JP2015026519A - Conductive resin composition and semiconductor device - Google Patents
Conductive resin composition and semiconductor device Download PDFInfo
- Publication number
- JP2015026519A JP2015026519A JP2013155624A JP2013155624A JP2015026519A JP 2015026519 A JP2015026519 A JP 2015026519A JP 2013155624 A JP2013155624 A JP 2013155624A JP 2013155624 A JP2013155624 A JP 2013155624A JP 2015026519 A JP2015026519 A JP 2015026519A
- Authority
- JP
- Japan
- Prior art keywords
- silver
- resin composition
- conductive resin
- silica particles
- meth
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
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- 239000011342 resin composition Substances 0.000 title claims abstract description 67
- 239000004065 semiconductor Substances 0.000 title claims description 29
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims abstract description 144
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims abstract description 129
- 229910052709 silver Inorganic materials 0.000 claims abstract description 126
- 239000004332 silver Substances 0.000 claims abstract description 126
- 239000002245 particle Substances 0.000 claims abstract description 107
- 239000003822 epoxy resin Substances 0.000 claims abstract description 53
- 229920000647 polyepoxide Polymers 0.000 claims abstract description 53
- 238000000034 method Methods 0.000 claims abstract description 23
- 239000003795 chemical substances by application Substances 0.000 claims abstract description 16
- 238000009826 distribution Methods 0.000 claims abstract description 10
- 239000012798 spherical particle Substances 0.000 claims abstract description 6
- -1 fatty acid salt Chemical class 0.000 claims description 40
- 230000005484 gravity Effects 0.000 claims description 25
- 230000001186 cumulative effect Effects 0.000 claims description 16
- 239000006087 Silane Coupling Agent Substances 0.000 claims description 14
- 235000014113 dietary fatty acids Nutrition 0.000 claims description 14
- 239000000194 fatty acid Substances 0.000 claims description 14
- 229930195729 fatty acid Natural products 0.000 claims description 14
- 150000004665 fatty acids Chemical class 0.000 claims description 7
- 238000000691 measurement method Methods 0.000 claims description 7
- 238000001179 sorption measurement Methods 0.000 claims description 4
- 239000000377 silicon dioxide Substances 0.000 abstract description 37
- 230000001070 adhesive effect Effects 0.000 abstract description 21
- 238000010521 absorption reaction Methods 0.000 abstract 1
- 238000005259 measurement Methods 0.000 abstract 1
- NIXOWILDQLNWCW-UHFFFAOYSA-M Acrylate Chemical compound [O-]C(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-M 0.000 description 72
- 238000000576 coating method Methods 0.000 description 28
- 239000011248 coating agent Substances 0.000 description 26
- 239000000853 adhesive Substances 0.000 description 20
- RAXXELZNTBOGNW-UHFFFAOYSA-N imidazole Natural products C1=CNC=N1 RAXXELZNTBOGNW-UHFFFAOYSA-N 0.000 description 15
- 239000000203 mixture Substances 0.000 description 15
- 229920005989 resin Polymers 0.000 description 13
- 239000011347 resin Substances 0.000 description 13
- 238000007747 plating Methods 0.000 description 12
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 12
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 11
- 239000000047 product Substances 0.000 description 10
- 239000007822 coupling agent Substances 0.000 description 8
- 239000003085 diluting agent Substances 0.000 description 8
- 238000007772 electroless plating Methods 0.000 description 8
- 238000004519 manufacturing process Methods 0.000 description 8
- 239000000243 solution Substances 0.000 description 8
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 7
- 125000003158 alcohol group Chemical group 0.000 description 7
- 239000010949 copper Substances 0.000 description 7
- 229910052802 copper Inorganic materials 0.000 description 7
- 238000002156 mixing Methods 0.000 description 7
- BPSIOYPQMFLKFR-UHFFFAOYSA-N trimethoxy-[3-(oxiran-2-ylmethoxy)propyl]silane Chemical compound CO[Si](OC)(OC)CCCOCC1CO1 BPSIOYPQMFLKFR-UHFFFAOYSA-N 0.000 description 7
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 6
- IISBACLAFKSPIT-UHFFFAOYSA-N bisphenol A Chemical compound C=1C=C(O)C=CC=1C(C)(C)C1=CC=C(O)C=C1 IISBACLAFKSPIT-UHFFFAOYSA-N 0.000 description 6
- PXKLMJQFEQBVLD-UHFFFAOYSA-N bisphenol F Chemical compound C1=CC(O)=CC=C1CC1=CC=C(O)C=C1 PXKLMJQFEQBVLD-UHFFFAOYSA-N 0.000 description 6
- 239000011521 glass Substances 0.000 description 6
- 229920001515 polyalkylene glycol Polymers 0.000 description 6
- 229920000768 polyamine Polymers 0.000 description 6
- 238000004062 sedimentation Methods 0.000 description 6
- 238000003756 stirring Methods 0.000 description 6
- 239000000758 substrate Substances 0.000 description 6
- 150000001412 amines Chemical class 0.000 description 5
- QGBSISYHAICWAH-UHFFFAOYSA-N dicyandiamide Chemical compound NC(N)=NC#N QGBSISYHAICWAH-UHFFFAOYSA-N 0.000 description 5
- 239000000945 filler Substances 0.000 description 5
- 229910052751 metal Inorganic materials 0.000 description 5
- 239000002184 metal Substances 0.000 description 5
- 229910052759 nickel Inorganic materials 0.000 description 5
- RUEBPOOTFCZRBC-UHFFFAOYSA-N (5-methyl-2-phenyl-1h-imidazol-4-yl)methanol Chemical compound OCC1=C(C)NC(C=2C=CC=CC=2)=N1 RUEBPOOTFCZRBC-UHFFFAOYSA-N 0.000 description 4
- WRIDQFICGBMAFQ-UHFFFAOYSA-N (E)-8-Octadecenoic acid Natural products CCCCCCCCCC=CCCCCCCC(O)=O WRIDQFICGBMAFQ-UHFFFAOYSA-N 0.000 description 4
- HHRACYLRBOUBKM-UHFFFAOYSA-N 2-[(4-tert-butylphenoxy)methyl]oxirane Chemical compound C1=CC(C(C)(C)C)=CC=C1OCC1OC1 HHRACYLRBOUBKM-UHFFFAOYSA-N 0.000 description 4
- LQJBNNIYVWPHFW-UHFFFAOYSA-N 20:1omega9c fatty acid Natural products CCCCCCCCCCC=CCCCCCCCC(O)=O LQJBNNIYVWPHFW-UHFFFAOYSA-N 0.000 description 4
- QSBYPNXLFMSGKH-UHFFFAOYSA-N 9-Heptadecensaeure Natural products CCCCCCCC=CCCCCCCCC(O)=O QSBYPNXLFMSGKH-UHFFFAOYSA-N 0.000 description 4
- 239000004593 Epoxy Substances 0.000 description 4
- PEDCQBHIVMGVHV-UHFFFAOYSA-N Glycerine Chemical compound OCC(O)CO PEDCQBHIVMGVHV-UHFFFAOYSA-N 0.000 description 4
- 239000005642 Oleic acid Substances 0.000 description 4
- ZQPPMHVWECSIRJ-UHFFFAOYSA-N Oleic acid Natural products CCCCCCCCC=CCCCCCCCC(O)=O ZQPPMHVWECSIRJ-UHFFFAOYSA-N 0.000 description 4
- ISWSIDIOOBJBQZ-UHFFFAOYSA-N Phenol Chemical compound OC1=CC=CC=C1 ISWSIDIOOBJBQZ-UHFFFAOYSA-N 0.000 description 4
- 235000021355 Stearic acid Nutrition 0.000 description 4
- 229910052782 aluminium Inorganic materials 0.000 description 4
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 4
- WERYXYBDKMZEQL-UHFFFAOYSA-N butane-1,4-diol Chemical compound OCCCCO WERYXYBDKMZEQL-UHFFFAOYSA-N 0.000 description 4
- 230000007423 decrease Effects 0.000 description 4
- SWXVUIWOUIDPGS-UHFFFAOYSA-N diacetone alcohol Chemical compound CC(=O)CC(C)(C)O SWXVUIWOUIDPGS-UHFFFAOYSA-N 0.000 description 4
- 238000011156 evaluation Methods 0.000 description 4
- 229910021485 fumed silica Inorganic materials 0.000 description 4
- LNEPOXFFQSENCJ-UHFFFAOYSA-N haloperidol Chemical compound C1CC(O)(C=2C=CC(Cl)=CC=2)CCN1CCCC(=O)C1=CC=C(F)C=C1 LNEPOXFFQSENCJ-UHFFFAOYSA-N 0.000 description 4
- IPCSVZSSVZVIGE-UHFFFAOYSA-N hexadecanoic acid Chemical compound CCCCCCCCCCCCCCCC(O)=O IPCSVZSSVZVIGE-UHFFFAOYSA-N 0.000 description 4
- QXJSBBXBKPUZAA-UHFFFAOYSA-N isooleic acid Natural products CCCCCCCC=CCCCCCCCCC(O)=O QXJSBBXBKPUZAA-UHFFFAOYSA-N 0.000 description 4
- 239000007788 liquid Substances 0.000 description 4
- QIQXTHQIDYTFRH-UHFFFAOYSA-N octadecanoic acid Chemical compound CCCCCCCCCCCCCCCCCC(O)=O QIQXTHQIDYTFRH-UHFFFAOYSA-N 0.000 description 4
- OQCDKBAXFALNLD-UHFFFAOYSA-N octadecanoic acid Natural products CCCCCCCC(C)CCCCCCCCC(O)=O OQCDKBAXFALNLD-UHFFFAOYSA-N 0.000 description 4
- ZQPPMHVWECSIRJ-KTKRTIGZSA-N oleic acid Chemical compound CCCCCCCC\C=C/CCCCCCCC(O)=O ZQPPMHVWECSIRJ-KTKRTIGZSA-N 0.000 description 4
- 239000005011 phenolic resin Substances 0.000 description 4
- 239000000843 powder Substances 0.000 description 4
- 239000002904 solvent Substances 0.000 description 4
- 239000008117 stearic acid Substances 0.000 description 4
- TYOXIFXYEIILLY-UHFFFAOYSA-N 5-methyl-2-phenyl-1h-imidazole Chemical compound N1C(C)=CN=C1C1=CC=CC=C1 TYOXIFXYEIILLY-UHFFFAOYSA-N 0.000 description 3
- LYCAIKOWRPUZTN-UHFFFAOYSA-N Ethylene glycol Chemical compound OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 description 3
- ZMXDDKWLCZADIW-UHFFFAOYSA-N N,N-Dimethylformamide Chemical compound CN(C)C=O ZMXDDKWLCZADIW-UHFFFAOYSA-N 0.000 description 3
- FQYUMYWMJTYZTK-UHFFFAOYSA-N Phenyl glycidyl ether Chemical compound C1OC1COC1=CC=CC=C1 FQYUMYWMJTYZTK-UHFFFAOYSA-N 0.000 description 3
- DNIAPMSPPWPWGF-UHFFFAOYSA-N Propylene glycol Chemical compound CC(O)CO DNIAPMSPPWPWGF-UHFFFAOYSA-N 0.000 description 3
- FOIXSVOLVBLSDH-UHFFFAOYSA-N Silver ion Chemical compound [Ag+] FOIXSVOLVBLSDH-UHFFFAOYSA-N 0.000 description 3
- ZJCCRDAZUWHFQH-UHFFFAOYSA-N Trimethylolpropane Chemical compound CCC(CO)(CO)CO ZJCCRDAZUWHFQH-UHFFFAOYSA-N 0.000 description 3
- XSQUKJJJFZCRTK-UHFFFAOYSA-N Urea Chemical compound NC(N)=O XSQUKJJJFZCRTK-UHFFFAOYSA-N 0.000 description 3
- 239000002585 base Substances 0.000 description 3
- KRKNYBCHXYNGOX-UHFFFAOYSA-N citric acid Chemical compound OC(=O)CC(O)(C(O)=O)CC(O)=O KRKNYBCHXYNGOX-UHFFFAOYSA-N 0.000 description 3
- 239000011247 coating layer Substances 0.000 description 3
- 125000003055 glycidyl group Chemical group C(C1CO1)* 0.000 description 3
- 238000010438 heat treatment Methods 0.000 description 3
- VLKZOEOYAKHREP-UHFFFAOYSA-N n-Hexane Chemical compound CCCCCC VLKZOEOYAKHREP-UHFFFAOYSA-N 0.000 description 3
- WXZMFSXDPGVJKK-UHFFFAOYSA-N pentaerythritol Chemical compound OCC(CO)(CO)CO WXZMFSXDPGVJKK-UHFFFAOYSA-N 0.000 description 3
- 238000012545 processing Methods 0.000 description 3
- WGYKZJWCGVVSQN-UHFFFAOYSA-N propylamine Chemical compound CCCN WGYKZJWCGVVSQN-UHFFFAOYSA-N 0.000 description 3
- 230000009257 reactivity Effects 0.000 description 3
- 238000007789 sealing Methods 0.000 description 3
- 238000012360 testing method Methods 0.000 description 3
- IMNIMPAHZVJRPE-UHFFFAOYSA-N triethylenediamine Chemical compound C1CN2CCN1CC2 IMNIMPAHZVJRPE-UHFFFAOYSA-N 0.000 description 3
- PUPZLCDOIYMWBV-UHFFFAOYSA-N (+/-)-1,3-Butanediol Chemical compound CC(O)CCO PUPZLCDOIYMWBV-UHFFFAOYSA-N 0.000 description 2
- STMDPCBYJCIZOD-UHFFFAOYSA-N 2-(2,4-dinitroanilino)-4-methylpentanoic acid Chemical compound CC(C)CC(C(O)=O)NC1=CC=C([N+]([O-])=O)C=C1[N+]([O-])=O STMDPCBYJCIZOD-UHFFFAOYSA-N 0.000 description 2
- VXQBJTKSVGFQOL-UHFFFAOYSA-N 2-(2-butoxyethoxy)ethyl acetate Chemical compound CCCCOCCOCCOC(C)=O VXQBJTKSVGFQOL-UHFFFAOYSA-N 0.000 description 2
- BBBUAWSVILPJLL-UHFFFAOYSA-N 2-(2-ethylhexoxymethyl)oxirane Chemical compound CCCCC(CC)COCC1CO1 BBBUAWSVILPJLL-UHFFFAOYSA-N 0.000 description 2
- YSUQLAYJZDEMOT-UHFFFAOYSA-N 2-(butoxymethyl)oxirane Chemical compound CCCCOCC1CO1 YSUQLAYJZDEMOT-UHFFFAOYSA-N 0.000 description 2
- NIXOWILDQLNWCW-UHFFFAOYSA-N 2-Propenoic acid Natural products OC(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 2
- CUFXMPWHOWYNSO-UHFFFAOYSA-N 2-[(4-methylphenoxy)methyl]oxirane Chemical compound C1=CC(C)=CC=C1OCC1OC1 CUFXMPWHOWYNSO-UHFFFAOYSA-N 0.000 description 2
- WTYYGFLRBWMFRY-UHFFFAOYSA-N 2-[6-(oxiran-2-ylmethoxy)hexoxymethyl]oxirane Chemical compound C1OC1COCCCCCCOCC1CO1 WTYYGFLRBWMFRY-UHFFFAOYSA-N 0.000 description 2
- POAOYUHQDCAZBD-UHFFFAOYSA-N 2-butoxyethanol Chemical compound CCCCOCCO POAOYUHQDCAZBD-UHFFFAOYSA-N 0.000 description 2
- NQBXSWAWVZHKBZ-UHFFFAOYSA-N 2-butoxyethyl acetate Chemical compound CCCCOCCOC(C)=O NQBXSWAWVZHKBZ-UHFFFAOYSA-N 0.000 description 2
- UUEWCQRISZBELL-UHFFFAOYSA-N 3-trimethoxysilylpropane-1-thiol Chemical compound CO[Si](OC)(OC)CCCS UUEWCQRISZBELL-UHFFFAOYSA-N 0.000 description 2
- YEJRWHAVMIAJKC-UHFFFAOYSA-N 4-Butyrolactone Chemical compound O=C1CCCO1 YEJRWHAVMIAJKC-UHFFFAOYSA-N 0.000 description 2
- HRPVXLWXLXDGHG-UHFFFAOYSA-N Acrylamide Chemical compound NC(=O)C=C HRPVXLWXLXDGHG-UHFFFAOYSA-N 0.000 description 2
- VTYYLEPIZMXCLO-UHFFFAOYSA-L Calcium carbonate Chemical compound [Ca+2].[O-]C([O-])=O VTYYLEPIZMXCLO-UHFFFAOYSA-L 0.000 description 2
- RTZKZFJDLAIYFH-UHFFFAOYSA-N Diethyl ether Chemical compound CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 description 2
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 2
- ZRALSGWEFCBTJO-UHFFFAOYSA-N Guanidine Chemical compound NC(N)=N ZRALSGWEFCBTJO-UHFFFAOYSA-N 0.000 description 2
- UFWIBTONFRDIAS-UHFFFAOYSA-N Naphthalene Chemical compound C1=CC=CC2=CC=CC=C21 UFWIBTONFRDIAS-UHFFFAOYSA-N 0.000 description 2
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 2
- 235000021314 Palmitic acid Nutrition 0.000 description 2
- GLUUGHFHXGJENI-UHFFFAOYSA-N Piperazine Chemical compound C1CNCCN1 GLUUGHFHXGJENI-UHFFFAOYSA-N 0.000 description 2
- NQRYJNQNLNOLGT-UHFFFAOYSA-N Piperidine Chemical compound C1CCNCC1 NQRYJNQNLNOLGT-UHFFFAOYSA-N 0.000 description 2
- JUJWROOIHBZHMG-UHFFFAOYSA-N Pyridine Chemical compound C1=CC=NC=C1 JUJWROOIHBZHMG-UHFFFAOYSA-N 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- AWMVMTVKBNGEAK-UHFFFAOYSA-N Styrene oxide Chemical compound C1OC1C1=CC=CC=C1 AWMVMTVKBNGEAK-UHFFFAOYSA-N 0.000 description 2
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 2
- UUQQGGWZVKUCBD-UHFFFAOYSA-N [4-(hydroxymethyl)-2-phenyl-1h-imidazol-5-yl]methanol Chemical compound N1C(CO)=C(CO)N=C1C1=CC=CC=C1 UUQQGGWZVKUCBD-UHFFFAOYSA-N 0.000 description 2
- 150000008065 acid anhydrides Chemical class 0.000 description 2
- YZXBAPSDXZZRGB-DOFZRALJSA-N arachidonic acid Chemical compound CCCCC\C=C/C\C=C/C\C=C/C\C=C/CCCC(O)=O YZXBAPSDXZZRGB-DOFZRALJSA-N 0.000 description 2
- 239000011230 binding agent Substances 0.000 description 2
- 238000013329 compounding Methods 0.000 description 2
- 239000011162 core material Substances 0.000 description 2
- PFURGBBHAOXLIO-UHFFFAOYSA-N cyclohexane-1,2-diol Chemical compound OC1CCCCC1O PFURGBBHAOXLIO-UHFFFAOYSA-N 0.000 description 2
- GYZLOYUZLJXAJU-UHFFFAOYSA-N diglycidyl ether Chemical compound C1OC1COCC1CO1 GYZLOYUZLJXAJU-UHFFFAOYSA-N 0.000 description 2
- SBZXBUIDTXKZTM-UHFFFAOYSA-N diglyme Chemical compound COCCOCCOC SBZXBUIDTXKZTM-UHFFFAOYSA-N 0.000 description 2
- XBDQKXXYIPTUBI-UHFFFAOYSA-N dimethylselenoniopropionate Natural products CCC(O)=O XBDQKXXYIPTUBI-UHFFFAOYSA-N 0.000 description 2
- ZUOUZKKEUPVFJK-UHFFFAOYSA-N diphenyl Chemical compound C1=CC=CC=C1C1=CC=CC=C1 ZUOUZKKEUPVFJK-UHFFFAOYSA-N 0.000 description 2
- 239000012153 distilled water Substances 0.000 description 2
- UKMSUNONTOPOIO-UHFFFAOYSA-N docosanoic acid Chemical compound CCCCCCCCCCCCCCCCCCCCCC(O)=O UKMSUNONTOPOIO-UHFFFAOYSA-N 0.000 description 2
- POULHZVOKOAJMA-UHFFFAOYSA-N dodecanoic acid Chemical compound CCCCCCCCCCCC(O)=O POULHZVOKOAJMA-UHFFFAOYSA-N 0.000 description 2
- 238000001035 drying Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000011049 filling Methods 0.000 description 2
- NIHNNTQXNPWCJQ-UHFFFAOYSA-N fluorene Chemical compound C1=CC=C2CC3=CC=CC=C3C2=C1 NIHNNTQXNPWCJQ-UHFFFAOYSA-N 0.000 description 2
- 235000011187 glycerol Nutrition 0.000 description 2
- HHLFWLYXYJOTON-UHFFFAOYSA-N glyoxylic acid Chemical compound OC(=O)C=O HHLFWLYXYJOTON-UHFFFAOYSA-N 0.000 description 2
- FFUAGWLWBBFQJT-UHFFFAOYSA-N hexamethyldisilazane Chemical compound C[Si](C)(C)N[Si](C)(C)C FFUAGWLWBBFQJT-UHFFFAOYSA-N 0.000 description 2
- NAQMVNRVTILPCV-UHFFFAOYSA-N hexane-1,6-diamine Chemical compound NCCCCCCN NAQMVNRVTILPCV-UHFFFAOYSA-N 0.000 description 2
- ZFSLODLOARCGLH-UHFFFAOYSA-N isocyanuric acid Chemical compound OC1=NC(O)=NC(O)=N1 ZFSLODLOARCGLH-UHFFFAOYSA-N 0.000 description 2
- 239000004850 liquid epoxy resins (LERs) Substances 0.000 description 2
