JP2014519558A - フレキシブル基材上にバリヤー層を製造するための方法および機器 - Google Patents
フレキシブル基材上にバリヤー層を製造するための方法および機器 Download PDFInfo
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- JP2014519558A JP2014519558A JP2014515276A JP2014515276A JP2014519558A JP 2014519558 A JP2014519558 A JP 2014519558A JP 2014515276 A JP2014515276 A JP 2014515276A JP 2014515276 A JP2014515276 A JP 2014515276A JP 2014519558 A JP2014519558 A JP 2014519558A
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- substrate
- electrodes
- oxide layer
- inorganic oxide
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02225—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
- H01L21/02227—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a process other than a deposition process
- H01L21/02247—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a process other than a deposition process formation by nitridation, e.g. nitridation of the substrate
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/40—Oxides
- C23C16/401—Oxides containing silicon
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/56—After-treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32018—Glow discharge
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D64/00—Electrodes of devices having potential barriers
- H10D64/118—Electrodes comprising insulating layers having particular dielectric or electrostatic properties, e.g. having static charges
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K77/00—Constructional details of devices covered by this subclass and not covered by groups H10K10/80, H10K30/80, H10K50/80 or H10K59/80
- H10K77/10—Substrates, e.g. flexible substrates
- H10K77/111—Flexible substrates
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/02203—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being porous
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02296—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer
- H01L21/02318—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer post-treatment
- H01L21/02321—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer post-treatment introduction of substances into an already existing insulating layer
- H01L21/02329—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer post-treatment introduction of substances into an already existing insulating layer introduction of nitrogen
- H01L21/02332—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer post-treatment introduction of substances into an already existing insulating layer introduction of nitrogen into an oxide layer, e.g. changing SiO to SiON
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02296—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer
- H01L21/02318—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer post-treatment
- H01L21/02362—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer post-treatment formation of intermediate layers, e.g. capping layers or diffusion barriers
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/549—Organic PV cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/249921—Web or sheet containing structurally defined element or component
- Y10T428/249953—Composite having voids in a component [e.g., porous, cellular, etc.]
- Y10T428/249967—Inorganic matrix in void-containing component
- Y10T428/249969—Of silicon-containing material [e.g., glass, etc.]
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Inorganic Chemistry (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Chemical Vapour Deposition (AREA)
- Laminated Bodies (AREA)
- Application Of Or Painting With Fluid Materials (AREA)
