JP2014013882A - 基板支持装置及び基板処理装置 - Google Patents
基板支持装置及び基板処理装置 Download PDFInfo
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- JP2014013882A JP2014013882A JP2013079038A JP2013079038A JP2014013882A JP 2014013882 A JP2014013882 A JP 2014013882A JP 2013079038 A JP2013079038 A JP 2013079038A JP 2013079038 A JP2013079038 A JP 2013079038A JP 2014013882 A JP2014013882 A JP 2014013882A
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32715—Workpiece holder
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68785—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by the mechanical construction of the susceptor, stage or support
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
- H01L21/67109—Apparatus for thermal treatment mainly by convection
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67126—Apparatus for sealing, encapsulating, glassing, decapsulating or the like
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67063—Apparatus for fluid treatment for etching
- H01L21/67069—Apparatus for fluid treatment for etching for drying etching
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- Condensed Matter Physics & Semiconductors (AREA)
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- Plasma & Fusion (AREA)
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- Analytical Chemistry (AREA)
- Drying Of Semiconductors (AREA)
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Abstract
【解決手段】 上部に基板が支持され、冷却ガスが通過する複数の供給管が形成された下板20と、下板20の上に脱着自在に設けられ、下板20に支持される基板の上面を露出させるポケット33が形成された上板30と、下板20に結合され、上板30と下板20との間及び基板と下板20との間にそれぞれ冷却空間を形成する封止部材40と、を備えることを特徴とする基板支持装置。
【選択図】図2
Description
Claims (11)
- 上部に基板が支持され、冷却ガスが通過する複数の供給管が形成された下板と、
前記下板の上に脱着自在に設けられ、前記下板に支持される基板の上面を露出させるポケットが形成された上板と、
前記下板に結合され、前記上板と前記下板との間及び前記基板と前記下板との間にそれぞれ冷却空間を形成する封止部材と、
を備えることを特徴とする基板支持装置。 - 前記上板は前記下板の上部及び側面を取り囲み、前記下板の側面と前記上板の側壁との間には前記冷却ガスが通過する流路を形成し、
前記封止部材は前記基板と前記上板との間を封止することを特徴とする請求項1に記載の基板支持装置。 - 前記上板には前記下板が収容される凹状の収容部が設けられ、前記収容部の直径は前記下板の直径よりも大きく、前記下板の側面と前記収容部の側壁との間に前記流路を形成して、前記流路を介して前記冷却ガスが前記上板の背面の縁部に供給されるようにすることを特徴とする請求項2に記載の基板支持装置。
- 前記上板は前記下板の上部を覆い、前記封止部材は前記基板と前記上板との間を封止し、
前記上板の縁部と前記下板の縁部との間に配設される封止リングを備えることを特徴とする請求項1に記載の基板支持装置。 - 前記冷却空間は、前記基板と前記下板との間に形成される第1冷却空間と、前記上板と前記下板との間に形成される第2冷却空間と、を備え、
前記下板は、前記冷却ガスを前記第1冷却空間に供給する第1供給管と、前記冷却ガスを前記第2冷却空間に供給する第2供給管と、を備えることを特徴とする請求項1から4のいずれか一項に記載の基板支持装置。 - 前記下板は、前記封止部材の下部の一部が嵌着されるリング状の収容溝を備えることを特徴とする請求項1から4のいずれか一項に記載の基板支持装置。
- 前記封止部材は、前記収容溝に嵌入する下部と、前記収容溝の上部側に突出する上部と、を備え、
前記上部の外側が前記上板に接し、内側が前記基板に接して、前記冷却ガスが前記基板と前記上板との間の空間に流出されることを防ぐことを特徴とする請求項6に記載の基板支持装置。 - 前記封止部材の前記上部の断面幅は、前記下部の断面幅よりも大きいか、等しいか、あるいは小さいことを特徴とする請求項7に記載の基板支持装置。
- 前記封止部材の前記上部の断面形状は、上部側が左右に分岐された形状、多角形、円形または長円形であることを特徴とする請求項7に記載の基板支持装置。
- 前記封止部材の前記下部は、上下方向に断面幅が等しいか、あるいは、下方に進むにつれて断面幅が増大することを特徴とする請求項7に記載の基板支持装置。
- 前記封止部材は、前記基板に接触される第1封止部材と、前記上板に接触される第2封止部材と、を備えることを特徴とする請求項1から4のいずれか一項に記載の基板支持装置。
Applications Claiming Priority (2)