- BFXIKLCIZHOAAZ-UHFFFAOYSA-N methyltrimethoxysilane Chemical compound CO[Si](C)(OC)OC BFXIKLCIZHOAAZ-UHFFFAOYSA-N 0.000 description 2
- 239000011259 mixed solution Substances 0.000 description 2
- KBJFYLLAMSZSOG-UHFFFAOYSA-N n-(3-trimethoxysilylpropyl)aniline Chemical compound CO[Si](OC)(OC)CCCNC1=CC=CC=C1 KBJFYLLAMSZSOG-UHFFFAOYSA-N 0.000 description 2
- WQEPLUUGTLDZJY-UHFFFAOYSA-N n-Pentadecanoic acid Natural products CCCCCCCCCCCCCCC(O)=O WQEPLUUGTLDZJY-UHFFFAOYSA-N 0.000 description 2
- SLCVBVWXLSEKPL-UHFFFAOYSA-N neopentyl glycol Chemical compound OCC(C)(C)CO SLCVBVWXLSEKPL-UHFFFAOYSA-N 0.000 description 2
- WWZKQHOCKIZLMA-UHFFFAOYSA-N octanoic acid Chemical compound CCCCCCCC(O)=O WWZKQHOCKIZLMA-UHFFFAOYSA-N 0.000 description 2
- 235000021313 oleic acid Nutrition 0.000 description 2
- SECPZKHBENQXJG-FPLPWBNLSA-N palmitoleic acid Chemical compound CCCCCC\C=C/CCCCCCCC(O)=O SECPZKHBENQXJG-FPLPWBNLSA-N 0.000 description 2
- 229920001296 polysiloxane Polymers 0.000 description 2
- KIDHWZJUCRJVML-UHFFFAOYSA-N putrescine Chemical compound NCCCCN KIDHWZJUCRJVML-UHFFFAOYSA-N 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- SQGYOTSLMSWVJD-UHFFFAOYSA-N silver(1+) nitrate Chemical compound [Ag+].[O-]N(=O)=O SQGYOTSLMSWVJD-UHFFFAOYSA-N 0.000 description 2
- 238000005507 spraying Methods 0.000 description 2
- 239000003381 stabilizer Substances 0.000 description 2
- KZNICNPSHKQLFF-UHFFFAOYSA-N succinimide Chemical compound O=C1CCC(=O)N1 KZNICNPSHKQLFF-UHFFFAOYSA-N 0.000 description 2
- UMGDCJDMYOKAJW-UHFFFAOYSA-N thiourea Chemical compound NC(N)=S UMGDCJDMYOKAJW-UHFFFAOYSA-N 0.000 description 2
- 239000013008 thixotropic agent Substances 0.000 description 2
- VTHOKNTVYKTUPI-UHFFFAOYSA-N triethoxy-[3-(3-triethoxysilylpropyltetrasulfanyl)propyl]silane Chemical compound CCO[Si](OCC)(OCC)CCCSSSSCCC[Si](OCC)(OCC)OCC VTHOKNTVYKTUPI-UHFFFAOYSA-N 0.000 description 2
- XFNJVJPLKCPIBV-UHFFFAOYSA-N trimethylenediamine Chemical compound NCCCN XFNJVJPLKCPIBV-UHFFFAOYSA-N 0.000 description 2
- RIOQSEWOXXDEQQ-UHFFFAOYSA-N triphenylphosphine Chemical compound C1=CC=CC=C1P(C=1C=CC=CC=1)C1=CC=CC=C1 RIOQSEWOXXDEQQ-UHFFFAOYSA-N 0.000 description 2
- RSJKGSCJYJTIGS-UHFFFAOYSA-N undecane Chemical compound CCCCCCCCCCC RSJKGSCJYJTIGS-UHFFFAOYSA-N 0.000 description 2
- 239000004034 viscosity adjusting agent Substances 0.000 description 2
- 229910052725 zinc Inorganic materials 0.000 description 2
- 239000011701 zinc Substances 0.000 description 2
- DTGKSKDOIYIVQL-WEDXCCLWSA-N (+)-borneol Chemical group C1C[C@@]2(C)[C@@H](O)C[C@@H]1C2(C)C DTGKSKDOIYIVQL-WEDXCCLWSA-N 0.000 description 1
- WYTZZXDRDKSJID-UHFFFAOYSA-N (3-aminopropyl)triethoxysilane Chemical compound CCO[Si](OCC)(OCC)CCCN WYTZZXDRDKSJID-UHFFFAOYSA-N 0.000 description 1
- LTQBNYCMVZQRSD-UHFFFAOYSA-N (4-ethenylphenyl)-trimethoxysilane Chemical compound CO[Si](OC)(OC)C1=CC=C(C=C)C=C1 LTQBNYCMVZQRSD-UHFFFAOYSA-N 0.000 description 1
- OYHQOLUKZRVURQ-NTGFUMLPSA-N (9Z,12Z)-9,10,12,13-tetratritiooctadeca-9,12-dienoic acid Chemical compound C(CCCCCCC\C(=C(/C\C(=C(/CCCCC)\[3H])\[3H])\[3H])\[3H])(=O)O OYHQOLUKZRVURQ-NTGFUMLPSA-N 0.000 description 1
- DPZSNGJNFHWQDC-ARJAWSKDSA-N (z)-2,3-diaminobut-2-enedinitrile Chemical compound N#CC(/N)=C(/N)C#N DPZSNGJNFHWQDC-ARJAWSKDSA-N 0.000 description 1
- MJYFYGVCLHNRKB-UHFFFAOYSA-N 1,1,2-trifluoroethyl 2-methylprop-2-enoate Chemical compound CC(=C)C(=O)OC(F)(F)CF MJYFYGVCLHNRKB-UHFFFAOYSA-N 0.000 description 1
- GIWQSPITLQVMSG-UHFFFAOYSA-N 1,2-dimethylimidazole Chemical compound CC1=NC=CN1C GIWQSPITLQVMSG-UHFFFAOYSA-N 0.000 description 1
- GEYOCULIXLDCMW-UHFFFAOYSA-N 1,2-phenylenediamine Chemical compound NC1=CC=CC=C1N GEYOCULIXLDCMW-UHFFFAOYSA-N 0.000 description 1
- RYHBNJHYFVUHQT-UHFFFAOYSA-N 1,4-Dioxane Chemical compound C1COCCO1 RYHBNJHYFVUHQT-UHFFFAOYSA-N 0.000 description 1
- CBCKQZAAMUWICA-UHFFFAOYSA-N 1,4-phenylenediamine Chemical compound NC1=CC=C(N)C=C1 CBCKQZAAMUWICA-UHFFFAOYSA-N 0.000 description 1
- ALVZNPYWJMLXKV-UHFFFAOYSA-N 1,9-Nonanediol Chemical compound OCCCCCCCCCO ALVZNPYWJMLXKV-UHFFFAOYSA-N 0.000 description 1
- ADQQGJLCEXHTRW-UHFFFAOYSA-N 1-(dimethylamino)hexan-1-ol Chemical compound CCCCCC(O)N(C)C ADQQGJLCEXHTRW-UHFFFAOYSA-N 0.000 description 1
- OQILSTRGJVCFAG-UHFFFAOYSA-N 1-(oxiran-2-ylmethoxy)butan-1-ol Chemical compound CCCC(O)OCC1CO1 OQILSTRGJVCFAG-UHFFFAOYSA-N 0.000 description 1
- KMBSSXSNDSJXCG-UHFFFAOYSA-N 1-[2-(2-hydroxyundecylamino)ethylamino]undecan-2-ol Chemical compound CCCCCCCCCC(O)CNCCNCC(O)CCCCCCCCC KMBSSXSNDSJXCG-UHFFFAOYSA-N 0.000 description 1
- QJAMEPRRHVBWKX-UHFFFAOYSA-N 1-[2-[2-(dimethylamino)ethoxy]ethoxy]ethanol Chemical compound CC(O)OCCOCCN(C)C QJAMEPRRHVBWKX-UHFFFAOYSA-N 0.000 description 1
- FBHPRUXJQNWTEW-UHFFFAOYSA-N 1-benzyl-2-methylimidazole Chemical compound CC1=NC=CN1CC1=CC=CC=C1 FBHPRUXJQNWTEW-UHFFFAOYSA-N 0.000 description 1
- LIOJOGAWBPJICS-UHFFFAOYSA-N 1-benzyl-2-phenylimidazole;hydrochloride Chemical compound Cl.C1=CN=C(C=2C=CC=CC=2)N1CC1=CC=CC=C1 LIOJOGAWBPJICS-UHFFFAOYSA-N 0.000 description 1
- DKEWNNWXZIIRRB-UHFFFAOYSA-N 1-benzylimidazole;hydrochloride Chemical compound Cl.C1=CN=CN1CC1=CC=CC=C1 DKEWNNWXZIIRRB-UHFFFAOYSA-N 0.000 description 1
- YQMXOIAIYXXXEE-UHFFFAOYSA-N 1-benzylpyrrolidin-3-ol Chemical compound C1C(O)CCN1CC1=CC=CC=C1 YQMXOIAIYXXXEE-UHFFFAOYSA-N 0.000 description 1
- RRQYJINTUHWNHW-UHFFFAOYSA-N 1-ethoxy-2-(2-ethoxyethoxy)ethane Chemical compound CCOCCOCCOCC RRQYJINTUHWNHW-UHFFFAOYSA-N 0.000 description 1
- SDXHBDVTZNMBEW-UHFFFAOYSA-N 1-ethoxy-2-(2-hydroxyethoxy)ethanol Chemical compound CCOC(O)COCCO SDXHBDVTZNMBEW-UHFFFAOYSA-N 0.000 description 1
- JUXXCHAGQCBNTI-UHFFFAOYSA-N 1-n,1-n,2-n,2-n-tetramethylpropane-1,2-diamine Chemical compound CN(C)C(C)CN(C)C JUXXCHAGQCBNTI-UHFFFAOYSA-N 0.000 description 1
- IBLKWZIFZMJLFL-UHFFFAOYSA-N 1-phenoxypropan-2-ol Chemical compound CC(O)COC1=CC=CC=C1 IBLKWZIFZMJLFL-UHFFFAOYSA-N 0.000 description 1
- HECLRDQVFMWTQS-RGOKHQFPSA-N 1755-01-7 Chemical compound C1[C@H]2[C@@H]3CC=C[C@@H]3[C@@H]1C=C2 HECLRDQVFMWTQS-RGOKHQFPSA-N 0.000 description 1
- HYZJCKYKOHLVJF-UHFFFAOYSA-N 1H-benzimidazole Chemical compound C1=CC=C2NC=NC2=C1 HYZJCKYKOHLVJF-UHFFFAOYSA-N 0.000 description 1
- VILCJCGEZXAXTO-UHFFFAOYSA-N 2,2,2-tetramine Chemical compound NCCNCCNCCN VILCJCGEZXAXTO-UHFFFAOYSA-N 0.000 description 1
- VJZBTBIZXCDAMV-UHFFFAOYSA-N 2-(1,3-dioxo-5,6,7,7a-tetrahydro-4h-isoindol-3a-yl)ethyl prop-2-enoate Chemical compound C1CCCC2C(=O)NC(=O)C21CCOC(=O)C=C VJZBTBIZXCDAMV-UHFFFAOYSA-N 0.000 description 1
- XDVMJFWMHCWGLB-UHFFFAOYSA-N 2-(1,3-dioxoisoindol-4-yl)ethyl prop-2-enoate Chemical compound C=CC(=O)OCCC1=CC=CC2=C1C(=O)NC2=O XDVMJFWMHCWGLB-UHFFFAOYSA-N 0.000 description 1
- GUMPIILNPLLYKX-UHFFFAOYSA-N 2-(2,5-dioxopyrrol-3-yl)ethyl prop-2-enoate Chemical compound C(C=C)(=O)OCCC=1C(=O)NC(C1)=O GUMPIILNPLLYKX-UHFFFAOYSA-N 0.000 description 1
- OAYXUHPQHDHDDZ-UHFFFAOYSA-N 2-(2-butoxyethoxy)ethanol Chemical compound CCCCOCCOCCO OAYXUHPQHDHDDZ-UHFFFAOYSA-N 0.000 description 1
- SMZOUWXMTYCWNB-UHFFFAOYSA-N 2-(2-methoxy-5-methylphenyl)ethanamine Chemical compound COC1=CC=C(C)C=C1CCN SMZOUWXMTYCWNB-UHFFFAOYSA-N 0.000 description 1
- CUGZWHZWSVUSBE-UHFFFAOYSA-N 2-(oxiran-2-ylmethoxy)ethanol Chemical compound OCCOCC1CO1 CUGZWHZWSVUSBE-UHFFFAOYSA-N 0.000 description 1
- XNWFRZJHXBZDAG-UHFFFAOYSA-N 2-METHOXYETHANOL Chemical compound COCCO XNWFRZJHXBZDAG-UHFFFAOYSA-N 0.000 description 1
- GQTBMBMBWQJACJ-UHFFFAOYSA-N 2-[(4-butan-2-ylphenoxy)methyl]oxirane Chemical compound C1=CC(C(C)CC)=CC=C1OCC1OC1 GQTBMBMBWQJACJ-UHFFFAOYSA-N 0.000 description 1
- GTEXIOINCJRBIO-UHFFFAOYSA-N 2-[2-(dimethylamino)ethoxy]-n,n-dimethylethanamine Chemical compound CN(C)CCOCCN(C)C GTEXIOINCJRBIO-UHFFFAOYSA-N 0.000 description 1
- VZHATSRCGGWIRE-UHFFFAOYSA-N 2-[3-(2-hydroxyethyl)cyclohexyl]ethanol Chemical compound OCCC1CCCC(CCO)C1 VZHATSRCGGWIRE-UHFFFAOYSA-N 0.000 description 1
- JVGDVPVEKJSWIO-UHFFFAOYSA-N 2-[4-(2-hydroxyethyl)cyclohexyl]ethanol Chemical compound OCCC1CCC(CCO)CC1 JVGDVPVEKJSWIO-UHFFFAOYSA-N 0.000 description 1
- SHKUUQIDMUMQQK-UHFFFAOYSA-N 2-[4-(oxiran-2-ylmethoxy)butoxymethyl]oxirane Chemical compound C1OC1COCCCCOCC1CO1 SHKUUQIDMUMQQK-UHFFFAOYSA-N 0.000 description 1
- 125000000022 2-aminoethyl group Chemical group [H]C([*])([H])C([H])([H])N([H])[H] 0.000 description 1
- CDAWCLOXVUBKRW-UHFFFAOYSA-N 2-aminophenol Chemical compound NC1=CC=CC=C1O CDAWCLOXVUBKRW-UHFFFAOYSA-N 0.000 description 1
- ZNQVEEAIQZEUHB-UHFFFAOYSA-N 2-ethoxyethanol Chemical compound CCOCCO ZNQVEEAIQZEUHB-UHFFFAOYSA-N 0.000 description 1
- SVONRAPFKPVNKG-UHFFFAOYSA-N 2-ethoxyethyl acetate Chemical compound CCOCCOC(C)=O SVONRAPFKPVNKG-UHFFFAOYSA-N 0.000 description 1
- PQAMFDRRWURCFQ-UHFFFAOYSA-N 2-ethyl-1h-imidazole Chemical compound CCC1=NC=CN1 PQAMFDRRWURCFQ-UHFFFAOYSA-N 0.000 description 1
- YTWBFUCJVWKCCK-UHFFFAOYSA-N 2-heptadecyl-1h-imidazole Chemical compound CCCCCCCCCCCCCCCCCC1=NC=CN1 YTWBFUCJVWKCCK-UHFFFAOYSA-N 0.000 description 1
- 125000000954 2-hydroxyethyl group Chemical group [H]C([*])([H])C([H])([H])O[H] 0.000 description 1
- LXBGSDVWAMZHDD-UHFFFAOYSA-N 2-methyl-1h-imidazole Chemical compound CC1=NC=CN1 LXBGSDVWAMZHDD-UHFFFAOYSA-N 0.000 description 1
- QXSNXUCNBZLVFM-UHFFFAOYSA-N 2-methyl-1h-imidazole;1,3,5-triazinane-2,4,6-trione Chemical compound CC1=NC=CN1.O=C1NC(=O)NC(=O)N1 QXSNXUCNBZLVFM-UHFFFAOYSA-N 0.000 description 1
- BSKHPKMHTQYZBB-UHFFFAOYSA-N 2-methylpyridine Chemical compound CC1=CC=CC=N1 BSKHPKMHTQYZBB-UHFFFAOYSA-N 0.000 description 1
- ZCUJYXPAKHMBAZ-UHFFFAOYSA-N 2-phenyl-1h-imidazole Chemical compound C1=CNC(C=2C=CC=CC=2)=N1 ZCUJYXPAKHMBAZ-UHFFFAOYSA-N 0.000 description 1
- RJIQELZAIWFNTQ-UHFFFAOYSA-N 2-phenyl-1h-imidazole;1,3,5-triazinane-2,4,6-trione Chemical compound O=C1NC(=O)NC(=O)N1.C1=CNC(C=2C=CC=CC=2)=N1 RJIQELZAIWFNTQ-UHFFFAOYSA-N 0.000 description 1
- FUOZJYASZOSONT-UHFFFAOYSA-N 2-propan-2-yl-1h-imidazole Chemical compound CC(C)C1=NC=CN1 FUOZJYASZOSONT-UHFFFAOYSA-N 0.000 description 1
- MKBBSFGKFMQPPC-UHFFFAOYSA-N 2-propyl-1h-imidazole Chemical compound CCCC1=NC=CN1 MKBBSFGKFMQPPC-UHFFFAOYSA-N 0.000 description 1
- LLEASVZEQBICSN-UHFFFAOYSA-N 2-undecyl-1h-imidazole Chemical compound CCCCCCCCCCCC1=NC=CN1 LLEASVZEQBICSN-UHFFFAOYSA-N 0.000 description 1
- UIDDPPKZYZTEGS-UHFFFAOYSA-N 3-(2-ethyl-4-methylimidazol-1-yl)propanenitrile Chemical compound CCC1=NC(C)=CN1CCC#N UIDDPPKZYZTEGS-UHFFFAOYSA-N 0.000 description 1
- SESYNEDUKZDRJL-UHFFFAOYSA-N 3-(2-methylimidazol-1-yl)propanenitrile Chemical compound CC1=NC=CN1CCC#N SESYNEDUKZDRJL-UHFFFAOYSA-N 0.000 description 1
- BVYPJEBKDLFIDL-UHFFFAOYSA-N 3-(2-phenylimidazol-1-yl)propanenitrile Chemical compound N#CCCN1C=CN=C1C1=CC=CC=C1 BVYPJEBKDLFIDL-UHFFFAOYSA-N 0.000 description 1
- SZUPZARBRLCVCB-UHFFFAOYSA-N 3-(2-undecylimidazol-1-yl)propanenitrile Chemical compound CCCCCCCCCCCC1=NC=CN1CCC#N SZUPZARBRLCVCB-UHFFFAOYSA-N 0.000 description 1
- RNLHGQLZWXBQNY-UHFFFAOYSA-N 3-(aminomethyl)-3,5,5-trimethylcyclohexan-1-amine Chemical compound CC1(C)CC(N)CC(C)(CN)C1 RNLHGQLZWXBQNY-UHFFFAOYSA-N 0.000 description 1
- XHQVNXUMHRNBJP-UHFFFAOYSA-N 3-[3,5-bis(3,3-diaminopropyl)-1,3,5-triazinan-1-yl]propane-1,1-diamine Chemical compound NC(N)CCN1CN(CCC(N)N)CN(CCC(N)N)C1 XHQVNXUMHRNBJP-UHFFFAOYSA-N 0.000 description 1
- GSRZIZYNWLLHIX-UHFFFAOYSA-N 3-[4,5-bis(2-cyanoethoxy)-2-phenylimidazol-1-yl]-2-methylpropanenitrile Chemical compound C(#N)C(C)CN1C(=NC(=C1OCCC#N)OCCC#N)C1=CC=CC=C1 GSRZIZYNWLLHIX-UHFFFAOYSA-N 0.000 description 1
- DOYKFSOCSXVQAN-UHFFFAOYSA-N 3-[diethoxy(methyl)silyl]propyl 2-methylprop-2-enoate Chemical compound CCO[Si](C)(OCC)CCCOC(=O)C(C)=C DOYKFSOCSXVQAN-UHFFFAOYSA-N 0.000 description 1
- IKYAJDOSWUATPI-UHFFFAOYSA-N 3-[dimethoxy(methyl)silyl]propane-1-thiol Chemical compound CO[Si](C)(OC)CCCS IKYAJDOSWUATPI-UHFFFAOYSA-N 0.000 description 1
- LZMNXXQIQIHFGC-UHFFFAOYSA-N 3-[dimethoxy(methyl)silyl]propyl 2-methylprop-2-enoate Chemical compound CO[Si](C)(OC)CCCOC(=O)C(C)=C LZMNXXQIQIHFGC-UHFFFAOYSA-N 0.000 description 1
- QOXOZONBQWIKDA-UHFFFAOYSA-N 3-hydroxypropyl Chemical group [CH2]CCO QOXOZONBQWIKDA-UHFFFAOYSA-N 0.000 description 1
- MECNWXGGNCJFQJ-UHFFFAOYSA-N 3-piperidin-1-ylpropane-1,2-diol Chemical compound OCC(O)CN1CCCCC1 MECNWXGGNCJFQJ-UHFFFAOYSA-N 0.000 description 1
- URDOJQUSEUXVRP-UHFFFAOYSA-N 3-triethoxysilylpropyl 2-methylprop-2-enoate Chemical compound CCO[Si](OCC)(OCC)CCCOC(=O)C(C)=C URDOJQUSEUXVRP-UHFFFAOYSA-N 0.000 description 1
- LVNLBBGBASVLLI-UHFFFAOYSA-N 3-triethoxysilylpropylurea Chemical compound CCO[Si](OCC)(OCC)CCCNC(N)=O LVNLBBGBASVLLI-UHFFFAOYSA-N 0.000 description 1
- SJECZPVISLOESU-UHFFFAOYSA-N 3-trimethoxysilylpropan-1-amine Chemical compound CO[Si](OC)(OC)CCCN SJECZPVISLOESU-UHFFFAOYSA-N 0.000 description 1
- XDLMVUHYZWKMMD-UHFFFAOYSA-N 3-trimethoxysilylpropyl 2-methylprop-2-enoate Chemical compound CO[Si](OC)(OC)CCCOC(=O)C(C)=C XDLMVUHYZWKMMD-UHFFFAOYSA-N 0.000 description 1
- KBQVDAIIQCXKPI-UHFFFAOYSA-N 3-trimethoxysilylpropyl prop-2-enoate Chemical compound CO[Si](OC)(OC)CCCOC(=O)C=C KBQVDAIIQCXKPI-UHFFFAOYSA-N 0.000 description 1
- KOGSPLLRMRSADR-UHFFFAOYSA-N 4-(2-aminopropan-2-yl)-1-methylcyclohexan-1-amine Chemical compound CC(C)(N)C1CCC(C)(N)CC1 KOGSPLLRMRSADR-UHFFFAOYSA-N 0.000 description 1
- DZIHTWJGPDVSGE-UHFFFAOYSA-N 4-[(4-aminocyclohexyl)methyl]cyclohexan-1-amine Chemical compound C1CC(N)CCC1CC1CCC(N)CC1 DZIHTWJGPDVSGE-UHFFFAOYSA-N 0.000 description 1
- CDBAMNGURPMUTG-UHFFFAOYSA-N 4-[2-(4-hydroxycyclohexyl)propan-2-yl]cyclohexan-1-ol Chemical compound C1CC(O)CCC1C(C)(C)C1CCC(O)CC1 CDBAMNGURPMUTG-UHFFFAOYSA-N 0.000 description 1
- HVCNXQOWACZAFN-UHFFFAOYSA-N 4-ethylmorpholine Chemical compound CCN1CCOCC1 HVCNXQOWACZAFN-UHFFFAOYSA-N 0.000 description 1
- SXIFAEWFOJETOA-UHFFFAOYSA-N 4-hydroxy-butyl Chemical group [CH2]CCCO SXIFAEWFOJETOA-UHFFFAOYSA-N 0.000 description 1
- PRKPGWQEKNEVEU-UHFFFAOYSA-N 4-methyl-n-(3-triethoxysilylpropyl)pentan-2-imine Chemical compound CCO[Si](OCC)(OCC)CCCN=C(C)CC(C)C PRKPGWQEKNEVEU-UHFFFAOYSA-N 0.000 description 1
- KWSLGOVYXMQPPX-UHFFFAOYSA-N 5-[3-(trifluoromethyl)phenyl]-2h-tetrazole Chemical compound FC(F)(F)C1=CC=CC(C2=NNN=N2)=C1 KWSLGOVYXMQPPX-UHFFFAOYSA-N 0.000 description 1
- ULKLGIFJWFIQFF-UHFFFAOYSA-N 5K8XI641G3 Chemical compound CCC1=NC=C(C)N1 ULKLGIFJWFIQFF-UHFFFAOYSA-N 0.000 description 1
- 239000004925 Acrylic resin Substances 0.000 description 1
- 229920000178 Acrylic resin Polymers 0.000 description 1
- 229910002012 Aerosil® Inorganic materials 0.000 description 1
- 229910002016 Aerosil® 200 Inorganic materials 0.000 description 1
- 229910001020 Au alloy Inorganic materials 0.000 description 1
- 229910052582 BN Inorganic materials 0.000 description 1
- 235000021357 Behenic acid Nutrition 0.000 description 1
- 229930185605 Bisphenol Natural products 0.000 description 1
- PZNSFCLAULLKQX-UHFFFAOYSA-N Boron nitride Chemical compound N#B PZNSFCLAULLKQX-UHFFFAOYSA-N 0.000 description 1
- 239000005635 Caprylic acid (CAS 124-07-2) Substances 0.000 description 1
- XDTMQSROBMDMFD-UHFFFAOYSA-N Cyclohexane Chemical compound C1CCCCC1 XDTMQSROBMDMFD-UHFFFAOYSA-N 0.000 description 1
- RPNUMPOLZDHAAY-UHFFFAOYSA-N Diethylenetriamine Chemical compound NCCNCCN RPNUMPOLZDHAAY-UHFFFAOYSA-N 0.000 description 1
- JOYRKODLDBILNP-UHFFFAOYSA-N Ethyl urethane Chemical compound CCOC(N)=O JOYRKODLDBILNP-UHFFFAOYSA-N 0.000 description 1
- PIICEJLVQHRZGT-UHFFFAOYSA-N Ethylenediamine Chemical compound NCCN PIICEJLVQHRZGT-UHFFFAOYSA-N 0.000 description 1
- 241000257303 Hymenoptera Species 0.000 description 1
- 239000005639 Lauric acid Substances 0.000 description 1
- FXHOOIRPVKKKFG-UHFFFAOYSA-N N,N-Dimethylacetamide Chemical compound CN(C)C(C)=O FXHOOIRPVKKKFG-UHFFFAOYSA-N 0.000 description 1
- SVYKKECYCPFKGB-UHFFFAOYSA-N N,N-dimethylcyclohexylamine Chemical compound CN(C)C1CCCCC1 SVYKKECYCPFKGB-UHFFFAOYSA-N 0.000 description 1
