JP2013516609A5 - - Google Patents

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JP2013516609A5
JP2013516609A5 JP2012547073A JP2012547073A JP2013516609A5 JP 2013516609 A5 JP2013516609 A5 JP 2013516609A5 JP 2012547073 A JP2012547073 A JP 2012547073A JP 2012547073 A JP2012547073 A JP 2012547073A JP 2013516609 A5 JP2013516609 A5 JP 2013516609A5
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pixels
pixel
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JP5809641B2 (ja
JP2013516609A (ja
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JP2012547073A 2009-12-30 2010-11-04 ピクセル型固体放射線フォトン検出器の電荷分布を制御する方法 Expired - Fee Related JP5809641B2 (ja)

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Application Number Priority Date Filing Date Title
US12/649,987 2009-12-30
US12/649,987 US8405038B2 (en) 2009-12-30 2009-12-30 Systems and methods for providing a shared charge in pixelated image detectors
PCT/US2010/055353 WO2011090530A2 (en) 2009-12-30 2010-11-04 Systems and methods for providing a shared charge in pixelated image detectors

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JP2013516609A JP2013516609A (ja) 2013-05-13
JP2013516609A5 true JP2013516609A5 (https=) 2013-12-19
JP5809641B2 JP5809641B2 (ja) 2015-11-11

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JP2012547073A Expired - Fee Related JP5809641B2 (ja) 2009-12-30 2010-11-04 ピクセル型固体放射線フォトン検出器の電荷分布を制御する方法

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US (2) US8405038B2 (https=)
JP (1) JP5809641B2 (https=)
CN (2) CN104977600B (https=)
CA (1) CA2785891C (https=)
WO (1) WO2011090530A2 (https=)

