JP2016095252A - 検体測定装置 - Google Patents
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Abstract
【解決手段】検体測定装置10は、検体から調製された測定試料にレーザ光を照射するレーザダイオード16aと、レーザ光が照射された測定試料中の粒子から光学情報を取得する検出部120と、レーザダイオード16aに直流の駆動信号を供給する駆動回路13と、所定周期でハイレベルとローレベルを繰り返す電位を生じさせることにより、駆動回路13から出力される駆動信号をレーザダイオード16aに繋がる第1信号経路102とは異なる第2信号経路103へ所定周期で導き、レーザダイオード16aに供給される駆動信号を高周波化する高周波化回路14と、を備える。
【選択図】図1
Description
図1に示すように、検体測定装置10は、制御部11と、抵抗12と、駆動回路13と、高周波化回路14と、ダイオード15と、レーザ光源16と、試料調製部17と、フローセル110と、検出部120と、を備える。制御部11は、レーザ光の出力を設定するための設定部11aを備える。
実施形態1に比べて実施形態2は、高周波化回路14の構成が変更されている。この変更に伴い、実施形態2では、ダイオード15が省略される。その他の構成は、実施形態1と同様である。
11a … 設定部
13 … 駆動回路
14 … 高周波化回路
14b … 出力部
15 … ダイオード
16a … レーザダイオード
16b … フォトダイオード
102 … 第1信号経路
103 … 第2信号経路
110 … フローセル
120 … 検出部
130 … 照射光学系
140 … 受光光学系
310 … リングオシレータ回路
331〜335 … ロジック回路
Claims (14)
- 検体から調製された測定試料にレーザ光を照射するレーザダイオードと、
レーザ光が照射された前記測定試料中の粒子から光学情報を取得する検出部と、
前記レーザダイオードに直流の駆動信号を供給する駆動回路と、
所定周期でハイレベルとローレベルを繰り返す電位を生じさせることにより、前記駆動回路から出力される前記駆動信号を前記レーザダイオードに繋がる第1信号経路とは異なる第2信号経路へ所定周期で導き、前記レーザダイオードに供給される前記駆動信号を高周波化する高周波化回路と、を備える検体測定装置。 - 前記高周波化回路は、前記所定周期で前記ハイレベルと前記ローレベルの電位を繰り返すパルス列信号を前記第2信号経路に繋がる出力部から出力する、請求項1に記載の検体測定装置。
- 前記高周波化回路は、リングオシレータ回路を含む、請求項2に記載の検体測定装置。
- 前記高周波化回路は、前記パルス列信号が前記ローレベルにある期間において、前記駆動回路から出力される前記駆動信号を、前記第2信号経路を介してグランドへと導く、請求項2または3に記載の検体測定装置。
- 前記高周波化回路は、前記パルス列信号が前記ローレベルにある期間において、前記駆動回路から出力される前記駆動信号をグランドへと導く多段のロジック回路を備える、請求項2ないし4の何れか一項に記載の検体測定装置。
- 前記パルス列信号の周波数が85MHz以上である、請求項2ないし5の何れか一項に記載の検体測定装置。
- 前記駆動回路および前記レーザダイオードを接続する信号線と、前記高周波化回路の出力部と、が接続され、
前記高周波化回路は、前記出力部の電位の値を、1周期中の所定期間において、前記駆動回路の電位よりも大きい値に設定する、請求項1ないし6の何れか一項に記載の検体測定装置。 - 前記高周波化回路の前記出力部と前記信号線との間に、前記出力部に向かう方向に電流を流すダイオードを備える、請求項7に記載の検体測定装置。
- 前記レーザダイオードの出力に応じたモニタ信号を出力するフォトダイオードをさらに備え、
前記駆動回路は、前記モニタ信号に基づいて、前記レーザダイオードの出力が設定値となるように、前記駆動信号を調整する、請求項1ないし8の何れか一項に記載の検体測定装置。 - 前記設定値を切り替える設定部をさらに備える、請求項9に記載の検体測定装置。
- 前記設定部は、前記検体の測定モードに応じて前記設定値を変更する、請求項10に記載の検体測定装置。
- 前記高周波化回路は、前記ハイレベルの電位を、前記検体の測定モードに応じて変化する前記駆動回路の電位よりも大きな一つの値に維持する、請求項11に記載の検体測定装置。
- 前記測定試料を流すフローセルと、
前記フローセルを流れる測定試料に前記レーザダイオードから出射された前記レーザ光を照射する照射光学系と、
前記測定試料から生じた光を前記検出部に導く受光光学系と、を備える請求項1ないし12の何れか一項に記載の検体測定装置。 - 前記検体は、血液、尿または上皮細胞である、請求項1ないし13の何れか一項に記載の検体測定装置。
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JP2014232242A JP6537252B2 (ja) | 2014-11-14 | 2014-11-14 | 検体測定装置 |
PCT/JP2015/081533 WO2016076284A1 (ja) | 2014-11-14 | 2015-11-10 | 検体測定装置 |
CN201580058693.2A CN107076658B (zh) | 2014-11-14 | 2015-11-10 | 检体测定装置 |