- SJRJJKPEHAURKC-UHFFFAOYSA-N N-Methylmorpholine Chemical compound CN1CCOCC1 SJRJJKPEHAURKC-UHFFFAOYSA-N 0.000 description 1
- SECXISVLQFMRJM-UHFFFAOYSA-N N-Methylpyrrolidone Chemical compound CN1CCCC1=O SECXISVLQFMRJM-UHFFFAOYSA-N 0.000 description 1
- WHNWPMSKXPGLAX-UHFFFAOYSA-N N-Vinyl-2-pyrrolidone Chemical compound C=CN1CCCC1=O WHNWPMSKXPGLAX-UHFFFAOYSA-N 0.000 description 1
- CHJJGSNFBQVOTG-UHFFFAOYSA-N N-methyl-guanidine Natural products CNC(N)=N CHJJGSNFBQVOTG-UHFFFAOYSA-N 0.000 description 1
- GRYLNZFGIOXLOG-UHFFFAOYSA-N Nitric acid Chemical compound O[N+]([O-])=O GRYLNZFGIOXLOG-UHFFFAOYSA-N 0.000 description 1
- CTQNGGLPUBDAKN-UHFFFAOYSA-N O-Xylene Chemical compound CC1=CC=CC=C1C CTQNGGLPUBDAKN-UHFFFAOYSA-N 0.000 description 1
- 235000021319 Palmitoleic acid Nutrition 0.000 description 1
- 239000005062 Polybutadiene Substances 0.000 description 1
- 239000004721 Polyphenylene oxide Substances 0.000 description 1
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 1
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- XDODWINGEHBYRT-UHFFFAOYSA-N [2-(hydroxymethyl)cyclohexyl]methanol Chemical compound OCC1CCCCC1CO XDODWINGEHBYRT-UHFFFAOYSA-N 0.000 description 1
- FDLQZKYLHJJBHD-UHFFFAOYSA-N [3-(aminomethyl)phenyl]methanamine Chemical compound NCC1=CC=CC(CN)=C1 FDLQZKYLHJJBHD-UHFFFAOYSA-N 0.000 description 1
- LUSFFPXRDZKBMF-UHFFFAOYSA-N [3-(hydroxymethyl)cyclohexyl]methanol Chemical compound OCC1CCCC(CO)C1 LUSFFPXRDZKBMF-UHFFFAOYSA-N 0.000 description 1
- YIMQCDZDWXUDCA-UHFFFAOYSA-N [4-(hydroxymethyl)cyclohexyl]methanol Chemical compound OCC1CCC(CO)CC1 YIMQCDZDWXUDCA-UHFFFAOYSA-N 0.000 description 1
- MZVQCMJNVPIDEA-UHFFFAOYSA-N [CH2]CN(CC)CC Chemical group [CH2]CN(CC)CC MZVQCMJNVPIDEA-UHFFFAOYSA-N 0.000 description 1
- 230000001133 acceleration Effects 0.000 description 1
- 238000009825 accumulation Methods 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- 229940114077 acrylic acid Drugs 0.000 description 1
- 150000001252 acrylic acid derivatives Chemical class 0.000 description 1
- 230000003213 activating effect Effects 0.000 description 1
- 239000000654 additive Substances 0.000 description 1
- 239000012790 adhesive layer Substances 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 230000004931 aggregating effect Effects 0.000 description 1
- 125000002723 alicyclic group Chemical group 0.000 description 1
- 239000004844 aliphatic epoxy resin Substances 0.000 description 1
- 239000003513 alkali Substances 0.000 description 1
- 125000000217 alkyl group Chemical group 0.000 description 1
- DTOSIQBPPRVQHS-PDBXOOCHSA-N alpha-linolenic acid Chemical compound CC\C=C/C\C=C/C\C=C/CCCCCCCC(O)=O DTOSIQBPPRVQHS-PDBXOOCHSA-N 0.000 description 1
- 235000020661 alpha-linolenic acid Nutrition 0.000 description 1
- CSDREXVUYHZDNP-UHFFFAOYSA-N alumanylidynesilicon Chemical compound [Al].[Si] CSDREXVUYHZDNP-UHFFFAOYSA-N 0.000 description 1
- WNROFYMDJYEPJX-UHFFFAOYSA-K aluminium hydroxide Chemical compound [OH-].[OH-].[OH-].[Al+3] WNROFYMDJYEPJX-UHFFFAOYSA-K 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 239000002518 antifoaming agent Substances 0.000 description 1
- 229940114079 arachidonic acid Drugs 0.000 description 1
- 235000021342 arachidonic acid Nutrition 0.000 description 1
- 150000004982 aromatic amines Chemical class 0.000 description 1
- 229910052788 barium Inorganic materials 0.000 description 1
- DSAJWYNOEDNPEQ-UHFFFAOYSA-N barium atom Chemical compound [Ba] DSAJWYNOEDNPEQ-UHFFFAOYSA-N 0.000 description 1
- 229940116226 behenic acid Drugs 0.000 description 1
- 125000002511 behenyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- QRUDEWIWKLJBPS-UHFFFAOYSA-N benzotriazole Chemical compound C1=CC=C2N[N][N]C2=C1 QRUDEWIWKLJBPS-UHFFFAOYSA-N 0.000 description 1
- 239000012964 benzotriazole Substances 0.000 description 1
- 125000001797 benzyl group Chemical group [H]C1=C([H])C([H])=C(C([H])=C1[H])C([H])([H])* 0.000 description 1
- 239000004305 biphenyl Substances 0.000 description 1
- 235000010290 biphenyl Nutrition 0.000 description 1
- 150000001642 boronic acid derivatives Chemical class 0.000 description 1
- 125000006226 butoxyethyl group Chemical group 0.000 description 1
- 125000000484 butyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 229910000019 calcium carbonate Inorganic materials 0.000 description 1
- 239000004202 carbamide Substances 0.000 description 1
- 150000001767 cationic compounds Chemical class 0.000 description 1
- PMMYEEVYMWASQN-IMJSIDKUSA-N cis-4-Hydroxy-L-proline Chemical compound O[C@@H]1CN[C@H](C(O)=O)C1 PMMYEEVYMWASQN-IMJSIDKUSA-N 0.000 description 1
- SECPZKHBENQXJG-UHFFFAOYSA-N cis-palmitoleic acid Natural products CCCCCCC=CCCCCCCCC(O)=O SECPZKHBENQXJG-UHFFFAOYSA-N 0.000 description 1
- 239000003086 colorant Substances 0.000 description 1
- 230000000052 comparative effect Effects 0.000 description 1
- 239000011231 conductive filler Substances 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 125000004122 cyclic group Chemical group 0.000 description 1
- RLMGYIOTPQVQJR-UHFFFAOYSA-N cyclohexane-1,3-diol Chemical compound OC1CCCC(O)C1 RLMGYIOTPQVQJR-UHFFFAOYSA-N 0.000 description 1
- 125000000113 cyclohexyl group Chemical group [H]C1([H])C([H])([H])C([H])([H])C([H])(*)C([H])([H])C1([H])[H] 0.000 description 1
- FOTKYAAJKYLFFN-UHFFFAOYSA-N decane-1,10-diol Chemical compound OCCCCCCCCCCO FOTKYAAJKYLFFN-UHFFFAOYSA-N 0.000 description 1
- KQAHMVLQCSALSX-UHFFFAOYSA-N decyl(trimethoxy)silane Chemical compound CCCCCCCCCC[Si](OC)(OC)OC KQAHMVLQCSALSX-UHFFFAOYSA-N 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 239000008367 deionised water Substances 0.000 description 1
- 229910021641 deionized water Inorganic materials 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- OTARVPUIYXHRRB-UHFFFAOYSA-N diethoxy-methyl-[3-(oxiran-2-ylmethoxy)propyl]silane Chemical compound CCO[Si](C)(OCC)CCCOCC1CO1 OTARVPUIYXHRRB-UHFFFAOYSA-N 0.000 description 1
- 125000001664 diethylamino group Chemical group [H]C([H])([H])C([H])([H])N(*)C([H])([H])C([H])([H])[H] 0.000 description 1
- 229940019778 diethylene glycol diethyl ether Drugs 0.000 description 1
- JJQZDUKDJDQPMQ-UHFFFAOYSA-N dimethoxy(dimethyl)silane Chemical compound CO[Si](C)(C)OC JJQZDUKDJDQPMQ-UHFFFAOYSA-N 0.000 description 1
- WHGNXNCOTZPEEK-UHFFFAOYSA-N dimethoxy-methyl-[3-(oxiran-2-ylmethoxy)propyl]silane Chemical compound CO[Si](C)(OC)CCCOCC1CO1 WHGNXNCOTZPEEK-UHFFFAOYSA-N 0.000 description 1
- SWSQBOPZIKWTGO-UHFFFAOYSA-N dimethylaminoamidine Natural products CN(C)C(N)=N SWSQBOPZIKWTGO-UHFFFAOYSA-N 0.000 description 1
- IUNMPGNGSSIWFP-UHFFFAOYSA-N dimethylaminopropylamine Chemical compound CN(C)CCCN IUNMPGNGSSIWFP-UHFFFAOYSA-N 0.000 description 1
- ZZTCPWRAHWXWCH-UHFFFAOYSA-N diphenylmethanediamine Chemical compound C=1C=CC=CC=1C(N)(N)C1=CC=CC=C1 ZZTCPWRAHWXWCH-UHFFFAOYSA-N 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 238000009713 electroplating Methods 0.000 description 1
- 150000002148 esters Chemical class 0.000 description 1
- JDVIRCVIXCMTPU-UHFFFAOYSA-N ethanamine;trifluoroborane Chemical compound CCN.FB(F)F JDVIRCVIXCMTPU-UHFFFAOYSA-N 0.000 description 1
- YWXOVPFDZMOAHI-UHFFFAOYSA-N ethane-1,2-diol;prop-2-enamide Chemical compound OCCO.NC(=O)C=C YWXOVPFDZMOAHI-UHFFFAOYSA-N 0.000 description 1
- FWDBOZPQNFPOLF-UHFFFAOYSA-N ethenyl(triethoxy)silane Chemical compound CCO[Si](OCC)(OCC)C=C FWDBOZPQNFPOLF-UHFFFAOYSA-N 0.000 description 1
- NKSJNEHGWDZZQF-UHFFFAOYSA-N ethenyl(trimethoxy)silane Chemical compound CO[Si](OC)(OC)C=C NKSJNEHGWDZZQF-UHFFFAOYSA-N 0.000 description 1
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 description 1
- 235000019197 fats Nutrition 0.000 description 1
- 239000000706 filtrate Substances 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- 239000003063 flame retardant Substances 0.000 description 1
- 239000011888 foil Substances 0.000 description 1
- 239000005350 fused silica glass Substances 0.000 description 1
- VOZRXNHHFUQHIL-UHFFFAOYSA-N glycidyl methacrylate Chemical compound CC(=C)C(=O)OCC1CO1 VOZRXNHHFUQHIL-UHFFFAOYSA-N 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 239000003353 gold alloy Substances 0.000 description 1
- 230000017525 heat dissipation Effects 0.000 description 1
- XXMIOPMDWAUFGU-UHFFFAOYSA-N hexane-1,6-diol Chemical compound OCCCCCCO XXMIOPMDWAUFGU-UHFFFAOYSA-N 0.000 description 1
- CZWLNMOIEMTDJY-UHFFFAOYSA-N hexyl(trimethoxy)silane Chemical compound CCCCCC[Si](OC)(OC)OC CZWLNMOIEMTDJY-UHFFFAOYSA-N 0.000 description 1
- 125000002887 hydroxy group Chemical group [H]O* 0.000 description 1
- 150000003949 imides Chemical class 0.000 description 1
- 230000001771 impaired effect Effects 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 125000000959 isobutyl group Chemical group [H]C([H])([H])C([H])(C([H])([H])[H])C([H])([H])* 0.000 description 1
- 125000001972 isopentyl group Chemical group [H]C([H])([H])C([H])(C([H])([H])[H])C([H])([H])C([H])([H])* 0.000 description 1
- 239000010410 layer Substances 0.000 description 1
- 229960004488 linolenic acid Drugs 0.000 description 1
- KQQKGWQCNNTQJW-UHFFFAOYSA-N linolenic acid Natural products CC=CCCC=CCC=CCCCCCCCC(O)=O KQQKGWQCNNTQJW-UHFFFAOYSA-N 0.000 description 1
- 239000000155 melt Substances 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 125000005395 methacrylic acid group Chemical group 0.000 description 1
- 125000000956 methoxy group Chemical group [H]C([H])([H])O* 0.000 description 1
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 1
- INJVFBCDVXYHGQ-UHFFFAOYSA-N n'-(3-triethoxysilylpropyl)ethane-1,2-diamine Chemical compound CCO[Si](OCC)(OCC)CCCNCCN INJVFBCDVXYHGQ-UHFFFAOYSA-N 0.000 description 1
- MQWFLKHKWJMCEN-UHFFFAOYSA-N n'-[3-[dimethoxy(methyl)silyl]propyl]ethane-1,2-diamine Chemical compound CO[Si](C)(OC)CCCNCCN MQWFLKHKWJMCEN-UHFFFAOYSA-N 0.000 description 1
- ZETYUTMSJWMKNQ-UHFFFAOYSA-N n,n',n'-trimethylhexane-1,6-diamine Chemical compound CNCCCCCCN(C)C ZETYUTMSJWMKNQ-UHFFFAOYSA-N 0.000 description 1
- RMTGISUVUCWJIT-UHFFFAOYSA-N n-[3-[3-aminopropoxy(dimethoxy)silyl]propyl]-1-phenylprop-2-en-1-amine;hydrochloride Chemical compound Cl.NCCCO[Si](OC)(OC)CCCNC(C=C)C1=CC=CC=C1 RMTGISUVUCWJIT-UHFFFAOYSA-N 0.000 description 1
- 125000004108 n-butyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- LGQLOGILCSXPEA-UHFFFAOYSA-L nickel sulfate Chemical compound [Ni+2].[O-]S([O-])(=O)=O LGQLOGILCSXPEA-UHFFFAOYSA-L 0.000 description 1
- 229910000363 nickel(II) sulfate Inorganic materials 0.000 description 1
- 229910017604 nitric acid Inorganic materials 0.000 description 1
- 229920003986 novolac Polymers 0.000 description 1
- 229960002446 octanoic acid Drugs 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 150000007524 organic acids Chemical class 0.000 description 1
- 150000001451 organic peroxides Chemical class 0.000 description 1
- 239000003960 organic solvent Substances 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- PIBWKRNGBLPSSY-UHFFFAOYSA-L palladium(II) chloride Chemical compound Cl[Pd]Cl PIBWKRNGBLPSSY-UHFFFAOYSA-L 0.000 description 1
- 125000000913 palmityl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- UKODFQOELJFMII-UHFFFAOYSA-N pentamethyldiethylenetriamine Chemical compound CN(C)CCN(C)CCN(C)C UKODFQOELJFMII-UHFFFAOYSA-N 0.000 description 1
- KJOMYNHMBRNCNY-UHFFFAOYSA-N pentane-1,1-diamine Chemical compound CCCCC(N)N KJOMYNHMBRNCNY-UHFFFAOYSA-N 0.000 description 1
- 125000005007 perfluorooctyl group Chemical group FC(C(C(C(C(C(C(C(F)(F)F)(F)F)(F)F)(F)F)(F)F)(F)F)(F)F)(F)* 0.000 description 1
- DBIWHDFLQHGOCS-UHFFFAOYSA-N piperidine;trifluoroborane Chemical compound FB(F)F.C1CCNCC1 DBIWHDFLQHGOCS-UHFFFAOYSA-N 0.000 description 1
- 229920002647 polyamide Polymers 0.000 description 1
- 229920002857 polybutadiene Polymers 0.000 description 1
- 229920000728 polyester Polymers 0.000 description 1
- 239000004645 polyester resin Substances 0.000 description 1
- 229920001225 polyester resin Polymers 0.000 description 1
- 229920000570 polyether Polymers 0.000 description 1
- 229920001223 polyethylene glycol Polymers 0.000 description 1
- 229920001721 polyimide Polymers 0.000 description 1
- 239000009719 polyimide resin Substances 0.000 description 1
- 229920005749 polyurethane resin Polymers 0.000 description 1
- 239000011164 primary particle Substances 0.000 description 1
- 235000019260 propionic acid Nutrition 0.000 description 1
- UMJSCPRVCHMLSP-UHFFFAOYSA-N pyridine Natural products COC1=CC=CN=C1 UMJSCPRVCHMLSP-UHFFFAOYSA-N 0.000 description 1
- IUVKMZGDUIUOCP-BTNSXGMBSA-N quinbolone Chemical compound O([C@H]1CC[C@H]2[C@H]3[C@@H]([C@]4(C=CC(=O)C=C4CC3)C)CC[C@@]21C)C1=CCCC1 IUVKMZGDUIUOCP-BTNSXGMBSA-N 0.000 description 1
- 238000007151 ring opening polymerisation reaction Methods 0.000 description 1
- 150000003839 salts Chemical class 0.000 description 1
- 229910000077 silane Inorganic materials 0.000 description 1
- 229920002050 silicone resin Polymers 0.000 description 1
- 229910001961 silver nitrate Inorganic materials 0.000 description 1
- 239000002002 slurry Substances 0.000 description 1
- 239000000344 soap Substances 0.000 description 1
- 239000001509 sodium citrate Substances 0.000 description 1
- NLJMYIDDQXHKNR-UHFFFAOYSA-K sodium citrate Chemical compound O.O.[Na+].[Na+].[Na+].[O-]C(=O)CC(O)(CC([O-])=O)C([O-])=O NLJMYIDDQXHKNR-UHFFFAOYSA-K 0.000 description 1
- 229910001379 sodium hypophosphite Inorganic materials 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 125000004079 stearyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 229960002317 succinimide Drugs 0.000 description 1
- 238000004381 surface treatment Methods 0.000 description 1
- 239000000454 talc Substances 0.000 description 1
- 229910052623 talc Inorganic materials 0.000 description 1
- TUNFSRHWOTWDNC-HKGQFRNVSA-N tetradecanoic acid Chemical compound CCCCCCCCCCCCC[14C](O)=O TUNFSRHWOTWDNC-HKGQFRNVSA-N 0.000 description 1
- FAGUFWYHJQFNRV-UHFFFAOYSA-N tetraethylenepentamine Chemical compound NCCNCCNCCNCCN FAGUFWYHJQFNRV-UHFFFAOYSA-N 0.000 description 1
- 230000009974 thixotropic effect Effects 0.000 description 1
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 description 1
- 125000002889 tridecyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- WUMSTCDLAYQDNO-UHFFFAOYSA-N triethoxy(hexyl)silane Chemical compound CCCCCC[Si](OCC)(OCC)OCC WUMSTCDLAYQDNO-UHFFFAOYSA-N 0.000 description 1
- CPUDPFPXCZDNGI-UHFFFAOYSA-N triethoxy(methyl)silane Chemical compound CCO[Si](C)(OCC)OCC CPUDPFPXCZDNGI-UHFFFAOYSA-N 0.000 description 1
- JCVQKRGIASEUKR-UHFFFAOYSA-N triethoxy(phenyl)silane Chemical compound CCO[Si](OCC)(OCC)C1=CC=CC=C1 JCVQKRGIASEUKR-UHFFFAOYSA-N 0.000 description 1
- JXUKBNICSRJFAP-UHFFFAOYSA-N triethoxy-[3-(oxiran-2-ylmethoxy)propyl]silane Chemical compound CCO[Si](OCC)(OCC)CCCOCC1CO1 JXUKBNICSRJFAP-UHFFFAOYSA-N 0.000 description 1
- JLGNHOJUQFHYEZ-UHFFFAOYSA-N trimethoxy(3,3,3-trifluoropropyl)silane Chemical compound CO[Si](OC)(OC)CCC(F)(F)F JLGNHOJUQFHYEZ-UHFFFAOYSA-N 0.000 description 1
- ZNOCGWVLWPVKAO-UHFFFAOYSA-N trimethoxy(phenyl)silane Chemical compound CO[Si](OC)(OC)C1=CC=CC=C1 ZNOCGWVLWPVKAO-UHFFFAOYSA-N 0.000 description 1
- DQZNLOXENNXVAD-UHFFFAOYSA-N trimethoxy-[2-(7-oxabicyclo[4.1.0]heptan-4-yl)ethyl]silane Chemical compound C1C(CC[Si](OC)(OC)OC)CCC2OC21 DQZNLOXENNXVAD-UHFFFAOYSA-N 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
- 239000008096 xylene Substances 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32245—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73251—Location after the connecting process on different surfaces
- H01L2224/73265—Layer and wire connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
Abstract
Description
本発明は、半導体素子を金属フレームなどに接着、固定する際に用いられる導電性樹脂組成物およびこれを用いた半導体装置に関する。 The present invention relates to a conductive resin composition used when a semiconductor element is bonded and fixed to a metal frame or the like, and a semiconductor device using the same.
