JP2017532602A5 - 画像ベースの測定および散乱測定ベースのオーバーレイ測定のための信号応答計測 - Google Patents
画像ベースの測定および散乱測定ベースのオーバーレイ測定のための信号応答計測 Download PDFInfo
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- JP2017532602A5 JP2017532602A5 JP2017519824A JP2017519824A JP2017532602A5 JP 2017532602 A5 JP2017532602 A5 JP 2017532602A5 JP 2017519824 A JP2017519824 A JP 2017519824A JP 2017519824 A JP2017519824 A JP 2017519824A JP 2017532602 A5 JP2017532602 A5 JP 2017532602A5
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JP2020067345A JP6983944B2 (ja) | 2014-10-14 | 2020-04-03 | 画像ベースの測定のための方法および測定システム |
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US201462063932P | 2014-10-14 | 2014-10-14 | |
US62/063,932 | 2014-10-14 | ||
US14/880,077 | 2015-10-09 | ||
US14/880,077 US10210606B2 (en) | 2014-10-14 | 2015-10-09 | Signal response metrology for image based and scatterometry overlay measurements |
PCT/US2015/055373 WO2016061128A1 (en) | 2014-10-14 | 2015-10-13 | Signal response metrology for image based and scatterometry overlay measurements |
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JP2020067345A Division JP6983944B2 (ja) | 2014-10-14 | 2020-04-03 | 画像ベースの測定のための方法および測定システム |
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JP2017532602A JP2017532602A (ja) | 2017-11-02 |
JP2017532602A5 true JP2017532602A5 (ja) | 2018-11-22 |
JP6688294B2 JP6688294B2 (ja) | 2020-04-28 |
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JP2017519824A Active JP6688294B2 (ja) | 2014-10-14 | 2015-10-13 | 画像ベースの測定および散乱測定ベースのオーバーレイ測定のための信号応答計測 |
JP2020067345A Active JP6983944B2 (ja) | 2014-10-14 | 2020-04-03 | 画像ベースの測定のための方法および測定システム |
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US (1) | US10210606B2 (ja) |
JP (2) | JP6688294B2 (ja) |
KR (2) | KR102486070B1 (ja) |
CN (2) | CN107076681B (ja) |
IL (1) | IL250087B (ja) |
TW (1) | TWI703652B (ja) |
WO (1) | WO2016061128A1 (ja) |
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2015
- 2015-10-09 US US14/880,077 patent/US10210606B2/en active Active
- 2015-10-13 KR KR1020177012417A patent/KR102486070B1/ko active IP Right Grant
- 2015-10-13 KR KR1020227025403A patent/KR102538261B1/ko active IP Right Grant
- 2015-10-13 CN CN201580055448.6A patent/CN107076681B/zh active Active
- 2015-10-13 WO PCT/US2015/055373 patent/WO2016061128A1/en active Application Filing
- 2015-10-13 JP JP2017519824A patent/JP6688294B2/ja active Active
- 2015-10-13 CN CN201910872426.9A patent/CN110596146B/zh active Active
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