JP2018185195A5 - - Google Patents
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- JP2018185195A5 JP2018185195A5 JP2017086222A JP2017086222A JP2018185195A5 JP 2018185195 A5 JP2018185195 A5 JP 2018185195A5 JP 2017086222 A JP2017086222 A JP 2017086222A JP 2017086222 A JP2017086222 A JP 2017086222A JP 2018185195 A5 JP2018185195 A5 JP 2018185195A5
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- JP
- Japan
- Prior art keywords
- light
- peripheral surface
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- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 230000002093 peripheral effect Effects 0.000 claims description 31
- 239000013307 optical fiber Substances 0.000 claims description 13
- 238000005259 measurement Methods 0.000 claims description 12
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 claims description 10
- 230000003287 optical effect Effects 0.000 claims description 9
- 238000001514 detection method Methods 0.000 claims description 5
- 238000002955 isolation Methods 0.000 claims description 2
- 238000000034 method Methods 0.000 claims description 2
- 230000005540 biological transmission Effects 0.000 claims 6
- 230000005284 excitation Effects 0.000 claims 4
- 238000009792 diffusion process Methods 0.000 claims 1
- 230000002452 interceptive effect Effects 0.000 claims 1
- 238000000691 measurement method Methods 0.000 claims 1
- 238000005192 partition Methods 0.000 claims 1
- 230000005855 radiation Effects 0.000 claims 1
- 239000000835 fiber Substances 0.000 description 3
- 230000001678 irradiating effect Effects 0.000 description 2
- 230000000052 comparative effect Effects 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2017086222A JP6959027B2 (ja) | 2017-04-25 | 2017-04-25 | クリアランス計測装置、クリアランス計測センサ及びクリアランス計測方法 |
| CN201880024668.6A CN110546453B (zh) | 2017-04-25 | 2018-04-24 | 间隙测量装置、间隙测量传感器及间隙测量方法 |
| PCT/JP2018/016574 WO2018199076A1 (ja) | 2017-04-25 | 2018-04-24 | クリアランス計測装置、クリアランス計測センサ及びクリアランス計測方法 |
| US16/606,047 US11073378B2 (en) | 2017-04-25 | 2018-04-24 | Clearance measurement device, clearance measurement sensor, and clearance measurement method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2017086222A JP6959027B2 (ja) | 2017-04-25 | 2017-04-25 | クリアランス計測装置、クリアランス計測センサ及びクリアランス計測方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2018185195A JP2018185195A (ja) | 2018-11-22 |
| JP2018185195A5 true JP2018185195A5 (enExample) | 2020-03-26 |
| JP6959027B2 JP6959027B2 (ja) | 2021-11-02 |
Family
ID=63919168
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2017086222A Active JP6959027B2 (ja) | 2017-04-25 | 2017-04-25 | クリアランス計測装置、クリアランス計測センサ及びクリアランス計測方法 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US11073378B2 (enExample) |
| JP (1) | JP6959027B2 (enExample) |
| CN (1) | CN110546453B (enExample) |
| WO (1) | WO2018199076A1 (enExample) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114440781B (zh) * | 2022-01-21 | 2023-07-11 | 中国工程物理研究院流体物理研究所 | 一种间隙传感器、间隙测量方法及测量装置 |
| US12339113B2 (en) * | 2022-06-30 | 2025-06-24 | Ge Infrastructure Technology Llc | Apparatus and method for transmitting radiation to a rotating component |
Family Cites Families (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4326804A (en) * | 1980-02-11 | 1982-04-27 | General Electric Company | Apparatus and method for optical clearance determination |
| JPS59142408A (ja) * | 1983-02-02 | 1984-08-15 | Ishikawajima Harima Heavy Ind Co Ltd | 翼端隙間の測定装置 |
| US4766323A (en) * | 1986-08-29 | 1988-08-23 | B. C. Hydro | Method and apparatus for determining the distance of an object |
| JPH0430105A (ja) * | 1990-05-26 | 1992-02-03 | Matsushita Electric Works Ltd | ファイバ光源装置 |
| US5818242A (en) * | 1996-05-08 | 1998-10-06 | United Technologies Corporation | Microwave recess distance and air-path clearance sensor |
| JP2003254091A (ja) | 2002-03-04 | 2003-09-10 | Ishikawajima Harima Heavy Ind Co Ltd | 圧縮機のチップクリアランス制御装置及び制御方法 |
| JP4148689B2 (ja) | 2002-03-15 | 2008-09-10 | 株式会社東芝 | 回転体計測装置 |
| DE102007051027A1 (de) * | 2007-10-25 | 2009-04-30 | Mtu Aero Engines Gmbh | Strömungsmaschine, Spaltmesssystem und Verfahren zum Ermitteln eines Rotorspaltes |
| JP2009168602A (ja) * | 2008-01-16 | 2009-07-30 | Ojima Shisaku Kenkyusho:Kk | エンコーダおよびエンコーダ構成用検出装置 |
| US8009939B2 (en) * | 2008-09-30 | 2011-08-30 | General Electric Company | Fiberoptic clearance detection system and method |
| US9267378B2 (en) * | 2012-06-27 | 2016-02-23 | General Electric Company | Turbomachine monitoring system and method |
| EP2698502A1 (en) * | 2012-08-13 | 2014-02-19 | Alstom Technology Ltd | Method for measuring the cold build blade tip clearance of a turbomachine and tip clearance measuring arrangment for conducting said method |
| CN203100688U (zh) * | 2013-02-28 | 2013-07-31 | 济南大学 | 一种测量旋转叶片叶尖间隙的光纤传感器 |
| JP6143085B2 (ja) * | 2013-06-14 | 2017-06-07 | 三菱重工業株式会社 | チップクリアランス計測装置 |
| CN103438814B (zh) | 2013-08-29 | 2016-03-16 | 中国科学院工程热物理研究所 | 一种叶尖间隙光纤测量方法及装置 |
| US9513117B2 (en) * | 2013-10-02 | 2016-12-06 | Siemens Energy, Inc. | Situ blade mounted tip gap measurement for turbines |
| WO2015199054A1 (ja) * | 2014-06-27 | 2015-12-30 | 株式会社キーエンス | 多波長光電測定装置、共焦点測定装置、干渉測定装置及びカラー測定装置 |
| JP6454489B2 (ja) * | 2014-07-10 | 2019-01-16 | オリンパス株式会社 | 観察システム |
| WO2016069278A1 (en) * | 2014-10-31 | 2016-05-06 | Halliburton Energy Services, Inc. | Flow distribution assemblies with shunt tubes and erosion-resistant shunt nozzles |
| CN104501728A (zh) * | 2014-12-12 | 2015-04-08 | 天津大学 | 一种基于全光纤叶尖定时的叶尖间隙测量方法 |
| JP6596399B2 (ja) | 2016-08-30 | 2019-10-23 | 三菱重工業株式会社 | クリアランス計測装置およびクリアランス制御システム |
-
2017
- 2017-04-25 JP JP2017086222A patent/JP6959027B2/ja active Active
-
2018
- 2018-04-24 WO PCT/JP2018/016574 patent/WO2018199076A1/ja not_active Ceased
- 2018-04-24 CN CN201880024668.6A patent/CN110546453B/zh active Active
- 2018-04-24 US US16/606,047 patent/US11073378B2/en active Active
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