JP2014529923A5 - - Google Patents

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JP2014529923A5
JP2014529923A5 JP2014523426A JP2014523426A JP2014529923A5 JP 2014529923 A5 JP2014529923 A5 JP 2014529923A5 JP 2014523426 A JP2014523426 A JP 2014523426A JP 2014523426 A JP2014523426 A JP 2014523426A JP 2014529923 A5 JP2014529923 A5 JP 2014529923A5
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JP
Japan
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latch
detector
trigger signal
avalanche diode
single photon
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JP2014523426A
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Japanese (ja)
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JP2014529923A (ja
JP6059722B2 (ja
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Priority claimed from PCT/IB2012/053837 external-priority patent/WO2013018006A1/en
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JP2014523426A 2011-08-03 2012-07-27 デジタルシリコン光電子増倍管アレイに関する位置敏感な読み出しモード Active JP6059722B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201161514504P 2011-08-03 2011-08-03
US61/514,504 2011-08-03
PCT/IB2012/053837 WO2013018006A1 (en) 2011-08-03 2012-07-27 Position-sensitive readout modes for digital silicon photomultiplier arrays

Publications (3)

Publication Number Publication Date
JP2014529923A JP2014529923A (ja) 2014-11-13
JP2014529923A5 true JP2014529923A5 (OSRAM) 2015-08-20
JP6059722B2 JP6059722B2 (ja) 2017-01-11

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JP2014523426A Active JP6059722B2 (ja) 2011-08-03 2012-07-27 デジタルシリコン光電子増倍管アレイに関する位置敏感な読み出しモード

Country Status (7)

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US (1) US9176241B2 (OSRAM)
EP (1) EP2740262B1 (OSRAM)
JP (1) JP6059722B2 (OSRAM)
CN (1) CN103733609B (OSRAM)
MX (1) MX2014001272A (OSRAM)
RU (1) RU2014107914A (OSRAM)
WO (1) WO2013018006A1 (OSRAM)