高度情報化社会の拡大とエレクトロニクス産業の著しい発展に伴い、トランジスタ、IC、LSI、LED等に用いられる半導体素子は集積度が増大し、より高い熱放散性と信頼性が求められるようになった。また、エレクトロニクス製品の利便性、可搬性の要求から、より小型化、高性能化が求められ、これに従い部品や半導体素子にも軽薄短小とコストダウンが要求されている。同様に半導体素子と金属フレームとを接合するダイボンディング用導電性樹脂組成物に対しても、導電性、接着性、作業性などの基本的な特性に加えて、軽量化とコストダウンが求められるようになってきた。 With the expansion of the advanced information society and the remarkable development of the electronics industry, the degree of integration of semiconductor elements used in transistors, ICs, LSIs, LEDs, etc. has increased, and higher heat dissipation and reliability have been demanded. . In addition, due to demands for convenience and portability of electronic products, further downsizing and higher performance are required, and in accordance with this, parts and semiconductor elements are required to be lighter, thinner, and lower in cost. Similarly, a conductive resin composition for die bonding that joins a semiconductor element and a metal frame is required to reduce weight and cost in addition to basic characteristics such as conductivity, adhesion, and workability. It has become like this.
一般的に、導電性樹脂組成物は銀粉を高充填することにより導電性を発現するものであるが、銀は高価でありかつ、比重が10.5と重く、そのために沈降しやすいという潜在的な問題を抱えていた。この要望に応えるべく、近年では、軽量で安価な銀被覆粒子を配合する導電性樹脂組成物が提案されている。 In general, the conductive resin composition exhibits conductivity by being highly filled with silver powder, but silver is expensive and has a specific gravity of 10.5 and is therefore likely to settle. Had a serious problem. In order to meet this demand, in recent years, conductive resin compositions containing light-weight and inexpensive silver-coated particles have been proposed.
例えば、ガラスに金属成分を溶融、還元し、金属皮膜を析出する金属析出結晶化ガラス粉末を含む導電性ペースト(特許文献1参照)が提案されている。しかし、粒径が大きく、銀被覆が不均一であるために、作業性低下や、チップの傾き、導電性の不足といった問題が発生しやすい。 For example, a conductive paste containing metal-deposited crystallized glass powder that melts and reduces a metal component in glass and deposits a metal film has been proposed (see Patent Document 1). However, since the particle size is large and the silver coating is non-uniform, problems such as reduced workability, tip tilt, and insufficient conductivity are likely to occur.
また、シリカ粒子の表面を銀で被覆した銀被覆シリカ粒子を含む導電粉末と有機バインダー樹脂と有機溶剤とを含有する導電性ペースト(特許文献2参照)、バインダーとフィラー粒子とを含み、フィラー粒子の少なくとも一部がメッキされた導電性組成物(特許文献3参照)が提案されている。しかし、接着強度の不足やボイドの発生など、接着剤として必ずしも十分な特性が得られていない。 In addition, a conductive particle containing silver-coated silica particles whose surface is coated with silver, a conductive paste containing an organic binder resin and an organic solvent (see Patent Document 2), a binder and filler particles, and filler particles A conductive composition in which at least a part of the electrode is plated (see Patent Document 3) has been proposed. However, sufficient properties as an adhesive such as insufficient adhesive strength and voids are not always obtained.
さらに、アスペクト比(T(平均厚み)/D50)が0.3〜1.0のフレーク状の銀被覆粒子を含む導電性組成物(特許文献4参照)が提案されている。しかし、フレーク状粒子は角部に銀が被覆しづらいために、体積抵抗が高くなる。また、フレーク形状は銀を均一に被覆することが難しく、被覆量が多くなるために比重が重くなる。これにより、導電性樹脂組成物全体の重量が増加するとともに、粒子の沈降が発生しやすい。また、フレーク状粒子は僅かな衝撃や応力などの外的要因によって被覆した銀が剥れやすく、導電性の低下や、接着強度の不足という問題が発生しやすい。また、フレーク状粒子は破断時の亀裂が延伸するために、接着強度が低い。 Furthermore, a conductive composition containing flaky silver-coated particles having an aspect ratio (T (average thickness) / D 50 ) of 0.3 to 1.0 has been proposed (see Patent Document 4). However, since the flaky particles are difficult to cover the corners with silver, the volume resistance becomes high. In addition, the flake shape is difficult to uniformly coat silver, and the specific gravity increases because the amount of coating increases. Thereby, the weight of the whole conductive resin composition increases, and the sedimentation of particles tends to occur. In addition, the flaky particles easily peel off the coated silver by an external factor such as a slight impact or stress, and problems such as a decrease in conductivity and insufficient adhesive strength are likely to occur. Moreover, since the crack at the time of a fracture | rupture extends | stretches, flaky particle | grains have low adhesive strength.
本発明は、このような課題に対処してなされたもので、導電性、接着性、作業性に優れる安価な導電性樹脂組成物、およびこのような導電性樹脂組成物を用いた信頼性の高い半導体装置を提供することを目的とする。 The present invention has been made in response to such problems, and is an inexpensive conductive resin composition excellent in conductivity, adhesion, and workability, and reliability using such a conductive resin composition. It is an object to provide a high semiconductor device.
本発明者らは、上記課題を解決するため鋭意研究を重ねた結果、特定の球状銀被覆シリカ粒子を必須成分として含む樹脂組成物が、上記の目的を達成し得ることを見出し、本発明を完成するに至った。 As a result of intensive studies to solve the above-mentioned problems, the present inventors have found that a resin composition containing specific spherical silver-coated silica particles as an essential component can achieve the above-described object. It came to be completed.
本発明の導電性樹脂組成物は、(A)銀被覆シリカ粒子、(B)エポキシ樹脂、および(C)硬化剤を必須成分として含有する。(A)銀被覆シリカ粒子は、導電性樹脂組成物中に35〜90質量%含まれる。また、(A)銀被覆シリカ粒子は、アスペクト比が1.0〜1.2、ガス吸着法による比表面積が0.3〜5.0m2/g、レーザー回折散乱式粒度分布測定法による累積体積粒径D50が1〜10μm、累積体積粒径D10、D50を用いて表されるD50/D10の値が1.0〜5.0、および最大粒径が40μm以下の球状粒子である。 The conductive resin composition of the present invention contains (A) silver-coated silica particles, (B) an epoxy resin, and (C) a curing agent as essential components. (A) 35-90 mass% of silver covering silica particles are contained in the conductive resin composition. Further, (A) the silver-coated silica particles have an aspect ratio of 1.0 to 1.2, a specific surface area of 0.3 to 5.0 m 2 / g by gas adsorption method, and accumulation by a laser diffraction scattering type particle size distribution measurement method. volume particle diameter D 50 of 1 to 10 [mu] m, the value of D 50 / D 10 which is represented using the cumulative volume particle diameter D 10, D 50 of 1.0 to 5.0, and a maximum particle size of less 40μm spherical Particles.
本発明によれば、導電性、接着性、作業性に優れる安価な導電性樹脂組成物を提供することができる。また、本発明によれば、上記の特性を有する導電性樹脂組成物を用いて、半導体素子を接着することで、信頼性に優れた半導体装置を提供することができる。 According to the present invention, an inexpensive conductive resin composition excellent in conductivity, adhesiveness, and workability can be provided. In addition, according to the present invention, a semiconductor device having excellent reliability can be provided by bonding a semiconductor element using the conductive resin composition having the above characteristics.
本発明の導電性樹脂組成物は、(A)銀被覆シリカ粒子、(B)エポキシ樹脂、(C)硬化剤を必須成分として含有する。 The conductive resin composition of the present invention contains (A) silver-coated silica particles, (B) an epoxy resin, and (C) a curing agent as essential components.
(A)成分の銀被覆シリカ粒子は、シリカ粒子の表面を銀で被覆した粒子であり、導電性樹脂組成物に導電性を付与するために用いられる。(A)銀被覆シリカ粒子は、アスペクト比が1.0〜1.2、ガス吸着法による比表面積が0.3〜5.0m2/g、レーザー回折散乱式粒度分布測定法による累積体積粒径D50が1〜10μm、累積体積粒径D10、D50を用いて表されるD50/D10の値が1.0〜5.0、および最大粒径が40μm以下の球状粒子である。(A)成分の銀被覆シリカ粒子は、単独でも、複数種を併用してもよい。 The silver-coated silica particles (A) are particles in which the surfaces of the silica particles are coated with silver, and are used for imparting conductivity to the conductive resin composition. (A) Silver-coated silica particles have an aspect ratio of 1.0 to 1.2, a specific surface area of 0.3 to 5.0 m 2 / g by a gas adsorption method, and a cumulative volume particle by a laser diffraction scattering type particle size distribution measurement method. diameter D 50 of 1 to 10 [mu] m, the value of D 50 / D 10 which is represented using the cumulative volume particle diameter D 10, D 50 of 1.0 to 5.0, and the maximum particle size or less spherical particles 40μm is there. The silver-coated silica particles (A) may be used alone or in combination of two or more.
(A)成分の銀被覆シリカ粒子のコア材は、シリカ粒子からなる。
(A)成分の銀被覆シリカ粒子の形状は球状である。球状の粒子は、導電性フィラーとして使用する場合に、充填性、分散性に優れる点で好ましい。球状であれば、中空状、ポーラス状であってもよく、粒子表面に多数の突起を有するものや、多数の凸凹を有するものであってもよい。(A)成分の銀被覆シリカ粒子は、特にコア材のシリカ粒子が球状のシリカ粒子であることが好ましい。
The core material of the silver-coated silica particles (A) is composed of silica particles.
The shape of the (A) component silver-coated silica particles is spherical. Spherical particles are preferable in terms of excellent filling properties and dispersibility when used as a conductive filler. As long as it is spherical, it may be hollow or porous, and may have a large number of protrusions on the particle surface or a large number of irregularities. The silver-coated silica particles (A) are particularly preferably silica particles in which the core silica particles are spherical.
球状のシリカ粒子は、例えば、溶融炉で溶融したシリカを上部より落下させ、冷却工程で球状化させることで製造される。シリカ粒子の表面は表面処理をされたものであってもよい。シリカ粒子の表面を銀で被覆処理する方法としては、蒸着法、スパッタ法、電気メッキ法、置換メッキ法、無電解メッキ法などがあり、これらを組合せて処理することもできる。また、処理する際に、例えば、パラジウムにより活性化し、ニッケルメッキした後に、銀メッキを行うことにより、シリカ粒子の表面を効率的に被覆処理することができる。特に、無電解メッキ法による被覆処理において、シリカ粒子の表面を均一に、かつ濃密に被覆できる点で好ましい。 Spherical silica particles are produced, for example, by dropping silica melted in a melting furnace from the top and spheronizing in a cooling step. The surface of the silica particles may be subjected to a surface treatment. As a method for coating the surface of the silica particles with silver, there are a vapor deposition method, a sputtering method, an electroplating method, a displacement plating method, an electroless plating method, and the like. Moreover, when processing, the surface of a silica particle can be efficiently coat | covered by performing silver plating after activating with palladium and nickel-plating, for example. In particular, the coating treatment by the electroless plating method is preferable in that the surface of the silica particles can be uniformly and densely coated.
(A)成分の銀被覆シリカ粒子は、アスペクト比が1.0〜1.2のものである。本発明においてアスペクト比は、(粒子の最大長径/最大長径に直交する幅)を測定した値である。アスペクト比がこの範囲にあると、半導体素子と、リードフレーム、基板などの支持部材とを接合した場合に、銀被覆シリカ粒子が高充填となり、体積抵抗を減らすことができる。また、配合量を多くした場合においても、粘度が高くなりにくく、作業性に悪影響を与えない。アスペクト比が1.2より大きいと、球状粒子であっても、フレーク状粒子であっても、銀被覆シリカ粒子の充填率が低下し、体積抵抗が上がるために、十分な導電性が得られない。また、配合量を多くした場合に、粘度が高くなりやすく、作業性が不十分である。 The silver-coated silica particles (A) have an aspect ratio of 1.0 to 1.2. In the present invention, the aspect ratio is a value obtained by measuring (maximum major axis of particle / width perpendicular to the major axis). When the aspect ratio is within this range, when the semiconductor element is bonded to a supporting member such as a lead frame or a substrate, the silver-coated silica particles are highly filled, and the volume resistance can be reduced. Further, even when the blending amount is increased, the viscosity is hardly increased and workability is not adversely affected. When the aspect ratio is greater than 1.2, the filling rate of the silver-coated silica particles is lowered and the volume resistance is increased regardless of whether the particles are spherical particles or flaky particles, so that sufficient conductivity is obtained. Absent. Further, when the blending amount is increased, the viscosity tends to be high and workability is insufficient.
(A)成分の銀被覆シリカ粒子は、ガス吸着法による比表面積が0.3〜5.0m2/gである。比表面積がこの範囲にあると、作業性、分散性、体積抵抗に優れる導電性樹脂組成物となる。比表面積が0.3m2/gより小さいと、粘度およびチキソ性が低下する。例えば、ニードル径0.3mmのシリンジでディスペンスした場合に、液ダレや糸引きが発生し、満足な作業性が得られない。比表面積が5.0m2/gより大きいと、粘度およびチキソ性が高くなり、作業性が不十分である。また、比表面積が5.0m2/gより大きいと、銀被覆量が多くなり、銀被覆シリカ粒子の比重が大きくなるために、粒子が沈降しやすくなる。また、比表面積が大きいと、同じ銀量をシリカ粒子に被覆した場合に、被覆面積が大きくなるため、銀被覆層の厚さが薄くなる。このため、十分な導通が得られず、体積抵抗が高くなる。 The silver-coated silica particles (A) have a specific surface area of 0.3 to 5.0 m 2 / g as determined by gas adsorption. When the specific surface area is in this range, the conductive resin composition is excellent in workability, dispersibility, and volume resistance. When the specific surface area is less than 0.3 m 2 / g, the viscosity and the thixotropy decrease. For example, when dispensing with a syringe having a needle diameter of 0.3 mm, dripping or stringing occurs, and satisfactory workability cannot be obtained. When the specific surface area is larger than 5.0 m 2 / g, the viscosity and the thixotropy are increased, and the workability is insufficient. On the other hand, when the specific surface area is larger than 5.0 m 2 / g, the silver coating amount increases and the specific gravity of the silver-coated silica particles increases, so that the particles easily settle. In addition, when the specific surface area is large, when the same amount of silver is coated on the silica particles, the coated area becomes large, and thus the thickness of the silver coating layer becomes thin. For this reason, sufficient conduction cannot be obtained, and the volume resistance increases.
(A)成分の銀被覆シリカ粒子は、レーザー回折散乱式粒度分布測定法による累積体積粒径D50が1〜10μmである。D50がこの範囲にあると、作業性に優れる導電性樹脂組成物となる。D50が1μmより小さいと、導電性樹脂組成物の粘度が高くなるために、作業性が低下する。D50が10μmより大きいと、例えば、ニードル径0.3mmのシリンジでディスペンスした場合に、シリンジ先端でノズル詰まりを起こしやすくなり、塗布不良を生じる可能性がある。 The silver-coated silica particles (A) have a cumulative volume particle size D 50 of 1 to 10 μm as measured by a laser diffraction / scattering particle size distribution measurement method. If D 50 is in this range, the conductive resin composition which is excellent in workability. And D 50 is 1μm smaller, because the viscosity of the conductive resin composition becomes high, workability is lowered. When D 50 is larger than 10 μm, for example, when dispensing with a syringe having a needle diameter of 0.3 mm, nozzle clogging is likely to occur at the tip of the syringe, which may cause application failure.
