JP2014527629A - X線光子及び中性子を導くナノチューブ素材の装置 - Google Patents
X線光子及び中性子を導くナノチューブ素材の装置 Download PDFInfo
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- 239000002071 nanotube Substances 0.000 title claims abstract description 209
- 239000000463 material Substances 0.000 title claims abstract description 29
- 239000002048 multi walled nanotube Substances 0.000 claims abstract description 30
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 27
- 239000002041 carbon nanotube Substances 0.000 claims description 13
- 229910021393 carbon nanotube Inorganic materials 0.000 claims description 13
- 230000005855 radiation Effects 0.000 claims description 12
- 230000035515 penetration Effects 0.000 claims description 11
- 230000003247 decreasing effect Effects 0.000 claims description 2
- 210000004349 growth plate Anatomy 0.000 abstract description 30
- 230000003287 optical effect Effects 0.000 description 43
- 239000010410 layer Substances 0.000 description 33
- 239000011521 glass Substances 0.000 description 24
- 238000000034 method Methods 0.000 description 16
- 238000002310 reflectometry Methods 0.000 description 11
- 238000013461 design Methods 0.000 description 10
- 239000002109 single walled nanotube Substances 0.000 description 9
- 238000002834 transmittance Methods 0.000 description 9
- 230000004907 flux Effects 0.000 description 8
- 230000007246 mechanism Effects 0.000 description 8
- 230000008901 benefit Effects 0.000 description 7
- 238000004364 calculation method Methods 0.000 description 7
- 229910052799 carbon Inorganic materials 0.000 description 7
- 238000005516 engineering process Methods 0.000 description 7
- 229910021389 graphene Inorganic materials 0.000 description 7
- 230000005540 biological transmission Effects 0.000 description 5
- 125000004432 carbon atom Chemical group C* 0.000 description 5
- 230000008859 change Effects 0.000 description 5
- 230000008878 coupling Effects 0.000 description 5
- 238000010168 coupling process Methods 0.000 description 5
- 238000005859 coupling reaction Methods 0.000 description 5
- 230000004048 modification Effects 0.000 description 5
- 238000012986 modification Methods 0.000 description 5
- 238000004458 analytical method Methods 0.000 description 4
- 230000007423 decrease Effects 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 4
- 238000001338 self-assembly Methods 0.000 description 4
- 239000002356 single layer Substances 0.000 description 4
- 230000007704 transition Effects 0.000 description 4
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 3
- 238000013459 approach Methods 0.000 description 3
- 239000013078 crystal Substances 0.000 description 3
- 238000009826 distribution Methods 0.000 description 3
- 230000006872 improvement Effects 0.000 description 3
- 238000003780 insertion Methods 0.000 description 3
- 230000037431 insertion Effects 0.000 description 3
- 239000002086 nanomaterial Substances 0.000 description 3
- 239000002245 particle Substances 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 230000001902 propagating effect Effects 0.000 description 3
- 229910052814 silicon oxide Inorganic materials 0.000 description 3
- 239000000758 substrate Substances 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- 229910052582 BN Inorganic materials 0.000 description 2
- PZNSFCLAULLKQX-UHFFFAOYSA-N Boron nitride Chemical compound N#B PZNSFCLAULLKQX-UHFFFAOYSA-N 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 238000002441 X-ray diffraction Methods 0.000 description 2
- 238000000441 X-ray spectroscopy Methods 0.000 description 2
- 238000000429 assembly Methods 0.000 description 2
- 230000000712 assembly Effects 0.000 description 2
- 238000011156 evaluation Methods 0.000 description 2
- 230000014509 gene expression Effects 0.000 description 2
- 239000012510 hollow fiber Substances 0.000 description 2
- 230000003993 interaction Effects 0.000 description 2
- -1 rare earth fluorides Chemical class 0.000 description 2
- 229910052761 rare earth metal Inorganic materials 0.000 description 2
- 230000009467 reduction Effects 0.000 description 2
- 239000000523 sample Substances 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 1
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 1
- 239000004793 Polystyrene Substances 0.000 description 1
- HSFWRNGVRCDJHI-UHFFFAOYSA-N alpha-acetylene Natural products C#C HSFWRNGVRCDJHI-UHFFFAOYSA-N 0.000 description 1
- 238000000559 atomic spectroscopy Methods 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 150000001721 carbon Chemical group 0.000 description 1
