JP2017072563A - X線検査装置 - Google Patents
X線検査装置 Download PDFInfo
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- JP2017072563A JP2017072563A JP2015201445A JP2015201445A JP2017072563A JP 2017072563 A JP2017072563 A JP 2017072563A JP 2015201445 A JP2015201445 A JP 2015201445A JP 2015201445 A JP2015201445 A JP 2015201445A JP 2017072563 A JP2017072563 A JP 2017072563A
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- 238000007689 inspection Methods 0.000 title claims abstract description 39
- 238000007664 blowing Methods 0.000 claims abstract description 6
- 238000001816 cooling Methods 0.000 abstract description 9
- 238000005192 partition Methods 0.000 description 18
- 230000005540 biological transmission Effects 0.000 description 4
- 230000007547 defect Effects 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 229910001220 stainless steel Inorganic materials 0.000 description 2
- 239000010935 stainless steel Substances 0.000 description 2
- 206010037660 Pyrexia Diseases 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000001747 exhibiting effect Effects 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
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Abstract
Description
Claims (5)
- X線を発生させるX線発生部が筐体内に配置されたX線検査装置であって、
空気を送風する送風装置を備え、
前記送風装置は、前記X線発生部、又は、前記X線発生部と熱交換を行う熱交換部材に対して前記空気を送風する、X線検査装置。 - 前記熱交換部材は、
前記X線発生部が載置されると共に、熱伝導性を有する載置部と、
前記載置部を支持すると共に、前記載置部の下方に空間を形成する一対の支持部と、を有し、
前記送風装置は、前記空間に向けて前記空気を送風する、請求項1に記載のX線検査装置。 - 前記X線発生部を含む機器の動作を制御する制御基板を備え、
前記制御基板は、前記送風装置と前記X線発生部又は前記熱交換部材との間以外の位置に配置されている、請求項1又は2に記載のX線検査装置。 - 前記送風装置は、冷却された前記空気を送風するクーラーである、請求項1〜3のいずれか一項に記載のX線検査装置。
- 前記送風装置から送風された前記空気を、前記X線検査装置、又は、前記熱交換部材に向けて送風するファンを備える、請求項1〜4のいずれか一項に記載のX線検査装置。
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JP2015201445A JP6619607B2 (ja) | 2015-10-09 | 2015-10-09 | X線検査装置 |
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JP2015201445A JP6619607B2 (ja) | 2015-10-09 | 2015-10-09 | X線検査装置 |
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JP2017072563A true JP2017072563A (ja) | 2017-04-13 |
JP6619607B2 JP6619607B2 (ja) | 2019-12-11 |
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Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001318062A (ja) * | 2000-05-08 | 2001-11-16 | Anritsu Corp | X線異物検出装置 |
JP2007292497A (ja) * | 2006-04-21 | 2007-11-08 | Ishida Co Ltd | X線検査装置 |
JP2009270876A (ja) * | 2008-05-02 | 2009-11-19 | System Square Inc | 異物検査装置 |
JP2009300379A (ja) * | 2008-06-17 | 2009-12-24 | Anritsu Sanki System Co Ltd | X線異物検出装置 |
JP3172652U (ja) * | 2011-10-14 | 2012-01-05 | 株式会社イシダ | X線検査装置 |
US20150276943A1 (en) * | 2014-03-26 | 2015-10-01 | Ge Medical Systems Global Technology Co. Llc | Thermal management system, an x-ray detection device and a computerized tomography apparatus |
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2015
- 2015-10-09 JP JP2015201445A patent/JP6619607B2/ja active Active
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001318062A (ja) * | 2000-05-08 | 2001-11-16 | Anritsu Corp | X線異物検出装置 |
JP2007292497A (ja) * | 2006-04-21 | 2007-11-08 | Ishida Co Ltd | X線検査装置 |
JP2009270876A (ja) * | 2008-05-02 | 2009-11-19 | System Square Inc | 異物検査装置 |
JP2009300379A (ja) * | 2008-06-17 | 2009-12-24 | Anritsu Sanki System Co Ltd | X線異物検出装置 |
JP3172652U (ja) * | 2011-10-14 | 2012-01-05 | 株式会社イシダ | X線検査装置 |
US20150276943A1 (en) * | 2014-03-26 | 2015-10-01 | Ge Medical Systems Global Technology Co. Llc | Thermal management system, an x-ray detection device and a computerized tomography apparatus |
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