JP2013149928A5 - - Google Patents
Download PDFInfo
- Publication number
- JP2013149928A5 JP2013149928A5 JP2012011558A JP2012011558A JP2013149928A5 JP 2013149928 A5 JP2013149928 A5 JP 2013149928A5 JP 2012011558 A JP2012011558 A JP 2012011558A JP 2012011558 A JP2012011558 A JP 2012011558A JP 2013149928 A5 JP2013149928 A5 JP 2013149928A5
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- measurement
- rotation mechanism
- lithography
- lithographic apparatus
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
- 239000000758 substrate Substances 0.000 claims description 24
- 238000005259 measurement Methods 0.000 claims description 12
- 238000001459 lithography Methods 0.000 claims description 7
- 230000003287 optical effect Effects 0.000 claims 2
- 238000004519 manufacturing process Methods 0.000 claims 1
- 238000000034 method Methods 0.000 claims 1
- 239000002245 particle Substances 0.000 claims 1
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2012011558A JP2013149928A (ja) | 2012-01-23 | 2012-01-23 | リソグラフィー装置および物品を製造する方法 |
| US13/739,196 US20130188165A1 (en) | 2012-01-23 | 2013-01-11 | Lithography apparatus, and method of manufacturing article |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2012011558A JP2013149928A (ja) | 2012-01-23 | 2012-01-23 | リソグラフィー装置および物品を製造する方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2013149928A JP2013149928A (ja) | 2013-08-01 |
| JP2013149928A5 true JP2013149928A5 (https=) | 2015-03-05 |
Family
ID=48796959
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2012011558A Abandoned JP2013149928A (ja) | 2012-01-23 | 2012-01-23 | リソグラフィー装置および物品を製造する方法 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US20130188165A1 (https=) |
| JP (1) | JP2013149928A (https=) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2014045041A (ja) * | 2012-08-24 | 2014-03-13 | Sharp Corp | 露光装置、露光方法、および電子デバイス製造方法 |
| EP3161854A4 (en) * | 2014-06-25 | 2018-05-30 | Intel Corporation | Techniques for forming a compacted array of functional cells |
| JP6791051B2 (ja) * | 2017-07-28 | 2020-11-25 | 株式会社ニューフレアテクノロジー | マルチ荷電粒子ビーム描画装置及びマルチ荷電粒子ビーム描画方法 |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5151750A (en) * | 1989-04-14 | 1992-09-29 | Nikon Corporation | Alignment apparatus |
| JPH04304615A (ja) * | 1991-04-01 | 1992-10-28 | Hitachi Ltd | 荷電粒子線描画装置及び方法 |
| US6225012B1 (en) * | 1994-02-22 | 2001-05-01 | Nikon Corporation | Method for positioning substrate |
| JPH08227839A (ja) * | 1995-02-20 | 1996-09-03 | Nikon Corp | 移動鏡曲がりの計測方法 |
| US5648854A (en) * | 1995-04-19 | 1997-07-15 | Nikon Corporation | Alignment system with large area search for wafer edge and global marks |
| KR100525521B1 (ko) * | 1996-10-21 | 2006-01-27 | 가부시키가이샤 니콘 | 노광장치및노광방법 |
| JP4366031B2 (ja) * | 2001-09-17 | 2009-11-18 | キヤノン株式会社 | 位置検出装置及び方法並びに露光装置、デバイスの製造方法 |
-
2012
- 2012-01-23 JP JP2012011558A patent/JP2013149928A/ja not_active Abandoned
-
2013
- 2013-01-11 US US13/739,196 patent/US20130188165A1/en not_active Abandoned
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP2012032837A5 (ja) | 露光装置、該露光装置を用いるデバイス製造方法、及び露光用マスク | |
| TWI522750B (zh) | 標記位置量測裝置及方法、微影裝置及器件製造方法 | |
| JP5723337B2 (ja) | パターン形成方法及びパターン形成装置 | |
| WO2013152878A3 (en) | Position measuring method, position measuring apparatus, lithographic apparatus and device manufacturing method, optical element | |
| JP2014131082A5 (ja) | リソグラフィ投影装置、オフセットを決定するための方法、露光方法、並びにデバイス製造方法 | |
| JP2015017844A5 (https=) | ||
| IL228201B (en) | Substrate and patterning device for use in metrology, metrology method and device manufacturing method | |
| JP2008199034A5 (https=) | ||
| JP2011253839A5 (https=) | ||
| JP2011060919A5 (https=) | ||
| WO2012041457A3 (en) | Projection exposure tool for microlithography and method for microlithographic imaging | |
| JP2014085123A5 (https=) | ||
| TW201604646A (zh) | 用於控制來自光刻成像系統之紫外光之焦點的方法和控制器以及利用其形成積體電路之裝置 | |
| US20170271214A1 (en) | Pattern accuracy detecting apparatus and processing system | |
| JP2013149928A5 (https=) | ||
| JP2016100428A5 (https=) | ||
| JP2012089575A5 (ja) | リソグラフィ装置及びデバイスの製造方法 | |
| CN103365098B (zh) | 一种用于曝光装置的对准标记 | |
| JP2016129212A5 (https=) | ||
| JP2011238788A5 (https=) | ||
| JP2016058452A5 (https=) | ||
| JP2016008924A5 (https=) | ||
| JP2013211488A5 (https=) | ||
| JP6639082B2 (ja) | リソグラフィ装置、リソグラフィ方法、および物品製造方法 | |
| JP2015070057A5 (https=) |