MY194719A - Inspection device for sheet object, and inspection method for sheet object - Google Patents

Inspection device for sheet object, and inspection method for sheet object

Info

Publication number
MY194719A
MY194719A MYPI2018702675A MYPI2018702675A MY194719A MY 194719 A MY194719 A MY 194719A MY PI2018702675 A MYPI2018702675 A MY PI2018702675A MY PI2018702675 A MYPI2018702675 A MY PI2018702675A MY 194719 A MY194719 A MY 194719A
Authority
MY
Malaysia
Prior art keywords
sheet object
sheet
unit
irradiation
projection
Prior art date
Application number
MYPI2018702675A
Inventor
Ikeda Keita
Sugihara Hiroki
Nakata Kazuki
Original Assignee
Toray Industries
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toray Industries filed Critical Toray Industries
Publication of MY194719A publication Critical patent/MY194719A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518—Projection by scanning of the object
    • G01B11/2522—Projection by scanning of the object the position of the object changing and being recorded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/0008—Industrial image inspection checking presence/absence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N2021/8924—Dents; Relief flaws

Landscapes

  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Analytical Chemistry (AREA)
  • Textile Engineering (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Quality & Reliability (AREA)
  • Theoretical Computer Science (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

An inspection device for a sheet object according to the present invention includes an irradiation unit configured to irradiate , with irradiation light, the sheet object that is continuously conveyed; a projection unit configured to project transmitted light or reflected light from the sheet object; an image capture unit configured to capture a projection image projected on the projection unit; and a data processing unit that detects a defect present on the sheet object from image data captured by the image capture unit. The longitudinal direction of the irradiation unit viewed from a direction perpendicular to a traveling surface of the sheet object is the same as a conveyance direction of the sheet object, and the irradiation unit emits light spreading in a sheet width direction of the sheet object. (Figure 1)
MYPI2018702675A 2016-02-05 2016-12-22 Inspection device for sheet object, and inspection method for sheet object MY194719A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2016020526 2016-02-05
PCT/JP2016/088544 WO2017134958A1 (en) 2016-02-05 2016-12-22 Inspection device for sheet-like objects, and inspection method for sheet-like objects

Publications (1)

Publication Number Publication Date
MY194719A true MY194719A (en) 2022-12-15

Family

ID=59499708

Family Applications (1)

Application Number Title Priority Date Filing Date
MYPI2018702675A MY194719A (en) 2016-02-05 2016-12-22 Inspection device for sheet object, and inspection method for sheet object

Country Status (7)

Country Link
US (1) US20190033229A1 (en)
EP (1) EP3413037B1 (en)
JP (1) JP6776899B2 (en)
KR (1) KR102628620B1 (en)
CN (1) CN108603847A (en)
MY (1) MY194719A (en)
WO (1) WO2017134958A1 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7076280B2 (en) * 2018-04-27 2022-05-27 日立造船株式会社 Measuring method and measuring device
KR20230174235A (en) * 2021-04-22 2023-12-27 히다치 조센 가부시키가이샤 inspection device
CN117589771A (en) * 2023-11-20 2024-02-23 杭州环申新材料科技股份有限公司 Transparent packaging bag flaw detection system and method

Family Cites Families (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5210036B1 (en) * 1970-10-07 1977-03-19
JPH04178545A (en) * 1990-11-14 1992-06-25 Fuji Photo Film Co Ltd Method and apparatus for inspecting transparent band-like body
JPH0599639A (en) * 1991-10-09 1993-04-23 Mitsubishi Rayon Co Ltd Inspection device for small unevenness of planar object
JPH06137845A (en) * 1992-10-26 1994-05-20 Nippon Steel Corp Device for inspecting uneven streak on surface of steel plate
CN1099031C (en) * 1995-10-27 2003-01-15 日本钢管株式会社 Method for detecting surface defects and apparatus thereof
JPH10115514A (en) * 1996-07-31 1998-05-06 Takiron Co Ltd Method and apparatus for inspection of surface smoothness
IL119850A (en) * 1996-12-17 2000-11-21 Prolaser Ltd Optical method and apparatus for detecting low frequency defects
JPH11337504A (en) * 1998-05-26 1999-12-10 Central Glass Co Ltd Inspection method and apparatus for discriminating defects in glass sheet
JP2001201429A (en) * 2000-01-18 2001-07-27 Mitsubishi Chemicals Corp Method and device for inspecting defect in inspected base body
JP3824059B2 (en) * 2000-08-03 2006-09-20 Ｊｆｅスチール株式会社 Surface inspection apparatus and manufacturing method of steel plate without micro unevenness defect
JP3654220B2 (en) * 2001-08-22 2005-06-02 セイコーエプソン株式会社 Lens inspection device
US7105848B2 (en) * 2002-04-15 2006-09-12 Wintriss Engineering Corporation Dual level out-of-focus light source for amplification of defects on a surface
JP4081414B2 (en) * 2002-10-08 2008-04-23 新日本製鐵株式会社 Strip shape inspection method and apparatus
TWI239817B (en) * 2002-12-20 2005-09-21 Japan Tobacco Inc Rolling paper inspection device and tobacco rolled up device
JP2005134362A (en) * 2003-05-07 2005-05-26 Nippon Steel Corp Inspection method and inspection device for surface irregularity
JP2005257681A (en) * 2004-02-10 2005-09-22 Showa Denko Kk Surface inspection method, and device therefor
JP2005241586A (en) 2004-02-27 2005-09-08 Advanced Display Inc Inspection device and method for optical film
JP2009025269A (en) 2007-07-24 2009-02-05 Toray Ind Inc Defect inspection apparatus and defect inspection method of optically-transparent sheet
JP5276875B2 (en) * 2008-03-31 2013-08-28 富士フイルム株式会社 Film defect inspection method and apparatus
JP2011145082A (en) * 2010-01-12 2011-07-28 Kaneka Corp Surface defect inspection device for sheet-like object
KR20150086633A (en) * 2014-01-20 2015-07-29 동우 화인켐 주식회사 Apparatus of inspecting optical film and method of inspecting the same
JP2015172565A (en) * 2014-02-19 2015-10-01 東レ株式会社 film inspection method and film manufacturing method using the same
CN105301004A (en) * 2015-11-05 2016-02-03 苏州威盛视信息科技有限公司 Light source detection device

Also Published As

Publication number Publication date
JP6776899B2 (en) 2020-10-28
US20190033229A1 (en) 2019-01-31
KR102628620B1 (en) 2024-01-24
EP3413037A4 (en) 2019-08-07
JPWO2017134958A1 (en) 2018-11-29
KR20180108583A (en) 2018-10-04
CN108603847A (en) 2018-09-28
EP3413037A1 (en) 2018-12-12
WO2017134958A1 (en) 2017-08-10
EP3413037B1 (en) 2023-05-03

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