JP2016138939A5 - - Google Patents

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Publication number
JP2016138939A5
JP2016138939A5 JP2015012577A JP2015012577A JP2016138939A5 JP 2016138939 A5 JP2016138939 A5 JP 2016138939A5 JP 2015012577 A JP2015012577 A JP 2015012577A JP 2015012577 A JP2015012577 A JP 2015012577A JP 2016138939 A5 JP2016138939 A5 JP 2016138939A5
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JP
Japan
Prior art keywords
unit
dark field
illumination
illumination device
microscope
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JP2015012577A
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English (en)
Japanese (ja)
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JP6555680B2 (ja
JP2016138939A (ja
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Priority to JP2015012577A priority Critical patent/JP6555680B2/ja
Priority claimed from JP2015012577A external-priority patent/JP6555680B2/ja
Priority to US15/001,790 priority patent/US9891419B2/en
Publication of JP2016138939A publication Critical patent/JP2016138939A/ja
Publication of JP2016138939A5 publication Critical patent/JP2016138939A5/ja
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JP2015012577A 2015-01-26 2015-01-26 顕微鏡用照明装置 Active JP6555680B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2015012577A JP6555680B2 (ja) 2015-01-26 2015-01-26 顕微鏡用照明装置
US15/001,790 US9891419B2 (en) 2015-01-26 2016-01-20 Microscope illumination apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2015012577A JP6555680B2 (ja) 2015-01-26 2015-01-26 顕微鏡用照明装置

Publications (3)

Publication Number Publication Date
JP2016138939A JP2016138939A (ja) 2016-08-04
JP2016138939A5 true JP2016138939A5 (enExample) 2018-03-01
JP6555680B2 JP6555680B2 (ja) 2019-08-07

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JP2015012577A Active JP6555680B2 (ja) 2015-01-26 2015-01-26 顕微鏡用照明装置

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US (1) US9891419B2 (enExample)
JP (1) JP6555680B2 (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6971770B2 (ja) * 2017-10-18 2021-11-24 株式会社キーエンス 拡大観察装置
CN109916918A (zh) * 2017-12-13 2019-06-21 武汉中导光电设备有限公司 一种检测平板清洁度和平整度的装置及方法
WO2020145946A1 (en) * 2019-01-08 2020-07-16 Google Llc Automated microscope objective detector
US11294162B2 (en) 2019-02-07 2022-04-05 Nanotronics Imaging, Inc. Fluorescence microscopy inspection systems, apparatus and methods with darkfield channel
US11762183B2 (en) * 2020-03-31 2023-09-19 Wdi Wise Device Inc. Method and apparatus for generating reflective dark field (RDF) illumination for a microscope
DE102022129094B4 (de) * 2022-11-03 2024-06-27 push4impact GmbH Mikroskopobjektiv sowie Objektivrevolver und Mikroskop umfassend ein solches Mikroskopobjektiv
CN120010105A (zh) * 2025-04-16 2025-05-16 奥来国信（北京）检测技术有限责任公司 一种多模态显微成像装置

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3442218A1 (de) * 1984-11-19 1986-05-28 Fa. Carl Zeiss, 7920 Heidenheim Auflichtbeleuchtungsapparat fuer mikroskope
JPS61270720A (ja) * 1985-05-25 1986-12-01 Nippon Kogaku Kk <Nikon> 暗視野照明装置
DE8915535U1 (de) * 1989-03-02 1990-10-25 Carl Zeiss, 89518 Heidenheim Auflicht-Objektbeleuchtungseinrichtung
WO2000033025A1 (fr) * 1998-11-30 2000-06-08 Olympus Optical Co., Ltd. Instrument de mesure
DE20304412U1 (de) * 2003-03-19 2003-06-12 Schott Glas, 55122 Mainz Steuereinheit für Mischlichtbeleuchtungen
JP4579554B2 (ja) * 2004-02-12 2010-11-10 オリンパス株式会社 顕微鏡用照明装置
JP2005316036A (ja) * 2004-04-28 2005-11-10 Olympus Corp 撮像装置、照明光制御方法および照明光制御プログラム
JP2006276193A (ja) * 2005-03-28 2006-10-12 Nikon Corp 顕微鏡
JP2007093887A (ja) * 2005-09-28 2007-04-12 Olympus Corp 照明装置及び顕微鏡
JP2007293282A (ja) * 2006-03-29 2007-11-08 Olympus Corp 顕微鏡
DE102008012585A1 (de) * 2008-03-05 2009-09-24 Carl Zeiss Microlmaging Gmbh Objektivwechsler mit Auflichtbeleuchtung für Lichtmikroskope
US8289621B2 (en) * 2008-10-07 2012-10-16 Gemological Institute Of America, Inc. Reflected dark field method and apparatus
SE533017C2 (sv) * 2009-02-20 2010-06-08 Seco Tools Ab Skärverktyg och skär med fluidströmningsstrukturer
JP2010271549A (ja) * 2009-05-21 2010-12-02 Olympus Corp 顕微鏡システム
JP2012042669A (ja) * 2010-08-18 2012-03-01 Sony Corp 顕微鏡制御装置及び光学的歪み補正方法
NL2008936A (en) * 2011-07-28 2013-01-29 Asml Netherlands Bv Illumination source for use in inspection methods and/or lithography inspection and lithographic apparatus and inspection method.
DE102011114336A1 (de) * 2011-09-23 2013-03-28 Carl Zeiss Microscopy Gmbh Vorrichtung und Verfahren zur Durchlichtbeleuchtung für Lichtmikroskope und Mikroskopsystem
JP5875812B2 (ja) * 2011-09-27 2016-03-02 オリンパス株式会社 顕微鏡システムおよび照明強度調整方法
JP6108772B2 (ja) * 2012-11-05 2017-04-05 オリンパス株式会社 顕微鏡及び暗視野対物レンズ
US9557551B2 (en) * 2013-07-18 2017-01-31 University Of Maine System System and apparatus for illuminating a specimen

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