JP2018147557A - 有機el表示装置 - Google Patents
有機el表示装置 Download PDFInfo
- Publication number
- JP2018147557A JP2018147557A JP2017037946A JP2017037946A JP2018147557A JP 2018147557 A JP2018147557 A JP 2018147557A JP 2017037946 A JP2017037946 A JP 2017037946A JP 2017037946 A JP2017037946 A JP 2017037946A JP 2018147557 A JP2018147557 A JP 2018147557A
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- JP
- Japan
- Prior art keywords
- organic
- dam
- sealing
- film
- display device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000010408 film Substances 0.000 claims abstract description 75
- 238000007789 sealing Methods 0.000 claims abstract description 52
- 239000000758 substrate Substances 0.000 claims abstract description 26
- 239000011368 organic material Substances 0.000 claims abstract description 22
- 239000000463 material Substances 0.000 claims abstract description 20
- 239000010409 thin film Substances 0.000 claims abstract description 17
- 238000001514 detection method Methods 0.000 claims abstract description 5
- 229910010272 inorganic material Inorganic materials 0.000 claims abstract description 5
- 239000011147 inorganic material Substances 0.000 claims abstract description 5
- 238000002161 passivation Methods 0.000 claims description 16
- 239000000126 substance Substances 0.000 claims description 11
- 239000007793 ph indicator Substances 0.000 claims description 7
- CDBYLPFSWZWCQE-UHFFFAOYSA-L Sodium Carbonate Chemical compound [Na+].[Na+].[O-]C([O-])=O CDBYLPFSWZWCQE-UHFFFAOYSA-L 0.000 claims description 4
- KJFMBFZCATUALV-UHFFFAOYSA-N phenolphthalein Chemical group C1=CC(O)=CC=C1C1(C=2C=CC(O)=CC=2)C2=CC=CC=C2C(=O)O1 KJFMBFZCATUALV-UHFFFAOYSA-N 0.000 claims description 4
- 229910000029 sodium carbonate Inorganic materials 0.000 claims description 2
- 239000010410 layer Substances 0.000 description 43
- 238000005401 electroluminescence Methods 0.000 description 12
- 239000002585 base Substances 0.000 description 8
- 239000004065 semiconductor Substances 0.000 description 8
- 239000004020 conductor Substances 0.000 description 6
- 239000011229 interlayer Substances 0.000 description 6
- 239000011810 insulating material Substances 0.000 description 5
- 230000015572 biosynthetic process Effects 0.000 description 4
- 230000007547 defect Effects 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 239000011347 resin Substances 0.000 description 3
- 229920005989 resin Polymers 0.000 description 3
- 239000003513 alkali Substances 0.000 description 2
- 238000005229 chemical vapour deposition Methods 0.000 description 2
- 238000000059 patterning Methods 0.000 description 2
- 239000011342 resin composition Substances 0.000 description 2
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- BOTDANWDWHJENH-UHFFFAOYSA-N Tetraethyl orthosilicate Chemical compound CCO[Si](OCC)(OCC)OCC BOTDANWDWHJENH-UHFFFAOYSA-N 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000009429 electrical wiring Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 230000005525 hole transport Effects 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 238000005468 ion implantation Methods 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 229920005591 polysilicon Polymers 0.000 description 1
- LIVNPJMFVYWSIS-UHFFFAOYSA-N silicon monoxide Chemical compound [Si-]#[O+] LIVNPJMFVYWSIS-UHFFFAOYSA-N 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
- YVTHLONGBIQYBO-UHFFFAOYSA-N zinc indium(3+) oxygen(2-) Chemical compound [O--].[Zn++].[In+3] YVTHLONGBIQYBO-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/80—Constructional details
- H10K50/84—Passivation; Containers; Encapsulations
- H10K50/844—Encapsulations
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N31/00—Investigating or analysing non-biological materials by the use of the chemical methods specified in the subgroup; Apparatus specially adapted for such methods
- G01N31/22—Investigating or analysing non-biological materials by the use of the chemical methods specified in the subgroup; Apparatus specially adapted for such methods using chemical indicators
- G01N31/222—Investigating or analysing non-biological materials by the use of the chemical methods specified in the subgroup; Apparatus specially adapted for such methods using chemical indicators for investigating moisture content
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/80—Constructional details
- H10K50/84—Passivation; Containers; Encapsulations
- H10K50/846—Passivation; Containers; Encapsulations comprising getter material or desiccants
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/70—Testing, e.g. accelerated lifetime tests
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N31/00—Investigating or analysing non-biological materials by the use of the chemical methods specified in the subgroup; Apparatus specially adapted for such methods
