JP2014190921A5 - - Google Patents

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Publication number
JP2014190921A5
JP2014190921A5 JP2013068420A JP2013068420A JP2014190921A5 JP 2014190921 A5 JP2014190921 A5 JP 2014190921A5 JP 2013068420 A JP2013068420 A JP 2013068420A JP 2013068420 A JP2013068420 A JP 2013068420A JP 2014190921 A5 JP2014190921 A5 JP 2014190921A5
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JP
Japan
Prior art keywords
gas
ray
fluorescent
incident window
sample
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JP2013068420A
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English (en)
Japanese (ja)
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JP2014190921A (ja
JP6081260B2 (ja
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Priority to JP2013068420A priority Critical patent/JP6081260B2/ja
Priority claimed from JP2013068420A external-priority patent/JP6081260B2/ja
Priority to US14/219,579 priority patent/US9400255B2/en
Publication of JP2014190921A publication Critical patent/JP2014190921A/ja
Publication of JP2014190921A5 publication Critical patent/JP2014190921A5/ja
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JP2013068420A 2013-03-28 2013-03-28 蛍光x線分析装置 Active JP6081260B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2013068420A JP6081260B2 (ja) 2013-03-28 2013-03-28 蛍光x線分析装置
US14/219,579 US9400255B2 (en) 2013-03-28 2014-03-19 X-ray fluorescence spectrometer comprising a gas blowing mechanism

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2013068420A JP6081260B2 (ja) 2013-03-28 2013-03-28 蛍光x線分析装置

Publications (3)

Publication Number Publication Date
JP2014190921A JP2014190921A (ja) 2014-10-06
JP2014190921A5 true JP2014190921A5 (https=) 2016-02-12
JP6081260B2 JP6081260B2 (ja) 2017-02-15

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ID=51620858

Family Applications (1)

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JP2013068420A Active JP6081260B2 (ja) 2013-03-28 2013-03-28 蛍光x線分析装置

Country Status (2)

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US (1) US9400255B2 (https=)
JP (1) JP6081260B2 (https=)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9933375B2 (en) * 2015-09-25 2018-04-03 Olympus Scientific Solutions Americas, Inc. XRF/XRD system with dynamic management of multiple data processing units
WO2022004000A1 (ja) * 2020-06-30 2022-01-06 株式会社島津製作所 蛍光x線分析装置

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DE19932275B4 (de) * 1999-07-06 2005-08-04 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Vorrichtung zur Röntgenfluoreszenzanalyse
DE19948382A1 (de) * 1999-10-07 2001-05-03 Gemetec Ges Fuer Mestechnik Un Detektor für grosse Waferflächen
DE10050116A1 (de) * 1999-10-21 2001-04-26 Koninkl Philips Electronics Nv Verfahren und Vorrichtung zum Untersuchen einer Probe mit Hilfe von Röntgenfluoreszenzanalyse
RU2180439C2 (ru) * 2000-02-11 2002-03-10 Кумахов Мурадин Абубекирович Способ получения изображения внутренней структуры объекта с использованием рентгеновского излучения и устройство для его осуществления
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