Families Citing this family (77)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8405038B2 (en) * 2009-12-30 2013-03-26 General Electric Company Systems and methods for providing a shared charge in pixelated image detectors
US8466420B2 (en) * 2010-06-04 2013-06-18 General Electric Company Charge loss correction
FR2972268B1 (fr) * 2011-03-01 2013-03-29 Sagem Defense Securite Detecteur de sursauts gamma compact a haute resolution
US9052497B2 (en) 2011-03-10 2015-06-09 King Abdulaziz City For Science And Technology Computing imaging data using intensity correlation interferometry
US9099214B2 (en) 2011-04-19 2015-08-04 King Abdulaziz City For Science And Technology Controlling microparticles through a light field having controllable intensity and periodicity of maxima thereof
WO2013012809A1 (en) * 2011-07-15 2013-01-24 Brookhaven Science Associates, Llc Radiation detector modules based on multi-layer cross strip semiconductor detectors
BR112014004344A2 (pt) * 2011-08-30 2017-05-30 Koninklijke Philips Nv matriz detectora e método de detecção de maiores taxas de fluxo de fóton
EP2758806B1 (en) 2011-09-21 2019-06-12 CERN - European Organization For Nuclear Research A single layer 3d tracking semiconductor detector
DE102011083832B4 (de) * 2011-09-30 2013-07-18 Siemens Aktiengesellschaft Verfahren zum Gewinnen eines Röntgenbildes mit einem direkt-konvertierenden, zählenden Röntgendetektor und direkt-konvertierender, zählender Röntgendetektor
DE102011085080A1 (de) * 2011-10-24 2013-04-04 Siemens Ag Verfahren und Vorrichtung zur Detektion von Röntgenquanten
EP2613178A3 (de) * 2011-11-25 2014-08-06 Albert-Ludwigs-Universität Freiburg Detektor und Verfahren zum Nachweis von ionisierender Strahlung
FR2996648A1 (fr) * 2012-10-08 2014-04-11 Commissariat Energie Atomique Procede et dispositif de detection d'un rayonnement ionisant par un photodetecteur pixellise
JP6349325B2 (ja) * 2012-12-04 2018-06-27 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 光子計数ｘ線検出器
DE102013202630B4 (de) * 2013-02-19 2017-07-06 Siemens Healthcare Gmbh Strahlungsdetektor und medizinisches Diagnosesystem
US9002084B2 (en) 2013-08-30 2015-04-07 Ge Medical Systems Israel, Ltd Systems and methods for summing signals from an imaging detector
DE102014201772B4 (de) * 2014-01-31 2017-10-12 Siemens Healthcare Gmbh Direktkonvertierender Röntgenstrahlungsdetektor, CT-System und Verfahren hierzu
DE102014207324A1 (de) * 2014-04-16 2015-10-22 Siemens Aktiengesellschaft Direktkonvertierender Röntgenstrahlungsdetektor und CT-System
JP6355747B2 (ja) * 2014-10-16 2018-07-11 株式会社日立製作所 放射線検出器、放射線撮像装置、コンピュータ断層撮影装置および放射線検出方法
WO2016059557A1 (en) * 2014-10-17 2016-04-21 Koninklijke Philips N.V. Pet detector scintillator arrangement with light sharing and depth of interaction estimation
JP6262919B2 (ja) * 2014-12-05 2018-01-17 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 傾斜角度でｘ線放射線を検出するｘ線検出器装置
RU2705717C2 (ru) * 2014-12-17 2019-11-11 Конинклейке Филипс Н.В. Детектор и способ для обнаружения ионизирующего излучения
US20160206255A1 (en) * 2015-01-16 2016-07-21 Kabushiki Kaisha Toshiba Hybrid passive/active multi-layer energy discriminating photon-counting detector
US9696440B2 (en) * 2015-02-20 2017-07-04 General Electric Company Systems and methods for improving energy resolution by sub-pixel energy calibration
US9927539B2 (en) 2015-02-20 2018-03-27 General Electric Company Systems and methods for improving imaging by sub-pixel calibration
US9482764B1 (en) 2015-05-28 2016-11-01 General Electric Company Systems and methods for charge-sharing identification and correction using a single pixel
JP6720229B2 (ja) * 2015-07-09 2020-07-08 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 積層検出器を用いる同時ｘ線及びガンマ光子イメージングのためのデバイス及び方法
US9891328B2 (en) * 2015-09-30 2018-02-13 General Electric Company Systems and methods for reduced size detector electronics
US10529753B2 (en) 2015-11-03 2020-01-07 Sensors Unlimited, Inc. Pixels
US10122946B2 (en) * 2015-11-11 2018-11-06 Fei Company Method for detecting particulate radiation
WO2017085304A1 (en) * 2015-11-20 2017-05-26 Koninklijke Philips N.V. Detection values determination system
US10497741B2 (en) 2016-01-05 2019-12-03 Board Of Regents, The University Of Texas System Apparatus and methods for optical emission detection
US10408951B2 (en) * 2016-01-29 2019-09-10 Board Of Trustees Of Michigan State University Radiation detector
JP6598302B2 (ja) * 2016-02-10 2019-10-30 国立研究開発法人情報通信研究機構 信号処理回路
WO2017163149A1 (en) * 2016-03-23 2017-09-28 Koninklijke Philips N.V. Nano-material imaging detector with an integral pixel border
JP6730424B2 (ja) * 2016-03-31 2020-07-29 株式会社ジョブ Ｘ線検出システム、ｘ線装置、並びに、ｘ線検出データを処理する装置及び方法
US10393891B2 (en) * 2016-05-03 2019-08-27 Redlen Technologies, Inc. Sub-pixel segmentation for semiconductor radiation detectors and methods of fabricating thereof