- 239000003054 catalyst Substances 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 238000005253 cladding Methods 0.000 description 1
- 230000001427 coherent effect Effects 0.000 description 1
- 239000012141 concentrate Substances 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 239000004035 construction material Substances 0.000 description 1
- 125000002534 ethynyl group Chemical group [H]C#C* 0.000 description 1
- 230000003203 everyday effect Effects 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 239000003365 glass fiber Substances 0.000 description 1
- 229910002804 graphite Inorganic materials 0.000 description 1
- 239000010439 graphite Substances 0.000 description 1
- 229910001385 heavy metal Inorganic materials 0.000 description 1
- 239000012770 industrial material Substances 0.000 description 1
- 230000001788 irregular Effects 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 239000011733 molybdenum Substances 0.000 description 1
- 238000002139 neutron reflectometry Methods 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 238000005457 optimization Methods 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 229920002223 polystyrene Polymers 0.000 description 1
- 238000011158 quantitative evaluation Methods 0.000 description 1
- 230000002787 reinforcement Effects 0.000 description 1
- 239000002620 silicon nanotube Substances 0.000 description 1
- 229910021430 silicon nanotube Inorganic materials 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 230000003746 surface roughness Effects 0.000 description 1
- 210000001519 tissue Anatomy 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
- 238000004876 x-ray fluorescence Methods 0.000 description 1
- 238000003963 x-ray microscopy Methods 0.000 description 1
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- G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
- G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
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Abstract
Description
本願は、2011年8月6日に出願されたPOLYCAPILLARY OPTICという名称の米国仮特許出願第61/515,853号の利益を主張する。
R≧2*d/θC 2 (1)
は、すべての反射が臨界角未満の角度で生じることが確保されるように、キャピラリ曲率の半径Rを制限する。ここで、dはキャピラリ直径、θCは、反射表面の接線方向にある平面から測定される全外部反射の臨界角である。この表現は、光子伝播中の著しい光子損失を避けるためのキャピラリ光学機器設計の基礎となる。
θtr=(2d/R)1/2 (2)
であることが示される。
N=L/(R*2*θ) (3)
で定義される。ここで、Lはキャピラリの長さである。
N=L/(R*(θo−θi)) (4)
で定義される。ここで、θo及びθiは、キャピラリの外側(凹面)及び内側(凸面)壁での入射角である。
θo 2=θi 2+2*d/R (5)
に従って互いに関連し合う。
T=Z0*ln(1/(1−ρ)) (6)
として計算することができる。ここで、Z0は浸透深さである。
Claims (17)
- X線、光子又は中性子のビームを導くナノチューブ素材の装置であって、
2端間の長さに沿った中心軸線と、前記2端の一方の光入口と、前記2端の他方の光出口とを有し、かつ、前記光入口が入射ビームに向けて配向される自己集合化した少なくとも一つのナノチューブであって、前記少なくとも一つのナノチューブの内表面上の外部全反射を介して前記ビームの方向を変えるべく構成され、かつ、前記長さの少なくとも複数の部分において所定の放射浸透深さを超える壁厚を有する少なくとも一つのナノチューブと、
前記ナノチューブの長さに沿った少なくとも一つの領域と
を含み、
前記領域は、
前記少なくとも一つのナノチューブの中心軸線が前記入射ビームの伝播方向に沿って位置決めされる領域と、
増加するチューブ壁厚を前記2端の少なくとも一方に近接して有する複数のナノチューブの領域であって、隣り合うナノチューブの外側壁がこの領域において互いに接触する領域と、
前記少なくとも一つのナノチューブの中心軸線が湾曲する領域であって、この領域内の異なる位置における局所的な湾曲半径、局所的な内径、及び局所的な外径によってビームが望ましい向きに変えられ、かつ、すべての集合体断面に緊密なナノチューブ充填がされる領域と、
前記中心軸線が直線状であり、かつ、前記少なくとも一つのナノチューブが拡大する内径を有する領域と、
前記複数のナノチューブの中心軸線が直線状であり、かつ、前記ナノチューブは均一な壁厚を有して緊密に充填される領域と
の一つである装置。 - 前記少なくとも一つのナノチューブは多壁ナノチューブである、請求項1に記載の装置。
- 前記少なくとも一つのナノチューブはコロッサルナノチューブである、請求項1に記載の装置。
- 前記少なくとも一つのナノチューブはカーボンナノチューブである、請求項1に記載の装置。
- 前記少なくとも一つのナノチューブは複数のナノチューブであり、
前記光入口は第1の点に向けて配向され、かつ、前記光出口は第2の点に向けて配向される、請求項1に記載の装置。 - 前記少なくとも一つのナノチューブは複数のナノチューブであり、
前記光入口は第1の点に向けて配向され、かつ、前記光出口は互いに平行に配向される、請求項1に記載の装置。 - 前記装置は単数のナノチューブを含む、請求項1に記載の装置。
- 前記ナノチューブは、円筒状の内部形状を有する、請求項7に記載の装置。
- 前記装置は、互いに同軸に挿入される異なる材料に由来するナノチューブであって、異なる材料のナノチューブが同軸層を形成するナノチューブを含む、請求項8に記載の装置。
- 小さい直径の前記同軸層は、大きい直径の前記同軸層よりも小さな臨界外部全反射角を有する材料から作られる、請求項9に記載の装置。
- 前記少なくとも一つのナノチューブは、内部層が前記光出口において減少する直径となる円錐形状を有する多層ナノチューブである、請求項7に記載の装置。
- 前記ナノチューブはコロッサルナノチューブである、請求項7に記載の装置。
- 前記ナノチューブは円錐状内部形状を有する、請求項7に記載の装置。
- 前記円錐状内部形状は前記光出口に近接した位置にある、請求項13に記載の装置。
- 前記ナノチューブは、楕円体、放物体又は双曲線体の内部形状を有する、請求項7に記載の装置。
- 前記単数のナノチューブは、外部多壁ナノチューブと同軸に整合した内部多壁ナノチューブを含み、
前記内部多壁ナノチューブと前記外部多壁ナノチューブとは異なる屈折係数を有する、請求項7に記載の装置。 - 前記内部多壁ナノチューブは小さな屈折係数を有する、請求項12に記載の装置。
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US201161515853P | 2011-08-06 | 2011-08-06 | |
US61/515,853 | 2011-08-06 | ||
PCT/US2012/041456 WO2013022515A1 (en) | 2011-08-06 | 2012-06-08 | Nanotube based device for guiding x-ray photons and neutrons |
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JP6175436B2 JP6175436B2 (ja) | 2017-08-02 |
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EP (1) | EP2740127B1 (ja) |
JP (1) | JP6175436B2 (ja) |
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