JP2018146580A5 - - Google Patents
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- Publication number
- JP2018146580A5 JP2018146580A5 JP2018036990A JP2018036990A JP2018146580A5 JP 2018146580 A5 JP2018146580 A5 JP 2018146580A5 JP 2018036990 A JP2018036990 A JP 2018036990A JP 2018036990 A JP2018036990 A JP 2018036990A JP 2018146580 A5 JP2018146580 A5 JP 2018146580A5
- Authority
- JP
- Japan
- Prior art keywords
- defect
- pattern
- print pattern
- markings
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
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- 230000002950 deficient Effects 0.000 claims 2
- 239000004744 fabric Substances 0.000 claims 1
Claims (2)
前記マーキングにより表面に印字され、短手方向において隣り合う第1の印字パターン及び第2の印字パターンを有し、前記第1の印字パターンと前記第2の印字パターンとの間に欠陥が位置することによって、前記欠陥の位置が表示されていることを特徴とする原反。 It is a long strip-shaped original fabric with markings on the defective parts.
Is printed on the surface by said marking comprises a first printing pattern及beauty second print patterns adjacent to each other in the lateral direction, the defect is located between the first print pattern and the second print pattern By doing so, the position of the defect is displayed.
前記マーキングにより表面に印字され、一の方向と交差する他の方向において隣り合う第1の印字パターン及び第2の印字パターンを有し、前記第1の印字パターンと前記第2の印字パターンとの間に欠陥が位置することによって、前記欠陥の位置が表示されていることを特徴とするシート。 A sheet with markings on the defective parts
Is printed on the surface by said marking comprises a first printing pattern及beauty second print patterns adjacent to each other in another direction crossing the one direction, and the first print pattern and the second print pattern A sheet characterized in that the position of the defect is displayed by locating the defect between the two.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2017040931 | 2017-03-03 | ||
JP2017040931 | 2017-03-03 |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2018146580A JP2018146580A (en) | 2018-09-20 |
JP2018146580A5 true JP2018146580A5 (en) | 2021-01-28 |
JP6978963B2 JP6978963B2 (en) | 2021-12-08 |
Family
ID=63486407
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2018036990A Active JP6978963B2 (en) | 2017-03-03 | 2018-03-01 | Defect marking method and defect marking device, raw fabric manufacturing method and raw fabric, and sheet manufacturing method and sheet |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP6978963B2 (en) |
KR (1) | KR102475056B1 (en) |
CN (1) | CN108535259B (en) |
TW (1) | TWI766952B (en) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2021117273A1 (en) * | 2019-12-10 | 2021-06-17 | 日東電工株式会社 | Elongated-optical-laminate inspection method and inspection system |
WO2022107756A1 (en) * | 2020-11-18 | 2022-05-27 | 日東電工株式会社 | Sheet-like product manufacturing method, sheet-like product, original fabric, and intermediate body |
JP7330253B2 (en) * | 2020-12-08 | 2023-08-21 | 住友化学株式会社 | Optical layered body with mark and method for manufacturing optical layered body with mark |
JP2022107419A (en) * | 2021-01-08 | 2022-07-21 | 日東電工株式会社 | Method for inspecting optical laminate film, and method for manufacturing film product |
CN114604678A (en) * | 2022-03-11 | 2022-06-10 | 凌云光技术股份有限公司 | Method for eliminating defect positioning error |
Family Cites Families (29)
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JPH0830683B2 (en) * | 1987-01-22 | 1996-03-27 | 大和製罐株式会社 | How to display defects in thin metal coil plates for can manufacturing |
JP3660763B2 (en) * | 1996-06-26 | 2005-06-15 | 株式会社日立製作所 | Inspection pattern inspection method, manufacturing process diagnosis method, and semiconductor substrate manufacturing method |
JP3878340B2 (en) * | 1998-09-18 | 2007-02-07 | 株式会社ルネサステクノロジ | Pattern defect inspection method and apparatus |
