JP2018528400A5 - - Google Patents

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Publication number
JP2018528400A5
JP2018528400A5 JP2017567411A JP2017567411A JP2018528400A5 JP 2018528400 A5 JP2018528400 A5 JP 2018528400A5 JP 2017567411 A JP2017567411 A JP 2017567411A JP 2017567411 A JP2017567411 A JP 2017567411A JP 2018528400 A5 JP2018528400 A5 JP 2018528400A5
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Japan
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particle
ionization chamber
sensor
flow rate
ionization
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JP2017567411A
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English (en)
Japanese (ja)
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JP6797846B2 (ja
JP2018528400A (ja
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Priority claimed from PCT/EP2016/065072 external-priority patent/WO2017005560A1/en
Publication of JP2018528400A publication Critical patent/JP2018528400A/ja
Publication of JP2018528400A5 publication Critical patent/JP2018528400A5/ja
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JP2017567411A 2015-07-03 2016-06-29 粒子センサ及び粒子感知方法 Active JP6797846B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP15175272.2 2015-07-03
EP15175272 2015-07-03
PCT/EP2016/065072 WO2017005560A1 (en) 2015-07-03 2016-06-29 A particle sensor and particle sensing method

Publications (3)

Publication Number Publication Date
JP2018528400A JP2018528400A (ja) 2018-09-27
JP2018528400A5 true JP2018528400A5 (https=) 2019-08-08
JP6797846B2 JP6797846B2 (ja) 2020-12-09

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JP2017567411A Active JP6797846B2 (ja) 2015-07-03 2016-06-29 粒子センサ及び粒子感知方法

Country Status (5)

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US (1) US10508982B2 (https=)
EP (1) EP3317640B1 (https=)
JP (1) JP6797846B2 (https=)
CN (1) CN107872986B (https=)
WO (1) WO2017005560A1 (https=)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6730154B2 (ja) * 2016-09-28 2020-07-29 日本特殊陶業株式会社 微粒子測定装置および微粒子測定システム
JP6730155B2 (ja) * 2016-09-29 2020-07-29 日本特殊陶業株式会社 微粒子測定装置および微粒子測定システム
WO2019037042A1 (en) * 2017-08-24 2019-02-28 Honeywell International Inc. AIRFLOW REGULATION FOR PARTICLE SENSOR
CN108896454B (zh) * 2018-09-18 2023-05-16 大连海事大学 一种基于时分复用技术的多通道磨粒检测方法及装置
DE102018218918A1 (de) * 2018-11-06 2020-05-07 Robert Bosch Gmbh Partikelsensor und Betriebsverfahren hierfür
US11433154B2 (en) 2020-05-18 2022-09-06 Wangs Alliance Corporation Germicidal lighting
US11027038B1 (en) 2020-05-22 2021-06-08 Delta T, Llc Fan for improving air quality
US20220282877A1 (en) * 2021-03-03 2022-09-08 Apicem Technology Services Company Limited Air purifying system

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Publication number Priority date Publication date Assignee Title
JPS5048990A (https=) * 1973-08-31 1975-05-01
JPS539874B2 (https=) * 1973-12-05 1978-04-08
JPH0652233B2 (ja) * 1985-08-21 1994-07-06 閃一 増田 超微粒子測定装置
US4769609A (en) * 1986-09-19 1988-09-06 Senichi Masuda Measurement of ultra-fine particles utilizing pulsed corona signals
JP3211317B2 (ja) * 1991-12-27 2001-09-25 株式会社デンソー 混合ガスの計測方法及び装置
EP1781481B1 (en) * 2004-08-11 2009-04-15 Koninklijke Philips Electronics N.V. Air pollution sensor system
JP2008510135A (ja) * 2004-08-11 2008-04-03 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 空気汚染センサシステム
JP2008544294A (ja) * 2005-06-28 2008-12-04 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 超微細粒子センサ
KR100614101B1 (ko) * 2005-09-15 2006-08-22 한국과학기술연구원 입자 계수기
EP1914537A1 (en) * 2006-10-17 2008-04-23 Ibiden Co., Ltd. Particulate matter sensor
US8402815B2 (en) 2007-04-06 2013-03-26 Koninklijke Philips Electronics N.V. Air pollution sensor system
US8539840B2 (en) * 2008-02-05 2013-09-24 Enertechnix, Inc Aerosol collection apparatus and methods
FI20080182A0 (fi) * 2008-03-04 2008-03-04 Navaro 245 Oy Mittausmenetelmä ja -laite
EP2370802B1 (en) * 2008-11-25 2017-07-26 Koninklijke Philips N.V. Sensor for sensing airborne particles
WO2012069963A1 (en) * 2010-11-26 2012-05-31 Koninklijke Philips Electronics N.V. Sensor for assessing air pollution
KR200484692Y1 (ko) * 2012-02-18 2017-10-18 페가소 오와이 확인된 공기 흐름을 생성하기 위한 장치 및 방법, 및 확인된 공기 흐름의 입자 농도 측정에서의 그러한 장치의 용도
EP2815473A1 (en) * 2012-02-18 2014-12-24 Pegasor OY Apparatus and process for producing acknowledged air flow and the use of such apparatus in measuring particle concentration in acknowledged air flow

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