JP2018156008A5 - - Google Patents

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Publication number
JP2018156008A5
JP2018156008A5 JP2017054393A JP2017054393A JP2018156008A5 JP 2018156008 A5 JP2018156008 A5 JP 2018156008A5 JP 2017054393 A JP2017054393 A JP 2017054393A JP 2017054393 A JP2017054393 A JP 2017054393A JP 2018156008 A5 JP2018156008 A5 JP 2018156008A5
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JP
Japan
Prior art keywords
optical system
light receiving
fresnel lens
axis
receiving optical
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JP2017054393A
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English (en)
Japanese (ja)
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JP2018156008A (ja
JP6810454B2 (ja
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Priority to JP2017054393A priority Critical patent/JP6810454B2/ja
Priority claimed from JP2017054393A external-priority patent/JP6810454B2/ja
Priority to US15/924,808 priority patent/US10527489B2/en
Publication of JP2018156008A publication Critical patent/JP2018156008A/ja
Publication of JP2018156008A5 publication Critical patent/JP2018156008A5/ja
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Publication of JP6810454B2 publication Critical patent/JP6810454B2/ja
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JP2017054393A 2017-03-21 2017-03-21 受光光学系 Active JP6810454B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2017054393A JP6810454B2 (ja) 2017-03-21 2017-03-21 受光光学系
US15/924,808 US10527489B2 (en) 2017-03-21 2018-03-19 Light-receiving optical system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2017054393A JP6810454B2 (ja) 2017-03-21 2017-03-21 受光光学系

Publications (3)

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JP2018156008A JP2018156008A (ja) 2018-10-04
JP2018156008A5 true JP2018156008A5 (enExample) 2020-02-27
JP6810454B2 JP6810454B2 (ja) 2021-01-06

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JP2017054393A Active JP6810454B2 (ja) 2017-03-21 2017-03-21 受光光学系

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US (1) US10527489B2 (enExample)
JP (1) JP6810454B2 (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6810454B2 (ja) * 2017-03-21 2021-01-06 ナルックス株式会社 受光光学系
JP6788537B2 (ja) * 2017-03-28 2020-11-25 本田技研工業株式会社 レーザ式測距装置を使用した物体エッジの検出方法
JP7103694B2 (ja) * 2020-01-24 2022-07-20 株式会社コムテック レーザー探知機
KR102668469B1 (ko) * 2021-06-25 2024-05-23 주식회사 세코닉스 라이다용 렌즈 시스템

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0658481B2 (ja) * 1985-02-22 1994-08-03 株式会社ニコン カメラの焦点板用多焦点距離フレネルレンズ
JP3356576B2 (ja) * 1994-02-25 2002-12-16 日本電気株式会社 レーザーレーダ
JPH07270602A (ja) * 1994-03-31 1995-10-20 Omron Corp 受光用レンズ,受光装置,これらを用いた光電センサおよびレーザ・レーダ,ならびにレーザ・レーダを搭載した車両
JPH0882677A (ja) * 1994-09-13 1996-03-26 Nippondenso Co Ltd 反射測定装置
JP3340885B2 (ja) * 1995-07-04 2002-11-05 株式会社デンソー 反射測定装置
WO2005050163A2 (en) * 2003-02-10 2005-06-02 University Of Virginia Patent Foundation System and method for remote sensing and analyzing spectral properties of targets
JP2004247947A (ja) * 2003-02-13 2004-09-02 Olympus Corp 光学装置
JP4702200B2 (ja) * 2006-06-27 2011-06-15 株式会社デンソー 受光器及び当該受光器を備えたレーダ装置
JP5177003B2 (ja) * 2009-02-19 2013-04-03 株式会社デンソーウェーブ レーザ距離測定装置
US9097965B2 (en) * 2009-10-15 2015-08-04 Nec Corporation Image projection device, image projection method, and image display device
JP5919530B2 (ja) * 2010-12-21 2016-05-18 パナソニックIpマネジメント株式会社 光学式検知装置およびそれを用いた機器
JP2013072770A (ja) * 2011-09-28 2013-04-22 Denso Wave Inc レーザレーダ装置
JP2013200367A (ja) * 2012-03-23 2013-10-03 Panasonic Corp フレネルレンズおよび光学検出器
CA2871502C (en) * 2012-04-26 2021-06-08 Neptec Design Group Ltd. High speed 360 degree scanning lidar head
US20140211194A1 (en) 2013-01-27 2014-07-31 Quanergy Systems, Inc. Cost-effective lidar sensor for multi-signal detection, weak signal detection and signal disambiguation and method of using same
JP6810454B2 (ja) * 2017-03-21 2021-01-06 ナルックス株式会社 受光光学系

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