(A)成分の銀被覆シリカ粒子は、レーザー回折散乱式粒度分布測定法による累積体積粒径D10、D50を用いて表されるD50/D10の値が1.0〜5.0である。D50/D10の値がこの範囲にあると、導電性、接着性に優れる。D50/D10が5.0より大きいと、1.0μm以下の微細粉が増加し、銀被覆面積が大きくなるため、同じ銀量をシリカ粒子に被覆した場合に、粒子全体の銀被覆層の厚さが薄くなる。このため、十分な導電性が得られない。また、微細粉が増加すると、粒子に対するエポキシ樹脂付着量が増加するために、導電性樹脂組成物と支持部材との界面および、導電性樹脂組成物と半導体素子との界面のエポキシ樹脂量が低下するために、接着性が十分に得られない。 The silver-coated silica particles (A) have a D 50 / D 10 value of 1.0 to 5.0 expressed using cumulative volume particle diameters D 10 and D 50 according to a laser diffraction / scattering particle size distribution measurement method. It is. When the value of D 50 / D 10 is within this range, the conductivity and adhesiveness are excellent. When D 50 / D 10 is larger than 5.0, fine powder of 1.0 μm or less is increased and the silver coating area is increased. Therefore, when silica particles are coated with the same amount of silver, the silver coating layer of the entire particles The thickness of the becomes thinner. For this reason, sufficient electrical conductivity cannot be obtained. In addition, as the amount of fine powder increases, the amount of epoxy resin attached to the particles increases, so the amount of epoxy resin at the interface between the conductive resin composition and the support member and the interface between the conductive resin composition and the semiconductor element decreases. Therefore, sufficient adhesion cannot be obtained.
(A)成分の銀被覆シリカ粒子は、レーザー回折散乱式粒度分布測定法による最大粒径が40μm以下の範囲にあると、半導体素子と支持部材とを接合した場合に、導電性樹脂組成物の膜厚が10〜30μmとなることが多いが、このときに粒子径の大きな銀被覆シリカ粒子が存在すると、半導体素子が傾くといった不具合が生じる可能性がある。また、例えば、ニードル径0.3mmのシリンジでディスペンスした場合に、シリンジ先端でノズル詰まりを起こしやすくなり、塗布不良を生じる可能性がある。 When the silver-coated silica particles (A) have a maximum particle size in the range of 40 μm or less according to the laser diffraction / scattering particle size distribution measurement method, when the semiconductor element and the support member are joined, the conductive resin composition The film thickness is often 10 to 30 μm, but if silver-coated silica particles having a large particle diameter are present at this time, there is a possibility that a problem such as tilting of the semiconductor element may occur. Further, for example, when dispensing with a syringe having a needle diameter of 0.3 mm, nozzle clogging is likely to occur at the tip of the syringe, which may cause application failure.
(A)成分の銀被覆シリカ粒子は、比重が2.4〜3.6であることが好ましい。比重がこの範囲にあると、導電性、分散性に優れる導電性樹脂組成物となる。比重が2.4より小さいと、銀被覆量が少なく、銀被覆層が薄くなるため、体積抵抗が上がり、導電性が低下する。比重が3.6より大きいと、銀被覆シリカ粒子が沈降しやすくなる。比重は、より好ましくは2.7〜3.3である。 The silver-coated silica particles (A) preferably have a specific gravity of 2.4 to 3.6. When the specific gravity is within this range, the conductive resin composition is excellent in conductivity and dispersibility. When the specific gravity is less than 2.4, the silver coating amount is small and the silver coating layer becomes thin, so that the volume resistance increases and the conductivity decreases. When the specific gravity is larger than 3.6, the silver-coated silica particles are liable to settle. The specific gravity is more preferably 2.7 to 3.3.
(A)成分の銀被覆シリカ粒子は、その表面がシランカップリング剤で被覆されたものであることが好ましい。シランカップリング剤が被覆されていると、銀被覆シリカ粒子とエポキシ樹脂との密着性、相溶性が上がり、接着強度が上昇する。シランカップリング剤で被覆する場合、銀被覆シリカ粒子表面を脂肪酸または脂肪酸塩で表面処理した後に、最表面をシランカップリング剤で被覆すると、密着性、相溶性、接着性において最も効果的である。シランカップリング剤は特に限定されず、単独でも、複数種を併用してもよい。シランカップリング剤の被覆方法としては、湿式法、乾式法があり、例えば、銀被覆シリカ粒子に直接添加し、撹拌し、乾燥する乾式方法、直接噴霧して処理する方法、アルコールにシランカップリング剤を配合し、銀被覆シリカ粒子を加えて撹拌し被覆処理する方法などが挙げられる。 The surface of the silver-coated silica particles (A) is preferably coated with a silane coupling agent. When the silane coupling agent is coated, the adhesion and compatibility between the silver-coated silica particles and the epoxy resin increase, and the adhesive strength increases. When coating with a silane coupling agent, the surface of the silver-coated silica particles is treated with a fatty acid or a fatty acid salt, and then the outermost surface is coated with a silane coupling agent, which is most effective in adhesion, compatibility, and adhesion. . The silane coupling agent is not particularly limited and may be used alone or in combination of two or more. The silane coupling agent coating method includes a wet method and a dry method. For example, a dry method of directly adding to silver-coated silica particles, stirring and drying, a method of directly spraying and processing, a silane coupling to alcohol A method of blending an agent, adding silver-coated silica particles, stirring, and coating treatment may be mentioned.
シランカップリング剤としては、3−グリシドキシプロピルメチルジメトキシシラン、3−グリシドキシプロピルトリメトキシシラン、3−グリシドキシプロピルメチルジエトキシシラン、3−グリシドキシプロピルトリエトキシシラン、2−(3,4−エポキシシクロへキシル)エチルトリメトキシシラン、p−スチリルトリメトキシシラン、3−メタクリロキシプロピルメチルジメトキシシラン、3−メタクリロキシプロピルトリメトキシシラン、3−メタクリロキシプロピルメチルジエトキシシラン、3−メタクリロキシプロピルトリエトキシシラン、3−アクリロキシプロピルトリメトキシシラン、N−2−(アミノエチル)−3−アミノプロピルメチルジメトキシシラン、N−2−(アミノエチル)−3−アミノプロピルトリメトキシシラン、N−2−(アミノエチル)−3−アミノプロピルトリエトキシシラン、3−アミノプロピルトリメトキシシラン、3−アミノプロピルトリエトキシシラン、3−トリエトキシシリル−N−(1,3−ジメチル−ブチリデン)プロピルアミン、3−メルカプトプロピルトリメトキシシラン、N−フェニル−3−アミノプロピルトリメトキシシラン、N−(ビニルベンジル)−2−アミノエチル−3−アミノプロピルトリメトキシシランの塩酸塩、3−ウレイドプロピルトリエトキシシラン、3−メルカプトプロピルメチルジメトキシシラン、ビニルトリメトキシシラン、ビニルトリエトキシシラン、メチルトリメトキシシラン、ジメチルジメトキシシラン、フェニルトリメトキシシラン、メチルトリエトキシシラン、ジメチルジエトキシシラン、フェニルトリエトキシシラン、ヘキシルトリメトキシシラン、へキシルトリエトキシシラン、デシルトリメトキシシラン、トリフルオロプロピルトリメトキシシラン、ヘキサメチルジシラザン、ビス(トリエトキシシリルプロピル)テトラスルフィド、3−イソシアネートプロピルトリエトキシシランなどが挙げられ、エポキシ樹脂との相溶性、反応性の観点から、好ましくは3−グリシドキシプロピルトリメトキシシラン、3−メルカプトプロピルトリメトキシシラン、N−フェニル−3−アミノプロピルトリメトキシシラン、メチルトリメトキシシラン、ビス(トリエトキシシリルプロピル)テトラスルフィドである。 Examples of silane coupling agents include 3-glycidoxypropylmethyldimethoxysilane, 3-glycidoxypropyltrimethoxysilane, 3-glycidoxypropylmethyldiethoxysilane, 3-glycidoxypropyltriethoxysilane, 2- (3,4-epoxycyclohexyl) ethyltrimethoxysilane, p-styryltrimethoxysilane, 3-methacryloxypropylmethyldimethoxysilane, 3-methacryloxypropyltrimethoxysilane, 3-methacryloxypropylmethyldiethoxysilane, 3-methacryloxypropyltriethoxysilane, 3-acryloxypropyltrimethoxysilane, N-2- (aminoethyl) -3-aminopropylmethyldimethoxysilane, N-2- (aminoethyl) -3-aminopropyltrimeth Sisilane, N-2- (aminoethyl) -3-aminopropyltriethoxysilane, 3-aminopropyltrimethoxysilane, 3-aminopropyltriethoxysilane, 3-triethoxysilyl-N- (1,3-dimethyl- Butylidene) propylamine, 3-mercaptopropyltrimethoxysilane, N-phenyl-3-aminopropyltrimethoxysilane, N- (vinylbenzyl) -2-aminoethyl-3-aminopropyltrimethoxysilane hydrochloride, 3- Ureidopropyltriethoxysilane, 3-mercaptopropylmethyldimethoxysilane, vinyltrimethoxysilane, vinyltriethoxysilane, methyltrimethoxysilane, dimethyldimethoxysilane, phenyltrimethoxysilane, methyltriethoxysilane, dimethyldie Xysilane, phenyltriethoxysilane, hexyltrimethoxysilane, hexyltriethoxysilane, decyltrimethoxysilane, trifluoropropyltrimethoxysilane, hexamethyldisilazane, bis (triethoxysilylpropyl) tetrasulfide, 3-isocyanatopropyltri From the viewpoint of compatibility and reactivity with epoxy resin, preferably 3-glycidoxypropyltrimethoxysilane, 3-mercaptopropyltrimethoxysilane, N-phenyl-3-aminopropyltrimethoxy Silane, methyltrimethoxysilane, bis (triethoxysilylpropyl) tetrasulfide.
(A)成分の銀被覆シリカ粒子は、その表面が脂肪酸または脂肪酸塩で被覆されたものであることが好ましい。脂肪酸または脂肪酸塩が被覆されていると、銀被覆シリカ粒子の分散性、相溶性の向上や、粒子同士の凝集防止効果がある。脂肪酸または脂肪酸塩は特に限定されず、単独でも、複数種を併用してもよい。脂肪酸または脂肪酸塩の被覆方法としては、メッキの際に添加する方法、加熱撹拌装置で気相反応する方法、直接添加し撹拌する方法、アルコールに配合し湿式で処理する方法、直接噴霧して処理する方法などが挙げられる。脂肪酸または脂肪酸塩としては、ベンゾトリアゾール、ステアリン酸、オレイン酸、プロピオン酸、カプリル酸、ラウリン酸、ミリスチン酸、パルミチン酸、パルミトレイン酸、べへン酸、アクリル酸、リノール酸、リノレン酸、アラキドン酸、およびこれらの塩などが挙げられる。エポキシ樹脂への相溶性、反応性の観点から、好ましくはオレイン酸、ステアリン酸、パルミチン酸である。 The silver-coated silica particles (A) are preferably those whose surfaces are coated with a fatty acid or a fatty acid salt. When the fatty acid or the fatty acid salt is coated, the dispersibility and compatibility of the silver-coated silica particles are improved and the particles are prevented from aggregating. The fatty acid or fatty acid salt is not particularly limited, and may be used alone or in combination of two or more. The coating method of fatty acid or fatty acid salt includes a method of adding at the time of plating, a method of reacting in a gas phase with a heating and stirring device, a method of directly adding and stirring, a method of blending with alcohol and wet processing, and a direct spraying process. The method of doing is mentioned. Examples of fatty acids or fatty acid salts include benzotriazole, stearic acid, oleic acid, propionic acid, caprylic acid, lauric acid, myristic acid, palmitic acid, palmitoleic acid, behenic acid, acrylic acid, linoleic acid, linolenic acid, arachidonic acid And salts thereof. From the viewpoint of compatibility with epoxy resins and reactivity, oleic acid, stearic acid, and palmitic acid are preferred.
導電性樹脂組成物の合計を100質量%とした場合、(A)成分の銀被覆シリカ粒子は35〜90質量%であることが好ましい。この範囲にあると、導電性、接着性、作業性に優れた導電性樹脂組成物となる。35質量%より少ないと、良好な導電性を得ることが困難となり、90質量%を超えると、接着性が低下し、作業性も著しく低下し、コストが増大する。より好ましくは40〜80質量%である。 When the total of the conductive resin composition is 100% by mass, the silver-coated silica particles of the component (A) is preferably 35 to 90% by mass. When it is within this range, a conductive resin composition excellent in conductivity, adhesiveness, and workability is obtained. If it is less than 35% by mass, it will be difficult to obtain good conductivity, and if it exceeds 90% by mass, the adhesiveness will be lowered, the workability will be significantly reduced, and the cost will be increased. More preferably, it is 40-80 mass%.
本発明の導電性樹脂組成物には、(A)成分以外の導電性粒子を配合してもよい。(A)成分以外の導電性粒子は、全導電性粒子((A)成分の銀被覆シリカ粒子と(A)成分以外の導電性粒子)中、合計で50質量%以下であることが好ましく、より好ましくは30質量%以下であり、さらに好ましくは(A)成分の銀被覆シリカ粒子のみを使用することである。 You may mix | blend conductive particles other than (A) component with the conductive resin composition of this invention. The conductive particles other than the component (A) are preferably 50% by mass or less in total in all the conductive particles (the silver-coated silica particles of the component (A) and the conductive particles other than the component (A)). More preferably, it is 30 mass% or less, More preferably, it is only using the silver coating silica particle of (A) component.
(A)成分以外の導電性粒子としては、銀粒子、銅粒子、ニッケル粒子、アルミニウム粒子、銀被覆銅粒子、銀ナノ粒子などが挙げられる。導電性、作業性の観点から、好ましくは銀粒子、銀ナノ粒子である。銀粒子としては、レーザー回折散乱式粒度分布測定法による累積体積粒径D50が0.5〜15μmである、フレーク状または不定形状のものがより好ましい。銀ナノ粒子としては、D50が5〜300nmであるものがより好ましく、形状は特に限定されない。 Examples of the conductive particles other than the component (A) include silver particles, copper particles, nickel particles, aluminum particles, silver-coated copper particles, and silver nanoparticles. From the viewpoint of conductivity and workability, silver particles and silver nanoparticles are preferable. As the silver particles, those having a flaky shape or an indefinite shape having a cumulative volume particle size D 50 of 0.5 to 15 μm by a laser diffraction scattering type particle size distribution measuring method are more preferable. The silver nanoparticles, more preferably those D 50 is 5 to 300 nm, the shape is not particularly limited.
本発明の導電性樹脂組成物には、本発明の所定の効果を損なわない範囲で非導電性粒子を配合してもよい。非導電性粒子は、全粒子((A)成分の銀被覆シリカ粒子と(A)成分以外の導電性粒子と非導電性粒子)中、合計で50質量%以下であることが好ましく、より好ましくは30質量%以下であり、さらに好ましくは(A)成分の銀被覆シリカ粒子のみを使用することである。 You may mix | blend nonelectroconductive particle with the conductive resin composition of this invention in the range which does not impair the predetermined effect of this invention. The total amount of the non-conductive particles is preferably 50% by mass or less, more preferably in the total particles (the silver-coated silica particles of the component (A), the conductive particles other than the component (A), and the non-conductive particles). Is 30% by mass or less, and more preferably, only the silver-coated silica particles of the component (A) are used.
非導電性粒子としては、シリカ、ヒュームドシリカ、アルミナ、窒化ホウ素、酸化チタン、バリウム、タルク、炭酸カルシウム、水酸化アルミニウムなどが挙げられる。作業性、接着性の観点から、好ましくはシリカ、ヒュームドシリカである。シリカとしては、レーザー回折散乱式粒度分布測定法による累積体積粒径D50が0.5〜15μmである、球状のものがより好ましい。ヒュームドシリカとしては一次粒径D50が5〜300nmであるものがより好ましく、形状は特に限定されない。 Non-conductive particles include silica, fumed silica, alumina, boron nitride, titanium oxide, barium, talc, calcium carbonate, aluminum hydroxide, and the like. From the viewpoint of workability and adhesiveness, silica and fumed silica are preferred. As the silica, a spherical one having a cumulative volume particle diameter D50 of 0.5 to 15 μm by a laser diffraction / scattering particle size distribution measurement method is more preferable. As the fumed silica, those having a primary particle size D50 of 5 to 300 nm are more preferable, and the shape is not particularly limited.
本発明の導電性樹脂組成物は、比重が1.0〜3.0であることが好ましい。この範囲にあると、導電性、分散性に優れた導電性樹脂組成物となる。比重が1.0より少ないと、良好な導電性を得ることが困難となり、3.0を超えると、分散性、作業性が低下し、コストが増大する。より好ましくは1.3〜2.5である。 The conductive resin composition of the present invention preferably has a specific gravity of 1.0 to 3.0. When in this range, a conductive resin composition having excellent conductivity and dispersibility is obtained. When the specific gravity is less than 1.0, it is difficult to obtain good electrical conductivity, and when it exceeds 3.0, dispersibility and workability are lowered, and the cost is increased. More preferably, it is 1.3-2.5.
本発明の導電性樹脂組成物は、E型粘度計(3°コーン)を用い、25℃、0.5rpmの条件で測定した粘度が5〜200Pa・sであることが好ましい。この範囲にあると、作業性に優れた導電性樹脂組成物となる。粘度が5Pa・sより小さいと、液ダレなどが発生し、粘度が200Pa・sより大きいと、ディスペンスが困難となり、作業性が低下する。より好ましくは20〜180Pa・sである。 The conductive resin composition of the present invention preferably has a viscosity of 5 to 200 Pa · s measured using an E-type viscometer (3 ° cone) at 25 ° C. and 0.5 rpm. When in this range, the conductive resin composition is excellent in workability. When the viscosity is less than 5 Pa · s, dripping or the like occurs, and when the viscosity is more than 200 Pa · s, dispensing becomes difficult and workability is deteriorated. More preferably, it is 20-180 Pa.s.
本発明の導電性樹脂組成物は(B)エポキシ樹脂を含む。(B)成分のエポキシ樹脂は特に限定されず、単独でも、複数種を併用してもよい。(B)成分のエポキシ樹脂は、1分子中に2個以上のグリシジル基を有するものであれば、いかなるエポキシ樹脂も使用することが出来る。 The conductive resin composition of the present invention contains (B) an epoxy resin. The epoxy resin as the component (B) is not particularly limited, and may be used alone or in combination. As the epoxy resin as the component (B), any epoxy resin can be used as long as it has two or more glycidyl groups in one molecule.
例えば、ビスフェノールA型エポキシ樹脂、ビスフェノールF型エポキシ樹脂、ビフェニル型エポキシ樹脂、ノボラック型エポキシ樹脂、エーテルまたはポリエーテル型エポキシ樹脂、エステルまたはポリエステルエポキシ樹脂、ウレタン型エポキシ樹脂、多官能型エポキシ樹脂、脂環式エポキシ樹脂、脂肪族エポキシ樹脂、水添型エポキシ樹脂、ナフタレン型エポキシ樹脂、フルオレン型エポキシ樹脂、エチレンオキサイド変性ビスフェノールA型エポキシ樹脂、プロピレンオキサイド変性ビスフェノールA型エポキシ樹脂、グリシジル変性ポリプタジエン樹脂、グリシジル変性トリアジン樹脂、シリコーン変性エポキシ樹脂、アミノフェノール型エポキシ樹脂、可とう性エポキシ樹脂、メタクリル変性エポキシ樹脂、アクリル変性エポキシ樹脂、特殊変性エポキシ樹脂、ジシクロペンタジエン型エポキシ樹脂、側鎖水酸基アルキル変性エポキシ樹脂、長鎖アルキル変性エポキシ樹脂、イミド変性エポキシ樹脂、CTBN変性エポキシ樹脂などが挙げられるが、これらに限定されない。 For example, bisphenol A type epoxy resin, bisphenol F type epoxy resin, biphenyl type epoxy resin, novolac type epoxy resin, ether or polyether type epoxy resin, ester or polyester epoxy resin, urethane type epoxy resin, polyfunctional type epoxy resin, fat Cyclic epoxy resin, aliphatic epoxy resin, hydrogenated epoxy resin, naphthalene type epoxy resin, fluorene type epoxy resin, ethylene oxide modified bisphenol A type epoxy resin, propylene oxide modified bisphenol A type epoxy resin, glycidyl modified polyptadiene resin, glycidyl Modified triazine resin, silicone modified epoxy resin, aminophenol type epoxy resin, flexible epoxy resin, methacrylic modified epoxy resin, acrylic modified epoxy resin Resins, special-modified epoxy resin, dicyclopentadiene type epoxy resin, side chain hydroxyl alkyl-modified epoxy resins, long-chain alkyl-modified epoxy resin, imide modified epoxy resin, such as CTBN modified epoxy resins include, but are not limited to.
エポキシ樹脂は常温で液状であることが好ましいが、常温で固体のものであっても、他の液状のエポキシ樹脂または反応性希釈剤、溶剤などにより希釈し、液状で用いることができる。液状であるエポキシ樹脂としては、ビスフェノールA型エポキシ樹脂、ビスフェノールF型エポキシ樹脂、1,6−ヘキサンジオールジグリシジルエーテル、4,4‘−イソプロピリデンジシクロヘキサノールジグリシジルエーテル、1,4−シクロヘキサンジメタノールジグリシジルエーテル、1,4−ブタンジオールジグリシジルエーテル、可とう性エポキシ樹脂がより好ましい。 The epoxy resin is preferably liquid at normal temperature, but even if it is solid at normal temperature, it can be diluted with another liquid epoxy resin, a reactive diluent, a solvent or the like and used in liquid form. Liquid epoxy resins include bisphenol A type epoxy resin, bisphenol F type epoxy resin, 1,6-hexanediol diglycidyl ether, 4,4′-isopropylidenedicyclohexanol diglycidyl ether, 1,4-cyclohexanedi Methanol diglycidyl ether, 1,4-butanediol diglycidyl ether, and a flexible epoxy resin are more preferable.