- Electroluminescent Light Sources (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GBGB1110117.7A GB201110117D0 (en) | 2011-06-16 | 2011-06-16 | method and device for manufacturing a barrie layer on a flexible substrate |
| GB1110117.7 | 2011-06-16 | ||
| PCT/GB2012/050897 WO2012172304A1 (en) | 2011-06-16 | 2012-04-24 | Method and device for manufacturing a barrier layer on a flexible substrate |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2014519558A true JP2014519558A (ja) | 2014-08-14 |
| JP2014519558A5 JP2014519558A5 (enExample) | 2015-06-18 |
Family
ID=44357840
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2014515276A Pending JP2014519558A (ja) | 2011-06-16 | 2012-04-24 | フレキシブル基材上にバリヤー層を製造するための方法および機器 |
Country Status (5)
| Country | Link |
|---|---|
| US (2) | US9117663B2 (enExample) |
| EP (1) | EP2721193B1 (enExample) |
| JP (1) | JP2014519558A (enExample) |
| GB (1) | GB201110117D0 (enExample) |
| WO (1) | WO2012172304A1 (enExample) |
Families Citing this family (33)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB201210836D0 (en) * | 2012-06-19 | 2012-08-01 | Fujifilm Mfg Europe Bv | Method and device for manufacturing a barrier layer on a flexible substrate |
| JP6117124B2 (ja) * | 2013-03-19 | 2017-04-19 | 富士フイルム株式会社 | 酸化物半導体膜及びその製造方法 |
| GB201403551D0 (en) | 2014-02-28 | 2014-04-16 | Fujifilm Mfg Europe Bv | Membrane stacks |
| CN106783720B (zh) * | 2017-03-03 | 2020-06-23 | 京东方科技集团股份有限公司 | 一种显示基板及其制作方法 |
| US10224224B2 (en) | 2017-03-10 | 2019-03-05 | Micromaterials, LLC | High pressure wafer processing systems and related methods |
| US10622214B2 (en) | 2017-05-25 | 2020-04-14 | Applied Materials, Inc. | Tungsten defluorination by high pressure treatment |
| US10847360B2 (en) * | 2017-05-25 | 2020-11-24 | Applied Materials, Inc. | High pressure treatment of silicon nitride film |
| CN110678973B (zh) | 2017-06-02 | 2023-09-19 | 应用材料公司 | 碳化硼硬掩模的干式剥除 |
| US10269571B2 (en) | 2017-07-12 | 2019-04-23 | Applied Materials, Inc. | Methods for fabricating nanowire for semiconductor applications |
| US10234630B2 (en) | 2017-07-12 | 2019-03-19 | Applied Materials, Inc. | Method for creating a high refractive index wave guide |
| US10179941B1 (en) | 2017-07-14 | 2019-01-15 | Applied Materials, Inc. | Gas delivery system for high pressure processing chamber |
| KR102405723B1 (ko) | 2017-08-18 | 2022-06-07 | 어플라이드 머티어리얼스, 인코포레이티드 | 고압 및 고온 어닐링 챔버 |
| US10276411B2 (en) | 2017-08-18 | 2019-04-30 | Applied Materials, Inc. | High pressure and high temperature anneal chamber |
| US11177128B2 (en) | 2017-09-12 | 2021-11-16 | Applied Materials, Inc. | Apparatus and methods for manufacturing semiconductor structures using protective barrier layer |
| US10643867B2 (en) | 2017-11-03 | 2020-05-05 | Applied Materials, Inc. | Annealing system and method |
| CN117936417A (zh) | 2017-11-11 | 2024-04-26 | 微材料有限责任公司 | 用于高压处理腔室的气体输送系统 |
| US10854483B2 (en) | 2017-11-16 | 2020-12-01 | Applied Materials, Inc. | High pressure steam anneal processing apparatus |
| KR20200075892A (ko) | 2017-11-17 | 2020-06-26 | 어플라이드 머티어리얼스, 인코포레이티드 | 고압 처리 시스템을 위한 컨덴서 시스템 |
| CN111699549B (zh) | 2018-01-24 | 2025-03-28 | 应用材料公司 | 使用高压退火的接缝弥合 |
| JP7239598B2 (ja) | 2018-03-09 | 2023-03-14 | アプライド マテリアルズ インコーポレイテッド | 金属含有材料の高圧アニーリングプロセス |
| US10714331B2 (en) | 2018-04-04 | 2020-07-14 | Applied Materials, Inc. | Method to fabricate thermally stable low K-FinFET spacer |
| US10950429B2 (en) | 2018-05-08 | 2021-03-16 | Applied Materials, Inc. | Methods of forming amorphous carbon hard mask layers and hard mask layers formed therefrom |
| US10566188B2 (en) | 2018-05-17 | 2020-02-18 | Applied Materials, Inc. | Method to improve film stability |