EP15858201.5A EP3220129A4 (en) | 2014-11-14 | 2015-11-10 | Analyte measurement device |
US15/592,316 US10024779B2 (en) | 2014-11-14 | 2017-05-11 | Sample measuring apparatus and sample measuring method |
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JP2014232242A JP6537252B2 (ja) | 2014-11-14 | 2014-11-14 | 検体測定装置 |
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JP (1) | JP6537252B2 (ja) |
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CN110411970A (zh) * | 2019-07-25 | 2019-11-05 | 青岛汇赢科技有限公司 | 一种ndir甲烷气体传感器及其使用与温度补偿和标定方法 |
US20220311211A1 (en) * | 2021-03-24 | 2022-09-29 | Apple Inc. | Laser Safety Circuit Providing Frequency-Based Average Current Monitoring |
Citations (4)
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JP2001067706A (ja) * | 1999-06-25 | 2001-03-16 | Toshiba Corp | 半導体集積回路とこれを含む光ピックアップ光学系ユニット及び光ピックアップ装置 |
JP2007200494A (ja) * | 2006-01-27 | 2007-08-09 | Rohm Co Ltd | レーザダイオード駆動回路、発光装置およびそれを搭載したディスク装置 |
JP2009053020A (ja) * | 2007-08-27 | 2009-03-12 | Sysmex Corp | 試料分析装置及び試料分析方法 |
US20100097534A1 (en) * | 2008-10-21 | 2010-04-22 | Microvision, Inc. | Projection System Using High-Frequency Drive Modulation to Reduce Perceived Speckle |
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JPH09178645A (ja) * | 1995-12-26 | 1997-07-11 | Rion Co Ltd | 光散乱式粒子計数装置 |
JP2011158384A (ja) * | 2010-02-02 | 2011-08-18 | Seiko Epson Corp | 微粒子検出装置 |
JP5765022B2 (ja) * | 2011-03-31 | 2015-08-19 | ソニー株式会社 | 微小粒子分析装置及び微小粒子分析方法 |
JP5818000B2 (ja) * | 2011-12-09 | 2015-11-18 | セイコーエプソン株式会社 | 原子発振器、原子発振器の制御方法及び量子干渉装置 |
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JP2001067706A (ja) * | 1999-06-25 | 2001-03-16 | Toshiba Corp | 半導体集積回路とこれを含む光ピックアップ光学系ユニット及び光ピックアップ装置 |
JP2007200494A (ja) * | 2006-01-27 | 2007-08-09 | Rohm Co Ltd | レーザダイオード駆動回路、発光装置およびそれを搭載したディスク装置 |
JP2009053020A (ja) * | 2007-08-27 | 2009-03-12 | Sysmex Corp | 試料分析装置及び試料分析方法 |
US20100097534A1 (en) * | 2008-10-21 | 2010-04-22 | Microvision, Inc. | Projection System Using High-Frequency Drive Modulation to Reduce Perceived Speckle |
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US10024779B2 (en) | 2018-07-17 |
CN107076658B (zh) | 2020-03-24 |
EP3220129A4 (en) | 2018-09-12 |
EP3220129A1 (en) | 2017-09-20 |
CN107076658A (zh) | 2017-08-18 |
JP6537252B2 (ja) | 2019-07-03 |
WO2016076284A1 (ja) | 2016-05-19 |
US20170241890A1 (en) | 2017-08-24 |
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