JP2016072372A - 研磨装置 - Google Patents
研磨装置 Download PDFInfo
- Publication number
- JP2016072372A JP2016072372A JP2014198804A JP2014198804A JP2016072372A JP 2016072372 A JP2016072372 A JP 2016072372A JP 2014198804 A JP2014198804 A JP 2014198804A JP 2014198804 A JP2014198804 A JP 2014198804A JP 2016072372 A JP2016072372 A JP 2016072372A
- Authority
- JP
- Japan
- Prior art keywords
- polishing
- substrate
- wafer
- release
- polishing head
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005498 polishing Methods 0.000 title claims abstract description 216
- 239000000758 substrate Substances 0.000 claims abstract description 56
- 238000003825 pressing Methods 0.000 claims description 10
- 239000012530 fluid Substances 0.000 abstract description 46
- 238000011109 contamination Methods 0.000 abstract 1
- 239000012528 membrane Substances 0.000 description 40
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 16
- 230000007246 mechanism Effects 0.000 description 14
- 238000000034 method Methods 0.000 description 13
- 239000010408 film Substances 0.000 description 11
- 230000002093 peripheral effect Effects 0.000 description 11
- 239000007788 liquid Substances 0.000 description 10
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 9
- 229910052757 nitrogen Inorganic materials 0.000 description 8
- 238000000926 separation method Methods 0.000 description 8
- 239000002245 particle Substances 0.000 description 6
- 230000007423 decrease Effects 0.000 description 5
- 239000004065 semiconductor Substances 0.000 description 5
- 206010022998 Irritability Diseases 0.000 description 4
- 238000007517 polishing process Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 239000007789 gas Substances 0.000 description 3
- 238000005192 partition Methods 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 229920002943 EPDM rubber Polymers 0.000 description 1
- 229920000181 Ethylene propylene rubber Polymers 0.000 description 1
- 239000004696 Poly ether ether ketone Substances 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 239000006061 abrasive grain Substances 0.000 description 1
- JUPQTSLXMOCDHR-UHFFFAOYSA-N benzene-1,4-diol;bis(4-fluorophenyl)methanone Chemical compound OC1=CC=C(O)C=C1.C1=CC(F)=CC=C1C(=O)C1=CC=C(F)C=C1 JUPQTSLXMOCDHR-UHFFFAOYSA-N 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000006835 compression Effects 0.000 description 1
- 238000007906 compression Methods 0.000 description 1
- 229920001971 elastomer Polymers 0.000 description 1
- 229920006351 engineering plastic Polymers 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 230000009191 jumping Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 229920002530 polyetherether ketone Polymers 0.000 description 1
- 229920003225 polyurethane elastomer Polymers 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 229920002379 silicone rubber Polymers 0.000 description 1
- 239000002002 slurry Substances 0.000 description 1
- 238000001179 sorption measurement Methods 0.000 description 1
- 239000007921 spray Substances 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 238000011144 upstream manufacturing Methods 0.000 description 1
Images
Landscapes
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2014198804A JP2016072372A (ja) | 2014-09-29 | 2014-09-29 | 研磨装置 |
| US14/833,727 US9539699B2 (en) | 2014-08-28 | 2015-08-24 | Polishing method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2014198804A JP2016072372A (ja) | 2014-09-29 | 2014-09-29 | 研磨装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2016072372A true JP2016072372A (ja) | 2016-05-09 |
| JP2016072372A5 JP2016072372A5 (cg-RX-API-DMAC7.html) | 2017-07-13 |
Family
ID=55864928
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2014198804A Pending JP2016072372A (ja) | 2014-08-28 | 2014-09-29 | 研磨装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2016072372A (cg-RX-API-DMAC7.html) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2018032714A (ja) * | 2016-08-24 | 2018-03-01 | 信越半導体株式会社 | 研磨装置及びウェーハの研磨方法 |
| US11517996B2 (en) | 2019-09-10 | 2022-12-06 | Kioxia Corporation | Polishing apparatus |
| JP2023097469A (ja) * | 2021-12-28 | 2023-07-10 | 北越工業株式会社 | 圧縮機のドレン混入防止構造 |
| CN120002493A (zh) * | 2025-04-18 | 2025-05-16 | 中国标准化研究院 | 一种半导体封装结构及其封装方法 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002075916A (ja) * | 2000-08-25 | 2002-03-15 | Canon Inc | 試料の分離装置及び分離方法 |
| JP2011258639A (ja) * | 2010-06-07 | 2011-12-22 | Ebara Corp | 研磨装置および方法 |
-
2014
- 2014-09-29 JP JP2014198804A patent/JP2016072372A/ja active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002075916A (ja) * | 2000-08-25 | 2002-03-15 | Canon Inc | 試料の分離装置及び分離方法 |
| JP2011258639A (ja) * | 2010-06-07 | 2011-12-22 | Ebara Corp | 研磨装置および方法 |
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2018032714A (ja) * | 2016-08-24 | 2018-03-01 | 信越半導体株式会社 | 研磨装置及びウェーハの研磨方法 |
| WO2018037878A1 (ja) * | 2016-08-24 | 2018-03-01 | 信越半導体株式会社 | 研磨装置及びウェーハの研磨方法 |
| CN109478506A (zh) * | 2016-08-24 | 2019-03-15 | 信越半导体株式会社 | 研磨装置以及晶圆的研磨方法 |
| KR20190040963A (ko) * | 2016-08-24 | 2019-04-19 | 신에쯔 한도타이 가부시키가이샤 | 연마장치 및 웨이퍼의 연마방법 |
| TWI673138B (zh) * | 2016-08-24 | 2019-10-01 | 日商信越半導體股份有限公司 | 晶圓的研磨方法 |
| KR102382807B1 (ko) * | 2016-08-24 | 2022-04-05 | 신에쯔 한도타이 가부시키가이샤 | 연마장치 및 웨이퍼의 연마방법 |
| US11517996B2 (en) | 2019-09-10 | 2022-12-06 | Kioxia Corporation | Polishing apparatus |
| JP2023097469A (ja) * | 2021-12-28 | 2023-07-10 | 北越工業株式会社 | 圧縮機のドレン混入防止構造 |
| JP7729773B2 (ja) | 2021-12-28 | 2025-08-26 | 株式会社Airman | 圧縮機のドレン混入防止構造 |
| CN120002493A (zh) * | 2025-04-18 | 2025-05-16 | 中国标准化研究院 | 一种半导体封装结构及其封装方法 |
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