JP2017227552A - 絶縁電圧プローブ - Google Patents
絶縁電圧プローブ Download PDFInfo
- Publication number
- JP2017227552A JP2017227552A JP2016124386A JP2016124386A JP2017227552A JP 2017227552 A JP2017227552 A JP 2017227552A JP 2016124386 A JP2016124386 A JP 2016124386A JP 2016124386 A JP2016124386 A JP 2016124386A JP 2017227552 A JP2017227552 A JP 2017227552A
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- Prior art keywords
- voltage
- magnetic sensor
- voltage probe
- electrode lead
- insulation
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
- G01R15/18—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using inductive devices, e.g. transformers
- G01R15/181—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using inductive devices, e.g. transformers using coils without a magnetic core, e.g. Rogowski coils
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0084—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring voltage only
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/07—Non contact-making probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06766—Input circuits therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
- G01R15/18—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using inductive devices, e.g. transformers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
- G01R15/20—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using galvano-magnetic devices, e.g. Hall-effect devices, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Measurement Of Current Or Voltage (AREA)
Abstract
【解決手段】正極リードと負極リードとが抵抗で接続されて構成された導体と、導体を流れる電流により生じる磁界を非接触で測定する磁気センサと、磁気センサの出力に基づく信号を伝送する同軸ケーブルと、を備えた絶縁電圧プローブ。
【選択図】図1
Description
ここで、前記磁気センサは、磁界に応じた電流を出力し、前記磁気センサが出力する電流を電圧に変換して前記同軸ケーブルを伝送させるI/V変換回路をさらに備えていてもよい。
また、前記抵抗は、特性の等しい2本の抵抗素子で構成されていてもよい。
110…プローブヘッド
111…正極リード
112…負極リード
113…導体
116…磁気センサ
117…I/V変換回路
120…同軸ケーブル
130…コネクタ
200…測定器
Claims (3)
- 正極リードと負極リードとが抵抗で接続されて構成された導体と、
前記導体を流れる電流により生じる磁界を非接触で測定する磁気センサと、
前記磁気センサの出力に基づく信号を伝送する同軸ケーブルと、
を備えたことを特徴とする絶縁電圧プローブ。 - 前記磁気センサは、磁界に応じた電流を出力し、
前記磁気センサが出力する電流を電圧に変換して前記同軸ケーブルを伝送させるI/V変換回路をさらに備えることを特徴とする請求項1に記載の絶縁電圧プローブ。 - 前記抵抗は、特性の等しい2本の抵抗素子で構成されていることを特徴とする請求項1または2に記載の絶縁電圧プローブ。
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016124386A JP6434456B2 (ja) | 2016-06-23 | 2016-06-23 | 絶縁電圧プローブ |
US15/588,843 US10962572B2 (en) | 2016-06-23 | 2017-05-08 | Isolated voltage probe |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016124386A JP6434456B2 (ja) | 2016-06-23 | 2016-06-23 | 絶縁電圧プローブ |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2017227552A true JP2017227552A (ja) | 2017-12-28 |
JP6434456B2 JP6434456B2 (ja) | 2018-12-05 |
Family
ID=60675500
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2016124386A Active JP6434456B2 (ja) | 2016-06-23 | 2016-06-23 | 絶縁電圧プローブ |
Country Status (2)
Country | Link |
---|---|
US (1) | US10962572B2 (ja) |
JP (1) | JP6434456B2 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20170370967A1 (en) * | 2016-06-23 | 2017-12-28 | Yokogawa Electric Corporation | Isolated voltage probe |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0494574U (ja) * | 1990-12-28 | 1992-08-17 | ||
JPH0622217Y2 (ja) * | 1989-12-05 | 1994-06-08 | 株式会社東芝 | 絶縁形電圧プローブ |
JPH06331657A (ja) * | 1993-05-19 | 1994-12-02 | Yokogawa Electric Corp | プローブ |