| US10704141B2 (en) | 2018-06-01 | 2020-07-07 | Applied Materials, Inc. | In-situ CVD and ALD coating of chamber to control metal contamination |
| US10748783B2 (en) | 2018-07-25 | 2020-08-18 | Applied Materials, Inc. | Gas delivery module |
| US10675581B2 (en) | 2018-08-06 | 2020-06-09 | Applied Materials, Inc. | Gas abatement apparatus |
| JP7179172B6 (ja) | 2018-10-30 | 2022-12-16 | アプライド マテリアルズ インコーポレイテッド | 半導体用途の構造体をエッチングするための方法 |
| KR20210077779A (ko) | 2018-11-16 | 2021-06-25 | 어플라이드 머티어리얼스, 인코포레이티드 | 강화된 확산 프로세스를 사용한 막 증착 |
| WO2020117462A1 (en) | 2018-12-07 | 2020-06-11 | Applied Materials, Inc. | Semiconductor processing system |
| US11996540B2 (en) | 2019-12-20 | 2024-05-28 | Intecells, Inc. | Method and apparatus for making lithium ion battery electrodes |
| US11621411B2 (en) * | 2019-12-23 | 2023-04-04 | Intecells, Inc. | Method of insulating lithium ion electrochemical cell components with metal oxide coatings |
| US11901222B2 (en) | 2020-02-17 | 2024-02-13 | Applied Materials, Inc. | Multi-step process for flowable gap-fill film |
| SE2330191A1 (en) | 2023-05-01 | 2024-11-02 | Volvo Truck Corp | Radar-based wheel end modules for determining wheel force generating capability |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2003264058A (ja) * | 2002-03-07 | 2003-09-19 | Konica Corp | 基板及び該基板を用いた有機エレクトロルミネッセンス表示装置 |
| EP1403902A1 (en) * | 2002-09-30 | 2004-03-31 | Fuji Photo Film B.V. | Method and arrangement for generating an atmospheric pressure glow discharge plasma (APG) |
| JP2004276566A (ja) * | 2003-03-19 | 2004-10-07 | Dainippon Printing Co Ltd | ガスバリア性積層材 |
| US20060148140A1 (en) * | 2004-12-31 | 2006-07-06 | Lin-En Chou | Method for forming a silicon oxynitride layer |
| US20070026243A1 (en) * | 2005-07-11 | 2007-02-01 | Fuji Photo Film Co., Ltd. | Gas barrier film, substrate film, and organic electroluminescence device |
| WO2009104443A1 (ja) * | 2008-02-19 | 2009-08-27 | コニカミノルタホールディングス株式会社 | 薄膜形成方法及び薄膜積層体 |
| US20110014424A1 (en) * | 2008-02-21 | 2011-01-20 | Fujifilm Manufacturing Europe B.V. | Plasma treatment apparatus and method for treatment of a substrate with atmospheric pressure glow discharge electrode configuration |
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| JPH04249520A (ja) | 1991-01-08 | 1992-09-04 | Matsushita Electric Works Ltd | 液状エポキシ樹脂成形材料 |
| US6913796B2 (en) * | 2000-03-20 | 2005-07-05 | Axcelis Technologies, Inc. | Plasma curing process for porous low-k materials |
| US6794311B2 (en) * | 2000-07-14 | 2004-09-21 | Applied Materials Inc. | Method and apparatus for treating low k dielectric layers to reduce diffusion |
| JP2003068850A (ja) * | 2001-08-29 | 2003-03-07 | Tokyo Electron Ltd | 半導体装置およびその製造方法 |
| JP4235551B2 (ja) | 2001-10-02 | 2009-03-11 | 独立行政法人産業技術総合研究所 | 金属酸化物薄膜及びその製造方法 |
| US6774569B2 (en) | 2002-07-11 | 2004-08-10 | Fuji Photo Film B.V. | Apparatus for producing and sustaining a glow discharge plasma under atmospheric conditions |
| US7288204B2 (en) | 2002-07-19 | 2007-10-30 | Fuji Photo Film B.V. | Method and arrangement for treating a substrate with an atmospheric pressure glow plasma (APG) |
| US20050202168A1 (en) * | 2002-08-16 | 2005-09-15 | General Electric Company | Thermally-stabilized thermal barrier coating and process therefor |
| KR100808790B1 (ko) | 2003-05-23 | 2008-03-03 | 주식회사 엘지화학 | 질소 플라즈마 처리된 ito 필름 및 이를 양극으로사용한 유기 발광 소자 |
| JP4057972B2 (ja) * | 2003-07-25 | 2008-03-05 | 富士通株式会社 | 半導体装置の製造方法 |
| JP2005142325A (ja) * | 2003-11-06 | 2005-06-02 | Semiconductor Leading Edge Technologies Inc | 半導体装置及びその製造方法 |
