JP2013541397A5 - - Google Patents

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Publication number
JP2013541397A5
JP2013541397A5 JP2013537243A JP2013537243A JP2013541397A5 JP 2013541397 A5 JP2013541397 A5 JP 2013541397A5 JP 2013537243 A JP2013537243 A JP 2013537243A JP 2013537243 A JP2013537243 A JP 2013537243A JP 2013541397 A5 JP2013541397 A5 JP 2013541397A5
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JP2013537243A
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Japanese (ja)
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JP2013541397A (ja
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Priority claimed from PCT/IB2011/054890 external-priority patent/WO2012063169A1/en
Publication of JP2013541397A publication Critical patent/JP2013541397A/ja
Publication of JP2013541397A5 publication Critical patent/JP2013541397A5/ja
Ceased legal-status Critical Current

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JP2013537243A 2010-11-08 2011-11-03 位相コントラスト撮像に関する格子 Ceased JP2013541397A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP10190351 2010-11-08
EP10190351.6 2010-11-08
PCT/IB2011/054890 WO2012063169A1 (en) 2010-11-08 2011-11-03 Grating for phase contrast imaging

Publications (2)

Publication Number Publication Date
JP2013541397A JP2013541397A (ja) 2013-11-14
JP2013541397A5 true JP2013541397A5 (https=) 2014-12-18

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ID=45370530

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JP2013537243A Ceased JP2013541397A (ja) 2010-11-08 2011-11-03 位相コントラスト撮像に関する格子

Country Status (7)

Country Link
US (1) US20130223595A1 (https=)
EP (1) EP2637565A1 (https=)
JP (1) JP2013541397A (https=)
CN (1) CN103200874B (https=)
BR (1) BR112013011028A2 (https=)
RU (1) RU2013126110A (https=)
WO (1) WO2012063169A1 (https=)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB201119257D0 (en) 2011-11-08 2011-12-21 Eshtech Ltd X-ray detection apparatus
GB201308818D0 (en) 2013-05-16 2013-07-03 Ibex Innovations Ltd X-ray detector apparatus
GB201308851D0 (en) * 2013-05-16 2013-07-03 Ibex Innovations Ltd Multi-spectral x-ray detection apparatus
GB201308876D0 (en) 2013-05-16 2013-07-03 Ibex Innovations Ltd X-Ray imaging apparatus and methods
CN106033133B (zh) * 2015-03-11 2019-09-17 同方威视技术股份有限公司 一种光栅、制造方法和辐射成像装置
WO2016181715A1 (ja) * 2015-05-12 2016-11-17 株式会社島津製作所 放射線源およびそれを備えた放射線位相差撮影装置
JP6430636B2 (ja) 2015-08-26 2018-11-28 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． デュアルエネルギー微分位相コントラスト撮像
CN109478440A (zh) * 2016-06-08 2019-03-15 皇家飞利浦有限公司 用于相位衬度成像和/或暗场成像的分析格栅
WO2018108853A1 (en) * 2016-12-15 2018-06-21 Koninklijke Philips N.V. Grating structure for x-ray imaging

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5606589A (en) * 1995-05-09 1997-02-25 Thermo Trex Corporation Air cross grids for mammography and methods for their manufacture and use
US7141812B2 (en) * 2002-06-05 2006-11-28 Mikro Systems, Inc. Devices, methods, and systems involving castings
EP1623671A4 (en) * 2002-12-26 2008-11-05 Atsushi Momose X-RAY PRESENTATION SYSTEM AND PRESENTATION METHOD
DE10322531B4 (de) * 2003-05-19 2010-09-16 Siemens Ag Streustrahlenraster oder Kollimator
DE10354808A1 (de) * 2003-11-21 2005-06-30 Siemens Ag Verfahren zur Abschattung von Streustrahlung vor einem Detektorarray
DE102006063048B3 (de) * 2006-02-01 2018-03-29 Siemens Healthcare Gmbh Fokus/Detektor-System einer Röntgenapparatur zur Erzeugung von Phasenkontrastaufnahmen
DE102006037281A1 (de) * 2006-02-01 2007-08-09 Siemens Ag Röntgenoptisches Durchstrahlungsgitter einer Fokus-Detektor-Anordnung einer Röntgenapparatur zur Erzeugung projektiver oder tomographischer Phasenkontrastaufnahmen von einem Untersuchungsobjekt
DE102006015358B4 (de) * 2006-02-01 2019-08-22 Paul Scherer Institut Fokus/Detektor-System einer Röntgenapparatur zur Erzeugung von Phasenkontrastaufnahmen, zugehöriges Röntgen-System sowie Speichermedium und Verfahren zur Erzeugung tomographischer Aufnahmen
DE102006037254B4 (de) * 2006-02-01 2017-08-03 Paul Scherer Institut Fokus-Detektor-Anordnung zur Erzeugung projektiver oder tomographischer Phasenkontrastaufnahmen mit röntgenoptischen Gittern, sowie Röntgen-System, Röntgen-C-Bogen-System und Röntgen-Computer-Tomographie-System
US8411816B2 (en) * 2007-02-21 2013-04-02 Konica Minolta Medical & Graphic, Inc. Radiological image capturing apparatus and radiological image capturing system
DE102007024156B3 (de) * 2007-05-24 2008-12-11 Siemens Ag Röntgenabsorptionsgitter
JP5339975B2 (ja) * 2008-03-13 2013-11-13 キヤノン株式会社 Ｘ線位相イメージングに用いられる位相格子、該位相格子を用いたｘ線位相コントラスト像の撮像装置、ｘ線コンピューター断層撮影システム
US8565371B2 (en) * 2008-03-19 2013-10-22 Koninklijke Philips N.V. Rotational X ray device for phase contrast imaging
JP5451150B2 (ja) * 2008-04-15 2014-03-26 キヤノン株式会社 Ｘ線用線源格子、ｘ線位相コントラスト像の撮像装置
DE102008048683A1 (de) * 2008-09-24 2010-04-08 Siemens Aktiengesellschaft Verfahren zur Bestimmung von Phase und/oder Amplitude zwischen interferierenden benachbarten Röntgenstrahlen in einem Detektorpixel bei einem Talbot-Interferometer
EP2168488B1 (de) * 2008-09-30 2013-02-13 Siemens Aktiengesellschaft Röntgen-CT-System zur Röntgen-Phasenkontrast-und/oder Röntgen-Dunkelfeld-Bildgebung
US7949095B2 (en) * 2009-03-02 2011-05-24 University Of Rochester Methods and apparatus for differential phase-contrast fan beam CT, cone-beam CT and hybrid cone-beam CT
RU2539333C2 (ru) * 2009-05-19 2015-01-20 Конинклейке Филипс Электроникс Н.В. Дифракционная решетка для получения изображений методом фазового контраста

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