JP2013536435A5 - - Google Patents

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Publication number
JP2013536435A5
JP2013536435A5 JP2013525918A JP2013525918A JP2013536435A5 JP 2013536435 A5 JP2013536435 A5 JP 2013536435A5 JP 2013525918 A JP2013525918 A JP 2013525918A JP 2013525918 A JP2013525918 A JP 2013525918A JP 2013536435 A5 JP2013536435 A5 JP 2013536435A5
Authority
JP
Japan
Prior art keywords
tube
needle
movable
extending
needles
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2013525918A
Other languages
English (en)
Japanese (ja)
Other versions
JP2013536435A (ja
JP5840689B2 (ja
Filing date
Publication date
Priority claimed from US12/859,713 external-priority patent/US8310223B2/en
Application filed filed Critical
Publication of JP2013536435A publication Critical patent/JP2013536435A/ja
Publication of JP2013536435A5 publication Critical patent/JP2013536435A5/ja
Application granted granted Critical
Publication of JP5840689B2 publication Critical patent/JP5840689B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2013525918A 2010-08-19 2011-07-20 電気プローブおよび関連方法 Active JP5840689B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US12/859,713 US8310223B2 (en) 2010-08-19 2010-08-19 Electrical probe and associated method
US12/859,713 2010-08-19
PCT/US2011/044717 WO2012024050A1 (en) 2010-08-19 2011-07-20 Electrical probe and associated method

Publications (3)

Publication Number Publication Date
JP2013536435A JP2013536435A (ja) 2013-09-19
JP2013536435A5 true JP2013536435A5 (enExample) 2014-09-04
JP5840689B2 JP5840689B2 (ja) 2016-01-06

Family

ID=44513147

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2013525918A Active JP5840689B2 (ja) 2010-08-19 2011-07-20 電気プローブおよび関連方法

Country Status (6)

Country Link
US (1) US8310223B2 (enExample)
EP (1) EP2606366B1 (enExample)
JP (1) JP5840689B2 (enExample)
CN (1) CN103069280B (enExample)
AU (1) AU2011292366B2 (enExample)
WO (1) WO2012024050A1 (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9748680B1 (en) * 2016-06-28 2017-08-29 Intel Corporation Multiple contact pogo pin
US10230459B2 (en) 2017-02-14 2019-03-12 The Boeing Company System and method for optical time-domain reflectometry and design data wire testing
JP7692685B2 (ja) * 2020-10-13 2025-06-16 日置電機株式会社 センサ

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2529270A (en) 1949-02-26 1950-11-07 Webster Robert Self-piercing and self-holding test prod
JPS6110213Y2 (enExample) * 1979-12-03 1986-04-02
US4414506A (en) * 1980-12-30 1983-11-08 Kelley Jack M Electrical circuit test probe
US4716365A (en) 1985-10-11 1987-12-29 Lisle Corporation Circuit tester
JPH04177172A (ja) * 1990-11-09 1992-06-24 Hokkaido Electric Power Co Inc:The 電気信号検出装置
WO1992011539A1 (en) * 1990-12-20 1992-07-09 Radu Filipescu Testing clip and circuit board contacting method
JP3190708B2 (ja) * 1991-09-09 2001-07-23 北海道電力株式会社 電気信号検出装置
US5416405A (en) * 1993-08-02 1995-05-16 Dill; David M. Test probe with improved capture assembly and threaded needle point probe adjustment
JPH08129039A (ja) * 1994-11-01 1996-05-21 Furukawa Electric Co Ltd:The 電気導体導電針装置
CN2240150Y (zh) * 1994-12-06 1996-11-13 孙万发 一种测电笔探头
CN2610339Y (zh) * 2003-04-17 2004-04-07 金建叨 试电笔
JP4912068B2 (ja) * 2006-08-01 2012-04-04 中国電力株式会社 電圧測定装置
US7355377B1 (en) * 2006-10-17 2008-04-08 Bill Gallentine Telescoping electrical tester

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