JP2014514554A - イメージング検出器 - Google Patents

イメージング検出器 Download PDF

Info

Publication number
JP2014514554A
JP2014514554A JP2014503263A JP2014503263A JP2014514554A JP 2014514554 A JP2014514554 A JP 2014514554A JP 2014503263 A JP2014503263 A JP 2014503263A JP 2014503263 A JP2014503263 A JP 2014503263A JP 2014514554 A JP2014514554 A JP 2014514554A
Authority
JP
Japan
Prior art keywords
array
scintillator
interposer
photosensor
gap
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
JP2014503263A
Other languages
English (en)
Japanese (ja)
Other versions
JP2014514554A5 (enExample
Inventor
ランドール ピーター ルータ
マーク アンソニー チャッポ
ブライアン イー ハーウッド
ロドニー アーノルド マットソン
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Koninklijke Philips NV
Koninklijke Philips Electronics NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninklijke Philips NV, Koninklijke Philips Electronics NV filed Critical Koninklijke Philips NV
Publication of JP2014514554A publication Critical patent/JP2014514554A/ja
Publication of JP2014514554A5 publication Critical patent/JP2014514554A5/ja
Ceased legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/20Measuring radiation intensity with scintillation detectors
    • G01T1/2018Scintillation-photodiode combinations
    • G01T1/20185Coupling means between the photodiode and the scintillator, e.g. optical couplings using adhesives with wavelength-shifting fibres
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/20Measuring radiation intensity with scintillation detectors
    • G01T1/2018Scintillation-photodiode combinations
    • G01T1/20183Arrangements for preventing or correcting crosstalk, e.g. optical or electrical arrangements for correcting crosstalk

Landscapes

  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Molecular Biology (AREA)
  • High Energy & Nuclear Physics (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
JP2014503263A 2011-04-06 2012-04-05 イメージング検出器 Ceased JP2014514554A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201161472238P 2011-04-06 2011-04-06
US61/472,238 2011-04-06
PCT/IB2012/051685 WO2012137160A2 (en) 2011-04-06 2012-04-05 Imaging detector

Publications (2)

Publication Number Publication Date
JP2014514554A true JP2014514554A (ja) 2014-06-19
JP2014514554A5 JP2014514554A5 (enExample) 2015-05-21

Family

ID=46022511

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2014503263A Ceased JP2014514554A (ja) 2011-04-06 2012-04-05 イメージング検出器

Country Status (5)

Country Link
US (1) US9121950B2 (enExample)
EP (1) EP2694999B1 (enExample)
JP (1) JP2014514554A (enExample)
CN (1) CN103620445B (enExample)
WO (1) WO2012137160A2 (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014153213A (ja) * 2013-02-08 2014-08-25 Shimadzu Corp 放射線検出器および放射線検出器の製造方法
JP2018112434A (ja) * 2017-01-10 2018-07-19 キヤノンメディカルシステムズ株式会社 検出器パック、x線検出器、x線ct装置、検出器パックの製造方法
US12025757B2 (en) 2017-08-03 2024-07-02 The Research Foundation For The State University Of New York Dual-screen digital radiography with asymmetric reflective screens

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10234572B2 (en) * 2014-07-25 2019-03-19 The Regents Of The University Of California Multiple spatial resolution scintillation detectors
EP3532872B1 (en) * 2016-10-26 2024-05-01 Koninklijke Philips N.V. Radiation detector scintillator with an integral through-hole interconnect
WO2018202465A1 (en) * 2017-05-01 2018-11-08 Koninklijke Philips N.V. Multi-layer radiation detector
CN107398844B (zh) * 2017-06-26 2019-05-28 东软医疗系统股份有限公司 一种探测器制造夹具和闪烁体定位方法
JP7181283B2 (ja) * 2017-08-31 2022-11-30 コーニンクレッカ フィリップス エヌ ヴェ モノリシックシンチレータを有する多層検出器

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07111322A (ja) * 1993-10-13 1995-04-25 Sumitomo Electric Ind Ltd 撮像装置
JP2002243859A (ja) * 2001-02-09 2002-08-28 Canon Inc 放射線検出装置及びその製造方法
JP2003232861A (ja) * 2002-02-07 2003-08-22 Hamamatsu Photonics Kk 放射線検出器
KR20100086098A (ko) * 2009-01-22 2010-07-30 (주)세현 엑스레이 검출기 및 이의 제조 방법

