JP2013190406A5 - - Google Patents

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Publication number
JP2013190406A5
JP2013190406A5 JP2012064934A JP2012064934A JP2013190406A5 JP 2013190406 A5 JP2013190406 A5 JP 2013190406A5 JP 2012064934 A JP2012064934 A JP 2012064934A JP 2012064934 A JP2012064934 A JP 2012064934A JP 2013190406 A5 JP2013190406 A5 JP 2013190406A5
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JP
Japan
Prior art keywords
image
phase
measured
intensity distribution
pseudo
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JP2012064934A
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English (en)
Japanese (ja)
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JP5808014B2 (ja
JP2013190406A (ja
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Priority claimed from PCT/JP2012/001689 external-priority patent/WO2013136356A1/en
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Priority to JP2012064934A priority Critical patent/JP5808014B2/ja
Priority claimed from JP2012064934A external-priority patent/JP5808014B2/ja
Publication of JP2013190406A publication Critical patent/JP2013190406A/ja
Publication of JP2013190406A5 publication Critical patent/JP2013190406A5/ja
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Publication of JP5808014B2 publication Critical patent/JP5808014B2/ja
Expired - Fee Related legal-status Critical Current
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JP2012064934A 2012-03-12 2012-03-22 三次元形状測定装置 Expired - Fee Related JP5808014B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2012064934A JP5808014B2 (ja) 2012-03-12 2012-03-22 三次元形状測定装置

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
WOPCT/JP2012/001689 2012-03-12
PCT/JP2012/001689 WO2013136356A1 (en) 2012-03-12 2012-03-12 3d shape measurement apparatus
JP2012064934A JP5808014B2 (ja) 2012-03-12 2012-03-22 三次元形状測定装置

Publications (3)

Publication Number Publication Date
JP2013190406A JP2013190406A (ja) 2013-09-26
JP2013190406A5 true JP2013190406A5 (enExample) 2014-12-11
JP5808014B2 JP5808014B2 (ja) 2015-11-10

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JP2012064934A Expired - Fee Related JP5808014B2 (ja) 2012-03-12 2012-03-22 三次元形状測定装置

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JP (1) JP5808014B2 (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104006765B (zh) * 2014-03-14 2016-07-13 中国科学院上海光学精密机械研究所 单幅载频干涉条纹相位提取方法及检测装置
CN104315996B (zh) * 2014-10-20 2018-04-13 四川大学 用二进制编码策略实现傅里叶变换轮廓术的方法
WO2017057077A1 (ja) 2015-09-29 2017-04-06 富士フイルム株式会社 標的細胞の識別方法、及び標的細胞識別装置
CN113396312B (zh) * 2018-10-12 2024-03-01 电力研究所有限公司 用于在光学失真介质中测量表面特性的方法
CN116027329B (zh) * 2022-12-21 2025-08-12 深圳大学 一种面向合成孔径雷达的2比特成像方法及相关设备

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0546062A (ja) * 1991-08-12 1993-02-26 Matsushita Electric Ind Co Ltd 計算機ホログラムの作成方法および光学的情報処理装置
US7127109B1 (en) * 1999-09-27 2006-10-24 University Of South Florida Digital interference holographic microscope and methods
JP4025880B2 (ja) * 2005-09-05 2007-12-26 国立大学法人 和歌山大学 球面波参照光を用いた位相シフトデジタルホログラフィの再生方法及び変位分布計測方法及び装置

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