| EP1548795A1 (en) | 2003-12-22 | 2005-06-29 | Fuji Photo Film B.V. | Method and apparatus for stabilizing a glow discharge plasma under atmospheric conditions |
| DE602004024576D1 (de) | 2003-12-22 | 2010-01-21 | Fujifilm Mfg Europe Bv | Verfahren und anordnung zum entfernen von verunreinigungen von einer substratoberfläche unter verwendung eines atmosphärendruck-glühplasmas |
| ATE348497T1 (de) | 2004-08-13 | 2007-01-15 | Fuji Photo Film Bv | Verfahren und vorrichtung zur steuerung eines glühentladungsplasmas unter atmosphärischem druck |
| US7229918B2 (en) | 2005-02-14 | 2007-06-12 | Infineon Technologies Ag | Nitrogen rich barrier layers and methods of fabrication thereof |
| US20080317974A1 (en) | 2005-08-26 | 2008-12-25 | Fujifilm Manufacturing Europe B.V. | Method and Arrangement for Generating and Controlling a Discharge Plasma |
| US20080242118A1 (en) * | 2007-03-29 | 2008-10-02 | International Business Machines Corporation | Methods for forming dense dielectric layer over porous dielectrics |
| US7629264B2 (en) * | 2008-04-09 | 2009-12-08 | International Business Machines Corporation | Structure and method for hybrid tungsten copper metal contact |
| KR20090116477A (ko) * | 2008-05-07 | 2009-11-11 | 삼성전자주식회사 | 초저유전막을 포함하는 반도체 소자의 제조 방법 |
| JP5173863B2 (ja) * | 2009-01-20 | 2013-04-03 | パナソニック株式会社 | 半導体装置およびその製造方法 |
| EP2226832A1 (en) | 2009-03-06 | 2010-09-08 | FUJIFILM Manufacturing Europe B.V. | Substrate plasma treatment using side tabs |
| US8334202B2 (en) * | 2009-11-03 | 2012-12-18 | Infineon Technologies Ag | Device fabricated using an electroplating process |
-
2011
- 2011-06-16 GB GBGB1110117.7A patent/GB201110117D0/en not_active Ceased
-
2012
- 2012-04-24 JP JP2014515276A patent/JP2014519558A/ja active Pending
- 2012-04-24 EP EP12719037.9A patent/EP2721193B1/en not_active Not-in-force
- 2012-04-24 WO PCT/GB2012/050897 patent/WO2012172304A1/en not_active Ceased
- 2012-04-24 US US14/126,572 patent/US9117663B2/en active Active
-
2015
- 2015-07-15 US US14/799,603 patent/US9390908B2/en not_active Expired - Fee Related
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2003264058A (ja) * | 2002-03-07 | 2003-09-19 | Konica Corp | 基板及び該基板を用いた有機エレクトロルミネッセンス表示装置 |
| EP1403902A1 (en) * | 2002-09-30 | 2004-03-31 | Fuji Photo Film B.V. | Method and arrangement for generating an atmospheric pressure glow discharge plasma (APG) |
| JP2004276566A (ja) * | 2003-03-19 | 2004-10-07 | Dainippon Printing Co Ltd | ガスバリア性積層材 |
| US20060148140A1 (en) * | 2004-12-31 | 2006-07-06 | Lin-En Chou | Method for forming a silicon oxynitride layer |
| US20070026243A1 (en) * | 2005-07-11 | 2007-02-01 | Fuji Photo Film Co., Ltd. | Gas barrier film, substrate film, and organic electroluminescence device |
| WO2009104443A1 (ja) * | 2008-02-19 | 2009-08-27 | コニカミノルタホールディングス株式会社 | 薄膜形成方法及び薄膜積層体 |
| US20110052924A1 (en) * | 2008-02-19 | 2011-03-03 | Konica Minolta Holdings, Inc. | Thin film forming method and thin film stack |
| US20110014424A1 (en) * | 2008-02-21 | 2011-01-20 | Fujifilm Manufacturing Europe B.V. | Plasma treatment apparatus and method for treatment of a substrate with atmospheric pressure glow discharge electrode configuration |
| JP2011512459A (ja) * | 2008-02-21 | 2011-04-21 | フジフィルム マニュファクチュアリング ヨーロッパ ビー.ヴィ. | プラズマ処理装置、及び大気圧グロー放電電極構成を使用して基板を処理するための方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| GB201110117D0 (en) | 2011-07-27 |
| US20150315701A1 (en) | 2015-11-05 |
| US9117663B2 (en) | 2015-08-25 |
| US9390908B2 (en) | 2016-07-12 |
| EP2721193B1 (en) | 2015-03-04 |
| US20140138802A1 (en) | 2014-05-22 |
| EP2721193A1 (en) | 2014-04-23 |
| WO2012172304A1 (en) | 2012-12-20 |
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