可とう性エポキシ樹脂としては例えば、柔軟基変性エポキシ樹脂YL7175−500、YL7175−1000、YL7410(以上、三菱化学社製、商品名)や、ビスフェノールA変性エポキシ樹脂EP−4003S、EP−4000S(以上、ADEKA社製、商品名)、TSR−960、TSR−601、1650−75MPX、EXA−4850−150、EXA−4850−1000、EXA−4816、EXA−4822(以上、DIC社製、商品名)、BPO−20E、BEO−60E(以上、新日本理化社製、商品名)などが挙げられ、YL7175−500、YL7175−1000がより好ましい。 Examples of the flexible epoxy resin include flexible group-modified epoxy resins YL7175-500, YL7175-1000, YL7410 (above, trade name, manufactured by Mitsubishi Chemical Corporation), and bisphenol A-modified epoxy resins EP-4003S, EP-4000S (above. ADEKA, trade name), TSR-960, TSR-601, 1650-75MPX, EXA-4850-150, EXA-4850-1000, EXA-4816, EXA-4822 (above, DIC, trade name) , BPO-20E, BEO-60E (trade name, manufactured by Shin Nippon Chemical Co., Ltd.) and the like, and YL7175-500 and YL7175-1000 are more preferable.
また、本発明においては、応力緩和性や密着性などをさらに改善する目的で、(B)成分以外の樹脂成分を配合してもよい。併用可能な樹脂としては、例えば、(B)成分以外のアクリル樹脂、ポリエステル樹脂、ポリブタジエン樹脂、フェノール樹脂、ポリイミド樹脂、シリコーン樹脂、ポリウレタン樹脂、キシレン樹脂などが挙げられる。これらの樹脂は1種を単独で使用してもよく、2種以上を混合して使用してもよい。このようにエポキシ樹脂以外の他の樹脂を併用する場合、エポキシ樹脂100質量部に対して、他の樹脂を50質量部まで混合することができる。 Moreover, in this invention, you may mix | blend resin components other than (B) component in order to improve stress relaxation property, adhesiveness, etc. further. Examples of the resin that can be used in combination include acrylic resins other than the component (B), polyester resins, polybutadiene resins, phenol resins, polyimide resins, silicone resins, polyurethane resins, xylene resins, and the like. These resins may be used alone or in combination of two or more. Thus, when using other resins other than an epoxy resin together, another resin can be mixed to 50 mass parts with respect to 100 mass parts of epoxy resins.
本発明の導電性樹脂組成物は(C)硬化剤を含む。(C)成分の硬化剤は特に制限されず、単独でも、複数種を併用してもよい。(C)成分の硬化剤は、エポキシ樹脂を硬化するものであれば、いかなるものでも使用できる。例えば、ジシアンジアミド、フェノール樹脂、アミン化合物、潜在性アミン化合物、カチオン化合物、酸無水物、特殊エポキシ硬化剤などが挙げられる。硬化性、接着性の観点から、ジシアンジアミドとフェノール樹脂がより好ましい。 The conductive resin composition of the present invention contains (C) a curing agent. The curing agent for component (C) is not particularly limited, and may be used alone or in combination. As the curing agent for component (C), any curing agent can be used as long as it cures the epoxy resin. For example, dicyandiamide, a phenol resin, an amine compound, a latent amine compound, a cationic compound, an acid anhydride, a special epoxy curing agent, and the like can be given. From the viewpoints of curability and adhesiveness, dicyandiamide and a phenol resin are more preferable.
(C)成分の配合量は、エポキシ樹脂を有効に硬化するものであればよく、特に制限されるものではない。(C)成分の配合量は、例えば硬化剤の種類に応じて以下の範囲が好ましい。ジシアンジアミドの場合、(B)成分であるエポキシ樹脂の合計100質量部に対して、0.1〜10質量部が好ましい。また、フェノール樹脂の場合、(B)成分であるエポキシ樹脂の合計100質量部に対して、5〜100質量部が好ましい。 The blending amount of the component (C) is not particularly limited as long as it effectively cures the epoxy resin. (C) The compounding quantity of a component has the following preferable range according to the kind of hardening | curing agent, for example. In the case of dicyandiamide, 0.1-10 mass parts is preferable with respect to a total of 100 mass parts of the epoxy resin which is (B) component. Moreover, in the case of a phenol resin, 5-100 mass parts is preferable with respect to a total of 100 mass parts of the epoxy resin which is (B) component.
本発明の導電性樹脂組成物には、硬化促進剤を配合してもよい。硬化促進剤としては、従来、エポキシ樹脂の硬化促進剤として使用されているものであれば特に制限されず、単独でも、複数種を併用してもよい。硬化促進剤としては、例えば、イミダゾール系硬化促進剤、アミン系硬化促進剤、トリフェニルホスフィン系硬化促進剤、ジアザビシクロ系硬化促進剤、ウレア系硬化促進剤、ボレート塩系硬化促進剤、ポリアミド系硬化促進剤などが挙げられる。硬化性、接着性の観点から、イミダゾール系硬化促進剤と、アミン系硬化促進剤が好ましく、イミダゾール系硬化促進剤であることがより好ましい。 You may mix | blend a hardening accelerator with the conductive resin composition of this invention. The curing accelerator is not particularly limited as long as it is conventionally used as an epoxy resin curing accelerator, and may be used alone or in combination. Examples of the curing accelerator include imidazole-based curing accelerators, amine-based curing accelerators, triphenylphosphine-based curing accelerators, diazabicyclo-based curing accelerators, urea-based curing accelerators, borate salt-based curing accelerators, and polyamide-based curing agents. Examples include accelerators. From the viewpoints of curability and adhesiveness, an imidazole curing accelerator and an amine curing accelerator are preferable, and an imidazole curing accelerator is more preferable.
イミダゾール系硬化促進剤の具体例としては、例えば、2−メチルイミダゾール、2−エチルイミダゾール、2−イソプロピルイミダゾール、2−n−プロピルイミダゾール、2−ウンデシル−1H−イミダゾール、2−へプタデシル−1H−イミダゾール、1,2−ジメチルイミダゾール、2−エチル−4−メチルイミダゾール、2−フェニル−1H−イミダゾール、4−メチル−2−フェニル−1H−イミダゾール、2−フェニル−4−メチルイミダゾール、1−ベンジル−2−メチルイミダゾール、1−シアノエチル−2−メチルイミダゾール、1−シアノエチル−2−エチル−4−メチルイミダゾール、1−シアノエチル−2−ウンデシルイミダゾール、1−シアノエチル−2−フェニルイミダゾール、1−シアノエチル−2−エチル−4−メチルイミダゾリウムトリメリテイト、1−シアノエチル−2−ウンデシルイミダゾリウムトリメリテイト、1−シアノエチル−2−フェニルイミダゾリウムトリメリテイト、2,4−ジアミノ−6−[2′−メチルイミダゾリル−(1′)]−エチル−s−トリアジン、2,4−ジアミノ−6−[2′−ウンデシルイミダゾリル−(1′)]−エチル−s−トリアジン、2,4−ジアミノ−6−[2′−エチル−4−メチルイミダゾリル−(1′)]−エチル−s−トリアジン、2,4−ジアミノ−6−[2′−メチルイミダゾリル−(1′)]−エチル−s−トリアジンイソシアヌル酸付加物、2−フェニル−イミダゾールイソシアヌル酸付加物、2−メチルイミダゾールイソシアヌル酸付加物、2−フェニル−4,5−ジヒドロキシメチルイミダゾール、2−フェニル−4−メチル−5−ヒドロキシメチルイミダゾール、1−シアノエチル−2−フェニル−4,5−ジ(2−シアノエトキシ)メチルイミダゾール、1−ドデシル−2−メチル−3−ベンジルイミダゾリウムクロライド、1−ベンジル−2−フェニルイミダゾール塩酸塩、1−ベンジル−2−フェニルイミダゾリウムトリメリテイトなどが挙げられる。 Specific examples of the imidazole curing accelerator include, for example, 2-methylimidazole, 2-ethylimidazole, 2-isopropylimidazole, 2-n-propylimidazole, 2-undecyl-1H-imidazole, 2-heptadecyl-1H- Imidazole, 1,2-dimethylimidazole, 2-ethyl-4-methylimidazole, 2-phenyl-1H-imidazole, 4-methyl-2-phenyl-1H-imidazole, 2-phenyl-4-methylimidazole, 1-benzyl 2-methylimidazole, 1-cyanoethyl-2-methylimidazole, 1-cyanoethyl-2-ethyl-4-methylimidazole, 1-cyanoethyl-2-undecylimidazole, 1-cyanoethyl-2-phenylimidazole, 1-cyanoethyl -2-Echi -4-methylimidazolium trimellitate, 1-cyanoethyl-2-undecylimidazolium trimellitate, 1-cyanoethyl-2-phenylimidazolium trimellitate, 2,4-diamino-6- [2'-methyl Imidazolyl- (1 ′)]-ethyl-s-triazine, 2,4-diamino-6- [2′-undecylimidazolyl- (1 ′)]-ethyl-s-triazine, 2,4-diamino-6 [2'-Ethyl-4-methylimidazolyl- (1 ')]-ethyl-s-triazine, 2,4-diamino-6- [2'-methylimidazolyl- (1')]-ethyl-s-triazine isocyanuric Acid adduct, 2-phenyl-imidazole isocyanuric acid adduct, 2-methylimidazole isocyanuric acid adduct, 2-phenyl-4,5-dihydride Ximethylimidazole, 2-phenyl-4-methyl-5-hydroxymethylimidazole, 1-cyanoethyl-2-phenyl-4,5-di (2-cyanoethoxy) methylimidazole, 1-dodecyl-2-methyl-3- Examples thereof include benzyl imidazolium chloride, 1-benzyl-2-phenylimidazole hydrochloride, 1-benzyl-2-phenylimidazolium trimellitate and the like.
また、アミン系硬化促進剤の具体例としては、例えば、エチレンジアミン、トリメチレンジアミン、テトラメチレンジアミン、ヘキサメチレンジアミン、ジエチレントリアミン、トリエチレンテトラミン、テトラエチレンペンタミン、ジプロピレンジアミン、ジメチルアミノプロピルアミン、ジエチルアミノプロピルアミン、トリメチルヘキサメチレンジアミン、ペンタンジアミン、ビス(2−ジメチルアミノエチル)エーテル、ペンタメチルジエチレントリアミン、アルキル−t−モノアミン、1,4−ジアザビシクロ(2,2,2)オクタン(トリエチレンジアミン)、N,N,N′,N′−テトラメチルヘキサメチレンジアミン、N,N,N′,N′−テトラメチルプロピレンジアミン、N,N,N′,N′−テトラメチルエチレンジアミン、N,N−ジメチルシクロへキシルアミン、ジメチルアミノエトキシエトキシエタノール、ジメチルアミノヘキサノールなどの脂肪族アミン類;ピペリジン、ピベラジン、メンタンジアミン、イソホロンジアミン、メチルモルホリン、エチルモルホリン、N,N′,N″−トリス(ジアミノプロピル)ヘキサヒドロ−s−トリアジン、3,9−ビス(3−アミノプロピル)−2,4,8,10−テトラオキシスピロ(5,5)ウンデカンアダクト、N−アミノエチルピベラジン、トリメチルアミノエチルピベラジン、ビス(4−アミノシクロへキシル)メタン、N,N′−ジメチルピベラジン、1,8−ジアザビシクロ(4.5.0)ウンデセン−7などの脂環式および複素環式アミン類;o−フェニレンジアミン、m−フェニレンジアミン、p−フェニレンジアミン、ジアミノジフェニルメタン、m−キシレンジアミン、ピリジン、ピコリン等の芳香族アミン類;エポキシ化合物付加ポリアミン、マイケル付加ポリアミン、マンニッヒ付加ポリアミン、チオ尿素付加ポリアミン、ケトン封鎖ポリアミン等の変性ポリアミン類;ジシアンジアミド;グアニジン;有機酸ヒドラジド;ジアミノマレオニトリル;アミンイミド;三フッ化ホウ素−ピペリジン錯体;三フッ化ホウ素−モノエチルアミン錯体などが挙げられる。硬化性の観点から、イミダゾール系硬化促進剤の2−フェニル−4−メチルイミダゾール(2P4MZ)、2−フェニル−4,5−ジヒドロキシメチルイミダゾール(2PHZ)、2−フェニル−4−メチル−5−ヒドロキシメチルイミダゾール(2P4MHZ)がより好ましい。 Specific examples of the amine curing accelerator include, for example, ethylenediamine, trimethylenediamine, tetramethylenediamine, hexamethylenediamine, diethylenetriamine, triethylenetetramine, tetraethylenepentamine, dipropylenediamine, dimethylaminopropylamine, diethylamino. Propylamine, trimethylhexamethylenediamine, pentanediamine, bis (2-dimethylaminoethyl) ether, pentamethyldiethylenetriamine, alkyl-t-monoamine, 1,4-diazabicyclo (2,2,2) octane (triethylenediamine), N N, N ', N'-tetramethylhexamethylenediamine, N, N, N', N'-tetramethylpropylenediamine, N, N, N ', N'-tetramethylethylenedi Aliphatic amines such as amine, N, N-dimethylcyclohexylamine, dimethylaminoethoxyethoxyethanol, dimethylaminohexanol; piperidine, piperazine, menthanediamine, isophoronediamine, methylmorpholine, ethylmorpholine, N, N ′, N ″ -Tris (diaminopropyl) hexahydro-s-triazine, 3,9-bis (3-aminopropyl) -2,4,8,10-tetraoxyspiro (5,5) undecane adduct, N-aminoethylpiverazine Alicyclic such as trimethylaminoethylpiverazine, bis (4-aminocyclohexyl) methane, N, N′-dimethylpiverazine, 1,8-diazabicyclo (4.5.0) undecene-7, and Heterocyclic amines; o-phenylenediamine, m-phenylenedi Aromatic amines such as amine, p-phenylenediamine, diaminodiphenylmethane, m-xylenediamine, pyridine, picoline; modified polyamines such as epoxy compound-added polyamine, Michael added polyamine, Mannich added polyamine, thiourea added polyamine, ketone-capped polyamine Dicyandiamide; guanidine; organic acid hydrazide; diaminomaleonitrile; amine imide; boron trifluoride-piperidine complex; boron trifluoride-monoethylamine complex, etc. From the viewpoint of curability, imidazole-based curing accelerator 2 -Phenyl-4-methylimidazole (2P4MHZ), 2-phenyl-4,5-dihydroxymethylimidazole (2PHZ), 2-phenyl-4-methyl-5-hydroxymethylimidazole (2P4MH) Z) is more preferred.
硬化促進剤の配合量は、特に制限されるものではないが、(B)成分であるエポキシ樹脂の合計100質量部に対して、0.1〜10質量部が好ましく、より好ましくは0.1〜5.0質量部である。 Although the compounding quantity of a hardening accelerator is not restrict | limited in particular, 0.1-10 mass parts is preferable with respect to a total of 100 mass parts of the epoxy resin which is (B) component, More preferably, it is 0.1. -5.0 parts by mass.
また、本発明の導電性樹脂組成物には、作業性を改善する目的で、エポキシ樹脂の開環重合に対する反応性を備えた反応性希釈剤を配合することができる。その具体例としては、例えば、n−ブチルグリシジルエーテル、アリルグリシジルエーテル、2−エチルへキシルグリシジルエーテル、スチレンオキサイド、フェニルグリシジルエーテル、クレジルグリシジルエーテル、p−sec−ブチルフェニルグリシジルエーテル、グリシジルメタクリレート、t−ブチルフェニルグリシジルエーテル、ジグリシジルエーテル、(ポリ)エチレングリコールグリシジルエーテル、ブタンジオールグリシジルエーテル、トリメチロールプロパントリグリシジルエーテル、1,6−ヘキサンジオールジグリシジルエーテル等が挙げられる。これらは、一種を単独で用いてもよく、二種以上を組み合わせて用いてもよい。これらのうち、フェニルグリシジルエーテル、t−ブチルフェニルグリシジルエーテルがより好ましい。反応性希釈剤の使用量は、本発明の導電性接着剤組成物の粘度(E型粘度計を用い3°コーンの条件で測定した値)が5〜200Pa・sの範囲となる範囲が好ましい。 Moreover, the reactive resin composition with the reactivity with respect to the ring-opening polymerization of an epoxy resin can be mix | blended with the conductive resin composition of this invention in order to improve workability | operativity. Specific examples thereof include, for example, n-butyl glycidyl ether, allyl glycidyl ether, 2-ethylhexyl glycidyl ether, styrene oxide, phenyl glycidyl ether, cresyl glycidyl ether, p-sec-butylphenyl glycidyl ether, glycidyl methacrylate, Examples include t-butylphenyl glycidyl ether, diglycidyl ether, (poly) ethylene glycol glycidyl ether, butanediol glycidyl ether, trimethylolpropane triglycidyl ether, 1,6-hexanediol diglycidyl ether, and the like. These may be used singly or in combination of two or more. Of these, phenyl glycidyl ether and t-butylphenyl glycidyl ether are more preferred. The amount of the reactive diluent used is preferably in the range in which the viscosity of the conductive adhesive composition of the present invention (value measured at 3 ° cone using an E-type viscometer) is in the range of 5 to 200 Pa · s. .
また、本発明の導電性樹脂組成物には、作業性を改善する目的で、希釈剤を配合することができる。希釈剤としては溶剤類に加え、(メタ)アクリレート化合物を使用することができる。 In addition, a diluent can be blended with the conductive resin composition of the present invention for the purpose of improving workability. As a diluent, in addition to solvents, a (meth) acrylate compound can be used.
溶剤としては、例えば、ジエチレングリコールジエチルエーテル、n−ブチルグリシジルエーテル、t−ブチルフェニルグリシジルエーテル、アリルグリシジルエーテル、2−エチルヘキシルグリシジルエーテル、スチレンオキシド、フェニルグリシジルエーテル、クレジルグリシジルエーテル、ジオキサン、ヘキサン、メチルセロソルブ、シクロヘキサン、ブチルセロソルブ、ブチルセロソルブアセテート、ブチルカルビトール、ブチルカルビトールアセテート、ジエチレングリコールジメチルエーテル、ジアセトンアルコール、N−メチルピロリドン、ジメチルホルムアミド、ジメチルアセトアミド、γ−ブチロラクトン、および1,3−ジメチル−2−イミダゾリジノンなどが挙げられる。 Examples of the solvent include diethylene glycol diethyl ether, n-butyl glycidyl ether, t-butylphenyl glycidyl ether, allyl glycidyl ether, 2-ethylhexyl glycidyl ether, styrene oxide, phenyl glycidyl ether, cresyl glycidyl ether, dioxane, hexane, methyl Cellosolve, cyclohexane, butyl cellosolve, butyl cellosolve acetate, butyl carbitol, butyl carbitol acetate, diethylene glycol dimethyl ether, diacetone alcohol, N-methylpyrrolidone, dimethylformamide, dimethylacetamide, γ-butyrolactone, and 1,3-dimethyl-2-imidazo Lysinone and the like can be mentioned.
