JP2017067730A5 - - Google Patents

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Publication number
JP2017067730A5
JP2017067730A5 JP2015196844A JP2015196844A JP2017067730A5 JP 2017067730 A5 JP2017067730 A5 JP 2017067730A5 JP 2015196844 A JP2015196844 A JP 2015196844A JP 2015196844 A JP2015196844 A JP 2015196844A JP 2017067730 A5 JP2017067730 A5 JP 2017067730A5
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JP
Japan
Prior art keywords
illumination
inspection
inspection light
laminate surface
light
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Application number
JP2015196844A
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English (en)
Japanese (ja)
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JP6428554B2 (ja
JP2017067730A (ja
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Priority to JP2015196844A priority Critical patent/JP6428554B2/ja
Priority claimed from JP2015196844A external-priority patent/JP6428554B2/ja
Publication of JP2017067730A publication Critical patent/JP2017067730A/ja
Publication of JP2017067730A5 publication Critical patent/JP2017067730A5/ja
Application granted granted Critical
Publication of JP6428554B2 publication Critical patent/JP6428554B2/ja
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JP2015196844A 2015-10-02 2015-10-02 検査システム、検査方法 Active JP6428554B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2015196844A JP6428554B2 (ja) 2015-10-02 2015-10-02 検査システム、検査方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2015196844A JP6428554B2 (ja) 2015-10-02 2015-10-02 検査システム、検査方法

Publications (3)

Publication Number Publication Date
JP2017067730A JP2017067730A (ja) 2017-04-06
JP2017067730A5 true JP2017067730A5 (cg-RX-API-DMAC7.html) 2018-08-23
JP6428554B2 JP6428554B2 (ja) 2018-11-28

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ID=58492205

Family Applications (1)

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JP2015196844A Active JP6428554B2 (ja) 2015-10-02 2015-10-02 検査システム、検査方法

Country Status (1)

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JP (1) JP6428554B2 (cg-RX-API-DMAC7.html)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6699694B2 (ja) * 2018-08-28 2020-05-27 大日本印刷株式会社 検査システム、検査方法
JP6901806B1 (ja) * 2020-05-22 2021-07-14 株式会社メック 欠陥検査装置及び欠陥検査方法
JP2023090001A (ja) * 2021-12-17 2023-06-29 株式会社カネカ 医療用具包装体の製造方法、医療用具包装体検査装置および包装体

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03255945A (ja) * 1990-03-06 1991-11-14 Toyobo Co Ltd しわの検出方法
JP3339426B2 (ja) * 1998-10-23 2002-10-28 ダックエンジニアリング株式会社 品質検査装置
WO2007052360A1 (ja) * 2005-11-07 2007-05-10 Fujitsu Limited 積層状態検査装置、積層状態検査方法および積層状態検出プログラム
JP4979114B2 (ja) * 2006-02-02 2012-07-18 株式会社ニレコ ラミネートフィルムの欠陥検出装置及びラミネートフィルムの欠陥検出方法
JP2007248166A (ja) * 2006-03-15 2007-09-27 Dainippon Printing Co Ltd しわ検査装置
JP4936194B2 (ja) * 2008-06-25 2012-05-23 パナソニック株式会社 光透過性フィルムの欠陥検出装置

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