Families Citing this family (84)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB201219781D0 (en) * 2012-11-02 2012-12-19 St Microelectronics Res & Dev Improvements in time of flight pixel circuits
JP6648008B2 (ja) 2013-06-12 2020-02-14 マサチューセッツ インスティテュート オブ テクノロジー 光変調器、波長分割多重システムおよび光変調器デバイス
EP3143429B1 (fr) * 2014-05-16 2020-09-09 Iltis, Alain Procédé pour améliorer la résolution en énergie de détecteurs de rayons gamma à scintillation; système, composant et application associés
US10204944B2 (en) * 2014-06-09 2019-02-12 Kiskeya Microsystems Llc Readout architecture for event-driven pixels
US9568620B2 (en) 2014-09-22 2017-02-14 General Electric Company Solid state photomultiplier
CN105816194B (zh) * 2015-01-07 2018-12-04 苏州瑞派宁科技有限公司 一种探测器信号读出的通道复用方法
CN106461792B (zh) 2015-03-17 2020-06-16 皇家飞利浦有限公司 在辐射粒子探测器中的闪烁事件定位
US9606245B1 (en) 2015-03-24 2017-03-28 The Research Foundation For The State University Of New York Autonomous gamma, X-ray, and particle detector
JP6528042B2 (ja) * 2015-06-19 2019-06-12 国立研究開発法人産業技術総合研究所 光子検出装置及び光子検出方法
CN105182396B (zh) 2015-06-29 2018-04-24 苏州瑞派宁科技有限公司 一种探测器信号读出的通道复用方法
WO2017058319A2 (en) 2015-06-30 2017-04-06 Massachusetts Institute Of Technology Waveguide-coupled silicon-germanium photodetectors and fabrication methods for same
US11105974B2 (en) 2015-06-30 2021-08-31 Massachusetts Institute Of Technology Waveguide-coupled silicon-germanium photodetectors and fabrication methods for same
US10697829B2 (en) 2015-07-08 2020-06-30 The Commonwealth Of Australia SPAD array structures and methods of operation
US11131756B2 (en) 2015-09-29 2021-09-28 Qualcomm Incorporated LIDAR system with reflected signal strength measurement
US10371835B2 (en) 2016-01-11 2019-08-06 General Electric Company Microcell interconnection in silicon photomultipliers
WO2018057975A1 (en) 2016-09-23 2018-03-29 Apple Inc. Stacked backside illuminated spad array
US10502830B2 (en) 2016-10-13 2019-12-10 Waymo Llc Limitation of noise on light detectors using an aperture
CN106580359B (zh) * 2016-12-02 2020-04-14 中国科学院深圳先进技术研究院 探测器信号处理方法及装置
US20180164414A1 (en) * 2016-12-13 2018-06-14 Sensl Technologies Ltd. LiDAR Apparatus
US20180164412A1 (en) * 2016-12-13 2018-06-14 Sensl Technologies Ltd. LiDAR Apparatus
US10422862B2 (en) 2016-12-13 2019-09-24 Sensl Technologies Ltd. LiDAR apparatus
US10656251B1 (en) 2017-01-25 2020-05-19 Apple Inc. Signal acquisition in a SPAD detector
WO2018140522A2 (en) * 2017-01-25 2018-08-02 Apple Inc. Spad detector having modulated sensitivity
US10962628B1 (en) 2017-01-26 2021-03-30 Apple Inc. Spatial temporal weighting in a SPAD detector
GB201704203D0 (en) * 2017-03-16 2017-05-03 Pixquanta Ltd An electromagnetic radiation detection device
US20180329064A1 (en) * 2017-05-09 2018-11-15 Stmicroelectronics (Grenoble 2) Sas Method and apparatus for mapping column illumination to column detection in a time of flight (tof) system
JP6881074B2 (ja) 2017-06-22 2021-06-02 株式会社デンソー 光検出器
EP3428574A1 (en) * 2017-07-11 2019-01-16 Fondazione Bruno Kessler Device for measuring a distance and method for measuring said distance
KR101938984B1 (ko) * 2017-08-09 2019-04-10 연세대학교 산학협력단 Spad 거리측정 센서 기반의 2단계 트래킹을 이용한 거리 측정 장치 및 방법
EP3688809B1 (en) * 2017-09-27 2025-08-20 The Commonwealth of Australia A neuromorphic single photon avalanche detector (spad) array microchip
JP7021501B2 (ja) * 2017-10-26 2022-02-17 オムロン株式会社 データ取得方法およびデータ取得装置
CN108051843B (zh) * 2017-10-30 2020-11-24 深圳先进技术研究院 一种pet探测器的位置编码方法及装置
US10340408B1 (en) 2018-05-17 2019-07-02 Hi Llc Non-invasive wearable brain interface systems including a headgear and a plurality of self-contained photodetector units configured to removably attach to the headgear
WO2019221799A1 (en) 2018-05-17 2019-11-21 Hi Llc Stacked photodetector assemblies
US10158038B1 (en) 2018-05-17 2018-12-18 Hi Llc Fast-gated photodetector architectures comprising dual voltage sources with a switch configuration
US10420498B1 (en) 2018-06-20 2019-09-24 Hi Llc Spatial and temporal-based diffusive correlation spectroscopy systems and methods
US11213206B2 (en) 2018-07-17 2022-01-04 Hi Llc Non-invasive measurement systems with single-photon counting camera
DE102018213819B3 (de) * 2018-08-16 2019-11-07 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Vorrichtung und Verfahren für TDC-Sharing bei laufzeitbasierter Distanzmessung
EP3627178B1 (en) 2018-09-19 2022-04-20 ams AG Sensor device, sensor module, imaging system and method to operate a sensor device
IT201800009064A1 (it) * 2018-10-01 2020-04-01 Massimo Luigi Maria Caccia Dispositivo e metodo per generare sequenze random di bit
JP2022510817A (ja) * 2018-11-20 2022-01-28 センス・フォトニクス,インコーポレイテッド 空間的に分配されるストロービングのための方法及びシステム
US11233966B1 (en) 2018-11-29 2022-01-25 Apple Inc. Breakdown voltage monitoring for avalanche diodes
WO2020131148A1 (en) 2018-12-21 2020-06-25 Hi Llc Biofeedback for awareness and modulation of mental state using a non-invasive brain interface system and method
AU2020268718B2 (en) 2019-05-06 2025-04-03 Hi Llc Photodetector architectures for time-correlated single photon counting
