JP2013541021A5 - - Google Patents

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Publication number
JP2013541021A5
JP2013541021A5 JP2013536562A JP2013536562A JP2013541021A5 JP 2013541021 A5 JP2013541021 A5 JP 2013541021A5 JP 2013536562 A JP2013536562 A JP 2013536562A JP 2013536562 A JP2013536562 A JP 2013536562A JP 2013541021 A5 JP2013541021 A5 JP 2013541021A5
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JP
Japan
Prior art keywords
sample
detection system
array
interference spectrum
phase difference
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JP2013536562A
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English (en)
Japanese (ja)
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JP2013541021A (ja
JP5920996B2 (ja
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Priority claimed from US12/914,622 external-priority patent/US8792102B2/en
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Publication of JP2013541021A5 publication Critical patent/JP2013541021A5/ja
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JP2013536562A 2010-10-28 2011-10-25 ２次元試料配列を検出及び撮像するためのシステム及び方法 Active JP5920996B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US12/914,622 2010-10-28
US12/914,622 US8792102B2 (en) 2010-10-28 2010-10-28 Interferometric spectral imaging of a two-dimensional array of samples using surface plasmon resonance
PCT/SE2011/051265 WO2012057681A1 (en) 2010-10-28 2011-10-25 Systems and methods for detection and imaging of two-dimensional sample arrays

Publications (3)

Publication Number Publication Date
JP2013541021A JP2013541021A (ja) 2013-11-07
JP2013541021A5 true JP2013541021A5 (enExample) 2014-11-20
JP5920996B2 JP5920996B2 (ja) 2016-05-24

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JP2013536562A Active JP5920996B2 (ja) 2010-10-28 2011-10-25 ２次元試料配列を検出及び撮像するためのシステム及び方法

Country Status (5)

Country Link
US (1) US8792102B2 (enExample)
EP (2) EP4279886A3 (enExample)
JP (1) JP5920996B2 (enExample)
KR (1) KR101983400B1 (enExample)
WO (1) WO2012057681A1 (enExample)

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