KR101769476B1 (ko) 2016-06-16 2017-08-18 한국과학기술원 전하 공유를 이용한 의료 영상의 공간 해상도 증가 장치 및 방법
CN106324649B (zh) * 2016-08-31 2023-09-15 同方威视技术股份有限公司 半导体探测器
DE102016221481B4 (de) 2016-11-02 2021-09-16 Siemens Healthcare Gmbh Strahlungsdetektor mit einer Zwischenschicht
US10156645B2 (en) * 2016-12-23 2018-12-18 General Electric Company Systems and methods for sub-pixel location determination at sidewalls and corners of detectors
US9983320B1 (en) 2017-05-15 2018-05-29 General Electric Company Systems and methods for improved collimation sensitivity
US10324200B2 (en) 2017-05-15 2019-06-18 General Electric Company Systems and methods for improved collimation sensitivity
US10145964B1 (en) 2017-05-15 2018-12-04 General Electric Company Systems and methods for improved collimation sensitivity
EP3659513B1 (en) * 2017-06-05 2021-08-11 General Electric Company Methods for improving imaging by sub-pixel calibration
CN110914713B (zh) * 2017-07-26 2023-07-18 深圳帧观德芯科技有限公司 能够管理周边电荷共享的x射线检测器
US10205033B1 (en) * 2017-12-14 2019-02-12 Sensl Technologies Ltd. ESD protected semiconductor photomultiplier
RU2672039C1 (ru) * 2017-12-27 2018-11-08 Объединенный Институт Ядерных Исследований (Оияи) Планарный полупроводниковый детектор
US10324202B1 (en) * 2018-01-02 2019-06-18 General Electric Company Systems and methods for collecting radiation detection
CN108267776B (zh) * 2018-02-02 2024-11-08 张岚 提高中低能射线探测能力的多层探测器结构及方法
US10254163B1 (en) * 2018-03-15 2019-04-09 Kromek Group, PLC Interaction characteristics from a plurality of pixels
US10627530B2 (en) * 2018-05-07 2020-04-21 Ka Imaging Inc. Method and apparatus for a high resolution, high speed radiation imaging
KR102069306B1 (ko) * 2018-06-04 2020-01-22 세종대학교산학협력단 디지털 신호 처리 회로 및 동판격자형 czt센서를 이용한 방사선 검출 방법 및 장치
US10761224B2 (en) 2018-06-06 2020-09-01 General Electric Company Systems and methods for improved detector assembly sizing
US11169286B2 (en) 2018-06-18 2021-11-09 Redlen Technologies, Inc. Methods of calibrating semiconductor radiation detectors using K-edge filters
US10481285B1 (en) * 2018-08-13 2019-11-19 General Electric Company Systems and methods for determination of depth of interaction
US10976452B2 (en) 2018-08-13 2021-04-13 General Electric Medical Systems Israel, Ltd. (Il) Systems and methods for improved medical imaging
US10247834B1 (en) 2018-08-15 2019-04-02 General Electric Company Anodes for improved detection of non-collected adjacent signal
US10591619B2 (en) 2018-08-15 2020-03-17 GE Precision Healthcare LLC Anodes for improved detection of non-collected adjacent signals
JP7391499B2 (ja) * 2018-09-05 2023-12-05 キヤノンメディカルシステムズ株式会社 放射線検出器、放射線診断装置及びチャージシェアリングの判定方法
CN112601981B (zh) 2018-09-07 2023-07-18 深圳帧观德芯科技有限公司 辐射探测器
CN109298438B (zh) * 2018-09-30 2020-05-19 重庆邮电大学 半导体探测器及半导体探测器制备方法
US10928527B2 (en) 2018-11-09 2021-02-23 Redlen Technologies, Inc. Charge sharing correction methods for pixelated radiation detector arrays
WO2020106198A1 (en) * 2018-11-19 2020-05-28 Prismatic Sensors Ab A method and a system for enabling estimation of an initial point of interaction of an x-ray photon in a photon-counting x-ray detector
US11372120B2 (en) 2019-08-26 2022-06-28 Redlen Technologies, Inc. Charge sharing correction methods for sub-pixellated radiation detector arrays
WO2021154851A1 (en) * 2020-01-27 2021-08-05 The Johns Hopkins University Photon counting detector
US11255984B2 (en) * 2020-05-07 2022-02-22 Kromek Group, PLC Photon interaction characteristics from a subset of pixels
US11320545B2 (en) 2020-07-07 2022-05-03 GE Precision Healthcare LLC Systems and methods for improved medical imaging
US11092701B1 (en) 2020-07-07 2021-08-17 GE Precision Healthcare LLC Systems and methods for improved medical imaging
CN111863847B (zh) * 2020-07-23 2024-06-07 湖南脉探芯半导体科技有限公司 一种梳状硅像素探测单元及梳状硅像素探测器
KR20230078684A (ko) * 2020-09-03 2023-06-02 더 리서치 파운데이션 포 더 스테이트 유니버시티 오브 뉴욕 결정체-채널 결합을 위한 시스템 및 방법
KR20230082025A (ko) * 2020-10-07 2023-06-08 더 리서치 파운데이션 포 더 스테이트 유니버시티 오브 뉴욕 결정체-간 광이 공유되는 높은 분해능 비행-시간 양전자 방출 단층촬영 모듈들에 대한 전력-효율적 다중화를 위한 시스템 및 방법
CN113140643B (zh) * 2021-04-16 2025-06-10 中国航天科工集团第二研究院 一种CdZnTe辐射探测器
FR3125338B1 (fr) * 2021-07-14 2023-11-03 Commissariat Energie Atomique Procédé de formation d’une image gamma sous-pixellisée, prenant en compte une non uniformité spatiale de la sensibilité.
IT202200002993A1 (it) * 2022-02-17 2023-08-17 Istituto Naz Fisica Nucleare Sensori a silicio con lettura resistiva senza distorsione dell’immagine
EP4235226A1 (en) 2022-02-24 2023-08-30 Koninklijke Philips N.V. Radiation detector and detection method
US11860319B2 (en) 2022-03-10 2024-01-02 GE Precision Healthcare LLC High-resolution detector having a reduced number of pixels
CN114784126A (zh) * 2022-05-11 2022-07-22 湖南脉探芯半导体科技有限公司 二维位置分辨硅探测器

