JP2014520260A - 測定装置及び測定方法 - Google Patents

測定装置及び測定方法 Download PDF

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Publication number
JP2014520260A
JP2014520260A JP2014514033A JP2014514033A JP2014520260A JP 2014520260 A JP2014520260 A JP 2014520260A JP 2014514033 A JP2014514033 A JP 2014514033A JP 2014514033 A JP2014514033 A JP 2014514033A JP 2014520260 A JP2014520260 A JP 2014520260A
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JP
Japan
Prior art keywords
signal
digital
display
test signal
composite
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Pending
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JP2014514033A
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English (en)
Japanese (ja)
Inventor
フランケ，イェンス
ラング，フロリアン
ジーモン，ミヒャエル
クーネン，ビョルン
ニードル，マルクス
トン，ロナルド
ステファン ヨハネス
Original Assignee
ローデ ウント シュワルツ ゲーエムベーハー ウント コー カーゲー
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Publication of JP2014520260A publication Critical patent/JP2014520260A/ja
Pending legal-status Critical Current

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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04W—WIRELESS COMMUNICATION NETWORKS
    • H04W24/00—Supervisory, monitoring or testing arrangements
    • H04W24/08—Testing, supervising or monitoring using real traffic
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/02—Arrangements for displaying electric variables or waveforms for displaying measured electric variables in digital form
    • G01R13/0218—Circuits therefor
    • G01R13/0236—Circuits therefor for presentation of more than one variable
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/16—Spectrum analysis; Fourier analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/16—Spectrum analysis; Fourier analysis
    • G01R23/18—Spectrum analysis; Fourier analysis with provision for recording frequency spectrum
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L1/00—Arrangements for detecting or preventing errors in the information received
    • H04L1/24—Testing correct operation
    • H04L1/242—Testing correct operation by comparing a transmitted test signal with a locally generated replica
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04W—WIRELESS COMMUNICATION NETWORKS
    • H04W84/00—Network topologies
    • H04W84/02—Hierarchically pre-organised networks, e.g. paging networks, cellular networks, WLAN [Wireless Local Area Network] or WLL [Wireless Local Loop]
    • H04W84/04—Large scale networks; Deep hierarchical networks
    • H04W84/042—Public Land Mobile systems, e.g. cellular systems

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Mathematical Physics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Monitoring And Testing Of Transmission In General (AREA)
  • Digital Transmission Methods That Use Modulated Carrier Waves (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
JP2014514033A 2011-06-10 2012-06-05 測定装置及び測定方法 Pending JP2014520260A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102011077390.8A DE102011077390B4 (de) 2011-06-10 2011-06-10 Messgerät und Verfahren zur Vermessung eines Signals mit mehreren Teilsignalen
DE102011077390.8 2011-06-10
PCT/EP2012/060582 WO2012168228A1 (de) 2011-06-10 2012-06-05 Messgerät und verfahren zur vermessung eines signals mit mehreren teilsignalen

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2016210167A Division JP6423843B2 (ja) 2011-06-10 2016-10-27 測定装置及び測定方法

Publications (1)

Publication Number Publication Date
JP2014520260A true JP2014520260A (ja) 2014-08-21

Family

ID=46354181

Family Applications (2)

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JP2014514033A Pending JP2014520260A (ja) 2011-06-10 2012-06-05 測定装置及び測定方法
JP2016210167A Active JP6423843B2 (ja) 2011-06-10 2016-10-27 測定装置及び測定方法

Family Applications After (1)

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JP2016210167A Active JP6423843B2 (ja) 2011-06-10 2016-10-27 測定装置及び測定方法

Country Status (5)

Country Link
US (1) US9491646B2 (zh)
JP (2) JP2014520260A (zh)
CN (1) CN103502823B (zh)
DE (1) DE102011077390B4 (zh)
WO (1) WO2012168228A1 (zh)

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DE102011084143B4 (de) * 2011-10-07 2024-07-04 Rohde & Schwarz GmbH & Co. Kommanditgesellschaft Messsoftware unterstütztes Messsystem und Messverfahren
WO2014032698A1 (en) * 2012-08-28 2014-03-06 Rohde & Schwarz Gmbh & Co. Kg Method and device for measuring weak inband interference
EP2768189A3 (en) 2013-02-15 2014-10-08 Rohde & Schwarz GmbH & Co. KG Measuring device and measuring method for joint estimation of parameters
DE102013206711A1 (de) * 2013-04-15 2014-10-16 Rohde & Schwarz Gmbh & Co. Kg Messgerät und Messverfahren mit Mehrfachanzeige
EP2846504B1 (en) 2013-09-04 2016-02-10 Rohde & Schwarz GmbH & Co. KG Measuring device and measuring method for joint estimation of parameters based upon data symbols
CN109709396A (zh) * 2018-12-13 2019-05-03 西安电子科技大学 基于无线传感器网络的电磁频谱监测系统及方法

