JP2014022036A5 - - Google Patents

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JP2014022036A5
JP2014022036A5 JP2013150444A JP2013150444A JP2014022036A5 JP 2014022036 A5 JP2014022036 A5 JP 2014022036A5 JP 2013150444 A JP2013150444 A JP 2013150444A JP 2013150444 A JP2013150444 A JP 2013150444A JP 2014022036 A5 JP2014022036 A5 JP 2014022036A5
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patent application
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JP2013150444A
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JP2014022036A (ja
JP5927148B2 (ja
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Priority claimed from US13/555,581 external-priority patent/US9082440B2/en
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本発明は、データ記憶のために用いられる装置、および方法に関する。
米国特許第７８００８５８号明細書 米国特許出願公開第２００４／０２４０１０９号明細書 米国特許出願公開第２００８／０２３９５８１号明細書 米国特許出願公開第２０１１／０１５７７３６号明細書
JP2013150444A 2012-07-23 2013-07-19 ヘッドとディスクとの接触および／または間隔を検知する装置、ならびに方法 Expired - Fee Related JP5927148B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US13/555,581 US9082440B2 (en) 2012-07-23 2012-07-23 Using first and second resistive sensor bias levels to detect head-to-disk contact and/or clearance
US13/555,581 2012-07-23

Publications (3)

Publication Number Publication Date
JP2014022036A JP2014022036A (ja) 2014-02-03
JP2014022036A5 true JP2014022036A5 (ja) 2014-03-20
JP5927148B2 JP5927148B2 (ja) 2016-05-25

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JP2013150444A Expired - Fee Related JP5927148B2 (ja) 2012-07-23 2013-07-19 ヘッドとディスクとの接触および／または間隔を検知する装置、ならびに方法

Country Status (5)

Country Link
US (1) US9082440B2 (ja)
EP (1) EP2690625A3 (ja)
JP (1) JP5927148B2 (ja)
KR (1) KR101502838B1 (ja)
CN (1) CN103578485B (ja)

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KR102660769B1 (ko) * 2017-11-15 2024-04-24 카프레스 에이/에스 테스트 샘플의 전기적 특성을 테스트하기 위한 프로브 및 연관된 근접성 검출기
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