A5/ja
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JP2017138766A 2017-07-18 2017-07-18 半導体装置およびその製造方法 Active JP6858091B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2017138766A JP6858091B2 (ja) 2017-07-18 2017-07-18 半導体装置およびその製造方法
CN201880023964.4A CN110521002B (zh) 2017-07-18 2018-05-29 半导体器件及其制造方法
PCT/JP2018/020457 WO2019017076A1 (ja) 2017-07-18 2018-05-29 半導体装置およびその製造方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2017138766A JP6858091B2 (ja) 2017-07-18 2017-07-18 半導体装置およびその製造方法

Publications (3)

Publication Number Publication Date
JP2019021761A JP2019021761A (ja) 2019-02-07
JP2019021761A5 true JP2019021761A5 (https=) 2020-01-23
JP6858091B2 JP6858091B2 (ja) 2021-04-14

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ID=65015205

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JP2017138766A Active JP6858091B2 (ja) 2017-07-18 2017-07-18 半導体装置およびその製造方法

Country Status (3)

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JP (1) JP6858091B2 (https=)
CN (1) CN110521002B (https=)
WO (1) WO2019017076A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPWO2025022836A1 (https=) * 2023-07-24 2025-01-30

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0834312B2 (ja) * 1988-12-06 1996-03-29 富士電機株式会社 縦形電界効果トランジスタ
TW218424B (https=) * 1992-05-21 1994-01-01 Philips Nv
EP0693773B1 (en) * 1994-07-14 2005-02-09 STMicroelectronics S.r.l. VDMOS power device and manufacturing process thereof
EP0841702A1 (en) * 1996-11-11 1998-05-13 STMicroelectronics S.r.l. Lateral or vertical DMOSFET with high breakdown voltage
JP3617507B2 (ja) * 2002-07-01 2005-02-09 日産自動車株式会社 炭化珪素半導体装置の製造方法、及びその製造方法によって製造される炭化珪素半導体装置
JP3981028B2 (ja) * 2002-09-11 2007-09-26 株式会社東芝 半導体装置
JP5997426B2 (ja) * 2011-08-19 2016-09-28 株式会社日立製作所 半導体装置および半導体装置の製造方法
JP6168732B2 (ja) * 2012-05-11 2017-07-26 株式会社日立製作所 炭化珪素半導体装置およびその製造方法
US9490328B2 (en) * 2013-06-26 2016-11-08 Hitachi, Ltd. Silicon carbide semiconductor device and manufacturing method of the same
US9214572B2 (en) * 2013-09-20 2015-12-15 Monolith Semiconductor Inc. High voltage MOSFET devices and methods of making the devices

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