JP2015516571A5 - - Google Patents

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Publication number
JP2015516571A5
JP2015516571A5 JP2015505735A JP2015505735A JP2015516571A5 JP 2015516571 A5 JP2015516571 A5 JP 2015516571A5 JP 2015505735 A JP2015505735 A JP 2015505735A JP 2015505735 A JP2015505735 A JP 2015505735A JP 2015516571 A5 JP2015516571 A5 JP 2015516571A5
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JP
Japan
Prior art keywords
plunger
spring
distal
hook
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2015505735A
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English (en)
Japanese (ja)
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JP6230595B2 (ja
JP2015516571A (ja
Filing date
Publication date
Application filed filed Critical
Priority claimed from PCT/US2013/031240 external-priority patent/WO2013154738A1/en
Publication of JP2015516571A publication Critical patent/JP2015516571A/ja
Publication of JP2015516571A5 publication Critical patent/JP2015516571A5/ja
Application granted granted Critical
Publication of JP6230595B2 publication Critical patent/JP6230595B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2015505735A 2012-04-13 2013-03-14 試験プローブアセンブリおよび関連方法 Expired - Fee Related JP6230595B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201261624083P 2012-04-13 2012-04-13
US61/624,083 2012-04-13
PCT/US2013/031240 WO2013154738A1 (en) 2012-04-13 2013-03-14 Test probe assembly and related methods

Publications (3)

Publication Number Publication Date
JP2015516571A JP2015516571A (ja) 2015-06-11
JP2015516571A5 true JP2015516571A5 (https=) 2016-03-03
JP6230595B2 JP6230595B2 (ja) 2017-11-15

Family

ID=48045061

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2015505735A Expired - Fee Related JP6230595B2 (ja) 2012-04-13 2013-03-14 試験プローブアセンブリおよび関連方法

Country Status (7)

Country Link
US (1) US9829506B2 (https=)
EP (1) EP2836847B1 (https=)
JP (1) JP6230595B2 (https=)
MY (1) MY176424A (https=)
PT (1) PT2836847T (https=)
SG (1) SG11201406561XA (https=)
WO (1) WO2013154738A1 (https=)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI573332B (zh) * 2014-07-23 2017-03-01 鴻騰精密科技股份有限公司 電連接器及其端子
US20180095110A1 (en) * 2016-09-30 2018-04-05 Xcerra Corporation Compact testing system
JP6432017B2 (ja) * 2016-11-30 2018-12-05 日本電産リード株式会社 接触端子、検査治具、及び検査装置
USD869305S1 (en) * 2017-02-10 2019-12-10 Kabushiki Kaisha Nihon Micronics Probe pin
JP1592871S (https=) * 2017-02-10 2017-12-11
JP1623279S (https=) * 2018-02-02 2019-01-28
JP1623280S (https=) * 2018-02-02 2019-01-28
JP1622969S (https=) * 2018-02-02 2019-01-28
JP1622970S (https=) * 2018-02-02 2019-01-28
JP1622968S (https=) * 2018-02-02 2019-01-28
JP1626667S (https=) * 2018-02-02 2019-03-18
USD873161S1 (en) * 2018-02-02 2020-01-21 Kabushiki Kaisha Nihon Micronics Electric contact
JP1626668S (https=) * 2018-02-02 2019-03-18
CN113728238A (zh) * 2019-04-23 2021-11-30 株式会社友华 接触探针
CN113009196B (zh) * 2021-03-02 2022-03-18 上海捷策创电子科技有限公司 一种芯片测试用探针和芯片测试装置
US11387587B1 (en) * 2021-03-13 2022-07-12 Plastronics Socket Partners, Ltd. Self-retained slider contact pin
US11906576B1 (en) 2021-05-04 2024-02-20 Johnstech International Corporation Contact assembly array and testing system having contact assembly array
US11867752B1 (en) 2021-05-13 2024-01-09 Johnstech International Corporation Contact assembly and kelvin testing system having contact assembly
USD1015282S1 (en) * 2022-02-01 2024-02-20 Johnstech International Corporation Spring pin tip
WO2023150615A2 (en) 2022-02-07 2023-08-10 Johnstech International Corporation Spring probe assembly for a kelvin testing system
TWI840266B (zh) * 2022-07-01 2024-04-21 南韓商二成電子有限公司 接觸針及包含該接觸針的測試用插座
CN115184652B (zh) * 2022-07-06 2024-07-09 渭南木王智能科技股份有限公司 一种细长稳流测试探针
CN118091212A (zh) * 2022-11-28 2024-05-28 恩普乐斯股份有限公司 接触探针
USD1090440S1 (en) * 2023-01-12 2025-08-26 Johnstech International Corporation Spring probe contact assembly

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US5936421A (en) * 1994-10-11 1999-08-10 Virginia Panel Corporation Coaxial double-headed spring contact probe assembly and coaxial surface contact for engagement therewith
JP4060919B2 (ja) * 1997-11-28 2008-03-12 富士通株式会社 電気的接続装置、接触子製造方法、及び半導体試験方法
KR20010033843A (ko) * 1998-01-05 2001-04-25 리카 일렉트로닉스 인터내셔널, 인크. 동축 전기 접점 조립체
US6506082B1 (en) * 2001-12-21 2003-01-14 Interconnect Devices, Inc. Electrical contact interface
US6746252B1 (en) * 2002-08-01 2004-06-08 Plastronics Socket Partners, L.P. High frequency compression mount receptacle with lineal contact members
US6967492B2 (en) * 2003-11-26 2005-11-22 Asm Assembly Automation Ltd. Spring contact probe device for electrical testing
WO2006135680A2 (en) * 2005-06-10 2006-12-21 Delaware Capital Formation Inc. Electrical contact probe with compliant internal interconnect
JP4999079B2 (ja) * 2007-04-10 2012-08-15 サンユー工業株式会社 プローブ
US7862391B2 (en) * 2007-09-18 2011-01-04 Delaware Capital Formation, Inc. Spring contact assembly
DE102008023761B9 (de) * 2008-05-09 2012-11-08 Feinmetall Gmbh Elektrisches Kontaktelement zum Berührungskontaktieren von elektrischen Prüflingen sowie entsprechende Kontaktieranordnung
US8105119B2 (en) * 2009-01-30 2012-01-31 Delaware Capital Formation, Inc. Flat plunger round barrel test probe
WO2011036800A1 (ja) * 2009-09-28 2011-03-31 株式会社日本マイクロニクス 接触子及び電気的接続装置
US8710856B2 (en) * 2010-01-15 2014-04-29 LTX Credence Corporation Terminal for flat test probe
US8721372B2 (en) * 2010-02-05 2014-05-13 Kabushiki Kaisha Nihon Micronics Contact and electrical connecting apparatus
JP5352525B2 (ja) * 2010-04-28 2013-11-27 日本航空電子工業株式会社 プローブピン用コンタクト、プローブピンおよび電子デバイス用接続治具
TWM393066U (en) * 2010-05-06 2010-11-21 Hon Hai Prec Ind Co Ltd Electrical connector
JP5618729B2 (ja) 2010-09-24 2014-11-05 シチズンセイミツ株式会社 コンタクトプローブ及びこれを用いた電子回路試験装置

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