JP2013019830A5 - - Google Patents

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Publication number
JP2013019830A5
JP2013019830A5 JP2011154675A JP2011154675A JP2013019830A5 JP 2013019830 A5 JP2013019830 A5 JP 2013019830A5 JP 2011154675 A JP2011154675 A JP 2011154675A JP 2011154675 A JP2011154675 A JP 2011154675A JP 2013019830 A5 JP2013019830 A5 JP 2013019830A5
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Japan
Prior art keywords
parallel
parallel data
bit
circuit
serial
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JP2011154675A
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English (en)
Japanese (ja)
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JP2013019830A (ja
JP5832800B2 (ja
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Publication of JP2013019830A5 publication Critical patent/JP2013019830A5/ja
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JP2011154675A 2011-07-13 2011-07-13 半導体集積回路および半導体集積回路のテスト方法 Expired - Fee Related JP5832800B2 (ja)

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Application Number Priority Date Filing Date Title
JP2011154675A JP5832800B2 (ja) 2011-07-13 2011-07-13 半導体集積回路および半導体集積回路のテスト方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2011154675A JP5832800B2 (ja) 2011-07-13 2011-07-13 半導体集積回路および半導体集積回路のテスト方法

Publications (3)

Publication Number Publication Date
JP2013019830A JP2013019830A (ja) 2013-01-31
JP2013019830A5 true JP2013019830A5 (zh) 2014-07-10
JP5832800B2 JP5832800B2 (ja) 2015-12-16

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JP2011154675A Expired - Fee Related JP5832800B2 (ja) 2011-07-13 2011-07-13 半導体集積回路および半導体集積回路のテスト方法

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JP (1) JP5832800B2 (zh)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111183517B (zh) * 2018-01-17 2023-06-16 默升科技集团有限公司 具有中介层的并行prbs测试的ic裸片

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60200632A (ja) * 1984-03-26 1985-10-11 Fujitsu Ltd 符号誤り検出回路
JPS6116368A (ja) * 1984-07-02 1986-01-24 Mitsubishi Electric Corp 画像処理装置の検査装置
JPH0653938A (ja) * 1992-07-30 1994-02-25 Nec Corp シリアルデータ伝送方式
US7447965B2 (en) * 2005-05-03 2008-11-04 Agere Systems Inc. Offset test pattern apparatus and method

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