US11081611B2 (en) 2019-05-21 2021-08-03 Hi Llc Photodetector architectures for efficient fast-gating comprising a control system controlling a current drawn by an array of photodetectors with a single photon avalanche diode
AU2020287839B2 (en) 2019-06-06 2025-04-17 Hi Llc Photodetector systems with low-power time-to-digital converter architectures
US11137607B2 (en) * 2019-06-28 2021-10-05 Canon Kabushiki Kaisha Image capturing and display apparatus and wearable device
CN110389141B (zh) * 2019-07-19 2022-04-05 东软医疗系统股份有限公司 位置读出设备、方法及装置
US11906354B2 (en) * 2019-07-19 2024-02-20 Avago Technologies International Sales Pte. Limited Recharge circuit for digital silicon photomultipliers
CN110411577B (zh) * 2019-07-23 2020-08-11 杭州电子科技大学 Spad探测器阵列的异步读出电路及其异步读出方法
US11378663B2 (en) 2019-11-26 2022-07-05 Waymo Llc Systems and methods for biasing light detectors
US12004887B2 (en) * 2020-01-31 2024-06-11 Canon Medical Systems Corporation Radiation diagnosis device with a first detector detecting Cherenkov light and a second detector detecting energy information of radiation
ES2849224B2 (es) 2020-02-14 2022-01-21 Consejo Superior Investigacion Fotomultiplicador digital de combinacion or de pulsos
US12029558B2 (en) 2020-02-21 2024-07-09 Hi Llc Time domain-based optical measurement systems and methods configured to measure absolute properties of tissue
WO2021167877A1 (en) 2020-02-21 2021-08-26 Hi Llc Multimodal wearable measurement systems and methods
US11630310B2 (en) 2020-02-21 2023-04-18 Hi Llc Wearable devices and wearable assemblies with adjustable positioning for use in an optical measurement system
US11096620B1 (en) 2020-02-21 2021-08-24 Hi Llc Wearable module assemblies for an optical measurement system
US11515014B2 (en) 2020-02-21 2022-11-29 Hi Llc Methods and systems for initiating and conducting a customized computer-enabled brain research study
US11771362B2 (en) 2020-02-21 2023-10-03 Hi Llc Integrated detector assemblies for a wearable module of an optical measurement system
US11969259B2 (en) 2020-02-21 2024-04-30 Hi Llc Detector assemblies for a wearable module of an optical measurement system and including spring-loaded light-receiving members
US11950879B2 (en) 2020-02-21 2024-04-09 Hi Llc Estimation of source-detector separation in an optical measurement system
US12144653B2 (en) 2020-02-21 2024-11-19 Hi Llc Systems, circuits, and methods for reducing common-mode noise in biopotential recordings
WO2021188496A1 (en) 2020-03-20 2021-09-23 Hi Llc Photodetector calibration of an optical measurement system
US12085789B2 (en) 2020-03-20 2024-09-10 Hi Llc Bias voltage generation in an optical measurement system
US11245404B2 (en) 2020-03-20 2022-02-08 Hi Llc Phase lock loop circuit based signal generation in an optical measurement system
US12059262B2 (en) 2020-03-20 2024-08-13 Hi Llc Maintaining consistent photodetector sensitivity in an optical measurement system
US12138068B2 (en) 2020-03-20 2024-11-12 Hi Llc Techniques for characterizing a nonlinearity of a time-to-digital converter in an optical measurement system
US11819311B2 (en) 2020-03-20 2023-11-21 Hi Llc Maintaining consistent photodetector sensitivity in an optical measurement system
US11877825B2 (en) 2020-03-20 2024-01-23 Hi Llc Device enumeration in an optical measurement system
US11187575B2 (en) 2020-03-20 2021-11-30 Hi Llc High density optical measurement systems with minimal number of light sources
US11645483B2 (en) 2020-03-20 2023-05-09 Hi Llc Phase lock loop circuit based adjustment of a measurement time window in an optical measurement system
US11864867B2 (en) 2020-03-20 2024-01-09 Hi Llc Control circuit for a light source in an optical measurement system by applying voltage with a first polarity to start an emission of a light pulse and applying voltage with a second polarity to stop the emission of the light pulse
US11607132B2 (en) 2020-03-20 2023-03-21 Hi Llc Temporal resolution control for temporal point spread function generation in an optical measurement system
US11857348B2 (en) 2020-03-20 2024-01-02 Hi Llc Techniques for determining a timing uncertainty of a component of an optical measurement system
US12059270B2 (en) 2020-04-24 2024-08-13 Hi Llc Systems and methods for noise removal in an optical measurement system
US11476372B1 (en) 2020-05-13 2022-10-18 Apple Inc. SPAD-based photon detectors with multi-phase sampling TDCs
WO2021240455A1 (en) 2020-05-29 2021-12-02 Voxelsensors Srl Pixel sensor system
BE1028366B1 (nl) * 2020-05-29 2022-01-11 Voxelsensors Srl Pixel sensor systeem
US11555901B2 (en) * 2020-07-27 2023-01-17 Nxp B.V. Photon-based detection using single-channel time-to-digital conversion
US12356740B2 (en) 2020-09-25 2025-07-08 Apple Inc. Transistor integration with stacked single-photon avalanche diode (SPAD) pixel arrays
EP4256778B1 (en) 2020-12-23 2024-10-23 VoxelSensors SRL Neighborhood-gated switching pixel sensor
EP4125269A1 (en) * 2021-07-29 2023-02-01 Leica Microsystems CMS GmbH Detector array, imaging system and method to image a sample
EP4155781A1 (en) * 2021-09-24 2023-03-29 Koninklijke Philips N.V. Photon detector, detector device and imaging apparatus
WO2025026636A1 (en) * 2023-08-01 2025-02-06 Ams-Osram Ag 2d tdc arrangement