JPH075201A (ja) * | 1993-06-18 | 1995-01-10 | Yokogawa Electric Corp | プローブ |
JPH07113822A (ja) * | 1993-10-13 | 1995-05-02 | Sony Tektronix Corp | フローティング測定用プローブ |
US20120074928A1 (en) * | 2010-09-23 | 2012-03-29 | Honeywell International, Inc. | System and Method for Improving Accuracy of High Voltage Phasing Voltmeters |
JP2015206596A (ja) * | 2014-04-17 | 2015-11-19 | 日置電機株式会社 | 電流センサおよび測定装置 |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
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US5973501A (en) * | 1993-10-18 | 1999-10-26 | Metropolitan Industries, Inc. | Current and voltage probe for measuring harmonic distortion |
US6118270A (en) * | 1998-02-17 | 2000-09-12 | Singer; Jerome R. | Apparatus for fast measurements of current and power with scaleable wand-like sensor |
JP2003315373A (ja) * | 2002-04-18 | 2003-11-06 | Toshiba Corp | 電流検出装置及び半導体装置 |
US7679162B2 (en) * | 2005-12-19 | 2010-03-16 | Silicon Laboratories Inc. | Integrated current sensor package |
CN101566642B (zh) * | 2008-04-10 | 2013-11-20 | Mks仪器有限公司 | 具有高动态范围的正交射频电压/电流传感器 |
US9304150B2 (en) * | 2011-09-30 | 2016-04-05 | Keysight Technologies, Inc. | Closed core current probe |
US9291649B2 (en) * | 2012-08-16 | 2016-03-22 | Mks Instruments, Inc. | On the enhancements of planar based RF sensor technology |
US9958480B2 (en) * | 2015-02-10 | 2018-05-01 | Qualcomm Incorporated | Apparatus and method for a current sensor |
US9689900B1 (en) * | 2015-12-14 | 2017-06-27 | Keysight Technologies, Inc. | Current sensing circuit |
JP6434456B2 (ja) * | 2016-06-23 | 2018-12-05 | 横河電機株式会社 | 絶縁電圧プローブ |
US11300588B2 (en) * | 2017-04-21 | 2022-04-12 | Rohde & Schwarz Gmbh & Co. Kg | Adapter for a current probe and testing system |
US10539643B2 (en) * | 2017-09-01 | 2020-01-21 | Fluke Corporation | Proving unit for use with electrical test tools |
-
2016
- 2016-06-23 JP JP2016124386A patent/JP6434456B2/ja active Active
-
2017
- 2017-05-08 US US15/588,843 patent/US10962572B2/en active Active
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0622217Y2 (ja) * | 1989-12-05 | 1994-06-08 | 株式会社東芝 | 絶縁形電圧プローブ |
JPH0494574U (ja) * | 1990-12-28 | 1992-08-17 | ||
JPH06331657A (ja) * | 1993-05-19 | 1994-12-02 | Yokogawa Electric Corp | プローブ |
JPH075201A (ja) * | 1993-06-18 | 1995-01-10 | Yokogawa Electric Corp | プローブ |
JPH07113822A (ja) * | 1993-10-13 | 1995-05-02 | Sony Tektronix Corp | フローティング測定用プローブ |
US20120074928A1 (en) * | 2010-09-23 | 2012-03-29 | Honeywell International, Inc. | System and Method for Improving Accuracy of High Voltage Phasing Voltmeters |
JP2015206596A (ja) * | 2014-04-17 | 2015-11-19 | 日置電機株式会社 | 電流センサおよび測定装置 |
Non-Patent Citations (1)
Title |
---|
""電圧計で、ホール効果を用いて計測するものがあると聞いたのです..."", YAHOO!知恵袋 [ONLINE], JPN6018015166, 25 June 2010 (2010-06-25), ISSN: 0003786567 * |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20170370967A1 (en) * | 2016-06-23 | 2017-12-28 | Yokogawa Electric Corporation | Isolated voltage probe |
US10962572B2 (en) * | 2016-06-23 | 2021-03-30 | Yokogawa Electric Corporation | Isolated voltage probe |
Also Published As
Publication number | Publication date |
---|---|
US10962572B2 (en) | 2021-03-30 |
JP6434456B2 (ja) | 2018-12-05 |
US20170370967A1 (en) | 2017-12-28 |
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