JP2014116403A5 - - Google Patents

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Publication number
JP2014116403A5
JP2014116403A5 JP2012268340A JP2012268340A JP2014116403A5 JP 2014116403 A5 JP2014116403 A5 JP 2014116403A5 JP 2012268340 A JP2012268340 A JP 2012268340A JP 2012268340 A JP2012268340 A JP 2012268340A JP 2014116403 A5 JP2014116403 A5 JP 2014116403A5
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JP
Japan
Prior art keywords
detection
mark
reference member
exposure
projection optical
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JP2012268340A
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Japanese (ja)
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JP6102230B2 (ja
JP2014116403A (ja
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Publication of JP2014116403A5 publication Critical patent/JP2014116403A5/ja
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JP2012268340A 2012-12-07 2012-12-07 露光装置及び露光方法、並びにデバイス製造方法 Active JP6102230B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2012268340A JP6102230B2 (ja) 2012-12-07 2012-12-07 露光装置及び露光方法、並びにデバイス製造方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2012268340A JP6102230B2 (ja) 2012-12-07 2012-12-07 露光装置及び露光方法、並びにデバイス製造方法

Publications (3)

Publication Number Publication Date
JP2014116403A JP2014116403A (ja) 2014-06-26
JP2014116403A5 true JP2014116403A5 (enExample) 2015-12-03
JP6102230B2 JP6102230B2 (ja) 2017-03-29

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JP2012268340A Active JP6102230B2 (ja) 2012-12-07 2012-12-07 露光装置及び露光方法、並びにデバイス製造方法

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JP (1) JP6102230B2 (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102676391B1 (ko) * 2015-09-30 2024-06-18 가부시키가이샤 니콘 노광 장치, 노광 방법, 플랫 패널 디스플레이의 제조 방법, 및 디바이스 제조 방법

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1068604A (ja) * 1996-08-27 1998-03-10 Canon Inc 光干渉計測方法およびそれを用いた光干渉計測装置
WO2004053426A1 (en) * 2002-12-05 2004-06-24 Kla-Tencor Technologies Corporation Apparatus and methods for detecting overlay errors using scatterometry
EP3267258A1 (en) * 2006-02-21 2018-01-10 Nikon Corporation Exposure apparatus, exposure method and device manufacturing method
CN101385120B (zh) * 2006-02-21 2012-09-05 株式会社尼康 测定装置及方法、处理装置及方法、图案形成装置及方法、曝光装置及方法、以及元件制造方法
KR101770082B1 (ko) * 2006-09-01 2017-08-21 가부시키가이샤 니콘 이동체 구동 방법 및 이동체 구동 시스템, 패턴 형성 방법 및 장치, 노광 방법 및 장치, 디바이스 제조 방법, 그리고 캘리브레이션 방법
NL2005092A (en) * 2009-07-16 2011-01-18 Asml Netherlands Bv Object alignment measurement method and apparatus.
SG168488A1 (en) * 2009-07-16 2011-02-28 Asml Netherlands Bv Position calibration of alignment heads in a multi-head alignment system

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