JP2015531957A5 - - Google Patents

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Publication number
JP2015531957A5
JP2015531957A5 JP2015532159A JP2015532159A JP2015531957A5 JP 2015531957 A5 JP2015531957 A5 JP 2015531957A5 JP 2015532159 A JP2015532159 A JP 2015532159A JP 2015532159 A JP2015532159 A JP 2015532159A JP 2015531957 A5 JP2015531957 A5 JP 2015531957A5
Authority
JP
Japan
Prior art keywords
transistor
voltage
bit line
memory cell
current
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
JP2015532159A
Other languages
English (en)
Japanese (ja)
Other versions
JP2015531957A (ja
Filing date
Publication date
Priority claimed from US14/029,741 external-priority patent/US9129695B2/en
Application filed filed Critical
Publication of JP2015531957A publication Critical patent/JP2015531957A/ja
Publication of JP2015531957A5 publication Critical patent/JP2015531957A5/ja
Ceased legal-status Critical Current

Links

JP2015532159A 2012-09-18 2013-09-18 自己バイアス電流基準 Ceased JP2015531957A (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201261702338P 2012-09-18 2012-09-18
US61/702,338 2012-09-18
US14/029,741 US9129695B2 (en) 2012-09-18 2013-09-17 Self-biasing current reference
US14/029,741 2013-09-17
PCT/US2013/060302 WO2014047114A1 (en) 2012-09-18 2013-09-18 Self-biasing current reference

Publications (2)

Publication Number Publication Date
JP2015531957A JP2015531957A (ja) 2015-11-05
JP2015531957A5 true JP2015531957A5 (https=) 2016-11-10

Family

ID=50274321

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2015532159A Ceased JP2015531957A (ja) 2012-09-18 2013-09-18 自己バイアス電流基準

Country Status (6)

Country Link
US (1) US9129695B2 (https=)
EP (1) EP2898512A1 (https=)
JP (1) JP2015531957A (https=)
KR (1) KR20150058408A (https=)
CN (1) CN104704571A (https=)
WO (1) WO2014047114A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9129680B2 (en) * 2012-09-18 2015-09-08 Microchip Technology Incorporated Self-biasing multi-reference

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6052307A (en) * 1998-08-11 2000-04-18 Texas Instruments Incorporated Leakage tolerant sense amplifier
JP2001229686A (ja) * 1999-12-08 2001-08-24 Matsushita Electric Ind Co Ltd 不揮発性半導体記憶装置
US6407946B2 (en) * 1999-12-08 2002-06-18 Matsushita Electric Industrial Co., Ltd. Nonvolatile semiconductor memory device
US6891768B2 (en) 2002-11-13 2005-05-10 Hewlett-Packard Development Company, L.P. Power-saving reading of magnetic memory devices
FR2888659A1 (fr) * 2005-07-18 2007-01-19 St Microelectronics Sa Amplificateur de lecture pour memoire non volatile
KR100781984B1 (ko) 2006-11-03 2007-12-06 삼성전자주식회사 셀프 레퍼런스를 갖는 센스앰프 회로 및 그에 의한 센싱방법
US7498885B2 (en) * 2006-11-03 2009-03-03 Taiwan Semiconductor Manufacturing Co., Ltd. Voltage controlled oscillator with gain compensation
JP5231972B2 (ja) * 2008-12-18 2013-07-10 力晶科技股▲ふん▼有限公司 不揮発性半導体記憶装置
US8467253B2 (en) 2010-05-24 2013-06-18 Hewlett-Packard Development Company, L.P. Reading memory elements within a crossbar array

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