JP2018089082A - 眼科測定装置 - Google Patents

眼科測定装置 Download PDF

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Publication number
JP2018089082A
JP2018089082A JP2016234565A JP2016234565A JP2018089082A JP 2018089082 A JP2018089082 A JP 2018089082A JP 2016234565 A JP2016234565 A JP 2016234565A JP 2016234565 A JP2016234565 A JP 2016234565A JP 2018089082 A JP2018089082 A JP 2018089082A
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Japan
Prior art keywords
image
measurement
purkinje
index
optical system
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Pending
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JP2016234565A
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English (en)
Japanese (ja)
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JP2018089082A5 (enExample
Inventor
泰久 村上
Yasuhisa Murakami
泰久 村上
邦生 鈴木
Kunio Suzuki
邦生 鈴木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nidek Co Ltd
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Nidek Co Ltd
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Application filed by Nidek Co Ltd filed Critical Nidek Co Ltd
Priority to JP2016234565A priority Critical patent/JP2018089082A/ja
Publication of JP2018089082A publication Critical patent/JP2018089082A/ja
Publication of JP2018089082A5 publication Critical patent/JP2018089082A5/ja
Priority to JP2022071367A priority patent/JP2022101653A/ja
Pending legal-status Critical Current

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  • Eye Examination Apparatus (AREA)
JP2016234565A 2016-12-01 2016-12-01 眼科測定装置 Pending JP2018089082A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2016234565A JP2018089082A (ja) 2016-12-01 2016-12-01 眼科測定装置
JP2022071367A JP2022101653A (ja) 2016-12-01 2022-04-25 眼科測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2016234565A JP2018089082A (ja) 2016-12-01 2016-12-01 眼科測定装置

Related Child Applications (1)

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JP2022071367A Division JP2022101653A (ja) 2016-12-01 2022-04-25 眼科測定装置

Publications (2)

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JP2018089082A true JP2018089082A (ja) 2018-06-14
JP2018089082A5 JP2018089082A5 (enExample) 2019-12-05

Family

ID=62564802

Family Applications (2)

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JP2016234565A Pending JP2018089082A (ja) 2016-12-01 2016-12-01 眼科測定装置
JP2022071367A Pending JP2022101653A (ja) 2016-12-01 2022-04-25 眼科測定装置

Family Applications After (1)

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JP2022071367A Pending JP2022101653A (ja) 2016-12-01 2022-04-25 眼科測定装置

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JP (2) JP2018089082A (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2021074101A (ja) * 2019-11-06 2021-05-20 株式会社ニデック 眼科測定装置
US11547294B2 (en) * 2018-09-18 2023-01-10 Topcon Corporation Ophthalmic apparatus, controlling method thereof, and recording medium
JP2023546655A (ja) * 2020-10-27 2023-11-07 アルコン インコーポレイティド 角膜トポグラファーのためのプラチドパターン

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003164483A (ja) * 2001-12-03 2003-06-10 Nidek Co Ltd 眼科装置及び角膜手術装置
JP2010110393A (ja) * 2008-11-05 2010-05-20 Nidek Co Ltd 眼科撮影装置
JP2015104554A (ja) * 2013-11-29 2015-06-08 株式会社ニデック 眼科測定装置および眼科測定プログラム

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2268192B8 (en) * 2008-04-17 2022-01-19 Stichting VUmc Apparatus for corneal shape analysis and method for determining a corneal thickness

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003164483A (ja) * 2001-12-03 2003-06-10 Nidek Co Ltd 眼科装置及び角膜手術装置
JP2010110393A (ja) * 2008-11-05 2010-05-20 Nidek Co Ltd 眼科撮影装置
JP2015104554A (ja) * 2013-11-29 2015-06-08 株式会社ニデック 眼科測定装置および眼科測定プログラム

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11547294B2 (en) * 2018-09-18 2023-01-10 Topcon Corporation Ophthalmic apparatus, controlling method thereof, and recording medium
US11813022B2 (en) 2018-09-18 2023-11-14 Topcon Corporation Ophthalmic apparatus, controlling method thereof, and recording medium
JP2021074101A (ja) * 2019-11-06 2021-05-20 株式会社ニデック 眼科測定装置
JP7415453B2 (ja) 2019-11-06 2024-01-17 株式会社ニデック 眼科測定装置
JP2023546655A (ja) * 2020-10-27 2023-11-07 アルコン インコーポレイティド 角膜トポグラファーのためのプラチドパターン

Also Published As

Publication number Publication date
JP2022101653A (ja) 2022-07-06

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