JP2000051941A (en) * | 1998-08-06 | 2000-02-22 | Nkk Corp | Defect marking method to thin steel sheet |
DE60036939T2 (en) * | 1999-03-18 | 2008-08-07 | Jfe Steel Corp. | METHOD AND DEVICE FOR MARKING ERRORS |
JP3890430B2 (en) * | 1999-08-24 | 2007-03-07 | 富士フイルム株式会社 | Surface inspection method and apparatus |
JP2001305070A (en) | 2000-04-19 | 2001-10-31 | Sumitomo Chem Co Ltd | Method and device for marking defect in sheet product |
JP4343456B2 (en) | 2001-04-03 | 2009-10-14 | 大日本印刷株式会社 | Defect marking method and apparatus for sheet-like product |
JP4049723B2 (en) * | 2003-09-04 | 2008-02-20 | 沖電気工業株式会社 | Nitride semiconductor device manufacturing method and nitride semiconductor device manufacturing apparatus |
JP2006071560A (en) * | 2004-09-03 | 2006-03-16 | Fuji Photo Film Co Ltd | Apparatus for detecting defect of optical fiber |
JP2007192660A (en) * | 2006-01-19 | 2007-08-02 | Fujifilm Corp | Surface flaw detecting method and detector of film |
JP2008020321A (en) * | 2006-07-13 | 2008-01-31 | Purex:Kk | Flaw cloth piece detector with flaw marking device |
CN101210889A (en) * | 2006-12-30 | 2008-07-02 | 大元科技股份有限公司 | Holographic type automatic optical detection system and method |
JP2009244064A (en) * | 2008-03-31 | 2009-10-22 | Sumitomo Chemical Co Ltd | Inspection method of polarization film |
JP5446232B2 (en) * | 2008-04-10 | 2014-03-19 | 凸版印刷株式会社 | Defect inspection apparatus and defect inspection method for color filter substrate |
TWI420098B (en) * | 2008-07-18 | 2013-12-21 | Asahi Glass Co Ltd | A defect inspection apparatus and method using the image data for defect inspection, a method for manufacturing the same, and a recording medium |
JP4776739B2 (en) | 2009-04-10 | 2011-09-21 | 日東電工株式会社 | Method for manufacturing image display device using optical film roll original fabric |
JP2011012986A (en) * | 2009-06-30 | 2011-01-20 | Toppan Printing Co Ltd | Printed matter inspection device |
US8935104B2 (en) * | 2010-03-10 | 2015-01-13 | 3M Innovative Properties Company | Application-specific repeat defect detection in web manufacturing processes |
WO2012073558A1 (en) * | 2010-11-29 | 2012-06-07 | 大日本印刷株式会社 | Substrate for evaluation, defect inspection method and defect inspection apparatus |
JP5274622B2 (en) * | 2011-06-27 | 2013-08-28 | 富士フイルム株式会社 | Defect inspection apparatus and method |
JP6004797B2 (en) | 2012-07-09 | 2016-10-12 | 大倉工業株式会社 | DEFECT MARKING METHOD, OPTICAL FILM MANUFACTURING METHOD, AND DEFECT MARKING DEVICE |
JP2014048206A (en) * | 2012-08-31 | 2014-03-17 | Sharp Corp | Defect classification device, defect classification method, control program and storage medium |
JP6204697B2 (en) * | 2013-05-16 | 2017-09-27 | 住友化学株式会社 | Defect inspection system |
JP6182806B2 (en) * | 2013-06-04 | 2017-08-23 | 住友化学株式会社 | Defect inspection system and film manufacturing apparatus |
JP6177017B2 (en) * | 2013-06-12 | 2017-08-09 | 住友化学株式会社 | Defect inspection system |
JP6268042B2 (en) * | 2014-06-06 | 2018-01-24 | 株式会社ニューフレアテクノロジー | Inspection method |
JP6641093B2 (en) * | 2015-03-20 | 2020-02-05 | 住友化学株式会社 | Defect inspection method for optical film and laminated optical film |
JP6749894B2 (en) * | 2015-04-09 | 2020-09-02 | 住友化学株式会社 | Defect inspection method for laminated optical film, optical film defect inspection method, and laminated optical film manufacturing method |
-
2018
- 2018-02-27 KR KR1020180023836A patent/KR102475056B1/en active IP Right Grant
- 2018-02-28 CN CN201810169825.4A patent/CN108535259B/en active Active
- 2018-03-01 TW TW107106823A patent/TWI766952B/en active
- 2018-03-01 JP JP2018036990A patent/JP6978963B2/en active Active
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