JP2017523403A5 - - Google Patents
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- JP2017523403A5 JP2017523403A5 JP2016574255A JP2016574255A JP2017523403A5 JP 2017523403 A5 JP2017523403 A5 JP 2017523403A5 JP 2016574255 A JP2016574255 A JP 2016574255A JP 2016574255 A JP2016574255 A JP 2016574255A JP 2017523403 A5 JP2017523403 A5 JP 2017523403A5
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- frequency
- signal
- optical
- distance
- sweep
- Prior art date
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- 230000003287 optical Effects 0.000 claims description 122
- 238000005259 measurement Methods 0.000 claims description 99
- 239000003365 glass fiber Substances 0.000 claims description 75
- 238000005305 interferometry Methods 0.000 claims description 24
- 238000005070 sampling Methods 0.000 claims description 17
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- 238000000034 method Methods 0.000 claims description 16
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- 229910052691 Erbium Inorganic materials 0.000 description 1
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- UYAHIZSMUZPPFV-UHFFFAOYSA-N erbium Chemical compound [Er] UYAHIZSMUZPPFV-UHFFFAOYSA-N 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
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Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB1411206.4 | 2014-06-24 | ||
| GBGB1411206.4A GB201411206D0 (en) | 2014-06-24 | 2014-06-24 | Dual laser frequency sweep interferometry system and method |
| PCT/GB2015/051839 WO2015198044A1 (en) | 2014-06-24 | 2015-06-24 | Dual laser frequency sweep interferometry system and method |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2017523403A JP2017523403A (ja) | 2017-08-17 |
| JP2017523403A5 true JP2017523403A5 (zh) | 2018-08-09 |
| JP6486971B2 JP6486971B2 (ja) | 2019-03-20 |
Family
ID=51410039
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2016574255A Active JP6486971B2 (ja) | 2014-06-24 | 2015-06-24 | 二重レーザ周波数掃引干渉測定システムおよび方法 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US10168137B2 (zh) |
| EP (1) | EP3161408B1 (zh) |
| JP (1) | JP6486971B2 (zh) |
| CN (1) | CN106687762B (zh) |
| ES (1) | ES2700875T3 (zh) |
| GB (2) | GB201411206D0 (zh) |
| WO (1) | WO2015198044A1 (zh) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7222433B2 (ja) | 2019-09-24 | 2023-02-15 | 日本電信電話株式会社 | 測距装置 |
Families Citing this family (32)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10527412B2 (en) | 2015-10-06 | 2020-01-07 | Bridger Photonics, Inc. | Gas-mapping 3D imager measurement techniques and method of data processing |
| CN109891261B (zh) * | 2016-07-28 | 2023-11-24 | 通用汽车环球科技运作有限责任公司 | 分布式交通工具激光雷达系统 |
| DE102017005395B4 (de) * | 2017-06-06 | 2019-10-10 | Blickfeld GmbH | LIDAR-Entfernungsmessung mit Scanner und FLASH-Lichtquelle |
| CN107390232B (zh) * | 2017-06-26 | 2019-02-05 | 南京牧镭激光科技有限公司 | 一种多普勒激光雷达测风方法及装置 |
| DE102018116953B4 (de) | 2017-07-12 | 2022-09-22 | GM Global Technology Operations LLC | Kalibrierung und ausrichtung des kohärenten lidar-systems |
| US11226403B2 (en) * | 2017-07-12 | 2022-01-18 | GM Global Technology Operations LLC | Chip-scale coherent lidar with integrated high power laser diode |