(メタ)アクリレート化合物としては、例えば、2−ヒドロキシエチル(メタ)アクリレート、2−ヒドロキシプロピル(メタ)アクリレート、3−ヒドロキシプロピル(メタ)アクリレート、2−ヒドロキシブチル(メタ)アクリレート、3−ヒドロキシブチル(メタ)アクリレート、4−ヒドロキシブチル(メタ)アクリレート、1,2−シクロヘキサンジオールモノ(メタ)アクリレート、1,3−シクロヘキサンジオールモノ(メタ)アクリレート、1,4−シクロヘキサンジオールモノ(メタ)アクリレート、1,2−シクロヘキサンジメタノールモノ(メタ)アクリレート、1,3−シクロヘキサンジメタノールモノ(メタ)アクリレート、1,4−シクロヘキサンジメタノールモノ(メタ)アクリレート、1,2−シクロヘキサンジエタノールモノ(メタ)アクリレート、1,3−シクロヘキサンジエタノールモノ(メタ)アクリレート、1,4−シクロヘキサンジエタノールモノ(メタ)アクリレート、グリセリンモノ(メタ)アクリレート、グリセリンジ(メタ)アクリレート、トリメチロールプロパンモノ(メタ)アクリレート、トリメチロールプロパンジ(メタ)アクリレート、ペンタエリスリトールモノ(メタ)アタリレート、ペンタエリスリトールジ(メタ)アクリレート、ペンタエリスリトールトリ(メタ)アクリレート、ネオペンチルグリコールモノ(メタ)アタリレートなどの水酸基を有する(メタ)アクリレート、メチル(メタ)アクリレート、エチル(メタ)アクリレート、n−ブチル(メタ)アクリレート、イソブチル(メタ)アクリレート、ターシャルブチル(メタ)アクリレート、イソデシル(メタ)アクリレート、ラクリル(メタ)アクリレート、トリデシル(メタ)アクリレート、セチル(メタ)アクリレート、ステアリル(メタ)アクリレート、イソアミル(メタ)アクリレート、イソステアリル(メタ)アクリレート、ベヘニル(メタ)アクリレート、2−エチルヘキシル(メタ)アクリレート、その他のアルキル(メタ)アクリレート、シクロへキシル(メタ)アクリレート、ターシャルブチルシクロへキシル(メタ)アクリレート、テトラヒドロフルフリル(メタ)アクリレート、ベンジル(メタ)アクリレート、フェノキシエチル(メタ)アクリレート、イソボルニル(メタ)アクリレート、グリシジル(メタ)アクリレート、トリメチロールプロパントリ(メタ)アクリレート、ジンクモノ(メタ)アクリレート、ジンクジ(メタ)アクリレート、ジメチルアミノエチル(メタ)アクリレート、ジエチルアミノエチル(メタ)アクリレート、ネオペンチルグリコール(メタ)アクリレート、トリフロロエチル(メタ)アクリレート、2,2,3,3−テトラフロロプロピル(メタ)アクリレート、2,2,3,3,4,4−ヘキサフロロブチル(メタ)アクリレート、パーフロロオクチル(メタ)アクリレート、パーフロロオクチルエチル(メタ)アクリレート、エチレングリコールジ(メタ)アクリレート、プロピレングリコールジ(メタ)アクリレート、1,4−ブタンジオールジ(メタ)アクリレート、1,6−ヘキサンジオールジ(メタ)アクリレート、1,9−ノナンジオールジ(メタ)アクリレート、1,3−ブタンジオールジ(メタ)アクリレート、1,10−デカンジオールジ(メタ)アクリレート、テトラメチレングリコールジ(メタ)アクリレート、メトキシエチル(メタ)アクリレート、ブトキシエチル(メタ)アクリレート、エトキシジエチレングリコール(メタ)アクリレート、メトキシポリアルキレングリコールモノ(メタ)アクリレート、オクトキシポリアルキレングリコールモノ(メタ)アクリレート、ラウロキシポリアルキレングリコールモノ(メタ)アクリレート、ステアロキシポリアルキレングリコールモノ(メタ)アクリレート、アリロキシポリアルキレングリコールモノ(メタ)アクリレート、ノニルフェノキシポリアルキレングリコールモノ(メタ)アクリレート、N,N’−メチレンビス(メタ)アクリルアミド、N,N’−エチレンビス(メタ)アクリルアミド、1,2−ジ(メタ)アクリルアミドエチレングリコール、ジ(メタ)アクリロイロキシメチルトリシクロデカン、N−(メタ)アクリロイロキシエチルマレイミド、N−(メタ)アクリロイロキシエチルヘキサヒドロフタルイミド、N−(メタ)アクリロイロキシエチルフタルイミド、n−ビニル−2−ピロリドンなどが挙げられる。 Examples of the (meth) acrylate compound include 2-hydroxyethyl (meth) acrylate, 2-hydroxypropyl (meth) acrylate, 3-hydroxypropyl (meth) acrylate, 2-hydroxybutyl (meth) acrylate, and 3-hydroxybutyl. (Meth) acrylate, 4-hydroxybutyl (meth) acrylate, 1,2-cyclohexanediol mono (meth) acrylate, 1,3-cyclohexanediol mono (meth) acrylate, 1,4-cyclohexanediol mono (meth) acrylate, 1,2-cyclohexanedimethanol mono (meth) acrylate, 1,3-cyclohexanedimethanol mono (meth) acrylate, 1,4-cyclohexanedimethanol mono (meth) acrylate, 1,2-cyclohex Diethanol mono (meth) acrylate, 1,3-cyclohexanediethanol mono (meth) acrylate, 1,4-cyclohexanediethanol mono (meth) acrylate, glycerin mono (meth) acrylate, glycerin di (meth) acrylate, trimethylolpropane mono (Meth) acrylate, trimethylolpropane di (meth) acrylate, pentaerythritol mono (meth) acrylate, pentaerythritol di (meth) acrylate, pentaerythritol tri (meth) acrylate, neopentyl glycol mono (meth) acrylate, etc. (Meth) acrylate having hydroxyl group, methyl (meth) acrylate, ethyl (meth) acrylate, n-butyl (meth) acrylate, isobutyl (meth) acrylate , Tertiary butyl (meth) acrylate, isodecyl (meth) acrylate, lactyl (meth) acrylate, tridecyl (meth) acrylate, cetyl (meth) acrylate, stearyl (meth) acrylate, isoamyl (meth) acrylate, isostearyl (meth) Acrylate, behenyl (meth) acrylate, 2-ethylhexyl (meth) acrylate, other alkyl (meth) acrylates, cyclohexyl (meth) acrylate, tertiary butylcyclohexyl (meth) acrylate, tetrahydrofurfuryl (meth) acrylate , Benzyl (meth) acrylate, phenoxyethyl (meth) acrylate, isobornyl (meth) acrylate, glycidyl (meth) acrylate, trimethylolpropane tri (meth) Acrylate), zinc mono (meth) acrylate, zinc di (meth) acrylate, dimethylaminoethyl (meth) acrylate, diethylaminoethyl (meth) acrylate, neopentyl glycol (meth) acrylate, trifluoroethyl (meth) acrylate, 2,2 , 3,3-tetrafluoropropyl (meth) acrylate, 2,2,3,3,4,4-hexafluorobutyl (meth) acrylate, perfluorooctyl (meth) acrylate, perfluorooctylethyl (meth) acrylate, Ethylene glycol di (meth) acrylate, propylene glycol di (meth) acrylate, 1,4-butanediol di (meth) acrylate, 1,6-hexanediol di (meth) acrylate, 1,9-nonanediol di (meth) Acrylate, 1,3-butanediol di (meth) acrylate, 1,10-decanediol di (meth) acrylate, tetramethylene glycol di (meth) acrylate, methoxyethyl (meth) acrylate, butoxyethyl (meth) acrylate, ethoxy Diethylene glycol (meth) acrylate, methoxy polyalkylene glycol mono (meth) acrylate, octoxy polyalkylene glycol mono (meth) acrylate, lauroxy polyalkylene glycol mono (meth) acrylate, stearoxy polyalkylene glycol mono (meth) acrylate, ants Roxy polyalkylene glycol mono (meth) acrylate, nonylphenoxy polyalkylene glycol mono (meth) acrylate, N, N'-methylenebis (Meth) acrylamide, N, N′-ethylenebis (meth) acrylamide, 1,2-di (meth) acrylamide ethylene glycol, di (meth) acryloyloxymethyltricyclodecane, N- (meth) acryloyloxyethylmaleimide N- (meth) acryloyloxyethyl hexahydrophthalimide, N- (meth) acryloyloxyethyl phthalimide, n-vinyl-2-pyrrolidone and the like.
これらの希釈剤は、1種を単独で使用してもよく、2種以上を混合して使用してもよい。これらの希釈剤は、導電性樹脂組成物100質量部に対して、1〜20質量部添加し、25℃における粘度を5〜200Pa・sの範囲とすることが好ましい。 These diluents may be used individually by 1 type, and 2 or more types may be mixed and used for them. These diluents are preferably added in an amount of 1 to 20 parts by mass with respect to 100 parts by mass of the conductive resin composition, and the viscosity at 25 ° C. is preferably in the range of 5 to 200 Pa · s.
本発明の導電性樹脂組成物には、以上の各成分の他、本発明の効果を阻害しない範囲で、この種の組成物に一般に配合される、粘度調整剤、酸無水物、カップリング剤などの接着助剤や、有機過酸化物などの硬化促進助剤、消泡剤、着色剤、難燃剤、チキソ性付与剤、その他添加剤などを、必要に応じて配合することができる。 In the conductive resin composition of the present invention, in addition to the above components, a viscosity modifier, an acid anhydride, and a coupling agent that are generally blended in this type of composition as long as the effects of the present invention are not impaired. Adhesion aids such as, curing acceleration aids such as organic peroxides, antifoaming agents, colorants, flame retardants, thixotropic agents, and other additives can be blended as necessary.
粘度調整剤としては、例えば、酢酸セロソルブ、エチルセロソルブ、ブチルセロソルブ、ブチルセロソルブアセテート、ブチルカルビトールアセテート、プロピレングリコールフェニルエーテル、ジエチレングリコールジメチルエーテル、ジアセトンアルコールなどが挙げられる。これらは1種を単独で使用してもよく、2種以上を混合して使用してもよい。
Examples of the viscosity modifier include cellosolve acetate, ethyl cellosolve, butyl cellosolve, butyl cellosolve acetate, butyl carbitol acetate, propylene glycol phenyl ether, diethylene glycol dimethyl ether, diacetone alcohol and the like. These may be used individually by 1 type, and may mix and
カップリング剤としては、例えば、既に説明したようなシランカップリング剤、チタネート系カップリング剤、アルミニウム系カップリング剤、ジルコネート系カップリング剤、およびジルコアルミネート系カップリング剤などが挙げられる。これらのカップリング剤のなかでも、シランカップリング剤が好ましく、特に、3−グリシドキシプロピルトリメトキシシランが好ましい。カップリング剤は1種を単独で使用してもよく、2種以上を混合して使用してもよい。 Examples of the coupling agent include silane coupling agents, titanate coupling agents, aluminum coupling agents, zirconate coupling agents, and zircoaluminate coupling agents as already described. Among these coupling agents, a silane coupling agent is preferable, and 3-glycidoxypropyltrimethoxysilane is particularly preferable. A coupling agent may be used individually by 1 type, and 2 or more types may be mixed and used for it.
この導電性樹脂組成物は、上記した(A)銀被覆シリカ粒子、(B)エポキシ樹脂、(C)硬化剤、および、必要に応じて配合される硬化促進剤、反応性希釈剤、溶剤などの成分を、高速混合機などを用いて均一に混合した後、ディスパース、ニーダ、三本ロールなどにより混練し、次いで、脱泡することにより、容易に調製することができる。 This conductive resin composition includes the above-described (A) silver-coated silica particles, (B) an epoxy resin, (C) a curing agent, and a curing accelerator, a reactive diluent, a solvent, and the like blended as necessary. These components are uniformly mixed using a high-speed mixer or the like, then kneaded with a disperse, kneader, three-roll, etc., and then defoamed to prepare easily.
本発明の導電性樹脂組成物は、糸引き性や液ダレが少なく作業性に優れている。また、半導体素子と銀メッキ銅フレーム、銅フレーム、PPFフレームの組み合わせにおいても、優れた導電性と接着強度を有する。すなわち、本発明の導電性樹脂組成物は、導電性に優れた安価な硬化物を与え、また、接着強度が大きく、作業性も良好であり、さらに、可使時間が長く、硬化物においてボイドが発生することもない。 The conductive resin composition of the present invention has excellent workability with little stringiness and dripping. Also, a combination of a semiconductor element and a silver-plated copper frame, a copper frame, or a PPF frame has excellent conductivity and adhesive strength. That is, the conductive resin composition of the present invention gives an inexpensive cured product excellent in conductivity, has high adhesive strength, good workability, and has a long pot life, and voids in the cured product. Does not occur.
より具体的な特性としては、導電性樹脂組成物の25℃における粘度が5〜200Pa・sであり、その硬化物の体積抵抗率が1×10−1Ω・cm以下、接着強度が25℃で20N以上、260℃で6N以上の範囲を全て満たすことが好ましく、本発明の樹脂組成物はこれを達成可能とするものである。なお、これら特性の試験条件は、実施例中の特性試験の条件によるものである。 As more specific characteristics, the viscosity at 25 ° C. of the conductive resin composition is 5 to 200 Pa · s, the volume resistivity of the cured product is 1 × 10 −1 Ω · cm or less, and the adhesive strength is 25 ° C. It is preferable to satisfy all the ranges of 20N or more and 260 ° C and 6N or more, and the resin composition of the present invention can achieve this. The test conditions for these characteristics are based on the characteristics test conditions in the examples.
本発明の半導体装置は、本発明の導電性樹脂組成物により、半導体素子が支持部材上に接着、固定されてなることを特徴とするものであり、例えば、本発明の導電性樹脂組成物を介して半導体素子をリードフレームにマウントし、導電性樹脂組成物を加熱硬化させた後、リードフレームのリード部と半導体素子上の電極とを常温で超音波によるワイヤボンディングにより接続し、次いで、これらを封止用樹脂により封止することにより製造することができる。 The semiconductor device of the present invention is characterized in that a semiconductor element is bonded and fixed on a support member with the conductive resin composition of the present invention. For example, the conductive resin composition of the present invention is After the semiconductor element is mounted on the lead frame and the conductive resin composition is heated and cured, the lead portion of the lead frame and the electrode on the semiconductor element are connected by ultrasonic wire bonding at room temperature, and then Can be manufactured by sealing with a sealing resin.
ここで、ボンディングワイヤとしては、例えば、銅、金、アルミニウム、金合金、アルミニウム−シリコンなどからなるワイヤが例示されるが、コストおよびボンディング性の観点からはアルミニウムワイヤが好ましい。また、ボンディングの際の超音波の出力、荷重などの条件は、特に限定されるものではなく、常法の範囲で適宜選択されてよい。 Here, examples of the bonding wire include wires made of copper, gold, aluminum, gold alloy, aluminum-silicon, and the like, but aluminum wires are preferable from the viewpoint of cost and bonding properties. The conditions such as the output of ultrasonic waves and the load at the time of bonding are not particularly limited, and may be appropriately selected within the range of ordinary methods.
図1に、本発明の半導体装置の一例を示す。
銅フレームなどのリードフレーム1と半導体素子2との間に、本発明の導電性樹脂組成物の硬化物である接着剤層3が介在されている。また、半導体素子2上の電極4とリードフレーム1のリード部5とがボンディングワイヤ6により接続されており、さらに、これらが封止用樹脂7により封止されている。なお、接着剤層3の厚さとしては、10〜30μm程度が好ましい。
FIG. 1 shows an example of a semiconductor device of the present invention.
An adhesive layer 3 that is a cured product of the conductive resin composition of the present invention is interposed between a
本発明の半導体装置は、導電性に優れた安価な硬化物を与え、しかも、接着強度が良好で、作業性にも優れる導電性樹脂組成物により、半導体素子が接着固定されているので、高い信頼性を具備している。本発明の導電性樹脂組成物は、半導体素子を半導体素子支持部材上に接着するための接着剤として広く使用することができ、半導体素子の接着剤に適用した場合に特に有用である。 The semiconductor device of the present invention provides an inexpensive cured product with excellent conductivity, and has a high adhesive strength and a semiconductor element bonded and fixed by a conductive resin composition having excellent workability. It has reliability. The conductive resin composition of the present invention can be widely used as an adhesive for bonding a semiconductor element onto a semiconductor element support member, and is particularly useful when applied to an adhesive for a semiconductor element.
以下、本発明を実施例により説明するが、本発明はこれらの実施例に限定されるものではない。 EXAMPLES Hereinafter, although an Example demonstrates this invention, this invention is not limited to these Examples.
<球状銀被覆シリカ粒子−1の製造例>
累積体積粒径D50が3.5μmの球状シリカ粒子(龍森社製、商品名:US−5)10gをアルカリ脱脂、酸中和してエッチングし、水洗後、二塩化パラジウム溶液に加え、撹拌し、パラジウム付着基材粒子を得た。
<Example of production of spherical silver-coated silica particles-1>
10 g of spherical silica particles (product name: US-5, manufactured by Tatsumori Co., Ltd.) having a cumulative volume particle size D 50 of 3.5 μm are alkali degreased, acid neutralized and etched, washed with water, added to the palladium dichloride solution, The mixture was stirred to obtain palladium-adhered substrate particles.
得られた基材粒子を脱イオン水300ml中で3分撹拌し、金属ニッケル粒子スラリー(三井金属社製、商品名:2020SUS)1gを添加し、ニッケル粒子付着基材粒子を得た。 The obtained base particles were stirred in 300 ml of deionized water for 3 minutes, and 1 g of a metallic nickel particle slurry (trade name: 2020SUS, manufactured by Mitsui Kinzoku Co., Ltd.) was added to obtain nickel particle-attached base particles.
得られた基材粒子を、蒸留水1000mlで希釈し、メッキ安定剤4mlを加えて撹拌した。その後、硫酸ニッケル400g/l、次亜リン酸ナトリウム100g/l、クエン酸ナトリウム100g/l、メッキ安定剤6mlの混合溶液150mlを、基材粒子混合溶液に撹拌しながら徐々に添加し、基材粒子にニッケル被膜を形成した。メッキ後の液を濾過し、濾過物を水洗した後、乾燥し、ニッケル被膜基材粒子を得た。 The obtained base particles were diluted with 1000 ml of distilled water, and 4 ml of a plating stabilizer was added and stirred. Thereafter, 150 ml of a mixed solution of 400 g / l of nickel sulfate, 100 g / l of sodium hypophosphite, 100 g / l of sodium citrate, and 6 ml of a plating stabilizer is gradually added to the substrate particle mixed solution while stirring. A nickel coating was formed on the particles. The liquid after plating was filtered, and the filtrate was washed with water and dried to obtain nickel-coated substrate particles.
得られたニッケル被膜基材粒子を、硝酸銀5g、蒸留水1200ml、ベンズイミダゾール10gを混合した溶液に、さらにコハク酸イミド30g、クエン酸4gを混合溶解し、グリオキシル酸10gを加えて調整した無電解銀メッキ液に、投入した。80℃で加熱撹拌を行い無電解メッキを行った後、水洗し、アルコールで置換した銀被膜粒子を乾燥し、銀被覆シリカ粒子−1を得た。得られた銀被覆シリカ粒子−1はアスペクト比1.01、比表面積1.5m2/g、D50=3.8μm、D50/D10=1.8、最大粒径19μm、比重2.8であり、銀被覆量は27.3質量%であった。 The resulting nickel-coated substrate particles were mixed with 5 g of silver nitrate, 1200 ml of distilled water, and 10 g of benzimidazole, and further mixed with 30 g of succinimide and 4 g of citric acid, and adjusted by adding 10 g of glyoxylic acid. It put into the silver plating solution. After heating and stirring at 80 ° C. to perform electroless plating, the coating was washed with water, and the silver-coated particles substituted with alcohol were dried to obtain silver-coated silica particles-1. The obtained silver-coated silica particles-1 had an aspect ratio of 1.01, a specific surface area of 1.5 m 2 / g, D 50 = 3.8 μm, D 50 / D 10 = 1.8, a maximum particle size of 19 μm, and a specific gravity of 2. The silver coating amount was 27.3 mass%.
<球状銀被覆シリカ粒子−2の製造例>
累積体積粒径D50が8.3μmの球状シリカ粒子(龍森社製、商品名:US−10)を球状銀被覆シリカ粒子−1と同様に無電解メッキを行った後、メッキ液中に銀量に対して0.2質量%のステアリン酸を添加し、撹拌を行った。その後、水洗し、アルコールで置換した銀被膜粒子を乾燥し、銀被覆シリカ粒子−2を得た。得られた銀被覆シリカ粒子−2はアスペクト比1.04、比表面積0.5m2/g、D50=8.5μm、D50/D10=1.6、最大粒径32μm、比重3.1であり、銀被覆量は29.2質量%であった。
<Production example of spherical silver-coated silica particles-2>
Cumulative volume particle diameter D 50 8.3μm spherical silica particles (Tatsumori Ltd., trade name: US-10) and after the electroless plating in the same manner as spherical silver coated silica particles -1, in the plating solution Stearic acid of 0.2% by mass with respect to the amount of silver was added and stirred. Then, it wash | cleaned with water, the silver coating particle substituted by alcohol was dried, and the silver covering silica particle-2 was obtained. The obtained silver-coated silica particles-2 had an aspect ratio of 1.04, a specific surface area of 0.5 m 2 / g, D 50 = 8.5 μm, D 50 / D 10 = 1.6, a maximum particle size of 32 μm, and a specific gravity of 3. 1 and the silver coating amount was 29.2% by mass.
<球状銀被覆シリカ粒子−3の製造例>
球状銀被覆シリカ粒子−1の粒子100gを、1.0質量%のシランカップリング剤(信越化学工業社製、商品名:KBM−403)とメタノールとを混合した溶液に配合し、撹拌を行った後、濾過、乾燥を行って、シランカップリング剤による処理が行われた銀被覆シリカ粒子−3を得た。得られた銀被覆シリカ粒子−3はアスペクト比1.01、比表面積1.5m2/g、D50=3.8μm、D50/D10=1.8、最大粒径24μm、比重2.8であり、銀被覆量は27.4質量%であった。
<Example of production of spherical silver-coated silica particles-3>
100 g of spherical silver-coated silica particles-1 are blended in a solution in which 1.0% by mass of a silane coupling agent (manufactured by Shin-Etsu Chemical Co., Ltd., trade name: KBM-403) and methanol are mixed and stirred. Then, filtration and drying were performed to obtain silver-coated silica particles-3 treated with a silane coupling agent. The obtained silver-coated silica particles-3 had an aspect ratio of 1.01, a specific surface area of 1.5 m 2 / g, D 50 = 3.8 μm, D 50 / D 10 = 1.8, a maximum particle size of 24 μm, and a specific gravity of 2. The silver coating amount was 27.4% by mass.
