JP2018146431A5 - - Google Patents

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JP2018146431A5
JP2018146431A5 JP2017042716A JP2017042716A JP2018146431A5 JP 2018146431 A5 JP2018146431 A5 JP 2018146431A5 JP 2017042716 A JP2017042716 A JP 2017042716A JP 2017042716 A JP2017042716 A JP 2017042716A JP 2018146431 A5 JP2018146431 A5 JP 2018146431A5
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Japan
Prior art keywords
scattered light
sample
light
light detector
detector
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JP2017042716A
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Japanese (ja)
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JP2018146431A (ja
JP6896459B2 (ja
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JP2017042716A 2017-03-07 2017-03-07 自動分析装置及び自動分析方法 Active JP6896459B2 (ja)

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JP2017042716A JP6896459B2 (ja) 2017-03-07 2017-03-07 自動分析装置及び自動分析方法

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JP2017042716A JP6896459B2 (ja) 2017-03-07 2017-03-07 自動分析装置及び自動分析方法

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JP2018146431A JP2018146431A (ja) 2018-09-20
JP2018146431A5 true JP2018146431A5 (cg-RX-API-DMAC7.html) 2020-01-30
JP6896459B2 JP6896459B2 (ja) 2021-06-30

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JP (1) JP6896459B2 (cg-RX-API-DMAC7.html)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111595823A (zh) * 2020-03-09 2020-08-28 宁波普瑞柏生物技术股份有限公司 一种散射比浊测量仪

Family Cites Families (7)

* Cited by examiner, † Cited by third party
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JPS61129153U (cg-RX-API-DMAC7.html) * 1985-01-30 1986-08-13
GB2475458B (en) * 2008-09-26 2012-05-23 Horiba Ltd Particle characterization instrument
JP5216051B2 (ja) * 2010-06-23 2013-06-19 株式会社日立ハイテクノロジーズ 自動分析装置および自動分析方法
US20130294974A1 (en) * 2010-12-08 2013-11-07 Hitachi High-Technologies Corporation Automatic analyzer
WO2013185621A1 (zh) * 2012-06-14 2013-12-19 南京拓鉒医药科技有限公司 内毒素检测系统及其检测方法
JP6013796B2 (ja) * 2012-06-25 2016-10-25 株式会社日立ハイテクノロジーズ 自動分析装置及び試料測定方法
JP6183826B2 (ja) * 2013-03-12 2017-08-23 国立大学法人 筑波大学 光散乱体の光学的測定方法、光学的測定装置及び光学的記録媒体

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