| CN107272020B (zh) * | 2017-07-19 | 2020-06-09 | 哈尔滨工业大学 | 基于Gm-APD的高灵敏偏振激光雷达系统 |
| WO2019060901A1 (en) | 2017-09-25 | 2019-03-28 | Bridger Photonics, Inc. | SCANNING SYSTEMS AND TECHNIQUES AND EXAMPLES OF USE IN FMCW LIDAR PROCESSES AND APPARATUSES |
| WO2019070751A1 (en) | 2017-10-02 | 2019-04-11 | Bridger Photonics, Inc. | PROCESSING TEMPORAL SEGMENTS OF LASER WAVE LENGTH FLUCTUATIONS AND EXAMPLES OF USE IN FREQUENCY MODULATED MAINTAINED WAVE LIDAR (FMCW) METHODS AND APPARATUSES |
| WO2019079448A1 (en) | 2017-10-17 | 2019-04-25 | Bridger Photonics, Inc. | ROTARY OPTICAL REFLECTOR APPARATUSES AND METHODS |
| US11112308B2 (en) | 2017-11-14 | 2021-09-07 | Bridger Photonics, Inc. | Apparatuses and methods for anomalous gas concentration detection |
| CA3099735A1 (en) * | 2018-05-10 | 2019-11-14 | Ours Technology, Inc. | Lidar system based on light modulator and coherent receiver for simultaneous range and velocity measurement |
| CN112204428B (zh) * | 2018-05-24 | 2024-03-22 | 三菱电机株式会社 | 光测距装置以及加工装置 |
| CN108845333B (zh) * | 2018-06-07 | 2022-07-01 | 天津大学 | 一种抑制振动效应的调频连续波激光测距方法 |
| CN108873007B (zh) * | 2018-06-07 | 2022-07-01 | 天津大学 | 一种抑制振动效应的调频连续波激光测距装置 |
| EP3581962A1 (de) * | 2018-06-11 | 2019-12-18 | Hexagon Technology Center GmbH | Dual-beam fmcw distanzmessverfahren mit kompensation eines geschwindigkeitsabhängigen distanzmessfehlers |
| CN112236688B (zh) | 2018-06-12 | 2024-03-22 | 三菱电机株式会社 | 光测距装置以及加工装置 |
| WO2019244242A1 (ja) * | 2018-06-19 | 2019-12-26 | 三菱電機株式会社 | 光測距装置及び加工装置 |
| US20210293960A1 (en) * | 2018-07-18 | 2021-09-23 | Bridger Photonics, Inc. | Methods and apparatuses for range peak pairing and high-accuracy target tracking using fmcw ladar measurements |
| CN109031340B (zh) * | 2018-07-26 | 2022-07-08 | 天津大学 | 一种测量物体运动速度的连续调频激光雷达装置 |
| CN109031341B (zh) * | 2018-07-26 | 2022-07-01 | 天津大学 | 一种使用连续调频激光雷达装置的物体运动速度测量方法 |
| CN109541621B (zh) * | 2018-10-15 | 2022-07-08 | 天津大学 | 一种频率扫描干涉绝对测距系统的振动补偿方法 |
| DE102018220227A1 (de) * | 2018-11-26 | 2020-05-28 | Robert Bosch Gmbh | LIDAR-Sensor und Verfahren zur optischen Erfassung eines Sichtfeldes |
| DE102019135648A1 (de) * | 2019-12-21 | 2021-06-24 | Carl Zeiss Ag | Vorrichtung und Verfahren zur Abstandsermittlung eines Objekts |
| CN118011361A (zh) | 2020-04-03 | 2024-05-10 | 阿克罗诺斯公司 | 用于测距应用的频率信息快速提取 |
| US11320255B2 (en) * | 2020-08-11 | 2022-05-03 | Raytheon Company | Swept frequency photonic integrated circuit for absolute metrology |
| US11221204B1 (en) | 2020-08-11 | 2022-01-11 | Raytheon Company | Heterodyne photonic integrated circuit for absolute metrology |
| CN112034483B (zh) * | 2020-08-28 | 2022-07-08 | 中国科学院上海光学精密机械研究所 | 基于相干探测关联成像技术的多目标距离--速度解耦方法 |
| CN113776445A (zh) * | 2021-07-20 | 2021-12-10 | 重庆大学 | 一种单调频干涉的转静子轴向间隙高速动态测量方法 |
| CN113916351B (zh) * | 2021-10-28 | 2024-03-12 | 苏州光格科技股份有限公司 | 光纤振动监测系统 |
| CN114415201B (zh) * | 2022-01-24 | 2024-05-10 | 湖北工业大学 | 基于频移干涉的激光雷达测距测速装置 |
| US20230314277A1 (en) * | 2022-03-17 | 2023-10-05 | Lumenis Ltd. | Techniques for determining distance between a fiber end and a target |