Family Cites Families (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2255702B1 (https=) * 1973-12-21 1976-10-08 Commissariat Energie Atomique
JPH02108992A (ja) * 1988-10-18 1990-04-20 Toshiba Corp 放射線検出器およびこれを用いた放射線検出装置
JPH0619466B2 (ja) * 1989-09-22 1994-03-16 理化学研究所 ２次元電荷位置検出用電極
GB9314398D0 (en) * 1993-07-12 1993-08-25 Gen Electric Signal processing in scintillation cameras for nuclear medicine
US6046454A (en) * 1995-10-13 2000-04-04 Digirad Corporation Semiconductor radiation detector with enhanced charge collection
US5754690A (en) * 1995-10-27 1998-05-19 Xerox Corporation Position sensitive detector based image conversion system capable of preserving subpixel information
US5825033A (en) * 1996-10-31 1998-10-20 The Arizona Board Of Regents On Behalf Of The University Of Arizona Signal processing method for gamma-ray semiconductor sensor
IL119875A (en) * 1996-12-20 1999-12-31 Israel State Technique for obtaining sub-pixel spatial resolution and corrected energy determinsation from room temperature solid state gamma and x-ray detectors with segmented readout
FR2759837B1 (fr) * 1997-02-14 2001-10-19 Commissariat Energie Atomique Dispositif et procede de traitement de signaux d'un detecteur de rayonnements a semiconducteurs
US6169287B1 (en) * 1997-03-10 2001-01-02 William K. Warburton X-ray detector method and apparatus for obtaining spatial, energy, and/or timing information using signals from neighboring electrodes in an electrode array
US5847398A (en) * 1997-07-17 1998-12-08 Imarad Imaging Systems Ltd. Gamma-ray imaging with sub-pixel resolution
US20040195512A1 (en) * 2000-05-16 2004-10-07 Crosetto Dario B. Method and apparatus for anatomical and functional medical imaging
US20030128324A1 (en) * 2001-11-27 2003-07-10 Woods Daniel D. Pixel size enhancements
US6618185B2 (en) * 2001-11-28 2003-09-09 Micronic Laser Systems Ab Defective pixel compensation method
JP3900992B2 (ja) * 2002-04-02 2007-04-04 株式会社日立製作所 放射線検出器及び放射線検査装置
DE10240062A1 (de) * 2002-08-30 2004-03-11 Philips Intellectual Property & Standards Gmbh Detektoranordnung
JP4178232B2 (ja) * 2003-02-28 2008-11-12 独立行政法人放射線医学総合研究所 入射位置検出装置
FR2864731B1 (fr) * 2003-12-30 2006-02-03 Commissariat Energie Atomique Systeme de detection de rayonnements permettant un meilleur comptage d'evenements
US7508509B2 (en) * 2004-05-04 2009-03-24 Metso Automation Oy Measurement of an object from an image consisting of a pixel matrix
DE102004048962B4 (de) * 2004-10-07 2006-09-21 Siemens Ag Digitale Röntgenaufnahmevorrichtung bzw. Verfahren zur Aufnahme von Röntgenabbildungen in einer digitalen Röntgenaufnahmevorrichtung
JP4748567B2 (ja) * 2005-02-25 2011-08-17 株式会社東芝 放射線入射位置検出装置
US7692156B1 (en) * 2006-08-23 2010-04-06 Radiation Monitoring Devices, Inc. Beam-oriented pixellated scintillators for radiation imaging
IL191154A0 (en) * 2007-05-04 2008-12-29 Gen Electric Photon counting x-ray detector with overrange logic control
JP5101972B2 (ja) * 2007-10-02 2012-12-19 オリンパス株式会社 固体撮像装置
EP2073040A2 (en) * 2007-10-31 2009-06-24 FUJIFILM Corporation Radiation image detector and phase contrast radiation imaging apparatus
US7495228B1 (en) * 2008-03-31 2009-02-24 General Electric Company Dual function detector device
US8405038B2 (en) * 2009-12-30 2013-03-26 General Electric Company Systems and methods for providing a shared charge in pixelated image detectors

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