JP2018018304A5 - - Google Patents

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Publication number
JP2018018304A5
JP2018018304A5 JP2016148118A JP2016148118A JP2018018304A5 JP 2018018304 A5 JP2018018304 A5 JP 2018018304A5 JP 2016148118 A JP2016148118 A JP 2016148118A JP 2016148118 A JP2016148118 A JP 2016148118A JP 2018018304 A5 JP2018018304 A5 JP 2018018304A5
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electronic component
unit
image
model image
component placement
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JP2016148118A
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Japanese (ja)
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JP6759809B2 (ja
JP2018018304A (ja
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Priority to JP2016148118A priority Critical patent/JP6759809B2/ja
Priority claimed from JP2016148118A external-priority patent/JP6759809B2/ja
Priority to TW106124856A priority patent/TW201803787A/zh
Priority to CN201710626908.7A priority patent/CN107661867B/zh
Publication of JP2018018304A publication Critical patent/JP2018018304A/ja
Publication of JP2018018304A5 publication Critical patent/JP2018018304A5/ja
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JP2016148118A 2016-07-28 2016-07-28 電子部品搬送装置及び電子部品検査装置 Active JP6759809B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2016148118A JP6759809B2 (ja) 2016-07-28 2016-07-28 電子部品搬送装置及び電子部品検査装置
TW106124856A TW201803787A (zh) 2016-07-28 2017-07-25 電子零件搬送裝置及電子零件檢查裝置
CN201710626908.7A CN107661867B (zh) 2016-07-28 2017-07-27 电子部件搬送装置以及电子部件检查装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2016148118A JP6759809B2 (ja) 2016-07-28 2016-07-28 電子部品搬送装置及び電子部品検査装置

Publications (3)

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JP2018018304A JP2018018304A (ja) 2018-02-01
JP2018018304A5 true JP2018018304A5 (enExample) 2019-06-20
JP6759809B2 JP6759809B2 (ja) 2020-09-23

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ID=61081820

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JP2016148118A Active JP6759809B2 (ja) 2016-07-28 2016-07-28 電子部品搬送装置及び電子部品検査装置

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JP (1) JP6759809B2 (enExample)
CN (1) CN107661867B (enExample)
TW (1) TW201803787A (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113820576B (zh) * 2020-06-17 2023-11-14 Tcl科技集团股份有限公司 测试发光二极管器件的方法及装置

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62274379A (ja) * 1986-05-22 1987-11-28 Kubota Ltd 果実認識用の画像処理装置
JP3528184B2 (ja) * 1991-10-31 2004-05-17 ソニー株式会社 画像信号の輝度補正装置及び輝度補正方法
JP4111613B2 (ja) * 1998-12-16 2008-07-02 富士通株式会社 半導体検査方法及び装置
JP2001125535A (ja) * 1999-10-29 2001-05-11 Fujitsu General Ltd 画質補正回路
JP2001067478A (ja) * 1999-08-30 2001-03-16 Oki Electric Ind Co Ltd 実装部品の検査装置および実装部品の検査方法
JP5196731B2 (ja) * 2006-04-20 2013-05-15 キヤノン株式会社 画像処理装置及び画像処理方法
JP2010060810A (ja) * 2008-09-03 2010-03-18 Samsung Digital Imaging Co Ltd 撮像装置及び撮像方法
JP5861462B2 (ja) * 2012-01-17 2016-02-16 オムロン株式会社 はんだ検査のための検査基準登録方法およびその方法を用いた基板検査装置
JP6061488B2 (ja) * 2012-04-26 2017-01-18 キヤノン株式会社 画像処理装置及び画像処理方法
JP6083140B2 (ja) * 2012-07-20 2017-02-22 セイコーエプソン株式会社 電子部品搬送装置および電子部品検査装置
CN103458194B (zh) * 2013-08-28 2017-02-22 中国科学院深圳先进技术研究院 分析数码影像曝光程度的方法、装置和一种数字成像系统
CN104994306B (zh) * 2015-06-29 2019-05-03 厦门美图之家科技有限公司 一种基于脸部亮度自动调整曝光度的摄像方法和摄像装置
JP6140255B2 (ja) * 2015-11-13 2017-05-31 株式会社キーエンス 画像処理装置及び画像処理方法

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