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KR1020120072522A KR101228484B1 (ko) | 2012-07-03 | 2012-07-03 | 플라즈마 처리장치의 기판 재치대 |
KR10-2012-0072522 | 2012-07-03 |
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JP2014013882A true JP2014013882A (ja) | 2014-01-23 |
JP5777656B2 JP5777656B2 (ja) | 2015-09-09 |
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JP (1) | JP5777656B2 (ja) |
KR (1) | KR101228484B1 (ja) |
CN (1) | CN103531513B (ja) |
TW (1) | TWI493652B (ja) |
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KR101950692B1 (ko) * | 2012-11-08 | 2019-02-21 | 엘지이노텍 주식회사 | 반도체 식각 장치 |
KR101599798B1 (ko) * | 2014-05-07 | 2016-03-14 | 세교 (주) | 플라즈마 처리장치의 기판재치대 |
TWI584706B (zh) * | 2014-07-24 | 2017-05-21 | Uvat Technology Co Ltd | A plasma etch device for a printed circuit board |
KR101600269B1 (ko) * | 2014-10-24 | 2016-03-07 | 세교 (주) | 플라즈마 처리장치의 기판재치대 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63236328A (ja) * | 1987-03-25 | 1988-10-03 | Hitachi Ltd | 試料温度制御機構 |
JP2000208439A (ja) * | 1999-01-18 | 2000-07-28 | Tokyo Electron Ltd | 成膜装置 |
JP2010225775A (ja) * | 2009-03-23 | 2010-10-07 | Panasonic Corp | プラズマ処理装置 |
JP2011114178A (ja) * | 2009-11-27 | 2011-06-09 | Samco Inc | プラズマ処理装置及びプラズマ処理方法 |
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AU2002326159A1 (en) * | 2001-08-27 | 2003-03-10 | Matsushita Electric Industrial Co., Ltd. | Plasma treating apparatus and plasma treating method |
JP3640385B2 (ja) * | 2001-12-26 | 2005-04-20 | 株式会社アルバック | 焦電性高誘電体のエッチング方法及び装置 |
JP4539981B2 (ja) * | 2005-05-17 | 2010-09-08 | 株式会社アルバック | 基板保持装置 |
JP4361045B2 (ja) * | 2005-10-12 | 2009-11-11 | パナソニック株式会社 | プラズマ処理装置及びプラズマ処理方法 |
KR100734016B1 (ko) * | 2006-07-06 | 2007-06-29 | 주식회사 래디언테크 | 기판 재치대 및 이를 구비한 플라즈마 처리 장치 |
KR100981120B1 (ko) * | 2009-09-09 | 2010-09-10 | 주식회사 맥시스 | 트레이 및 이를 이용한 제조장치 |
KR101040697B1 (ko) * | 2009-11-25 | 2011-06-13 | 세메스 주식회사 | 정전척 |
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- 2012-07-03 KR KR1020120072522A patent/KR101228484B1/ko active IP Right Grant
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- 2013-04-05 JP JP2013079038A patent/JP5777656B2/ja active Active
- 2013-04-08 TW TW102112344A patent/TWI493652B/zh active
- 2013-04-18 CN CN201310136374.1A patent/CN103531513B/zh active Active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63236328A (ja) * | 1987-03-25 | 1988-10-03 | Hitachi Ltd | 試料温度制御機構 |
JP2000208439A (ja) * | 1999-01-18 | 2000-07-28 | Tokyo Electron Ltd | 成膜装置 |
JP2010225775A (ja) * | 2009-03-23 | 2010-10-07 | Panasonic Corp | プラズマ処理装置 |
JP2011114178A (ja) * | 2009-11-27 | 2011-06-09 | Samco Inc | プラズマ処理装置及びプラズマ処理方法 |
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TW201403744A (zh) | 2014-01-16 |
KR101228484B1 (ko) | 2013-01-31 |
TWI493652B (zh) | 2015-07-21 |
CN103531513A (zh) | 2014-01-22 |
JP5777656B2 (ja) | 2015-09-09 |
CN103531513B (zh) | 2016-04-13 |
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