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3340793B2 (ja) * 1993-05-27 2002-11-05 株式会社日立メディコ 放射線検出器
US5430298A (en) * 1994-06-21 1995-07-04 General Electric Company CT array with improved photosensor linearity and reduced crosstalk
JPH0954162A (ja) 1995-08-17 1997-02-25 Ge Yokogawa Medical Syst Ltd X線検出器およびその製造方法
JP2001074845A (ja) * 1999-09-03 2001-03-23 Canon Inc 半導体装置及びそれを用いた放射線撮像システム
DE10063907A1 (de) 2000-12-21 2002-07-04 Philips Corp Intellectual Pty Detektor zum Detektieren von elektromagnetischer Strahlung
JP4220818B2 (ja) 2003-03-27 2009-02-04 浜松ホトニクス株式会社 ホトダイオードアレイおよびその製造方法並びに放射線検出器
US6933504B2 (en) 2003-03-12 2005-08-23 General Electric Company CT detector having a segmented optical coupler and method of manufacturing same
US7019297B2 (en) * 2003-05-20 2006-03-28 Cti Pet Systems, Inc. Detector array using internalized light sharing and air coupling
US6990176B2 (en) 2003-10-30 2006-01-24 General Electric Company Methods and apparatus for tileable sensor array
CN101010806A (zh) 2004-08-20 2007-08-01 皇家飞利浦电子股份有限公司 具有钝化层的微电子系统
JP4534006B2 (ja) * 2005-09-28 2010-09-01 独立行政法人放射線医学総合研究所 放射線位置検出方法及び装置
JP2008224429A (ja) 2007-03-13 2008-09-25 Canon Inc 放射線検出装置
US7605374B2 (en) * 2007-03-27 2009-10-20 General Electric Company X-ray detector fabrication methods and apparatus therefrom
CN101669040B (zh) * 2007-04-25 2012-11-28 皇家飞利浦电子股份有限公司 具有分裂层压板光耦合的辐射探测器

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07111322A (ja) * 1993-10-13 1995-04-25 Sumitomo Electric Ind Ltd 撮像装置
JP2002243859A (ja) * 2001-02-09 2002-08-28 Canon Inc 放射線検出装置及びその製造方法
JP2003232861A (ja) * 2002-02-07 2003-08-22 Hamamatsu Photonics Kk 放射線検出器
KR20100086098A (ko) * 2009-01-22 2010-07-30 (주)세현 엑스레이 검출기 및 이의 제조 방법

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014153213A (ja) * 2013-02-08 2014-08-25 Shimadzu Corp 放射線検出器および放射線検出器の製造方法
JP2018112434A (ja) * 2017-01-10 2018-07-19 キヤノンメディカルシステムズ株式会社 検出器パック、x線検出器、x線ct装置、検出器パックの製造方法
US12025757B2 (en) 2017-08-03 2024-07-02 The Research Foundation For The State University Of New York Dual-screen digital radiography with asymmetric reflective screens

Also Published As

Publication number Publication date
CN103620445B (zh) 2016-08-17
EP2694999A2 (en) 2014-02-12
CN103620445A (zh) 2014-03-05
WO2012137160A2 (en) 2012-10-11
EP2694999B1 (en) 2019-10-02
WO2012137160A3 (en) 2013-01-03
US9121950B2 (en) 2015-09-01
US20140029724A1 (en) 2014-01-30

Similar Documents

Publication Publication Date Title
JP2014514554A (ja) イメージング検出器
RU2595795C2 (ru) Спектральный детектор изображения
JP5623281B2 (ja) 撮像装置用シンチレータ、シンチレータモジュール、該シンチレータ付き撮像装置およびシンチレータ製造方法
US20110019801A1 (en) Method for producing a 2d collimator element for a radiation detector and 2d collimator element
CN109891268B (zh) 具有视差补偿的伽马辐射探测器
JP5078266B2 (ja) 検出器および画像化装置
JP7181283B2 (ja) モノリシックシンチレータを有する多層検出器
JP2001194463A (ja) X線を吸収するためのグリッド
US8552388B2 (en) Sensor unit for an X-ray detector and associated production method
CN104838286A (zh) 成像探测器
KR101125284B1 (ko) 엑스선 그리드 및 그 제조 방법
JP3975091B2 (ja) 放射線検出器
CN101939667B (zh) 用于检测图像的设备和方法
US20100173445A1 (en) Production method for a sensor unit of an x-ray detector
JP2024026391A (ja) 均一なイメージングのための集束型シンチレータ構造のx線検出器
JP2015049126A (ja) 検出器モジュール製造方法、検出器モジュール及び医用画像診断装置
JP2008304349A (ja) シンチレータ部材およびx線ct装置
JP6951092B2 (ja) 放射線検出器、シンチレータアレイ、及びシンチレータアレイの製造方法
JP2015049123A (ja) 検出器モジュール製造方法、検出器モジュール及び医用画像診断装置
JP2002082175A (ja) 二次元アレイ型放射線検出器の製造方法
JP2015148446A (ja) 放射線撮像装置及び放射線検査装置
WO2025087933A1 (en) Imaging component comprising flat anti-scatter grid
JP2015049124A (ja) 検出器モジュール製造方法、検出器モジュール及び医用画像診断装置
JP2020501151A (ja) X線検出器における導光
JP2015049119A (ja) 検出器モジュール製造方法、検出器モジュール及び医用画像診断装置

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20150401

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20150401

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20160222

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20160229

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20160526

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20160826

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20161125

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20170321

A045 Written measure of dismissal of application [lapsed due to lack of payment]

Free format text: JAPANESE INTERMEDIATE CODE: A045

Effective date: 20170724