Family Cites Families (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4672207A (en) * 1985-08-21 1987-06-09 The United States Of America As Represented By The United States Department Of Energy Readout system for multi-crystal gamma cameras
US5099128A (en) 1989-03-17 1992-03-24 Roger Stettner High resolution position sensitive detector
US5619040A (en) * 1994-03-29 1997-04-08 Shapiro; Stephen L. Data acquisition system
AU2002331266A1 (en) 2002-07-17 2004-02-02 European Organisation For Nuclear Research - Cern Gamma ray detector for positron emission tomography (pet) and single photon emmission computed tomography (spect)
US7547872B2 (en) 2005-02-14 2009-06-16 Ecole Polytechnique Federale De Lausanne Integrated circuit comprising an array of single photon avalanche diodes
CN101163989B (zh) * 2005-04-22 2013-04-10 皇家飞利浦电子股份有限公司 具有飞行时间性能的pet/mr扫描仪
ATE537466T1 (de) 2005-08-26 2011-12-15 Koninkl Philips Electronics Nv Medizinischer bildgebungsdetektor mit hoher auflösung
JP5437791B2 (ja) 2006-04-25 2014-03-12 コーニンクレッカ フィリップス エヌ ヴェ (Bi)CMOSプロセスによるアバランシェフォトダイオードの製造方法
CN101600972B (zh) * 2006-07-28 2012-08-29 皇家飞利浦电子股份有限公司 正电子发射断层摄影中的飞行时间测量
JP2008096278A (ja) 2006-10-12 2008-04-24 Fujifilm Corp 放射線画像検出器
WO2008113067A2 (en) * 2007-03-15 2008-09-18 Johns Hopkins University Deep submicron and nano cmos single photon photodetector pixel with event based circuits for readout data-rate reduction
CN101669218B (zh) 2007-04-24 2012-01-11 皇家飞利浦电子股份有限公司 光电二极管及其制作
RU2473099C2 (ru) 2007-05-16 2013-01-20 Конинклейке Филипс Электроникс Н.В. Виртуальный детектор рет и схема квазипикселированного считывания для рет
WO2009001237A1 (en) 2007-06-25 2008-12-31 Koninklijke Philips Electronics N.V. Photodiode self-test
WO2009019659A2 (en) 2007-08-08 2009-02-12 Koninklijke Philips Electronics N.V. Silicon photomultiplier readout circuitry
WO2009031074A2 (en) 2007-09-04 2009-03-12 Koninklijke Philips Electronics N.V. Silicon photomultiplier energy resolution
WO2009054070A1 (ja) * 2007-10-26 2009-04-30 Shimadzu Corporation 放射線検出器
WO2009115956A2 (en) 2008-03-19 2009-09-24 Koninklijke Philips Electronics N.V. Single photon radiation detector
CN102246058B (zh) 2008-12-15 2014-06-11 皇家飞利浦电子股份有限公司 用于硅光电倍增管和其他单光子计数器的温度补偿电路
US8610808B2 (en) 2008-12-22 2013-12-17 Koninklijke Philips N.V. Color CMOS imager with single photon counting capability
WO2010073136A2 (en) 2008-12-22 2010-07-01 Koninklijke Philips Electronics N.V. High dynamic range light sensor
KR101111011B1 (ko) 2008-12-26 2012-02-15 연세대학교 산학협력단 감마선 영상측정을 위한 다층 평판형 검출기 및 3차원 위치검출방법
JP2010249672A (ja) 2009-04-16 2010-11-04 Toshiba Corp ポジトロンct装置
WO2010136910A2 (en) 2009-05-28 2010-12-02 Koninklijke Philips Electronics N.V. A method to improve the time resolution of digital silicon photomultipliers
JP5681176B2 (ja) * 2009-06-22 2015-03-04 トヨタ モーター ヨーロッパ ナームロゼ フェンノートシャップ/ソシエテ アノニム パルス光による光学式距離計
TWI559763B (zh) * 2009-10-01 2016-11-21 索尼半導體解決方案公司 影像取得裝置及照相機系統

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