JP2013120650A5 - - Google Patents
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- Publication number
- JP2013120650A5 JP2013120650A5 JP2011267068A JP2011267068A JP2013120650A5 JP 2013120650 A5 JP2013120650 A5 JP 2013120650A5 JP 2011267068 A JP2011267068 A JP 2011267068A JP 2011267068 A JP2011267068 A JP 2011267068A JP 2013120650 A5 JP2013120650 A5 JP 2013120650A5
- Authority
- JP
- Japan
- Prior art keywords
- sample
- electron
- electron beam
- emitted
- primary electron
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010894 electron beam technology Methods 0.000 claims 19
- 238000001514 detection method Methods 0.000 claims 10
- 230000002093 peripheral effect Effects 0.000 claims 7
- 230000001678 irradiating effect Effects 0.000 claims 2
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2011267068A JP2013120650A (ja) | 2011-12-06 | 2011-12-06 | 走査電子顕微鏡および二次電子検出方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2011267068A JP2013120650A (ja) | 2011-12-06 | 2011-12-06 | 走査電子顕微鏡および二次電子検出方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2013120650A JP2013120650A (ja) | 2013-06-17 |
| JP2013120650A5 true JP2013120650A5 (https=) | 2014-12-04 |
Family
ID=48773216
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2011267068A Pending JP2013120650A (ja) | 2011-12-06 | 2011-12-06 | 走査電子顕微鏡および二次電子検出方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2013120650A (https=) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2016120971A1 (ja) * | 2015-01-26 | 2016-08-04 | 株式会社日立製作所 | 荷電粒子線装置 |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5823172Y2 (ja) * | 1974-07-01 | 1983-05-18 | 株式会社島津製作所 | ハンシヤデンシケンシユツソウチ |
| JPS5349661Y2 (https=) * | 1975-01-31 | 1978-11-29 | ||
| JPH07169675A (ja) * | 1993-12-16 | 1995-07-04 | Natl Res Inst For Metals | 電子線リソグラフィー用基板材料 |
| JPH11273608A (ja) * | 1998-03-23 | 1999-10-08 | Hitachi Ltd | 走査電子顕微鏡 |
| JP4613405B2 (ja) * | 2000-09-06 | 2011-01-19 | 株式会社日立製作所 | 走査型電子顕微鏡 |
| DE112011100306B4 (de) * | 2010-01-20 | 2019-06-19 | Hitachi High-Technologies Corporation | Ladungsteilchenstrahlvorrichtung |
-
2011
- 2011-12-06 JP JP2011267068A patent/JP2013120650A/ja active Pending
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