<球状銀被覆シリカ粒子−4の製造例>
累積体積粒径D50が3.5μmの球状シリカ粒子(龍森社製、商品名:US−5)を、球状銀被覆シリカ粒子−1と同様に無電解メッキを行った後、メッキ液中に銀量に対して0.2質量%のオレイン酸を添加し、撹拌を行った。その後、水洗し、アルコールで置換した銀被膜粒子を乾燥し、銀被覆シリカ粒子を得た。その粒子100gを、1.0質量%のシランカップリング剤(信越化学工業社製、商品名:KBM−403)とメタノールとを混合した溶液に配合し、撹拌を行った後、濾過、乾燥を行って、シランカップリング剤による処理が行われた銀被覆シリカ粒子−4を得た。銀被覆シリカ粒子−4はアスペクト比1.01、比表面積1.5m2/g、D50=3.8μm、D50/D10=1.8、最大粒径22μm、比重2.8であり、銀被覆量は27.3質量%であった。
<Example of production of spherical silver-coated silica particles-4>
In the plating solution, spherical silica particles having a cumulative volume particle diameter D 50 of 3.5 μm (trade name: US-5, manufactured by Tatsumori Co., Ltd.) are electrolessly plated in the same manner as the spherical silver-coated silica particles-1. The oleic acid of 0.2 mass% with respect to the amount of silver was added to and stirred. Then, it washed with water and the silver coating particle substituted with alcohol was dried, and the silver covering silica particle was obtained. 100 g of the particles were mixed in a solution obtained by mixing 1.0% by mass of a silane coupling agent (manufactured by Shin-Etsu Chemical Co., Ltd., trade name: KBM-403) and methanol, stirred, filtered and dried. And silver-coated silica particles-4 treated with a silane coupling agent were obtained. Silver-coated silica particle-4 has an aspect ratio of 1.01, a specific surface area of 1.5 m 2 / g, D 50 = 3.8 μm, D 50 / D 10 = 1.8, a maximum particle size of 22 μm, and a specific gravity of 2.8. The silver coating amount was 27.3% by mass.
<球状銀被覆シリカ粒子−5の製造例>
累積体積粒径D50が1.0μmの球状シリカ粒子(アドマテックス社製、商品名:SO−E3、)を球状銀被覆シリカ粒子−1と同様に無電解メッキを行った後、水洗し、アルコールで置換した銀被膜粒子を乾燥し、銀被覆シリカ粒子−5を得た。銀被覆シリカ粒子−5はアスペクト比1.03、比表面積6.0m2/g、D50=1.9μm、D50/D10=2.5、最大粒径18μm、比重2.6であり、銀被覆量は20.0質量%であった。
<Example of production of spherical silver-coated silica particles-5>
Cumulative volume particle diameter D 50 1.0μm spherical silica particles (Admatechs Co., Ltd., trade name: SO-E3,) the after electroless plating in the same manner as spherical silver coated silica particles -1, washed with water, The silver-coated particles substituted with alcohol were dried to obtain silver-coated silica particles-5. Silver-coated silica particles-5 have an aspect ratio of 1.03, a specific surface area of 6.0 m 2 / g, D 50 = 1.9 μm, D 50 / D 10 = 2.5, a maximum particle size of 18 μm, and a specific gravity of 2.6. The silver coating amount was 20.0% by mass.
<球状銀被覆シリカ粒子−6の製造例>
累積体積粒径D50が8.0μmの球状シリカ粒子を球状銀被覆シリカ粒子−1と同様に無電解メッキを行った後、水洗し、アルコールで置換した銀被膜粒子を乾燥し、銀被覆シリカ粒子−6を得た。銀被覆シリカ粒子−6はアスペクト比1.29、比表面積2.2m2/g、D50=8.5μm、D50/D10=1.5、最大粒径72μm、比重4.9であり、銀被覆量は30.0質量%であった。
<Example of production of spherical silver-coated silica particles-6>
After the cumulative volume particle diameter D 50 was carried out in a manner similar to electroless plating spherical silica particles and spherical silver coated silica particles -1 8.0 .mu.m, washed with water, dried silver coating particles substituted with alcohol, the silver-coated silica Particle-6 was obtained. Silver-coated silica particles-6 have an aspect ratio of 1.29, a specific surface area of 2.2 m 2 / g, D 50 = 8.5 μm, D 50 / D 10 = 1.5, a maximum particle size of 72 μm, and a specific gravity of 4.9. The silver coating amount was 30.0% by mass.
<球状銀被覆シリカ粒子−7の製造例>
累積体積粒径D50が7.0μmの球状シリカ粒子を球状銀被覆シリカ粒子−1と同様に無電解メッキを行った後、メッキ液中に銀量に対して0.2質量%のステアリン酸を添加し、撹拌を行った。その後、水洗し、アルコールで置換した銀被膜粒子を乾燥し、銀被覆シリカ粒子−7を得た。銀被覆シリカ粒子−7はアスペクト比1.01、比表面積1.1m2/g、D50=7.6μm、D50/D10=1.8、最大粒径46μm、比重2.8であり、銀被覆量は29.0質量%であった。
<Example of production of spherical silver-coated silica particles-7>
After the cumulative volume particle diameter D 50 was carried out in a manner similar to electroless plating spherical silica particles and spherical silver coated silica particles -1 7.0 .mu.m, stearic acid 0.2% by weight relative to amount of silver in the plating solution Was added and stirred. Then, it wash | cleaned with water and the silver coating particle substituted by alcohol was dried, and the silver covering silica particle-7 was obtained. Silver-coated silica particles-7 have an aspect ratio of 1.01, a specific surface area of 1.1 m 2 / g, D 50 = 7.6 μm, D 50 / D 10 = 1.8, a maximum particle size of 46 μm, and a specific gravity of 2.8. The silver coating amount was 29.0% by mass.
<球状銀被覆シリカ粒子−8の製造例>
累積体積粒径D50が4.0μmの球状シリカ粒子を球状銀被覆シリカ粒子−1と同様に無電解メッキを行った後、メッキ液中に銀量に対して0.2質量%のオレイン酸を添加し、撹拌を行つた。その後、水洗し、アルコールで置換した銀被膜粒子を乾燥し、銀被覆シリカ粒子−8を得た。銀被覆シリカ粒子−8はアスペクト比1.03、比表面積4.5m2/g、D50=4.3μm、D50/D10=6.1、最大粒径22μm、比重3.0であり、銀被覆量は30.5質量%であった。
<Example of production of spherical silver-coated silica particles-8>
After the cumulative volume particle diameter D 50 was carried out in a manner similar to electroless plating spherical silica particles and spherical silver coated silica particles -1 4.0 .mu.m, oleic acid 0.2% by weight relative to amount of silver in the plating solution Was added and stirred. Then, it wash | cleaned with water, the silver coating particle substituted by alcohol was dried, and the silver covering silica particle-8 was obtained. Silver-coated silica particle-8 has an aspect ratio of 1.03, a specific surface area of 4.5 m 2 / g, D 50 = 4.3 μm, D 50 / D 10 = 6.1, a maximum particle size of 22 μm, and a specific gravity of 3.0. The silver coating amount was 30.5% by mass.
なお、アスペクト比は、走査型電子顕微鏡 SSX−550(島津製作所製)により測定した。比表面積は、流動式比表面積測定装置 フローソープII2300(島津製作所製)により測定した。D50、D10、最大粒径は、レーザー回折散乱式粒度分布測定装置 LA−920(堀場製作所製)により測定した。銀被覆量は、銀被覆シリカ粒子重量と、硝酸により銀を溶解した銀除去シリカ粒子重量とから算出した。表1に、球状銀被覆シリカ粒子−1〜8の特性をまとめて示す。 The aspect ratio was measured with a scanning electron microscope SSX-550 (manufactured by Shimadzu Corporation). The specific surface area was measured with a flow-type specific surface area measuring apparatus Flow Soap II 2300 (manufactured by Shimadzu Corporation). D 50 , D 10 and the maximum particle size were measured with a laser diffraction / scattering particle size distribution analyzer LA-920 (manufactured by Horiba, Ltd.). The silver coating amount was calculated from the weight of silver-coated silica particles and the weight of silver-removed silica particles in which silver was dissolved with nitric acid. Table 1 summarizes the characteristics of the spherical silver-coated silica particles-1 to 8.
<実施例1〜8、比較例1〜6>
表2、3に示す配合割合で各成分を十分に混合し、三本ロールで混練して導電性樹脂組成物を調製した。この導電性樹脂組成物を真空ポンプにて脱泡した後、各種の性能を評価した。用いた各成分の詳細は次の通りである。
<Examples 1-8, Comparative Examples 1-6>
Each component was sufficiently mixed at the blending ratios shown in Tables 2 and 3, and kneaded with three rolls to prepare a conductive resin composition. After defoaming this conductive resin composition with a vacuum pump, various performances were evaluated. Details of each component used are as follows.
・ビスフェノールA型エポキシ樹脂(エポキシ当量185)
・可とう性エポキシ樹脂(三菱化学社製、商品名:YL7175−500、
エポキシ当量487)
・フェノール硬化剤:ビスフェノールF(本州化学社製)
・フェノール硬化剤:ポリパラビニルフェノール
(丸善化学社製、商品名:マルカリンカーM)
・硬化剤:ジシアジアミド(DICY)
・硬化促進剤:2−フェニル−4−メチル−5−ヒドロキシメチルイミダゾール
(四国化成社製、商品名:2P4MHZ)
・接着助剤:3−グリシドキシプロピルトリメトキシシラン
(信越シリコーン社製、商品名:KBM−403)
・希釈剤:t−ブチルフェニルグリシジルエーテル
(日本化薬社製、商品名:TGE−H)
・チキソ剤:ヒュームドシリカ(日本アエロジル社製、商品名:アエロジル200)
・充填材(フレーク状銀被覆ガラス):
フレーク状銀被覆ガラス(Ecka社製、商品名:Ag/flaky glass5/30、アスペクト比1.25、D50=6.0μm、D50/D10=1.7、最大粒径28μm、比重4.6、銀被覆量30質量%)
・充填材(フレーク状銀粉):
フレーク状銀粉(福田金属箔工業社製、商品名:AgC−221A、平均粒径6.6μm、比重10.5)
・充填材(シリカ粉):
溶融シリカ(龍森社製、商品名:US−5、平均粒径3.5μm、比重2.2)
・ Bisphenol A type epoxy resin (epoxy equivalent 185)
・ Flexible epoxy resin (Mitsubishi Chemical Co., Ltd., trade name: YL7175-500,
Epoxy equivalent 487)
・ Phenol curing agent: Bisphenol F (Honshu Chemical Co., Ltd.)
・ Phenol curing agent: Polyparavinylphenol
(Product name: Maruka Linker M, manufactured by Maruzen Chemical Co., Ltd.)
・ Curing agent: Diciadiamide (DICY)
Curing accelerator: 2-phenyl-4-methyl-5-hydroxymethylimidazole
(Product name: 2P4MHZ, manufactured by Shikoku Kasei Co., Ltd.)
Adhesion aid: 3-glycidoxypropyltrimethoxysilane
(Product name: KBM-403, manufactured by Shin-Etsu Silicone)
Diluent: t-butylphenyl glycidyl ether
(Nippon Kayaku Co., Ltd., trade name: TGE-H)
・ Thixotropic agent: fumed silica (manufactured by Nippon Aerosil Co., Ltd., trade name: Aerosil 200)
・ Filler (flaky silver-coated glass):
Flaky silver-coated glass (Ecka, trade name: Ag /
・ Filler (flaky silver powder):
Flaky silver powder (made by Fukuda Metal Foil Industry Co., Ltd., trade name: AgC-221A, average particle size 6.6 μm, specific gravity 10.5)
・ Filler (silica powder):
Fused silica (manufactured by Tatsumori Co., Ltd., trade name: US-5, average particle size 3.5 μm, specific gravity 2.2)
<評価方法>
(1)粘度
東機産業社製のE型粘度計(3°コーン)を用い、25℃、0.5rpmの条件で測定した。
(2)チキソ性
東機産業社製のE型粘度計(3°コーン)を用い、25℃、2.5rpmの条件で粘度を測定し、(1)の結果と合わせ、異なる回転数で測定した粘度の比をチキソ性(0.5rpm粘度/2.5rpm粘度)として算出した。
(3)沈降性
シリンジに導電性樹脂組成物を10g充填し、25℃インキュベーターにシリンジが垂直になるよう設置し、24時間後のシリンジ上部、下部の導電性樹脂組成物を取出し、灰分を測定した。沈降性を下記に示す式より算出し、1.5%より大きければ、沈降しやすいと判断できる。
沈降性[%]=(シリンジ下部灰分−シリンジ上部灰分)/シリンジ上部灰分×100
(4)接着強度
導電性樹脂組成物を銀メッキした銅フレーム上に20μm厚に塗布し、その上に2mm×2mmのシリコンチップをマウントし、150℃で1時間硬化した。硬化後、ダイシェア強度測定装置を用いて、25℃と260℃での熱時ダイシェア強度を測定した。
(5)体積抵抗率
導電性樹脂組成物を硬化後の膜厚が40μmかつ幅が5mmとなるように、ガラス板状に印刷し、150℃で1時間硬化した後、デジタルマルチメーターで測定した。
(6)作業性
シリンジに導電性樹脂組成物を10g充填し、武蔵エンジニアリング社製のショットマスターを用い、温度25℃、湿度35%RH、ニードル径φ=0.3mm、吐出圧7.85N(0.8kgf)、ギャップ100μmの条件で、シリコンウェハー基板上に対するディスペンス試験を行った。光学顕微鏡を用いて100ショット後の糸引きによる角倒れおよび、シリンジ詰まりまたは液ダレによる吐出なしの吐出不良数を測定した。作業性を下記に示す式より算出し、10%より大きい場合は、作業性が悪いと判断できる。
作業性[%]=吐出不良数/100×100
<Evaluation method>
(1) Viscosity Using an E-type viscometer (3 ° cone) manufactured by Toki Sangyo Co., Ltd., the viscosity was measured at 25 ° C. and 0.5 rpm.
(2) Thixotropic Use an E-type viscometer (3 ° cone) manufactured by Toki Sangyo Co., Ltd., and measure the viscosity at 25 ° C. and 2.5 rpm. The viscosity ratio was calculated as thixotropy (0.5 rpm viscosity / 2.5 rpm viscosity).
(3) Sedimentation Fill the syringe with 10g of the conductive resin composition, place the syringe vertically in a 25 ° C incubator, take out the conductive resin composition on the upper and lower syringes 24 hours later, and measure the ash content did. If the sedimentation property is calculated from the following formula and is greater than 1.5%, it can be determined that sedimentation is likely to occur.
Sedimentability [%] = (Syringe lower ash-syringe upper ash) / syringe upper ash × 100
(4) Adhesive strength A conductive resin composition was applied to a silver-plated copper frame to a thickness of 20 μm, and a 2 mm × 2 mm silicon chip was mounted thereon and cured at 150 ° C. for 1 hour. After curing, the die shear strength during heating at 25 ° C. and 260 ° C. was measured using a die shear strength measuring device.
(5) Volume resistivity The conductive resin composition was printed on a glass plate so that the film thickness after curing was 40 μm and the width was 5 mm, cured at 150 ° C. for 1 hour, and then measured with a digital multimeter. .
(6) Workability 10 g of the conductive resin composition was filled in the syringe, and a shot master manufactured by Musashi Engineering Co., Ltd. was used. A dispensing test was performed on the silicon wafer substrate under the conditions of 0.8 kgf) and a gap of 100 μm. Using an optical microscope, the number of discharge failures without discharge due to angular collapse due to stringing after 100 shots and syringe clogging or liquid dripping was measured. When workability is calculated from the following formula and is greater than 10%, it can be determined that workability is poor.
Workability [%] = Number of ejection defects / 100 × 100
(7)総合評価
以上の各評価に基づいて総合評価を行った。判定基準は以下の通りである。
「×」:粘度 5Pa・s未満または200Pa・s超、チキソ性 2.0未満または6.0超、比重 1.0未満または3.0超、沈降性 1.5%超、接着強度(25℃) 20N未満、接着強度(260℃) 6N未満、体積抵抗率 1×10−1Ω・cm超、作業性 10%超のうち、1つでも当てはまるもの。
「○」:粘度 5〜200Pa・s、チキソ性 2.0〜6.0、比重 1.0〜3.0、沈降性 1.5%以下、接着強度(25℃) 20N以上、接着強度(260℃) 6N以上、体積抵抗率 1×10−1Ω・cm以下、作業性 10%以下の全てを満たすもの。
「◎」:「○」の基準を満たし、さらに接着強度(25℃) 120N以上、接着強度(260℃) 22N以上の全てを満たすもの。
(7) Comprehensive evaluation Comprehensive evaluation was performed based on each above evaluation. Judgment criteria are as follows.
“X”: Viscosity less than 5 Pa · s or more than 200 Pa · s, thixotropy less than 2.0 or more than 6.0, specific gravity less than 1.0 or more than 3.0, sedimentation property more than 1.5%, adhesive strength (25 ° C.) Less than 20N, adhesive strength (260 ° C.) less than 6N, volume resistivity of 1 × 10 −1 Ω · cm, workability of more than 10%, whichever applies.
“◯”:
“◎”: Satisfies the criteria of “◯” and further satisfies all of adhesive strength (25 ° C.) of 120 N or higher and adhesive strength (260 ° C.) of 22 N or higher.
Claims (6)
前記(A)銀被覆シリカ粒子は、前記導電性樹脂組成物中に35〜90質量%含まれるとともに、アスペクト比が1.0〜1.2、ガス吸着法による比表面積が0.3〜5.0m2/g、レーザー回折散乱式粒度分布測定法による累積体積粒径D50が1〜10μm、累積体積粒径D10、D50を用いて表されるD50/D10の値が1.0〜5.0、および最大粒径が40μm以下の球状粒子であることを特徴とする導電性樹脂組成物。 A conductive resin composition comprising (A) silver-coated silica particles, (B) an epoxy resin, and (C) a curing agent as essential components,
The (A) silver-coated silica particles are contained in the conductive resin composition in an amount of 35 to 90% by mass, have an aspect ratio of 1.0 to 1.2, and a specific surface area of 0.3 to 5 by a gas adsorption method. 0.0 m 2 / g, cumulative volume particle size D 50 by laser diffraction scattering type particle size distribution measurement method is 1 to 10 μm, and the value of D 50 / D 10 represented using cumulative volume particle size D 10 , D 50 is 1. A conductive resin composition, characterized by 0.0 to 5.0 and spherical particles having a maximum particle size of 40 μm or less.
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CN115260963A (en) * | 2022-09-27 | 2022-11-01 | 武汉市三选科技有限公司 | Low-modulus film die attach adhesive for vertical stack packaging, and preparation method and application thereof |
CN115851193A (en) * | 2022-12-06 | 2023-03-28 | 深圳市绚图新材科技有限公司 | Die bonding conductive adhesive, preparation method thereof and die bonding processing method |
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Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001011503A (en) * | 1999-06-25 | 2001-01-16 | Catalysts & Chem Ind Co Ltd | New conductive fine particle and its use |
JP2003031028A (en) * | 2001-07-17 | 2003-01-31 | Shin Etsu Chem Co Ltd | Conductive composition |
JP2004131780A (en) * | 2002-10-09 | 2004-04-30 | Catalysts & Chem Ind Co Ltd | Metallic particulate and adhesive, film and electric circuit substrate using the particulate |
JP2004149903A (en) * | 2002-11-01 | 2004-05-27 | Kaken Tec Kk | Conductive powder, conductive composition, and production method for conductive powder |
JP2009256539A (en) * | 2008-04-21 | 2009-11-05 | Three Bond Co Ltd | Electrically conductive resin composition |
JP2012079457A (en) * | 2010-09-30 | 2012-04-19 | Taiyo Holdings Co Ltd | Conductive paste and conductive pattern |
-
2013
- 2013-07-26 JP JP2013155624A patent/JP6190653B2/en active Active
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001011503A (en) * | 1999-06-25 | 2001-01-16 | Catalysts & Chem Ind Co Ltd | New conductive fine particle and its use |
JP2003031028A (en) * | 2001-07-17 | 2003-01-31 | Shin Etsu Chem Co Ltd | Conductive composition |
JP2004131780A (en) * | 2002-10-09 | 2004-04-30 | Catalysts & Chem Ind Co Ltd | Metallic particulate and adhesive, film and electric circuit substrate using the particulate |
JP2004149903A (en) * | 2002-11-01 | 2004-05-27 | Kaken Tec Kk | Conductive powder, conductive composition, and production method for conductive powder |
JP2009256539A (en) * | 2008-04-21 | 2009-11-05 | Three Bond Co Ltd | Electrically conductive resin composition |
JP2012079457A (en) * | 2010-09-30 | 2012-04-19 | Taiyo Holdings Co Ltd | Conductive paste and conductive pattern |
Cited By (18)
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JP2016219600A (en) * | 2015-05-20 | 2016-12-22 | 京セラ株式会社 | Die attach paste for semiconductor and semiconductor device |
JP2018170420A (en) * | 2017-03-30 | 2018-11-01 | 京セラ株式会社 | Paste for adhesion and method for manufacturing semiconductor device |
KR101898556B1 (en) * | 2017-10-31 | 2018-09-13 | 주식회사 엠엠에스 | Method for manufacturing Conductive powder with enhanced Heat-resistant |
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JP2021166268A (en) * | 2020-04-08 | 2021-10-14 | 株式会社東芝 | Superconducting coil |
JP7395412B2 (en) | 2020-04-08 | 2023-12-11 | 株式会社東芝 | superconducting coil |
JP7371792B2 (en) | 2021-03-24 | 2023-10-31 | 住友ベークライト株式会社 | Conductive paste and semiconductor devices |
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CN115260963A (en) * | 2022-09-27 | 2022-11-01 | 武汉市三选科技有限公司 | Low-modulus film die attach adhesive for vertical stack packaging, and preparation method and application thereof |
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