Family Cites Families (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| BE1007876A4 (nl) * | 1993-12-17 | 1995-11-07 | Philips Electronics Nv | Stralingsbron-eenheid voor het opwekken van een bundel met twee polarisatierichtingen en twee frequenties. |
| DE59607789D1 (de) | 1995-06-08 | 2001-10-31 | Siemens Ag | Blockierungsfreie multicast wdm-koppelanordnung |
| US5748313A (en) * | 1996-11-14 | 1998-05-05 | Hewlett-Packard Company | Signal-to-noise ratio of second harmonic interferometers |
| JP3973769B2 (ja) * | 1998-08-19 | 2007-09-12 | 富士通株式会社 | 波長変換のための方法及び装置 |
| JP2002168732A (ja) * | 2000-11-29 | 2002-06-14 | Ando Electric Co Ltd | 光ファイバ波長分散分布測定器及び測定方法 |
| US7054057B2 (en) * | 2001-03-27 | 2006-05-30 | The Furukawa Electric Co., Ltd. | Multi-frequency light source |
| US6825934B2 (en) * | 2002-03-14 | 2004-11-30 | Agilent Technologies, Inc. | Vibration noise mitigation in an interferometric system |
| US20060088068A1 (en) | 2004-10-13 | 2006-04-27 | Intune Technologies | Low noise swept wavelength laser system and method |
| US7884947B2 (en) * | 2005-01-20 | 2011-02-08 | Zygo Corporation | Interferometry for determining characteristics of an object surface, with spatially coherent illumination |
| JP4701928B2 (ja) | 2005-09-01 | 2011-06-15 | 株式会社日立製作所 | 光電界波形観測装置 |
| US7841728B2 (en) | 2005-10-20 | 2010-11-30 | Seiko Epson Corporation | Image display apparatus |
| US7372576B2 (en) * | 2005-11-01 | 2008-05-13 | Agilent Technologies, Inc. | System and method for generating beams of light using an anisotropic acousto-optic modulator |
| JP2007271925A (ja) * | 2006-03-31 | 2007-10-18 | Fujitsu Ltd | 光集積素子 |
| GB0611807D0 (en) * | 2006-06-14 | 2006-07-26 | Univ Huddersfield | A near common-path optical fibre interferometer for potentially fast on-line micro/nano scale surface measurement |
| WO2008080636A1 (en) * | 2007-01-04 | 2008-07-10 | Telefonaktiebolaget Lm Ericsson (Publ) | Improvements in or relating to the sampling of optical signals |
| US8175126B2 (en) | 2008-10-08 | 2012-05-08 | Telaris, Inc. | Arbitrary optical waveform generation utilizing optical phase-locked loops |
| US8179534B2 (en) * | 2010-08-11 | 2012-05-15 | Mitutoyo Corporation | Fixed wavelength absolute distance interferometer |
| US20120170047A1 (en) * | 2011-01-03 | 2012-07-05 | Qualcomm Mems Technologies, Inc. | System and method for measuring a distance |
| DE102012001754B4 (de) * | 2012-01-30 | 2015-05-07 | Karlsruher Institut für Technologie | Mehrskalige Distanzmessung mit Frequenzkämmen |
| CN104412125B (zh) * | 2012-03-29 | 2019-04-05 | Npl管理有限公司 | 测量装置、系统和方法 |
-
2014
- 2014-06-24 GB GBGB1411206.4A patent/GB201411206D0/en not_active Ceased
-
2015
- 2015-06-24 GB GB1511133.9A patent/GB2529752A/en not_active Withdrawn
- 2015-06-24 WO PCT/GB2015/051839 patent/WO2015198044A1/en active Application Filing
- 2015-06-24 US US15/322,017 patent/US10168137B2/en active Active
- 2015-06-24 CN CN201580036930.5A patent/CN106687762B/zh active Active
- 2015-06-24 JP JP2016574255A patent/JP6486971B2/ja active Active
- 2015-06-24 ES ES15744631T patent/ES2700875T3/es active Active
- 2015-06-24 EP EP15744631.1A patent/EP3161408B1/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7222433B2 (ja) | 2019-09-24 | 2023-02-15 | 日本電信電話株式会社 | 測距装置 |
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