JP2017152555A5 - - Google Patents
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- JP2017152555A5 JP2017152555A5 JP2016033929A JP2016033929A JP2017152555A5 JP 2017152555 A5 JP2017152555 A5 JP 2017152555A5 JP 2016033929 A JP2016033929 A JP 2016033929A JP 2016033929 A JP2016033929 A JP 2016033929A JP 2017152555 A5 JP2017152555 A5 JP 2017152555A5
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- Prior art keywords
- electronic component
- unit
- flow rate
- ejection
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Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2016033929A JP6668816B2 (ja) | 2016-02-25 | 2016-02-25 | 電子部品搬送装置および電子部品検査装置 |
| TW106102837A TWI625294B (zh) | 2016-01-28 | 2017-01-25 | Electronic component conveying device and electronic component inspection device |
| TW107108660A TWI728237B (zh) | 2016-01-28 | 2017-01-25 | 電子零件搬送裝置及電子零件檢查裝置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2016033929A JP6668816B2 (ja) | 2016-02-25 | 2016-02-25 | 電子部品搬送装置および電子部品検査装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2017152555A JP2017152555A (ja) | 2017-08-31 |
| JP2017152555A5 true JP2017152555A5 (https=) | 2019-01-24 |
| JP6668816B2 JP6668816B2 (ja) | 2020-03-18 |
Family
ID=59739807
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2016033929A Active JP6668816B2 (ja) | 2016-01-28 | 2016-02-25 | 電子部品搬送装置および電子部品検査装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP6668816B2 (https=) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7841999B2 (ja) * | 2022-09-26 | 2026-04-07 | ファスフォードテクノロジ株式会社 | 半導体製造装置および半導体装置の製造方法 |
| KR20260030441A (ko) * | 2024-08-27 | 2026-03-06 | 한화세미텍 주식회사 | 부품 흡착 높이 보정 장치 및 방법 |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0612254B2 (ja) * | 1985-08-29 | 1994-02-16 | マツダ株式会社 | 穴の求心方法 |
| JP2002277384A (ja) * | 2001-03-19 | 2002-09-25 | Ishikawajima Inspection & Instrumentation Co | 欠陥検出方法及び装置 |
| US8028100B2 (en) * | 2006-05-05 | 2011-09-27 | Data I/O Corporation | Automated processing system employing intelligent module automatic recognition |
| JP5359801B2 (ja) * | 2009-11-13 | 2013-12-04 | セイコーエプソン株式会社 | 電子部品検査装置、および電子部品搬送装置 |
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2016
- 2016-02-25 JP JP2016033929A patent/JP6668816B2/ja active Active
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