JP6102230B2 - 露光装置及び露光方法、並びにデバイス製造方法 - Google Patents

露光装置及び露光方法、並びにデバイス製造方法 Download PDF

Info

Publication number
JP6102230B2
JP6102230B2 JP2012268340A JP2012268340A JP6102230B2 JP 6102230 B2 JP6102230 B2 JP 6102230B2 JP 2012268340 A JP2012268340 A JP 2012268340A JP 2012268340 A JP2012268340 A JP 2012268340A JP 6102230 B2 JP6102230 B2 JP 6102230B2
Authority
JP
Japan
Prior art keywords
detection
wafer
mark
exposure
measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2012268340A
Other languages
English (en)
Japanese (ja)
Other versions
JP2014116403A (ja
JP2014116403A5 (enExample
Inventor
柴崎　祐一
祐一 柴崎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nikon Corp
Original Assignee
Nikon Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nikon Corp filed Critical Nikon Corp
Priority to JP2012268340A priority Critical patent/JP6102230B2/ja
Publication of JP2014116403A publication Critical patent/JP2014116403A/ja
Publication of JP2014116403A5 publication Critical patent/JP2014116403A5/ja
Application granted granted Critical
Publication of JP6102230B2 publication Critical patent/JP6102230B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Landscapes

  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
JP2012268340A 2012-12-07 2012-12-07 露光装置及び露光方法、並びにデバイス製造方法 Active JP6102230B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2012268340A JP6102230B2 (ja) 2012-12-07 2012-12-07 露光装置及び露光方法、並びにデバイス製造方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2012268340A JP6102230B2 (ja) 2012-12-07 2012-12-07 露光装置及び露光方法、並びにデバイス製造方法

Publications (3)

Publication Number Publication Date
JP2014116403A JP2014116403A (ja) 2014-06-26
JP2014116403A5 JP2014116403A5 (enExample) 2015-12-03
JP6102230B2 true JP6102230B2 (ja) 2017-03-29

Family

ID=51172120

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2012268340A Active JP6102230B2 (ja) 2012-12-07 2012-12-07 露光装置及び露光方法、並びにデバイス製造方法

Country Status (1)

Country Link
JP (1) JP6102230B2 (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102676391B1 (ko) * 2015-09-30 2024-06-18 가부시키가이샤 니콘 노광 장치, 노광 방법, 플랫 패널 디스플레이의 제조 방법, 및 디바이스 제조 방법

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1068604A (ja) * 1996-08-27 1998-03-10 Canon Inc 光干渉計測方法およびそれを用いた光干渉計測装置
WO2004053426A1 (en) * 2002-12-05 2004-06-24 Kla-Tencor Technologies Corporation Apparatus and methods for detecting overlay errors using scatterometry
CN102866591B (zh) * 2006-02-21 2015-08-19 株式会社尼康 曝光装置及方法、以及元件制造方法
WO2007097380A1 (ja) * 2006-02-21 2007-08-30 Nikon Corporation パターン形成装置及びパターン形成方法、移動体駆動システム及び移動体駆動方法、露光装置及び露光方法、並びにデバイス製造方法
KR101626245B1 (ko) * 2006-09-01 2016-05-31 가부시키가이샤 니콘 이동체 구동 방법 및 이동체 구동 시스템, 패턴 형성 방법 및 장치, 노광 방법 및 장치, 디바이스 제조 방법, 그리고 캘리브레이션 방법
NL2005092A (en) * 2009-07-16 2011-01-18 Asml Netherlands Bv Object alignment measurement method and apparatus.
SG168488A1 (en) * 2009-07-16 2011-02-28 Asml Netherlands Bv Position calibration of alignment heads in a multi-head alignment system

Also Published As

Publication number Publication date
JP2014116403A (ja) 2014-06-26

Similar Documents

Publication Publication Date Title
JP6566389B2 (ja) 露光装置及び露光方法、並びにデバイス製造方法
JP5625345B2 (ja) 露光装置及び露光方法、並びにデバイス製造方法
US9690209B2 (en) Movable body apparatus, exposure apparatus, exposure method, and device manufacturing method
JP6423797B2 (ja) 露光装置及び露光方法、並びにデバイス製造方法
JP2017062490A (ja) 露光装置及び露光方法、並びにデバイス製造方法
JP2013236104A (ja) 露光装置及び露光方法、並びにデバイス製造方法
JPWO2008038752A1 (ja) 移動体システム、パターン形成装置、露光装置及び露光方法、並びにデバイス製造方法
CN108613638A (zh) 曝光装置及曝光方法、以及器件制造方法
JP2011049558A (ja) 露光方法及び露光装置、並びにデバイス製造方法
WO2008056735A1 (en) Holding unit, position detecting system and exposure system, moving method, position detecting method, exposure method, adjusting method of detection system, and device producing method
JP2015505154A (ja) 露光装置及び露光方法、並びにデバイス製造方法
JP5861858B2 (ja) 露光方法及び露光装置、並びにデバイス製造方法
JP6229311B2 (ja) 露光装置及びデバイス製造方法
JP6855008B2 (ja) 露光装置、フラットパネルディスプレイの製造方法、デバイス製造方法、及び露光方法
TWI409598B (zh) Pattern forming method and pattern forming apparatus, exposure method and exposure apparatus, and component manufacturing method
JP6102230B2 (ja) 露光装置及び露光方法、並びにデバイス製造方法
JP2011258922A (ja) 露光装置及び露光方法、並びにデバイス製造方法
JP6493481B2 (ja) 露光装置及びデバイス製造方法
JP5757397B2 (ja) 露光方法及び露光装置、並びにデバイス製造方法

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20151020

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20151020

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20160725

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20160802

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20160912

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20170131

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20170213

R150 Certificate of patent or registration of utility model

Ref document number: 6102230

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250