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JPS5478184A (en) * 1977-12-02 1979-06-22 Mitsubishi Electric Corp Frequency analytical apparatus
US20030036872A1 (en) * 2001-03-14 2003-02-20 Stark Donald Wilson Data acquisition instrument architecture with flexible data acquisition, processing and display
EP1699142A1 (de) * 2005-03-03 2006-09-06 Rohde & Schwarz GmbH & Co. KG Verfahren zur Analyse von Funksignalen
JP2008128967A (ja) * 2006-11-24 2008-06-05 Tektronix Japan Ltd シグナル・アナライザ及びそのデータ生成方法

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US6507624B1 (en) * 1999-04-21 2003-01-14 Tektronix, Inc. Bandpass sampling architecture for wide-frequency band signal analysis
JP2001024523A (ja) * 1999-07-08 2001-01-26 Advantest Corp 復号器
JP2001099877A (ja) * 1999-09-28 2001-04-13 Ando Electric Co Ltd 周波数スペクトル解析方法及び周波数スペクトル解析装置
DE60017573T2 (de) * 2000-11-16 2006-01-12 Sony International (Europe) Gmbh Wirksame GSM/GCS/UMTS (UTRA/FDD) Sende-Empfänger-Architektur
US20030041300A1 (en) * 2001-08-23 2003-02-27 Koninklijke Philips Electronics N.V. Universal device for processing Reed-Solomon forward error-correction encoded messages
DE10226394B4 (de) * 2002-06-13 2006-10-19 Siemens Ag Verfahren zur Datenübertragung
US7302237B2 (en) * 2002-07-23 2007-11-27 Mercury Computer Systems, Inc. Wideband signal generators, measurement devices, methods of signal generation, and methods of signal analysis
US7110765B2 (en) * 2002-08-27 2006-09-19 Qualcomm Incorporated Limiting cell reselection based on pilot power
JP2004320500A (ja) * 2003-04-17 2004-11-11 Fujitsu Ltd 情報処理装置の無線通信品質を試験する方法およびプログラム
JP3962785B2 (ja) * 2003-07-02 2007-08-22 テクトロニクス・インターナショナル・セールス・ゲーエムベーハー シグナル・アナライザ及び周波数領域データ生成方法
DE102004020278A1 (de) 2004-04-26 2005-11-10 Rohde & Schwarz Gmbh & Co. Kg Spektrumanalysator mit hoher Geschwindigkeit und gleichzeitig hoher Auflösung
JP4567371B2 (ja) * 2004-05-12 2010-10-20 パナソニック株式会社 検査装置、解析／表示装置、検査システム
JP4813774B2 (ja) 2004-05-18 2011-11-09 テクトロニクス・インターナショナル・セールス・ゲーエムベーハー 周波数分析装置の表示方法
US7251577B2 (en) * 2004-07-19 2007-07-31 Tektronix, Inc. Realtime power mask trigger
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DE602004005728T2 (de) 2004-12-09 2007-12-27 Cheng Shin Enterprise Co., Ltd., Long Jing Verfahren zum Prägen eines Behälterkörpers an einer genauen Position
EP1952166B1 (en) * 2005-11-04 2017-07-26 Tektronix, Inc. Wide-bandwidth spectrum analysis of transient signals using a real-time spectrum analyzer
US8576231B2 (en) * 2005-11-28 2013-11-05 Ryan Woodings Spectrum analyzer interface
JP4768019B2 (ja) * 2006-06-28 2011-09-07 パナソニック株式会社 隣接チャンネル妨害検出装置、隣接チャンネル妨害検出方法、および集積回路
JP2008042668A (ja) * 2006-08-08 2008-02-21 Tektronix Internatl Sales Gmbh 伝搬特性表示方法及び装置
US7953188B2 (en) * 2007-06-25 2011-05-31 Broadcom Corporation Method and system for rate>1 SFBC/STBC using hybrid maximum likelihood (ML)/minimum mean squared error (MMSE) estimation
JP5287001B2 (ja) 2008-07-14 2013-09-11 株式会社リコー 画像形成装置
GB0916709D0 (en) 2009-09-23 2009-11-04 Cambridge Silicon Radio Ltd Image rejection
JP5216036B2 (ja) * 2010-02-26 2013-06-19 アンリツ株式会社 基地局評価装置およびその信号抽出方法
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Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5478184A (en) * 1977-12-02 1979-06-22 Mitsubishi Electric Corp Frequency analytical apparatus
US20030036872A1 (en) * 2001-03-14 2003-02-20 Stark Donald Wilson Data acquisition instrument architecture with flexible data acquisition, processing and display
EP1699142A1 (de) * 2005-03-03 2006-09-06 Rohde & Schwarz GmbH & Co. KG Verfahren zur Analyse von Funksignalen
JP2008128967A (ja) * 2006-11-24 2008-06-05 Tektronix Japan Ltd シグナル・アナライザ及びそのデータ生成方法

Also Published As

Publication number Publication date
WO2012168228A1 (de) 2012-12-13
JP2017053864A (ja) 2017-03-16
CN103502823A (zh) 2014-01-08
CN103502823B (zh) 2017-05-03
DE102011077390A1 (de) 2012-12-13
US20150111506A1 (en) 2015-04-23
JP6423843B2 (ja) 2018-11-14
DE102011077390B4 (de) 2022-01-27
US9491646B2 (en) 2016-11-08

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