- G01N31/22—Investigating or analysing non-biological materials by the use of the chemical methods specified in the subgroup; Apparatus specially adapted for such methods using chemical indicators
- G01N31/221—Investigating or analysing non-biological materials by the use of the chemical methods specified in the subgroup; Apparatus specially adapted for such methods using chemical indicators for investigating pH value
Abstract
Description
Claims (7)
- 基材と、
前記基材上の表示領域に配置され、下部電極と上部電極とに挟持される有機材料層と、
前記基材上の前記表示領域を囲む外部領域に設けられるダムと、
前記有機材料層上に形成され、前記表示領域を覆う封止層と、を有する薄膜トランジスタ基板を備え、
前記封止層に含まれ、有機材料で構成される封止平坦化膜は、前記ダムの内側に形成され、
前記封止層に含まれ、無機材料で構成される封止膜は、前記ダムを覆うように形成され、
前記ダムが水分検知部を含む、
有機EL表示装置。 - 前記水分検知部が水分により色が変化する、請求項1に記載の有機EL表示装置。
- 前記水分検知部がpH指示薬および水溶性物質を含有する、請求項1または2に記載の有機EL表示装置。
- 前記pH指示薬がフェノールフタレインであり、前記水溶性物質が塩基性物質である、請求項3に記載の有機EL表示装置。
- 前記塩基性物質が炭酸ナトリウムを含む、請求項4に記載の有機EL表示装置。
- 前記ダムが、前記封止平坦化膜を堰き止めている、請求項1から5のいずれかに記載の有機EL表示装置。
- 前記薄膜トランジスタ基板が、前記基材と前記有機材料層との間に配置されるパッシベーション膜を有し、前記パッシベーション膜が前記ダムを覆う、請求項1から6のいずれかに記載の有機EL表示装置。
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2017037946A JP6830011B2 (ja) | 2017-03-01 | 2017-03-01 | 有機el表示装置 |
US15/904,932 US10586948B2 (en) | 2017-03-01 | 2018-02-26 | Organic electro-luminescent display device including moisture detection member |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2017037946A JP6830011B2 (ja) | 2017-03-01 | 2017-03-01 | 有機el表示装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2018147557A true JP2018147557A (ja) | 2018-09-20 |
JP6830011B2 JP6830011B2 (ja) | 2021-02-17 |
Family
ID=63355329
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2017037946A Active JP6830011B2 (ja) | 2017-03-01 | 2017-03-01 | 有機el表示装置 |
Country Status (2)
Country | Link |
---|---|
US (1) | US10586948B2 (ja) |
JP (1) | JP6830011B2 (ja) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101974086B1 (ko) * | 2016-09-30 | 2019-05-02 | 삼성디스플레이 주식회사 | 표시모듈 |
CN109585676B (zh) * | 2018-11-28 | 2020-10-27 | 云谷(固安)科技有限公司 | 显示面板 |
CN111106267B (zh) * | 2019-12-31 | 2021-02-09 | 华中科技大学 | 一种柔性显示电流体雾化薄膜封装系统及工艺 |
CN111668271B (zh) * | 2020-06-11 | 2021-08-24 | 武汉华星光电半导体显示技术有限公司 | Oled显示面板及其制备方法、oled显示装置 |
CN111668385B (zh) * | 2020-06-15 | 2022-11-04 | Tcl华星光电技术有限公司 | 显示面板及其封装方法 |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2003061346A1 (fr) * | 2002-01-15 | 2003-07-24 | Seiko Epson Corporation | Structure d'etancheite a film fin possedant une propriete de barriere pour un element electronique, dispositif d'affichage, equipement electronique et procede de fabrication d'un element electronique |
JP2004347822A (ja) * | 2003-05-21 | 2004-12-09 | Semiconductor Energy Lab Co Ltd | 発光装置およびその作製方法 |
US20100295759A1 (en) * | 2009-05-20 | 2010-11-25 | Hitachi Displays, Ltd. | Organic electroluminescence display device |
JP2016004053A (ja) * | 2014-06-13 | 2016-01-12 | 株式会社ジャパンディスプレイ | 表示装置 |
CN105355645A (zh) * | 2015-11-06 | 2016-02-24 | 上海天马微电子有限公司 | 一种柔性显示面板及其制造方法、显示装置 |
US20160307971A1 (en) * | 2015-04-16 | 2016-10-20 | Samsung Display Co., Ltd. | Organic light emitting diode display |
US20160372528A1 (en) * | 2013-12-06 | 2016-12-22 | Sharp Kabushiki Kaisha | Light-emitting substrate, photovoltaic cell, display device, lighting device, electronic device, organic light-emitting diode, and method of manufacturing light-emitting substrate |
-
2017
- 2017-03-01 JP JP2017037946A patent/JP6830011B2/ja active Active
-
2018
- 2018-02-26 US US15/904,932 patent/US10586948B2/en active Active
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2003061346A1 (fr) * | 2002-01-15 | 2003-07-24 | Seiko Epson Corporation | Structure d'etancheite a film fin possedant une propriete de barriere pour un element electronique, dispositif d'affichage, equipement electronique et procede de fabrication d'un element electronique |
JP2004347822A (ja) * | 2003-05-21 | 2004-12-09 | Semiconductor Energy Lab Co Ltd | 発光装置およびその作製方法 |
US20100295759A1 (en) * | 2009-05-20 | 2010-11-25 | Hitachi Displays, Ltd. | Organic electroluminescence display device |
JP2010272270A (ja) * | 2009-05-20 | 2010-12-02 | Hitachi Displays Ltd | 有機el表示装置 |
US20160372528A1 (en) * | 2013-12-06 | 2016-12-22 | Sharp Kabushiki Kaisha | Light-emitting substrate, photovoltaic cell, display device, lighting device, electronic device, organic light-emitting diode, and method of manufacturing light-emitting substrate |
JP2016004053A (ja) * | 2014-06-13 | 2016-01-12 | 株式会社ジャパンディスプレイ | 表示装置 |
US20160307971A1 (en) * | 2015-04-16 | 2016-10-20 | Samsung Display Co., Ltd. | Organic light emitting diode display |
CN105355645A (zh) * | 2015-11-06 | 2016-02-24 | 上海天马微电子有限公司 | 一种柔性显示面板及其制造方法、显示装置 |
Also Published As
Publication number | Publication date |
---|---|
US10586948B2 (en) | 2020-03-10 |
US20180254435A1 (en) | 2018-09-06 |
JP6830011B2 (ja) | 2021-02-17 |
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